阅读说明：本技术 一种实物型交直流回路电阻计量标准器 (Material object type AC/DC loop resistance measurement standard device ) 是由 吕金华 呼和 闫立新 陈林颖 肖利华 张敏 郭晓冬 郑玉娟 晓峰 高永生 王思 于 2020-06-17 设计创作，主要内容包括：本发明公开一种实物型交直流回路电阻计量标准器,其包括：一面板,在该面板上设置有原理性及使用指导性标识；在所述面板上设置有第一电位电极和第二电位电极；在所述面板的下方设置有主电阻器；所述第一电位电极和第二电位电极分别连接到所述面板下方的所述主电阻器的两端,主电阻器Rz由L个基准值为R的分量程电阻器组ΔRn连接组成,L为大于等于1的整数。本发明具有结构简单、制造容易、使用方式同被测仪器工作方式一样的优点。(The invention discloses a kind of material object type AC/DC loop resistance measurement standard device, it includes: a panel, on which a principle and use instruction mark is set; a first potential electrode and a second potential electrode are arranged on the panel; a main resistor is arranged below the panel; the first potential electrode and the second potential electrode are respectively connected to two ends of a main resistor below the panel, the main resistor Rz is formed by connecting L component program resistor groups delta Rn with the reference value of R, and L is an integer larger than or equal to 1. The invention has the advantages of simple structure, easy manufacture and the same use mode as the working mode of the tested instrument.)

1. A kind of material object type alternating current-direct current loop resistance measures the standard device, it includes: a panel, on which a principle and use instruction mark is set; a first potential electrode and a second potential electrode are arranged on the panel; a main resistor is arranged below the panel; the method is characterized in that: the first potential electrode and the second potential electrode are respectively connected to two ends of a main resistor below the panel, the main resistor Rz is formed by connecting L component program resistor groups delta Rn with the reference value of R, and L is an integer larger than or equal to 1.

2. The physical type alternating current-direct current loop resistance measurement standard device according to claim 1, characterized in that: the total resistance value of the resistor delta Rn of each range is H times of a reference value R, and the resistor delta Rn is formed by connecting M resistors with two resistance values of X times R and N resistors with two resistance values of Y times R, namely, the total resistance value of the resistor delta Rn is R (M + X + N + Y), and M, N is an integer which is more than or equal to 1; H. x, Y is a rational number greater than 0.

3. The physical type alternating current-direct current loop resistance measurement standard device according to claim 1, characterized in that: m resistors of X times R of each component program resistor group delta Rn are connected with S trimming disks of set values in parallel according to requirements; n resistors of Y times R are connected in parallel with P trimming pads of set values as required, and S, P is an integer of 0 or more.

4. The physical type alternating current-direct current loop resistance measurement standard device according to claim 3, characterized in that: the fine tuning disc comprises a first adjusting disc and a second adjusting disc.

Technical Field

The invention relates to a novel electromagnetism metering device, in particular to a material object type AC/DC loop resistance metering standard device for magnitude transmission in the process of testing/calibrating errors of an AC/DC large-current low-value resistance measuring instrument in the field of electromagnetism metering.

Background

At present, a measuring part is used in the prior art, and the measuring range is tested/calibrated in a range below 10 omega ohm resistance; the test current is more than 1A; the single-value physical resistor or the analog resistor is mainly used in the process of working in a direct-current to power-frequency alternating-current high-current low-value resistance measuring instrument, and the single-value physical resistor is used for testing/calibrating, so that the defects that the measuring range is narrow, and the testing/calibrating work can be finished by wiring for many times are overcome; the disadvantage of using analog resistors for testing/calibration is that this method is not an actual working condition of the instrument being tested and does not provide a good assessment of the actual performance of the instrument.

Therefore, it is necessary to develop a physical type ac/dc circuit resistance measurement standard device.

Disclosure of Invention

In order to overcome the defects of the background technology, the invention discloses a manufacturing and using method of an AC/DC dual-purpose low-value resistance real object metering standard device, which belongs to the field of electromagnetic metering, has a working range below 10 omega ohm resistance and a measuring current greater than 1A.

The invention provides a kind of material object type AC/DC loop resistance measurement standard device, it includes: a panel, on which a principle and use instruction mark is set; a first potential electrode and a second potential electrode are arranged on the panel; a main resistor is arranged below the panel; the first potential electrode and the second potential electrode are respectively connected to two ends of a main resistor below the panel, the main resistor Rz is formed by connecting L component program resistor groups delta Rn with the reference value of R, and L is an integer larger than or equal to 1.

