Precision chip detection equipment
阅读说明：本技术 一种精密芯片检测设备 (Precision chip detection equipment ) 是由 晁阳升 蔡浪滔 王宇峰 梁永鑫 于 2021-08-26 设计创作，主要内容包括：本发明涉及一种精密芯片检测设备,其包括基座、校正装置、顶升装置和检测系统。校正装置包括校正安装机构、转盘机构和定位相机。顶升装置包括顶升安装机构、顶针和伸缩机构。检测系统包括顶面检测相机和相对设置的第一检测装置和第二检测装置,第一检测装置和第二检测装就用于芯片的检测。校正装置对芯片的位置进行校正,并通过定位相机对芯片的位置进行确认和记录,便于后续进行顶面检测和运送机构定位吸附。顶升装置利用顶针的向上顶升力使芯片脱离薄膜,以便于运送机构吸附并输送至检测系统中。第一检测装置和第二检测装置共用转盘机构作为料仓,两者之间相互独立运行,分别对顶面检测完成的芯片进行端面和底面检测,有效地提高了检测效率。(The invention relates to a precision chip detection device which comprises a base, a correction device, a jacking device and a detection system. The correction device comprises a correction mounting mechanism, a turntable mechanism and a positioning camera. The jacking device comprises a jacking installation mechanism, a thimble and a telescopic mechanism. The detection system comprises a top surface detection camera and a first detection device and a second detection device which are oppositely arranged, and the first detection device and the second detection device are used for detecting the chip. The correcting device corrects the position of the chip, confirms and records the position of the chip through the positioning camera, and facilitates subsequent top surface detection and positioning adsorption of the conveying mechanism. The jacking device utilizes the upward jacking force of the ejector pin to separate the chip from the film, so that the conveying mechanism can adsorb and convey the chip to the detection system conveniently. The first detection device and the second detection device share the turntable mechanism as a storage bin, the first detection device and the second detection device operate independently from each other, end face and bottom face detection is carried out on chips which are detected and finished on the top face respectively, and detection efficiency is effectively improved.)
1. A precision chip inspection apparatus, comprising:
a base;
the correcting device comprises a correcting installation mechanism, a turntable mechanism and a positioning camera; the correcting installation mechanism is arranged on the base and can move in the directions of an x axis and a y axis; the rotary table mechanism is arranged on the correction installation mechanism and can rotate by taking a vertical line as a rotating shaft; the positioning camera is arranged above the turntable mechanism;
the jacking device comprises a jacking mounting mechanism, a thimble and a telescopic mechanism; the jacking installation mechanism is arranged on the base and can move in the z-axis direction; the telescopic mechanism is arranged on the jacking installation mechanism, the ejector pin is vertically arranged on the telescopic mechanism, and the ejector pin is positioned below the turntable mechanism;
the detection system comprises a top surface detection camera, a first detection device and a second detection device which are arranged oppositely; the first detection device and the second detection device respectively comprise a bottom surface detection camera, an end surface detection camera and a conveying mechanism; the top surface detection camera is arranged above the turntable mechanism; the optical axes of the bottom surface detection camera and the end surface detection camera are orthogonal and are arranged on the base; the conveying mechanism comprises a rotating assembly and a suction nozzle, the rotating assembly is arranged on the base and can move in the directions of an x axis, a y axis and a z axis, and the directions of the x axis, the y axis and the z axis are mutually vertical; the suction nozzle is arranged on the rotating assembly, the suction nozzle can rotate by taking a vertical line as a rotating shaft, and the rotating assembly can convey the chip on the turntable mechanism to an orthogonal area of an optical axis of the bottom surface detection camera and the end surface detection camera through the suction nozzle.
2. The precision chip inspection apparatus of claim 1, wherein the correcting mounting mechanism comprises a first correcting mounting plate, a second correcting mounting plate, a first correcting driving component, and a second correcting driving component;
the first correcting installation plate is arranged on the base in a sliding mode through a first correcting slide rail, the second correcting installation plate is arranged on the first correcting installation plate in a sliding mode through a second correcting slide rail, the first correcting slide rail is parallel to the x-axis direction, and the second correcting slide rail is parallel to the y-axis direction;
the first correction driving assembly is arranged on the base and used for driving the first correction mounting plate to move along the first correction sliding rail;
the second correction driving assembly is arranged on the first correction mounting plate and used for driving the second correction mounting plate to move along the second correction sliding rail;
the turntable mechanism is arranged on the second correction mounting plate.
