X-ray source cathode detection method, detection system and X-ray imaging system
阅读说明：本技术 X射线源阴极检测方法、检测系统及x射线成像系统 (X-ray source cathode detection method, detection system and X-ray imaging system ) 是由 唐华平 李科 董超 秦占峰 张庆辉 于 2019-10-31 设计创作，主要内容包括：本发明提供了一种X射线源阴极检测方法、检测系统及其使用该检测系统的X射线成像系统，该方法包括以下步骤：检测X射线源阴极的工作状况并获得相应的工作参数；获得X射线源阴极的老化曲线数据，其中，所述老化曲线数据包括环境参数和/或阴极型号参数、批次参数；根据获得的工作参数和对应的老化曲线数据进行计算；以及根据计算的结果获得检测结果，所述检测结果包括阴极的剩余使用寿命和/或故障概率；根据所述计算结果，生成阴极使用列表，在发现高故障概率的情况下，调整阴极使用列表以从所述阴极使用列表中移除高故障概率的阴极。(The invention provides an X-ray source cathode detection method, an X-ray source cathode detection system and an X-ray imaging system using the X-ray source cathode detection system, wherein the method comprises the following steps: detecting the working condition of the cathode of the X-ray source and obtaining corresponding working parameters; obtaining aging curve data of a cathode of an X-ray source, wherein the aging curve data comprises environmental parameters and/or cathode model parameters and batch parameters; calculating according to the obtained working parameters and the corresponding aging curve data; and obtaining a detection result according to the calculated result, wherein the detection result comprises the residual service life and/or the fault probability of the cathode; and generating a cathode use list according to the calculation result, and in the case of finding high fault probability, adjusting the cathode use list to remove the cathode with high fault probability from the cathode use list.)
1. An X-ray source cathode detection method comprises the following steps:
detecting the working condition of the cathode of the X-ray source and obtaining corresponding working parameters;
obtaining aging curve data of a cathode of an X-ray source, wherein the aging curve data comprises environmental parameters and/or cathode model parameters and batch parameters;
calculating according to the obtained working parameters and the corresponding aging curve data; and
and obtaining a detection result according to the calculated result, wherein the detection result comprises the residual service life and/or the fault probability of the cathode.
2. An X-ray source cathode detection method according to claim 1 wherein the step of obtaining aging curve data of an X-ray source cathode precedes the step of calculating from the obtained operating parameters and corresponding aging curve data.
3. An X-ray source cathode detection method according to claim 1 wherein the step of calculating from the obtained operating parameters and corresponding aging curve data comprises: and calculating according to the working parameters and the aging curve data with the same cathode model parameter, the same cathode batch parameter and the environmental parameter.
4. An X-ray source cathode detection method according to claim 3 wherein said step of calculating from the obtained operating parameters and corresponding aging curve data further comprises: and weighting the working parameters, and calculating to obtain the residual service life and/or the fault probability of the cathode in the use environment.
5. The X-ray source cathode detection method according to any one of claims 1 to 4, wherein the X-ray source cathode is a distributed X-ray source cathode having a plurality of cathodes.
6. The X-ray source cathode detection method according to claim 5, wherein the step of obtaining the detection result according to the calculation result further comprises: and generating a cathode use list according to the calculation result, and in the case of finding high fault probability, adjusting the cathode use list to remove the cathode with high fault probability from the cathode use list.
7. An X-ray source cathode detection system comprising:
the detection device is used for detecting the working condition of the X-ray source cathode and obtaining corresponding working parameters and aging curve data of the cathode, wherein the aging curve data comprises environmental parameters and/or cathode model parameters and batch parameters;
the data storage module is electrically connected with the detection device and is used for receiving and storing data from the detection device; and
and the data processing module is electrically connected with the detection device and the data processing module and is used for calculating the obtained working parameters and the corresponding aging curve data to obtain the service life and/or the fault probability of the cathode.
8. An X-ray source cathode detection system according to claim 7 further comprising a result generation module electrically connected to the data processing module for determining a cathode usage list and, in the event of a high probability of failure being found, adjusting the cathode usage list to remove the cathode with the high probability of failure from the cathode usage list.
