阅读说明：本技术 开关控制电路、点火器 (Switch control circuit and igniter ) 是由 田口敦司 大长央 于 2019-02-22 设计创作，主要内容包括：本发明提供一种开关控制电路、点火器。开关控制电路与点火信号对应地控制与点火线圈的初级线圈连接的开关元件。开关元件包含晶体管、连接在晶体管的集电极栅极之间的保护元件。开关控制电路将控制晶体管的栅极端子的电压、或与晶体管的集电极电流对应的电压作为检测电压,生成与检测电压的变化对应的状态检测信号。(The invention provides a switch control circuit and an igniter. The switching control circuit controls a switching element connected to a primary coil of the ignition coil in response to the ignition signal. The switching element includes a transistor and a protection element connected between collector gates of the transistor. The switch control circuit generates a state detection signal corresponding to a change in the detection voltage, using, as the detection voltage, a voltage at the gate terminal of the control transistor or a voltage corresponding to a collector current of the transistor.)

1. A switching control circuit for controlling a switching element connected to a primary coil of an ignition coil in response to an ignition signal,

the switching element includes a transistor, and a protection element connected between a collector and a gate of the transistor,

the switch control circuit includes: and a state detection circuit that generates a state detection signal corresponding to a change in the detection voltage, using, as the detection voltage, a voltage that controls a gate terminal of the transistor or a voltage corresponding to a collector current of the transistor.

2. The switch control circuit of claim 1,

the state detection circuit includes:

a first comparator that compares the detection voltage with a first reference voltage;

a second comparator for comparing the detection voltage with a second reference voltage,

the state detection circuit generates the state detection signal based on output signals of the first comparator and the second comparator.

3. The switch control circuit according to claim 1 or 2,

the detection voltage corresponding to the collector current is a voltage of a terminal connected between the emitter of the transistor and a resistor connected to the emitter.

4. The switch control circuit of claim 2,

the state detection circuit is provided with a capacitor,

charging and discharging the capacitor according to output signals of the first comparator and the second comparator,

the state detection signal is generated based on a charging voltage of the capacitor.

5. The switch control circuit according to any one of claims 1 to 4,

the switch control circuit includes: and a signal output circuit that outputs the state detection signal to a terminal.

6. The switch control circuit according to any one of claims 1 to 4,

the switch control circuit includes: and a signal output circuit for outputting an ignition confirmation signal based on the state detection signal.

7. The switch control circuit according to claim 5 or 6,

the switch control circuit includes: a current detection circuit for detecting a collector current of the transistor,

the signal output circuit generates an ignition confirmation signal by combining the detection signal of the current detection circuit and the detection signal of the state detection circuit.

8. The switch control circuit according to any one of claims 5 to 7,

the signal output circuit outputs the state detection signal in accordance with the timing of the ignition signal.

9. The switch control circuit according to any one of claims 1 to 8,

the switching element includes a protection element connected between the emitter and the gate of the transistor.

10. An igniter, comprising:

a switching element connected to a primary coil of the ignition coil;

a switching control circuit for controlling the switching element in response to an ignition signal,

the switching element includes a transistor, and a protection element connected between a collector and a gate of the transistor,

the switch control circuit includes: and a state detection circuit that generates a state detection signal corresponding to a change in the detection voltage, using, as the detection voltage, a voltage that controls a gate terminal of the transistor or a voltage corresponding to a collector current of the transistor.

11. A switching control circuit for controlling a switching element connected to a primary coil of an ignition coil in response to an ignition signal,

the switching element includes a transistor, and a protection element connected between a collector and a gate of the transistor,

the switch control circuit includes: and a state detection circuit that generates a state detection signal corresponding to a change in the detection voltage, using the collector voltage of the transistor as the detection voltage.

12. The switch control circuit of claim 11,

the state detection circuit includes: and a second resistor that generates the detection voltage by dividing a collector voltage of the transistor by a first resistor connected to a collector terminal of the switching element.

13. The switch control circuit according to claim 11 or 12,

the state detection circuit includes: a first comparator for comparing the detection voltage with a first reference voltage,

the state detection circuit generates the state detection signal based on an output signal of the first comparator.

14. The switch control circuit of claim 13,

the state detection circuit includes:

a capacitor;

a first current source for charging the capacitor in accordance with an output signal of the first comparator;

a second current source that discharges the capacitor; and

and a second comparator for comparing a charged voltage of the capacitor with a second reference voltage and outputting the state detection signal.

15. The switch control circuit according to any one of claims 11 to 14,

the switch control circuit includes: and a signal output circuit that outputs the state detection signal to a terminal.

16. The switch control circuit according to any one of claims 11 to 14,

the switch control circuit includes: and a signal output circuit for outputting an ignition confirmation signal based on the state detection signal.

17. The switch control circuit according to claim 15 or 16,

the switch control circuit includes: a current detection circuit for detecting a collector current of the transistor,

the signal output circuit generates an ignition confirmation signal by combining the detection signal of the current detection circuit and the detection signal of the state detection circuit.

18. The switch control circuit according to any one of claims 15 to 17,

the signal output circuit outputs the state detection signal in accordance with the timing of the ignition signal.

19. The switch control circuit according to any one of claims 11 to 18,

the switching element includes a protection element connected between the emitter and the gate of the transistor.

20. An igniter, comprising:

a switching element connected to a primary coil of the ignition coil;

a switching control circuit for controlling the switching element in response to an ignition signal,

the switching element includes a transistor, and a protection element connected between a terminal connected to the primary coil and a control terminal of the transistor,

the switch control circuit includes: and a state detection circuit that generates a state detection signal corresponding to a change in the detection voltage, using a voltage corresponding to a collector voltage of the transistor as the detection voltage.

21. A switching control circuit for controlling a switching element connected to a primary coil of an ignition coil in response to an ignition signal,

the switch control circuit includes: a protection circuit connected between an input terminal to which an ignition signal is supplied and a ground terminal connected to ground,

the protection circuit includes:

a first diode element provided in a forward direction from the input terminal toward the ground terminal and connected to the input terminal;

at least one second diode element provided in a reverse direction from the input terminal to the ground terminal and connected between the first diode element and the ground terminal,

the first diode element and the second diode element are formed of PMOSFETs.

22. The switch control circuit of claim 21,

the protection circuit includes 2 second diode elements connected in series.

23. The switch control circuit of claim 21 or 22,

the protection circuit is formed in a region between a first pad to which the input terminal is connected and a second pad to which the ground terminal is connected in a semiconductor substrate on which the switch control circuit is integrated.

24. The switch control circuit according to any one of claims 1 to 9 and 11 to 19, comprising:

a protection circuit connected between an input terminal to which an ignition signal is supplied and a ground terminal connected to ground,

the protection circuit includes:

a first diode element provided in a forward direction from the input terminal toward the ground terminal and connected to the input terminal;

at least one second diode element provided in a reverse direction from the input terminal to the ground terminal and connected between the first diode element and the ground terminal,

the first diode element and the second diode element are formed of PMOSFETs.

25. The igniter of claim 10 or 20,

the igniter includes: a protection circuit connected between an input terminal to which an ignition signal is supplied and a ground terminal connected to ground,

the protection circuit includes:

a first diode element provided in a forward direction from the input terminal toward the ground terminal and connected to the input terminal;

at least one second diode element provided in a reverse direction from the input terminal to the ground terminal and connected between the first diode element and the ground terminal,

the first diode element and the second diode element are formed of PMOSFETs.

Technical Field

The invention relates to a switch control circuit and an igniter.

Background

Conventionally, an ignition device for a gasoline car is provided with an igniter for controlling an ignition coil connected to an ignition plug. The igniter includes a switching element connected to an ignition coil, and a control circuit for controlling the switching element in accordance with an ignition instruction signal supplied from an ECU (engine control unit) (see, for example, patent document 1). The igniter controls the switching of the switching element, and the ignition coil generates a high voltage to be supplied to the ignition plug.

Disclosure of Invention

Problems to be solved by the invention

However, so-called misfires (misfire) may occur in which the ignition spark plug does not generate a spark (spark). Since a misfire may affect the rotation of an engine, etc., it is required to detect the state of the misfire.

The invention aims to: provided are a switch control circuit and an igniter capable of detecting a misfire condition.

Means for solving the problems

A switching control circuit according to an aspect of the present invention is a switching control circuit for controlling a switching element connected to a primary coil of an ignition coil in response to an ignition signal, the switching element including a transistor and a protection element connected between collector and gate of the transistor, the switching control circuit including: and a state detection circuit that generates a state detection signal corresponding to a change in the detection voltage, using, as the detection voltage, a voltage that controls a gate terminal of the transistor or a voltage corresponding to a collector current of the transistor.

An igniter according to another aspect of the present invention includes: a switching element connected to a primary coil of the ignition coil; a switching control circuit for controlling the switching element in response to an ignition signal, the switching element including a transistor and a protection element connected between a collector and a gate of the transistor, the switching control circuit including: and a state detection circuit that generates a state detection signal corresponding to a change in the detection voltage, using, as the detection voltage, a voltage that controls a gate terminal of the transistor or a voltage corresponding to a collector current of the transistor.

A switching control circuit according to another aspect of the present invention is a switching control circuit for controlling a switching element connected to a primary coil of an ignition coil in response to an ignition signal, the switching element including a transistor and a protection element connected between a terminal connected to the primary coil and a control terminal of the transistor, the switching control circuit including: and a state detection circuit that generates a state detection signal corresponding to a change in the detection voltage, using a voltage corresponding to a collector voltage of the transistor as the detection voltage.

An igniter according to another aspect of the present invention includes: a switching element connected to a primary coil of an ignition coil, and a switching control circuit for controlling the switching element in response to an ignition signal, wherein the switching element includes a transistor and a protection element connected between a terminal connected to the primary coil and a control terminal of the transistor, and the switching control circuit includes: and a state detection circuit that generates a state detection signal corresponding to a change in the detection voltage, using a voltage corresponding to a collector voltage of the transistor as the detection voltage.

Effects of the invention

According to one embodiment of the present invention, the misfire condition can be detected.

Drawings

Fig. 1 is a schematic block circuit diagram of an ignition device according to a first embodiment.

Fig. 2A is a schematic block circuit diagram of the switch control circuit of the first embodiment.

Fig. 2B is a waveform diagram showing the operation of the misfire detection circuit.

Fig. 3A is a waveform diagram showing voltages at respective portions of the igniter that normally ignites.

Fig. 3B is a waveform diagram showing voltages at respective portions of the igniter in the event of a misfire.

Fig. 4 is a waveform diagram showing an operation of the switch control circuit.

Fig. 5 is a schematic configuration diagram of the ignition device.

Fig. 6 is a schematic plan view showing an example of the external appearance of the igniter.

Fig. 7 is a schematic side view showing an example of the external appearance of the igniter.

Fig. 8 is a schematic plan view showing an example of the internal structure of the igniter.

Fig. 9 is a schematic plan view of the switching element.

Fig. 10 is a schematic cross-sectional view of the switching element.

Fig. 11 is a schematic cross-sectional view of the switching element.

Fig. 12 is a schematic block circuit diagram of a switch control circuit according to a modified example.

Fig. 13 is a waveform diagram showing an operation of the switching control circuit according to the modified example.

Fig. 14 is a schematic block circuit diagram of a switch control circuit according to a modified example.

Fig. 15 is a waveform diagram showing an operation of the switching control circuit according to the modified example.

Fig. 16 is a schematic block circuit diagram of a switch control circuit according to a modified example.

Fig. 17 is a schematic block circuit diagram of an ignition device according to a modification example.

Fig. 18 is a schematic block circuit diagram of the ignition device of the second embodiment.

Fig. 19 is a schematic block circuit diagram of the switch control circuit according to the second embodiment.

Fig. 20A is a waveform diagram showing voltages at respective portions of the igniter that normally ignites.

Fig. 20B is a waveform diagram showing voltages at respective portions of the igniter in the event of a misfire.

Fig. 21 is a schematic block circuit diagram of a switch control circuit according to a modified example.

Fig. 22 is a schematic block circuit diagram of a switch control circuit according to a modified example.

Fig. 23 is a schematic block circuit diagram of an ignition device according to a modification example.

Fig. 24 is a schematic block circuit diagram showing an ignition device according to a third embodiment.

Fig. 25 is a schematic block circuit diagram showing a switch control circuit according to the third embodiment.

Fig. 26A is a waveform diagram showing voltages at respective portions of the igniter that normally ignites.

Fig. 26B is a waveform diagram showing voltages at respective portions of the igniter in the event of a misfire.

Fig. 27 is a waveform diagram showing an operation of the switch control circuit.

Fig. 28 is a schematic plan view showing an example of the internal structure of the igniter.

Fig. 29 is an explanatory diagram of the resistance element.

Fig. 30 is a schematic plan view showing an example of the internal structure of the igniter according to the modification.

Fig. 31 is a schematic block circuit diagram of a switch control circuit according to a modified example.

Fig. 32 is a waveform diagram showing an operation of the switching control circuit according to the modified example.

Fig. 33 is a schematic block circuit diagram of a switch control circuit according to a modified example.

Fig. 34 is a waveform diagram showing an operation of the switching control circuit according to the modified example.

Fig. 35 is a schematic block circuit diagram of a switch control circuit according to a modified example.

Fig. 36 is a schematic block circuit diagram of an ignition device according to a modification example.

Fig. 37 is a schematic block circuit diagram showing an ignition device according to the fourth embodiment.

Fig. 38 is a schematic plan view showing an example of the internal structure of the igniter.

Fig. 39 is a schematic plan view showing an example of the layout of the functional IC of the switch control circuit.

Fig. 40 is a schematic plan view of the protection element.

Fig. 41 is a sectional view showing a schematic configuration of the protection circuit.

Fig. 42 is an equivalent circuit diagram of the protection circuit.

Fig. 43A is a schematic cross-sectional view of an NMOSFET.

Fig. 43B is a schematic cross-sectional view of an NMOSFET generating an offset.

Fig. 44A is an explanatory diagram showing a method of forming a protection element using an NMOSFET.

Fig. 44B is an explanatory diagram showing a method of forming a protection element using a PMOSFET.

Fig. 45 is a schematic block circuit diagram showing an ignition device according to a modification of the fourth embodiment.

Fig. 46 is a schematic cross-sectional view showing a protection element of the protection circuit.

Fig. 47 is an equivalent circuit diagram of the protection circuit.

Fig. 48 is a schematic block circuit diagram of an ignition device according to a modification example.

Detailed Description

Hereinafter, each embodiment and a modification will be described with reference to the drawings. The embodiments and modified examples shown below are intended to exemplify a structure and a method for embodying the technical idea, and the material, shape, structure, arrangement, size, and the like of each component are not limited to the examples described below. Various modifications can be made to the embodiments and modified examples described below.

