RLC broadband test method and circuit
阅读说明：本技术 一种rlc宽带测试方法及电路 (RLC broadband test method and circuit ) 是由 张琪春 余泽 苗菁 王杰 王亚茹 张小林 金谋平 于 2020-04-28 设计创作，主要内容包括：本发明公开了一种RLC宽带测试方法及电路,属于微波技术领域,测试电路由一块微带板即可实现,待测元器件的测试连接线分别与微带板正面保留铜箔焊接,矢量网络分析仪的两个端口分别与测试电路的连接器相连,得到测试电路的散射矩阵,然后利用计算仿真工具对散射矩阵分情况处理,对电阻进行测试时,得到单频点、宽带范围内电阻值,对电感和电容进行测试时,除了得到电感值和电容值外,还可得到单频点、宽带范围内的串联电阻值和并联电导值。本发明无需人工多次干预即可获得元件的宽带特性,可极大提高科研人员在电子对抗、预警探测、卫星通信等宽带应用领域的工作效率。(The invention discloses a RLC broadband test method and a circuit, belonging to the technical field of microwaves, wherein the test circuit can be realized by a microstrip board, test connecting wires of components to be tested are respectively welded with copper foils reserved on the front side of the microstrip board, two ports of a vector network analyzer are respectively connected with a connector of the test circuit to obtain a scattering matrix of the test circuit, then a calculation simulation tool is used for carrying out condition processing on the scattering matrix, when a resistor is tested, resistance values in a single frequency point and a broadband range are obtained, when the inductor and the capacitor are tested, besides the inductance value and the capacitance value, a series resistance value and a parallel conductance value in the single frequency point and the broadband range can also be obtained. The invention can obtain the broadband characteristic of the element without manual multiple intervention, and can greatly improve the working efficiency of scientific research personnel in the broadband application fields of electronic countermeasure, early warning detection, satellite communication and the like.)
1. An RLC broadband test method is characterized by comprising the following steps:
s1: manufacturing test circuit
Manufacturing a test circuit according to the size of the component to be tested;
s2: obtaining scattering matrix data for a test circuit
Correspondingly connecting the test circuit with the input and output ports of the vector network analyzer, and obtaining scattering matrix data of the test circuit by using the vector network analyzer;
s3: obtaining characteristic parameters of a component to be tested
And processing the scattering matrix data acquired in the step S2 by using a calculation simulation tool to obtain the characteristic parameters of the component to be detected.
2. The RLC broadband test method of claim 1, wherein: in step S1, the device under test is any one of a resistor, an inductor, and a capacitor.
3. The RLC broadband test method of claim 1, wherein: in step S2, the test circuit is connected to the input and output ports of the vector network analyzer by using the rf cable.
4. The RLC broadband test method of claim 1, wherein: in said step S2, the vector network analyzer is calibrated according to the test frequency range before processing the scattering matrix data.
5. The RLC broadband test method of claim 1, wherein: in step S3, when the device to be tested is a resistor, the resistance value within a single frequency point and a broadband range is obtained after processing by using a calculation simulation tool; when the component to be tested is an inductor, obtaining an inductance value and a series resistance value within a single frequency point and a broadband range after processing by using a calculation simulation tool; and when the component to be tested is a capacitor, processing by using a calculation simulation tool to obtain a single frequency point, a capacitance value in a broadband range and a parallel conductance value.
6. The RLC broadband test method of claim 1, wherein in the step S3, the processing procedure of the scattering matrix data obtained in the step S2 by using a computational simulation tool comprises the following steps:
s31: writing calculation simulation program
Compiling a characteristic parameter calculation simulation program according to the type of the component to be tested;
s32: importing test data
Importing scattering matrix data of a test circuit into a calculation simulation tool;
s33: the computational simulation program in the above step S31 is called to process the test data
When the component to be tested is a resistor, calling a resistor calculation simulation program to obtain a resistance value in a single frequency point and broadband range; when the component to be tested is an inductor, calling an inductor calculation simulation program to obtain an inductance value and a series resistance value in a single frequency point and broadband range; and when the component to be tested is a capacitor, calling a capacitor calculation simulation program to obtain a single frequency point, a capacitance value in a broadband range and a parallel conductance value.
7. An RLC broadband test circuit, characterized by: the measurement method according to any one of claims 1 to 6, wherein the measurement method comprises a microstrip board, a component to be measured and two connectors, the lower surface copper foil of the microstrip board is completely reserved, the upper surface of the microstrip board is reserved with two copper foils along the length direction of the microstrip board, the component to be measured is connected with the two copper foils on the microstrip board, the two connectors are respectively arranged on two end surfaces of the microstrip board, and the two connectors are respectively connected with an input port and an output port of a vector network analyzer.
