阅读说明：本技术 测试系统 (Test system ) 是由 方柏翔 陈冠达 卢盈维 赖佳助 谢承财 于 2019-04-01 设计创作，主要内容包括：本发明披露一种测试系统,包括双线性极化天线、相位延迟器、分功器与高频讯号收发机。双线性极化天线将有关待测物的水平极化路径与垂直极化路径的圆形极化无线电波分成一第一高频讯号与一第二高频讯号,相位延迟器将第一高频讯号的相位延迟90度而形成一具相位延迟90度的第一高频讯号,且分功器接收或合成具相位延迟90度的第一高频讯号与第二高频讯号。同时,高频讯号收发机量测具相位延迟90度的第一高频讯号与第二高频讯号的功率,以判断待测物的水平极化路径与垂直极化路径的状态。借此,本发明能加快待测物的量测速度。(The invention discloses a test system, which comprises a bilinear polarized antenna, a phase delayer, a power divider and a high-frequency signal transceiver. The dual-linear polarization antenna divides the circular polarization radio wave of the horizontal polarization path and the vertical polarization path of the object to be tested into a first high-frequency signal and a second high-frequency signal, the phase delayer delays the phase of the first high-frequency signal by 90 degrees to form the first high-frequency signal with the phase delay of 90 degrees, and the power divider receives or synthesizes the first high-frequency signal and the second high-frequency signal with the phase delay of 90 degrees. Meanwhile, the high-frequency signal transceiver measures the power of the first high-frequency signal and the second high-frequency signal with phase delay of 90 degrees so as to judge the states of a horizontal polarization path and a vertical polarization path of the object to be measured. Therefore, the invention can accelerate the measurement speed of the object to be measured.)

1. A test system, comprising:

a dual linear polarization antenna for receiving circularly polarized radio waves from the object to be measured with respect to the horizontal polarization path and the vertical polarization path to divide the circularly polarized radio waves into a first high frequency signal and a second high frequency signal;

a phase delayer electrically connected to the dual linear polarization antenna for delaying the phase of the first high frequency signal from the dual linear polarization antenna by 90 degrees to form a first high frequency signal with 90 degrees phase delay;

a power divider electrically connected to the phase retarder and the dual linear polarized antenna for receiving or combining the first high frequency signal with 90 degree phase delay from the phase retarder and the second high frequency signal from the dual linear polarized antenna; and

a high frequency signal transceiver electrically connected to the power divider for measuring the power of the first high frequency signal and the second high frequency signal with 90 degree phase delay received or synthesized by the power divider, and then the high frequency signal transceiver determines the states of the horizontal polarization path and the vertical polarization path of the object to be tested according to the power.

2. The test system of claim 1, wherein the circularly polarized radio waves are left-handed circularly polarized radio waves or right-handed circularly polarized radio waves.

3. The test system of claim 1, wherein the object is a semiconductor device, an antenna device or a mobile communication device having the horizontal polarization path, the vertical polarization path and an antenna, and the antenna forms the circularly polarized radio wave according to the horizontal polarization signal from the horizontal polarization path and the vertical polarization signal from the vertical polarization path and transmits the circularly polarized radio wave to the dual linear polarization antenna.

4. The testing system of claim 1, wherein in a transmission mode of the testing system, the high frequency transceiver transmits a high frequency signal to be divided into a third high frequency signal and a fourth high frequency signal by the power divider, and the phase delay device delays the phase of the third high frequency signal from the power divider by 90 degrees to form a third high frequency signal with a 90-degree phase delay.

5. The testing system of claim 4, wherein the dual linear polarized antenna further forms another circularly polarized radio wave according to the third high frequency signal with 90 degree phase delay from the phase retarder and the fourth high frequency signal from the power divider, so as to transmit the another circularly polarized radio wave to the antenna of the object to be tested, and the antenna divides the another circularly polarized radio wave into a horizontally polarized signal and a vertically polarized signal to pass through the horizontally polarized path and the vertically polarized path, respectively.