9. An X-ray source cathode detection system according to claim 7 wherein the data processing module is configured to weight the obtained operating parameters and then calculate based on the corresponding aging curve to obtain the remaining useful life and/or failure probability of the cathode.
10. An X-ray imaging system comprising:
an X-ray source for generating X-rays covering a detection area;
the detector is positioned on the other side of the detection area, which is different from the X-ray source, and is used for receiving X-rays;
the conveying device is positioned between the X-ray source and the detector and is used for bearing the detected object to pass through the detection area;
an X-ray source cathode detection system as claimed in any one of claims 7 to 9;
the cathode state judgment module is used for generating use lists of X-ray source cathodes in different grades according to the result of the X-ray source cathode detection system;
the exposure control module marks the used exposure focuses according to the result of the cathode state judgment module and controls the exposure sequence according to the cathode use list of the X-ray source;
a data processor receiving and processing the received X-ray data from the detector;
and the image processor receives the data from the data module and outputs a corresponding image.
11. The X-ray imaging system of claim 10, wherein the cathode state determination module is configured to receive data regarding a state of the cathode, a position of the cathode, and a grade of the cathode.
12. The X-ray imaging system of claim 10, wherein the data processor comprises:
the data acquisition module is used for acquiring X-ray data received by the detector and determining the corresponding relation between the X-ray data and an exposure focus;
the data reforming module is used for rearranging the received X-ray data according to the corresponding relation of the exposure focuses;
the data preprocessing module is used for preprocessing the X-ray data.
Technical Field
The present invention relates to the field of X-ray source cathode detection, and more particularly, to an X-ray source cathode detection method, an X-ray source cathode detection system, and an X-ray imaging system using the detection system.
Background
X-rays have wide applications in the fields of industrial nondestructive testing, safety inspection, medical diagnosis and treatment, etc. The device that generates X-rays is called an X-ray source. An X-ray source with multiple cathodes and multiple target points, called a distributed X-ray source, is an X-ray source with multiple cathodes, multiple target points, and capable of generating X-rays from multiple different locations. The distributed X-ray source entity is a closed vacuum cavity, and a plurality of independently working cathode structures are integrated inside the closed vacuum cavity.
In the working process of the distributed X-ray source cathode, due to the difference of production process and use condition, the working performance, the service life and the like of each cathode have individual difference, and the probability of the cathode failure is gradually increased along with the increase of the working time and the exposure times of the cathode. The distributed X-ray source contains a large number of cathodes, and the probability of failure of the distributed X-ray source due to failure of a single or multiple cathodes will increase simultaneously. The failure of single or multiple cathodes directly results in that the distributed X-ray source cannot expose and beam out according to a predetermined programming sequence, which seriously affects the workflow of a subsequent imaging system.
The failure of a single or multiple cathodes often results in failure of the distributed X-ray source and, in turn, equipment shutdown. Because the distributed X-ray tube is a closed vacuum cavity, a large number of cathode arrays are sealed in the cavity, and the problem of failure cannot be solved simply by direct modes such as replacing and maintaining the corresponding cathode after a certain part of cathodes fail.
The common method for troubleshooting the cathode of the distributed X-ray source is as follows: the method comprises the steps of positioning a cathode fault point through fault detection, then adjusting the working condition of a fault cathode to primarily solve the fault, if the cathode has an irreversible fault, only treating the fault cathode as a dead pixel, correspondingly modifying a subsequent working process to avoid the influence caused by the dead pixel, and reducing the influence caused by the reduction of the working performance of equipment.
The method comprises the following steps that a distributed X-ray source is failed due to single or multiple cathode failures, equipment is temporarily shut down, failures need to be checked, follow-up equipment work flow needs to be modified, multiple aspects of X-ray tube hardware detection, cathode control adjustment, equipment work flow adjustment and the like are involved, multiple posts such as a hardware engineer, an electrical engineer, a software engineer, an algorithm engineer and the like need to be matched with one another, the processing flow is complex, and the consumed time is relatively long. If the fault occurs in the working site, the fault needs to be transferred through an after-sales system, so that the time for processing the fault is prolonged, and the normal work arrangement of a client is seriously influenced.
