阅读说明：本技术 用于测试印刷电路板的测试针、测试探针、及飞针测试器 (Test pin, test probe, and flying probe tester for testing printed circuit board ) 是由 斯特凡·韦斯 奥利·尤舒克 克里斯蒂安·温德尔 于 2019-01-17 设计创作，主要内容包括：本发明涉及用于测量印刷电路板的孔洞中的导电层的测试针,以及涉及配备有此类测试针的测试探针及涉及用于测试印刷电路板的配备有此类测试针或此类测试探针的飞针测试器。该测试针具有电容测量主体,该电容测量主体经由缆线连接到电容测量设备。该缆线被屏蔽为使得只有该电容测量主体可以与其他的导电主体形成电容耦接。这使得可能用高局部分辨率确定此电容耦接。(The invention relates to a test needle for measuring a conductive layer in a hole of a printed circuit board, and to a test probe equipped with such a test needle and to a flying-needle tester equipped with such a test needle or such a test probe for testing a printed circuit board. The test pin has a capacitance measuring body that is connected to a capacitance measuring device via a cable. The cable is shielded such that only the capacitance measuring body can form a capacitive coupling with the other conductive body. This makes it possible to determine this capacitive coupling with a high local resolution.)

1. A test pin for measuring a conductive layer in a hole of a printed circuit board, the test pin comprising:

an electrical conductor enclosed by a shield (24); the test pin (19) has a connection end at which it can be electrically connected to a capacitance measuring device; and a measuring end (23) which can be inserted into the hole during measurement,

wherein at said measuring end (23) a capacitance measuring body (26) connected to the electrical conductor is positioned outside the shield (24) and can form a capacitive coupling with the conductive layer in the hole.

2. A test needle according to claim 1, wherein the measuring body (26) is encapsulated by an electrically insulating layer.

3. A test needle according to claim 1 or 2, wherein the measuring body (26) is embodied in the form of a hollow cylinder.

4. A test needle according to claim 1 or 2, wherein the measuring body (26) is implemented by means of one or more windings of the electrical conductor, which are located outside the shield (24).

5. A test needle according to claim 4, wherein the test needle (19) has a conductive tube (24) forming the shield, in which conductive tube a cable (25) is guided and at the measuring end the cable (25) comprises the electrical conductor and an electrically insulating layer, the cable (25) protruding a small distance from the tube (24) at the connecting end for connection to the capacitance measuring device and a small distance at the measuring end (23) for forming the measuring body (26) in one or more windings around the tube (24).

6. A test needle according to claim 5, wherein, in the region of the measuring tip (27), the electrically conductive tube (24, 28) is cut in an oblique manner, so that in the axial direction of the tube (24, 28) an outlet opening (30) is created which extends in an oblique manner, wherein the cable is routed through the outlet opening.

7. A test probe for measuring a conductive layer in a hole of a printed circuit board, the test probe having:

a test needle (12) according to any one of claims 1-6, and

a touch sensor (20, 21) with which it can be determined whether the test pin (12) is touching another body.

8. A test probe according to claim 7, wherein the touch sensor (20, 21) has a spring-elastic mount (16, 17) for holding the test needle (12) and a sensor for detecting deflection of the spring-elastic mount (16, 17).

9. Test probe according to claim 8, wherein the sensor for detecting the deflection of the spring-elastic mount (16, 17) is a light sensor, in particular a photo-electric beam device (21).

10. Test probe according to claim 8 or 9, wherein a stop (13) is provided on the test probe (12), against which stop the test needle (19) and/or the spring-elastic mount (16, 17) bear in the non-deflected state.

11. A flying probe tester for testing printed circuit boards, in particular bare printed circuit boards, having at least one test finger (2) which is freely movable in a predetermined test area to be movable into the vicinity of a predetermined contact point of the printed circuit board (4), wherein the test finger has a test probe according to any one of claims 1 to 6 or a test probe according to claim 7.

12. The flying needle tester according to claim 11, wherein the flying needle tester (1) has a plurality of test fingers (2), and one or more of the test fingers are implemented as test needles (10) having predetermined contact points for electrically contacting the printed circuit board (4).

13. A method for measuring a conductive layer in a hole of a printed circuit board, wherein: using the flying pin tester of claim 11 or 12, inserting the test pin with the capacitance measuring body (26) into a hole, detecting the position of the capacitance measuring body (26), and at the same time, measuring the capacitance of the capacitance measuring body (26) relative to the surroundings of the capacitance measuring body, such that a determination is made as to whether an electrical conductor is positioned near the detected position based on the measured capacitance.

