阅读说明：本技术 一种微波功率放大模块精确测试方法 (Accurate test method for microwave power amplification module ) 是由 胡张平 刘家兵 于 2020-07-01 设计创作，主要内容包括：本发明涉及微波模块测试技术领域,尤其为一种微波功率放大模块精确测试方法,包括如下步骤：步骤1：设备仪器准备；步骤2：输入链路的插损测量；步骤3：输出链路的插损测量；步骤4：待测件加电准备；步骤5：待测模块饱和功率测试。本发明,基于传统的微波信号源加功率计方式进行改进,公开了一种微波功率放大模块精确测试方法。该方法基于常规测试仪器进行合理搭配,使用该测试方可显著提高测试准确性和可靠性、具有精度高、兼容性好、散热便于处理,工作频率任意覆盖(由测试设备决定),使用方便等特点。通过此方法,使得功放模块测试变得更加简单而又准确可靠。(The invention relates to the technical field of microwave module testing, in particular to a method for accurately testing a microwave power amplification module, which comprises the following steps: step 1: preparing equipment instruments; step 2: measuring insertion loss of an input link; and step 3: measuring insertion loss of an output link; and 4, step 4: powering up a piece to be tested for preparation; and 5: and testing the saturation power of the module to be tested. The invention discloses a method for accurately testing a microwave power amplification module, which is improved based on a traditional microwave signal source and power meter mode. The method is reasonably matched based on a conventional test instrument, the test accuracy and reliability can be obviously improved by using the test method, and the method has the characteristics of high precision, good compatibility, convenience in heat dissipation treatment, arbitrary coverage of working frequency (determined by test equipment), convenience in use and the like. By the method, the power amplifier module is tested more simply, accurately and reliably.)

1. A microwave power amplification module accurate test method is characterized by comprising the following steps:

step 1: preparing equipment instruments;

step 2: measuring insertion loss of an input link;

and step 3: measuring insertion loss of an output link;

and 4, step 4: powering up a piece to be tested for preparation;

and 5: and testing the saturation power of the module to be tested.

2. The method for accurately testing a microwave power amplification module as claimed in claim 1, wherein the equipment instrument preparation comprises:

step 10: starting the power supply of each test device, and preheating for 30 minutes;

step 11: the gate and drain of the MMIC are current limited, with the gate limited to 10mA and the drain limited to 10% above the maximum operating current of the driver amplifier.

3. The method of claim 1, wherein the measuring of the insertion loss of the input link comprises:

step 20: calibrating according to the input link, and installing and turning on the driving amplifier and the cooling fan of the module to be tested;

step 21: setting the working voltage of the driving amplifier according to requirements;

step 22: turning on a signal source and setting working frequency;

step 22: adjusting the output power of the signal source to enable the display power of the output power probe to be +10dBm and ensure that the power value displayed by the output power probe is less than +20 dBm;

step 23: comparing the power value of the AB channel of the microwave power meter to obtain the insertion loss of the input channel;

step 24: the insertion loss value is input into an input channel power meter Offset;

step 25: the signal source output power is reduced to-40 dBm.

4. The method of claim 1, wherein the measuring of the insertion loss of the output link comprises:

step 30: according to the output link calibration, adjusting the output power of a signal source to enable the display power of an output power probe to be +10dBm and ensure that the power value displayed by a B-channel power probe is less than +20 dBm;

step 31: comparing the power value of the AB channel of the power meter with the microwave to obtain the insertion loss of the output link;

step 32: the insertion loss value is recorded into the Offset of the B-channel power meter;

step 33: the signal source power is reduced to-40 dBm.

5. The method of claim 1, wherein the power-up preparation of the dut comprises:

step 40: according to a test link, returning Vgs and Vds to zero, and adjusting the voltage of Vgs to turn off Ids;

step 41: adjusting the Vds voltage to the working voltage of the module to be tested;

step 42: regulating Vgs voltage to enable Ids to be equal to the nominal current of the module to be tested;

step 43: and recording the bias condition of the module to be tested.

6. The method for accurately testing the microwave power amplification module as claimed in claim 1, wherein the saturation power test of the module to be tested comprises:

step 50: turning on a signal source and setting working frequency;

step 51: the channel A display of the microwave power meter is set as B/A, and the gain of the to-be-detected piece can be directly observed at the moment;

step 52: adjusting the power of a signal source to enable the output power to be 10dB less than that of a 3dB compression point, and recording the small signal gain of the frequency point;

step 53: and increasing the output power of the signal source, and recording the output power to obtain a 1dB compression point when the gain is compressed by 1 dB.

Step 54: continuing with step 53, the input power is increased and the recorded output power is 3dB compressed when the gain is compressed by 3 dB.

Technical Field

The invention relates to the technical field of microwave module testing, in particular to a method for accurately testing a microwave power amplification module.

