Multiplexed sigma-delta analog-to-digital converter
阅读说明:本技术 多路复用的σ-δ模数转换器 (Multiplexed sigma-delta analog-to-digital converter ) 是由 Y·J·沙玛 A·J·卡尔布 于 2019-08-23 设计创作,主要内容包括:本公开涉及多路复用的Σ-Δ模数转换器。具有模拟环路滤波器电路的Σ-ΔADC电路可以通过刷新模拟环路滤波器积分器和数字抽取滤波器的存储器在不同输入之间进行多路复用,并为其填充当前输入的新数据。然而,相对于采样频率,填充存储器可能是慢的,因为必须在生成有意义的输出数据之前建立关于过去历史的信息。因此,使用Σ-ΔADC电路的信道之间的复用率可以通过这种存储器刷新而减慢。描述了可以克服这些问题的多路复用Σ-ΔADC电路,以便能够支持多个信道的逐周期采样。这些技术可以提供快速的Σ-Δ模数转换器(ADC)电路,其面积小并且可以动态地在多个信道上复用。(The present disclosure relates to a multiplexed sigma-delta analog-to-digital converter. A sigma-delta ADC circuit with an analog loop filter circuit may multiplex between different inputs and fill it with new data of the current input by refreshing the memories of the analog loop filter integrator and the digital decimation filter. However, filling the memory can be slow relative to the sampling frequency, as information about the past history must be built before meaningful output data is generated. Thus, the multiplexing rate between channels using sigma-delta ADC circuits may be slowed by such memory refresh. A multiplexed sigma-delta ADC circuit is described that can overcome these problems so as to be able to support cycle-by-cycle sampling of multiple channels. These techniques may provide fast sigma-delta analog-to-digital converter (ADC) circuits that are small in area and may be dynamically multiplexed over multiple channels.)
1. A multiplexed multi-channel sigma-delta (SD) analog-to-digital converter (ADC) circuit, comprising:
a shared analog circuit configured to receive a selected one of a plurality of analog input signals, the shared analog circuit comprising:
an ADC circuit coupled to an input of the analog circuit; and
a digital-to-analog converter (DAC) circuit configured to provide an analog feedback signal to an input of the analog circuit; and
a plurality of digital channels coupled to outputs of the shared analog circuit and DAC circuit, each of the plurality of digital channels configured to generate a digital output signal representative of a respective one of the analog input signals.
2. The SD ADC circuit of claim 1, further comprising:
a gain amplifier circuit coupled to an input of the ADC circuit and configured to receive and amplify a difference between an output of the DAC circuit and one of the received analog input signals;
a first chopping switch circuit coupled to an input of the gain amplifier circuit; and
a second chopping switch circuit coupled to an output of the gain amplifier circuit.
3. The SD ADC circuit of claim 2, further comprising:
a first multiplexer circuit coupled to an input of the analog circuit and configured to select one of the plurality of analog input signals;
a second multiplexer circuit coupled to an input of the DAC circuit and each of the plurality of digital channels;
a digital demultiplexer circuit coupled to an output of the analog circuit and each of the plurality of digital channels, the demultiplexer circuit configured to select one of a plurality of digital circuits to receive the output of the analog circuit; and
a controller circuit configured to:
controlling operation of the first and second multiplexer circuits and the demultiplexer circuit; and
controlling the operation of the first and second chopping switches.
4. The SD ADC of claim 3 wherein the controller circuit is configured to control operation of the demultiplexer circuit to select the plurality of digital channels in a sequential mode.
5. The SD ADC of claim 3 wherein the controller circuit is configured to control operation of the demultiplexer circuit to select the plurality of digital channels in a non-sequential mode.
6. The SD ADC of claim 1, wherein the ADC circuit is a memoryless ADC circuit.
7. The SD ADC of claim 1 wherein each of the plurality of digital channels comprises:
a quantizer circuit coupled to an output of the digital filter circuit;
a digital filter circuit configured to receive an output signal of the analog circuit and output a filter circuit output signal to a DAC circuit; and
a digital decimation filter circuit configured to generate a digital output signal corresponding to a particular one of the received analog input signals.