14. Method according to claim 13, wherein for measuring the capacitance an electrical signal having a frequency of at least 1kHz is applied to a conductor track having a conductive section in the vicinity of the hole to be measured and/or to the measuring body (26).

15. The method according to claim 13 or 14, wherein the determination as to whether a conductive body is positioned in the vicinity of the measuring body (26) is achieved by comparison with the capacitance distribution of the correct hole.

16. The method according to any of claims 13-15, wherein at least one conductor track (23) of the printed circuit board is connected to electrical ground, and this conductor track (33) is preferably a conductor track extending across the far side of the printed circuit board, such as a ground conductor track.

17. A method according to claim 16, wherein for measuring the capacitance a current measuring device is used, the input side of which has an electrical ground potential applied to it.

18. Method according to claim 16 or 17, wherein a measuring signal is applied to the conductive layers in the region of the plated through hole, and this signal can be detected by the measuring body (26).

19. The method of claim 18, wherein the plurality of measurement signals are oscillating signals having different frequencies, and in the measuring, different measurement signals are distinguished based on the different frequencies.

Technical Field

The present invention relates to test needles for measuring conductive layers in holes of printed circuit boards, as well as to test probes having such test needles and to flying-needle testers for testing printed circuit boards with such test needles or with such test probes.

Background

In the manufacture of printed circuit boards, the printed circuit boards are usually initially produced with so-called test pieces. The test piece is a region of a printed circuit board having a predetermined conductor track to allow measurements to be performed on the region. After measurements have been performed to test whether the printed circuit board has been manufactured correctly, the test piece is separated from the rest of the printed circuit board. The rest of the printed circuit board comprises one or more so-called use areas or panels, which are equipped with electrical components and are used in electrical products.

On the test piece, different electrical properties can be measured. The test piece has a special conductor track in which it can easily be determined whether the production process has already met the manufacturing requirements of conductor tracks suitable for high frequencies, for example. The conductor tracks of the test piece can also be used to carry out load tests, which can also destroy individual conductor tracks on the test piece. Since the conductor rail of the test piece is not used in the subsequent production, it can be optimized in particular for certain test procedures.

Not all measurements on the test piece can be transferred to the conductor tracks of the area of use. On the one hand, the conductor tracks in the area of use usually have a different geometry from the geometry on the test piece, so that the transfer of the measurement results in the test piece is not always applicable to the conductor tracks of the area of use.

Measuring probes have also been known for a long time for applying high-frequency signals to conductor tracks of a region of use in order to test the high-frequency properties of the conductor tracks. Such high-frequency measurements can be reliably carried out only if the contacting of the conductor tracks takes place in an electrically adapted manner. If a reflection occurs, it is difficult to identify the actual position of the defect. Furthermore, high frequency measurements always require a ground reference point close to the contact point. The design of the corresponding measuring head is therefore expensive.

For measuring conductive layers in back-drilled holes, a corresponding test head with a conductive elastomer is known from US 9,459,285B 2, which can mechanically sense and electrically measure the conductive layer.

It is also known from US 8,431,834B 2 to provide the printed circuit board with an additional conductor track so that impedance measurements between this additional conductor track and the actual conductor track can be used to verify whether the back-drilled hole is made deep enough or is already too deep. Providing such additional conductor tracks is very expensive and adds significantly to the cost of the multilayer printed circuit board.

US 2015/047892 a1 has disclosed a method in which the drill bit is simultaneously used as a probe to be able to measure the electrical contact with the conductor track during backdrilling and thus control the drill bit accordingly.

Patents US 9,341,670B 2, US 9,488,690B 2, and US 9,739,825B 2 disclose methods and apparatus for measuring so-called "residue" in holes in printed circuit boards. Such remnants are remnants or stubs of conductive layers in holes of the printed circuit board, which are generally electrically connected to the conductor tracks. To remove such residue, the holes of the printed circuit board are typically drilled a second time, which is referred to as back drilling. Such backdrilling can remove these remnants that have been inadvertently created during the coating of the individual layers with a conductive layer, typically a copper layer. However, such back-drilled holes may also cut off the electrical connections required for the conductor tracks. The apparatus has a capacitive probe that is inserted into a back-drilled hole in the printed circuit board. The capacitance of the capacitance probe is measured. Other conductive materials present in the back-drilled holes are detected by capacitance. It is possible to detect defects in the back-drilled hole.

Disclosure of Invention

The object behind the present invention is to create a test pin for measuring conductive layers in holes of printed circuit boards and corresponding test probe and flying-pin tester which can easily, reliably and very accurately measure back-drilled holes of printed circuit boards according to the method described in US 9,341,670B 2.