6. The testing system of claim 1, wherein the high frequency transceiver reads the maximum value of the power or the gain when the electric wave of the antenna of the object to be tested matches the circularly polarized radio wave of the dual linearly polarized antenna, and reads the value of the power or the gain which changes sensitively when the electric wave of the antenna of the object to be tested does not match the circularly polarized radio wave of the dual linearly polarized antenna.

7. The testing system of claim 1, wherein the dual linear polarized antenna, the phase delayer, the power divider and the high frequency signal transceiver constitute a testing module, and the testing system comprises a plurality of testing modules.

8. A test system, comprising:

a dual linear polarization antenna for receiving circularly polarized radio waves from the object to be measured with respect to the horizontal polarization path and the vertical polarization path to divide the circularly polarized radio waves into a first high frequency signal and a second high frequency signal;

a first power divider and a second power divider, each electrically connected to the dual linear polarization antenna for respectively receiving the first high frequency signal and the second high frequency signal from the dual linear polarization antenna;

a first phase delay device electrically connected to the first power divider for delaying the phase of the first high frequency signal from the first power divider by 90 degrees to form a first high frequency signal with a phase delay of 90 degrees;

a third power divider electrically connected to the first phase delayer and the second power divider for receiving or combining the first high frequency signal with 90 degree phase delay from the first phase delayer and the second high frequency signal from the second power divider; and

and the first power meter is electrically connected with the third power divider to measure the power of the first high-frequency signal and the second high-frequency signal with the phase delay of 90 degrees received or synthesized by the third power divider, and then judges the states of the horizontal polarization path and the vertical polarization path of the object to be detected according to the power.

9. The test system of claim 8, wherein the circularly polarized radio waves are left-handed circularly polarized radio waves or right-handed circularly polarized radio waves.

10. The test system of claim 8, wherein the object is a semiconductor device, an antenna device or a mobile communication device having the horizontal polarization path, the vertical polarization path and an antenna, and the antenna forms the circularly polarized radio wave according to the horizontal polarization signal from the horizontal polarization path and the vertical polarization signal from the vertical polarization path and transmits the circularly polarized radio wave to the dual linear polarization antenna.

11. The test system as claimed in claim 8, further comprising a second phase delay device electrically connected to the second power divider for delaying the phase of the second high frequency signal from the second power divider by 90 degrees to form a second high frequency signal with a phase delay of 90 degrees.

12. The test system as claimed in claim 11, further comprising a fourth power divider electrically connected to the second phase delayer and the first power divider for receiving or combining the second high frequency signal with a phase delay of 90 degrees from the second phase delayer and the first high frequency signal from the first power divider.

13. The testing system of claim 12, further comprising a second power meter electrically connected to the fourth power divider for measuring the power of the second high frequency signal and the first high frequency signal received or combined by the fourth power divider with a phase delay of 90 degrees.

14. The test system as claimed in claim 8, wherein the first power meter reads a maximum value of the power or the gain thereof when the electric wave of the antenna of the object to be tested matches the circularly polarized radio wave of the dual linearly polarized antenna, and reads a value of the power or the gain thereof which is sensitively changed when the electric wave of the antenna of the object to be tested does not match the circularly polarized radio wave of the dual linearly polarized antenna.

15. The testing system of claim 8, wherein the dual linear polarization antenna, the first power splitter, the second power splitter, the first phase delayer, the third power splitter and the first power meter form a testing module, and the testing system comprises a plurality of testing modules.

Technical Field

The present invention relates to a test system, and more particularly, to a test system for testing a horizontal polarization path and a vertical polarization path of an object under test.

Background

An Antenna on a conventional device under test (e.g., millimeter wave (mm wave) Package Antenna (AiP) has two signal feeding points, i.e., a horizontal polarization signal and a vertical polarization signal of the Antenna, respectively, and the horizontal polarization signal and the vertical polarization signal of the Antenna respectively pass through a horizontal polarization path and a vertical polarization path via different circuits and Solder bumps (Solder Bump).