8. The SD ADC circuit of claim 7, wherein each digital filter circuit comprises a digital integrator circuit.
9. The SD ADC of claim 7, wherein each of the plurality of digital channels further comprises:
a quantization error compensation circuit coupled to an input of the digital decimation filter and an output of the quantizer circuit, the quantization error compensation circuit configured to combine an output signal of the analog circuit with an input signal of the DAC circuit and output a quantization error compensation signal to the digital decimation filter.
10. A method of multiplexing a plurality of channels using sigma-delta (SD) analog-to-digital converter (ADC) circuitry, the method comprising:
performing analog-to-digital conversion of a first input signal selected from a plurality of received analog input signals using a shared analog circuit;
processing a digital output of the shared analog circuit using a first digital channel selected from the plurality of digital channels;
performing digital-to-analog conversion on the processed digital output to produce a feedback signal for application to an input of the shared analog circuit; and
a digital output signal is generated representing a respective one of the analog input signals.
11. The method of claim 10, further comprising:
receiving and amplifying a difference between the feedback signal and one of the received analog input signals;
controlling a chopper switch circuit to be coupled to an input and an output of the gain amplifier circuit; and
controlling a first multiplexer circuit to select a first one of the plurality of received analog input signals; and
controlling a second multiplexer circuit to select one of the plurality of digital channels to couple to an input of a digital-to-analog converter (DAC) circuit.
12. The method of claim 10, further comprising:
selecting other digital channels of the plurality of digital channels in a sequential mode to receive a digital output of a shared analog circuit.
13. The method of claim 10, further comprising:
selecting other digital channels of the plurality of digital channels in a non-sequential mode to receive a digital output of a shared analog circuit.
14. The method of claim 10, wherein performing analog-to-digital conversion of a first input signal selected from a plurality of received analog input signals using shared analog circuitry comprises:
analog-to-digital conversion is performed on the selected first input signal using a memoryless ADC circuit.
15. The method of claim 10, wherein performing analog-to-digital conversion of a first input signal selected from a plurality of received analog input signals using shared analog circuitry comprises:
a Successive Approximation Register (SAR) ADC operation is performed on the selected first input signal.
16. The method of claim 10, wherein performing analog-to-digital conversion of the selected first input signal using the shared analog circuit comprises:
a flash ADC operation is performed on the selected first input signal.
17. The method of claim 10, wherein performing analog-to-digital conversion of the selected first input signal using the shared analog circuit comprises:
a pipelined ADC operation is performed on the selected first input signal.
18. The method of claim 10, further comprising:
combining a digital output signal of the analog circuit with an input signal of the digital-to-analog converter (DAC) circuit and outputting a quantization error compensation signal to a digital decimation filter.
19. A multiplexed multi-channel sigma-delta (SD) analog-to-digital converter (ADC) circuit comprising:
means for performing analog-to-digital conversion of a first input signal selected from a plurality of received analog input signals using a shared analog circuit;
means for processing a digital output of the shared analog circuit using a first digital channel selected from the plurality of digital channels;
means for performing digital to analogue conversion on the processed digital output to produce a feedback signal for application to the input of the shared analogue circuit; and
means for generating a digital output signal representative of a respective one of said analog input signals.
20. The SD ADC circuit of claim 18, further comprising:
means for receiving and amplifying a difference between the feedback signal and one of the received analog input signals;
means for chopping an input and an output of the gain amplifier circuit; and
means for selecting a first one of the plurality of received analog input signals; and
means for selecting one of the plurality of digital channels to couple to an input of the digital-to-analog converter (DAC) circuit.
Technical Field
This document relates generally, but not exclusively, to integrated circuits and, more particularly, to analog-to-digital converter circuits and systems.
Background
In many electronic applications, an Analog Front End (AFE) may convert an analog electrical signal (e.g., light, sound, temperature, or pressure) representative of a real-world phenomenon for digital processing, for example, for further signal processing. For example, in some precision measurement systems, one or more sensors may be provided for an electronic device to take measurements and generate analog signals. The analog signal may be provided to an analog-to-digital converter (ADC) to generate a digital representation for further processing.