3. The precision chip inspection apparatus according to claim 2, wherein said turntable mechanism comprises a turntable drive assembly and a rotating disk;
the rotating disc is rotatably arranged on the second correcting mounting plate, the rotating disc driving assembly is arranged on the second correcting mounting plate, and the rotating disc driving assembly is used for driving the rotating disc to rotate;
a first circular through hole is formed in the rotating disc, a second circular through hole is formed in the second correcting and installing plate, and the central axes of the first circular through hole and the second circular through hole are collinear with the rotation axis of the rotating disc;
the positioning camera is positioned above the rotating disc, and a lens of the positioning camera faces downwards;
the ejector pin is located below the second through hole, and the top end of the ejector pin faces upwards.
4. The precision chip inspection apparatus according to claim 3, wherein said calibration device further comprises a first pressing mechanism and a second pressing mechanism disposed opposite to each other;
the first pressing mechanism and the second pressing mechanism respectively comprise a pressing cylinder, a pressing plate and a material lifting block;
the compression air cylinder is arranged on the second correction mounting plate, and a piston rod of the first compression air cylinder is arranged vertically upwards;
the compression plate is horizontally arranged on a piston rod of the compression cylinder, the lower surface of the compression plate can abut against the upper surface of the rotating disc, and the compression plate of the first compression mechanism and the compression plate of the second compression mechanism are point-symmetrical about the symmetry center of the rotating disc;
the material lifting block is arranged on the lower surface of the pressing plate.
5. The precision chip inspection apparatus of claim 4, wherein each of the first and second pressing mechanisms further comprises a pull rod assembly and a plurality of guide assemblies;
the pull rod assembly comprises a first guide shaft and a spring, the first guide shaft is vertically arranged on the lower surface of the compression plate, the spring is sleeved on the first guide shaft, the lower end of the spring is connected with the second correction mounting plate, and the second end of the spring is connected with the compression plate;
the guide assembly comprises a second guide shaft and a guide sleeve, the second guide shaft is vertically arranged on the lower surface of the pressing plate, the guide sleeve is vertically arranged on the second correction mounting plate, and the second guide shaft is slidably sleeved in the guide sleeve.
6. The precision chip inspection apparatus of any one of claims 1-5, wherein the telescoping mechanism comprises a telescoping mounting plate, a telescoping drive assembly, a telescoping rod, a thimble guide tube, and a thimble mounting block;
the telescopic mounting plate is arranged on the jacking mounting mechanism, and the thimble guide pipe is arranged on the telescopic mounting plate;
the thimble mounting block is arranged on the telescopic mounting plate in a sliding manner through a telescopic slide rail, the first end of the telescopic rod is connected with the thimble mounting block, the second end of the telescopic rod is connected with the thimble, the telescopic rod is sleeved in the thimble guide tube in a sliding manner, and the telescopic slide rail and the telescopic rod are parallel to the z-axis direction;
the telescopic driving assembly is arranged on the telescopic mounting plate and used for driving the thimble mounting block to move along the telescopic slide rail.
7. The precision chip inspection apparatus of claim 6, wherein the jacking mounting mechanism comprises a first jacking mounting plate, a second jacking mounting plate, and a jacking driving assembly;
the first jacking mounting plate is arranged on the base, the second jacking mounting plate is arranged on the first jacking mounting plate in a sliding mode through a jacking sliding rail, and the jacking sliding rail is parallel to the z-axis direction;
the jacking driving assembly is arranged on the first jacking mounting plate and used for driving the second jacking mounting plate to move along the jacking sliding rail;
the telescopic mounting plate is arranged on the second jacking mounting plate.