In an FT (final test) testing station of an object to be tested, because the electric waves of a horizontal polarization signal and a vertical polarization signal have orthogonal characteristics, two measurement ports of a dual linear polarization antenna on a measurement probe of a testing system need to be switched to measure the states of a horizontal polarization path and a vertical polarization path of the object to be tested, respectively, resulting in a great reduction in the measurement speed of the object to be tested.

In addition, currently, circularly polarized radio waves are mostly used for satellite applications such as a satellite positioning system (GPS), and are less suitable for, for example, fifth generation (5G) mobile communication transmission, and since mobile communication transmission in a normal environment mostly depends on multipath reflection to transmit signals to an indoor mobile communication device (such as a mobile phone), the circularly polarized radio waves are not used for, for example, an OTA (over the air) test of an object to be tested of a millimeter wave packaged antenna.

Therefore, how to provide a novel or innovative test system has become a subject of great research by those skilled in the art.

Disclosure of Invention

The invention provides a test system which can simultaneously test a horizontal polarization path and a vertical polarization path of an object to be tested at one time so as to accelerate the measurement speed of the object to be tested.

A test system of the present invention comprises: a dual linear polarization antenna for receiving the circularly polarized radio wave from the object to be measured with respect to the horizontal polarization path and the vertical polarization path to divide the circularly polarized radio wave into a first high frequency signal and a second high frequency signal; a phase delayer electrically connected to the dual linear polarization antenna for delaying the phase of the first high frequency signal from the dual linear polarization antenna by 90 degrees to form a first high frequency signal with 90 degrees phase delay; a power divider electrically connected to the phase delayer and the dual linear polarized antenna for receiving or combining the first high frequency signal with 90 degree phase delay from the phase delayer and the second high frequency signal from the dual linear polarized antenna; and a high frequency signal transceiver electrically connected to the power divider for measuring the power of the first and second high frequency signals with 90 degree phase delay received or synthesized by the power divider, and determining the states of the horizontal polarization path and the vertical polarization path of the object according to the power.

Another test system of the present invention comprises: a dual linear polarization antenna for receiving the circularly polarized radio wave from the object to be measured with respect to the horizontal polarization path and the vertical polarization path to divide the circularly polarized radio wave into a first high frequency signal and a second high frequency signal; a first power divider and a second power divider, each electrically connected to the dual linear polarization antenna for respectively receiving the first high frequency signal and the second high frequency signal from the dual linear polarization antenna; a first phase delayer electrically connected to the first power divider for delaying the phase of the first high frequency signal from the first power divider by 90 degrees to form a first high frequency signal with a phase delay of 90 degrees; a third power divider electrically connected to the first phase delayer and the second power divider for receiving or synthesizing the first high frequency signal with a phase delay of 90 degrees from the first phase delayer and the second high frequency signal from the second power divider; and a first power meter electrically connected to the third power divider for measuring the power of the first high-frequency signal and the second high-frequency signal with 90-degree phase delay received or synthesized by the third power divider, and determining the states of the horizontal polarization path and the vertical polarization path of the object to be tested according to the power by the first power meter.

In order to make the aforementioned and other features and advantages of the invention more comprehensible, embodiments accompanied with figures are described in detail below. Additional features and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. The features and advantages of the invention will be realized and attained by means of the elements and combinations particularly pointed out in the appended claims. It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the invention, as claimed.

Drawings

Fig. 1A and 1B are schematic diagrams of basic architectures of a test system according to the present invention, wherein fig. 1A is a receiving mode of the test system, and fig. 1B is a transmitting mode of the test system;

FIG. 2 is a schematic diagram of the test system of FIGS. 1A and 1B according to an embodiment of the present invention;

FIG. 3 is a schematic diagram of a basic architecture of another test system according to the present invention;

FIG. 4 is a schematic diagram of the test system of FIG. 3 according to an embodiment of the present invention; and

FIG. 5 is a schematic diagram of an embodiment of the present invention, in which the test module of FIGS. 1A to 1B and the test module of FIG. 3 are integrated into a same test system.

