阅读说明：本技术 等效输入电压源的估计 (Estimation of equivalent input voltage source ) 是由 达维德·拉克罗齐 图罗·克斯基-亚斯卡里 于 2018-12-11 设计创作，主要内容包括：本发明的目的是提供一种用于估计升压转换器的等效输入电压的设备。根据第一方面,设备配置为向升压转换器施加开关信号,其中所述升压转换器配置为向触觉反馈元件提供电压；等待至少一个时间间隔；测量升压转换器的输出侧上的至少一个电压；以及基于测量的至少一个电压来估计所述升压转换器的等效输入电压,其中所述等效输入电压表示在参考条件下将引起测量的至少一个电压的物理输入电压。描述了一种设备,方法和计算机程序。(It is an object of the present invention to provide an apparatus for estimating an equivalent input voltage of a boost converter. According to a first aspect, a device is configured to apply a switching signal to a boost converter, wherein the boost converter is configured to provide a voltage to a haptic feedback element; waiting for at least one time interval; measuring at least one voltage on an output side of the boost converter; and estimating an equivalent input voltage of the boost converter based on the measured at least one voltage, wherein the equivalent input voltage represents a physical input voltage that would result in the measured at least one voltage under reference conditions. An apparatus, method and computer program are described.)

1. An apparatus configured to:

applying a switching signal to a boost converter, wherein the boost converter is configured to provide a voltage for a haptic feedback element;

waiting for at least one time interval;

measuring at least one voltage on an output side of the boost converter; and

estimating an equivalent input voltage of the boost converter based on the measured at least one voltage, wherein the equivalent input voltage represents a physical input voltage that would result in the measured at least one voltage under reference conditions.

2. The apparatus of claim 1, wherein the at least one time interval is in a range of 50 to 200 microseconds.

3. The apparatus of any one of the preceding claims, wherein the measured at least one voltage is in a range of 30 to 500 volts.

4. The apparatus of any preceding claim, further configured to:

detecting an undesired behavior of the boost converter based on the measured at least one voltage.

5. The apparatus of any preceding claim, wherein the reference conditions comprise a reference temperature, a component of the boost converter having predetermined electrical characteristics, and a predetermined input voltage.

6. The apparatus of any preceding claim, further configured to:

disconnecting the haptic feedback element from the boost converter during the at least one time interval and the measured duration of the at least one voltage.

7. The apparatus of any preceding claim, further configured to:

adjusting the switching signal applied to the boost converter based on the equivalent input voltage.

8. The apparatus of any preceding claim, wherein the at least one voltage is measured using a voltage divider on the output side of the boost converter.

9. The apparatus of any preceding claim, wherein the input voltage is measured directly in addition to estimating the equivalent input voltage.

10. The apparatus of any preceding claim, wherein the input voltage is measured using a voltage divider in addition to estimating the equivalent input voltage.

11. The apparatus of any preceding claim, further configured to:

an alarm is triggered if an undesired behavior of the boost converter is detected.

12. The apparatus of any preceding claim, further configured to:

measuring the stiffness of the haptic feedback element by inputting a voltage from the boost converter to the haptic feedback element and measuring a resulting signal from the haptic feedback element after the voltage is input.

13. An apparatus configured to:

applying a switching signal to a boost converter, wherein the boost converter is configured to provide a voltage for a haptic feedback element;

waiting until a voltage on an output side of the boost converter reaches a predetermined value;

measuring the time delay between the start of the switching signal and the time when the output voltage reaches the predetermined value; and

based on the time delay, an equivalent input voltage of the boost converter is estimated, wherein the equivalent input voltage represents a physical input voltage that would cause the measured time delay under a reference condition.

14. A method, comprising:

applying a switching signal to a boost converter, wherein the boost converter is configured to provide a voltage for a haptic feedback element;

waiting for at least one time interval;

measuring at least one voltage on an output side of the boost converter; and

estimating an equivalent input voltage of the boost converter based on the measured at least one voltage, wherein the equivalent input voltage represents a physical input voltage that would result in the measured at least one voltage under reference conditions.