8. The precision chip inspection apparatus of any one of claims 1-5, wherein the transport mechanism further comprises a beam, a first motion assembly, a second motion assembly, and a third motion assembly;
the beam is arranged on the base along the x-axis direction;
the first motion assembly, the second motion assembly and the third motion assembly each comprise a motion mounting plate and a motion driving assembly;
the motion mounting plate of the first motion assembly is arranged on the cross beam in a sliding mode through a first motion sliding rail, and the first motion sliding rail is parallel to the x-axis direction; the motion driving assembly of the first motion assembly is arranged on the motion mounting plate of the first motion assembly and used for driving the motion mounting plate of the first motion assembly to move along the first slide rail;
the motion mounting plate of the second motion assembly is arranged on the motion mounting plate of the first motion assembly in a sliding mode through a second motion sliding rail, and the second motion sliding rail is parallel to the y-axis direction; the motion driving assembly of the second motion assembly is arranged on the motion mounting plate of the first motion assembly and used for driving the motion mounting plate of the second motion assembly to move along the second slide rail;
the motion mounting plate of the third motion assembly is slidably arranged on the motion mounting plate of the second motion assembly through a third motion sliding rail, and the third motion sliding rail is parallel to the z-axis direction; the motion driving assembly of the third motion assembly is arranged on the motion mounting plate of the second motion assembly and used for driving the motion mounting plate of the third motion assembly to move along the third slide rail;
the rotating assembly is arranged on the motion mounting plate of the third motion assembly.
9. The precision chip detection apparatus according to claim 8, wherein the rotation assembly comprises a rotation driving motor, a rotation housing and a rotation head, the rotation driving motor and the rotation housing are both disposed on the motion mounting plate of the third motion assembly, and a rotation shaft of the rotation driving motor is disposed vertically downward;
the lower extreme of rotary drive motor's pivot passes connect behind the swivel housing the rotating head, the suction nozzle set up in the lower extreme of rotating head.
10. The precision chip inspection apparatus according to any one of claims 1 to 5, further comprising a first blanking device and a second blanking device disposed opposite to each other, wherein the first blanking device is adjacent to the first inspection device, and the second blanking device is adjacent to the second inspection device;
the first blanking device and the second blanking device respectively comprise a blanking moving platform, a blanking driving assembly and an empty material detection camera;
the blanking mobile station is horizontally arranged on the base through a mobile slide rail, and the mobile slide rail is parallel to the y-axis direction;
the blanking driving assembly is arranged on the blanking moving table and used for driving the blanking moving table to move along the moving slide rail;
the empty material detection camera is arranged above the blanking mobile station.
Technical Field
The invention relates to the technical field of visual detection, in particular to precision chip detection equipment.
Background
After the integrated circuit chip finished product is produced, in order to avoid the pollution of the environment to the chip surface, the chip is directly packaged in the material box. Finished chips in the material box can be packaged and put in storage after detection is carried out to ensure that the finished chips are qualified, the detection content comprises physical defect detection, magnetic induction detection and the like, and chips which are not qualified are recovered.
The existing chip detection process comprises manual detection and equipment detection, wherein the manual detection is that the chips are detected one by one through naked eyes by labor-intensive workers, the detection mode is low in efficiency, the detection error is large, and the detection environment is very easy to pollute the chips in the detection process. The equipment detection is to detect one surface of the chip through a detection camera, turn over the chip through manual work, and then detect the other surface. The mode is also low in efficiency, automatic feeding and discharging operations cannot be realized, and subsequent packaging and other processes cannot be finished simultaneously.
Disclosure of Invention
Technical problem to be solved
In view of the above disadvantages and shortcomings of the prior art, the present invention provides a precision chip inspection apparatus, which solves the technical problems of low automation degree and low inspection efficiency of the chip inspection apparatus.