In this specification, the "state in which the member a is connected to the member B" includes a case in which the member a and the member B are physically directly connected, and a case in which the member a and the member B are indirectly connected via another member which does not affect the electrical connection state.

Also, "a state in which the member C is provided between the member a and the member B" includes a case in which the member a and the member C, or the member B and the member C are directly connected, and a case in which the member a and the member C, or the member B and the member C are indirectly connected via another member which does not affect the electrical connection state.

(first embodiment)

The first embodiment is explained below.

As shown in fig. 1 and 5, the ignition device 1 includes an ignition coil 2, a diode 3 (see fig. 1), and an igniter 4. The ignition coil 2 includes a primary coil 2a and a secondary coil 2 b. A first terminal of the primary coil 2a is connected to the battery 5 and the cathode of the diode 3, and a second terminal of the primary coil 2a is connected to an output terminal of the igniter 4. A first terminal of secondary winding 2b is connected to the anode of diode 3, and a second terminal of secondary winding 2b is connected to ignition plug 6.

The igniter 4 includes a switching control circuit 11 and a switching element 12, and performs switching control of the switching element 12 based on an ignition instruction signal IGT supplied from the ECU 7. If the switching element 12 is turned on in accordance with the ignition instruction signal IGT, the battery voltage VBAT is applied to the primary coil 2a of the ignition coil 2, and the current I1 flowing through the primary coil 2a increases with time. If the switching element 12 is turned off in accordance with the ignition instruction signal IGT, the current I1 of the primary coil 2a is cut off. At this time, a primary voltage V1 proportional to the time derivative of the current I1 is generated in the primary coil 2 a. In addition, a secondary voltage V2, which is the primary voltage V1 multiplied by the winding ratio, is generated in the secondary coil 2 b. The ignition plug 6 generates a spark (spark) by the secondary voltage V2 thus generated.

As shown in fig. 1, the igniter 4 includes a high-potential-side power supply terminal T1 to which the battery voltage VBAT is supplied from the battery 5, and an output terminal T6 connected to the primary coil 2a of the ignition coil 2. The igniter 4 includes an input terminal T5 connected to the ECU7, a signal output terminal T4, and a low-potential-side power supply terminal T2.

The ignition instruction signal IGT is input from the ECU7 to the signal input terminal T5. The igniter 4 outputs an ignition confirmation signal IGF from the signal output terminal T4.

The igniter 4 includes a switch control circuit 11, a switching element 12, a resistor R1, capacitors C1, C2, and a resistor R2, and is housed in a single package in a modular manner.

A first terminal of the resistor R1 is connected to the high-potential-side power supply terminal T1, and a second terminal of the resistor R1 is connected to the high-potential-side power supply terminal P1 of the switch control circuit 11. A first terminal of the capacitor C1 is connected between the high-side power supply terminal T1 and the low-side power supply terminal T2. The capacitor C2 is connected between the second terminal of the resistor R1 and the low-potential-side power supply terminal T2. The battery voltage VBAT is supplied as a high-potential power supply voltage VDD to the switch control circuit 11 via a resistor R1. The switch control circuit 11 operates based on the high-potential power supply voltage VDD. The resistor R1 lowers a surge voltage added to the battery voltage VBAT, for example, and relieves stress on the switch control circuit 11. The capacitor C1 reduces noise (e.g., spike noise) added to the battery voltage VBAT, for example, and stabilizes the high-potential power supply voltage VDD. The capacitor C2 functions as a bypass capacitor for stabilizing the high-potential power supply voltage VDD, for example.

The switch control circuit 11 includes an input terminal P5 to which an ignition instruction signal IGT is input via an input terminal T5, and a signal output terminal P4 from which an ignition confirmation signal IGF is output. The switch control circuit 11 includes an output terminal P6 connected to the switching element 12, input terminals P7 and P8 connected to both terminals of the resistor R2, and a low-potential-side power supply terminal P2 connected to the low-potential-side power supply terminal T2.

The switching control circuit 11 includes a low-voltage protection circuit 21, an overvoltage protection circuit 22, a signal detection circuit 23, an overvoltage protection circuit 24, a gate driver 25, a state detection circuit 26, an overcurrent protection circuit (current detection circuit) 27, and a signal output circuit 28.

The low Voltage Protection circuit (BUVP) 21 compares the driving Voltage VDD with a predetermined threshold Voltage, and outputs a detection signal K1 having a level corresponding to the comparison result. For example, the threshold voltage of the low-voltage protection circuit 21 is set in accordance with the lower limit voltage in the voltage range in which the switch control circuit 11 can operate. The overvoltage Protection circuit (BOVP) 22 compares the drive Voltage with a predetermined threshold Voltage, and outputs a detection signal K2 of a level corresponding to the comparison result. For example, the threshold voltage of the overvoltage protection circuit 22 is set in accordance with the upper limit voltage in the voltage range in which the switch control circuit 11 can operate.

The Signal Detector (Signal Detector)23 includes a filter circuit and a comparator. The signal detection circuit 23 detects the ignition instruction signal IGT from the ECU7, and outputs a reception signal Sdet. The overvoltage protection circuit (Over duty protection)24 generates a control signal S1 to be supplied to the gate driver 25 based on the reception signal Sdet of the signal detection circuit 23, the detection signal K1 of the low voltage protection circuit 21, and the detection signal K2 of the overvoltage protection circuit 22. In addition, the overvoltage protection circuit 24 generates the control signal S1 based on the reception signal Sdet such that the switching element 12 is not turned on for a predetermined energization protection time.

The Gate driver (Gate Drive)25 outputs a Gate signal Sg for switching the switching element 12 in response to the control signal S1. The switching element 12 is configured as one semiconductor chip including a transistor 31. The Transistor 31 is, for example, an IGBT (Insulated Gate Bipolar Transistor). Each terminal (C, G, E) of the transistor 31 may be described as a terminal of the semiconductor chip, that is, the switching element 12.

The gate signal Sg output from the gate driver 25 is supplied to the gate terminal G of the switching element 12 via the output terminal P6. The overcurrent Protection circuit (Over Current Protection)27 detects the state of the collector Current Ic (emitter Current Ie) of the switching element 12 based on the detection voltage (emitter voltage Ve) at the node between the emitter terminal E of the switching element 12 and the resistor R2, and generates a detection signal CE corresponding to the detection result. The gate driver 25 lowers the level of the voltage Vsg of the gate signal Sg based on the detection signal CE. This limits the collector current Ic to the upper limit value or less.

The state detection circuit (Ignition Status Detector)26 outputs a detection signal FE corresponding to a voltage of the gate terminal G of the transistor 31 controlling the switching element 12 as a detection voltage. The gate driver 25 supplies a gate signal Sg to the gate terminal G. Therefore, the state detection circuit 26 detects the ignition state of the ignition plug 6 based on the detection voltage (gate voltage Vsg) obtained by using the voltage of the gate signal Sg as the detection voltage, and outputs the detection signal FE. For example, the state detection circuit 26 outputs the detection signal FE at a high level when the ignition plug 6 is in a normal state in which spark (spark) is generated, that is, in a normal ignition state, and outputs the detection signal FE at a low level when the ignition plug 6 is in a misfire state in which spark (spark) is not generated, that is, in which ignition is not performed normally.

The signal Output circuit (Output logic)28 synthesizes various signals including the detection signal CE of the overcurrent protection circuit 27 and the detection signal FE of the state detection circuit 26 to generate an ignition confirmation signal IGF, and outputs the ignition confirmation signal IGF. The ignition confirmation signal IGF is supplied to the ECU7 via the signal output terminal P4 of the switch control circuit 11 and the signal output terminal T4 of the igniter 4.

The switching element 12 includes a transistor 31 and a protection element 32, and is integrated on one semiconductor substrate manufactured by a high withstand voltage process.

The protection element 32 is provided between the gate and collector of the power transistor for the purpose of overvoltage protection. The protection element 32 includes, for example, a diode connected in reverse series between the gate and the collector of the transistor 31. The diode is for example a zener diode. When the transistor 31 is turned off to cut off the primary current I1 flowing through the primary coil 2a of the ignition coil 2, a high voltage is generated at the collector terminal C of the switching element 12 by the counter electromotive force of the primary coil 2 a. When a voltage equal to or higher than the clamp voltage of the protection element 32 is applied between the gate and the collector of the transistor 31, the protection element 32 turns on the transistor 31, and releases the energy stored in the primary winding 2a of the ignition winding 2, thereby protecting the transistor 31. The protection element 32 improves the avalanche resistance of the transistor 31.

The switching element 12 may include a protection element connected between the gate and the emitter of the transistor 31. The protection element includes a diode (for example, a zener diode) connected in reverse series between the gate and the emitter of the transistor 31 for the purpose of overvoltage protection, and clamps an overvoltage (for example, surge noise) between the gate and the emitter to a predetermined voltage.

The emitter terminal E of the switching element 12 is connected to the low-potential-side power supply terminal T2 via a resistor R2.

As shown in fig. 2A, the gate driver 25 includes transistors M1 and M2 connected in series between a line VDD that transmits a drive voltage VDD (hereinafter referred to as a power supply line) and a line AGND that transmits a low potential voltage AGND (hereinafter referred to as a ground line). The transistor M1 is, for example, a PMOSFET (P-channel Metal Oxide Semiconductor Field Effect transistor), and the transistor M2 is, for example, an NMOSFET (N-channel MOSFET). A node N1 between the transistor M1 and the transistor M2 is connected to the output terminal P6 via a resistor R11.

The state detection circuit 26 includes comparators 41 and 42, current sources 43 and 44, a capacitor C11, and a comparator 45.

The gate signal Sg (gate voltage Vsg) is supplied to inverting input terminals of the comparators 41 and 42. The reference voltage Vref1 is supplied to the non-inverting input terminal of the comparator 41, and the reference voltage Vref2 is supplied to the non-inverting input terminal of the comparator 41. The reference voltages Vref1 and Vref2 are set in accordance with the change in the voltage Vsg. The comparator 41 compares the gate voltage Vsg with the reference voltage Vref1, and outputs a signal S11 at a level corresponding to the comparison result. The comparator 42 compares the voltage Vsg with the reference voltage Vref2, and outputs a signal S12 at a level corresponding to the comparison result.

A first terminal of the current source 43 is connected to the power supply line VDD, and supplies the driving voltage VDD. The current source 43 corresponds to a "first current source". A second terminal of the current source 43 is connected to a first terminal of the capacitor C11, and a second terminal of the capacitor C11 is connected to the ground wiring AGND. The current source 44 is connected in parallel with the capacitor C11. The current source 43 is activated or deactivated in response to the output signal S11 of the comparator 41. The activated current source 43 flows a predetermined current I11. By the current I11, electric charge is accumulated in the capacitor C11, and the voltage V11 of the first terminal of the capacitor C11 rises.

Current source 44 is activated or deactivated in response to output signal S12 of comparator 42. The current source 44 corresponds to a "second current source". The activated current source 44 flows a predetermined current I12. The current I12 discharges the charge in the capacitor C11, and the voltage V11 at the first terminal of the capacitor C11 drops. A first terminal of the capacitor C11 is connected to a non-inverting input terminal of the comparator 45, and a reference voltage Vref3 is supplied to an inverting input terminal of the comparator 45. The comparator 45 compares the voltage V11 of the first terminal of the capacitor C11 with the reference voltage Vref3, and outputs a detection signal FE corresponding to the comparison result.

The detection signal FE output from the comparator 45 and the detection signal CE output from the overcurrent protection circuit 27 shown in fig. 1 are input to the signal output circuit 28. Further, a clock signal CLK of a predetermined frequency is supplied from an Oscillation Section (OSC)29 to the signal output circuit 28. The clock signal CLK is, for example, a system clock, a signal obtained by dividing the system clock, and is used for receiving the ignition control signal. The signal output circuit 28 operates based on the clock signal CLK to output an ignition confirmation signal IGF obtained by synthesizing the detection signals CE and FE.

Fig. 3A and 3B show changes in the collector-emitter voltage Vce, the collector current Ic, and the gate-emitter voltage VGE (gate voltage Vsg) of the switching element 12 (transistor 31).

As shown in fig. 3A, if the transistor 31 shown in fig. 1 is turned off to cut off the primary current of the ignition coil 2, a large counter electromotive force is generated in the primary coil 2a of the ignition coil 2 due to a self-inductance effect, and the collector-emitter voltage Vce rises sharply. In the secondary coil 2b, a large electromotive force corresponding to the turn ratio is generated due to the mutual inductance effect with the primary coil 2 a. Due to the electromotive force of the secondary coil 2b thus generated, a very high secondary voltage V2 is applied to the ignition plug 6, and the ignition plug 6 generates a spark (spark). When a spark is normally generated, energy is lost, the collector current Ic of the transistor 31 rapidly decreases, and the collector-emitter voltage Vce rapidly decreases in accordance with the collector current Ic. Then, collector current Ic and gate-emitter voltage VGE (gate voltage Vsg) become the low potential level (0). Thus, when the ignition of the ignition plug 6 is normal, the gate-emitter voltage VGE (gate voltage Vsg) and the collector current Ic decrease to predetermined levels in a short period of time.

As shown in fig. 3B, when the spark plug 6 is not sparking (spark), the collector-emitter voltage Vce is maintained at a high voltage. The gate-emitter voltage VGE (gate voltage Vsg) gradually decreases, and the collector current Ic gradually decreases while repeating rising and falling due to the parasitic capacitance and inductance of the ignition coil 2. Then, if the gate-to-emitter voltage VGE (gate voltage Vsg) and the collector current Ic become lower than predetermined values, the collector-to-emitter voltage Vce decreases.

In this way, the gate-emitter voltage VGE and the collector current Ic decrease in accordance with the state of the ignition plug 6, and the period during which the collector-emitter voltage Vce is maintained at the high level differs.

The state detection circuit 26 shown in fig. 1 and 2A detects the state of the ignition plug 6 based on these voltage changes, and outputs a detection signal FE. In the present embodiment, the state detection circuit 26 detects a state based on the gate voltage Vsg and outputs the detection signal FE. Then, the signal output circuit 28 synthesizes the detection signal FE of the state detection circuit 26 with other signals to generate an ignition confirmation signal IGF. By outputting the ignition confirmation signal IGF thus synthesized from the signal output terminal P4, the detection results of the plurality of detection circuits can be output from one signal output terminal P4, and the size increase of the igniter 4 can be suppressed.

