阅读说明：本技术 一种用于深度器件深度精度测试装置及检测方法 (Depth precision testing device and method for depth device ) 是由 张世伟 于 2019-11-04 设计创作，主要内容包括：本发明公开了一种用于深度器件深度精度测试装置及检测方法,针对现有的学术界和工业界对深度器件的深度标定及深度检测没有具体的装置及有效、统一、快速的方法的问题,提出如下方案,包括六轴平台调整组件、直线导轨、标板、反射镜、光阱,由深度器件向标板投射图案,并经反射后由深度器件的内部处理器根据采集到的结构光团计算得到深度图案作为参考图案,并将数据信息存储到处理器内部的寄存器,完成深度器件标定,通过不同相对、绝对距离,进行标定结果验证,并根据深度器件的内部算法对标定数据进行修正,此过程为深度检测。本发明结构新颖,且自动化水平及测量精度较高,满足不断增长的深度具体需求,使用简便。(The invention discloses a depth precision testing device and a detection method for a depth device, and provides a scheme for solving the problems that no specific device and an effective, uniform and quick method are available for depth calibration and depth detection of the depth device in the existing academic and industrial fields. The invention has novel structure, higher automation level and measurement precision, meets the specific requirements of the depth which is continuously increased, and is simple and convenient to use.)

1. A depth precision testing device for a depth device is characterized by comprising: the device comprises a six-axis platform adjusting assembly (1), a linear guide rail (2), a target switching control module (3), a target (4), a reflector (5), an optical trap (6), an electric cabinet (7), a depth device (8), collimated laser (22) and a laser range finder (21);

the six-axis platform adjusting assembly (1) comprises a depth device fixing platform (18), a six-axis adjusting platform (19), a six-axis adjusting platform base (20), a laser range finder (21), collimation laser (22) and a linear guide rail (2), wherein the six-axis adjusting platform base (20) is fixed on the linear guide rail (2), the laser range finder (21), the collimation laser (22) and the six-axis adjusting platform (19) are all arranged on the six-axis adjusting platform base (20), and the depth device fixing platform (18) is connected to the six-axis adjusting platform (19);

one side of electric cabinet (7) is fixed with plane frame (13), plane frame (13) internal fixation has the mark board to remove the subassembly, and the mark board removes the subassembly and includes: the X-axis moving screw (12) and the X-axis lower supporting sliding seat (15) are arranged in parallel, and the Z-axis moving screw (11) and the X-axis moving screw (12) are arranged perpendicular to each other;

one side below of plane frame (13) is provided with the mark board and switches the subassembly, and the mark board switches the subassembly and includes: the mark plate box (9), the hook (10), the plate feeding screw rod (17), the electromagnet (16) and the positioning groove (23), wherein the hook (10) is arranged at the top of the mark plate (4), and the positioning groove (23) and the plate feeding screw rod (17) are arranged in parallel;

the linear guide (2) comprises: two linear guide, size rack (24) and rag screw (25), two linear guide parallel arrangement each other, and size rack (24) are fixed on a set of two linear guide, rag screw (25) set up along two linear guide's length direction.

2. The depth precision testing device for the depth device according to claim 1, wherein a desktop (14) is horizontally fixed on the top of the electric cabinet (7), a support rod is connected between the desktop (14) and the plane frame (13), and the plane frame (13) is perpendicular to the desktop (14).

3. The depth precision testing device for the depth device according to claim 1, wherein a reflector (5) and an optical trap (6) are connected to one side of each target (4), and the reflector (5) is arranged below the optical trap (6).

4. The depth precision testing device for the depth device is characterized in that the linear guide rail (2) is horizontally arranged on one side of the electric cabinet (7), and the six-axis adjusting platform base (20) is vertically arranged above the linear guide rail (2).

5. A depth device detection method is characterized by comprising the following steps:

s1: the vertical correction of the target plate, the reflector and the six-axis adjusting platform base and the flatness correction of the reflector and the target plate;

s2: a projection module in the depth device projects laser beams to the target;

s3: a reflector on the target reflects the laser beam projected by the depth device;

s4: a photosensitive receiving module of the depth device collects laser beams reflected by the reflector;

s5: calculating by an internal processor of the depth device according to the acquired structured light mass to obtain a depth pattern as a reference pattern, and storing data information into a register in the processor to finish the calibration of the depth device;

s6: and verifying the calibration result through different relative and absolute distances, and correcting the calibration data according to an internal algorithm of the depth device, wherein the process is depth detection.