(II) technical scheme
In order to achieve the above object, a precision chip inspection apparatus of the present invention comprises:
a base;
the correcting device comprises a correcting installation mechanism, a turntable mechanism and a positioning camera; the correcting installation mechanism is arranged on the base and can move in the directions of an x axis and a y axis; the rotary table mechanism is arranged on the correction installation mechanism and can rotate by taking a vertical line as a rotating shaft; the positioning camera is arranged above the turntable mechanism;
the jacking device comprises a jacking mounting mechanism, a thimble and a telescopic mechanism; the jacking installation mechanism is arranged on the base and can move in the z-axis direction; the telescopic mechanism is arranged on the jacking installation mechanism, the ejector pin is vertically arranged on the telescopic mechanism, and the ejector pin is positioned below the turntable mechanism;
the detection system comprises a top surface detection camera, a first detection device and a second detection device which are arranged oppositely; the first detection device and the second detection device respectively comprise a bottom surface detection camera, an end surface detection camera and a conveying mechanism; the top surface detection camera is arranged above the turntable mechanism; the optical axes of the bottom surface detection camera and the end surface detection camera are orthogonal and are arranged on the base; the conveying mechanism comprises a rotating assembly and a suction nozzle, the rotating assembly is arranged on the base and can move in the directions of an x axis, a y axis and a z axis, and the directions of the x axis, the y axis and the z axis are mutually vertical; the suction nozzle is arranged on the rotating assembly, the suction nozzle can rotate by taking a vertical line as a rotating shaft, and the rotating assembly can convey the chip on the turntable mechanism to an orthogonal area of an optical axis of the bottom surface detection camera and the end surface detection camera through the suction nozzle.
Optionally, the correcting mounting mechanism comprises a first correcting mounting plate, a second correcting mounting plate, a first correcting driving component and a second correcting driving component;
the first correcting installation plate is arranged on the base in a sliding mode through a first correcting slide rail, the second correcting installation plate is arranged on the first correcting installation plate in a sliding mode through a second correcting slide rail, the first correcting slide rail is parallel to the x-axis direction, and the second correcting slide rail is parallel to the y-axis direction;
the first correction driving assembly is arranged on the base and used for driving the first correction mounting plate to move along the first correction sliding rail;
the second correction driving assembly is arranged on the first correction mounting plate and used for driving the second correction mounting plate to move along the second correction sliding rail;
the turntable mechanism is arranged on the second correction mounting plate.
Optionally, the carousel mechanism comprises a carousel drive assembly and a rotating disc;
the rotating disc is rotatably arranged on the second correcting mounting plate, the rotating disc driving assembly is arranged on the second correcting mounting plate, and the rotating disc driving assembly is used for driving the rotating disc to rotate;
a first circular through hole is formed in the rotating disc, a second circular through hole is formed in the second correcting and installing plate, and the central axes of the first circular through hole and the second circular through hole are collinear with the rotation axis of the rotating disc;
the positioning camera is positioned above the rotating disc, and a lens of the positioning camera faces downwards;
the ejector pin is located below the second through hole, and the top end of the ejector pin faces upwards.
Optionally, the correcting device further comprises a first pressing mechanism and a second pressing mechanism which are oppositely arranged;
the first pressing mechanism and the second pressing mechanism respectively comprise a pressing cylinder, a pressing plate and a material lifting block;
the compression air cylinder is arranged on the second correction mounting plate, and a piston rod of the first compression air cylinder is arranged vertically upwards;
the compression plate is horizontally arranged on a piston rod of the compression cylinder, the lower surface of the compression plate can abut against the upper surface of the rotating disc, and the compression plate of the first compression mechanism and the compression plate of the second compression mechanism are point-symmetrical about the symmetry center of the rotating disc;
the material lifting block is arranged on the lower surface of the pressing plate.
Optionally, each of the first pressing mechanism and the second pressing mechanism further includes a pull rod assembly and a plurality of guide assemblies;
the pull rod assembly comprises a first guide shaft and a spring, the first guide shaft is vertically arranged on the lower surface of the compression plate, the spring is sleeved on the first guide shaft, the lower end of the spring is connected with the second correction mounting plate, and the second end of the spring is connected with the compression plate;
the guide assembly comprises a second guide shaft and a guide sleeve, the second guide shaft is vertically arranged on the lower surface of the pressing plate, the guide sleeve is vertically arranged on the second correction mounting plate, and the second guide shaft is slidably sleeved in the guide sleeve.
Optionally, the telescopic mechanism comprises a telescopic mounting plate, a telescopic driving assembly, a telescopic rod, a thimble guide tube and a thimble mounting block;
the telescopic mounting plate is arranged on the jacking mounting mechanism, and the thimble guide pipe is arranged on the telescopic mounting plate;
the thimble mounting block is arranged on the telescopic mounting plate in a sliding manner through a telescopic slide rail, the first end of the telescopic rod is connected with the thimble mounting block, the second end of the telescopic rod is connected with the thimble, the telescopic rod is sleeved in the thimble guide tube in a sliding manner, and the telescopic slide rail and the telescopic rod are parallel to the z-axis direction;
the telescopic driving assembly is arranged on the telescopic mounting plate and used for driving the thimble mounting block to move along the telescopic slide rail.