Description of the symbols

1. 2, 3 test system

1', 2' test module

10 dual linearly polarized antenna

20 phase delayer

21 first phase retarder

22 second phase delay device

30 power divider

31 first power divider

32 second power divider

33 third power divider

34 fourth power divider

40 high frequency signal transceiver

41 first wattmeter

42 second wattmeter

A test substance

B conductive element

H-horizontal polarization path

L-shaped transmission line

M1, N1 first high frequency signal

M1 'and N1' have the first high frequency signal with phase delay of 90 degrees

M2, N2 second high frequency signal

M3 third high frequency signal

M3' third high frequency signal with 90 degree phase delay

M4 fourth high frequency signal

Ma, Mb, Na, Nb high frequency signal

N2' second high frequency signal with phase delay of 90 degrees

S_HHorizontally polarized signal

S_VVertical polarization signal

T-antenna

V vertical polarization path

W1, W2 circular polarized radio waves

Φ_H、Φ_VA phase controller.

Detailed Description

The present invention is described in terms of specific embodiments, which are intended to provide further advantages and benefits, as will be apparent to those skilled in the art upon reading the present disclosure, and may be embodied or applied in other specific and equivalent manners.

First, the physical significance of the orthogonal property of horizontal polarization and vertical polarization is that when both the transmitting antenna and the receiving antenna are horizontally polarized or vertically polarized, the energy from the transmitting antenna to the receiving antenna is completely transferred (100%); and when the transmitting antenna is horizontally polarized and the receiving antenna is vertically polarized, or the transmitting antenna is vertically polarized and the receiving antenna is horizontally polarized, the energy from the transmitting antenna to the receiving antenna cannot be transferred (0%). Therefore, if the horizontal polarization signal and the vertical polarization signal are input to the horizontal polarization path and the vertical polarization path of the object to be measured, respectively, and the phase difference between the horizontal polarization signal and the vertical polarization signal is 90 degrees (i.e. the time difference is 1/4 wavelengths), the circularly polarized radio wave can be formed. Meanwhile, according to the configuration that the horizontal polarization signal or the vertical polarization signal is +90 degrees or-90 degrees, a left-handed circularly polarized radio wave or a right-handed circularly polarized radio wave can be formed, and the left-handed circularly polarized radio wave and the right-handed circularly polarized radio wave also have the characteristic of being orthogonal to each other.

Further, when the radio wave is incident on the surface of the conductive element (e.g., metal) of the object to be measured, reflection occurs, and the characteristics of the reflected radio wave can be obtained according to the different polarities of the incident radio wave. For example, (1) if the incident wave is vertically linearly polarized, the reflected wave is vertically linearly polarized; (2) if the incident electric wave is horizontally linearly polarized, the reflected electric wave is horizontally linearly polarized; (3) the incident electric wave is right-handed circular polarization, and the reflected electric wave is left-handed circular polarization; and (4) the incident wave is circularly polarized in the left hand direction, and the reflected wave is circularly polarized in the right hand direction. Therefore, the circularly polarized radio wave has a characteristic of resisting odd-numbered reflections such as the first reflection and the third reflection in combination with the orthogonal characteristic.

Furthermore, since the reflected wave becomes a physical characteristic of orthogonal polarization after the circularly polarized radio wave collides with the conductive element (e.g., metal) of the object to be tested, the first reflection (maximum reflected energy) caused by the wall surface of the isolation box (metal isolation chamber) is not received by the antenna (receiving antenna) in the OTA (over the air) test of the object to be tested, so that the interference to the antenna (receiving antenna) is not easily caused.

In view of the above-mentioned characteristics, the present invention provides the following two test systems, which can be used in equipment such as an FT (final test) test station for an object under test, and can select any one of the test systems according to the measurement requirements of the object under test. Meanwhile, the test circuit of the test system can simultaneously test the horizontal polarization path and the vertical polarization path of the object to be tested at one time, so that the time for respectively switching the horizontal polarization path or the vertical polarization path is saved, the measurement speed (such as twice speed) of the object to be tested is accelerated, and about half of the test time is saved.