AFEs can be found in many places, such as broadband communication systems, audio systems, receiver systems, and the like. AFEs are used for a wide range of applications including communications, energy, healthcare, instrumentation and measurement, motor and power control, industrial automation, and aerospace/defense.
Disclosure of Invention
A sigma-delta ADC circuit with an analog loop filter circuit may multiplex between different inputs and fill it with new data of the current input by refreshing the memories of the analog loop filter integrator and the digital decimation filter. However, filling the memory can be slow relative to the sampling frequency, as information about the past history must be built before meaningful output data is generated. Thus, the multiplexing rate between channels using sigma-delta ADC circuits may be slowed by such memory refresh. It is not possible to retain past data in the loop filter circuit and skip samples because the loop filters are analog circuits and they cannot store past history due to leakage effects. Similarly, skipping samples in the digital decimation filter circuit may change the filtering action of the decimation filter.
The present disclosure describes a multiplexed sigma-delta ADC circuit that may overcome these problems in order to be able to support cycle-by-cycle sampling of multiple channels. The techniques of this disclosure may provide a fast sigma-delta analog-to-digital converter (ADC) circuit that is small in area and can be dynamically multiplexed over multiple channels.
In certain aspects, the present disclosure relates to a multiplexed multi-channel sigma-delta (SD) analog-to-digital converter (ADC) circuit, comprising: a shared analog circuit configured to receive a selected one of a plurality of analog input signals, the shared analog circuit comprising: an ADC circuit coupled to an input of the analog circuit; a digital-to-analog converter (DAC) circuit configured to provide an analog feedback signal to an input of the analog circuit; and a plurality of digital channels coupled to outputs of the shared analog circuit and the DAC circuit, each of the plurality of digital channels configured to generate a digital output signal representative of a respective one of the analog input signals.
In certain aspects, the present disclosure relates to a method of multiplexing a plurality of channels using sigma-delta (SD) analog-to-digital converter (ADC) circuitry, the method comprising: performing analog-to-digital conversion of a first input signal selected from a plurality of received analog input signals using a shared analog circuit; processing a digital output of the shared analog circuit using a first digital channel selected from the plurality of digital channels; performing digital-to-analog conversion on the processed digital output to produce a feedback signal for application to an input of the shared analog circuit; and generating a digital output signal representative of a respective one of the analog input signals.
In certain aspects, the present disclosure relates to a multiplexed multi-channel sigma-delta (SD) analog-to-digital converter (ADC) circuit, comprising: means for performing analog-to-digital conversion of a first input signal selected from a plurality of received analog input signals using a shared analog circuit; means for processing the digital output of the shared analog circuit using a first digital channel selected from the plurality of digital channels; means for performing digital to analogue conversion on the processed digital output to produce a feedback signal for application to the input of the shared analogue circuit; and means for generating a digital output signal representative of a respective one of said analogue input signals.
This summary is intended to provide an overview of the subject matter of the present patent application. It is not intended to provide an exclusive or exhaustive explanation of the invention. The detailed description is included to provide further information about the present patent application.
Drawings
In the drawings, which are not necessarily drawn to scale, like numerals may describe similar components in different views. Like numerals having different letter suffixes may represent different instances of similar components. The drawings illustrate by way of example, and not by way of limitation, various embodiments discussed in the present document.
Fig. 1 is a block diagram of an example of a multiplexed multi-channel sigma-delta analog-to-digital converter circuit according to the present invention.
Fig. 2 is an example of a timing diagram that may be used with the circuits of fig. 1 or 3.
Fig. 3 is a block diagram of another example of a multiplexed multi-channel sigma-delta analog-to-digital converter circuit according to the present invention.
Fig. 4 is a simplified block diagram of a multiplexed multi-channel sigma-delta analog-to-digital converter circuit according to the present invention.
Detailed Description
In a Successive Approximation Register (SAR) analog-to-digital converter (ADC) circuit, each digital output code is a function of the last input sample and is independent of previous input samples processed by the ADC circuit. In other words, the SAR ADC is memoryless. Therefore, SAR ADCs are suitable for multi-channel solutions. Due to its memoryless nature, SAR ADC may allow multiplexing between different input signals on a sample-by-sample basis. For a SAR ADC, the clock cycle delay between two samples of the same channel is equal to the number of channels.
