阅读说明：本技术 一种具多电压基准发生器的集成电路测量与供电系统 (Integrated circuit measuring and power supply system with multi-voltage reference generator ) 是由 崔善默 施伟 于 2019-10-23 设计创作，主要内容包括：本发明涉及一种具多电压基准发生器的集成电路测量与供电系统,是一个具有可选择的测量和供电电压源的一体化可选择测量和电源系统,所述系统被配置为CPU控制块(CPU control block)控制测量块和电压供应器块的选择,所述控制是可以通过控制命令块文本形式脚本或GUI界面来实现控制设置。该系统具有多种模式的选择,例如,具有用于需要多个电压源的情况下的电源模式(PSM)的模式选项以及用于需要大量电压输出情况下的测量模式(MM)。可用于评估晶片级或封装级显示驱动器IC的特性。可用于在面板模块组装前或组装后对其特性进行评估或验证。(The invention relates to an integrated circuit measurement and power supply system with multiple voltage reference generators, which is an integrated selectable measurement and power supply system with selectable measurement and power supply voltage sources, and the system is configured as a CPU control block (CPU control block) for controlling the selection of a measurement block and a voltage supply block, wherein the control can be realized by a control command block text form script or a GUI interface. The system has multiple mode options, for example, having a mode option for power mode (PSM) where multiple voltage sources are required and a Measurement Mode (MM) where a large voltage output is required. Can be used to evaluate the characteristics of a wafer-level or package-level display driver IC. Can be used to evaluate or verify the characteristics of the panel module before or after assembly.)

1. The integrated circuit measuring and power supply system with multiple voltage reference generators is characterized by comprising a CPU control block and a working module, wherein the working module mainly comprises a measuring block and a voltage supplier block, the working module is provided with a plurality of output/input data channels, the CPU control block controls and gates the measuring block and the voltage supplier block in the working module to enable the output/input channels to be set according to requirements, and the control is realized through a text form script of a control command block or a GUI interface.

2. The system of claim 1, wherein the operation module further comprises a selection block and a selection switch, wherein the selection block executes the control command of the CPU control block to select the measurement block and the voltage supply block, and the selection switch defines each of the output/input channels according to the control command.

3. The system of claim 1 or 2, wherein the system is externally connected to a DUT socket board to which the target device is plugged.

4. The system of claim 3, further comprising an interface block configured to be set and controlled by the interface block to modify measurement preferences of a semiconductor product targeted for the device when measured or powered by an external DUT.

5. An integrated circuit measurement and power supply system with multiple voltage reference generators according to claim 4, characterized in that it further comprises a control command block, the system being able to perform said control by writing scripts in the control command block or by internalization into the GUI interface console, the configuration of said commands being stored in each script file or in the internal memory.

6. The measurement and power supply system of claim 1 or 2, wherein the system further comprises a display module capable of outputting data for displaying the measurement and power supply, so that the system can check the data transmitted through the input/output unit in real time through the connected display module to determine the current status of the measured voltage and the output voltage.

7. An integrated circuit measurement and power supply system with multiple voltage reference generators as claimed in claim 1 or 2, characterized in that the system has a selection of modes, said modes comprising at least a power supply mode and a measurement mode, said power supply mode being selected in case of a need for multiple voltage sources and said measurement mode being selected in case of a need for a large voltage output.

Technical Field

The invention relates to the field of electronic instruments, in particular to an integrated circuit measuring and power supply system with a multi-voltage reference generator.

Background

Conventional semiconductor products, such as display panels, display driver ICs, or multiple voltage reference generators, often generate or require more than 10 voltage references.

For some semiconductor products, a multi-voltage output or multi-voltage input source is required, and most of the commercially available power supplies can simultaneously output 2-4 channels, and at the same time, because it is difficult to provide a voltage pin of a diversified commercial power supply for the purpose of using diversification. (for example, more than 10 voltage sources are required to drive the panel for the nearest display module).

In this case, the measurement or power supply system must be configured using a large number of commercially available measurement devices for the measurement and supply modes, respectively.

