Array antenna intermodulation and active impedance test system
阅读说明:本技术 一种阵列天线互调兼有源阻抗测试系统 (Array antenna intermodulation and active impedance test system ) 是由 李荣明 唐静 朱斌 吴雪 于 2019-10-20 设计创作,主要内容包括:本发明公开了一种阵列天线互调兼有源阻抗测试系统,其中,发射装置装置的输出端连接合路单元的出入口,合路单元的输出口连接双工器模块的发射TX端口,双工器模块的ANT端口连接64路射频开关的Ⅰ路通道,64路射频开关的Ⅱ路通道连接有源阻抗测试系统的输入端,64路射频开关的COM通道连接多端口天线阵列的被测端口,双工器模块的射频信号通过64路射频开关的COM端口传输至多端口天线阵列的被测端口,该多端口天线阵列的各端口移项调幅参数信号通过64路射频开关的Ⅱ路通道切换至有源阻抗测试系统系统。本发明可以实现多功能测试,集互调测试和有源阻抗测试为一体。(The invention discloses an array antenna intermodulation and active impedance test system, wherein the output end of a transmitting device is connected with the inlet and outlet of a combining unit, the output port of the combining unit is connected with the transmitting TX port of a duplexer module, the ANT port of the duplexer module is connected with a first channel of a 64-channel radio frequency switch, a second channel of the 64-channel radio frequency switch is connected with the input end of the active impedance test system, a COM channel of the 64-channel radio frequency switch is connected with a tested port of a multi-port antenna array, a radio frequency signal of the duplexer module is transmitted to the tested port of the multi-port antenna array through the COM port of the 64-channel radio frequency switch, and phase shift amplitude modulation parameter signals of each port of the multi-port antenna array are switched to the active impedance test system through the second channel of the 64-channel radio. The invention can realize multifunctional test, and integrates intermodulation test and active impedance test.)
1. The utility model provides an array antenna intermodulation and active impedance test system which characterized in that: the device comprises a transmitting device, a receiving device, a combiner unit, a duplexer module, a 64-channel radio frequency switch, a multi-port antenna array and an active impedance test system; the output end of the transmitting device is connected with the inlet and the outlet of the combining unit, the output port of the combining unit is connected with the transmitting TX port of the duplexer module, the ANT port of the duplexer module is connected with the I-path channel of the 64-path radio frequency switch, the II-path channel of the 64-path radio frequency switch is connected with the input end of the active impedance test system, the COM channel of the 64-path radio frequency switch is connected with the tested port of the multi-port antenna array, the radio frequency signal of the duplexer module is transmitted to the tested port of the multi-port antenna array through the COM port of the 64-path radio frequency switch, and the phase shift amplitude modulation parameter signal of each port of the multi-port antenna array is switched to the active impedance test system through the II-.
2. The array antenna intermodulation and active impedance test system of claim 1, characterized in that: the transmitting device comprises a first signal source, a second signal source, a first power amplifier, a second power amplifier, a combiner and a combiner module, wherein the first signal source is connected with the first power amplifier, the second signal source is connected with the second power amplifier, the output end of the first power amplifier is connected with the first input end of the combiner, the output end of the second power amplifier is connected with the second input end of the combiner, the output end of the combiner is connected with the input port of the combiner module, the output port of the combiner module is connected with the TX reflection port of the duplexer module, the combiner is used for power combining two received signals, and the combined power signal transmits the power signal to the TX port of the duplexer module through the combiner module.
3. The array antenna intermodulation and active impedance test system of claim 1, characterized in that: the receiving device comprises a radio frequency switch unit, a receiving filter and a digital receiver module, wherein the output end of the radio frequency switch unit is connected with an RX channel of the duplexer module, a COM port of the radio frequency switch unit is connected with the input end of the receiving filter, and the output end of the receiving filter is connected with the input end of the digital receiver module.
4. The array antenna intermodulation and active impedance test system of claim 1, characterized in that: the active impedance test system comprises a phase matrix, a switch matrix and a vector network analyzer, wherein the phase matrix is connected with a circulator through a first coupling unit, the circulator is connected with II channels of 64-path radio frequency switches, a coupling port of the first coupling unit is connected with an input port of the switch matrix, a 3 rd port of the circulator is connected with a second coupling unit, a coupling port of the second coupling unit is connected with an input port of the switch matrix, and a COM port of the switch matrix is connected with a second port of the vector network analyzer.
Technical Field
The invention relates to the field of testing of intermodulation products and active impedance of passive devices, in particular to an array antenna intermodulation and active impedance testing system.