Therefore, a more efficient method and system for detecting the cathode of the X-ray source is desired.
Disclosure of Invention
In order to solve one or more of the above technical problems, the present invention provides an X-ray source cathode detection method, an X-ray source cathode detection system, and an X-ray imaging system.
In an embodiment of the present invention, the method for detecting the cathode of the X-ray source comprises the following steps: detecting the working condition of the cathode of the X-ray source and obtaining corresponding working parameters; obtaining aging curve data of a cathode of an X-ray source, wherein the aging curve data comprises environmental parameters and/or cathode batch parameters; calculating according to the obtained working parameters and the corresponding aging curve data; and obtaining a detection result according to the calculated result, wherein the detection result comprises the residual service life and/or the failure probability of the cathode.
Further, in an embodiment of the present invention, the step of obtaining aging curve data of the cathode of the X-ray source is preceded by the step of calculating according to the obtained operating parameters and the corresponding aging curve data.
Further, in an embodiment of the present invention, the step of calculating according to the obtained operating parameters and the corresponding aging curve data includes: and calculating according to the working parameters and the aging curve data with the same model or the same cathode production batch parameters and environmental parameters.
Further, in an embodiment of the present invention, the step of calculating according to the obtained operating parameters and the corresponding aging curve data further includes: and weighting the working parameters, and calculating to obtain the residual service life and/or the fault probability of the cathode in the use environment.
Further, in an embodiment of the present invention, the X-ray source cathode is a distributed X-ray source cathode with multiple parallel cathodes, and includes multiple cathodes, which may be used alternately or simultaneously.
Further, in an embodiment of the present invention, the step of obtaining the detection result according to the calculation result further includes: and generating a cathode use list according to the calculation result, and in the case of finding high fault probability, adjusting the cathode use list to remove the cathode with high fault probability from the cathode use list.
Further, in an embodiment of the present invention, the detecting method further includes displaying a detection result.
Further, in an embodiment of the present invention, the operating parameter includes a driving parameter of the cathode.
Further, in an embodiment of the present invention, the operating parameters further include a model parameter of the cathode, a batch parameter and an environmental parameter.
In addition, an embodiment of the present invention further provides an X-ray source cathode detection system, including: the detection device is used for detecting the working condition of the X-ray source cathode and obtaining corresponding working parameters and aging curve data of the cathode, wherein the aging curve data comprises environmental parameters and/or cathode model parameters and batch parameters; the data storage module is electrically connected with the detection device and is used for receiving and storing data from the detection device; and the data processing module is electrically connected with the detection device and the data processing module and is used for calculating the obtained working parameters and the corresponding aging curve data to obtain the service life and/or the fault probability of the cathode.
Further, in an embodiment of the present invention, the X-ray source cathode detection system further includes a result generation module, electrically connected to the data processing module, for determining a cathode usage list, and in case of finding a high failure probability, adjusting the cathode usage list to remove the cathode with the high failure probability from the cathode usage list.
Further, in an embodiment of the present invention, the detecting device includes a cathode detecting unit and an environment detecting unit, the cathode detecting unit is configured to detect and obtain a driving parameter of the cathode, and the environment detecting unit is configured to detect and obtain an external environment parameter.
Further, in an embodiment of the present invention, the data processing module is configured to perform weighting processing on the obtained operating parameters, and then perform calculation according to the corresponding aging curve to obtain the remaining service life and/or the failure probability of the cathode.
Furthermore, an embodiment of the present invention also proposes an X-ray imaging system, including: an X-ray source for generating X-rays covering a detection area; the detector is positioned on the other side of the detection area, which is different from the X-ray source, and is used for receiving X-rays; the conveying device is positioned between the X-ray source and the detector and is used for bearing the detected object to pass through the detection area; an X-ray source cathode detection system; the cathode state judgment module is used for generating use lists of X-ray source cathodes in different grades according to the result of the X-ray source cathode detection system; the exposure control module marks the used exposure focuses according to the result of the cathode state judgment module and controls the exposure sequence according to the cathode use list of the X-ray source; a data processor receiving and processing the received X-ray data from the detector; and the image processor receives the data from the data module and outputs a corresponding image.