Optionally, the jacking mounting mechanism comprises a first jacking mounting plate, a second jacking mounting plate and a jacking driving assembly;
the first jacking mounting plate is arranged on the base, the second jacking mounting plate is arranged on the first jacking mounting plate in a sliding mode through a jacking sliding rail, and the jacking sliding rail is parallel to the z-axis direction;
the jacking driving assembly is arranged on the first jacking mounting plate and used for driving the second jacking mounting plate to move along the jacking sliding rail;
the telescopic mounting plate is arranged on the second jacking mounting plate.
Optionally, the transport mechanism further comprises a cross beam, a first motion assembly, a second motion assembly, and a third motion assembly;
the beam is arranged on the base along the x-axis direction;
the first motion assembly, the second motion assembly and the third motion assembly each comprise a motion mounting plate and a motion driving assembly;
the motion mounting plate of the first motion assembly is arranged on the cross beam in a sliding mode through a first motion sliding rail, and the first motion sliding rail is parallel to the x-axis direction; the motion driving assembly of the first motion assembly is arranged on the motion mounting plate of the first motion assembly and used for driving the motion mounting plate of the first motion assembly to move along the first slide rail;
the motion mounting plate of the second motion assembly is arranged on the motion mounting plate of the first motion assembly in a sliding mode through a second motion sliding rail, and the second motion sliding rail is parallel to the y-axis direction; the motion driving assembly of the second motion assembly is arranged on the motion mounting plate of the first motion assembly and used for driving the motion mounting plate of the second motion assembly to move along the second slide rail;
the motion mounting plate of the third motion assembly is slidably arranged on the motion mounting plate of the second motion assembly through a third motion sliding rail, and the third motion sliding rail is parallel to the z-axis direction; the motion driving assembly of the third motion assembly is arranged on the motion mounting plate of the second motion assembly and used for driving the motion mounting plate of the third motion assembly to move along the third slide rail;
the rotating assembly is arranged on the motion mounting plate of the third motion assembly.
Optionally, the rotating assembly includes a rotation driving motor, a rotation housing and a rotating head, the rotation driving motor and the rotation housing are both disposed on the movement mounting plate of the third moving assembly, and a rotating shaft of the rotation driving motor is disposed vertically downward;
the lower extreme of rotary drive motor's pivot passes connect behind the swivel housing the rotating head, the suction nozzle set up in the lower extreme of rotating head.
Optionally, the precision chip detection apparatus further includes a first discharging device and a second discharging device, which are oppositely disposed, where the first discharging device is close to the first detection device, and the second discharging device is close to the second detection device;
the first blanking device and the second blanking device respectively comprise a blanking moving platform, a blanking driving assembly and an empty material detection camera;
the blanking mobile station is horizontally arranged on the base through a mobile slide rail, and the mobile slide rail is parallel to the y-axis direction;
the blanking driving assembly is arranged on the blanking moving table and used for driving the blanking moving table to move along the moving slide rail;
the empty material detection camera is arranged above the blanking mobile station.
(III) advantageous effects
The correcting device corrects the positions of the chips, the positioning camera is arranged above the turntable mechanism, and the positions of the chips are adjusted by the correcting installation mechanism and the turntable mechanism, and then the positions of the chips are shot and determined by the positioning camera, so that the subsequent top surface detection and positioning adsorption of the conveying mechanism are facilitated; the jacking device utilizes the upward jacking force of the ejector pin to separate the chip from the film, so that the conveying mechanism can adsorb and convey the chip to the detection system conveniently. The optical axis of the bottom surface detection camera is orthogonal to that of the end surface detection camera, and the chip located in the orthogonal area can simultaneously detect the end surface and the bottom surface so as to improve the detection efficiency. The rotating assembly adjusts the spatial position of the suction nozzle through the movement in the three directions of the x axis, the y axis and the z axis, so that the suction nozzle can be ensured to adsorb each chip on the turntable mechanism, the chips are conveyed to the orthogonal area of the optical axis of the bottom surface detection camera and the optical axis of the end surface detection camera through the movement in the three directions of the x axis, the y axis and the z axis, and the bottom surface and the end surface detection are carried out on the chips of which the top surface detection is finished. The suction nozzle can use the vertical line to rotate as the rotation axis, and rotatory in-process end face detection camera carries out once detection to every terminal surface of chip, improves the degree of automation that the chip detected and then has improved detection efficiency. The first detection device and the second detection device share the turntable mechanism as a storage bin, the first detection device and the second detection device operate independently from each other, end face and bottom face detection is carried out on chips which are detected and finished on the top face respectively, and detection efficiency is effectively improved.