Therefore, in this case, it is necessary to use expensive professional equipment or some high-cost architected commercial equipment.

Due to the production of display modules, it is often necessary to assemble the display panel and the display driver IC in the form of a module with a professional panel inspection apparatus for verifying the operating characteristics thereof.

Further, in the case of the above-described display driving IC, a plurality of reference voltage outputs are required in order to supply necessary voltages for the display panel operation. In this case, in order to measure such a large number of voltages at the same time, it is necessary to equip with a corresponding number of multichannel multimeters and oscilloscopes.

This entails high costs and extensive and repetitive construction and makes the work of establishing a test environment more complicated.

Disclosure of Invention

The technical problem to be solved by the invention is as follows: an integrated circuit measurement and power supply system with multiple voltage reference generators is provided that can have multiple mode options, for example, power mode (PSM) can be selected where multiple voltage sources are required, and Measurement Mode (MM) can be selected where a large voltage output is required.

The technical scheme adopted by the invention for solving the technical problems is as follows: the invention provides an integrated circuit measuring and power supply system with multiple voltage reference generators, which comprises a CPU control block and a working module, wherein the working module mainly comprises a measuring block and a voltage supplier block, the working module is provided with a plurality of output/input data channels, the control and gating of the measuring block and the voltage supplier block in the working module by the CPU control block enable the output/input channels to be set according to requirements, and the control is realized by a text form script of a control command block or a GUI interface.

Further, the working module further comprises a selection block and a selection switch, wherein the selection block executes the control command of the CPU control block to select the measurement block and the voltage supplier block, and the selection switch defines each output/input channel according to the control command.

Further, the system is externally connected with a DUT plug board, and target equipment can be plugged on the DUT plug board.

Further, the system includes an interface block configured to be set and controlled by the interface block to modify the measurement preferences of the semiconductor product as the target device when measured or powered by the external DUT.

Further, the system further comprises a control command block, the system being capable of performing said controlling by writing a script in the control command block or by internalizing into the GUI interface console, the configuration of said command being stored in each script file or internal memory.

Further, the system also includes a display module capable of outputting data showing the measurement and the power supply, so that the system can check the data transmitted through the input/output unit in real time through the connected display module to determine the current states of the measured voltage and the output voltage.

Further, the system may have a selection of modes, the modes including at least a power mode and a measurement mode, the power mode being selected if a plurality of voltage sources are required and the measurement mode being selected if a large number of voltage outputs are required.

In order to determine the current state of the measurement voltage and the output voltage, the data transmitted via the input/output unit can be checked in real time by means of the connected display module. This configuration may immediately respond to a possible error condition. And the system can be connected with a DUT socket board, on which target equipment can be plugged, such as DDI or voltage regulation IC, display panel, etc.

And the system may have a choice of modes, for example, the supply mode (PSM) in case a plurality of voltage sources is required, and the Measurement Mode (MM) in case a large voltage output is required.

The invention has the beneficial effects that: with the above structure, an integrated circuit measurement and power supply system with multiple voltage reference generators of the present invention is an integrated selectable measurement and power system (ASMPS) with multiple mode selection, e.g., with mode options for power mode (PSM) where multiple voltage sources are required and Measurement Mode (MM) where a large voltage output is required.

The system can be used to evaluate the characteristics of a wafer-level or package-level display driver IC. In addition, it can also be used to evaluate or verify the properties of the panel module before or after its assembly.

The invention can reduce the cost of respectively configuring two power supplies and a measuring system by using expensive commercial equipment, and has the following advantages: a system can be established in which the display panel and the driver IC can be evaluated. The invention mainly aims at two mutually conflicting aims, the measurement function and the power supply function can be realized optionally, and the purpose is to improve the efficiency and the burden capability of the system test of the semiconductor product.

Drawings

FIG. 1 is a system block diagram of an integrated circuit measurement and power supply system with multiple voltage reference generators according to the present invention.

In the figure: command, D: data, DDI: display driver IC (integrated circuit), DUT: the device under test.