Further, in an embodiment of the invention, the cathode state determining module is configured to receive data about a state of the cathode, a position of the cathode, and a grade of the cathode.
Further, in an embodiment of the present invention, the data processor includes: the data acquisition module is used for acquiring X-ray data received by the detector and determining the corresponding relation between the X-ray data and an exposure focus; the data reforming module is used for rearranging the received X-ray data according to the corresponding relation of the exposure focuses; the data preprocessing module is used for preprocessing the X-ray data.
Further, in an embodiment of the invention, the X-ray source is a distributed X-ray source.
The X-ray source cathode detection method and the X-ray source cathode detection system effectively solve the problem of complete machine failure caused by cathode failure, change the problem of cathode failure from temporary sudden failure into daily detection and maintenance items by detecting and testing the working condition of the cathode, calculating the residual service life of the cathode and predicting the failure occurrence probability of the cathode, successfully reduce the influence caused by equipment failure and improve the working efficiency of the equipment.
Drawings
The present disclosure will become more fully understood from the detailed description and the accompanying drawings. The drawings illustrate one or more embodiments of the disclosure and, together with the written description, serve to explain the principles of the disclosure. Wherever possible, the same reference numbers will be used throughout the drawings to refer to the same or like elements of an embodiment, and wherein:
fig. 1 is a flow chart of an X-ray source cathode detection method according to an exemplary embodiment of the present invention.
Fig. 2 is a block diagram of an X-ray source cathode detection system according to an exemplary embodiment of the present invention.
Fig. 3 is a block diagram of an X-ray source cathode detection system according to another exemplary embodiment of the present invention.
Fig. 4 is a flow chart of an X-ray imaging system according to an exemplary embodiment of the present invention.
FIG. 5 is a system block diagram of an X-ray imaging system according to an exemplary embodiment of the present invention.
Fig. 6 is a black and white illustration of the cathode array operating state according to an exemplary embodiment of the present invention.
FIG. 7 is a schematic diagram of a distributed X-ray imaging system based on a cathode detection system according to an exemplary embodiment of the present invention.
Detailed Description
The present disclosure now will be described more fully hereinafter with reference to the accompanying drawings, in which embodiments of the disclosure are shown. This disclosure may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
Fig. 1 is a flow chart of an X-ray source cathode detection method according to an exemplary embodiment of the present invention. The method for detecting the cathode of the X-ray source is mainly characterized in that the working performance of each cathode is monitored and recorded in daily detection and maintenance, the working state information of the cathode is obtained and is combined with the corresponding aging curve, and the calculation is preferably carried out on the aging curve of the cathode in the batch, so that the residual service life and the fault probability of the cathode are obtained, a recommended X-ray source cathode working list can be further obtained, the sudden fault is changed into a daily maintenance detection item, and the equipment fault rate is reduced.
The detection method may include the following steps, but the method of the present embodiment is not limited to the execution order of the following steps.
Detecting the working condition of the cathode of the X-ray source and obtaining corresponding working parameters, wherein in the step, the working condition of the cathode can be detected under a plurality of groups of different fixed test conditions, and the working parameters of the cathode, such as the model parameter, batch parameter, cathode driving parameter, external environment parameter and the like of the cathode, are recorded, wherein the cathode driving parameter comprises one or more of emission current, cathode grid control voltage, pulse width, filament current, filament voltage and the like. Acquiring aging curve data of the X-ray source cathode, wherein the aging curve data comprises environmental parameters and/or cathode model parameters and batch parameters, and further acquiring cathode parameters of each type and each batch and corresponding environmental parameters; calculating according to the obtained working parameters and the corresponding aging curve data, namely calculating according to the obtained working parameters and the aging curve data of the corresponding batch and environmental parameters, and further obtaining the required aging curve data; and step four, obtaining a detection result according to the calculated result, wherein the detection result comprises but is not limited to the remaining service life and/or the failure probability of the cathode, and for example, the detection result can be whether the cathode is available or not.