This object is achieved by the subject matter of the independent claims. Advantageous embodiments of the invention are disclosed in the respective dependent claims.

A test pin according to the present invention for measuring a conductive layer in a hole of a printed circuit board, the test pin comprising: an electrical conductor encapsulated by the shield; the test pin has a connection end where the test pin can be electrically connected to a capacitance measuring device; and a measuring end that can be inserted into the hole during measurement.

The test pin is characterized in that at the measuring end a capacitance measuring body connected to the electrical conductor is positioned outside the shield and can form a capacitive coupling with the conductive layer in the hole.

Since the conductive body of the test needle is shielded and only the capacitance measuring body can form a capacitive coupling with another conductive body, the test needle can detect the position of the capacitance measuring body very accurately based on the capacitance measured with respect to the conductive layer.

The measuring body is preferably encapsulated by an electrically insulating layer, so that no electrical contact can take place between the measuring body and the further electrically conductive body.

The measuring body can be implemented in the form of a hollow cylinder.

The measuring body can also be implemented by means of one or more windings of the electrical conductor, wherein the windings are located outside the shield.

The measuring body preferably has a maximum diameter of 1.5mm, in particular a maximum diameter of 1mm, and preferably a maximum diameter of 0.75 mm.

In the axial direction of the test needle, the test needle preferably has a maximum length of 0.5mm, preferably a maximum length of 0.25mm, and in particular a maximum length of 0.15 mm.

The smaller the measurement body is implemented, the more accurate the local resolution that can be detected with the test pin.

On the other hand, the larger the area over which the measuring body extends, the larger the capacitive coupling to the conductive layer in the hole and the stronger the signal measured. In order to detect the conductive layer, a compromise between local resolution and capacitive coupling must be made.

The test pin may have a conductive tube forming the shield, in which a cable is guided, the cable comprising the electrical conductor and an electrically insulating layer. The cable may protrude a short distance from the tube at the connection end for connection to the capacitance measuring device. At the measuring end, the cable may protrude a short distance to be placed around the tube, so as to form the measuring body in the form of one or more windings. This is a very simple design of the test pin, but still allows very accurate measurements to be made. Preferably, the cable is wound around the conductive tube with two, three, four, or more windings to produce the measurement body.

A test probe for measuring a conductive layer in a hole of a printed circuit board may be provided with the test pin described above and have a touch sensor, possibly used to determine whether the test pin is touching another body.

The touch sensor can be used to measure the depth of a blind hole in the following manner: the testing probe firstly touches the surface of the printed circuit board to be tested and then touches the bottom of the blind hole; the touches are each detected and in so doing the position of the test probe is detected. The difference between the two positions creates the depth of the blind hole.

The actual capacitance measurement should be as contactless as possible, which is why the touch sensor can also be used to try to determine whether another body is being touched, in order then to move the test pin if necessary so that it no longer touches the body.

The touch sensor may have a spring elastic mount for holding the test pin and a sensor for detecting deflection of the spring elastic mount.

The sensor for detecting the deflection of the spring-elastic mount may be an optical sensor. Such a light sensor can be implemented in different ways. The light source may be positioned, for example, on the spring-elastic mount directly or indirectly via an optical fiber, wherein the light output is detected by a light sensor. Upon deflection of the spring-elastic mount, the light cone moves away from the light sensor, which is detectable due to a change in brightness. It is likewise possible to provide a photoelectric beam.

Stops may be provided on the test probe against which the test needle and/or the spring-elastic mount bear in the undeflected state. The position of the test needle in the non-deflected state is thus clearly defined with respect to the test probe. If the position of the test probe is known, it is also possible to infer the position of the test needle and thus of the measuring body on the basis thereof.

A flying probe tester for testing printed circuit boards, particularly bare printed circuit boards, preferably has a test finger that is free to move in a predetermined test area to be able to move near a predetermined contact point of the printed circuit board. The test fingers may be provided with test needles as described above or with test probes as described above.

The flying probe tester may have a plurality of test fingers, wherein one or more of the additional test fingers are implemented as test probes having specific contact points for electrically contacting a printed circuit board.

According to another aspect, the invention relates to a method for measuring a conductive layer in a hole of a printed circuit board. For this purpose, the test needles mentioned above or the test probes mentioned above or the flying-needle tester mentioned above are used. The test pin with the capacitance measuring body is inserted into a hole. In this case, the position of the capacitance measuring body is detected and, at the same time, the capacitance of the capacitance measuring body with respect to the surroundings of the capacitance measuring body is measured. Based on the measured capacitance, a determination is made as to whether a conductive object is present near the detected location. By simultaneously detecting the position of the capacitance measuring body and the capacitance measured in conjunction with this position, it is thus possible to determine the position of the electrically conductive body. The capacitance measuring body can also be inserted into a small hole, so that the conductive layer implemented on the inner surface can be easily detected.