8. The RLC broadband test circuit of claim 7, wherein: and a test connecting line is arranged between the component to be tested and the microstrip plate, and the component to be tested is connected with the microstrip plate through the test connecting line.
9. The RLC broadband test circuit of claim 7, wherein: and the two copper foils are symmetrically arranged in the middle of the upper surface of the microstrip plate.
Technical Field
The invention relates to the technical field, in particular to an RLC broadband test method and circuit.
Background
With the rapid development of circuit integration technology, miniaturization and miniaturization of components become inevitable trends, and the requirements on the operating frequency and performance of the components are higher and higher, so how to test the performance of the components is very important. In electronic products, the resistance (R), the inductance (L) and the capacitance (C) are the most basic and the most used components, and the performance of the components directly affects the product quality.
At present, the traditional element parameter measuring instruments are all analog, and the measuring principle mainly adopts a bridge method, a resonance method and an I-V method. The conventional measuring instrument is mostly a desktop computer, such as an RLC bridge, and has a large volume and is inconvenient to carry, although the measuring method is simple, the conventional measuring instrument generally has the problems of low measuring precision, no memory function, capability of measuring performance only at a single frequency point, and the like, cannot acquire a multi-frequency value of the RLC at one time, requires manual operation and recording for acquiring broadband characteristics of elements, and has extremely low working efficiency in the broadband application fields of electronic countermeasure, early warning detection, satellite communication and the like, and a high-efficiency testing method is urgently needed for quickly testing and recording the broadband characteristics of the RLC, so that the RLC broadband testing method and the circuit are provided.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: how to solve the problems of low measurement precision, no memory function, only single frequency point measurement performance, low measurement efficiency and the like in the existing measurement method, provides an RLC broadband test method, can obtain element characteristic values in a broadband range at one time, obtains accurate numerical values of RLC at high frequency under the premise that the precision of a vector network analyzer is ensured, and can respectively and synchronously obtain the series resistance and the parallel conductance of an element when testing L, C.
The invention solves the technical problems through the following technical scheme, and the invention comprises the following steps:
s1: manufacturing test circuit
Manufacturing a test circuit according to the size of the component to be tested;
s2: obtaining scattering matrix data for a test circuit
Correspondingly connecting a connector of the test circuit with an input port and an output port of a vector network analyzer, and obtaining scattering matrix data of the test circuit by using the vector network analyzer;
s3: obtaining characteristic parameters of a component to be tested
And processing the scattering matrix data acquired in the step S2 by using a calculation simulation tool to obtain the characteristic parameters of the component to be detected.
Further, in step S1, the device under test is any one of a resistor, an inductor, and a capacitor.
Further, in step S2, the connector of the test circuit is connected to the input and output ports of the vector network analyzer by using a radio frequency cable.
Further, in step S2, before processing the scattering matrix data, the frequency range of the vector network analyzer is set according to the application frequency of the device under test engineering, and the vector network analyzer is calibrated by using the calibration device.
Further, in step S3, when the component to be tested is a resistor, the resistance value within a single frequency point and a broadband (multi-frequency point) range is obtained after processing by using a calculation simulation tool; when the component to be tested is an inductor, obtaining an inductance value and a series resistance value within a single frequency point, a broadband (multi-frequency point) range after processing by using a calculation simulation tool; when the component to be measured is a capacitor, the capacitance value and the parallel conductance value within the range of a single frequency point, a broadband (multi-frequency point) are obtained after the processing by using a calculation simulation tool.
Further, in the step S3, the processing of the scattering matrix data acquired in the step S2 by using a computational simulation tool includes the following steps:
s31: writing calculation simulation program
Compiling a characteristic parameter calculation simulation program according to the type of the component to be tested;
s32: importing test data
Importing scattering matrix data of a test circuit into a calculation simulation tool;
s33: the computational simulation program in the above step S31 is called to process the test data
When the component to be tested is a resistor, calling a resistor calculation simulation program to obtain a resistance value in a single frequency point and broadband range; when the component to be tested is an inductor, calling an inductor calculation simulation program to obtain an inductance value and a series resistance value in a single frequency point and broadband range; and when the component to be tested is a capacitor, calling a capacitor calculation simulation program to obtain a single frequency point, a capacitance value in a broadband range and a parallel conductance value.
The invention also provides an RLC broadband test circuit, which comprises a microstrip board, a component to be tested and two connectors, wherein the copper foil on the lower surface of the microstrip board is completely reserved, the two copper foils are reserved on the upper surface of the microstrip board along the length direction of the microstrip board, the component to be tested is connected with the microstrip board, the two connectors are respectively arranged on the two end surfaces of the microstrip board, and the two connectors are respectively connected with the input port and the output port of a vector network analyzer.