Background

The measurement of the main microwave parameters of the microwave module comprises gain parameters, power parameters and the like. The same problem is encountered in the microwave module testing industry, namely the problem that the gain and power are not accurately tested under the influence of the testing environment when a high-power and high-frequency power module is tested. In order to solve the problem, the power amplifier module is tested more simply, accurately and reliably, and a precise testing method of the microwave power amplifier module is provided.

Disclosure of Invention

The invention aims to provide a method for accurately testing a microwave power amplification module, so as to solve the problems in the background technology.

In order to achieve the purpose, the invention provides the following technical scheme:

a method for accurately testing a microwave power amplification module comprises the following steps:

step 1: preparing equipment instruments;

step 2: measuring insertion loss of an input link;

and step 3: measuring insertion loss of an output link;

and 4, step 4: powering up a piece to be tested for preparation;

and 5: and testing the saturation power of the module to be tested.

Preferably, the apparatus instrument preparation comprises:

step 10: starting the power supply of each test device, and preheating for 30 minutes;

step 11: the gate and drain of the MMIC are current limited, with the gate limited to 10mA and the drain limited to 10% above the operating current of the driver amplifier.

Preferably, the insertion loss measurement of the input link includes:

step 20: calibrating according to the input link, and installing and turning on the driving amplifier and the cooling fan of the module to be tested;

step 21: setting the working voltage of the driving amplifier according to requirements;

step 22: turning on a signal source and setting working frequency;

step 22: adjusting the output power of the signal source to enable the display power of the output power probe to be +10dBm and ensure that the power value displayed by the output power probe is less than +20 dBm;

step 23: comparing the power value of the AB channel of the microwave power meter to obtain the insertion loss of the input channel;

step 24: the insertion loss value is input into an input channel power meter Offset;

step 25: the signal source output power is reduced to-40 dBm.

Preferably, the insertion loss measurement of the output link includes:

step 30: according to the output link calibration, adjusting the output power of a signal source to enable the display power of an output power probe to be +10dBm and ensure that the power value displayed by a B-channel power probe is less than +20 dBm;

step 31: comparing the power value displayed by the AB channel of the microwave power meter to obtain the insertion loss of the output link;

step 32: the insertion loss value is recorded into the Offset of the B-channel power meter;

step 33: the signal source power is reduced to-40 dBm.

Preferably, the power-up preparation of the device under test comprises:

step 40: according to a test link, returning Vgs and Vds to zero, and adjusting the voltage of Vgs to turn off Ids;

step 41: adjusting the Vds voltage to the working voltage of the module to be tested;

step 42: regulating Vgs voltage to enable Ids to be equal to the nominal current of the module to be tested;

step 43: and recording the bias condition of the module to be tested.

Preferably, the saturation power test of the module to be tested comprises:

step 50: turning on a signal source and setting working frequency;

step 51: the channel A display of the microwave power meter is set as B/A, and the gain of the to-be-detected piece can be directly observed at the moment;

step 52: adjusting the power of a signal source to enable the output power to be 10dB less than that of a 3dB compression point, and recording the small signal gain of the frequency point;

step 53: and increasing the output power of the signal source, and recording the output power to obtain a 1dB compression point when the gain is compressed by 1 dB.

Step 54: continuing with step 53, the input power is increased and the recorded output power is 3dB compressed when the gain is compressed by 3 dB.

Compared with the prior art, the invention has the beneficial effects that:

the invention discloses a method for accurately testing a microwave power amplification module, which is improved based on a traditional microwave signal source and power meter mode. The method is reasonably matched based on a conventional test instrument, the test accuracy and reliability can be obviously improved by using the test party (test link (system)), and the method has the characteristics of high precision, good compatibility, convenient heat dissipation treatment, arbitrary coverage of working frequency (determined by test equipment), convenient use and the like. By the method, the power amplifier module is tested more simply, accurately and reliably.

Drawings

FIG. 1 is a diagram of an input link calibration according to the present invention;

FIG. 2 is a diagram of an output link calibration according to the present invention;

FIG. 3 is a test link connection diagram of the present invention.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Referring to fig. 1 to 3, the present invention provides a technical solution:

a method for accurately testing a microwave power amplification module comprises the following steps:

1.1 equipment instrument preparation:

a. and starting the power supply of each test device, and preheating for 30 minutes.

b. Both the gate and drain of the MMIC require current limiting, with the gate typically limited to 10mA and the drain limited to 10% above the maximum operating current of the amplifier.

1.2 insertion loss measurement of input link:

a. the circuits are connected according to fig. 1 and the driver amplifier and the cooling fan of the module to be tested are installed and switched on.

b. The operating voltage of the driver amplifier is set as required.

c. And turning on a signal source and setting the working frequency.

d. And adjusting the output power of the signal source to ensure that the display power of the output power probe is approximately +10dBm, and ensuring that the power value displayed by the output power probe is less than +20 dBm.

e. And comparing the AB (double) channel power value of the power meter to obtain the insertion loss of the A channel.

f. The insertion loss value is entered into the input channel power meter Offset.

g. The signal source output power is reduced to-40 dBm.