Fig. 1A and 1B are schematic diagrams of basic architectures of a test system 1 according to the present invention, wherein fig. 1A is a receiving mode of the test system 1, and fig. 1B is a transmitting mode of the test system 1. As shown in the figure, the testing system 1 may include a dual linear polarized antenna 10, a phase retarder 20, a power divider 30 and a high frequency signal transceiver 40 disposed in the same testing module 1', wherein the phase retarder 20 is electrically connected to the dual linear polarized antenna 10, the power divider 30 is electrically connected to the phase retarder 20 and the dual linear polarized antenna 10, and the high frequency signal transceiver 40 is electrically connected to the power divider 30.

As shown in fig. 1A, in the receiving mode of the test system 1, the dual linear polarized antenna 10 can receive the circularly polarized radio wave W1 from the object a to be tested with respect to the horizontal polarization path H and the vertical polarization path V, so that the dual linear polarized antenna 10 divides the circularly polarized radio wave W1 into a first high frequency signal M1 and a second high frequency signal M2. The phase retarder 20 delays the phase of the first rf signal M1 from the dual-linear polarization antenna 10 by 90 degrees (i.e., ± 90 degrees or time difference of 1/4 wavelengths) to form a first rf signal M1' with a phase delay of 90 degrees. Moreover, the power divider 30 can receive or combine the 90 ° phase-delayed first rf signal M1' from the phase delay 20 and the second rf signal M2 from the dual linear polarization antenna 10, for example, combine them into the rf signal Ma. Meanwhile, the high frequency transceiver 40 can measure the powers of the first high frequency signal M1' and the second high frequency signal M2 with 90 degree phase delay received or synthesized by the power splitter 30, so that the high frequency transceiver 40 can determine the states of the horizontal polarization path H and the vertical polarization path V of the object a to be tested or the quality of the conductive element B thereon according to the powers. For example, when the power is higher than the threshold, it indicates that the horizontal polarization path H and the vertical polarization path V are good and have no abnormality, or the conductive element B is defect-free and has good bonding quality; on the contrary, when the power is lower than the threshold, it indicates that at least one of the horizontal polarization path H and the vertical polarization path V is bad, abnormal, or the conductive element B is defective and the bonding quality is poor.

The object A to be measured can be an object having an antenna T, a horizontal polarization path H, a vertical polarization path V, a conductive element B, and a phase controller phi_HAnd phase controller phi_VThe semiconductor device, the antenna device, the mobile communication device, or the like. The antenna T can be based on the horizontal polarization signal S from the horizontal polarization path H_HAnd a vertically polarized signal S from a vertically polarized path V_VCircularly polarized radio wave W1 is formed, and circularly polarized radio wave W1 is transmitted to dual linearly polarized antenna 10. And phase controller phi_HCan control or adjust the horizontal polarization signal S_HAnd phase controller phi_VCan control or adjust the vertical polarization signal S_VThe phase of (c).

The circularly polarized radio wave W1 may be a left-handed circularly polarized radio wave or a right-handed circularly polarized radio wave or the like. The antenna T may be a patch antenna, and the conductive element B may be a conductive bump, a solder ball, or a solder ball. The semiconductor device may be a semiconductor package, a semiconductor structure, a chip package, or the like. The antenna device may be a package antenna, such as a millimeter wave package antenna. The mobile communication device may be, for example, a fifth generation mobile communication device or the like. However, the present invention is not limited thereto.

