阅读说明：本技术 控制电路 (Control circuit ) 是由 潘喜光 于 2019-09-12 设计创作，主要内容包括：本申请实施例公开了一种控制电路,应用于负载点电源POL芯片,与所述POL芯片中的电源VCC引脚和电源正常PGood引脚相连,所述控制电路包括：检测模块,用于检测所述VCC引脚输出的电压的数值,判断所述电压的数值是否满足预先设置的PGood逻辑正常工作的判断条件,并输出检测信号；控制模块,用于控制所述PGood引脚输出的PGood信号处于低电平状态,直到接收的检测信号指示所述VCC信号的电压满足所述PGood逻辑正常工作的判断条件为止；其中,所述PGood引脚通过第一分压单元与控制电源相连。(The embodiment of the application discloses control circuit is applied to load point power POL chip, with power VCC pin and the normal PGood pin of power in the POL chip link to each other, control circuit includes: the detection module is used for detecting the value of the voltage output by the VCC pin, judging whether the value of the voltage meets the preset judgment condition that the PGood logic works normally or not, and outputting a detection signal; the control module is used for controlling a PGood signal output by the PGood pin to be in a low level state until the received detection signal indicates that the voltage of the VCC signal meets the judgment condition that the PGood logic normally works; the PGood pin is connected with a control power supply through a first voltage division unit.)

1. The utility model provides a control circuit, its characterized in that is applied to point-of-load power POL chip, with power VCC pin and the normal PGood pin of power in the POL chip link to each other, control circuit includes:

the detection module is used for detecting the value of the voltage output by the VCC pin, judging whether the value of the voltage meets the preset judgment condition that the PGood logic works normally or not, and outputting a detection signal;

the control module is used for controlling a PGood signal output by the PGood pin to be in a low level state until the received detection signal indicates that the voltage of the VCC signal meets the judgment condition that the PGood logic normally works; the PGood pin is connected with a control power supply through a first voltage division unit.

2. The circuit of claim 1, wherein the detection module comprises a first NMOS transistor and a second divided voltage, wherein:

the source electrode of the first NMOS tube is grounded, the drain electrode of the first NMOS tube is connected with a PGood signal, and the grid electrode of the first NMOS tube is connected with one end of the second voltage division unit;

and the other end of the second voltage division unit is connected with the control power supply.

3. The circuit of claim 1, wherein the control module comprises a second NMOS transistor, a third voltage divider unit, and a fourth voltage divider unit, wherein:

the source electrode of the first NMOS tube is grounded, the drain electrode of the second NMOS tube is connected with the grid electrode of the first NMOS tube, and the grid electrode of the second NMOS tube is connected with one end of the third voltage division unit;

the other end of the third voltage division unit is connected with the VCC pin;

one end of the fourth voltage division unit is grounded, and the other end of the fourth voltage division unit is connected with the VCC pin.

4. The circuit of claim 3, wherein the turn-on voltage of the first NMOS transistor and the second NMOS transistor is determined according to an operating voltage of a PGood logic circuit in the POL.

5. The circuit of claim 4, wherein a value of a turn-on voltage of the first NMOS transistor and the second NMOS transistor is greater than half a value of an operating voltage of the PGood logic circuit.

6. The circuit of claim 2, wherein the PGood logic circuit operates at a voltage greater than 2 volts.

7. The circuit of claim 2, wherein the voltages dissipated by the first and second voltage-dividing cells are of the same order of magnitude.

8. The circuit of claim 3, wherein the consumed voltages of the third voltage dividing unit and the fourth voltage dividing unit are equal.

9. The circuit of claim 7 or 8, wherein at least one of the first and second voltage dividing cells, the third voltage dividing cell, and the fourth voltage dividing cell is a resistor.

10. The circuit of claim 9, wherein when at least one of the first voltage-dividing cells and the second voltage-dividing cells is a resistor, the resistance value is greater than 1 kilo-ohm and less than 10 kilo-ohms.

Technical Field

The present disclosure relates to electronic circuits, and more particularly, to a control circuit.

Background

With the rapid development of the internet, the amount of online services is increasing, and the applications of electronic products such as servers are also increasing.