6. The method for detecting a depth device of claim 5, wherein the vertical correction of the target, the mirror and the six-axis adjustment platform base in S1 is specifically to adjust the flatness of the optical trap and the target by a plane meter, emit a laser beam by a collimation laser on the six-axis adjustment platform base, reflect the laser beam emitted by the collimator by the mirror on the target, and determine whether the target, the mirror and the six-axis adjustment platform base are vertical and adjusted to be vertical according to whether the laser beam reflected by the mirror returns to the emission port again.

7. The method of claim 5, wherein the step of correcting the flatness of the mirror and target in the step S1 comprises moving the target and mirror to three positions, measuring the distance with a laser distance meter, and calculating the flatness of the mirror and target.

Technical Field

The invention relates to the field of depth device testing devices, in particular to a depth precision testing device and a depth precision testing method for a depth device.

Background

With the development of technology, depth devices have begun to be widely applied in the fields of human face technology, intelligent human-computer interaction, robots, three-dimensional reconstruction, AR/VR, unmanned driving, etc., and include a number of optical modules, such as an emission lighting module (laser, dot matrix projector), a photosensitive receiving module (infrared camera), an RGB camera, a light entrance window, a processor, etc. The depth device is used for acquiring a depth pattern and a color pattern of a target, and can be a structured light depth camera, a time flight depth camera, a laser radar and the like.

At present, there is no specific device and effective, unified and quick method for depth calibration and depth detection of depth devices in academic and industrial circles, so a depth precision testing device and a depth precision testing method for depth devices are designed to solve the problems. The invention provides a depth module precision test for generating depth information by taking an emitting illumination module and a photosensitive receiving module as cores and through mutual correlation between the two core modules, and the depth calibration and the depth detection distance of a depth device meet the existing market demands.

Disclosure of Invention

The depth precision testing device and the depth precision testing method for the depth device, provided by the invention, solve the problems that no specific device and effective, unified and quick method are provided for depth calibration and depth detection of the depth device in academic and industrial circles.

In order to achieve the purpose, the invention adopts the following technical scheme:

a depth accuracy testing apparatus for a depth device, comprising: the device comprises a six-axis platform adjusting assembly, a linear guide rail, a target switching control module, a target, a reflector, an optical trap, an electric cabinet, a depth device, a collimated laser and a laser range finder;

the six-axis platform adjusting assembly comprises a depth device fixing platform, a six-axis adjusting platform base, a laser range finder, collimated laser and a linear guide rail, wherein the six-axis adjusting platform base is fixed on the linear guide rail, the laser range finder, the collimated laser and the six-axis adjusting platform are all arranged on the six-axis adjusting platform base, and the depth device fixing platform is connected to the six-axis adjusting platform;

one side of electric cabinet is fixed with the plane frame, plane frame internal fixation has the mark board to remove the subassembly, and the mark board removes the subassembly and includes: the X-axis moving screw and the X-axis lower supporting sliding seat are arranged in parallel, and the Z-axis moving screw and the X-axis moving screw are arranged vertically;

one side below of plane frame is provided with the mark board and switches the subassembly, and the mark board switches the subassembly and includes: the mark plate box, the hook, the plate feeding screw rod, the electromagnet and the positioning groove are arranged on the top of the mark plate, and the positioning groove and the plate feeding screw rod are arranged in parallel;

the linear guide includes: the double-linear guide rail, the size rack and the foundation screws are arranged in parallel, the size rack is fixed on the double-linear guide rails, and the foundation screws are arranged along the length direction of the double-linear guide rails.

Preferably the top level of electric cabinet is fixed with the desktop, be connected with the bracing piece between desktop and the plane frame, the plane frame sets up with the desktop is perpendicular, and is fixed through the support of bracing piece to the plane frame, makes the fixed stability of plane frame, avoids the mark board to rock when removing in the plane frame.

Preferably, one side of each target is connected with a reflector and an optical trap, the reflector is arranged below the optical trap, the angle of the reflector is adjustable, and the parallelism between the optical trap and the target can be ensured through a plane meter during installation.

