阅读说明：本技术 一种输出状态的测试方法和系统、及计算机存储介质 (Method and system for testing output state and computer storage medium ) 是由 田晨 于 2018-09-30 设计创作，主要内容包括：本申请实施例公开了一种输出状态的测试方法和系统、及计算机存储介质,上述测试方法包括：在指示适配器开启快充功能之后,接收第一指令；其中,第一指令用于对输出电压的状态进行确定；响应第一指令,获取第一实时电压并根据第一实时电压确定电压状态；在接入快充功能对应的充电电流之后,获取充电电流对应的电流变化速率,并根据电流变化速率确定电流状态；根据电压状态和电流状态,获得适配器对应的输出状态的测试结果。(The embodiment of the application discloses a method and a system for testing an output state and a computer storage medium, wherein the testing method comprises the following steps: after the adapter is instructed to start the quick charging function, receiving a first instruction; the first instruction is used for determining the state of the output voltage; responding to the first instruction, acquiring a first real-time voltage and determining a voltage state according to the first real-time voltage; after the charging current corresponding to the quick charging function is accessed, acquiring a current change rate corresponding to the charging current, and determining a current state according to the current change rate; and obtaining a test result of the output state corresponding to the adapter according to the voltage state and the current state.)

A method of testing an output state, the method comprising:

after the adapter is instructed to start the quick charging function, receiving a first instruction; wherein the first instruction is to determine a state of an output voltage;

responding to the first instruction, acquiring a first real-time voltage and determining a voltage state according to the first real-time voltage;

after the charging current corresponding to the quick charging function is accessed, acquiring a current change rate corresponding to the charging current, and determining a current state according to the current change rate;

and obtaining a test result of the output state corresponding to the adapter according to the voltage state and the current state.

The method of claim 1, wherein said determining a voltage state from said first real-time voltage comprises:

when the first real-time voltage is larger than a preset voltage threshold, determining that the voltage state is higher;

when the first real-time voltage is equal to a preset voltage threshold, determining that the voltage state is appropriate;

and when the first real-time voltage is smaller than a preset voltage threshold value, determining that the voltage state is lower.

The method of claim 2, wherein after obtaining a first real-time voltage and determining a voltage condition from the first real-time voltage in response to the first instruction, the method further comprises:

sending a first response according to the voltage status; wherein the voltage state is carried in the first response.

The method of claim 3, wherein, when the voltage condition is not appropriate, after the sending the first response according to the voltage condition, the method further comprises:

receiving and responding to the first instruction again to obtain a second real-time voltage;

and determining the voltage state again according to the second real-time voltage until the voltage state is proper.

The method of claim 1, wherein the obtaining a rate of change of current corresponding to the charging current comprises:

and detecting the charging current in real time according to a preset time interval to obtain the current change rate.

The method of claim 5, wherein said determining a current state from said rate of current change comprises:

when the current change rate is smaller than or equal to a preset rate threshold, determining that the current state meets the change requirement;

and when the current change rate is larger than the preset rate threshold value, determining that the current state does not meet the change requirement.

The method of claim 1, wherein before obtaining a current change rate corresponding to the charging current and determining a current state according to the current change rate, the method further comprises:

receiving a second instruction; wherein the second instruction is used for inquiring an upper limit value of the charging current;

responding to the second instruction, and sending a preset current threshold value; wherein the preset current threshold is used for determining the charging current.

The method of claim 4, wherein the voltage condition is again determined from the second real-time voltage until after the voltage condition is appropriate, the method further comprising:

reading voltage adjustment time; wherein the voltage adjustment time is the time for the adapter to adjust the first real-time voltage to the second real-time voltage;

and generating a test result of the output state according to the voltage adjusting time and a preset time threshold.

The method of claim 4, wherein after the obtaining the second real-time voltage, the method further comprises:

comparing the second real-time voltage with the first real-time voltage to obtain a voltage regulation mode; wherein the voltage regulation mode comprises a step-up and a step-down;

and generating a test result of the output state according to the voltage state and the voltage adjusting mode.