As shown in fig. 2A, the state detection circuit 26 compares the gate voltage Vsg with the reference voltages Vref1, Vref2 by the comparators 41, 42. As shown in fig. 3B, the reference voltages Vref1 and Vref2 are set in correspondence with a period (a period indicated by an arrow) in which the collector-emitter voltage Vce is maintained at a high level with respect to the gate voltage Vsg.

The capacitor C11 is charged in accordance with the output signal S11 of the comparator 41, and the capacitor C11 is discharged in accordance with the output signal S12 of the comparator 42. Therefore, the voltage V11 of the first terminal of the capacitor C11 corresponds to the change in the gate-emitter voltage VGE (gate voltage Vsg) shown in fig. 3A and 3B.

The upper section of fig. 2B shows the change in voltage V11 corresponding to fig. 3A. The horizontal axis of fig. 2B is time, and the vertical axis is voltage. If the gate voltage Vsg becomes lower than the reference voltage Vref1 at time t1, the capacitor C11 is charged by the current source 43 shown in fig. 2A, and the voltage V11 rises. When a spark is normally generated in the ignition plug 6 shown in fig. 1 and 5, the gate voltage Vsg becomes lower than the reference voltage Vref2 at time t 2. Thus, the current source 44 shown in fig. 2A discharges the capacitor C11, and the voltage V11 drops. The reference voltage Vref3 shown in fig. 2A is set to be higher than the voltage V11 that rises and falls in a short period of time. Therefore, the comparator 45 outputs the detection signal FE of high level.

The lower stage of fig. 2B shows the change in voltage V11 corresponding to fig. 3B. If the gate voltage Vsg becomes lower than the reference voltage Vref1 at time t1, the capacitor C11 is charged by the current source 43 shown in fig. 2A, and the voltage V11 rises. In the case where the ignition plug 6 shown in fig. 1 and 5 does not normally generate a spark, the gate voltage Vsg becomes lower than the reference voltage Vref2 at time t 3. Thus, the current source 44 shown in fig. 2A discharges the capacitor C11, and the voltage V11 drops.

During the period from the time t1 to the time t3, the voltage V11 becomes higher than the reference voltage Vref 3. Thus, the comparator 45 outputs the detection signal FE at a low level. If the voltage V11 falls to become lower than the reference voltage Vref3, the comparator 45 outputs the detection signal FE of high level.

The signal output circuit 28 shown in fig. 1 and 2A generates the ignition acknowledge signal IGF from the detection signal FE.

Fig. 4 is a waveform diagram showing an example of the operation of the igniter 4.

The ECU7 shown in fig. 1 outputs a pulse-shaped ignition instruction signal IGT in a predetermined ignition cycle. Fig. 4 shows N periods, N +1 periods, and N +2 periods. In addition, a case where the ignition is normally performed in the N cycle and the ignition is not performed in the N +1 cycle will be described.

In the N period, the igniter 4 turns on the transistor 31 of the switching element 12 while the ignition indication signal IGT is at the high level. If the transistor 31 is turned on, the battery voltage VBAT is applied between the two terminals of the primary coil 2a, and the current flowing via the primary coil 2a and the transistor 31, i.e., the collector current Ic of the transistor 31, increases with time.

The overcurrent protection circuit 27 shown in fig. 1 generates a pulse-like detection signal CE based on the collector current Ic that rises during the period in which the ignition instruction signal IGT is at the high level.

When the ignition instruction signal IGT goes low, the igniter 4 turns off the transistor 31 to cut off the collector current Ic, that is, the primary current of the primary coil 2 a. At this time, a primary voltage V1 proportional to the time derivative of the current Ic is generated in the primary coil 2 a. In addition, a secondary voltage V2 proportional to the primary voltage V1 is generated in the secondary coil 2 b.

In the case where a spark is normally generated, the gate-emitter voltage VGE (gate voltage Vsg) and the collector current Ic decrease in a short period of time. Therefore, the state detection circuit 26 shown in fig. 1 and 2A outputs the detection signal FE of high level.

Next, in the N +1 cycle, the igniter 4 turns on the transistor 31 of the switching element 12 while the ignition indication signal IGT is at the high level. The overcurrent protection circuit 27 shown in fig. 1 generates a pulse-like detection signal CE based on the collector current Ic that rises during the period in which the ignition instruction signal IGT is at the high level.

If the ignition instruction signal IGT goes low, the igniter 4 turns off the transistor 31 to cut off the collector current Ic, that is, the primary current of the primary coil 2 a. Without generating a spark, the collector current Ic and the gate-emitter voltage VGE decrease over a long period of time. The state detection circuit 26 shown in fig. 1 and 2A generates the low-level detection signal FE based on the gate-emitter voltage VGE (gate voltage Vsg). It is possible to easily confirm a spark occurrence error (misfire) from the ignition confirmation signal IGF obtained by synthesizing the detection signal FE.

As shown in fig. 2A, the state detection circuit 26 charges and discharges the capacitor C11 based on the output signals S11 and S12 of the comparators 41 and 42 comparing the gate voltage Vsg with the reference voltages Vref1 and Vref2, and outputs the detection signal FE based on the charge voltage V11 of the capacitor C11. Therefore, even when the gate voltage Vsg fluctuates due to noise or the like, malfunction according to the noise can be suppressed. For example, if the gate voltage Vsg is lower than the reference voltage Vref1, the charging of the capacitor C11 is started by the current I11 flowing due to the current source 43 activated according to the output signal S11 of the comparator 41. Then, if the gate voltage Vsg becomes higher than the reference voltage Vref1 due to noise or the like, the current source 43 is inactivated according to the output signal S11 of the comparator 41. That is, the charging voltage V11 of the capacitor C11 does not decrease unless the charging of the capacitor C11 is stopped. Then, if the gate voltage Vsg becomes lower than the reference voltage Vref1 again, the charging of the capacitor C11 is restarted by the current source 43 activated in accordance with the output signal S11 of the comparator 41. Thus, the variation of the charging voltage V11 of the capacitor C11 due to noise or the like is suppressed, and therefore, the erroneous determination of the comparator 45 due to the charging voltage V11 of the capacitor C11 is suppressed.

(encapsulation of igniter)

Fig. 6, 7, and 8 show the package of the igniter 4. Fig. 6 and 7 show the appearance of the package. Fig. 8 shows the components of the igniter 4 mounted on the lead frame. Fig. 8 shows the sealing resin 51 by a two-dot chain line.

As shown in fig. 6 and 7, the igniter 4 includes a sealing resin 51 sealing a part of the lead frame and the constituent members of the igniter 4, and a plurality of lead frames F1, F2, F3, F4, F5, and F6 protruding from the sealing resin 51. The sealing resin 51 is formed into a substantially cubic shape, and the lead frames F1 to F6 protrude from one side surface. The igniter 4 further includes a lead frame F7 embedded in the sealing resin 51. As the lead frames F1 to F7, a metal having conductivity, for example, copper (Cu), a Cu alloy, nickel (Ni), a Ni alloy, or a 42 alloy can be used. Further, the lead frames F1 to F7 may be plated with Pd, Ag, Ni/Pd/Ag, or the like. The sealing resin 51 may be a resin having insulating properties, such as an epoxy resin.

As shown in fig. 8, lead frames F1 to F6 include mounting portions B1 to B6 and lead portions T1 to T6 extending from mounting portions B1 to B6. The lead portions T1 to T6 correspond to the terminals of the igniter 4.

A resistor R1 is connected between the mounting portion B1 of the lead frame F1 and the lead frame F7. A capacitor C1 is connected between the mounting portion B1 of the lead frame F1 and the mounting portion B2 of the lead frame F2. The capacitor C1 is mounted to the lead portions T1 and T2 of the lead frames F1 and F2 with respect to the resistor R1. Further, a capacitor C2 is connected between the mounting portion B2 of the lead frame F2 and the lead frame F7. The capacitor C2 is mounted on the opposite side of the capacitor C1 with the resistor R1 interposed therebetween. The resistor R1 and the capacitors C1, C2 are connected by silver (Ag) paste, solder, or the like, for example.

The switch control device 11 is mounted on the mounting portion B2 of the lead frame F2, and the switching element 12 is mounted on the mounting portion B6 of the lead frame F6. The switch control device 11 is an IC chip forming the switch control circuit 11 shown in fig. 1 and 2A. The switching control device 11 and the switching element 12 are connected by, for example, silver paste, solder, or the like. The switching element 12 has a collector electrode PC (see fig. 10) on a lower surface thereof, and the collector electrode PC is connected to the mounting portion B6 by silver paste, solder, or the like.

Gate pad PG and emitter pad PE corresponding to gate terminal G and emitter terminal E shown in fig. 1 are exposed on the upper surface of switching element 12.

Pads P1, P2, P4, P5, P6, P7, and P8 corresponding to the respective terminals shown in fig. 1 are exposed on the upper surface of the switch control device 11. The pad P1 is connected to the lead frame F7 by a wire W1. The pad P2 is connected to the mounting portion B2 of the lead frame F2 by a wire W2. The pad P4 is connected to the mounting portion B4 of the lead frame F4 by a wire W4. The pad P5 is connected to the mounting portion B5 of the lead frame F5 by a wire W5. The pad P6 is connected to the gate pad PG of the switching element 12 by a wire W6. The pad P7 is connected to the emitter pad PE of the switching element 12 by a wire W7. The emitter pad PE of the switching element 12 is connected to the mounting portion B2 of the lead frame 2 via a wire W9. The pad P8 of the switch control device 11 is connected to the mounting portion B2 of the lead frame F2 by a wire W8.

The wires W1, W2, W4, W5, W6, W7, W8 are, for example, aluminum wires with a diameter of, for example, 125 μm. The wire W9 is, for example, an aluminum wire, having a diameter of, for example, 250 μ 0. The resistance value of the wire W9 is several meters to several tens of meters, for example, 5 meters. The resistance component of the wire W9 functions as the resistor R2 shown in fig. 1.

(plan view)

As shown in fig. 9, the switching element 12 is formed in a rectangular shape, and has a gate electrode (gate pad) PG and an emitter electrode (emitter pad) PE formed on an upper surface thereof, and a collector electrode PC formed on a lower surface thereof (see fig. 10). The switching element 12 has a cell portion in which a plurality of transistors are formed, and a protective element 32 shown in fig. 1 is formed on an outer peripheral portion.

(Cross-sectional Structure of switching element (Unit portion))

Fig. 10 is a schematic diagram showing a schematic cross section of a unit portion of the switching element 12.

In the switching element 12, an N + buffer layer 62 and an N-epitaxial layer 63 are formed on the upper surface of a P + substrate 61, and a collector electrode PC is formed on the lower surface of the P + substrate 61. The thickness from the lower surface of the P + substrate 61 to the upper surface of the N-epitaxial layer 63 is, for example, 260 μm. The thickness of the P + substrate 61 is, for example, 150 μm, and the total thickness of the N + buffer layer 62 and the N-epitaxial layer 63 is, for example, 90 μm.

An N + diffusion region 64 is formed on the upper surface of the N-epitaxial layer 63. P + diffusion regions 65 are selectively formed in the N + diffusion regions 64, and P + + diffusion regions 66 having a higher concentration than the P + diffusion regions 65 and N + + diffusion regions 67 having a higher concentration than the N + diffusion regions 64 are selectively formed in the P + diffusion regions 65.

A gate electrode 69 is disposed on N + diffusion region 64 and P + diffusion region 65 sandwiched between P + diffusion regions 65 with gate oxide film 68 interposed therebetween, and gate electrode 69 is covered with interlayer insulating film 70. The gate oxide film 68 is, for example, a silicon oxide film. The gate electrode 69 is formed of, for example, polysilicon. The interlayer insulating film 70 is, for example, a silicon oxide film, a titanium film/titanium nitride film (Ti/TiN).

An emitter wiring 71 is formed on the interlayer insulating film 70. The emitter wiring 71 is, for example, AlSiCu. The thickness of the emitter wiring 71 is 4 degrees, for example. A protective layer 72 is formed on the emitter wiring 71. The protective layer 72 is, for example, polyimide resin.

(Cross-sectional Structure of switching element (outer peripheral part))

Fig. 11 is a schematic diagram showing a schematic cross section of the outer peripheral portion of the switching element 12.

P + diffusion regions 73 and N + diffusion regions 74 are selectively formed in N-epitaxial layer 63. An oxide film 75 is selectively formed on the N-epitaxial layer 63. Oxide film 75 is formed thick on N-epitaxial layer 63 and thin on P + diffusion region 73.

A polysilicon layer 76 is formed on the oxide film 75. A silicon oxide film 77 is formed on the polysilicon layer 76. The polysilicon layer 76 is connected to gate fingers 78. The gate finger 78 also serves as a gate-side electrode of the protection element 32 between the gate and the collector of the transistor 31.

N regions 76N and P regions 76P are alternately formed in the polysilicon layer 76. These N region 76N and P region 76P constitute the gate-collector protection element 32 of the transistor 31 shown in fig. 1.

As described above, according to the present embodiment, the following effects are obtained.

(1-1) the state detection circuit 26 detects a state based on the gate voltage Vsg and outputs a detection signal FE. Then, the signal output circuit 28 synthesizes the detection signal FE of the state detection circuit 26 with other signals to generate an ignition confirmation signal IGF. The ignition confirmation signal IGF thus synthesized makes it possible to easily grasp the occurrence error (misfire condition) of the spark (spark) of the ignition plug 6.

(1-2) the state detection circuit 26 outputs an ignition acknowledge signal IGF from the signal output terminal P4. Therefore, the detection results of the plurality of detection circuits can be outputted from the single signal output terminal P4, and the size increase of the igniter 4 can be suppressed.

(1-3) the state detection circuit 26 charges and discharges the capacitor C11 based on the output signals S11 and S12 of the comparators 41 and 42 comparing the gate voltage Vsg with the reference voltages Vref1 and Vref2, and outputs the detection signal FE based on the charge voltage V11 of the capacitor C11. Therefore, even when the gate voltage Vsg fluctuates due to noise or the like, malfunction according to the noise can be suppressed.

(modified example of the first embodiment)

A modified example of the first embodiment will be described below. In the following description, the same members as those in the first embodiment are given the same reference numerals, and some or all of the description may be omitted.

As shown in fig. 12, the switch control circuit 11a includes an output buffer 101 and a signal output terminal P3 connected to an output terminal of the output buffer 101. The detection signal FE output from the comparator 45 of the state detection circuit 26 is input to the output buffer 101. That is, the switch control circuit 11a includes a dedicated signal output terminal P3 for outputting a signal FA indicating the state of ignition. This signal FA is an example of a single ignition detection signal that does not contain other detection signals.