The total resistance value of the resistor delta Rn of each measuring range is H times of a reference value R, and the resistor delta Rn is formed by connecting M resistors with two resistance values of R multiplied by X and N resistors with two resistance values of R multiplied by Y, namely, the resistor delta Rn is R multiplied by H (M multiplied by X + N multiplied by Y), and M, N is an integer which is more than or equal to 1; H. x, Y is a rational number greater than 0.

M resistors of X-times R of each sub-range resistor group delta Rn are connected with S trimming disks of set values in parallel according to requirements; n resistors of Y times R are connected in parallel with P trimming pads of set values as required, and S, P is an integer of 0 or more.

Wherein the fine tuning disc comprises a first tuning disc and a second tuning disc.

In the invention, the AC/DC low-value resistance real object measuring standard device consists of a panel with a principle and use guiding mark, an electrode connected with a main resistor Rz under the panel, a fine tuning resistance disc, a first potential electrode P1 and a first potential electrode P2; the first potential electrode P1 and the first potential electrode P2 are fixed to both ends of the main resistor Rz; the main resistor Rz is formed by connecting L component program resistor groups delta Rn with the reference value of R; the total resistance value of the resistor group delta Rn of each measuring range is H times of a reference value R, and the resistor group delta Rn is formed by connecting M resistors with two resistance values of X times R and N resistors with two resistance values of Y times R, namely delta Rn-R-H-R (M-X + N-Y); m resistors of X times R of each component program resistor group delta Rn are connected with S trimming disks of set values in parallel according to requirements; the N Y-time R resistors are connected with P fine tuning discs with set values in parallel according to requirements, wherein L is an integer greater than or equal to 1; m, N is an integer of 0 or more; H. x, Y is a rational number greater than 0; s, P is an integer of 0 or more.

When the calibration device is used, the voltage measuring end of the calibrated low resistance meter is connected to the voltage output electrodes P1 and P2 of the standard device, the current output end is connected to the current electrodes corresponding to the two ends of the standard device, and the current electrodes are changed on the current electrodes at the two ends of the standard device according to the required value of the standard device according to different values; the micro-adjustment disc can be adjusted to carry out measurement, so that the device has the advantages of simple structure, easy manufacture and the same use mode as the working mode of the measured instrument.

Drawings

FIG. 1 is a schematic diagram of an appearance of an AC/DC loop resistance standard according to the present invention;

FIG. 2 is a schematic diagram of the internal structure of the AC/DC loop resistance standard according to the present invention;

fig. 3 is a schematic diagram of the structure principle and the use of the ac/dc loop resistance standard device of the present invention.

DETAILED DESCRIPTION OF EMBODIMENT (S) OF INVENTION

In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention. It should be noted that the embodiments and features of the embodiments in the present application may be arbitrarily combined with each other without conflict.

Fig. 1 is a schematic structural diagram of the low-value resistance measurement standard according to the present invention. The invention discloses a real object type low-value resistance metering standard device, which comprises: a panel 100, wherein the panel 100 is preferably made of a metal material, and further preferably, the panel 100 is made of a metal plate with a length of 550mm, a width of 330mm and a thickness of 2 mm; a principle and use guiding mark 200 is arranged on the panel 100 and used for guiding the resistance value combination in use and marking the maximum load current flow of each range of resistance; a first potential electrode P1 and a second potential electrode P2 are mounted on a first side of a panel 100, a main resistor Rz (150) is disposed under the panel 100, and the first potential electrode P1(600) and the second potential electrode P2(700) are respectively connected to both ends of the main resistor Rz (900) under the panel 100; said main resistor Rz (900) preferably comprises 8 standard resistors R, one current electrode 200 being provided in correspondence of at least one side position of each of said standard resistors R; the detailed structure is as follows:

the main resistor Rz (150) comprises 8 standard resistors R, wherein R is a reference value, the two sides of each standard resistor comprise 9 current electrodes 200, the upper parts of the standard resistors are provided with 3 current electrodes, and the guiding marks are B, C, D from left to right respectively; the lower part is provided with 6 guiding marks A, 1, 2, 3, 4 and 5 from left to right. The combined values of the resistances under the corresponding panels (100) are as follows:

A～1＝0.1R＝0.1mΩ； A～2＝0.2R＝0.2mΩ

A～3＝0.3R＝0.3mΩ； A～4＝0.4R＝0.4mΩ

B～A＝0.5R＝0.5mΩ； B～1＝0.6R＝0.6mΩ

B～2＝0.7R＝0.7mΩ； B～3＝0.8R＝0.8mΩ

B～4＝0.9R＝0.9mΩ； B～5＝1.0R＝1.0mΩ

C～1＝1.1R＝1.1mΩ； C～2＝1.2R＝1.2mΩ

C～3＝1.3R＝1.3mΩ； C～4＝1.4R＝1.4mΩ

D～A＝1.5R＝1.5mΩ； D～1＝1.6R＝1.6mΩ

D～2＝1.7R＝1.7mΩ； D～3＝1.8R＝1.8mΩ

D～4＝1.9R＝1.9mΩ； D～5＝2.0R＝2.0mΩ

also mounted on the panel 100 are 2 resolution adjustment disks 300 for calibrating the instrument under test, the resolution adjustment disks 300 preferably including a first adjustment disk 301 and a second adjustment disk 302, the first adjustment disk 301 and the second adjustment disk 302 being mounted on the upper portion of the panel 100, as described below with reference to fig. 2:

the second adjusting disk 302 preferably comprises a 0-11 bit rotary waveband switch, the second micro-adjusting disk 302 is connected in parallel on a 0.5m omega standard resistor between the B electrode and the A electrode, and R with different resistance values are arranged at 0-11 fixed cutter positions of the rotary waveband switch_{And are}The resistor is switched by rotating the cutter position, and the standard resistor R connected in parallel is preferably selected in the inventionIs 0.5 m.OMEGA.; r_{Resolution ratio}Preferably 0.001m Ω, and the parallel resistance is calculated by the formula:

R_{and are}＝R×(R-R_{Resolution ratio})/R_{Resolution ratio}(1)

When the device is used, the rotating band switch is adjusted and switched from 0 to 11 along with the rotation of the rotating band switch, and the corresponding parallel 0.5m omega standard resistor R is changed from 0.5000m omega to 0.4989m omega according to the 1 mu omega step value.

The specific parallel values are as follows:

× -0 mu omega at position 0, R_{And are}Empty connected 1-position × -1 mu omega, R_{And are}＝0.249Ω

× -2 mu omega at position 2 and R_{And are}0.124 omega 3 position × -3 mu omega, R_{And are}＝0.083Ω

Position 4 × -4 mu omega, R_{And are}0.062 omega 5 bit × -5 mu omega, R_{And are}＝0.049Ω

Position 6 × -6 mu omega, R_{And are}× -7 [ mu ] omega as 0.041 [ omega ] 7 position, R_{And are}＝0.035Ω

8 position × -8 mu omega, R_{And are}0.031 omega 9 position × -9 mu omega, R_{And are}＝0.027Ω

10 position × -10 mu omega, R_{And are}0.023 omega 11 position × -11 mu omega and R_{And are}＝0.022Ω

The first adjusting disk 301 preferably comprises a 0-11 position rotary band switch connected in parallel with two 0.1m omega standard resistors connected in series between the A-2 electrodes, and resistors R with different resistance values are mounted at 0-11 fixed knife positions of the rotary band switch_{And are}And is switched by a rotary cutter bit, the resistance value of the rotary cutter bit is set according to the value of a standard resistor R connected in parallel, in the example, the parallel standard resistor R is 0.2m omega, and R is_{Resolution ratio}0.0001m omega, parallel resistance R_{And are}By the calculation of the formula (1), when in use, the parallel resistance corresponding to the standard resistance R of 0.2m Ω changes from 0.2000m Ω to 0.1989m Ω by 0.1 μ Ω step value through the rotation of the rotating band switch along with the rotation adjustment switching of the rotating band switch from 0 to 11.

In particular to a parallel resistor R required for being connected in parallel with a 0.2m omega standard resistor_{And are}The parallel values of (c) are as follows:

× -0 mu omega at position 0, R_{And are}Empty joint, position 1: × -0.1 mu omega, R_{And are}＝0.400Ω

× -0.2 mu omega at position 2, R_{And are}0.200 omega, position 3 × -0.3 mu omega, R_{And are}＝0.133Ω

The 4 position is × -0.4 mu omega, R_{And are}0.100 omega, 5-position × -0.5 mu omega, R_{And are}＝0.080Ω

× -0.6 mu omega at position 6, R_{And are}0.066 omega, 7-position × -0.7 mu omega, R_{And are}＝0.057Ω