15. A method, comprising:

applying a switching signal to a boost converter, wherein the boost converter is configured to provide a voltage for a haptic feedback element;

waiting until a voltage on an output side of the boost converter reaches a predetermined value;

measuring the time delay between the start of the switching signal and the time at which the output voltage reaches the predetermined value; and

based on the time delay, an equivalent input voltage of the boost converter is estimated, wherein the equivalent input voltage represents a physical input voltage that would cause the measured time delay under a reference condition.

16. A computer program comprising program code configured to:

the method according to claim 14 or 15 is performed when the computer program is run on a computer.

Technical Field

The present disclosure relates to an electronic device, and more particularly, to a device for estimating an equivalent input voltage of a boost converter. Furthermore, the disclosure relates to a corresponding method and computer program.

Background

High voltages are required in certain applications of electronic devices. For example, a haptic feedback element that may be used to provide haptic feedback in a mobile device (e.g., a mobile phone) may require tens or even hundreds of volts to function properly. Meanwhile, conventional batteries in mobile devices can directly provide voltages of only a few volts. This voltage may be converted to a higher voltage using a boost converter. However, the performance of the boost converter may be affected by various factors, and the effect of these factors on the output voltage of the boost converter may be difficult to predict.

Disclosure of Invention

This summary is provided to introduce a selection of concepts in a simplified form that are further described below in the detailed description. This summary is not intended to identify key features or essential features of the claimed subject matter, nor is it intended to be used to limit the scope of the claimed subject matter.

It is an object of the present invention to provide an apparatus for estimating an equivalent input voltage of a boost converter. This object is achieved by the features of the independent claims. Further embodiments are provided by the dependent claims, the description and the drawings.

According to a first aspect, a device is configured to apply a switching signal to a boost converter, wherein the boost converter is configured to provide a voltage to a haptic feedback element; waiting for at least one time interval; measuring at least one voltage on an output side of the boost converter; and estimating an equivalent input voltage of the boost converter based on the at least one measured voltage, wherein the equivalent input voltage represents a physical input voltage that would result in the at least one measured voltage under reference conditions. For example, the equivalent input voltage may be used to characterize the performance of the boost converter and better drive the boost converter regardless of conditions.

In a further implementation form of the first aspect, the at least one time interval is in a range of 50-200 microseconds. Thus, the measurement is substantially imperceptible to the user.

In a further implementation form of the first aspect, the at least one voltage measured is in the range of 30-500 volts such that the voltage may be sufficient for a piezoelectric haptic feedback element.

In a further implementation form of the first aspect, the device is further configured to detect an undesired behavior of the boost converter based on the at least one voltage measured. This may allow for detecting an undesired performance of the boost converter.

In a further implementation form of the first aspect, the reference condition comprises a reference temperature, a component of the boost converter having a predetermined electrical characteristic, and a predetermined input voltage. Thus, these factors can be characterized by the equivalent input voltage.

In a further implementation form of the first aspect, the device is further configured to disconnect the haptic feedback element from the boost converter during the at least one time interval and a duration of the measurement of the at least one voltage. This can reduce measurement errors caused by the element and prevent the element from producing unwanted tactile feedback or sound during measurement.

In a further implementation form of the first aspect, the device is further configured to adjust the switching signal based on the equivalent input voltage. Therefore, the boost converter can operate properly regardless of the conditions.

In a further implementation form of the first aspect, the at least one voltage is measured using a voltage divider on the output side of the boost converter. Therefore, the measured voltage may be lower than the output voltage of the boost converter.

In a further embodiment of the first aspect, the input voltage is measured directly in addition to the estimation of the equivalent input voltage. This allows other operating parameters, such as temperature, to be derived.

In a further implementation form of the first aspect, the input voltage is measured using a voltage divider in addition to estimating the equivalent input voltage. This allows other operating parameters, such as temperature, to be derived.

In a further implementation form of the first aspect, the device is further configured to trigger an alarm in case an undesired behavior of the boost converter is detected. Thus, if sufficient voltage cannot be provided to the haptic feedback element, the user of the device may be notified, the components may be protected from potential damage, and sufficient haptic feedback may be ensured, which may provide a good user experience.