In an embodiment of the invention, the step of obtaining aging curve data of the cathode of the X-ray source precedes the step of calculating based on the obtained operating parameters and the corresponding aging curve data. However, the step of obtaining aging curve data of the X-ray source cathode may also precede the step of detecting the operating condition of the X-ray source cathode and obtaining the corresponding operating parameter. In other words, the present invention does not particularly limit the sequence of the steps for acquiring the aging curve data. The aging curve data acquisition stage includes but is not limited to a production stage, a factory stage and the like of the cathode. The aging curve data can be obtained by sampling test, for example, extracting a certain number of cathodes at a certain ratio to perform typical parameter test to obtain the aging curve data of the cathode.
In an embodiment of the present invention, the aging curve data includes, but is not limited to, typical parameters of the same type of cathode or the same batch of cathodes, such as environmental parameters and/or cathode batch parameters, operating environment parameters, and performance parameters corresponding to the number of emission pulses, performance parameters corresponding to the operating time, lifetime, and the like.
In an embodiment of the present invention, the step of calculating the aging curve data according to the working parameters of the cathode and the aging curve data having the same cathode batch parameters and environmental parameters includes selecting and calculating applicable aging curve data, that is, selecting the aging curve data of the batch of the model from the pre-collected cathode aging data according to the model parameters and batch parameters of the tested cathode, and then selecting the aging curve data of the batch of the model according to the working temperature condition t recorded during the test and the adjacent temperature t1And t2Aging curve data g (t)1) And g (t)2) According to a linear interpolation formula, for example
And calculating aging curve data g (t) under the temperature condition t, including aging curve data g (t, I) under different working current conditions I under the temperature. In other embodiments, other interpolation formulas known in the art may also be used.
In an embodiment of the present invention, the remaining service life of the cathode under different operating current conditions is calculated according to the aging curve data obtained above and the operating voltage values of the cathode under different operating current conditions. In order to display the residual service life of the cathode more accurately, the operating parameters of the cathode can be weighted, and the residual service life and the fault probability under the approximately normal operating condition can be obtained through weighted calculation. E.g. T_iDenotes the remaining service life, w, of the cathode under the i-th operating current condition_iRepresenting the respective weights given, the corresponding equation for calculating the remaining useful life of the cathode may be: t isusefullife＝∑iwiTi. Then, the failure probability ρ ═ μ F (T) can be calculatedusefullife) Wherein F is a function of the remaining service life, mu is a correlation factor of the remaining service life and the fault probability obtained according to experimental measurement, and TusefullifeFor the remaining useful life calculated above.
In an embodiment of the present invention, obtaining the detection result may include: based on the calculation results, a cathode usage list is generated, and in case a high failure probability is found, if the failure rate is higher than 80%, the cathode usage list is adjusted to remove the cathode with high failure probability from the cathode usage list. In other words, an overall cathode working state report can be given according to the working states of all the cathodes, and the available cathode list can be output in a visual mode. And if the cathode with higher fault probability is found, adjusting the available cathode list timely. For example, cathodes with a greater probability of failure are identified and removed from the list of available cathodes. In the present invention, the high failure probability may also be set to be higher than 90%, 85%, or 75%, or 70%.
In an embodiment of the present invention, the cathode detection method can be applied to detect the cathode status of a distributed X-ray source.
Therefore, the invention can change the sudden fault into an ordered problem which can be found in advance and processed in advance through a detection method, thereby obviously reducing the influence on the work of the whole machine; in addition, the complex and complicated professional detection of the distributed ray source is changed into a simple and effective routine detection project through daily maintenance, real-time recording and monitoring of the working state of the cathode, the detection difficulty is reduced, the detection efficiency is improved, and finally, the cathode state and the optimal cathode configuration of the distributed ray source can be accurately mastered through the detection method, and the working efficiency of equipment is improved.
Fig. 2 is a block diagram of an X-ray source cathode detection system according to an exemplary embodiment of the present invention. In the following, an X-ray source
The
The data storage module 120 may receive and store data from the detection device 110, and may also be configured to store cathode driving parameters and external environment parameters obtained by the other data obtaining module 150, and the data processing module 130 may calculate the obtained operating parameters and the corresponding aging curve data to obtain the service life and the failure probability of the cathode.