As shown in fig. 13, the switch control circuit 11a outputs a pulse-like detection signal CE in the N period, N +1 period, and N +2 period based on the collector current Ic. Then, the state detection circuit 26 outputs a signal FA corresponding to the state of ignition until the next ignition instruction signal IGT of N +2 cycles, in correspondence with the gate-emitter voltage VGE (gate voltage Vsg) that changes in accordance with the ignition instruction signal IGT of N +1 cycles. By separately outputting the signal FA for the detection signal CE in this way, the state of ignition can be easily confirmed in the ECU 7. Further, by outputting the signal FA before the ignition indication signal IGT of the N +2 cycle, the pulse width and the like of the ignition indication signal IGT in the next N +2 cycle can be adjusted.

As shown in fig. 14, the switch control circuit 11b includes a signal output circuit 28 b. The signal output circuit 28b is supplied with a reception signal Sdet that has received the ignition instruction signal IGT from the signal detection circuit 23.

As shown in fig. 15, the signal output circuit 28b generates an ignition confirmation signal IGF corresponding to a detection signal of the overcurrent protection circuit 27 or the like in a period when the ignition indication signal IGT is at a high level, and generates an ignition confirmation signal IGF corresponding to the detection signal FE of the state detection circuit 26 in a period when the ignition indication signal IGT is at a low level, based on the reception signal Sdet. By such a switch control circuit 11b, it is not necessary to separately prepare a terminal for outputting the detection signal FE corresponding to the state, and it is possible to suppress an increase in size of the switch control circuit 11b and to easily confirm the state of ignition in the ECU 7. Further, by outputting the detection signal FE before the ignition indication signal IGT of the N +2 cycle, the pulse width and the like of the ignition indication signal IGT in the next N +2 cycle can be adjusted.

As shown in fig. 16, the switch control circuit 11c includes a state detection circuit 26 c. The state detection circuit 26C includes comparators 41 and 42, voltage-dividing resistors R21 and R22, inverter circuits 111 and 113, a NAND gate (NAND) circuit 112, a charge/discharge circuit 120, a capacitor C11, transistors M21 and M22, and a comparator 45. The transistors M21, M22 are NMOSFETs, for example.

The voltage dividing resistors R21 and R22 are connected between the output terminal P6 and the ground wiring AGND. Output nodes of the voltage dividing resistors R21 and R22 are connected to non-inverting input terminals of the comparators 41 and 42. The threshold voltage Vth1 is supplied to the inverting input terminal of the comparator 41, and the threshold voltage Vth2 is supplied to the inverting input terminal of the comparator 42. The output terminal of the comparator 41 is connected to the input terminal of the nand gate circuit 112, and the output terminal of the comparator 42 is connected to the input terminal of the nand gate circuit 112 via the inverter circuit 111. The output terminal of the nand gate 112 is connected to the gate terminal of the transistor M21 via the inverter circuit 113. The source terminal of the transistor M21 is connected to a ground line AGND, and the drain terminal of the transistor M21 is connected to the input node N21 of the charge/discharge circuit 120.

The charge/discharge circuit 120 includes a current source 121 and transistors Q1 to Q5. The transistors Q1 to Q3 are, for example, PNP transistors, and the transistors Q4 and Q5 are, for example, NPN transistors. Emitters of the transistors Q1 to Q3 are connected to the power supply line VDD. A collector of the transistor Q1 is connected to a first terminal of the current source 121, and a second terminal of the current source 121 is connected to the ground wiring AGND. The bases of the transistors Q2, Q3 are connected to the base and collector of the transistor Q1. The transistors Q1, Q2, and Q3 constitute a current mirror circuit. The transistors Q2 and Q3 are configured to flow the same amount of current as the current flowing through the transistor Q1.

Collectors of the transistors Q2 and Q3 are connected to collectors of the transistors Q4 and Q5, and emitters of the transistors Q4 and Q5 are connected to a ground line AGND. The collector of the transistor Q5 (input node N21) is connected to the bases of two transistors Q4 and Q5. An output node N22 between the transistor Q2 and the transistor Q4 is connected to the capacitor C11. The transistor Q4 is formed of, for example, a plurality of transistors connected in parallel, and is configured to flow a current that is an integral multiple of the current flowing through the transistor Q5.

The capacitor C11 is connected in parallel with a transistor M22, and the reception signal Sdet is supplied to the gate of the transistor M22. Note that various detection signals inside the switch control circuit 11c or signals obtained by synthesizing various signals may be supplied to the gate of the transistor M21.

The output terminal of the comparator 45 is connected to the set terminal S of the flip-flop circuit 130, and the signal supplied to the gate of the transistor M22 and the reception signal Sdet are supplied to the reset terminal R of the flip-flop circuit 130. The flip-flop circuit 130 outputs an ignition acknowledge signal IGF from the output terminal Q.

In the state detection circuit 26C, the charge/discharge circuit 120 charges the capacitor C11 while the transistor M21 is turned on, and discharges the capacitor C11 while the transistor M21 is turned off. The flip-flop circuit 130 is set based on the detection signal FE of the comparator 45 that detects the voltage V11 of the capacitor C11, and an ignition confirmation signal IGF corresponding to the state of ignition is output from the output terminal Q of the flip-flop circuit 130. Then, the transistor M22 is turned on by the reception signal Sdet supplied to the gate of the transistor M22, the voltage V11 of the capacitor C11 is set to a low level, and the flip-flop circuit 130 is reset.

As shown in fig. 17, the ignition device 1a includes an ignition coil 2 and an igniter 4 a. The igniter 4a includes a switching element 12a, a switching control circuit 11, a resistor R1, capacitors C1, C2, and a resistor R2, and is modularly housed in one package. The switching control circuit 11 includes a low-voltage protection circuit 21, an overvoltage protection circuit 22, a signal detection circuit 23, an overvoltage protection circuit 24, a gate driver 25, a state detection circuit 26, an overcurrent protection circuit 27, and a signal output circuit 28.

The switching element 12a is configured as one semiconductor chip including a transistor 31 a. The transistor 31a is, for example, a SiCMOSFET. A protection element 32 is connected between the gate and the drain of the transistor 31 a. Each terminal (S, G, D) of the transistor 31a may be described as a terminal of a semiconductor chip, that is, the switching element 12 a. The gate terminal of the transistor 31a is connected to the output terminal P6 of the switch control circuit 11 via a resistor. The gate signal Sg output from the gate driver 25 is supplied to the gate terminal G of the switching element 12a via the output terminal P6. The source terminal of the transistor 31a is connected to the resistor R2, and the drain terminal of the transistor 31a is connected to the primary coil 2a of the ignition coil 2 via the output terminal T6.

The igniter 4a performs switching control of the switching element 12a based on the ignition instruction signal IGT supplied from the ECU 7. By switching of the switching element 12a, the ignition plug 6 is caused to generate a spark (spark) by the secondary voltage V2 generated in the secondary coil 2b of the ignition coil 2. The state detection circuit 26 of the switching control circuit 11 outputs a detection signal FE corresponding to a voltage of the gate terminal G of the transistor 31a controlling the switching element 12a as a detection voltage. The signal output circuit 28 synthesizes various signals including the detection signal CE of the overcurrent protection circuit 27 and the detection signal FE of the state detection circuit 26 to generate an ignition confirmation signal IGF, and outputs the ignition confirmation signal IGF. The switch control circuit 11 may be the switch control circuit 11a in fig. 12, the switch control circuit 11b in fig. 14, or the like.

In this way, in the igniter 4a including the switching element 12a including the transistor 31a as the SiC MOSFET, for example, the occurrence error (misfire condition) of the spark (spark) in the ignition plug 6 can be easily grasped from the ignition confirmation signal IGF as in the first embodiment.

(second embodiment)

The second embodiment is explained below.

In the present embodiment, the same constituent elements as those in the above-described embodiment are given the same reference numerals, and the description thereof is omitted.

As shown in fig. 18, the ignition device 200 includes an ignition coil 2 and an igniter 201.

The igniter 201 includes the switching element 12, the switching control circuit 211, the resistor R1, the capacitors C1, C2, and the resistor R2, and is modularly housed in one package.

The switch control circuit 211 includes a low-voltage protection circuit 21, an overvoltage protection circuit 22, a signal detection circuit 23, an overvoltage protection circuit 24, a gate driver 25, a state detection circuit 226, an overcurrent protection circuit 27, and a signal output circuit 28.

The state detection circuit (Ignition Status Detector)226 outputs a detection signal FE corresponding to a change in the detection voltage, using the voltage corresponding to the collector current Ic of the transistor 31 of the switching element 12 as the detection voltage. The state detection circuit 226 of the present embodiment detects the ignition state of the ignition plug 6 based on the emitter current Ie (collector current Ic) flowing through the resistor R2, and outputs a detection signal FE. A first terminal of the resistor R2 is connected to the emitter of the switching element 12, and a second terminal of the resistor R2 is connected to the ground wiring AGND. Therefore, the state detection circuit 226 detects the ignition state of the ignition plug 6 based on the voltage Ve at the node N31 (detection node between the switching element 12 and the resistor R2) that changes in accordance with the collector current Ic. For example, the state detection circuit 226 outputs the detection signal FE at a high level when the ignition plug 6 is in a normal state in which spark (spark) is generated, that is, normal ignition, and outputs the detection signal FE at a low level when the ignition plug is in a misfire state in which spark (spark) is not generated, that is, normal ignition is not performed.

As shown in fig. 19, the state detection circuit 226 includes comparators 41 and 42, current sources 43 and 44, a capacitor C11, and a comparator 45.

The inverting input terminals of the comparators 41 and 42 are connected to the input terminal P7, and supplied with the voltage Ve.

The reference voltage Vref1 is supplied to the non-inverting input terminal of the comparator 41, and the reference voltage Vref2 is supplied to the non-inverting input terminal of the comparator 42. The reference voltages Vref1, Vref2 are set in accordance with changes in the voltage Ve.

The comparator 41 compares the voltage Ve with the reference voltage Vref1, and outputs a signal S11 at a level corresponding to the comparison result. The comparator 42 compares the voltage Ve with the reference voltage Vref2, and outputs a signal S12 at a level corresponding to the comparison result.

A first terminal of the current source 43 is connected to the power supply wiring VDD, and is supplied with the driving voltage VDD. A second terminal of the current source 43 is connected to a first terminal of the capacitor C11, and a second terminal of the capacitor C11 is connected to the ground wiring AGND. The current source 44 is connected in parallel with the capacitor C11.

The current source 43 is activated or deactivated in response to the output signal S11 of the comparator 41. The activated current source 43 flows a predetermined current I11. By the current I11, electric charge is accumulated in the capacitor C11, and the voltage V11 of the first terminal of the capacitor C11 rises.

Current source 44 is activated or deactivated in response to output signal S12 of comparator 42. The activated current source 44 flows a predetermined current I12. The current I12 discharges the charge in the capacitor C11, and the voltage V11 at the first terminal of the capacitor C11 drops.

A first terminal of the capacitor C11 is connected to a non-inverting input terminal of the comparator 45, and a reference voltage Vref3 is supplied to an inverting input terminal of the comparator 45.

The comparator 45 compares the voltage V11 of the first terminal of the capacitor C11 with the reference voltage Vref3, and outputs a detection signal FE corresponding to the comparison result.

The detection signal FE output from the comparator 45 and the detection signal CE output from the overcurrent protection circuit 27 shown in fig. 1 are input to the signal output circuit 28. Further, a clock signal CLK of a predetermined frequency is supplied from an Oscillation Section (OSC)29 to the signal output circuit 28.

The clock signal CLK is, for example, a system clock, a signal obtained by dividing the system clock, and is used for receiving the ignition control signal.

The signal output circuit operates based on the clock signal CLK and outputs an ignition confirmation signal IGF obtained by synthesizing the detection signals FE and CE.

Fig. 20A and 20B show changes in the collector-emitter voltage Vce, the collector current Ic, and the gate-emitter voltage VGE (gate voltage Vsg) of the switching element 12 (transistor 31).

As shown in fig. 20A, when a spark is normally generated, energy is lost, the collector current Ic of the transistor 31 rapidly decreases, and the collector-emitter voltage Vce rapidly decreases in accordance with the collector current Ic. Then, collector current Ic and gate-emitter voltage VGE (gate voltage Vsg) become the low potential level (0). Thus, when the ignition of the ignition plug 6 is normal, the gate-emitter voltage VGE (gate voltage Vsg) and the collector current Ic decrease to predetermined levels in a short period of time.

As shown in fig. 20B, when the spark plug 6 is not sparking (spark), the collector-emitter voltage Vce is maintained at a high voltage. The gate-emitter voltage VGE (gate voltage Vsg) gradually decreases, and the collector current Ic gradually decreases while repeating rising and falling due to the parasitic capacitance and inductance of the ignition coil 2. Then, if the gate-to-emitter voltage VGE (gate voltage Vsg) and the collector current Ic become lower than predetermined values, the collector-to-emitter voltage Vce decreases.

In this way, the gate-emitter voltage VGE (gate voltage Vsg) and the collector current Ic decrease in accordance with the state of the ignition plug 6, and the period during which the collector-emitter voltage Vce is maintained at the high level differs.

The state detection circuit 226 shown in fig. 19 detects the state of the ignition plug 6 based on these voltage changes, and outputs a detection signal FE. In the present embodiment, state detection circuit 226 detects a state based on voltage Ve corresponding to collector current Ic and outputs detection signal FE. Then, the signal output circuit 28 synthesizes the detection signal FE of the state detection circuit 26 with other signals to generate an ignition confirmation signal IGF. By outputting the ignition confirmation signal IGF thus synthesized from the signal output terminal P4, the detection results of the plurality of detection circuits can be output from one signal output terminal P4, and the size increase of the igniter 201 can be suppressed.

As shown in FIG. 19, the state detection circuit 226 compares the collector current Ic (emitter voltage Ve: detection voltage shown in FIG. 18) with the reference voltages Vref1, Vref2 by the comparators 41, 42. As shown in fig. 20B, the reference voltages Vref1 and Vref2 are set in correspondence with a period (a period indicated by an arrow) during which the collector-emitter voltage Vce is maintained at a high level with respect to the collector current Ic.

The capacitor C11 is charged in accordance with the output signal S11 of the comparator 41, and the capacitor C11 is discharged in accordance with the output signal S12 of the comparator 42. Therefore, the voltage V11 at the first terminal of the capacitor C11 corresponds to the change in the collector current Ic shown in fig. 20A and 20B.