As shown in fig. 1B, in the transmission mode of the test system 1, the rf transceiver 40 can transmit an rf signal Mb, so that the power divider 30 divides the rf signal Mb from the rf transceiver 40 into a third rf signal M3 and a fourth rf signal M4, and the phase delayer 20 delays the phase of the third rf signal M3 from the power divider 30 by 90 degrees (i.e., ± 90 degrees or a time difference of 1/4 wavelengths) to form a third rf signal M3' with a 90-degree phase delay. The dual-linear polarized antenna 10 can form another circularly polarized radio wave W1 according to the third high frequency signal M3' with 90-degree phase delay from the phase delayer 20 and the fourth high frequency signal M4 from the power divider 30, so as to transmit the another circularly polarized radio wave W1 to the antenna T of the object a to be tested, and then the antenna T divides the another circularly polarized radio wave W1 into the horizontally polarized signal S_HAnd vertically polarizeSignal S_VTo pass through the horizontal polarization path H and the vertical polarization path V, respectively. Then, the high frequency signal transceiver 40 can receive the horizontal polarization signal S passing through the horizontal polarization path H and the vertical polarization path V of the object a through at least one transmission line L respectively_HAnd a vertical polarization signal S_VAccording to the horizontal polarization signal S_HAnd a vertical polarization signal S_VThe states of the horizontal polarization path H and the vertical polarization path V of the object a to be measured or the quality of the conductive element B thereon are determined. For example, when the power is higher than the threshold, it indicates that the horizontal polarization path H and the vertical polarization path V are good and have no abnormality, or the conductive element B is defect-free and has good bonding quality; on the contrary, when the power is lower than the threshold, it indicates that at least one of the horizontal polarization path H and the vertical polarization path V is bad, abnormal, or the conductive element B is defective and the bonding quality is poor.

For example, in fig. 1A or fig. 1B, when the electric wave of the antenna T of the object a matches the circularly polarized radio wave of the dual-linear polarized antenna 10, the high frequency signal transceiver 40 reads the maximum value of the power, which indicates that the conductive element B of the object a is defect-free. On the contrary, when the electric wave of the antenna T of the object a does not match the circular polarized radio wave of the dual linear polarized antenna 10, the high frequency transceiver 40 will read a value with sensitively varying (greatly varying) power, which indicates that the conductive element B of the object a may be defective.

In the above fig. 1A to 1B, the test system 1 needs to be matched with the phase control of the object a to be tested, each antenna T is connected to the circuits of different horizontal path polarization H and vertical polarization path V, and the circuits are provided with the phase controller Φ_HAnd phase controller phi_VTo set the horizontal polarization signal S respectively_HAnd a vertical polarization signal S_VThe phases of both. For example, each antenna T is connected to a different phase controller Φ_HAnd phase controller phi_VAnd the phase of the object A to be measured is set to the formula phi_H＝Φ_V+90 or the formula Φ_H＝Φ_V90, and this setting has to match the left-handed circularly polarized radio waves or the right-handed circularly polarized radio waves of the test system 1.

FIG. 2 is a schematic diagram of the test system 1 of FIGS. 1A and 1B according to an embodiment of the present invention. As shown in fig. 2, in the main technical content of the present embodiment, the test system 1 may include a plurality of test modules 1' having dual linear polarization antennas 10, phase delayers 20, power splitters 30 and high frequency signal transceivers 40, and other technical contents are as described in detail in fig. 1A and fig. 1B.

FIG. 3 is a schematic diagram of a basic architecture of another test system 2 according to the present invention. As shown in the figure, the test system 2 at least includes a dual linear polarization antenna 10, a first power divider 31, a second power divider 32, a first phase delayer 21, a third power divider 33, and a first power meter 41, where the first power divider 31 and the second power divider 32 are respectively electrically connected to the dual linear polarization antenna 10, the first phase delayer 21 is electrically connected to the first power divider 31, the third power divider 33 is electrically connected to the first phase delayer 21 and the second power divider 32, and the first power meter 41 is electrically connected to the third power divider 33.