In other words, the detecting device 110 in this embodiment can perform the detecting steps in the detecting method and obtain the corresponding operating parameters and aging curve data. The data storage module 120 may store various acquired data, and the data processing module 130 may perform calculation according to the acquired operating parameters and the corresponding aging curve data, and obtain the remaining service life and the failure probability of the cathode according to the calculated result. Furthermore, the data processing module 130 may also perform weighting processing on the operating parameters of the cathode according to the above method, so as to obtain more accurate remaining service life and failure probability of the cathode.
In an embodiment of the present invention, as shown in fig. 3, the X-ray source
In another embodiment of the present invention, the distributed X-ray source
Fig. 4 is a flow chart of an X-ray imaging system according to an exemplary embodiment of the present invention. FIG. 5 is a system block diagram of an X-ray imaging system. Hereinafter, an X-ray imaging system according to an embodiment of the present invention will be described in detail with reference to fig. 4 and 5.
In an embodiment of the invention, the X-ray imaging system comprises: an X-ray source for generating X-rays covering a detection area; the detector is positioned on the other side of the detection area, which is different from the X-ray source, and is used for receiving X-rays; the conveying device is positioned between the X-ray source and the detector and is used for bearing the detected object to pass through the detection area; the foregoing X-ray source cathode detection system; the cathode state judging module can divide a single cathode into different grades according to the state according to the preset judgment standard of the working state of the cathode, and gives a state list of an integral cathode array in the X-ray source system by combining the state and the geometric position of the cathode and the precondition of the image processing module, and the single cathode is divided into different grades according to the working performance of the integral cathode array. And selecting a cathode state list of available grades according to actual needs to output a cathode use list, and entering a next exposure control module. If only the unavailable grade list is available for selection, the subsequent process of the imaging system is terminated, and cathode error information of the distributed X-ray source is output. The exposure control module can mark the focus used by the beam according to the cathode use list, and update the focus exposure flow to complete the exposure beam. A data processor receiving and processing the received X-ray data from the detector; and the image processor receives the data from the data module and outputs a corresponding image.
In an embodiment of the invention, the data processor includes a data acquisition module, a data reforming module, and a data preprocessing module. And when the exposure control module exposes out the beam, the data acquisition module synchronously acquires the data of the detector, wherein the acquired data is synchronously marked according to the cathode use list, the corresponding relation between the data and the exposure focus is determined, and the data acquisition module outputs the marked original data to the data reforming module. And after receiving the original data, the data reforming module rearranges the original data according to a set model sequence by combining the geometric position arrangement of the focuses of the distributed X-ray sources according to the cathode use list. After the raw data is reformed, the data preprocessing module can perform preliminary processing on the reformed raw data, and particularly perform corresponding adaptive processing on the changed focus according to the cathode use list.
Hereinafter, a specific embodiment of the present invention will be described with reference to the above drawings.
In the following embodiments, the cathode driving parameter is exemplified by the operating voltage of the cathode, and the external environment parameter is exemplified by the external temperature.
The cathode detection method in this embodiment includes the following 4 steps: the method comprises the following steps of cathode data pre-acquisition, cathode detection, cathode residual service life calculation, failure probability prediction and cathode state report and display.
First, cathode data is pre-collected. The data collected in this step are mainly used for preparing the corresponding contrast data for detection and the data of the judgment standard. In order to improve the accuracy of the detection method, the corresponding cathode batch number and the aging curve data of the same batch of cathodes can be recorded. Specifically, after a qualified cathode is obtained, a certain proportion of cathodes in the same batch of cathodes can be extracted for aging test, and the change data of the working performance of the batch of cathodes along with the working time at different working temperatures can be obtained.