1.3 insertion loss measurement of output link:

a. the circuit diagrams are connected according to fig. 2.

b. And adjusting the output power of the signal source to ensure that the display power of the output power probe is approximately +10dBm, and ensuring that the power value displayed by the output power probe is less than +20 dBm.

c. And comparing the AB channel power value of the power meter to obtain the insertion loss of the B channel.

d. The insertion loss value is counted into the B-channel power meter Offset.

e. The signal source power is reduced to-40 dBm.

1.4 the piece to be tested (i.e. the module to be tested) is powered up and prepared:

a. the pieces to be tested are connected according to fig. 3, and Vgs and Vds are zeroed. The Vgs voltage is adjusted to substantially turn Ids off, typically to within-2.5V.

b. Adjusting the Vds voltage to the working voltage of the workpiece to be tested.

c. And regulating the Vgs voltage to enable Ids to be equal to the nominal current of the to-be-measured element.

d. And recording the bias condition of the piece to be tested.

1.5 saturation power test of the piece to be tested:

a. and turning on a signal source and setting the working frequency.

b. The display of the power meter A is set to be B/A, and the gain of the piece to be measured can be directly observed.

c. And adjusting the power of the signal source to ensure that the output power is 10dB less than P-3, and recording the small signal gain of the frequency point.

d. Increasing the signal source output power the recorded output power yields P-1 when the gain is compressed by 1 dB.

e. Continuing the previous operation to increase the input power the recorded output power gets P-3 when the gain is compressed by 3 dB.

In this embodiment, Vds: drain supply, Vgs: grid supply, Ids: a drain current; p-1: 1dB compression point, P-3: a 3dB compression point; MMIC: the monolithic microwave integrated circuit is characterized in that a PA (power amplifier) and a radio frequency middle power amplifier are used in a sample array; the power meter, namely a microwave power meter, is a double-channel, namely an AB channel, A refers to an A channel, B refers to a B channel, B/A displays the gain or insertion loss index of the piece to be tested, the A channel is connected with an input port of the piece to be tested, and the B channel is connected with an output port of the piece to be tested, so that the output ratio input obtains the gain; the channel A is an input channel and corresponds to an input link, and the channel B is an output channel and corresponds to an output link.

The invention, fig. 1, is an input link calibration comprising a microwave power meter and a power sensor a connected to a programmable computer, a spectrum analyzer, respectively, the power sensor a is connected to a directional coupler through an attenuator, the programmable computer is connected to a sweep frequency signal generator, the sweep frequency signal generator is connected to the directional coupler through a drive amplifier, the directional coupler is connected to an isolator, the isolator is connected to a power sensor B through an output port attenuator, and the power sensor B is connected to the spectrum analyzer.

The invention, fig. 2 is an output link calibration, which comprises a microwave power meter, a power sensor A and a power sensor B, wherein the microwave power meter is respectively connected with a program control computer, a spectrum analyzer, the power sensor A and the power sensor B, the power sensor A is connected with a directional coupler through an attenuator, the program control computer is connected with a sweep frequency signal generator, the sweep frequency signal generator is connected with the directional coupler through a drive amplifier, and the directional coupler is connected with an isolator; the power sensor B is connected to the directional coupler through an attenuator, the directional coupler is connected to the isolator, the two isolators are connected, the spectrum analyzer is connected to the output port attenuator, and the output port attenuator is connected to the directional coupler to which the power sensor B is connected.

The invention, fig. 3 is a test link, which is basically similar to fig. 2, except that a device under test is connected between two isolators, and a grid electrode and a drain electrode of the device under test are respectively and correspondingly powered by a grid electrode power supply program control power supply and a drain electrode power supply program control power supply.

The invention uses the following accessories: radio frequency cables, radio frequency coaxial connectors, adapter connectors, socket head wrenches, torque wrenches, tweezers, and the like. The remarks are as follows: 1. strict adherence to general safety regulations and the present operating specifications. 2. The E4413A power probe can only withstand +20dBm at the maximum, and needs attention during operation. 3. The MMIC bare chip is easy to be subjected to electrostatic breakdown, and during operation, an anti-static bracelet is worn to make anti-static measures. 4. And in the process, the screen of the frequency spectrograph is observed in real time, and whether the piece to be detected has the self-oscillation phenomenon or not is monitored. 5. The operator should carefully record the test data.

The invention discloses a method for accurately testing a microwave power amplification module, which is improved based on a traditional microwave signal source and power meter mode. The method is reasonably matched based on a conventional test instrument, the test accuracy and reliability can be obviously improved by using the test party (test link (system)), and the method has the characteristics of high precision, good compatibility, convenient heat dissipation treatment, arbitrary coverage of working frequency (determined by test equipment), convenient use and the like. By the method, the power amplifier module is tested more simply, accurately and reliably.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.