As shown in fig. 20B, the collector current Ic gradually decreases while repeating rising and falling due to the parasitic capacitance and inductance of the ignition coil 2. Therefore, after the detected voltage Ve based on the collector current Ic is lower than the reference voltage Vref1, the detected voltage Ve may become higher than the reference voltage Vref 1. In this case, the charging of the capacitor C11 is interrupted in accordance with the output signal S11 of the comparator 41 shown in fig. 19. Then, if the detection voltage Ve is lower than the reference voltage Vref1 again, the charging of the capacitor C11 is restarted.

As described above, according to the present embodiment, the following effects are obtained.

(2-1) the state detection circuit 226 detects a state based on the detection voltage Ve corresponding to the collector current Ic of the transistor 31 and outputs a detection signal FE. Then, the signal output circuit 28 synthesizes the detection signal FE of the state detection circuit 26 with other signals to generate an ignition confirmation signal IGF. The state of the spark (spark) of the ignition plug 6 can be easily grasped from the ignition confirmation signal IGF thus synthesized.

(modified example of the second embodiment)

Next, a modified example of the second embodiment will be described. In the following description, the same members as those of the first and second embodiments and the respective modified examples are given the same reference numerals, and some or all of the description may be omitted.

As shown in fig. 21, the switch control circuit 211a includes an output buffer 101 and a signal output terminal P3 connected to an output terminal of the output buffer 101. The detection signal FE output from the comparator 45 of the state detection circuit 226 is input to the output buffer 101. That is, the switch control circuit 211a includes a dedicated signal output terminal P3 for outputting a signal FA indicating the state of ignition. By outputting the signal FA separately for the ignition confirmation signal IGF in this way, the ECU7 can easily confirm the state of ignition. Further, by outputting the signal FA before the ignition indication signal IGT of the N +2 cycle, the pulse width and the like of the ignition indication signal IGT in the next N +2 cycle can be adjusted.

As shown in fig. 22, the switch control circuit 211b includes a signal output circuit 28 b. The signal output circuit 28b is supplied with a reception signal Sdet that has received the ignition instruction signal IGT from the signal detection circuit 23. By such a switch control circuit 211b, it is not necessary to separately prepare a terminal for outputting the signal FE corresponding to the state, and it is possible to suppress an increase in size of the switch control circuit 211b and to easily confirm the state of ignition in the ECU 7. As described with reference to fig. 15, the pulse width of the ignition indication signal IGT in the next N +2 period can be adjusted by outputting the signal FE before the ignition indication signal IGT in the N +2 period.

< addition >

As shown in fig. 23, the ignition device 200a includes an ignition coil 2 and an igniter 201 a.

The igniter 201a includes the switching element 12a, the switch control circuit 211, the resistor R1, the capacitors C1, C2, and the resistor R2, and is modularly housed in one package.

The switch control circuit 211 includes a low-voltage protection circuit 21, an overvoltage protection circuit 22, a signal detection circuit 23, an overvoltage protection circuit 24, a gate driver 25, a state detection circuit 226, an overcurrent protection circuit 27, and a signal output circuit 28.

The switching element 12a is configured as one semiconductor chip including a transistor 31 a. The transistor 31a is, for example, a SiCMOSFET. The state detection circuit 226 of the switch control circuit 211 outputs a detection signal FE corresponding to a change in the detection voltage, using the voltage Vs corresponding to the drain current Id of the transistor 31a of the switching element 12a as the detection voltage. For example, the state detection circuit 226 detects the ignition state of the ignition plug 6 based on the source current Is (drain current Id) flowing through the resistor R2, and outputs a detection signal FE. The signal output circuit 28 synthesizes various signals including the detection signal CE of the overcurrent protection circuit 27 and the detection signal FE of the state detection circuit 226 to generate an ignition confirmation signal IGF, and outputs the ignition confirmation signal IGF. As the switch control circuit 211, a switch control circuit 211a in fig. 21, a switch control circuit 211b in fig. 22, or the like may be used.

In this way, in the igniter 201a including the switching element 12a including the transistor 31a as the SiC MOSFET, for example, the occurrence error (misfire condition) of the spark (spark) of the ignition plug 6 can be easily grasped from the ignition confirmation signal IGF as in the second embodiment.

(third embodiment)

The third embodiment is explained below.

In the present embodiment, the same constituent members as those in the above-described embodiment are given the same reference numerals, and all or part of the description thereof may be omitted.

As shown in fig. 24, the ignition device 300 of the present embodiment includes an ignition coil 2 and an igniter 301.

The igniter 301 includes the switching element 12, the switch control circuit 311, the resistor R1, the capacitors C1, C2, the resistor R2, and the resistor R31, and is modularly housed in one package.

The switch control circuit 311 includes a high-side power supply terminal P1, a low-side power supply terminal P2, an output terminal P4, an input terminal P5, an output terminal P6, input terminals P7, P8, and an input terminal P11. The switch control circuit 311 inputs the ignition instruction signal IGT via the input terminal P5. The switch control circuit 311 outputs an ignition acknowledge signal IGF from the output terminal P4. The switch control circuit 311 detects the emitter current Ie of the switching element 12 from the potential difference between the two terminals of the resistor R2 connected to the input terminals P7 and P8.

The input terminal P11 of the switch control circuit 311 is connected to a first terminal of the resistor R31, and a second terminal of the resistor R31 is connected to the collector terminal C of the switching element 12.

The switch control circuit 311 includes a low-voltage protection circuit 21, an overvoltage protection circuit 22, a signal detection circuit 23, an overvoltage protection circuit 24, a gate driver 25, a state detection circuit 326, an overcurrent protection circuit 27, and a signal output circuit 28.

The state detection circuit 326 is connected to a first terminal of the resistor R31 via the input terminal P11. That is, the state detection circuit 326 is connected to the collector terminal C of the switching element 12 via the resistor R31.

The state detection circuit 326 outputs a detection signal FE corresponding to a change in the detection voltage Vc2, using a voltage corresponding to the collector voltage Vc of the transistor 31 of the switching element 12 as the detection voltage Vc 2. The state detection circuit 326 of the present embodiment is connected to the collector terminal C of the switching element 12 via a resistor R31. Therefore, state detection circuit 326 inputs a voltage proportional to collector voltage Vc as detection voltage Vc 2. The resistor R31 is, for example, a high withstand voltage resistor. Further, a plurality of resistors having a lower withstand voltage than the resistor R31 may be connected in series for use.

The threshold voltage Vth1 corresponding to the detection voltage Vc2 is set for the state detection circuit 326. The state detection circuit 326 compares the detection voltage Vc2 with the threshold voltage Vth1 in magnitude to detect the state of the ignition plug 6. Then, the state detection circuit 326 outputs the detection signal FE at a level corresponding to the detected state. In the present embodiment, the state detection circuit 326 monitors the time when the detection voltage Vc2 exceeds the threshold voltage Vth1, and detects the state of the ignition plug 6 in accordance with the time. Then, the state detection circuit 326 outputs the detection signal FE at a level corresponding to the detected state.

The signal output circuit 28 synthesizes various signals including the detection signal CE of the overcurrent protection circuit 27 and the detection signal FE of the state detection circuit 326 to generate an ignition confirmation signal IGF, and outputs the ignition confirmation signal IGF. The ignition confirmation signal IGF is supplied to the ECU7 via the signal output terminal P4 of the switch control circuit 11 and the signal output terminal T4 of the igniter 4.

The switching element 12 includes a transistor 31 and a protection element 32, and is integrated on one semiconductor substrate manufactured by a high withstand voltage process. The protection element 32 operates as a voltage clamping element for clamping a voltage (an emitter-collector voltage) applied to the transistor 31, and protects the transistor 31.

As shown in fig. 25, the state detection circuit 326 includes a comparator 41, current sources 43 and 44, a capacitor C11, a comparator 45, and a resistor R32.

The inverting input terminal of the comparator 41 is connected to the resistor R31 of fig. 24 via the input terminal P11. An inverting input terminal of the comparator 41 is connected to a first terminal of the resistor R32, and a second terminal of the resistor R32 is connected to the ground wiring AGND. The resistor R32 constitutes a voltage dividing resistor that divides the collector voltage Vc together with the resistor R31 in fig. 24. The resistor R31 corresponds to a "first resistor", and the resistor R32 corresponds to a "second resistor". That is, divided voltage Vc2 obtained by dividing collector voltage Vc by the resistance ratio of resistance R31 and resistance R32 in fig. 24 is supplied to the inverting input terminal of comparator 41. The divided voltage Vc2 is proportional to the collector voltage Vc, and therefore may be referred to as the collector voltage of the switching element 12. Setting the resistance values of the resistors R31, R32 enables generation of collector voltage Vc2 that can be input to the comparator 41. For example, the resistance value of the resistor R31 and the resistance value of the resistor R32 may be 100: 1.

the reference voltage Vth1 is supplied to the non-inverting input terminal of the comparator 41. Reference voltage Vth1 is set in accordance with a change in collector voltage Vc 2. Comparator 41 compares collector voltage Vc2 with reference voltage Vth1, and outputs signal S11 at a level corresponding to the comparison result.

A first terminal of the current source 43 is connected to the power supply wiring VDD, and is supplied with the driving voltage VDD. A second terminal of the current source 43 is connected to a first terminal of the capacitor C11, and a second terminal of the capacitor C11 is connected to the ground wiring AGND. The current source 44 is connected in parallel with the capacitor C11.

The current source 43 is activated or deactivated in response to the output signal S11 of the comparator 41. The activated current source 43 flows a predetermined current I11. By the current I11, electric charge is accumulated in the capacitor C11, and the voltage V11 of the first terminal of the capacitor C11 rises. The current source 44 flows a predetermined current I12. The current I12 discharges the charge in the capacitor C11, and the voltage V11 at the first terminal of the capacitor C11 drops.

A first terminal of the capacitor C11 is connected to a non-inverting input terminal of the comparator 45, and a reference voltage Vref3 is supplied to an inverting input terminal of the comparator 45. The comparator 45 compares the voltage V11 of the first terminal of the capacitor C11 with the reference voltage Vref3, and outputs a detection signal FE corresponding to the comparison result. The signal output circuit 28 operates based on the clock signal CLK, and outputs an ignition confirmation signal IGF obtained by combining the detection signal FE output from the comparator 45 and the detection signal CE output from the overcurrent protection circuit 27 in fig. 24.

Fig. 26A and 26B show changes in the collector-emitter voltage (collector voltage), the collector current Ic, and the gate-emitter voltage VGE (gate voltage Vsg) of the switching element 12 (transistor 31).

As shown in fig. 26A, if the transistor 31 shown in fig. 24 is turned off to cut off the primary current of the ignition coil 2, a large counter electromotive force is generated in the primary coil 2a of the ignition coil 2 due to the self-inductance effect, and the collector voltage Vc rises sharply. In the secondary coil 2b, a large electromotive force corresponding to the turn ratio is generated due to the mutual inductance effect with the primary coil 2 a. Due to the electromotive force of the secondary coil 2b thus generated, a very high secondary voltage V2 is applied to the ignition plug 6, and the ignition plug 6 generates a spark (spark). When a spark is normally generated, energy is lost, collector current Ic of transistor 31 rapidly decreases, and collector voltage Vc rapidly decreases in accordance with collector current Ic. Thus, when the ignition of the ignition plug 6 is normal, the collector voltage Vc falls to a predetermined level in a short period of time.

As shown in fig. 26B, when spark plug 6 is not sparking (spark), collector voltage Vc (Vc2) is maintained at a high voltage. The gate-emitter voltage VGE (gate voltage Vsg) decreases gradually, and the collector current Ic decreases in accordance with the parasitic capacitance and inductance of the ignition coil 2.

Thus, the period during which collector voltage Vc (Vc2) is maintained at the high level differs according to the state of ignition plug 6. In some cases, the period during which collector voltage Vc (Vc2) is maintained at the high level is longer than the period during which gate-emitter voltage VGE is maintained within a predetermined voltage range. Therefore, when the state is detected using the collector voltage Vc (Vc2), the detection may be easier than when the gate voltage Vsg is used.

State detection circuit 326 of the present embodiment shown in fig. 24 and 25 detects the state of ignition from collector voltage Vc (Vc2) and generates detection signal FE. Then, the signal output circuit 28 synthesizes the detection signal FE of the state detection circuit 326 with other signals to generate the ignition confirmation signal IGF. By outputting the ignition confirmation signal IGF thus synthesized from the signal output terminal P4, the detection results of the plurality of detection circuits can be output from one signal output terminal P4, and the size increase of the igniter 4 can be suppressed.

As shown in fig. 25, the state detection circuit 326 compares the collector voltage Vc2 with the reference voltage Vth1 by the comparator 41. As shown in fig. 26B, reference voltage Vth1 is set in correspondence with a period (a period indicated by an arrow) in which collector voltage Vc (Vc2) is maintained at a high level. Reference voltage Vth is set in accordance with collector voltage Vc2, and collector voltage Vc2 is a value corresponding to the collector voltage Vc and the resistance ratio between resistor R31 in fig. 24 and resistor R32 in fig. 25. For example, reference voltage Vth1 is set so that measured collector voltage Vc is, for example, a period of 100V (volts) to 300V or more, for example, 200V or more. The ratio of the resistance R31 to the resistance R32 is, for example, 100: 1, the reference voltage Vth1 is set to a range of 1V to 3V, for example, 2V.

The capacitor C11 is charged by the current source 43 activated according to the output signal S11 of the comparator 41, and the capacitor C11 is discharged by the current source 44. Therefore, the voltage V11 of the first terminal of the capacitor C11 corresponds to the change in the collector voltage Vc (Vc2) shown in fig. 26A and 26B.

Fig. 27 is a waveform diagram showing an example of the operation of the igniter 301.

The ECU7 shown in fig. 24 outputs a pulse-shaped ignition instruction signal IGT in a predetermined ignition cycle. Fig. 27 shows N periods, N +1 periods, and N +2 periods. In addition, a case where the ignition is normally performed in the N cycle and the ignition is not performed in the N +1 cycle will be described.

In each cycle, the igniter 301 turns on the transistor 31 of the switching element 12 while the ignition indication signal IGT is at the high level. If the transistor 31 is turned on, the battery voltage VBAT is applied between the two terminals of the primary coil 2a, and the current flowing via the primary coil 2a and the transistor 31, i.e., the collector current Ic of the transistor 31, increases with time. The overcurrent protection circuit 27 shown in fig. 24 generates a pulse-shaped detection signal CE based on the collector current Ic that rises based on the ignition instruction signal IGT.

When the ignition instruction signal IGT goes low, the igniter 301 turns off the transistor 31 and cuts off the collector current Ic, that is, the primary current of the primary coil 2 a. At this time, a primary voltage V1 proportional to the time derivative of the current Ic is generated in the primary coil 2 a. In addition, a secondary voltage V2 proportional to the primary voltage V1 is generated in the secondary coil 2 b. In the case where a spark is normally generated, collector voltage Vc decreases for a short period of time. Therefore, the state detection circuit 326 shown in fig. 24 and 25 outputs the detection signal FE at a high level.