A Point of Load (POL) is a common DC to DC conversion chip scheme on a server, and can convert 12V into various voltages to supply power to a system. The POL chip may output Power Good (PGood) signals. This signal has mainly the following applications:

1. whether the POL output is normal can be judged according to the PGood signal;

2. can be used for Enable subordinate power supplies;

3. can be used for lighting LED lamps;

fig. 1 is a block diagram of a POL chip in the related art. As shown in FIG. 1, the lower right circular indication area shown in FIG. 1, the PGood control logic within the POL controls the high and low levels of the PGood signal by controlling the switches of the MOSFETs. When the PGood control logic is not controlled, an MOSFET is abnormally switched, glotch occurs when the PGood signal is powered on, and a problem of abnormal power-on may occur in a lower-level power supply enabled by the PGood signal, and a POL output may be erroneously determined.

Disclosure of Invention

In order to solve any one of the above technical problems, an embodiment of the present application provides a control circuit.

In order to achieve the purpose of the embodiments of the present application, an embodiment of the present application provides a control circuit, which is applied to a point-of-load power POL chip, and is connected to a power VCC pin and a power normal PGood pin in the POL chip, where the control circuit includes:

the detection module is used for detecting the value of the voltage output by the VCC pin, judging whether the value of the voltage meets the preset judgment condition that the PGood logic works normally or not, and outputting a detection signal;

the control module is used for controlling a PGood signal output by the PGood pin to be in a low level state until the received detection signal indicates that the voltage of the VCC signal meets the judgment condition that the PGood logic normally works; the PGood pin is connected with a control power supply through a first voltage division unit.

In an exemplary embodiment, the detection module includes a first NMOS transistor and a second divided voltage, wherein:

the source electrode of the first NMOS tube is grounded, the drain electrode of the first NMOS tube is connected with a PGood signal, and the grid electrode of the first NMOS tube is connected with one end of the second voltage division unit;

and the other end of the second voltage division unit is connected with the control power supply.

In one exemplary embodiment, the control module includes a second NMOS transistor, a third voltage dividing unit, and a fourth voltage dividing unit, wherein:

the source electrode of the first NMOS tube is grounded, the drain electrode of the second NMOS tube is connected with the grid electrode of the first NMOS tube, and the grid electrode of the second NMOS tube is connected with one end of the third voltage division unit;

the other end of the third voltage division unit is connected with the VCC pin;

one end of the fourth voltage division unit is grounded, and the other end of the fourth voltage division unit is connected with the VCC pin.

In an exemplary embodiment, the turn-on voltages of the first NMOS transistor and the second NMOS transistor are determined according to an operating voltage of a PGood logic circuit in POL.

In an exemplary embodiment, a value of the on-state voltage of the first NMOS transistor and the second NMOS transistor is greater than half a value of the operating voltage of the PGood logic circuit.

In one exemplary embodiment, the operating voltage of the PGood logic circuit is greater than 2 volts.

In an exemplary embodiment, the voltages consumed by the first and second voltage dividing cells are of the same order of magnitude.

In one exemplary embodiment, the consumed voltages of the third voltage division unit and the fourth voltage division unit are equal.

In an exemplary embodiment, at least one of the first and second voltage dividing units, the third voltage dividing unit, and the fourth voltage dividing unit is a resistor.

In an exemplary embodiment, when at least one of the first and second voltage division units is a resistor, the resistance value is greater than 1 kilo-ohm and less than 10 kilo-ohm.

The embodiment that this application embodiment provided detects the numerical value of the voltage of VCC pin output judges whether the numerical value of voltage satisfies the judgement condition that the PGood logic that sets up in advance normally worked to output the detected signal, control the PGood signal that the PGood pin output is in the low level state, indicates until the detected signal that receives the voltage of VCC signal satisfies the judgement condition that the PGood logic normally worked is kept the low level before guaranteeing that the PGood signal keeps the PGood logic control by the POL chip, overcomes the PGood signal and discovers the Glitch phenomenon at the voltage rise in VCC in-process, guarantees the normality of power signal.

Additional features and advantages of the embodiments of the application will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by the practice of the embodiments of the application. The objectives and other advantages of the embodiments of the application may be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.

Drawings

The accompanying drawings are included to provide a further understanding of the embodiments of the present application and are incorporated in and constitute a part of this specification, illustrate embodiments of the present application and together with the examples of the embodiments of the present application do not constitute a limitation of the embodiments of the present application.