Furthermore, a test connecting line is arranged between the component to be tested and the microstrip plate, and the component to be tested is connected with the microstrip plate through the test connecting line.
Furthermore, the two copper foils are symmetrically arranged in the middle of the upper surface of the microstrip plate.
Compared with the prior art, the invention has the following advantages: through the cooperation of the calculation simulation tool, the test circuit and the vector network analyzer, the numerical values of the RLC on a plurality of frequency points can be obtained at one time without manually operating the instrument and recording for a plurality of times; when the inductance is measured, the inductance value and the series resistance value can be obtained simultaneously; when the capacitance is measured, the capacitance value and the parallel conductance value can be obtained simultaneously.
Drawings
FIG. 1 is a schematic diagram of a topology structure of an RLC broadband test method in an embodiment of the present invention;
FIG. 2 is a schematic diagram of a test circuit according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of the connection of a test circuit to a vector network analyzer in an embodiment of the present invention;
FIG. 4 is a diagram of an application interface for MATLAB, one of the computational simulation tools for scatter matrix data processing in an embodiment of the present invention.
Detailed Description
The following examples are given for the detailed implementation and specific operation of the present invention, but the scope of the present invention is not limited to the following examples.
As shown in fig. 1, the present embodiment provides a technical solution: an RLC broadband test method comprises the following steps:
s1: manufacturing test circuit
Manufacturing a test circuit according to the size of the component to be tested;
s2: obtaining scattering matrix data for a test circuit
Correspondingly connecting a connector of the test circuit with an input port and an output port of a vector network analyzer, and obtaining scattering matrix data of the test circuit by using the vector network analyzer: saving an output data file of the vector network analyzer into an s2p format, and reading the output data file by using a program in a calculation simulation tool;
s3: obtaining characteristic parameters of a component to be tested
And compiling a calculation simulation program, and processing the scattering matrix data acquired in the step S2 by using a calculation simulation tool (MALTAB) to obtain the characteristic parameters of the component to be tested.
In step S1, the device under test is any one of a resistor, an inductor, and a capacitor.
In step S2, the connector of the test circuit is connected to the input and output ports of the vector network analyzer by using the rf cable.
In step S2, the vector network analyzer frequency range is set according to the application frequency of the device under test engineering, and the vector network analyzer is calibrated by using the calibration element.
In step S3, when testing the resistance, the device to be tested is equivalent to a series resistance circuit, and is processed in a computational simulation tool to obtain a resistance value within a single frequency point and a broadband (multi-frequency point);
in step S3, when testing the inductor, the device to be tested is equivalent to a resistor and inductor series circuit, and is processed in a computational simulation tool to obtain an inductance value and a series resistance value within a single frequency point, a broadband (multi-frequency point) range;
in step S3, when testing the capacitor, the device to be tested is equivalent to a parallel circuit of the capacitor and the capacitor, and is processed in a calculation simulation tool to obtain an inductance value and a parallel resistance value within a single frequency point, a broadband (multi-frequency point) range;
in the step S3, the processing procedure of the scattering matrix data acquired in the step S2 by using the computational simulation tool includes the following steps:
s31: writing calculation simulation program
Compiling a characteristic parameter calculation simulation program according to the type of the component to be tested;
s32: importing test data
Importing scattering matrix data of a test circuit into a calculation simulation tool;
s33: the computational simulation program in the above step S31 is called to process the test data
When the component to be tested is a resistor, calling a resistor calculation simulation program to obtain a resistance value in a single frequency point and broadband range; when the component to be tested is an inductor, calling an inductor calculation simulation program to obtain an inductance value and a series resistance value in a single frequency point and broadband range; and when the component to be tested is a capacitor, calling a capacitor calculation simulation program to obtain a single frequency point, a capacitance value in a broadband range and a parallel conductance value.
As shown in fig. 2 and fig. 3, this embodiment further provides an RLC broadband test circuit, which includes a microstrip board, a device to be tested 3, and two connectors, namely a
The device to be tested 3 and the microstrip plate are provided with a test connecting line therebetween, and the device to be tested 3 is connected with the microstrip plate through the test connecting line.
The two
In summary, the RLC broadband test method and circuit in the above embodiments can obtain the values of the RLC at multiple frequency points at one time through the cooperation of the calculation simulation tool, the test circuit and the vector network analyzer, and do not need to manually operate the instrument and record for multiple times; when the inductance is measured, the inductance value and the series resistance value can be obtained simultaneously; when the capacitance is measured, the capacitance value and the parallel conductance value can be obtained simultaneously, and the method is worthy of popularization and application.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.
In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.
Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made to the above embodiments by those of ordinary skill in the art within the scope of the present invention.
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