For example, the operating temperature conditions of the cathode test may be set to 3 typical conditions of high temperature, normal temperature, and low temperature, i.e., 40 degrees celsius, 20 degrees celsius, and 0 degree celsius. The operating current conditions for the cathodic test can be set to 3 conditions of high current, medium current, and low current, i.e., 80% max current, 50% max current, and 20% max current. Thus, for the same batch of cathodes, each cathode gets a unique number and its production batch, time, etc. parameters can be traced back. In this same batch of acceptable cathodes, a proportion of the cathodes were extracted for testing. The cathodes extracted and tested are randomly and averagely divided into 9 groups, and the groups respectively correspond to different combinations of working temperature and working current, namely respectively correspond to 9 testing conditions of high-temperature high current, high-temperature medium current, high-temperature low current, normal-temperature high current, normal-temperature medium current, normal-temperature low current, low-temperature high current, low-temperature medium current and low-temperature low current, and the relation curve of the working voltage and the working time of the cathodes is tested under the condition that the currents of the cathodes are not changed, so that the aging curve of the cathodes under the testing conditions is obtained.
In order to ensure the accuracy of the test result, the vacuum degree of the cathode test cavity is kept in the normal working interval of the distributed X-ray tube, and a termination condition is set correspondingly, namely, the termination can be finished when one of the following 3 conditions is met in the test: 1) the maximum design working time is reached; 2) the cathode working voltage is increased to the maximum available voltage; 3) the cathode cannot normally emit current.
After one of the above 3 conditions is achieved, the operating voltage of the cathode under 9 operating conditions versus the operating time of the cathode can be obtained. Under each working condition, if a plurality of testing cathode data exist, the group of data with the working time closest to the average working time is selected as the basis. Under each working condition, recording 50 percent, 80 percent and 90 percent of the maximum working time according to the maximum working time obtained by testing, respectively marking the maximum working time as low-risk, medium-risk and high-risk early warning mark positions, recording specific parameters of 9 testing conditions, recording cathode working curve data, and simultaneously associating cathode batches and serial numbers.
And secondly, detecting the cathode. The cathode test may be a stage in which the cathode is tested in the field. That is, the cathode detection may be performed when the apparatus is turned on, or may be a separate maintenance detection item. After the detection is started, the working voltage data of each cathode is sequentially tested according to 3 conditions of preset low current, medium current and high current, and meanwhile, the environmental temperature data is recorded. And summarizing and storing the delivery batch number of the cathode, the working voltage data and the environmental temperature data under different test conditions.
And thirdly, calculating the residual service life of the cathode and predicting the fault probability. And calculating the residual service life of the cathode and the probability of failure according to the test data of the cathode stored in the previous step. The specific calculation process for each cathode can be further divided into the following three steps.
First, applicable aging curve data is selected and calculated. In the process, the aging curve data of the batch can be selected from the cathode aging data collected in advance according to the tested cathode batch. And then according to the working temperature condition recorded in the field test, calculating the aging curve data under the temperature condition by interpolation according to the aging curve data under different temperatures in the pre-collection process, wherein the aging curve data comprises the aging curve data under different working current conditions at the temperature.
Then, the remaining service life under different test conditions was calculated. In the process, the remaining service life and the failure rate under different test conditions are calculated. And respectively calculating the residual service life of the cathode under different working current conditions according to the obtained aging curve data and the working voltage values of the cathode under different working current conditions obtained by the test in the previous step.
And then, performing weighted calculation to obtain the residual service life and the fault probability under the working condition. The calculation method can utilize the formula Tusefullife＝∑iwiTiWherein, TusefullifeFor the weighted remaining service life, T, calculated above_iDenotes the remaining service life, w, of the cathode under the i-th operating current condition_iRepresenting the respective weights given, and then calculating to obtain the failure probability p ═ μ F (T)usefullife) Wherein F is TusefullifeFunction of, TusefullifeMu is a correlation factor of the residual service life and the fault probability obtained according to experimental measurement.
Alternatively, in other embodiments, the remaining service life of the cathode at the low, medium and high operating currents may be weighted by 25%, 50% and 25%, respectively, to calculate the remaining service life of the cathode. And estimating the fault probability according to a set proportion according to the aging curve of the normal working current condition at the temperature and the weighted residual service life calculated above.