In addition to the actual measured value of the capacitance, it is also possible to use the touch sensor described above to determine the depth of the blind hole to be measured. Such depth determination may be achieved before, during, or after the capacitance measurement.

For measuring the capacitance, an electrical signal having a frequency of at least 1kHz is applied. Higher frequencies, for example at least 2kHz or at least 4kHz, may also be used. The measurement signal may be applied to the conductor of the test needle and thus to the capacitance measuring body. In a conductor track to be connected to a segment of an electrical conductor to be measured, a measurement signal induced in the conductor track is sensed. However, it is preferred that the measurement signal is applied to a conductor track to be connected to an electrical conductor sensed with the capacitive measuring body. The measurement signal of this conductor is then induced in the capacitance measuring body and can be correspondingly detected and evaluated by the measuring device. This is particularly advantageous when the electrical conductor is connected to a number of conductive segments positioned in different holes. Then, test fingers must be placed on the conductors and test probes can sense the conductors in the plurality of holes one after another.

A comparison with the capacitance distribution of a correctly implemented hole can be achieved when determining whether the electrical conductor is positioned in the vicinity of the measuring body. A "correctly implemented hole" is a hole in which the desired areas of the inner surface are provided with an electrically conductive layer and these areas are connected to an electrical conductor to which the measurement signal is applied, while other areas of the inner surface of the hole are not provided with an electrically conductive layer. The position of the conductive layer on the inner surface of the hole can thus be determined based on the comparison. If the measured capacitance distribution matches the predetermined capacitance distribution, the holes are implemented correctly, i.e. the conductive layer is only installed in the desired place. However, if there is a deviation, this means that the conductive layer is absent at a specific place or the conductive layer is provided at a place where the conductive layer should not be present.

With this method, the test pin is always kept as perpendicular as possible to the surface of the printed circuit board to be tested, since, as usual, the hole is created perpendicular to the surface of the printed circuit board. Thus, the test pins are axially aligned with the respective holes with little risk of collision with the inner surfaces of the holes.

Drawings

The invention will be explained in more detail below on the basis of exemplary embodiments shown in the drawings. In this schematic diagram:

FIG. 1 shows a perspective view of a flying probe tester;

FIGS. 2a-2c show perspective and side views of a test probe with a test needle according to the present invention;

FIG. 3 shows a cross-sectional view of a detail of a test needle with a test tip;

FIG. 4 schematically depicts a measurement apparatus for measuring a conductive layer in a plated through hole of a printed circuit board, wherein the printed circuit board is depicted in cross-section, and wherein a ground conductor rail is connected to an electrical ground;

FIG. 5 schematically depicts a measurement apparatus for measuring a conductive layer in a plated through hole of a printed circuit board, wherein the printed circuit board is depicted in cross-section, and wherein a ground conductor rail is not connected to an electrical ground; and

fig. 6 shows an equivalent circuit diagram of a measuring device for contactless measurement of a conductive layer in a plated through hole according to fig. 4 and 5.

Detailed Description

The invention can be implemented by means of a flying-needle tester 1 having a plurality of test fingers 2, each provided with a test probe 3 with which a printed circuit board 4 to be tested can be electrically contacted to feed or sense corresponding measurement signals in a conductor track (fig. 1).

Such test probes 3 are described, for example, in WO 03/048787A1, to which reference is made in this respect.

In the present exemplary embodiment, the flying probe tester has two lateral units 5 with a plurality of guide rails 6 positioned thereon, which extend across a test area that can receive a printed circuit board 4 to be tested. Each transverse element 5 forms a frame with a rectangular through opening. The two transverse units 5 stand vertically on a support 7 so that the through openings of the transverse units are flush with each other. The test area for receiving the printed circuit board 4 extends through the through opening of the transverse unit 5. In the present exemplary embodiment, each transverse unit has four guide rails 6, two on each side of the transverse unit 5. On each side of the transverse unit, one of the guide rails 6 is positioned above the through opening 8 and the other of the guide rails is positioned below the through opening.

Each guide 6 has at least one slide 9 slidingly positioned on the guide, each slide supporting one of the test fingers 2. In the present exemplary embodiment, two slides 9 are provided on each guide 6. Basically, however, more than two sliders 9 may be mounted on the guide 6.

The test finger 2 is pivotally fixed at one end to a slide 9. Such a design of a flying probe tester can be inferred, for example, from WO 2014/140029a 1. In this respect, reference is made to the entire content of this document.