In a further implementation form of the first aspect, the apparatus is further configured to measure the stiffness of the haptic feedback element by inputting a voltage from the boost converter to the haptic feedback element and measuring a resulting signal from the haptic feedback element after inputting the voltage. The measurement may be taken into account when driving the haptic feedback element.

According to a second aspect, an apparatus is configured to apply a switching signal to a boost converter, wherein the boost converter is configured to provide a voltage to a haptic feedback element; waiting for a voltage at an output side of the boost converter to reach a predetermined value; measuring the time delay between the start of the switching signal and the time at which the output voltage reaches the predetermined value; and estimating an equivalent input voltage of the boost converter based on the time delay, wherein the equivalent input voltage represents a physical input voltage that would cause the measured time delay under a reference condition. For example, the equivalent input voltage may be used to characterize the performance of the boost converter and to properly drive the boost converter regardless of conditions.

According to a third aspect, a method includes applying a switching signal to a boost converter, wherein the boost converter is configured to provide a voltage for a haptic feedback element; waiting for at least one time interval; measuring at least one voltage on an output side of the boost converter; and estimating an equivalent input voltage of the boost converter based on the at least one measured voltage, wherein the equivalent input voltage represents a physical input voltage that would result in the at least one measured voltage under reference conditions.

According to a fourth aspect, a method includes applying a switching signal to a boost converter, wherein the boost converter is configured to provide a voltage for a haptic feedback element; waiting until the voltage at the output side of the boost converter reaches a predetermined value; measuring the time delay between the start of the switching signal and the time at which the output voltage reaches the predetermined value; and estimating an equivalent input voltage of the boost converter based on the time delay, wherein the equivalent input voltage represents a physical input voltage that would cause the measured time delay under a reference condition.

According to a fifth aspect, there is provided a computer program comprising program code configured to perform the method according to the third or fourth aspect when the computer program is run on a computer.

Many of the attendant features will be more readily appreciated as the same becomes better understood by reference to the following detailed description considered in connection with the accompanying drawings.

Drawings

The invention will be better understood from the following detailed description in light of the accompanying drawings, in which:

fig. 1 shows a schematic representation of a boost converter circuit according to an embodiment.

Fig. 2 shows a schematic representation of a boost converter circuit under reference conditions according to an embodiment.

Fig. 3 shows a schematic representation of a voltage measurement according to an embodiment.

Fig. 4 shows a schematic representation of a voltage measurement according to another embodiment.

Fig. 5 shows a schematic representation of a voltage measurement according to another embodiment.

Fig. 6 shows a schematic representation of a system comprising a device according to an embodiment.

Fig. 7 shows a schematic representation of a system comprising a device according to an embodiment.

In the drawings, like reference numerals are used to designate like components.

Detailed Description

The detailed description provided below in connection with the appended drawings is intended as a description of the embodiments and is not intended to represent the only forms in which the embodiments may be constructed or utilized. However, the same or equivalent functions and structures may be accomplished by different embodiments.

According to an embodiment, the device applies a switching signal to a boost converter operating under certain conditions. The boost converter may be configured to provide a voltage to a load, and the load may be, for example, a haptic feedback element. The device waits for a set time interval and then measures the voltage on the output side of the boost converter. Based on the measured voltage and the length of the time interval, the device can derive an equivalent input voltage VBST of the boost converter. The equivalent VBST may be interpreted as an input voltage that will result in a measured voltage under reference conditions. Thus, the equivalent VBST may be a global parameter including all variables that affect the performance of the boost converter. Based on the equivalent VBST, the device can regulate the switching signal applied to the boost converter. Thus, the boost converter can provide sufficient voltage to the load regardless of conditions, and does not require additional measurement points or sensors. Additionally, the equivalent VBST may be used to derive other parameters related to the performance of the boost converter.