Unlike SAR ADCs, sigma-delta ADC circuits have memory. In particular, the sigma-delta ADC circuit may include an analog loop filter circuit having a plurality of analog integration circuit stages, wherein information from past inputs may be used in conjunction with the current input to process and provide the digital output code. Additionally, the sigma-delta ADC circuit may include a digital decimation filter circuit that also has a memory of past input signal values.
A sigma-delta ADC circuit with an analog loop filter circuit may be multiplexed between different inputs by refreshing the memories of the analog loop filter integrator and the digital decimation filter and filling them with new data of the current input. However, filling the memory can be slow relative to the sampling frequency, as information about the past history must be built before meaningful output data is generated. Thus, the rate of multiplexing between channels using sigma-delta ADC circuits may be slowed by such memory refresh. It is not possible to retain past data in the loop filter circuit and skip samples because the loop filters are analog circuits and they cannot store past history due to leakage effects. Similarly, skipping samples in the digital decimation filter circuit may change the filtering action of the decimation filter.
The present disclosure describes a multiplexed sigma-delta ADC circuit that may overcome these problems in order to be able to support cycle-by-cycle sampling of multiple channels. The techniques of this disclosure may provide a fast sigma-delta analog-to-digital converter (ADC) circuit that is small in area and can be dynamically multiplexed over multiple channels.
Fig. 1 is a block diagram of an example of a multiplexed multi-channel sigma-delta analog-to-digital converter (ADC) circuit according to the present invention. The
The
According to the present invention, the sigma-
Using the techniques of this disclosure,
As shown in fig. 1, a
Each of the plurality of
The action of
For purposes of non-limiting illustrative explanation,
In a non-limiting illustrative configuration, a fixed Capacitive Gain Amplifier (CGA) circuit 28 (e.g., having a gain of 16) may be used to amplify the difference between a selected one of the analog input signals 16A-16N and the
One way to implement the numeration is for each channel to have its own block of numerics. Alternatively, it may be more area efficient to include a shared digital compute engine with separate memory for each channel.
It should be noted that the analog block may operate at a 'N' times higher sampling frequency. However, a large amount of area can be saved due to the use of a set of analog modules. Furthermore, the architecture described in this disclosure may scale particularly well when doing finer geometry processing, as the 'N' digital blocks (e.g., digital filter circuits, quantizer circuits, and decimation filter circuits) may scale significantly.
Fig. 2 is an example of a timing diagram 70 that may be used with the circuits of fig. 1 or 3. For simplicity, four (4) channel selection signals 72-78 are shown in FIG. 2. In other implementations, there may be more than four channels or less than four channels. In addition to the channel selection signals 72-78, the timing diagram 70 depicts a
A control circuit, such as
In some example configurations, the control circuitry may control the operation of the input multiplexer circuitry and demultiplexer circuitry to select a plurality of digital channels, e.g.,
In configurations that include chopping,
In addition, a gain amplifier circuit, such as
In some examples, an ADC circuit (e.g.,
The digital signal may be processed by a digital filter circuit for a particular digital channel, such as
It should be noted that the
Fig. 3 is a block diagram of another example of a multiplexed multi-channel sigma-
The
The actual amplifier gain error (GA) may return the loop quantization noise, but its contribution can be significantly suppressed using the technique of FIG. 3. The amplifier gain error does not affect the Signal Transfer Function (STF) in the frequency band of interest because the loop gain can be high in the frequency band of interest. The DAC circuit gain error may occur directly on the STF.
Additional information regarding the technique of FIG. 3 may be found in U.S. patent application No.15/621,621 entitled "Quantization noise cancellation in a Feedback Loop" to Kalb et al, and filed on 2017, 13.6, which is incorporated herein by reference in its entirety, including its description of Quantization noise cancellation techniques.