Next, in the N +1 cycle, the igniter 301 turns on the transistor 31 of the switching element 12 while the ignition indication signal IGT is at the high level. Further, if the ignition instruction signal IGT goes low, the igniter 301 turns off the transistor 31 to cut off the collector current Ic, that is, the primary current of the primary coil 2 a.

When a spark is not normally generated, collector voltage Vc (Vc2) decreases for a long period of time. State detection circuit 326 shown in fig. 24 and 25 generates low-level detection signal FE from collector voltage Vc (Vc 2). It is possible to easily confirm a spark occurrence error (misfire) from the ignition confirmation signal IGF obtained by synthesizing the detection signal FE.

(encapsulation of igniter)

Fig. 28 is a plan view showing an example of the internal structure of the igniter 301.

Since the external appearance of the igniter 301 is the same as that of the igniter 4 of the first embodiment, drawings and description are omitted.

The igniter 301 includes lead frames F11 to F16, F21 to F24, and a sealing resin 51 for sealing a part of the lead frames F11 to F16 and F21 to F24 and the constituent components of the igniter 301. In fig. 28, the sealing resin 51 is indicated by a two-dot chain line. The sealing resin 51 is formed in a substantially cubic shape, and lead frames F11 to F16 protrude from one side surface as connection terminals (lead portions) T1 to T6 for mounting. That is, the package is a 6 pin SIP (single inline package).

As the lead frames F11 to F16 and F21 to F24, metals having conductivity, such as Cu, Cu alloy, Ni alloy, and 42 alloy, can be used. Further, the surfaces of the lead frames F11 to F16 and F21 to F24 may be plated with Pd, Ag, Ni/Pd/Ag, or the like.

The sealing resin 51 may be a resin having insulating properties, such as an epoxy resin. In addition, the sealing resin 51 is colored in a predetermined color (for example, black).

The lead frames F11 to F16 include mounting portions B11 to B16, and lead portions T1 to T6 extending from the mounting portions B11 to B16. The lead portions T1 to T6 correspond to the terminals of the igniter 301.

A resistor R1 is connected between the mounting portion B11 of the lead frame F11 and the lead frame F21. A capacitor C1 is connected between the mounting portion B11 of the lead frame F11 and the mounting portion B12 of the lead frame F12. The capacitor C1 is mounted on the lead portion T1 of the lead frame F11 with respect to the resistor R1. A capacitor C2 is connected between the mounting portion B12 of the lead frame F12 and the lead frame F21. The capacitor C2 is mounted on the opposite side of the capacitor C1 with the resistor R1 interposed therebetween. The resistor R1 and the capacitors C1, C2 are connected to the respective lead frames by silver paste, solder, or the like, for example.

The switch controller 311 is mounted on the mounting portion B12 of the lead frame F12. The switch control device 311 is an IC chip (semiconductor device) in which the components of the switch control circuit 311 shown in fig. 24 and 25 are integrated on one semiconductor substrate. The switch control device 311 is connected to the lead frame F12 by, for example, silver paste, solder, or the like.

The switching element 12 is mounted on the mounting portion B16 of the lead frame F16. The switching element 12 is connected to the lead frame F16 by, for example, silver paste, solder, or the like. The switching element 12 has a collector electrode PC on the lower surface, and the collector electrode PC is connected to the lead frame F16.

A resistor R31 is connected between the mounting portion B16 of the lead frame F16 and the lead frame F24. The resistor R31 is connected to each lead frame by, for example, silver paste, solder, or the like. The lead frame F24 is connected to a pad P11 of the switch control device 311 via a wire W11.

A chip component 331 is connected between the mounting portion B12 of the lead frame F12 and the lead frame F22. The chip parts 331 are connected to the respective lead frames by, for example, silver paste, solder, or the like. The lead frame F22 is connected to the switch control device 311 via a wire W12. The chip component 331 is a circuit component externally provided to the switch control device 311, and may be, for example, a capacitor, a resistor, or the like. The chip component 331 and the wire W12 may be omitted according to the configuration and function of the switch control device 311.

Gate pad PG and emitter pad PE are exposed on the upper surface of switching element 12.

Pads P1, P2, P4, P5, P6, P7, and P8 are exposed on the upper surface of the switch controller 311. The pad P1 is connected to the lead frame F21 by a wire W1. The pad P2 is connected to the mounting portion B12 of the lead frame F12 by a wire W2. The pad P4 is connected to the mounting portion B14 of the lead frame F14 by a wire W4. The pad P5 is connected to the mounting portion B15 of the lead frame F15 by a wire W5. The pad P6 is connected to the gate pad PG of the switching element 12 by a wire W6. The pad P7 is connected to the lead frame F23 by a wire W7. The emitter pad PE of the switching element 12 is connected to the lead frame F23 via a wire W9 a. The lead frame F23 is connected to the mounting portion B2 of the lead frame F2 of the lead frame F12 via a wire W9B.

The wires W1, W2, W4, W5, W6, W7, W8 are, for example, aluminum wires with a diameter of, for example, 125 μ 5.

The wires W9a, W9b are, for example, aluminum wires with a diameter of, for example, 250 μm. The resistance of the wire W9b is several m and several tens of m, for example 5 m. The resistance component of the wire W9b functions as the resistor R2 shown in fig. 1.

(Structure of high withstand Voltage resistance)

As shown in fig. 29, the resistor R31 includes a substrate 351, a pair of external electrodes 352, and a resistor 353 between the pair of external electrodes 352. The substrate 351 has a rectangular plate shape, for example. The substrate 351 is, for example, an aluminum substrate. The external electrodes 352 are provided at both end portions of the substrate 351. The external electrode 352 is made of, for example, a silver-based thick film material or nickel plating. The resistor 353 is provided on the upper surface of the substrate 351 and between the external electrodes 352. For example, a mixed powder of a metal material and glass is formed into a paste together with an organic binder, and the paste is sintered onto the substrate 351 to form the resistor 353. The resistor 353 includes a plurality of wiring portions 354 extending in parallel to the external electrodes 352, and a wiring portion 355 connecting these in series between the external electrodes 352. The resistor R31 having the resistor 353 with such a shape has high withstand voltage characteristics.

Fig. 30 shows an igniter 301a according to a modification. The igniter 301a is different from the igniter 301 shown in fig. 28 in the mounting direction of the switching element 12.

The gate pad PG is disposed toward the switching control device 311, and the switching element 12 is mounted to the mounting portion B16 of the lead frame F16. By this mounting, the wire W6 connecting the pad P6 of the switch control device 311 and the gate pad PG of the switching element 12 can be shortened.

As described above, according to the present embodiment, the following effects are obtained.

(3-1) state detection circuit 326 detects a state from collector voltage Vc (Vc2), and outputs detection signal FE. Then, the signal output circuit 28 synthesizes the detection signal FE of the state detection circuit 26 with other signals to generate an ignition confirmation signal IGF. The ignition confirmation signal IGF thus synthesized makes it possible to easily grasp the occurrence error (misfire condition) of the spark (spark) of the ignition plug 6.

(3-2) collector voltage Vc2 proportional to collector voltage Vc is generated by a resistor R31 connected between collector terminal C of switching element 12 and input terminal P11 of switch control circuit 311, and a voltage-dividing resistor of resistor R32 included in switch control circuit 311. The resistor R31 is a high withstand voltage resistor. Therefore, collector voltage Vc2 that can be input by switch control circuit 311 can be easily generated in proportion to collector voltage Vc of a high voltage. Therefore, the state of ignition plug 6 can be grasped from collector voltage Vc.

(modified example of the third embodiment)

A modified example of the third embodiment will be described below. In the following description, the same members as those of the first to third embodiments and the respective modified examples are given the same reference numerals, and some or all of the description may be omitted.

As shown in fig. 31, the switch control circuit 311a includes an output buffer 101 to which the detection signal FE of the state detection circuit 326 is input, and a signal output terminal P3 to which an output terminal of the output buffer 101 is connected. The switch control circuit 311a includes a dedicated signal output terminal P3 for outputting a signal FA indicating the state of ignition. This signal FA is an example of a single ignition detection signal that does not contain other detection signals.

As shown in fig. 32, switch control circuit 311a outputs signal FA corresponding to the state of ignition until ignition instruction signal IGT of the next N +2 cycle in accordance with collector voltage Vc. By separately outputting the signal FA for the detection signal CE in this way, the state of ignition can be easily confirmed in the ECU 7. Further, by outputting the signal FA before the ignition indication signal IGT of the N +2 cycle, the pulse width and the like of the ignition indication signal IGT in the next N +2 cycle can be adjusted.

As shown in fig. 33, the switch control circuit 311b includes a signal output circuit 28b to which the detection signal FE of the state detection circuit 326 is input. The signal output circuit 28b is supplied with a reception signal Sdet that has received the ignition instruction signal IGT from the signal detection circuit 23.

As shown in fig. 34, signal output circuit 28b generates an ignition ok signal IGF corresponding to a detection signal of overcurrent protection circuit 27 or the like during a period in which ignition instruction signal IGT is at a high level, and generates an ignition ok signal IGF corresponding to collector voltage Vc during a period in which ignition instruction signal IGT is at a low level. By such a switch control circuit 311b, it is not necessary to separately prepare a terminal for outputting the detection signal FE corresponding to the state, and it is possible to suppress an increase in size of the switch control circuit 311b and to easily confirm the state of ignition in the ECU 7. Further, by outputting the detection signal FE before the ignition indication signal IGT of the N +2 cycle, the pulse width and the like of the ignition indication signal IGT in the next N +2 cycle can be adjusted.

As shown in fig. 35, the switch control circuit 311c includes a state detection circuit 326 c. The state detection circuit 326C includes comparators 41 and 42, voltage-dividing resistors R21 and R22, inverter circuits 111 and 113, a NAND gate (NAND) circuit 112, a charge/discharge circuit 120, a capacitor C11, transistors M21 and M22, and a comparator 45. The transistors M21, M22 are NMOSFETs, for example.

The resistor R32 is connected to the non-inverting input terminal of the comparator 41 and one end of the resistor R32 via the input terminal P11, and the other end of the resistor R32 is connected to the ground wiring AGND. The reference voltage Vth1 is supplied to the inverting input terminal of the comparator 41. The output terminal of the comparator 41 is connected to the gate terminal of the transistor M21. The source terminal of the transistor M21 is connected to a ground line AGND, and the drain terminal of the transistor M21 is connected to the input node N21 of the charge/discharge circuit 120.

The charge/discharge circuit 120 includes a current source 121 and transistors Q1 to Q5. The transistors Q1 to Q3 are, for example, PNP transistors, and the transistors Q4 and Q5 are, for example, NPN transistors. Emitters of the transistors Q1 to Q3 are connected to the power supply line VDD. A collector of the transistor Q1 is connected to a first terminal of the current source 121, and a second terminal of the current source 121 is connected to the ground wiring AGND. The bases of the transistors Q2, Q3 are connected to the base and collector of the transistor Q1. The transistors Q1, Q2, and Q3 constitute a current mirror circuit. The transistors Q2 and Q3 are configured to flow the same amount of current as the current flowing through the transistor Q1.

Collectors of the transistors Q2 and Q3 are connected to collectors of the transistors Q4 and Q5, and emitters of the transistors Q4 and Q5 are connected to a ground line AGND. The collector of the transistor Q5 (input node N21) is connected to the bases of two transistors Q4 and Q5. An output node N22 between the transistor Q2 and the transistor Q4 is connected to the capacitor C11. The transistor Q4 is formed of, for example, a plurality of transistors connected in parallel, and is configured to flow a current that is an integral multiple of the current flowing through the transistor Q5.

The capacitor C11 is connected in parallel with a transistor M22, and the reception signal Sdet is supplied to the gate of the transistor M22. Note that various detection signals in the switch control circuit 311c or signals obtained by synthesizing various signals may be supplied to the gate of the transistor M21.

The output terminal of the comparator 45 is connected to the set terminal S of the flip-flop circuit 130, and the signal supplied to the gate of the transistor M22 and the reception signal Sdet are supplied to the reset terminal R of the flip-flop circuit 130. The flip-flop circuit 130 outputs an ignition acknowledge signal IGF from the output terminal Q.

In the state detection circuit 326C, the charge/discharge circuit 120 charges the capacitor C11 while the transistor M21 is turned on, and discharges the capacitor C11 while the transistor M21 is turned off. The flip-flop circuit 130 is set based on the detection signal FE of the comparator 45 that detects the voltage V11 of the capacitor C11, and an ignition confirmation signal IGF corresponding to the state of ignition is output from the output terminal Q of the flip-flop circuit 130. Then, the transistor M22 is turned on by the reception signal Sdet supplied to the gate of the transistor M22, the voltage V11 of the capacitor C11 is set to a low level, and the flip-flop circuit 130 is reset.

As shown in fig. 36, the ignition device 300a includes an ignition coil 2 and an igniter 301 b.

The igniter 301b includes the switching element 12a, the switch control circuit 311, the resistor R1, the capacitors C1, C2, and the resistors R2, R31, and is modularly housed in one package. The switch control circuit 311 includes a low-voltage protection circuit 21, an overvoltage protection circuit 22, a signal detection circuit 23, an overvoltage protection circuit 24, a gate driver 25, a state detection circuit 326, an overcurrent protection circuit 27, and a signal output circuit 28.

The switching element 12a is configured as one semiconductor chip including a transistor 31 a. The transistor 31a is, for example, a SiCMOSFET. A protection element 32 is connected between the gate and the drain of the transistor 31 a. Each terminal (S, G, D) of the transistor 31a may be described as a terminal of a semiconductor chip, that is, the switching element 12 a. The gate terminal of the transistor 31a is connected to the output terminal P6 of the switch control circuit 311 via a resistor. The gate signal Sg output from the gate driver 25 is supplied to the gate terminal G of the switching element 12a via the output terminal P6. The source terminal of the transistor 31a is connected to the resistor R2, and the drain terminal of the transistor 31a is connected to the primary coil 2a of the ignition coil 2 via the output terminal T6.

The igniter 301b performs switching control of the switching element 12a based on the ignition instruction signal IGT supplied from the ECU 7. By switching of the switching element 12a, the ignition plug 6 is caused to generate a spark (spark) by the secondary voltage V2 generated in the secondary coil 2b of the ignition coil 2. The state detection circuit 326 of the switching control circuit 311 outputs a detection signal FE corresponding to the detection voltage, using the collector voltage Vc of the switching element 12a (transistor 31a) as the detection voltage. The signal output circuit 28 synthesizes various signals including the detection signal CE of the overcurrent protection circuit 27 and the detection signal FE of the state detection circuit 326 to generate an ignition confirmation signal IGF, and outputs the ignition confirmation signal IGF. The switch control circuit 311 may be the switch control circuits 311a, 311b, 311c, or the like.