The test probes 3 are positioned at the ends oriented away from the slide 9, i.e. the free ends of the test fingers 2, and each have a test needle 10 oriented with the contact tip 11 in the direction of the printed circuit board 4 to be contacted. The test finger 2 can be moved together with the test probe 3 in a direction towards the printed circuit board 4 and away from the printed circuit board 4 to position the contact tip 11 on the surface of the printed circuit board or to insert the contact tip into a hole in the printed circuit board 4.

According to the invention, at least one or several of the test fingers 2 has a corresponding test probe 12 (fig. 2a-2c) which is implemented for the contactless capacitive sensing of holes in the printed circuit board 4 and in particular blind holes therein. Such a test probe 12 has a base plate 13, which is embodied as a printed circuit board. The base plate 13 is provided with a brake body 14 having two brake arms 15 with which the test probe 12 can be secured brakingly to one of the test fingers 2. Two spring arms 16, 17 are fixed to the brake body 14. One of the two spring arms bears directly against the base plate 13 and is clamped between the base plate 13 and the brake body 14. The other spring arm 17 is fixed to the surface of the brake body 14 facing away from the base plate 13 by means of two screws. The spring arms 16, 17 are oriented parallel to each other. Starting from the brake body 14, the base plate 13 and the spring arms 16, 17 taper, viewed from above, to a free end 18, at which the two spring arms 16, 17 each project a short distance. At these ends of the spring arms 16, 17, the respective test needles 19 are fixed such that the sections of the elastic spring arms 16, 17, the braking body 14, and the test needle 19 joining the two spring arms 16, 17 form a parallelogram. The free ends of the two spring arms 16, 17 can be pivoted away from the base plate 13, so that the test needle is supported on the test probe 12 in an elastic manner. The spring arms 16 that are disposed directly on the base plate are referred to hereinafter as base spring arms 16, while the spring arms 17 at the distal end of the base plate 13 are referred to as free spring arms 17. The base plate 13 thus constitutes a stop for the base spring arm 16 and thus for the movement of the test needle 19 relative to the rest of the body of the test needle 12.

The two spring arms 16, 17 form an approximately triangular frame, seen from above. The measuring terminal 20 directed towards the base plate 13 is positioned on the free spring arm 17.

On the base plate 13, a photoelectric beam device 21 is provided, which forms a photoelectric beam with a light source and a light sensor, which is interrupted by a measuring terminal 20 when the spring arms 16, 17 are not deflected. When the spring arm is deflected, the measuring terminal 20 moves out of the photoelectric beam, so that the light sensor detects an increase in brightness. This photo-beam device 21 thus forms, together with the measuring terminal 20, a touch sensor which detects when the spring arms 16, 17 are deflected as a result of the test pin 19 touching the other body.

The test pin has a connection end 22 and a measurement end 23. In the region of the connecting end 22, the free spring arm 17 is connected to a test pin 19. The test pin 19 is connected to the base spring arm 16 such that in an undeflected state of the spring arms 16, 17 (i.e. when the base spring arm 16 abuts the base plate 13), the test pin 19 is positioned perpendicular to the plane of the base plate 13.

This test probe 12 and the corresponding test finger 2 are implemented such that, in an undeflected state when mounted on the test finger 2, the test needle is positioned perpendicular to the test area and perpendicular to the printed circuit board 4 positioned in the test area.

The test needles 19 on the test probes 12 protrude a small distance relative to the base plate 13. The test needle 19 has a metal tube which is electrically conductive and preferably has an outer diameter of at most 0.2mm and in particular at most 0.18 mm. The cable 25 is guided in a metal tube 24 and has an electrical conductor, which is surrounded by an insulating layer. In the present exemplary embodiment, the cable 25 is connected to a conductor track which is implemented on the base plate 13 and which is electrically connected to a capacitance measuring device (not shown). At the measuring end 23, the conductor of the cable 25 is connected to a capacitance measuring body 26. The capacitance measuring body is a metal annular body positioned around and electrically insulated from the tube. The capacitance measuring body 26 may be a metal ring provided with an insulating layer, which is electrically connected to the conductor of the cable 25. However, the capacitance measuring body 26 may also consist of one or more windings of the cable 25.

The metal tube 24 serves to shield the cable 25 so that only the capacitive measuring body 26 can be capacitively coupled with a nearby positioned electrical conductor and only the capacitive coupling of the capacitive measuring body with another electrical conductor can be sensed by the cable 25.

A measuring tip 27 is provided at the measuring end 23 of the test needle 19. This measuring tip is only used for mechanically touching another body. The measuring tip may comprise a material which is non-conductive or may be provided with an insulating layer. In the present exemplary embodiment, it is not used to electrically contact the contact points of the printed circuit board.