FIG. 1 is a block diagram of a POL chip in the related art;

FIG. 2 is a diagram illustrating a PGood signal setting in the related art;

fig. 3 is a schematic diagram of a control circuit according to an embodiment of the present disclosure.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present application more apparent, the embodiments of the present application will be described in detail below with reference to the accompanying drawings. It should be noted that, in the embodiments of the present application, features in the embodiments and the examples may be arbitrarily combined with each other without conflict.

The inventor carries out technical analysis on the related art, and takes an IR38263 chip of Infineon as an example for explanation:

fig. 2 is a schematic diagram illustrating a setting of a PGood signal in the related art. As shown in fig. 2, the PGood pin in the POL chip is an OD gate, when the chip is not outputting, the MOS transistor in the PGood pin is in an on state, at this time, the PGood pin is directly grounded inside the chip, and the Power Good is at a voltage level of 0;

when the voltage output of the POL chip is normal, the MOS in the PGood pin is closed, the voltage of the PGood pin is pulled up to 3.3V by P3V3, and the Power Good is at a high voltage level.

In the above example, the inventor found that when the VCC voltage is 1V to 2V after the VCC pin in the POL chip starts to power up, the PGood logic control is unknown, and the PGood signal in the POL chip is pulled up by P3V3, and a Glitch of about 1V occurs. This Glitch may cause a BMC alarm or a later timing anomaly.

Based on the above analysis, the embodiment of the present application provides a control circuit, is applied to a load point power supply POL chip, with power VCC pin and PGood pin in the POL chip link to each other, control circuit includes:

the detection module is used for detecting the value of the voltage output by the VCC pin, judging whether the value of the voltage meets the preset judgment condition that the PGood logic works normally or not, and outputting a detection signal;

the control module is used for controlling a PGood signal output by the PGood pin to be in a low level state until the received detection signal indicates that the voltage of the VCC signal meets the judgment condition that the PGood logic normally works; the PGood pin is connected with a control power supply through a first voltage division unit.

The circuit that this application embodiment provided detects the numerical value of the voltage of VCC pin output judges whether the numerical value of voltage satisfies the judgement condition that the PGood logic that sets up in advance normally worked to output the detected signal, control the PGood signal of PGood pin output is in the low level state, indicates until the detected signal that receives the voltage of VCC signal satisfies the judgement condition that the PGood logic normally worked is long-pending, guarantees to keep the low level before the PGood signal is by the PGood logic control in the POL chip, overcomes the PGood signal and discovers the Glitch phenomenon at the voltage rise in VCC in-process, guarantees the normality of power signal.

The following describes a circuit provided in an embodiment of the present application:

fig. 3 is a schematic diagram of a control circuit according to an embodiment of the present disclosure. The structure of the modules in the control circuit is explained below by taking fig. 3 as an example:

in an exemplary embodiment, the detection module includes a first NMOS transistor and a second divided voltage, wherein:

the source electrode of the first NMOS tube is grounded, the drain electrode of the first NMOS tube is connected with a PGood signal, and the grid electrode of the first NMOS tube is connected with one end of the second voltage division unit;

and the other end of the second voltage division unit is connected with the control power supply.

In the above exemplary embodiment, taking the IR38263 chip of Infineon as an example for explanation, the voltage of the control power supply is 3.3V, when the first NMOS transistor is in the on state, the PGood signal is at low level, and when the first NMOS transistor is not in the on state, the PGood channel is at high level.

In one exemplary embodiment, the control module includes a second NMOS transistor, a third voltage dividing unit, and a fourth voltage dividing unit, wherein:

the source electrode of the first NMOS tube is grounded, the drain electrode of the second NMOS tube is connected with the grid electrode of the first NMOS tube, and the grid electrode of the second NMOS tube is connected with one end of the third voltage division unit;

the other end of the third voltage division unit is connected with the VCC pin;

one end of the fourth voltage division unit is grounded, and the other end of the fourth voltage division unit is connected with the VCC pin.

In the above exemplary embodiment, in the power-on process of the POL chip, as the voltage output by the VCC pin gradually increases, before the on-voltage of the second NMOS is not present, the first NMOS is turned on; and after the conduction voltage of the second NMOS is reached, the second NMOS tube is started, the first NMOS tube is closed, and the conduction state of the first NMOS tube is controlled.