In this way, for example, in the igniter 301b including the switching element 12a including the transistor 31a as the SiC MOSFET, the occurrence error (misfire condition) of the spark (spark) of the ignition plug 6 can be easily grasped from the ignition confirmation signal IGF as in the first embodiment.

(fourth embodiment)

The fourth embodiment is explained below.

In the present embodiment, the same constituent members as those in the above-described embodiment are given the same reference numerals, and all or part of the description thereof may be omitted.

As shown in fig. 37, the ignition device 400 of the present embodiment includes an ignition coil 2 and an igniter 401.

The igniter 401 includes the switching element 12, the switch control circuit 411, the resistor R1, the capacitors C1, C2, and the resistor R2, and is modularly housed in one package.

The switching element 12 includes a transistor 31 and a protection element 32, and is integrated on one semiconductor substrate manufactured by a high withstand voltage process.

The switch control circuit 411 includes a high-potential-side power supply terminal P1, a low-potential-side power supply terminal P2, an output terminal P4, an input terminal P5, an output terminal P6, input terminals P7, P8, and an input terminal P11. The switch control circuit 411 inputs the ignition instruction signal IGT via the input terminal P5. The switch control circuit 411 outputs an ignition acknowledge signal IGF from the output terminal P4. The switch control circuit 411 detects the emitter current Ie of the switching element 12 from the potential difference between the two terminals of the resistor R2 connected to the input terminals P7 and P8.

The input terminal P11 of the switch control circuit 411 is connected to a first terminal of the resistor R31, and a second terminal of the resistor R31 is connected to the collector terminal C of the switching element 12.

The switch control circuit 411 includes a low-voltage protection circuit 21, an overvoltage protection circuit 22, a signal detection circuit 23, an overcurrent protection circuit 24, a gate driver 25, an overcurrent protection circuit 27, and a protection circuit 420.

The protection circuit 420 is connected between the input terminal P5 and the low-potential-side power supply terminal P2. The switch control circuit 411 of the present embodiment includes a signal wiring LS5 connected to the input terminal P5 and transmitting the ignition indication signal IGT, and a ground wiring AGND connected to the low-potential-side power supply terminal P2 connected to the low-potential-side power supply terminal T2. Therefore, in other words, the protection circuit 420 is connected between the signal wiring LS5 and the ground wiring AGND.

The protection circuit 420 protects the internal circuit of the protection circuit 420 at the subsequent stage against various noises superimposed on the signal wiring LS5 and the ground wiring AGND from the input terminal P5 and the low-potential-side power supply terminal P2.

The protection circuit 420 of the present embodiment includes 2 protection elements 421 and 422 connected in series between the terminals P5 and P2. The protective elements 421 and 422 are diode elements. The protection element 421 corresponds to a "first diode element", and the protection element 422 corresponds to a "second diode element". Specifically, a first terminal (corresponding to an anode terminal of the diode element) of the protection element 421 is connected to the signal wiring LS5, a second terminal (corresponding to a cathode terminal) of the protection element 421 is connected to a second terminal (corresponding to a cathode terminal) of the protection element 422, and a first terminal (corresponding to an anode terminal) of the protection element 422 is connected to the ground wiring AGND. That is, the protection circuit 420 is a circuit having a bidirectional diode structure connected in reverse series. In the present specification, a diode element is an element that functions as a diode by being connected to a terminal through a wiring.

In this embodiment, the protection elements 421 and 422 are formed of P-channel MOSFETs (P-channel metal oxide semiconductor field effect transistors). A P-channel MOSFET has a source, a gate, and a back gate (back gate) connected to each other, and these components function as a cathode terminal of a diode element. The drain of the P-channel MOSFET functions as an anode terminal of the diode element.

(example of the protective Circuit configuration)

Fig. 41 shows a configuration example of the protection circuit 420.

The protection circuit 420 includes 2 protection elements 421 and 422 connected between an input terminal P5 and a ground terminal P2.

The protective elements 421 and 422 are formed on a P-type semiconductor substrate (P-sub) 431. An N-type epitaxial layer (N-Epi)432 is formed on the P-type semiconductor substrate 431. The N-type epitaxial layer 432 is separated by an element composed of a P-type region 433 and a P + region 434, and a region forming one element is divided. An N-well 435 is formed in the N-type epitaxial layer 432, and an N + region 436 serving as a back gate terminal BG and P + regions 437 serving as source terminals S on both sides of the N + region 436 are formed in the N-well 435. On both sides of the N-well 435, a P region 438 and a P + region 439 which become a drain are formed by double diffusion at intervals from the N-well 435. An oxide film 440 and a field oxide film 441 are formed on the upper surface of the N-type epitaxial layer 432. A gate electrode 442 (gate terminal G) is formed on the upper surface of the oxide film 440.

The drain terminal D (P + region 439) of the protective element 421 is connected to a signal wiring LS5 connected to the input terminal P5. The source terminal S (P + region 437), the back gate terminal BG (N + region 436), and the gate terminal G (gate electrode 442) of the protection element 421 are connected to each other and to a wiring L41, and the wiring L41 is connected to the source terminal S, the back gate terminal BG, and the gate terminal G of the protection element 422. The drain terminal D of the protection element 422 is connected to a ground wiring AGND connected to the ground terminal P2. The ground terminal P2 is connected to the P-type semiconductor substrate 431 of the protection elements 421 and 422.

Fig. 42 shows an equivalent circuit diagram of the protection circuit 420.

The protection circuit 420 includes 2 protection elements 421 and 422 connected between an input terminal P5 and a ground terminal P2.

The protection elements 421 and 422 include a P-channel mosfet Q1, a parasitic transistor (shown as a diode) Q2 between the source and the drain of the P-channel mosfet Q1, resistors R41 and R42 connected to the source and the drain, respectively, and parasitic transistors Q13 and Q14 connected in series to the resistors R41 and R42. The parasitic transistor Q2 is an NPN transistor formed by the P + region serving as the drain terminal D, the N-type epitaxial layer 432, the N-well 435, and the P + region 437 serving as the source terminal S shown in fig. 41. The resistances R41, R42 are resistance components of the N-type epitaxial layer 432. The parasitic transistors Q3, Q4 are PNP transistors formed of the P-type semiconductor substrate 431, the N-type epitaxial layer 432, and the P region 438 shown in fig. 41.

(action of protective Circuit)

In fig. 41 and 42, the two-dot chain line indicates a current path at the time of breakdown caused by application of a positive surge voltage, and the one-dot chain line indicates a current path at the time of breakdown caused by application of a negative surge voltage.

When a positive surge voltage is applied, a current flows from the input terminal P5 to the ground terminal P2 through the signal wiring LS5, the drain terminal D of the protection element 421, the source terminal S of the protection element 421, the wiring L41, the source terminal S of the protection element 422, the drain terminal D of the protection element 422, and the ground wiring AGND. At this time, the voltage fluctuation of the signal wiring LS5 connected to the input terminal P5 is clamped by the sum (VF + BVdss) of the forward voltage VF of the parasitic transistor Q2 of the protection element 421 and the reverse voltage (breakdown voltage) BVdss of the diode constituted by the PMOS transistor Q1 of the protection element 422.

When a negative surge voltage is applied, a current flows from the ground terminal P2 to the input terminal P5 through the ground wiring AGND, the drain terminal D of the protection element 422, the source terminal S of the protection element 422, the wiring L41, the source terminal S of the protection element 421, the drain terminal D of the protection element 421, and the signal wiring LS 5. In addition, a current flows from the ground terminal P2 to the signal wiring LS5 in the vertical direction in the protective element 421, that is, through the parasitic transistor Q3 (the P-type semiconductor substrate 431, the N-type epitaxial layer 432, and the P region 438) and the P + region 439. The current flowing longitudinally through the protection element 421 is limited to a minute current (e.g., several mA) by the resistance component of the N-type epitaxial layer 432 (resistance R41 shown in fig. 42). Therefore, the voltage of ground line AGND is clamped by a voltage substantially equal to that when a positive surge voltage is applied.

(encapsulation of igniter)

Fig. 38 shows a package of the igniter 401, and shows components of the igniter 401 mounted on a lead frame. The external appearance of the igniter 401 is the same as that of the igniter 4 of the first embodiment, and therefore, the drawings and the description are omitted.

The igniter 401 includes lead frames F1 to F7, and a sealing resin 51 for sealing a part of the lead frames F1 to F7 and the components of the igniter 401. In fig. 38, the sealing resin 51 is indicated by a two-dot chain line. The sealing resin 51 is formed in a substantially cubic shape, and lead frames F1 to F6 protrude from one side surface as connection terminals (lead portions) T1 to T6 for mounting. That is, the package of the igniter 401 is a 6 pin SIP. In addition, the number of pins of the package may be appropriately changed.

As the lead frames F1 to F7, metals having conductivity, such as Cu, Cu alloy, Ni alloy, and 42 alloy, can be used. Further, the surfaces of the lead frames F1 to F7 may be plated with Pd plating, Ag plating, Ni/Pd/Ag plating, or the like. The sealing resin 51 may be a resin having insulating properties, such as an epoxy resin. In addition, the sealing resin 51 is colored in a predetermined color (for example, black).

The lead frames F1 to F6 include mounting portions B1 to B6, and lead portions T1 to T6 extending from the mounting portions B1 to B6. The lead portions T1 to T6 correspond to the terminals of the igniter 4.

A resistor R1 is connected between the mounting portion B1 of the lead frame F1 and the lead frame F7. A capacitor C1 is connected between the mounting portion B1 of the lead frame F1 and the mounting portion B2 of the lead frame F2. The capacitor C1 is mounted closer to the lead portions T1 and T2 of the lead frames F1 and F2 than to the resistor R1. Further, a capacitor C2 is connected between the mounting portion B2 of the lead frame F2 and the lead frame F7. The capacitor C2 is mounted on the opposite side of the capacitor C1 with the resistor R1 interposed therebetween. The resistor R1 and the capacitors C1, C2 are connected by silver paste, solder, or the like, for example.

The switch control device 11 is mounted on the mounting portion B2 of the lead frame F2, and the switching element 12 is mounted on the mounting portion B6 of the lead frame F6. The switch control device 11 is an IC chip in which the switch control circuit 11 shown in fig. 37 is formed. The switching control device 11 and the switching element 12 are connected by, for example, silver paste, solder, or the like. The switching element 12 has a collector electrode PC (see fig. 10) on a lower surface thereof, and the collector electrode PC is connected to the mounting portion B6 by silver paste, solder, or the like.

Gate pad PG and emitter pad PE are exposed on the upper surface of switching element 12. Pads P1, P2, P4, P5, P6, P7, and P8 are exposed on the upper surface of the switch control device 11. The pad P1 is connected to the lead frame F7 by a wire W1. The pad P2 is connected to the mounting portion B2 of the lead frame F2 by a wire W2. The pad P5 is connected to the mounting portion B5 of the lead frame F5 by a wire W5. The pad P6 is connected to the gate pad PG of the switching element 12 by a wire W6. The pad P7 is connected to the emitter pad PE of the switching element 12 by a wire W7. The emitter pad PE of the switching element 12 is connected to the mounting portion B2 of the lead frame 2 via a wire W9. The pad P8 of the switch control device 11 is connected to the mounting portion B2 of the lead frame F2 by a wire W8. The wires W1, W2, W5, W6, W7, W8 are, for example, aluminum wires, the diameter of which is, for example, 125 μm. The wire W9 is, for example, an aluminum wire, and has a diameter of, for example, 250 μm. The resistance value of the wire W9 is several m and several tens of m, for example, 5 m. The resistance component of the wire W9 functions as a resistor R2 shown in fig. 37.

(layout of switch control Circuit (chip))

Fig. 39 shows an example of the layout of an IC chip of the switch control circuit 411.

The switch control circuit 411 includes a semiconductor substrate 450. A plurality of pads P1, P2, P5, P6, P7, and P8 corresponding to the terminals shown in fig. 37 are arranged on the semiconductor substrate 450. In addition, each functional element constituting the switch control circuit 411 is formed on the semiconductor substrate 450. In fig. 39, a direction along one side of the semiconductor substrate 450 (the left-right direction in fig. 39) is described as an X direction (X1-X2 direction), and a direction along a side perpendicular to the one side (the up-down direction in fig. 39) is described as a Y direction (Y1-Y2 direction).

The pad P1, the pad P7, and the pad P8 are disposed at the end of the semiconductor substrate 450 in the Y1 direction. The pad P1 is disposed at an end in the X2 direction, and the dimension in the X direction is longer than the dimension in the Y direction. The pad P7 is arranged near the end in the X1 direction, and the Y-direction dimension Y6 is longer than the X-direction dimension X6. The pad P8 is arranged near the center in the X direction, and the dimension Y7 in the Y direction is longer than the dimension X7 in the X direction. The pad P7 and the pad P8 correspond to "first pad" and "second pad" of the present invention, respectively. The pads P2, P5 are disposed at the ends of the semiconductor substrate 450 in the Y2 direction. The pad P2 is disposed at an end in the X2 direction, and the dimension in the Y direction is longer than the dimension in the X direction. The pad P5 is arranged near the end in the X1 direction, and the dimension in the Y direction is longer than the dimension in the X direction. The pad P6 is disposed at the end of the pad P7 in the X1 direction on the Y2 side, and the dimension in the X direction is longer than the dimension in the Y direction. The shape of each of the pads P1, P2, and P5 to P8 is a shape that matches the direction in which the bonding wires are bonded.

The semiconductor substrate 450 includes a plurality of regions 451, 452, 453, and 454. The area 451 is an area where functional elements of the circuits 21 to 25, 27 constituting the switch control circuit 411 are formed. The region 452 is a region where the protective elements 421 and 422 of the protective circuit 420 are formed. The region 453 is a region where a protection circuit for protecting the constituent members of the switch control circuit 411 against a surge and noise input from the pads P1 and P2 is formed. The region 454 is a region where a pad for test is formed. Further, the layout of the IC chip of the switch control circuit 411 is not limited to that shown in fig. 42.

(schematic plan view of protective element)

Fig. 40 is an enlarged plan view of a part of the protective elements 421 and 422.