In the context of the present invention, however, it is also possible to embody the measuring tip to be electrically conductive, so that it can be used to produce an electrical connection to a contact point of a printed circuit board. If such a conductive contact tip is electrically connected to the capacitance measuring body 26, the contact tip may also be considered in the capacitive coupling of the capacitance measuring body 26 with the conductive article to be measured.

An exemplary embodiment of the measuring tip 27 consists of a sleeve 28, one end of which is mechanically connected to the tube or shield 24 in an electrically conductive manner by means of a soldered connection 29. In the region of the welded connection 29, the sleeve has a diameter of, for example, 0.3 mm. The sleeve is axially oriented in the direction of the measuring tip 27 and has a diameter of 0.2mm or less in the region of the measuring tip 27. In the region of the measuring tip, the sleeve 28 is cut in an oblique manner, so that an outlet opening 30 extending in an oblique manner is created.

The cable 25 is guided through the tube 24 and the sleeve 28 and exits the sleeve 28 at the outlet opening 30. In the region of the measuring tip 27, the cable is wound around three windings around the sleeve 28 and forms a capacitance measuring body 26.

The measuring tip 27 is itself electrically conductive and is connected to the tube 24 in an electrically conductive manner.

Such a measuring tip implemented in an electrically conductive manner has the following advantages: the test needle 19 can, for example, be in contact with a calibration face having conductive and non-conductive surface sections, making it possible to calibrate the position of the test needle 19 and thus of the test finger 2, in which the test needle 19 is fixed.

The test pin 19 shown in fig. 3 is easy to produce and has a very small measuring body 26, so that the local resolution is correspondingly accurate.

A typical measuring procedure for measuring conductive paint in blind holes of a printed circuit board by means of the flying probe tester 1 is carried out as follows:

the test probe 12 according to the invention has a test finger 2 which mechanically contacts the surface to be tested of the printed circuit board 4 to determine the height of this surface.

A test probe with a test needle is inserted into the blind hole belonging to the printed circuit board 4 and to be measured until the measuring tip 27 touches the bottom of the blind hole of the printed circuit board 4. The position of the test probe 12 at the time when the bottom of the blind hole is touched is detected by means of the touch sensor, so that the depth of the blind hole is determined on the basis of the difference in height between this position and the position at which the test probe (or more precisely its measuring tip 27) has touched the surface of the printed circuit board.

With the capacitance measuring body 26 positioned in the blind hole, a capacitance measurement of the capacitance between the capacitance measuring body 26 and the electrical conductor positioned in the blind hole is performed in the blind hole by: a predetermined measuring signal is applied to the conductor by means of a further test finger 2 contacting a contact point of the printed circuit board which is connected to the conductor. The measurement signal preferably has a frequency of at least 1kHz and in particular a frequency of at least 4kHz or at least 10 kHz.

The signal thus induced in the capacitive measuring body 26 is sensed by the capacitive measuring body 26 via the cable 25 and relayed to the measuring device. The amplitude of the signal measured in this way is used to determine the capacitance generated between the capacitance measuring body 26 and the electrical conductor adjacent to it. At the same time, the position of the capacitance measuring body 26 is detected, which is predetermined by the position of the test probe 12 set by the movement of the corresponding test finger 2 and is known on the flying-needle tester 1. By simultaneously detecting the position and the capacitance during the movement of the capacitance measuring body 26 in the blind hole, it is possible to determine the capacitance which the capacitance measuring body 26 exhibits with respect to its surroundings, position-dependently. This produces a distribution of capacitance, on the basis of which it is possible to deduce whether the inner surface of the blind hole is coated with an electrical conductor.

Preferably, flying probe tester 1 has a plurality of test fingers 2, each provided with a test probe 12 according to the present invention. Thereby, a plurality of blind holes or through holes can be measured simultaneously. Preferably, measurement signals that differ in terms of frequency are used during simultaneous measurements. It is therefore possible to use a corresponding band-pass filter to prevent crosstalk from one measurement to another.

Preferably, each rail 6 is provided with at least one test finger 2 with a test probe 3 equipped with a conventional test needle 10 for electrically contacting a contact point of a printed circuit board, and with another test finger 2 with a test probe 12 according to the invention. It may also be advantageous to provide the rail 6 with two test fingers 2 with conventional test probes 3 and another test finger 2 equipped with test probes 12 according to the invention.

However, the invention can also be used on a conventional flying probe tester having a plurality of individual transverse beams not positioned on a combined transverse element 5. In a flying probe tester of this type, it is in turn advantageous to provide each transverse beam with at least one test finger 2 with a test probe 12 according to the invention and one or more test fingers with a conventional test probe 3.