In an exemplary embodiment, the turn-on voltages of the first NMOS transistor and the second NMOS transistor are determined according to an operating voltage of a PGood logic circuit in POL.

Whether the first NMOS tube and the second NMOS tube are conducted or not is to control the PGood signal to be at a low level through external control of the POL chip when PGood logic is not controlled, and therefore the conducting voltage is determined by the working voltage of the PGood logic circuit.

In an exemplary embodiment, a value of the on-state voltage of the first NMOS transistor and the second NMOS transistor is greater than half a value of the operating voltage of the PGood logic circuit.

In one exemplary embodiment, the operating voltage of the PGood logic circuit is greater than 2 volts.

In the above exemplary embodiment, taking the IR38263 chip of Infineon as an example for explanation, when the voltage value of VCC is between 1 volt and 2 volts, the glotch phenomenon occurs in the PGood signal, and therefore, it can be determined that the PGood control logic in the POL chip can normally operate only after the voltage value of VCC is greater than 2 volts, and the control of the PGood signal by the inside of POL is realized.

In an exemplary embodiment, the voltages consumed by the first and second voltage dividing cells are of the same order of magnitude.

In one exemplary embodiment, the consumed voltages of the third voltage division unit and the fourth voltage division unit are equal.

In an exemplary embodiment, at least one of the first and second voltage dividing units, the third voltage dividing unit, and the fourth voltage dividing unit is a resistor.

In an exemplary embodiment, when at least one of the first and second voltage division units is a resistor, the resistance value is greater than 1 kilo-ohm and less than 10 kilo-ohm.

And based on the voltage distribution mode, the conduction of the NMOS tube is controlled.

In the schematic diagram of fig. 3, the operating states of the control circuit include:

before the POL chip is not started, the voltage output by the VCC is 0V, the voltage at the G2 position in the control circuit is 0, and the MOS tube Q2 is closed; the voltage at the G1 position is 3.3V, and the MOS tube Q1 is conducted; the Power Good is maintained at 0V;

when the POL chip starts to work, the voltage output by the VCC pin rises, and when the voltage at the G2 position is higher than the conduction voltage of the MOS transistor Q2, the Q2 is conducted; the voltage at position G1 is 0 and Q1 is off. If the on-state voltage of Q2 can be set to 1.5V, the corresponding voltage output by VCC is 3V, and the uncontrolled voltage interval of PGood logic is avoided;

when the output of the POL chip is normal, the internal MOS of the PGood pin is closed, and the Power Good is pulled up to a high level by the P3V 3.

The circuit that this application embodiment provided detects the numerical value of the voltage of VCC pin output judges whether the numerical value of voltage satisfies the judgement condition that the PGood logic that sets up in advance normally worked to output the detected signal, control the PGood signal of PGood pin output is in the low level state, indicates until the detected signal that receives the voltage of VCC signal satisfies the judgement condition that the PGood logic normally worked is long-pending, guarantees to keep the low level before the PGood signal is by the PGood logic control in the POL chip, overcomes the PGood signal and discovers the Glitch phenomenon at the voltage rise in VCC in-process, guarantees the normality of power signal.

It will be understood by those of ordinary skill in the art that all or some of the steps of the methods, systems, functional modules/units in the devices disclosed above may be implemented as software, firmware, hardware, and suitable combinations thereof. In a hardware implementation, the division between functional modules/units mentioned in the above description does not necessarily correspond to the division of physical components; for example, one physical component may have multiple functions, or one function or step may be performed by several physical components in cooperation. Some or all of the components may be implemented as software executed by a processor, such as a digital signal processor or microprocessor, or as hardware, or as an integrated circuit, such as an application specific integrated circuit. Such software may be distributed on computer readable media, which may include computer storage media (or non-transitory media) and communication media (or transitory media). The term computer storage media includes volatile and nonvolatile, removable and non-removable media implemented in any method or technology for storage of information such as computer readable instructions, data structures, program modules or other data, as is well known to those of ordinary skill in the art. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, Digital Versatile Disks (DVD) or other optical disk storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other medium which can be used to store the desired information and which can accessed by a computer. In addition, communication media typically embodies computer readable instructions, data structures, program modules or other data in a modulated data signal such as a carrier wave or other transport mechanism and includes any information delivery media as known to those skilled in the art.