According to an embodiment, the voltage measurement may be periodically repeated a plurality of times while the switching signal is applied to the boost converter. This may allow for the detection of the behavior of the boost converter that is not detectable in a single measurement. According to another embodiment, the device may wait until the voltage on the output side of the boost converter reaches the set value and measure the time delay between the time the switching signal starts and the time the voltage reaches the set value. This measurement can also be used to derive the equivalent VBST.

Fig. 1 shows a schematic representation of a circuit comprising a boost converter 100 according to an embodiment. The circuit comprises an inductor 101, a diode 102, two resistors 103 and 104 and a capacitive load 105. Capacitive load 105 may be, for example, a haptic feedback element configured to provide haptic feedback. The load 105 may also be resistive, inductive, or some combination of these. The circuit further comprises a switch 106 and an open switch 107. The disconnect switch 107 may be used to disconnect the capacitive load 105 from the circuit, and the switch 106 may be used to operate the boost converter. In another embodiment, the load 105 may be connected to a bias voltage instead of the ground 112. The boost converter 100 is provided with an input voltage VBST108 and the switch 106 can be operated by inputting a signal 109. The signal 109 may also be referred to as a switching signal. The switch 106 may be any type of transistor, for example, and the switch signal 109 may be a voltage or a current based on the type of transistor.

Boost converter 100 may provide a higher voltage than VBST108 to capacitive load 105. This may be beneficial in many applications where a relatively low voltage power source (e.g., a battery) is available but high voltages are required. When switch 106 is closed, current flows through inductor 101 and switch 106, and a magnetic field is generated inside inductor 101. In addition, diode 102 prevents any current from flowing from node 111 to ground 112 through switch 106. When switch 106 is then opened, the magnetic field within inductor 101 resists the change in current through inductor 101 according to Lenz's law, thereby producing a voltage across inductor 101. Since VBST108 is connected in series with the voltage induced by inductor 101, a higher voltage is generated between node 111 and ground 112. Switch 106 may be repeatedly opened and closed by switching signal 109 to increase the voltage in node 111. Resistors 103 and 104 form a voltage divider between node 111 and ground 112. Thus, a portion of the voltage at node 111 may be measured at node 110. The node 110 may also be referred to as a feedback point. The side to the right of the diode 102 in fig. 1 may be referred to as the output side of the boost converter 100.

The output voltage produced by the boost converter 100 is naturally affected by how the switch 106 is operated by the VBST108 and the switching signal 109. Additionally, boost converter 100 operates under certain conditions 113, and these conditions may affect the operation of boost converter 100. Conditions 113 may include, for example, temperature at which boost converter 100 operates, aging of components of boost converter 100, unknown electrical characteristics of the components, limited current on the input side, and load capacitance. These conditions may even include VBST108 and switching signal 109. Alternatively or in addition, condition 113 may include any internal or external factor that may affect the operation of boost converter 100. For example, the output voltage at node 111 may change if the operating temperature of the boost converter 100 increases, or the behavior of the boost converter 100 may change if the reference voltage changes. Condition 113 may include a number of factors, and how these factors affect the operation of boost converter 100 may be difficult to predict.

It should be understood that the boost converter 100 may be implemented in a variety of ways other than the embodiment shown in fig. 1. For example, to change the performance characteristics of boost converter 100, a capacitor or any other electrical component may be added to boost converter 100. Moreover, fig. 1 and any other figures herein present only components or features that may be used in embodiments.

Fig. 2 shows a schematic representation of a circuit comprising a boost converter 100 according to an embodiment. Boost converter 100 is similar to the boost converter shown in fig. 1. However, boost converter 100 now operates under reference condition 113'. Reference conditions 113' may include, for example, where ambient operating temperature and components of boost converter 100 are new and their electrical characteristics are known.