In the case of the use of a test probe according to the invention, it is therefore possible very easily to determine the geometry of the blind hole or the through hole with great accuracy and, on the other hand, to determine very easily whether the inner surface of the blind hole or the through hole is coated with an electrical conductor.

Also, the test probe 12 according to the present invention may be used in a conventional flying probe tester. No other mechanical modifications are required. It is only necessary to provide the flying-needle tester with a suitable control program that is capable of processing the measurement signals generated by the test probe 12 according to the invention, of applying suitable measurement signals, and of controlling the movement of the test finger 2 with the test probe 12 according to the invention.

A method for measuring the plated through holes 31 in the holes 37 of the printed circuit board 38 will be explained below. The plated through hole 31 is a conductive coating on the inner surface of the hole. When the printed circuit board 38 is produced, the entire hole is initially coated. The holes are then back-drilled a second time to a depth such that in the predetermined section the coating of the holes 37 is removed again. In this regard, errors may occur when the back-drilled hole has been implemented such that the back-drilled hole is not deep enough or too deep such that the rim of the coating in the hole is offset a little from its desired position. The second hole may also be offset a little with respect to the first hole, so that the two holes are not concentric. As a result, thin, unwanted streaks in the coating may still be present in the region of the holes. The striations extend in a direction approximately parallel to the central axis of the hole. Such striations may also occur when the second aperture is embodied to be slightly inclined with respect to the first aperture.

The printed circuit board 38 has a plurality of layers 32, between which conductor tracks 33 are embodied. There are larger and smaller conductor tracks. As a rule, the so-called ground conductor track is the largest conductor track of the printed circuit board and may generally extend across a plurality of layers 32. In the measurement method described below, the ground conductor track is connected to an electrical ground 34 (fig. 4). It is also possible to use a plurality of individual smaller conductor tracks connected simultaneously to the electrical ground 34 instead of using individual ground conductor tracks. In the following description, the term "ground conductor track" is used to describe one or more conductor tracks that may be simultaneously connected to electrical ground and expanded across a large area of the printed circuit board 38, particularly across several layers. Such a connection to electrical ground 34 is preferably made by placing the moving contact finger of the flying probe tester against the conductor track, this contact finger having a conductive contact tip connected to electrical ground.

When the test probe 3 is inserted into the hole, the capacitance measuring body 26 forms a capacitance with the surrounding electrical conductor. The aim of this method is to measure the capacitance or more precisely the change in the capacitance when the capacitance measuring body is inserted into the hole.

For this purpose, the signal generator 35 is used to apply an oscillating signal with respect to electrical ground to the plated through hole 31. This measurement signal flows along the plated through hole 31 via the capacitance C1 between the plated through hole 31 and the capacitance measuring body 26 into the capacitance measuring body 26 and from there via the cable 25 to the current measuring device 36, with which the voltage and thus the capacitance C1 or more precisely its capacitance change is measured when the capacitance measuring body 26 travels in the vicinity of the plated through hole 31.

A parasitic capacitance C2 is created between the plated through hole 31 and the adjacent conductor track. This is primarily relevant when the parasitic capacitance is generated between the plated through hole and the ground conductor rail. If the ground conductor rail is not grounded, the parasitic capacitance may cause the measurement signal on the other conductor rail to be transmitted to the ground conductor rail via the capacitive coupling (capacitance C3). As a result, with the capacitance measuring body, a measurement signal is observed via the other capacitive coupling (capacitance C4) between the capacitance measuring body 26 and the conductor track located outside the plated through hole (fig. 5).

As a result, it may no longer be possible to accurately determine whether the capacitance C1 between the measurement body 26 and the plated through hole 31 or the capacitance C4 between the measurement body 26 and one of the other conductor rails is being measured.

The functionality of the measuring device from fig. 4 and 5 will be explained below on the basis of the equivalent circuit diagram (fig. 6). The equivalent circuit diagram includes the following components:

26 measurement body

31 plated through hole

34 electrical ground (switchable as ground finger)

35 Signal generator

36 current measuring device

The capacitor C1 is the coupling between the plated through hole 31 and the measurement body 26.

Capacitor C2 is positioned between plated through hole 31 and the ground conductor rail as defined by the above description. Capacitor C3 is the coupling between the ground conductor rail and the other conductor rails. The capacitor C4 is the coupling of the conductor track to the measurement body 26. The coupling of the conductor track to the measuring body 26 can be realized by means of a ground conductor track or by means of a capacitance C3 of another conductor track coupled to the ground conductor track. If the coupling is produced directly between the ground conductor track and the measuring body 26, the capacitor C3 is eliminated, which is why it is short-circuited with a dashed line in the equivalent circuit diagram and does not need to be taken into account in the following considerations.