Detailed Description

The invention will now be further described with reference to the accompanying drawings. These drawings are simplified schematic diagrams only illustrating the basic structure of the present invention in a schematic manner, and thus show only the constitution related to the present invention.

The invention mainly aims at two contradictory targets, and the measurement function and the power supply function can be selectively realized so as to improve the system test efficiency and the load capability of the semiconductor product.

The invention relates to an integrated circuit measuring and power supply system with a multi-voltage reference generator, wherein a Hardware system (Hardware) mainly comprises: a CPU control block and a work module, wherein the work module mainly comprises a measuring block, a voltage supplier block, a selection block and a selection switch, and has a plurality of output/input data channels D (CH 1-CHn). The control gating of the measurement block and the voltage supply block in the working module by the CPU control block enables the output/input channel to be set according to requirements, and the control is realized by a text form script of a control command block or a GUI interface. The CPU control Block can send out control Command (Command) to the working module and transmit data signal (Date) to each other, the control Command defines each output/input channel (CH1-CHn) by means of Selection Block and Selection switch, the system is connected with DUT plug board, and the target device can be plugged on the control Command. A measurement Block (Output Voltage measurement Block) or a Voltage supply Block (Voltage source supply Block) is selected to define it as either measurement or supply, respectively. The selection block executes the control command of the CPU control block to select the measurement block and the voltage supplier block, and the selection switch defines each output/input channel according to the control command.

The hardware system may be externally connected to a DUT (design under test) board, in a specific embodiment, an ECOF/COB/SSOP/etc. connection DUT board, to which a Target Device (system Target Device) may be plugged: DDI, voltage regulation IC, display panel, etc.

In one embodiment, a Control Command Block (Control Command Block), a display module (DisplayBlock), and an Interface Block (Interface Block) may also be included. Wherein the system can perform said control by writing scripts in a control command block or by internalization into a GUI interface console, the configuration of said commands being stored in each script file or internal memory.

An interface block (InterfaceBlock) may connect the central CPU control block and the DUT board, may transmit commands and data, and is configured to be capable of setting and controlling through the interface block so as to change measurement preferences of a semiconductor product as a target device when measurement or power supply is performed through an external DUT.

The system further comprises a display module capable of outputting data showing the measurement and the power supply, so that the system can check the data transmitted through the input/output unit in real time through the connected display module to be able to determine the current states of the measured voltage and the output voltage. And the display module can output and display the data of measurement and power supply.

With the above structure, the system can have a selection of multiple modes, including at least a power supply mode selected when multiple voltage sources are required and a measurement mode selected when a large voltage output is required. For example, the supply mode (PSM) may be selected in case a plurality of voltage sources is required, and the Measurement Mode (MM) may be selected in case a large number of voltage outputs are required.

The working mode is as follows:

as shown in fig. 1, the system is configured such that a CPU control block (CPU control block) controls selection of a measurement block and a voltage supplier block, and this configuration can be realized by a script or GUI interface in the form of text of a control command block (the control command block).

In order to determine the current state of the measured voltage and the output voltage, the data transmitted by the input/output unit can be checked in real time by means of a connected display block, which can receive the data of the CPU control block in real time. This configuration allows immediate response to error conditions that may occur.

Next, when measurement or power supply is performed by the external DUT, it is configured to be able to be set and controlled by the interface block so as to change the measurement preference of the semiconductor product as the target device.

Further, these settings are configured to be performed by writing scripts in the control command block or by internalization into the GUI interface console. The configuration will be stored in each script file or internal memory.

This configuration can shorten the time required for each mode transition and setting thereof. Also, since the measurement and power supply can be integrated into a single system for use, the economy is considerably high compared to conventional commercially available products and professional equipment.

In conclusion, the functions of the measurement and the power supply can be realized optionally, and the efficiency and the burden capacity of the system test of the semiconductor product are improved.

In light of the foregoing description of the preferred embodiment of the present invention, many modifications and variations will be apparent to those skilled in the art without departing from the spirit and scope of the invention. The technical scope of the present invention is not limited to the content of the specification, and must be determined according to the scope of the claims.