If under some non-reference conditions 113 and the input voltage of the boost converter 100 is V_BSTIn the case of (2), the voltage at the feedback point 110 is a certain V_FBAnd under reference condition 113 'and input voltage V'_BSTThe same voltage V is induced at the feedback point 110_FBAnd the voltage V 'of the switching signal 109 is the same for both cases'_BSTMay be referred to as an equivalent input voltage or an equivalent VBST. This relationship can be expressed mathematically as V_FB＝V_FB(V_BST，s，c)＝V_FB(V′_BSTS, c '), where c is the condition 113, c ' is the reference condition 113 ', and s is the switching signal 109. Equivalent VBSTV'_BSTCan be interpreted as referring to the feedback point under the reference condition 113An input voltage as the measured voltage. It should be understood that a similar relationship may also be expressed using some other voltage on the output side of the boost converter 100. For example, the output voltage may be measured at node 111.

The operating conditions of boost converter 100 (e.g., temperature, aging of components, or even electrical characteristics of components) may be unknown in normal operation. This is particularly true if boost converter 100 is manufactured by a third party. In addition, the physical VBST may not be precisely known. The measurement of the voltage at the feedback point allows the equivalent VBST to be derived even if these other factors are unknown. The equivalent VBST may be estimated from the feedback point voltage, e.g., based on previous measurements of the boost converter 100 under the reference condition 113'. Alternatively or in addition, the relationship between the feedback point voltage and the equivalent VBST can be estimated, for example, from an analytical model or circuit or multiple physical simulations. It should be understood that the equivalent VBST does not necessarily correspond to any physical voltage in the boost converter 100 when measuring the feedback point voltage, but may be considered a global parameter that includes all variables that affect the performance of the boost converter 100.

Estimating the capability of the equivalent VBST allows for adjusting the switching signal 109 of the boost converter 100 based on the performance of the boost converter 100. Thus, the boost converter 100 can provide the same output voltage regardless of the conditions under which it operates, and no additional sensors or measurements are required to measure these conditions or any additional voltages. This may reduce the number of components required for robust operation of the boost converter 100. In addition, the equivalent VBST enables the boost converter 100 to be emulated under different conditions. For example, the behavior of the boost converter 100 may be simulated at another temperature by applying the corresponding equivalent VBST, regardless of the temperature at which the boost converter 100 operates. Further, if the physical VBST is measured at the input side of the boost converter 100 while estimating the equivalent VBST, other parameters related to conditions, such as temperature, may be derived. Additionally, the equivalent VBST may be used to estimate, for example, overall performance of the booster, out-of-range component variations, third party designs outside of the guidelines, aging, booster faults, and input supply current limits.

Fig. 3 shows a measurement that can be used to estimate the equivalent VBST of the boost converter 100 according to an embodiment. At the start of the measurement, a switching signal 109 is applied to the switch 106. Disconnect switch 107 may be opened to disconnect capacitive load 105 from boost converter 100 to reduce possible errors in measurements caused by capacitive load 105. When the switching signal 109 is applied, the voltage on the output side of the boost converter 100 starts to increase. The voltage may be measured, for example, from the feedback point 110 or from the node 111. The switching signal 109 is applied to the switch 106 during a time interval t 301. The length of the time interval t301 may be, for example, 50-200 microseconds, mus. The time interval may also be within any subrange thereof, such as 70-100 μ s or 90-150 μ s, etc.

After time interval t301, the voltage on the output side of the boost converter 100 is measured. Alternatively, the switching signal 109 may be applied for a longer period and the measurement is made just after the time interval t 301. It is beneficial to limit the time interval t301 to a small value in order to prevent the voltage from increasing to a level that may cause damage to the circuit. Alternatively or in addition, the voltage may be limited to a safe level by, for example, separate monitoring.

In fig. 3, three different measurement results V are given₁302、V₂303 and V₃304 which correspond to voltage curves 305, 306 and 307, respectively. The voltage V may be reached during the time interval t301₁302、V₂303 and V₃304. The measured voltage may be, for example, in the range of 30-500 volts (V). The measured voltage may also be in any subrange thereof, such as 80-150V or 50-300V. Based on the measured voltage and the time interval t301, an equivalent VBST can be derived.

Fig. 4 shows a measurement that can be used to estimate the equivalent VBST of the boost converter 100 according to an embodiment. The measurements of fig. 4 are similar to those shown in fig. 3. However, the voltage on the output side of the boost converter 100 is now measured multiple times while the switching signal 109 is applied to the switch 106. For example, the voltage may be measured once between each time interval t 401. Alternatively, according to another embodiment, the time interval between measurements need not be equal for each measurement.