Fig. 4 is a simplified block diagram of a multiplexed multi-channel sigma-
The architecture described in this disclosure may allow for processing of input signals of different bandwidth, input range, and SNR requirements in a multiplexing operation. Non-limiting illustrative configurations are described below. The sigma-delta ADC circuit architecture described in this disclosure may be configured to support eight multiplexed channels. The gain amplifier may be a CGA with a fixed gain of 16. The ADC circuit may be a 14-bit resolution sar ADC sampled at 2 MHz. The DAC circuit may be a 7-bit DAC, and in some examples, noise-shaped.
In some example implementations, the sigma-delta ADC circuit may process input signals up to 5V and provide an 18-bit SNR at 625 samples per second (sps), with an oversampling ratio (OSR) of 200). Some digital channels may operate without a digital feedback loop in which the DAC circuitry is disconnected or disabled. With a CGA gain of 1, these channels can process up to 5V of input signal and provide output at a resolution of 305uV of 250 ksps. With a CGA gain of 16, some channels can process up to 300mV of input signal and provide 18.3uV output at a resolution of 250 ksps. The converter architecture described in this invention can support these varying input signals and process them cycle by cycle with the same shared analog signal chain.
Various notes
Each of the non-limiting aspects or examples described herein can exist independently or can be combined in various permutations or with one or more other examples.
The foregoing detailed description includes references to the accompanying drawings, which form a part of the detailed description. The drawings show, by way of illustration, specific embodiments in which the invention may be practiced. These embodiments are also referred to herein as "examples". These examples may include elements in addition to those shown or described. However, the inventors also contemplate examples in which only those elements shown or described are provided. Moreover, the inventors also contemplate examples using any combination or permutation of those elements shown or described (or one or more aspects thereof), with respect to a particular example (or one or more aspects thereof), or with respect to other examples (or one or more aspects thereof) shown or described herein.
If there is no inconsistency in the usage of this document with any of the documents incorporated by reference, then the usage in this document shall prevail.
In this document, the terms "a" or "an" are used generically in the patent document, and include any other instance or use of one or more than one, independent of "at least one" or "one or more. In this document, the term "or" is used to indicate nonexclusivity, e.g., "a or B" includes "a but not B," "B but not a" and "a and B," unless otherwise indicated. The terms "including" and "wherein" are used herein as the equivalent of the respective terms "comprising" and "wherein". Furthermore, in the following claims, the terms "comprises" and "comprising" are open-ended, i.e., a system, apparatus, article, composition, formulation, or process that comprises elements other than those listed after such term in a claim is considered to be within the scope of that claim. Furthermore, in the following claims, the terms "first," "second," and "third," etc. are used merely as labels, and are not intended to impose numerical requirements on their objects.
The method examples described herein may be machine or computer-implemented at least in part. Some examples may include a computer-readable or machine-readable medium encoded with instructions operable to configure an electronic device to perform a method as described in the above examples. Implementations of such methods may include code, such as microcode, assembly language code, higher level language code, and the like. Such code may include computer readable instructions for performing various methods. The code may form part of a computer program product. Further, in an example, the code can be tangibly stored on one or more volatile, non-transitory, or non-volatile tangible computer-readable media, e.g., during execution or at other times. Examples of such tangible computer-readable media may include, but are not limited to, hard disks, removable magnetic disks, removable optical disks (e.g., compact disks and digital video disks), magnetic tape, memory cards or sticks, Random Access Memories (RAMs), Read Only Memories (ROMs), and the like.
The above description is intended to be illustrative and not restrictive. For example, the above-described examples (or one or more aspects thereof) may be used in combination with each other. Other embodiments may be utilized, for example, by one of ordinary skill in the art, upon reading the above description. The abstract is provided to comply with 37c.f.r. § 1.72(b), allowing the reader to quickly ascertain the nature of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims. Also, in the foregoing detailed description, various features may be combined together to simplify the present disclosure. This should not be interpreted as intending that an unclaimed disclosed feature is essential to any claim. Rather, inventive subject matter may lie in less than all features of a particular disclosed embodiment. Thus, the following claims are hereby incorporated into the detailed description as examples or embodiments, with each claim standing on its own as a separate embodiment, and it is contemplated that these embodiments may be combined with each other in various combinations or permutations. The scope of the invention should be determined with reference to the appended claims, along with the full scope of equivalents to which such claims are entitled.
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