8 position × -0.8 mu omega, R_{And are}0.050 Ω, 9-position × -0.9 μ Ω R_{And are}＝0.044Ω

10 position × -1.0 mu omega, R_{And are}0.040 omega, position 11 × -1.1 mu omega, R_{And are}＝0.036Ω

The following description is made with reference to fig. 1 and 2: the main resistor Rz includes L component program resistor groups Δ Rn having a reference value R, where L is an integer equal to or greater than 1. The total resistance value of the resistor group delta Rn of each measuring range is H times of a reference value R, and the resistor group delta Rn is formed by connecting M resistors with two resistance values of X times R and N resistors with two resistance values of Y times R, namely delta Rn-R-H-R (M-X + N-Y); m resistors of X times R of each component program resistor group delta Rn are connected with S trimming disks of set values in parallel according to requirements; the N Y-time R resistors are connected with P fine tuning discs with set values in parallel according to requirements, wherein L is an integer greater than or equal to 1; m, N is an integer of 0 or more; H. x, Y is a rational number greater than 0; s, P is an integer of 0 or more.

In a specific preferred embodiment, the range value Rz ∑ R of the ac/dc circuit resistance standard is 2M Ω, L is 1, M is 3, N is 5, and the range reference value R is 1M Ω, and in the standard resistance processing, only the standard resistors of 3 resistances of 0.5R and 5 resistances of 0.1R need to be manufactured and connected, and the resistor is processed by using a 3mm × 100mm resistance alloy plate, so that the structure is simple, the processing and adjustment are easy, and 20 standard resistance values such as 0.1M Ω to 2.0M Ω can be combined by connecting different potential electrodes when in use. The first adjusting disk 301 and the second adjusting disk 302 mounted on the upper part of the panel 100 of the invention each comprise 11 single-value resistors and rotary wave band switches, and the micro-adjustment value in the range of 0.1 mu omega-12.1 mu omega can be provided by switching the rotary wave band switches, so that the structure is simple, and the processing and adjustment are easy.

The following description is used in conjunction with the accompanying drawings 1, 2 and 3: voltage measuring electrodes P1(702) and P2(703) of the tested instrument 700 are respectively connected to voltage output stages P1 and P2(400) of the AC-DC low-resistance real object metering standard; the current output end 701 of the detected instrument 700 is connected to the current electrode marked with B on the panel 100 of the AC/DC dual-purpose low-resistance material object metering standard device, and the current output end 704 is connected to the current electrode marked with 5 on the panel 100 of the AC/DC dual-purpose low-resistance material object metering standard device, so that the measurement can be performed, and different values can be measured by only changing the current electrodes on the current electrodes at two ends of the standard device with required values and adjusting a fine tuning disc;

in one embodiment, the resistance between B and 5 is 1.0R, i.e., 1.0m Ω; adjusting x-1 μ Ω; adjusting the (0-11 μ Ω) pad 1 of the second adjustment pad 302 to decrease the parallel resistance B-a by 0.5R-0.5 m Ω by 1 μ Ω, i.e., B-a by 0.499m Ω; the first dial 301 is adjusted to x-0.1 μ Ω; the (0-1.1 μ Ω) plate 1 of the first actuator plate 301 reduces the parallel resistance a-2 to 0.2R to 0.2m Ω by 0.1 μ Ω, i.e. a-2 to 0.199.9m Ω; in this case, B to 5 is 0.9989m Ω. If the current output ends 701 and 704 of the adjusted detected instrument (700) are connected to different current electrodes of the panel (100) of the AC/DC dual-purpose low-resistance material object metering standard instrument, the following results can be obtained: any value of 0m omega-2.0 m omega; if the disks were adjusted to x-1. mu. omega. and x-0.1. mu. omega. the following were obtained: different values in the range of 0.1 μ Ω to 12.1 μ Ω; the error of the indication value of the device 700 to be tested can be calibrated, and the error of the resolution of the device 700 to be tested can also be calibrated. Therefore, the device has the advantages of simple structure, easy manufacture and the same use mode as the working mode of the tested instrument.

It is to be understood that while the present invention has been described in conjunction with the preferred embodiments thereof, it is not intended to limit the invention to those embodiments. It will be apparent to those skilled in the art from this disclosure that many changes and modifications can be made, or equivalents modified, in the embodiments of the invention without departing from the scope of the invention. Therefore, any simple modification, equivalent change and modification made to the above embodiments according to the technical essence of the present invention are still within the scope of the protection of the technical solution of the present invention, unless the contents of the technical solution of the present invention are departed.