The method of claim 1, wherein after the charging current corresponding to the fast charging function is switched on, the method further comprises:

receiving a third instruction; the third instruction is used for determining the voltage state in the constant current charging stage;

responding to the third instruction, and acquiring a third real-time voltage;

when the third real-time voltage is greater than or equal to a preset quick charging voltage, detecting the charging current;

and when the charging current is greater than or equal to a preset current upper limit, sending the preset current upper limit to the adapter so as to update the charging current according to the preset current upper limit.

The method of claim 10, wherein after the receiving the third instruction, the method further comprises:

responding to the third instruction, and detecting a voltage change parameter according to a preset time period;

when the voltage change parameter is greater than or equal to a preset mutation threshold value, sending a closing instruction;

and receiving a closing response corresponding to the closing instruction.

The method of claim 11, wherein after receiving a shutdown response corresponding to the shutdown instruction, the method further comprises:

obtaining closing time; wherein the shutdown time is used for characterizing the response time of the adapter to the shutdown instruction;

and generating a test result of the output state according to the closing time and a preset closing threshold value.

The method of claim 11, wherein after receiving a shutdown response corresponding to the shutdown instruction, the method further comprises:

when the third instruction is received again, responding to the third instruction and sending reset inquiry information;

receiving a reset response corresponding to the reset inquiry information; and the reset response is used for representing the corresponding reset state of the adapter.

The method of claim 10, wherein after the charging current corresponding to the fast charging function is switched on, the method further comprises:

after the constant current charging is carried out, detecting a current variation parameter corresponding to the charging current;

and generating a test result of the output state according to the current change parameter and preset control precision.

The method of claim 1, wherein before obtaining the test result of the output state corresponding to the adapter according to the voltage state and the current state, the method further comprises:

receiving a disconnection request;

disconnecting from the adapter in response to the disconnection request.

The method of claim 15, wherein the disconnection request carries a power-off time corresponding to the adapter, and after the disconnection from the adapter in response to the disconnection request, the method further comprises:

recording the disconnection time;

determining a disconnection time interval according to the power supply disconnection time and the disconnection time;

and generating a test result of the output state according to the disconnection time interval and a preset interval threshold.

A test system, wherein the test system comprises: a receiving section, an acquiring section, and a determining section,

the receiving part is used for receiving a first instruction after the adapter is instructed to start the quick charging function; wherein the first instruction is to determine a state of an output voltage;

the acquisition part is used for responding to the first instruction and acquiring a first real-time voltage;

the determining part is used for determining a voltage state according to the first real-time voltage;

the acquisition part is also used for acquiring the current change rate corresponding to the charging current after the charging current corresponding to the quick charging function is accessed;

the determining part is further used for determining a current state according to the current change rate;

the acquisition part is further used for acquiring a test result of the output state corresponding to the adapter according to the voltage state and the current state.

The test system of claim 17,

the determining part is specifically configured to determine that the voltage state is relatively high when the first real-time voltage is greater than a preset voltage threshold; and when the first real-time voltage is equal to a preset voltage threshold, determining that the voltage state is appropriate; and when the first real-time voltage is smaller than a preset voltage threshold value, determining that the voltage state is lower.

The test system of claim 18, wherein the test system further comprises a transmitting portion,

the sending part is used for responding to the first instruction, acquiring a first real-time voltage, determining a voltage state according to the first real-time voltage, and then sending a first response according to the voltage state; wherein the voltage state is carried in the first response;

the receiving part is further used for receiving and responding the first instruction again after sending the first response according to the voltage state when the voltage state is not proper, and acquiring a second real-time voltage;

the determining part is further used for determining the voltage state again according to the second real-time voltage until the voltage state is appropriate.