Preferably, the linear guide rail is horizontally arranged on one side of the electric cabinet, the six-axis adjusting platform base is vertically arranged above the linear guide rail, the linear guide rail is used for depth calibration of depth devices, the six-axis adjusting platform is fixedly installed on the linear guide rail, and the linear motor on the linear guide rail enables the six-axis adjusting platform to axially move through the size rack.

Preferably, the six-axis adjusting platform can realize XYZ axis, XY plane rotation and front-back pitching adjustment, is used for adjusting the depth device to adjust the parallelism of the target, and is compatible with the electric six-axis adjusting platform, and mounting hole positions are reserved.

Preferably, the automatic switch target assembly can realize taking and placing targets with different reflectivity through electric control, the targets are freely moved and positioned in the area of the plane frame of the test equipment, the guide screw rod is freely moved in the plane frame of the test equipment through the X, Z shaft, the targets with different reflectivity are fixed in the target box through the guide positioning groove, the targets in the target box move to the target position through the axial movement of the guide screw rod, and the automatic switch target system is convenient to take and replace the targets.

A depth device detection method, comprising the steps of:

s1: the vertical correction of the target plate, the reflector and the six-axis adjusting platform base and the flatness correction of the reflector and the target plate;

s2: a projection module in the depth device projects laser beams to the target;

s3: a reflector on the target reflects the laser beam projected by the depth device;

s4: a photosensitive receiving module of the depth device collects laser beams reflected by the reflector;

s5: calculating by an internal processor of the depth device according to the acquired structured light mass to obtain a depth pattern as a reference pattern, and storing data information into a register in the processor to finish the calibration of the depth device;

and S6, verifying the calibration result through different relative and absolute distances, and correcting the calibration data according to the internal algorithm of the depth device, wherein the process is depth detection.

Preferably, the vertical correction of the target, the reflecting mirror and the six-axis adjustment platform base in S1 specifically adjusts the flatness of the optical trap and the target by the plane gauge, emits a laser beam by the collimation laser on the six-axis adjustment platform base, reflects the laser beam emitted by the collimator by the reflecting mirror on the target, and determines whether the target, the reflecting mirror and the six-axis adjustment platform base are vertical and adjusted to be vertical according to whether the laser beam reflected by the reflecting mirror returns to the emission port again.

Preferably, in S1, the flatness correction of the mirror and the target is performed by moving the target and the mirror to three positions, measuring a distance with a laser range finder, and calculating the flatness of the mirror and the target.

The invention has the beneficial effects that: the automatic level and the measurement precision of the testing device are obviously improved by automatically switching the target plate assembly, the target plate moving assembly, the linear guide rail and the like, meanwhile, the depth precision testing of the target plates with different reflectivity can be realized, and the requirement of the continuously increased depth distance can be met.

Drawings

FIG. 1 is a schematic structural view of the present invention;

FIG. 2 is a schematic structural diagram of a reticle moving assembly of the present invention;

FIG. 3 is a schematic structural diagram of an automatic switch assembly for a target of the present invention;

FIG. 4 is a schematic structural view of a six-axis adjustable platform assembly according to the present invention;

FIG. 5 is a schematic view of the structure of the linear guide of the present invention

Fig. 6 is an enlarged view of the structure of the hanger in fig. 2.

Reference numbers in the figures: the device comprises a 1 six-axis adjusting platform assembly, a 2 linear guide rail, a 3 standard plate switching control module, a 4 standard plate, a 5 reflector, a 6 optical trap, a 7 electric cabinet, an 8 depth device, a 9 standard plate box, a 10 hook, a 11Z-axis moving lead screw, a 12X-axis moving lead screw, a 13 plane frame, a 14 desktop, a 15X-axis lower supporting sliding seat, a 16 electromagnet, a 17 plate feeding lead screw, a 18 depth device fixing platform, a 19 six-axis adjusting platform, a 20 six-axis adjusting platform base, a 21 laser range finder, a 22 collimation laser, a 23 positioning groove, a 24-size rack and a 25 foundation screw.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments.