The dual linear polarized antenna 10 can receive the circularly polarized radio wave W2 from the object a to be tested regarding the horizontal polarization path H and the vertical polarization path V, so that the dual linear polarized antenna 10 divides the circularly polarized radio wave W2 into a first high frequency signal N1 and a second high frequency signal N2. The first power splitter 31 and the second power splitter 32 can respectively receive the first high frequency signal N1 and the second high frequency signal N2 from the dual linear polarized antenna 10, the first phase delayer 21 can delay the phase of the first high frequency signal N1 from the first power splitter 31 by 90 degrees (i.e., ± 90 degrees or with a time difference of 1/4 wavelengths) to form a first high frequency signal N1 'with a phase delay of 90 degrees, and the third power splitter 33 can receive or combine the first high frequency signal N1' with a phase delay of 90 degrees from the first phase delayer 21 and the second high frequency signal N2 from the second power splitter 32, for example, combine the two into the high frequency signal Na. Meanwhile, the first power meter 41 can measure the powers of the first high-frequency signal N1' and the second high-frequency signal N2 with a phase delay of 90 degrees received or synthesized by the third power divider 33, so that the first power meter 41 can determine the states of the horizontal polarization path H and the vertical polarization path V of the object a to be tested or the quality of the conductive element B thereon according to the powers. For example, when the power is higher than the threshold, it indicates that the horizontal polarization path H and the vertical polarization path V are good and have no abnormality, or the conductive element B is defect-free and has good bonding quality; on the contrary, when the power is lower than the threshold, it indicates that at least one of the horizontal polarization path H and the vertical polarization path V is bad, abnormal, or the conductive element B is defective and the bonding quality is poor.

The object A to be measured can be an object having an antenna T, a horizontal polarization path H, a vertical polarization path V, a conductive element B, and a phase controller phi_HAnd phase controller phi_VThe semiconductor device, the antenna device, the mobile communication device, or the like. The antenna T can be based on the horizontal polarization signal S from the horizontal polarization path H_HAnd a vertically polarized signal S from a vertically polarized path V_VCircularly polarized radio wave W2 is formed, and circularly polarized radio wave W2 is transmitted to dual linearly polarized antenna 10. And phase controller phi_HCan control or adjust the horizontal polarization signal S_HAnd phase controller phi_VCan control or adjust the vertical polarization signal S_VThe phase of (c).

The circularly polarized radio wave W2 may be a left-handed circularly polarized radio wave or a right-handed circularly polarized radio wave or the like. The antenna T can be a flat antenna, etc., and the conductive element B can be a conductive bump, a solder ball, etc. The semiconductor device may be a semiconductor package, a semiconductor structure, a chip package, or the like. The antenna device may be a package antenna, such as a millimeter wave package antenna. The mobile communication device may be, for example, a fifth generation mobile communication device or the like. However, the present invention is not limited thereto.

The testing system 2 may further include a second phase delay device 22, and the second phase delay device 22 is electrically connected to the second power divider 32 to delay the phase of the second high-frequency signal N2 from the second power divider 32 by 90 degrees (i.e., ± 90 degrees or a time difference of 1/4 wavelengths) to form a second high-frequency signal N2' with a phase delay of 90 degrees.

The test system 2 may further include a fourth power divider 34, and the fourth power divider 34 is electrically connected to the second phase delayer 22 and the first power divider 31 to receive or combine the second high-frequency signal N2' with a phase delay of 90 degrees from the second phase delayer 22 and the first high-frequency signal N1 from the first power divider 31, for example, combine the two into the high-frequency signal Nb.

The testing system 2 may further include a second power meter 42, wherein the second power meter 42 is electrically connected to the fourth power divider 34 to measure the power of the second high-frequency signal N2' and the first high-frequency signal N1 with a phase delay of 90 degrees received or synthesized by the fourth power divider 34, and the second power meter 42 determines the defect of the conductive element B on the horizontal polarization path H or the vertical polarization path V of the object a according to the power.

For example, in fig. 3, when the electric wave of the antenna T of the object a matches the circularly polarized radio wave of the dual-linearly polarized antenna 10, the first power meter 41 or the second power meter 42 reads the maximum value of the power or the gain thereof, indicating that the conductive element B of the object a is not defective. Alternatively, when the electric wave of the antenna T of the object a does not match the circularly polarized radio wave of the dual-linearly polarized antenna 10, the first power meter 41 or the second power meter 42 reads a value in which the power or the gain thereof sensitively changes (largely changes), indicating that the conductive element B of the object a may be defective.