The test system of claim 17,

the acquisition part is specifically used for detecting the charging current in real time according to a preset time interval to acquire the current change rate;

the determining part is specifically used for determining that the current state meets the change requirement when the current change rate is smaller than or equal to a preset rate threshold; and when the current change rate is larger than the preset rate threshold value, determining that the current state does not meet the change requirement.

The test system of claim 19,

the receiving part is also used for receiving a second instruction; wherein the second instruction is used for inquiring an upper limit value of the charging current;

the sending part is also used for responding to the second instruction and sending a preset current threshold value; wherein the preset current threshold is used for determining the charging current.

The test system of claim 19,

the acquisition part is further used for determining the voltage state again according to the second real-time voltage, and reading the voltage adjustment time until the voltage state is proper; wherein the voltage adjustment time is the time for the adapter to adjust the first real-time voltage to the second real-time voltage;

the determining part is further used for generating a test result of the output state according to the voltage adjusting time and a preset time threshold;

the acquisition part is further used for comparing a second real-time voltage with the first real-time voltage after the second real-time voltage is acquired, so as to acquire a voltage adjustment mode; wherein the voltage regulation mode comprises a step-up and a step-down;

the determining part is further used for generating a test result of the output state according to the voltage state and the voltage adjusting mode.

The test system of claim 17, wherein the test system further comprises: the detection section is provided with a detection section,

the receiving part is also used for receiving a third instruction after the charging current corresponding to the quick charging function is accessed; the third instruction is used for determining the voltage state in the constant current charging stage;

the acquisition part is also used for responding to the third instruction and acquiring a third real-time voltage;

the detection part is used for detecting the charging current when the third real-time voltage is greater than or equal to a first preset quick charging voltage;

the sending part is further configured to send the first preset current upper limit to the adapter when the charging current is greater than or equal to the first preset current upper limit, so as to update the charging current according to the first preset current upper limit;

the detection part is also used for responding to a third instruction after receiving the third instruction and detecting a voltage change parameter according to a preset time period;

the sending part is further used for sending a closing instruction when the voltage change parameter is larger than or equal to a preset mutation threshold value;

the receiving part is also used for receiving a closing response corresponding to the closing instruction;

the acquisition part is further used for acquiring closing time after receiving a closing response corresponding to the closing instruction; wherein the shutdown time is used for characterizing the response time of the adapter to the shutdown instruction;

the determining part is further used for generating a test result of the output state according to the closing time and a preset closing threshold;

the sending part is further configured to send reset query information in response to the third instruction when receiving the third instruction again after receiving a close response corresponding to the close instruction;

the receiving part is also used for receiving a reset response corresponding to the reset inquiry information; and the reset response is used for representing the corresponding reset state of the adapter.

The test system of claim 23,

the detection part is also used for detecting a current change parameter corresponding to the charging current after the charging current corresponding to the quick charging function is accessed and the constant current charging is carried out;

the determining part is further used for generating a test result of the output state according to the current change parameter and preset control precision.

The test system of claim 23, wherein the test system further comprises: a cut-off section and a recording section,

the receiving part is further used for receiving a disconnection request before obtaining a test result of the output state corresponding to the adapter according to the voltage state and the current state; wherein the disconnection request carries power supply disconnection time corresponding to the adapter;

the disconnection part is used for responding to the disconnection request and disconnecting from the adapter;

the recording part is used for responding to the disconnection request and recording disconnection time after the disconnection of the adapter;

the determining part is further used for determining a disconnection time interval according to the power supply disconnection time and the disconnection time; and generating a test result of the output state according to the disconnection time interval and a preset interval threshold.

A test system, wherein the test system comprises a test platelet, a host computer, and an electronic load, wherein the test platelet and the host computer have integrated therein a processor, a memory having stored thereon processor-executable instructions that, when executed, implement the method of any one of claims 1-16.

A computer-readable storage medium, on which a program is stored, for use in a test system, wherein the program, when executed by a processor, implements the method of any one of claims 1-16.