The protective elements 421 and 422 include a semiconductor substrate 450 and a plurality of gate electrodes 442 formed on the semiconductor substrate 450. The gate electrode 442 is formed to extend in a predetermined direction (vertical direction in fig. 40). A predetermined number (for example, 2) of gate electrodes 422 are connected to the end connecting portions 442 a. These connection portions 442a are connected from the gate electrode 442 to the wiring 462 on the upper layer via the contact 461.

One of the regions sandwiching the gate electrode 442 is an N-well region 435, and the other region is a drain region 439. Source contacts 463 and back gate contacts 464 are alternately disposed in the N-well region 435. A drain contact 465 is provided in the drain region 439. The source contact 463 is connected to a P + region 437 (not shown) having substantially the same size as the source contact 463. Each back gate contact 464 is surrounded by an N + region 436.

Next, the operation of the protection circuit 420 of the present embodiment will be described.

As described above, the protection circuit 420 has a bidirectional diode structure and includes the protection elements 421 and 422. Each of the protection elements 421 and 422 has a PMOSFET structure, and is a diode element in which a source terminal S of the PMOSFET is connected to a gate terminal G and a back gate terminal BG. The anode terminals of the protective elements 421 and 422 are connected to a signal wiring LS5 connected to the input terminal P5 and a ground wiring AGND connected to the ground terminal P2, respectively, and the cathode terminals of the protective elements 421 and 422 are connected to each other. In the protection circuit 420 including the protection elements 421 and 422 configured and connected in this manner, damage to the protection elements 421 and 422 due to a surge can be suppressed, and the immunity to noise can be improved.

A comparative example corresponding to the protection circuit 420 (protection elements 421 and 422) of the present embodiment will be described.

As a comparative example, for example, a protection element may be formed by diode-connecting NMOSFETs. However, the characteristics of the protection element using NMOSFETs are likely to vary, and the surge resistance of the protection element having variations is low.

Fig. 43A shows a cross-sectional configuration of an NMOSFET. The NMOSFET has an N-region 502 and N + regions 503a and 503b formed in a P-type well 501, and an N + region 504 formed in the N-region 502. A gate electrode 505 is formed on P-type well 501 with an insulating film (gate insulating film) not shown interposed therebetween. Contacts 506a, 506b, 506c are connected to respective N + regions 503a, 503b, 504. Contact 506c is the drain terminal D of the NMOSFET and contacts 506a, 506b are the source terminals S.

In this NMOSFET, parasitic NPN transistors Qa, Qb are formed between the N-region 502 and the N + regions 503a, 503b, and these parasitic NPN transistors Qa, Qb are connected to the contact 506c via a parasitic resistance composed of resistance components of the N-region 502 and the N + region 504.

Fig. 43B shows a cross-sectional configuration of an NMOSFET with an offset generated. In the NMOSFET, an N + region 504 within an N-region 502 is formed offset. In this case, distances La and Lb from the end of N + region 504 to the boundary (PN junction boundary) between N-region 502 and P-type well 501 are different from left to right in the drawing. In design, the distances La and Lb are set to be equal to each other as shown in fig. 43A in accordance with the required characteristics.

Due to such a shift, a difference is generated in the resistance value between the parasitic NPN transistors Qa, Qb and the contact 506 c. The film resistance of the N-region 502 is more than one bit greater than the film resistance of the N + region 504. Therefore, the resistance value between the collector of the parasitic NPN transistor Qb and the contact 506c is lower than the resistance value between the collector of the parasitic NPN transistor Qa and the contact 506 c. Thereby, the current limiting effect becomes small. In this case, the surge current may be concentrated on the parasitic NPN transistor Qb, which is a portion having a small resistance value, and may be broken by the parasitic NPN transistor Qb.

Sometimes, an NMOSFET offset occurs in the manufacturing process.

Fig. 44A shows a part of a process for manufacturing an NMOSFET. Fig. 44A shows a process for manufacturing an NMOSFET centered on the source, corresponding to the process for manufacturing a PMOSFET of the present embodiment.

In the process shown in the upper stage of fig. 44A, N-region 502 is formed in P-type well 501. Oxide film 511 and field oxide film 512 are formed on the upper surface of P-type well 501, and gate electrode 505 is formed on oxide film 511. Then, a resist film 513 having an opening 513X is formed, and an N-type impurity is implanted into the P-type well 501 from the opening 513X to form an N-region 502. Then, the resist film 513 is removed.

In the step shown in the middle stage of fig. 44A, N + region 503 between gate electrodes 505 and N + region 504 in N-region 502 are formed. The N + regions 503, 504 are regions for connection with contacts. A resist film 514 having openings 514A and 514B is formed. The opening 514B is formed at a position corresponding to a contact to the N-region 502, and the opening 514A is a region to be a source. Then, N-type impurities are implanted from the openings 514A and 514B to form N + regions 503 and 504.

As shown in the lower stage of fig. 44A, when forming the resist film 514, the openings 514A and 514B of the resist film 514 are formed so as to be shifted from a desired position in the alignment step. The size of opening 514B is smaller than the size of N-region 502. Therefore, due to the positional shift of the resist film 514, the N + region 504 formed in the N-region 502 is shifted in position. On the other hand, N + region 503 between gate electrodes 505 is not affected by the offset of resist film 514 because impurities are implanted into P-type well 501 using gate electrode 505 as a mask. Therefore, a difference is generated in the distance from the N + region 503 between the gate electrodes 505 to the N + regions 504 in the N-regions 502 on both sides. Thus, the position of the N + region 503 is relatively offset with respect to the N + region 504 for the contact. This causes the above-described current concentration.

In contrast, since the protection elements 421 and 422 of the protection circuit 420 of the present embodiment have a PMOS structure, the above-described offset is less likely to occur.

Fig. 44B shows a part of a process for manufacturing a PMOSFET. In addition, fig. 44B is for explaining the formation of the P-type region, and the N-type well 435 of fig. 41 is omitted.

In the process shown in the upper stage of fig. 44B, a P region 438 is formed in the N-type epitaxial layer 432. An oxide film 440 and a field oxide film 441 are formed on the N-type epitaxial layer 432, and a gate electrode 442 is formed on the oxide film 440. Then, a resist film 521 having an opening 521X is formed, and a P-type impurity is implanted into the N-type epitaxial layer 432 through the opening 521X to form a P region 438. The opening 521X is formed to expose a region where the drain electrode between the gate electrode 442 and the field oxide film 441 is formed. In this step, the gate electrode 442 and the field oxide film 441 function as a mask (mask) when P-type impurities are implanted. Then, the resist film 521 is removed.

In the step illustrated in the middle of fig. 44B, the P + region 437 between the gate electrodes 442 and the P + region 439 in the P region 438 are formed. A resist film 522 having an opening 522X is formed. The opening 522X is formed to expose a part of the field oxide film 441 so that the entire region inside the field oxide film 441 is exposed corresponding to the region where the P-type impurity is implanted. Then, P-type impurities are implanted from the opening 522X. In this step, the gate electrode 442 and the field oxide film 441 function as masks when P-type impurities are implanted. Therefore, as shown in the lower stage of fig. 44B, even if the resist film 522 is misaligned, the relative positions of the N + regions 437 and 439 do not change. Therefore, the resistance value between the N + region 437 and the N + region 439 is not affected by alignment deviation in the manufacturing process. Therefore, concentration of current due to surge is suppressed, and the protective elements 421 and 422 are less likely to be damaged.

As described above, according to the present embodiment, the following effects are obtained.

The protection circuit 420 (4-1) includes 2 protection elements 421 and 422 connected in series between the input terminal P5 and the low-potential-side power supply terminal P2. The protective elements 421 and 422 are diode elements. The protection circuit 420 is a circuit of an inverse series-connected bidirectional diode structure. The diode element functions as a diode by connection between a wire and a terminal, and the protective elements 421 and 422 are formed of PMOSFETs. The protection circuit 420 including the protection elements 421 and 422 can improve the noise immunity of the switch control circuit 411.

(4-2) the protection elements 421 and 422 are formed of PMOSFETs. In the PMOSFET manufacturing process, P + regions 437 and 439 to be source and drain terminals S and D are formed using the gate electrode 442 and the field oxide film 441 as masks. With such a configuration, current concentration due to surge can be suppressed, and damage of the protective elements 421 and 422 can be suppressed.

(modified example of the fourth embodiment)

A modified example of the fourth embodiment will be described below. In the following description, the same members as those of the first to fourth embodiments and the respective modified examples are given the same reference numerals, and some or all of the description may be omitted.

As shown in fig. 45, the ignition device 400a includes an ignition coil 2 and an igniter 401 a.

The igniter 401a includes the switching element 12, the switch control circuit 411a, the resistor R1, the capacitors C1, C2, and the resistor R2, and is modularly housed in one package.

The switch control circuit 411a includes a low-voltage protection circuit 21, an overvoltage protection circuit 22, a signal detection circuit 23, an overvoltage protection circuit 24, a gate driver 25, an overcurrent protection circuit 27, and a protection circuit 420 a.

The protection circuit 420a is connected between the input terminal P5 and the low-potential-side power supply terminal P2. The protection circuit 420a protects the internal circuit of the protection circuit 420a at the subsequent stage against various noises superimposed on the signal wiring LS5 and the ground wiring AGND from the input terminal P5 and the low-potential-side power supply terminal P2.

The protection circuit 420a includes 3 protection elements 421, 422, and 423 connected in series between the terminals P5 and P2. The protective elements 421, 422, and 423 are diode elements. The protection element 421 corresponds to a "first diode element", and the protection elements 422 and 423 correspond to a "second diode element". The protection elements 421, 422, and 423 are each formed of a PMOSFET.

A first terminal (corresponding to an anode terminal) of the protection element 421 is connected to the signal wiring LS5, and a second terminal (corresponding to a cathode terminal) of the protection element 421 is connected to a second terminal (corresponding to a cathode terminal) of the protection element 422. A first terminal (corresponding to an anode terminal) of the protection element 422 is connected to a second terminal (corresponding to a cathode terminal) of the protection element 423, and a first terminal (anode terminal device) of the protection element 423 is connected to the ground wiring AGND. That is, the protection circuit 420 is a bidirectional diode structure circuit in which 2 protection elements 422 and 423 connected in series are connected in reverse series to one protection element 421.

(example of the protective Circuit configuration)

Fig. 46 shows a configuration example of the protection circuit 420 a.

The protection circuit 420a includes 3 protection elements 421, 422, and 423 connected between an input terminal P5 and a ground terminal P2.

The protective elements 421, 422, 423 have the same structure as that of the fourth embodiment (fig. 37). Therefore, reference numerals and explanations corresponding to the respective regions are omitted.

The drain terminal D of the protection element 421 is connected to a signal wiring LS5 connected to the input terminal P5. The source terminal S, the back gate terminal BG, and the gate terminal G of the protection element 421 are connected to each other and to the wiring L42, and the wiring L42 is connected to the source terminal S, the back gate terminal BG, and the gate terminal G of the protection element 422. The drain terminal D of the protection element 422 is connected to the source terminal S, back gate terminal BG, and gate terminal G of the protection element 423 via a wiring L43, and the drain terminal D of the protection element 423 is connected to a ground wiring AGND connected to a ground terminal P2. The ground terminal P2 is connected to the P-type semiconductor substrate 431 of the protection elements 421, 422, 423.

Fig. 47 shows an equivalent circuit diagram of the protection circuit 420 a.

The protection circuit 420a includes 3 protection elements 421, 422, and 423 connected between an input terminal P5 and a ground terminal P2.

The protection elements 421, 422, and 423 include a parasitic transistor (shown as a diode) Q2 between the source and the drain of the P-channel mosfet Q1 and the P-channel mosfet Q1, resistors R41a and R41b connected to the source and the drain, respectively, and parasitic transistors Q3 and Q4 connected in series to the resistors R41a and R41b, respectively.

(action of protective Circuit)

In fig. 46 and 47, the two-dot chain line indicates a current path at the time of breakdown caused by application of a positive surge voltage, and the one-dot chain line indicates a current path at the time of breakdown caused by application of a negative surge voltage.

When a positive surge voltage is applied, a current flows from the input terminal P5 to the ground terminal P2 via the signal wiring LS5, the drain terminal D of the protection element 421, the source terminal S of the protection element 421, the wiring L42, the source terminal S of the protection element 422, the drain terminal D of the protection element 422, the wiring LS43, the source terminal S of the protection element 423, the drain terminal D of the protection element 423, and the ground wiring AGND. At this time, the voltage fluctuation of the wiring LS5 connected to the input terminal P5 is clamped by the sum (VF +2 × BVdss) of the forward voltage VF of the parasitic transistor Q2 of the protection element 421 and the reverse voltage (breakdown voltage) BVdss of the diode constituted by the PMOS transistor Q1 of the 2 protection elements 422 and 423.

When a negative surge voltage is applied, a current flows from the ground terminal P2 to the input terminal P5 through the ground wiring AGND, the drain terminal D of the protection element 423, the source terminal S of the protection element 423, the wiring LS43, the drain terminal D of the protection element 422, the source terminal S of the protection element 422, the wiring L42, the source terminal S of the protection element 421, the drain terminal D of the protection element 421, and the signal wiring LS 5. In addition, a current flows from the ground terminal P2 to the signal wiring LS5 in the longitudinal direction in the protective element 421, that is, through the parasitic transistor Q3. The current flowing longitudinally through the protection element 421 is limited to a minute current (e.g., several mA) by the resistance component of the N-type epitaxial layer 432 (the resistance R41a shown in fig. 47). Therefore, the voltage of ground line AGND is clamped by a voltage substantially equal to that when a positive surge voltage is applied.

As shown in fig. 48, the ignition device 400b includes an ignition coil 2 and an igniter 401 b.

The igniter 401b includes the switching element 12a, the switch control circuit 411, the resistor R1, the capacitors C1, C2, and the resistor R2, and is modularly housed in one package. The switching element 12a is configured as one semiconductor chip including a transistor 31a, and the transistor 31a is, for example, a SiC MOSFET. In this way, for example, in the igniter 401b including the switching element 12a including the transistor 31a as the SiC MOSFET, damage of the protection elements 421 and 422 of the protection circuit 420 can be suppressed and the noise immunity can be improved, as in the fourth embodiment. The protection circuit 420 may also use the protection circuit 420a of fig. 45.

(other modified examples)

In the above embodiments and modified examples, the IGBT and the SiC MOSFET are used as the transistor, but a GaN-based power device or the like may be used as the transistor.

The above embodiments and modified examples may be combined as appropriate.

Description of the reference numerals

4. 4a, 201a, 301a, 401a, 401 b: an igniter; 11. 11a to 11c, 211a, 211 b: a switch control circuit; 26. 26c, 226, 326: a state detection circuit; 12. 12 a: a switching element.