And fourthly, reporting and displaying the cathode state. After each cathode in the distributed X-ray source is tested and calculated through the steps, the residual service life and the fault probability of all cathodes under the working condition of equipment are obtained. The failure probability level of the cathode is marked according to a predetermined rule and displayed visually as shown in fig. 4. And judging the usable state of the whole cathode array by combining the arrangement position of the cathodes and the fault probability level thereof, and forming an optimized cathode configuration for the use strategy of the high-risk cathodes.
Fig. 6 is a diagram of the operation of a cathode array according to an exemplary embodiment of the present invention, in which reference numeral 601 denotes a normal cathode, reference numeral 602 denotes a high risk cathode, and reference numeral 603 denotes a faulty cathode. After each cathode in the distributed X-ray source is tested and calculated through the steps, the residual service life and the fault probability of all cathodes under the working condition of equipment are obtained. And marking the cathodes with the working time more than or equal to 60 percent of the maximum working time as high-risk cathodes, marking the cathodes incapable of working normally as fault cathodes, and marking the working states of all the cathodes according to the rule and displaying.
FIG. 7 is a schematic diagram of a distributed X-ray imaging system based on a cathode detection system according to an exemplary embodiment of the present invention. Hereinafter, the operation of the distributed X-ray imaging system based on the above-described cathode detection method will be described with reference to the above-described drawings.
As shown in fig. 7, the distributed
Firstly, the cathode detection module of the imaging system device starts to work, and detects all cathodes in the distributed X-ray source according to the cathode detection method described above, and outputs a working state list of the cathodes. After detection, the 5 th cathode in the distributed X-ray source can not work normally, and the working states of other cathodes are good.
And then, the cathode state judgment module works to judge whether the cathode state influences the subsequent flow of the imaging system. And the cathode state judgment module starts to work, and finds that the failure of the No. 5 cathode can cause the subsequent multi-view imaging to lack an angle image, and the failure level is within an acceptable range. And converting the input cathode state list into a cathode use list, and entering a next exposure control module.
The exposure control module then performs exposure beaming according to the cathode usage list. And marking the focus used by the beam according to the cathode use list input in the last step, and updating the focus exposure flow to finish exposing the beam.
Next, the data acquisition module and the exposure control module operate synchronously. And when the exposure control module exposes out the beam, the data acquisition module synchronously acquires the data of the detector, wherein the acquired data needs to be synchronously marked according to the input cathode use list, and the corresponding relation between the data and the exposure focus is determined. And the data acquisition module outputs the marked original data to the data reforming module.
And then, the data reforming module starts to work after the data acquisition is finished. After the data reforming module receives the original data, the original data are rearranged according to a preset model sequence by combining the geometric position arrangement of the focuses of the distributed X-ray sources according to the cathode use list and excluding the focus information corresponding to the No. 5 cathode.
And then, the data preprocessing module carries out primary processing on the reformed original data. Since the No. 5 cathode does not work, the corresponding No. 5 focus is not exposed, and the geometric position information, the angle information, the correction file and the like are skipped.
And finally, the image comprehensive processing module receives the preprocessed data, converts the original data into an image according to the established data processing and image reconstruction process, and outputs and displays the image. Due to the failure of No. 5 cathode, the image corresponding to the angle has the defect, and the actual display is processed according to the defect position.
The present disclosure is more particularly described in the following examples that are intended as illustrations only, since numerous modifications and variations therein will be apparent to those skilled in the art. Various embodiments of the present disclosure will now be described in detail. Referring to the drawings, like numbers (if any) indicate like parts throughout the views. In addition, some terms used in the present specification will be defined more specifically below.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs. In case of conflict, the present document, including definitions, will control.
The embodiments were chosen and described in order to explain the principles of the disclosure and its practical application to enable others skilled in the art to utilize the disclosure and various embodiments and with various modifications as are suited to the particular use contemplated. Alternative embodiments will become apparent to those skilled in the art to which the present disclosure pertains without departing from its spirit and scope. Accordingly, the scope of the present disclosure is defined by the appended claims rather than by the foregoing description and the exemplary embodiments described therein.
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