In the above fig. 3, the test system 2 needs to be matched with the phase control of the object a to be tested, each antenna T is connected to the circuits of different horizontal path polarization H and vertical polarization path V, and the circuits are provided with the phase controller Φ_HAnd phase controller phi_VTo set the horizontal polarization signal S respectively_HAnd a vertical polarization signal S_VThe phases of both. For example, each antenna T is connected to a different phase controller Φ_HAnd phase controller phi_VAnd the phase of the object A to be measured is set to the formula phi_H＝Φ_V+90 or the formula Φ_H＝Φ_V90, and this setting must match the left-handed circularly polarized radio waves or the right-handed circularly polarized radio waves of the test system 2.

FIG. 4 is a schematic diagram of the test system 2 of FIG. 3 according to an embodiment of the present invention. As shown in fig. 4, in the main technical content of the present embodiment, the test system 2 may be composed of a plurality of test modules 2' having dual linear polarization antennas 10, a first phase delayer 21, a second phase delayer 22, a first power splitter 31, a second power splitter 32, a third power splitter 33, a fourth power splitter 34, a first power meter 41 and a second power meter 42, and the rest of the technical contents are as described in detail in fig. 3.

Fig. 5 is a schematic diagram of an embodiment of the present invention in which the test module 1 'of fig. 1A to 1B and the test module 2' of fig. 3 are integrated into the same test system 3. As shown in fig. 5, in the main technical content of the present embodiment, the test system 3 may be composed of the test module 1 '(test system 1) of fig. 1A to 1B and the test module 2' (test system 2) of fig. 3, and the rest of the technical contents are as detailed in fig. 1A to 1B and fig. 3.

In addition, when the testing system 1 of fig. 1A to 1B or fig. 2 of the present invention is used, ideally, all the conductive elements B of the object a are perfect, the electric wave on the antenna T of the object a should match the circularly polarized radio wave of the testing system 1, and the high frequency signal transceiver 40 will read the maximum value of power or gain. However, when some of the conductive elements B are defective, the channel energy of the horizontal polarization path H or the vertical polarization path V is attenuated, and the circularly polarized radio wave becomes mismatched, so that the high frequency signal cannot enter the high frequency signal transceiver 40, and thus the reading of the power or gain of the high frequency signal transceiver 40 is sensitively changed (greatly changed). Therefore, the invention can complete the measurement of the horizontal polarization path H and the vertical polarization path V of the object A to be tested at one time so as to save the test time.

Meanwhile, when the test system 2 shown in fig. 3 or 4 of the present invention is used, in addition to obtaining the results of the test system 1, the test system 2 can also read another value of power or gain not matched with the circularly polarized radio wave, and the value can provide another characteristic (the ideal value is close to 0) for determining the quality of the conductive element B of the object a to be tested, so that the test system 2 can provide more accurate determination for analyzing the defects of the conductive element B.

In summary, the testing system of the present invention may have the following features, advantages or technical effects, for example.

Firstly, the testing system of the invention can simultaneously test the horizontal polarization path and the vertical polarization path of the object to be tested at one time, and the time for respectively switching the horizontal polarization path or the vertical polarization path is saved, so that the measuring speed (such as double speed) of the object to be tested is accelerated, and about half of the testing time is saved.

Secondly, the test system of the invention can rapidly test the state of the horizontal polarization path and the vertical polarization path of the object to be tested or the quality of the conductive element on the horizontal polarization path and the vertical polarization path. For example, the horizontal polarization path and the vertical polarization path have defects or abnormalities, or the conductive element has defects or poor bonding quality.

Thirdly, the test system of the invention can be used for OTA (over the air) measurement of the object to be tested, such as a millimeter wave package Antenna (AiP).

The test system can reduce the wave absorbing capacity requirement or specification requirement of the isolation box (metal isolation chamber), thereby reducing the setting cost of the isolation box.

The above embodiments are merely illustrative of the principles, features and effects of the present invention, and are not intended to limit the scope of the invention, which can be modified and varied by those skilled in the art without departing from the spirit and scope of the invention. Any equivalent changes and modifications made by the present disclosure should be covered by the claims. Therefore, the scope of the invention should be determined from the following claims.