Background
Active impedance parameters of real-time antennas for phased array beam scanning work are key indexes of phased array antennas, and are directly related to the coverage area of phased array beams, the gain and the safety of T/R equipment. The beam scanning is realized by adjusting the phase on each antenna unit, and the change of the phase directly affects the mutual coupling between the antenna units, so as to change the impedance characteristic parameters of the antenna units, thereby possibly forming signal reflection at the ports of the antenna units, being incapable of realizing the beam and gain required by design, and burning the power amplifier unit under extreme conditions. Therefore, when the phased array antenna is in scanning operation, the port impedance parameter of each antenna unit, namely the active impedance parameter, is a key index for describing the characteristics of the phased array. While precise testing of active impedance parameters requires simultaneous testing of a group of cells at a given amplitude and phase, conventional test systems cannot provide simultaneous testing of port parameters of multiple channels, thereby disturbing effective design and performance assurance of phased arrays.
Therefore, it is urgently needed to design a passive intermodulation tester which can measure the intermodulation index of the passive device and can also measure the phase shift amplitude modulation index of the passive device.
Disclosure of Invention
The invention aims to provide an array antenna intermodulation and active impedance test system to solve the problems in the prior art.
In order to achieve the purpose, the technical scheme adopted by the invention is as follows:
an array antenna intermodulation and active impedance test system comprises a transmitting device, a receiving device, a combiner unit, a duplexer module, a 64-channel radio frequency switch, a multi-port antenna array and an active impedance test system; the output end of the transmitting device is connected with the inlet and the outlet of the combining unit, the output port of the combining unit is connected with the transmitting TX port of the duplexer module, the ANT port of the duplexer module is connected with the I-path channel of the 64-path radio frequency switch, the II-path channel of the 64-path radio frequency switch is connected with the input end of the active impedance test system, the COM channel of the 64-path radio frequency switch is connected with the tested port of the multi-port antenna array, the radio frequency signal of the duplexer module is transmitted to the tested port of the multi-port antenna array through the COM port of the 64-path radio frequency switch, and the phase shift amplitude modulation parameter signal of each port of the multi-port antenna array is switched to the active impedance test system through the II-.
Furthermore, the transmitting device includes a first signal source, a second signal source, a first power amplifier, a second power amplifier, a combiner, and a combiner module, where the first signal source is connected to the first power amplifier, the second signal source is connected to the second power amplifier, an output end of the first power amplifier is connected to a first input end of the combiner, an output end of the second power amplifier is connected to a second input end of the combiner, an input end of the combiner is connected to an input port of the combiner module, an output port of the combiner module is connected to a TX reflection port of the duplexer module, the combiner is configured to perform power combining on the two received signals, and the combined power signal transmits the power signal to a TX port of the duplexer module through the combiner module.
Furthermore, the receiving device includes a radio frequency switch unit, a receiving filter and a digital receiver module, an output end of the radio frequency switch unit is connected to an RX channel of the duplexer module, a COM port of the radio frequency switch unit is connected to an input end of the receiving filter, and an output end of the receiving filter is connected to an input end of the digital receiver module.
Further, the active impedance testing system comprises a phase matrix, a switch matrix and a vector network analyzer, wherein the phase matrix is connected with a circulator through a first coupling unit, the circulator is connected with II channels of 64 radio frequency switches, a coupling port of the first coupling unit is connected with an input port of the switch matrix, a 3 rd port of the circulator is connected with a second coupling unit, a coupling port of the second coupling unit is connected with an input port of the switch matrix, and a COM port of the switch matrix is connected with a second port of the vector network analyzer.
Compared with the prior art, the invention has the advantages that: the invention can measure the intermodulation index of the passive device and the active impedance parameter index, and integrates the intermodulation test and the phase shift amplitude modulation.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a schematic diagram of an array antenna intermodulation and active impedance test system of the present invention.
Detailed Description
The preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings so that the advantages and features of the present invention can be more easily understood by those skilled in the art, and the scope of the present invention will be more clearly and clearly defined.
Referring to fig. 1, the present invention provides an array antenna intermodulation and active impedance test system, which includes a transmitter, a receiver, a combiner unit, a
In this embodiment, the intermodulation signal generated by the multi-port antenna array is transmitted to the RX port of the duplexer module 500 (total 32 duplexers) through the i channel of the 64
In this embodiment, the transmitting device includes a
In this embodiment, the receiving apparatus includes a radio frequency switch unit, a receiving filter, and a
In this embodiment, the rf switch unit includes an
Because the port to be tested of the multi-port antenna is connected with the COM port of the 64-path
In this embodiment, the active impedance testing system includes a
The first coupling unit comprises couplers (601,602,603) and a coupler (604,605,606), wherein the couplers (601,602,603) are connected in series behind a
In this embodiment, the
In this embodiment, the
Although the embodiments of the present invention have been described with reference to the accompanying drawings, various changes or modifications may be made by the patentees within the scope of the appended claims, and within the scope of the invention, as long as they do not exceed the scope of the invention described in the claims.
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