The connection 34 of the ground conductor track to electrical ground is depicted in the equivalent circuit diagram with a switch (fig. 6); in the measuring device according to fig. 4, the switch is closed, whereas in the measuring device according to fig. 5, the switch is open.

If the ground conductor rail is not connected to electrical ground (switch open at 34 in fig. 6), then the following condition is true:

the capacitors C2(, C3) and C4 are connected in parallel to the capacitor C1. If the serial circuit consisting of C2(, C3) and C4 is larger than C1, the total capacitance between the plated through hole 31 and the measuring body 26 is mainly determined by the serial circuit of the capacitors C2(, C3) and C4, and the current measured by the current measuring apparatus 36 is mainly determined by the serial circuit consisting of C2(, C3) and C4.

If the ground conductor rail is connected to electrical ground (switch closed at 34 in fig. 6), the connection between C2 and C3 is connected to electrical ground.

The current measuring device 36 is a current-to-voltage converter having an operational amplifier 39 and a measuring resistor 40. For example, the operational amplifier is of the AD549 type. At the output of the current measuring device 36, a voltage signal Um is present, which is proportional to the current flowing at the input of the current measuring device.

The inputs of the operational amplifier are connected to the measurement body 26, while the other inputs are connected to electrical ground. The feedback of the input and output sides of the operational amplifier via the measuring resistor 40 keeps the two inputs of the operational amplifier 39 at the potential of electrical ground.

The capacitors C3 and C4 are thus positioned between two points, each point being at a potential of electrical ground, such that no current flows through the two points. They are therefore not visible in the measurement.

The voltage signal of the signal generator 35 is present on one side of the capacitor C2, while the other side of the capacitor C2 is connected to electrical ground, so that a current flows through this capacitor. This current is not measured by the measurement device because it flows directly to electrical ground. This current affects the power output by signal generator 35, but does not affect the voltage output by signal generator 35. Since the voltage signal U present at the capacitor C1 and the current I flowing through the capacitor are known, the voltage signal and the current can be used to determine the capacitance of the capacitor C1 when the ground conductor rail is connected to electrical ground without the measurement being affected by the other capacitances C2, C3, and C4.

As a result, by connecting the ground conductor rail to electrical ground, the capacitive coupling C1 between the measurement body 26 and the plated through hole 31 can be accurately measured; the amount of capacitive coupling C1 can be determined and allows gathering information about the geometry of the defects in the plated via.

This method is so accurate that it can also be modified such that the signal of the signal generator can be applied to a single conductor track which extends to the through-hole, so that the capacitive coupling of the measuring body to this conductor track can be detected on the basis of this signal. Thereby, the position of the measuring body in the through hole can be determined and it can be determined that this conductor track is correctly conducting the measuring signal to the area of the plated through hole.

Typically, the position of the test probe relative to the position of the printed circuit board to be tested is calibrated by bringing the contact tip of the test probe 12 into contact with the surface of the printed circuit board. Such mechanical calibration may be replaced by electrical calibration; in achieving the electrical calibration, an oscillating signal is applied to the conductor track adjacent to the through-hole, which signal is then detected by the test probe or more precisely its measuring body.

The method can also be modified such that a plurality of measurement signals with different frequencies are applied to different conductor tracks and/or to the plated-through holes. Different frequencies are distinguished during the measurement. This can be achieved, for example, in the following way: the current measuring device 36 is preceded by tunable band-pass filters which can be connected to frequency bands respectively comprising the frequency of one of the signals. Thereby, it is possible to detect a plurality of conductor tracks in the vicinity of the through hole, provided that the conductor tracks are not shielded by the plated through hole.

List of reference numerals

1 flying probe tester

2 test finger

3 test probe

4 printed circuit board

5 transverse unit

6 guide rail

7 support

8 port

9 slider

10 test needle

11 contact tip

12 test probe

13 base plate

14 brake body

15 brake arm

16 spring arm (base spring arm)

17 spring arm (free spring arm)

18 free end

19 testing needle

20 measuring terminal

21 photoelectric beam device

22 connecting end

23 measuring end

24 tube

25 Cable

26 capacitance measuring body

27 measuring tip

28 casing tube

29 welding connection structure

30 outlet opening

31 plated through hole

32 layers

33 conductor track

34 electrical ground

35 Signal generator

36 current measuring device

37 holes

38 printed circuit board

39 operational amplifier

40 measuring resistor