It should be understood that even after the first voltage measurement, the voltage curves 402, 403, 405 and 406 may be distinguished from each other. Thus, for these curves, the measurement of fig. 3 should be sufficient. However, the voltage curve 404 behaves differently. If the method of fig. 3 is used, for example, for the voltage curves 404 and 405, the measurement results may be equal, since the voltages of these curves are approximately equal after the first time interval t 401. However, voltage curve 404 appears significantly different from the other voltage curves in FIG. 4; the curve 404 includes some abnormal oscillation behavior. This type of behavior may be caused by, for example, current limiting of the input side of the boost converter 100. This behavior may not be detectable unless the voltage is measured multiple times during the application of the switching voltage 109. Since the behavior of curve 404 is most likely undesirable for boost converter 100, it may be beneficial to trigger an alarm or interrupt if such behavior is detected. Therefore, the user can be informed that the user equipment including the boost converter 100 cannot operate normally, and possible damage to the electrical components can be prevented.

It should be appreciated that while the measurement of fig. 3 may not be able to detect the undesirable irregular behavior of the voltage curve 404, the measurement of fig. 3 may be significantly faster than the measurement of fig. 4. In addition, the measurements of fig. 4 may require more computing resources than the computing resources of fig. 3 due to the additional measurements and processing of these measurements. On the other hand, if the measurement of fig. 4 is used, it is possible to more easily prevent the measured voltage from reaching a level that may cause circuit damage.

Fig. 5 shows a measurement that can be used to estimate the equivalent VBST of the boost converter 100 according to an embodiment. This measurement is similar to the measurement shown in fig. 3, but instead of waiting for some set time interval after the start of the switching signal 109, the measurement is made by waiting until the voltage on the output side of the boost converter 100 reaches the predetermined value 501. The time delay between the start of the switching signal 109 and the voltage reaching the value 501 is then used to determine the equivalent VBST. In fig. 5, three different voltage curves 505, 506 and 507 are shown. The curves are respectively in timeTime t₁502、t₂503 and t₃504 reaches a predetermined voltage value 501. Based on the voltage 501 and the time delay, a corresponding equivalent VBST can be derived for each curve. It will be appreciated that in this measurement the voltage cannot rise to a level that could damage the circuit, since the measurement is stopped when the voltage reaches the set value 501. However, as can be seen from the curves 505, 506 and 507, the time it takes for the voltage to reach the set value may vary significantly, which in turn may lead to an unpredictable length of the measurement interval.

Fig. 6 shows a schematic representation of a system in which a device 601 may adjust the switching signal 109 of the boost converter 100 based on the equivalent VBST. The boost converter 100 operates under certain conditions 113 and is configured to provide a voltage to the load 105 using a lower voltage VBST 108. The device 601 is configured to measure the voltage from the feedback point 110. Alternatively, the device 601 may measure some other voltage on the output side of the boost converter 100. For the measurement, the apparatus 601 may use, for example, the processes presented in fig. 3-5, and based on the measured voltage, the apparatus 601 may estimate the equivalent VBST. Further, based on the equivalent VBST, device 601 may adjust switching signal 109 such that sufficient voltage is provided to load 105 regardless of condition 113.

It should also be appreciated that the VBST108 need not be adjusted as precisely as the device 601 is not being used, which may reduce the number of components required. For example, a separate regulator may not be required. This may be particularly beneficial for mobile devices. Furthermore, in all applications, a precisely regulated input voltage may not even be available. In addition, the system is more robust and can be used in more varied conditions and applications than would be the case without the use of the device 601.