Referring to fig. 1-6, a depth precision testing device for a depth device comprises a six-axis platform adjusting assembly 1, a linear guide rail 2, a target switching control module 3, a target 4, a reflector 5, an optical trap 6, an electric cabinet 7, a depth device 8, a collimated laser 22 and a laser range finder 21;

referring to fig. 4, the six-axis platform adjusting assembly 1 includes a depth device fixing platform 18, a six-axis adjusting platform 19, a six-axis adjusting platform base 20, a laser range finder 21, a collimated laser 22, and a linear guide rail 2, the six-axis adjusting platform base 20 is fixed on the linear guide rail 2, the laser range finder 21, the collimated laser 22, and the six-axis adjusting platform 19 are all arranged on the six-axis adjusting platform base 20, and the depth device fixing platform 18 is connected to the six-axis adjusting platform 19;

the working principle is as follows: by setting the calibration distance, namely the distance between the depth device 8 to be measured on the six-axis adjusting platform 19 and the target plate 4 on the linear guide rail 2, for example, the depth device 8 is 7m away from the target 4, the projection module in the depth device 8 projects a laser beam to the target 4, the photosensitive receiving module in the depth device 8 collects a structured light pattern formed by irradiating the target 4, the processor in the depth device 8 calculates the depth pattern according to the collected structured light pattern to be used as a reference pattern, and the data information is stored in a register inside the processor to finish the calibration of the depth device 8, in order to ensure the accuracy of the calibration result after the calibration is finished, the calibration result can be verified through different relative and absolute distances, and the calibration data is corrected according to the self algorithm program of the depth device 8, and the process is depth detection.

Referring to fig. 2, one side of electric cabinet 7 is fixed with plane frame 13, and plane frame 13 internal fixation has the mark board to remove the subassembly, and the mark board removes the subassembly and includes: the X-axis moving screw 12 and the X-axis lower supporting slide carriage 15 are arranged in parallel, and the Z-axis moving screw 11 and the X-axis moving screw 12 are arranged perpendicular to each other;

the working principle is as follows: the target board to be tested moves to the designated position in the plane frame of the test equipment under the coordination of the X-axis and Z-axis moving lead screws through the electric control system.

Referring to fig. 3, one side below of plane frame 13 is provided with the target and switches the subassembly, and the target switches the subassembly and includes: the mark plate box 9, the hook 10, the plate feeding screw 17, the electromagnet 16 and the positioning groove 23, wherein the hook 10 is arranged at the top of the mark plate 4, and the positioning groove 23 and the plate feeding screw 17 are arranged in parallel;

the working principle is as follows: the automatic switching of the target templates with different reflectivities is controlled by an electric control system, and a target template in the target template box is moved to be horizontal to the plane frame of the test equipment by a plate feeding lead screw; the hook belt sensor at the mark plate moving system can effectively detect whether the hook is hung on a standard mark plate or not and whether the position is correct or not; there are perpendicular plane bracing piece and electro-magnet behind the mark board moving system, fixed mark board prevents to rock at the removal in-process.

Referring to fig. 5, the linear guide 2 includes: the double-linear guide rail, the size rack 24 and the foundation screws 25 are arranged in parallel, the size rack 24 is fixed on the group of double-linear guide rails, and the foundation screws 25 are arranged along the length direction of the double-linear guide rails.

The working principle is as follows: and under the control of an electric control system, a linear motor on the linear guide rail enables the six-axis adjusting platform to axially move through a size rack.

A depth device detection method, comprising the steps of:

s1: the vertical correction of the target plate, the reflector and the six-axis adjusting platform base and the flatness correction of the reflector and the target plate;

s2: a projection module in the depth device projects laser beams to the target;

s3: a reflector on the target reflects the laser beam projected by the depth device;

s4: a photosensitive receiving module of the depth device collects laser beams reflected by the reflector;

s5: calculating by an internal processor of the depth device according to the acquired structured light mass to obtain a depth pattern as a reference pattern, and storing data information into a register in the processor to finish the calibration of the depth device;

and S6, verifying the calibration result through different relative and absolute distances, and correcting the calibration data according to the internal algorithm of the depth device, wherein the process is depth detection.

It should be noted that the size of the target to be detected in the present invention is determined, and as the detection distance increases, for some depth devices, the full FOV beam will need a target with a larger size to meet the requirement, and in order to avoid this, a compromise is selected to achieve the detection effect, that is, the FOV is selected to be within a smaller range (e.g. 3% of the full FOV) for the detection larger than the moving detection distance.

The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art should be considered to be within the technical scope of the present invention, and the technical solutions and the inventive concepts thereof according to the present invention should be equivalent or changed within the scope of the present invention.