Fig. 7 shows a schematic representation of a system in which a device 601 may regulate the switching signal 109 of the boost converter 100 based on the equivalent VBST. The device 601 drives the boost converter 100 using the switching signal 109, and the boost converter 100 provides a voltage to the load 105. Additionally, device 601 may be connected to boost converter 100 through other electrical connections that may be used, for example, to turn boost converter 100 on. The device 601 may be implemented using, for example, a microcontroller or any other programmable device (e.g., field programmable gate array, FPGA). The apparatus 601 may measure the voltage on the output side of the boost converter 100 and estimate the equivalent VBST using, for example, the processes presented in fig. 3-5. Capacitive load 105 (which may be a haptic feedback element, for example) is also connected to device 601 through resistors 701 and 702. Device 601 may use the connection through resistors 701 and 702 to apply different voltages across load 105. For example, if the same bias voltage is applied through both resistors 701,702, the load 105 may be set to an idle mode. Further, device 601 may use disconnect switch 107 to disconnect load 105 from boost converter 100. It should be understood that multiple loads 105 may be connected to the output of the boost converter 100 such that the boost converter 100 may provide voltage to the multiple loads 105.

In addition to estimating the equivalent VBST and driving the boost converter 100, the device 601 may also use other measurement and control processes related to the function of the circuit. For example, if load 105 is a haptic feedback element, device 601 may measure the stiffness of the haptic feedback element. The stiffness of the element may affect the voltage that should be provided to the element by the boost converter 100. For example, stiffness may be measured by driving a known voltage to the element by the boost converter 100 for a set period, and measuring the signal produced by the element after that period.

It should be appreciated that apparatus 601 may also be implemented as part of some other apparatus or circuit. Additionally, the device 601 may measure other voltages from the circuit. For example, the device 601 may also measure the input voltage of the boost converter and use it with the estimated equivalent VBST to derive other parameters related to the operation of the boost converter 100. Alternatively or in addition, the device 601 may use a voltage divider to measure the input voltage. Further, device 601 may communicate with other devices or circuits, for example, to trigger and alarm or interrupt if undesired behavior of boost converter 100 is detected. This is particularly advantageous in situations where the device 601 is unable to drive a boost converter to provide sufficient voltage to the load 105.

Any range or device value given herein may be extended or altered without losing the effect sought. Moreover, any embodiment may be combined with another embodiment unless explicitly prohibited.

Although the subject matter has been described in language specific to structural features and/or acts, it is to be understood that the subject matter defined in the appended claims is not limited to the specific features or acts described above. Rather, the specific features and acts described above are disclosed as embodiments implementing the claims, and other equivalent features and acts are considered to be within the scope of the claims.

The functions described herein may be performed, at least in part, by one or more computer program product components (e.g., software components). Alternatively or in addition, the functions described herein may be performed, at least in part, by one or more hardware logic components. For example, but not limiting of, illustrative types of hardware logic components that may be used include Field Programmable Gate Arrays (FPGAs), program Application Specific Integrated Circuits (ASICs), program specific standard products (ASSPs), systems on a chip (SOCs), Complex Programmable Logic Devices (CPLDs), and Graphics Processing Units (GPUs).

It is to be understood that the benefits and advantages described above may relate to one embodiment, or may relate to several embodiments. Embodiments are not limited to embodiments that solve any or all of the problems or embodiments having any or all of the benefits and advantages described. It should also be understood that reference to "an" item may refer to one or more of those items. The term "and/or" may be used to indicate that one or more of its connected conditions may occur. Two or more connections may occur or only one connection may occur.

The operations of the methods described herein may be performed in any suitable order, or simultaneously where appropriate. In addition, individual blocks may be deleted from any of the methods without departing from the purpose and scope of the subject matter described herein. Aspects of any of the embodiments described above may be combined with aspects of any of the other embodiments described to form further embodiments without losing the effect sought.

The term "comprising" is used herein to mean including the identified method, block, or element, but that such block or element does not include the exclusive list, and that the method or apparatus may include additional blocks or elements.

It should be understood that the above description is given by way of example only and that various modifications may be made by those skilled in the art. The above specification, embodiments and data provide a complete description of the structure and use of exemplary embodiments. Although various embodiments have been described above with a certain degree of particularity, or with reference to one or more individual embodiments, those skilled in the art could make numerous alterations to the disclosed embodiments without departing from the spirit or scope of this disclosure.