Drawings
FIG. 1 is a schematic structural diagram of a precision chip inspection apparatus according to the present invention;
FIG. 2 is a schematic view of a part of the structure of the precision chip inspection apparatus of the present invention;
FIG. 3 is a schematic structural diagram of a calibration device of the precision chip inspection apparatus according to the present invention;
FIG. 4 is a schematic view of a part of the structure of the calibration device of the precision chip inspection apparatus of the present invention;
FIG. 5 is a schematic view of a part of the structure of the calibration device of the precision chip inspection apparatus according to the present invention;
FIG. 6 is a schematic structural diagram of a jacking device of the precision chip inspection apparatus of the present invention;
FIG. 7 is a schematic view of a part of the structure of a jacking device of the precision chip inspection apparatus of the present invention;
FIG. 8 is a schematic view of the mounting structure of the conveying mechanism of the precision chip inspection apparatus according to the present invention;
FIG. 9 is a schematic structural diagram of a conveying mechanism of the precision chip inspection apparatus according to the present invention;
FIG. 10 is a schematic structural diagram of a first unloading device of the precision chip inspection apparatus according to the present invention;
FIG. 11 is a schematic structural diagram of a fine tuning platform of the precision chip inspection apparatus according to the present invention.
[ description of reference ]
100: a base; 101: a chip;
10: positioning a camera; 20: a top surface inspection camera; 30: a bottom surface detection camera; 40: an end face detection camera;
1: a correction device; 111: a first correcting mounting plate; 112: a second correction mounting plate; 113: a first correction drive assembly; 114: a second correction drive component;
12: a turntable mechanism; 121: a turntable drive assembly; 122: rotating the disc;
13: a first hold-down mechanism; 14: a second hold-down mechanism; 131: a pressing cylinder; 132: a compression plate; 133: lifting a material block; 134: a first guide shaft; 135: a spring; 136: a second guide shaft; 137: a guide sleeve;
2: a jacking device; 22: a thimble;
211: a first jacking mounting plate; 212: a second jacking mounting plate; 213: a jacking driving component;
231: a telescopic mounting plate; 232: a telescopic drive assembly; 233: a telescopic rod; 234: a thimble guide tube; 235: a thimble mounting block; 236: a thimble guide mounting block;
31: a conveyance mechanism; 311: a suction nozzle; 312: a cross beam; 313: a first motion assembly; 314: a second motion assembly; 315: a third motion assembly;
3161: a rotary drive motor; 3162: rotating the head;
4: a first discharging device; 41: a blanking mobile station; 42: a blanking driving component; 43: placing the box; 5: a second blanking device; 501: and (5) fine tuning the platform.
Detailed Description
For the purpose of better explaining the present invention and to facilitate understanding, the present invention will be described in detail by way of specific embodiments with reference to the accompanying drawings. In which the terms "upper", "lower", etc. are used herein with reference to the orientation of fig. 1.
For a better understanding of the above-described technical solutions, exemplary embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the invention are shown in the drawings, it should be understood that the invention can be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.
As shown in fig. 1 and 2, the present invention provides a precision chip 101 inspection apparatus, which includes a base 100, a calibration device 1, a jacking device 2, and an inspection system. The correction device 1 includes a correction mounting mechanism, a turntable mechanism 12, and a positioning camera 10. The correcting installation mechanism is arranged on the base 100, and can realize the movement in the x-axis direction and the y-axis direction, so that the chip 101 placed on the turntable can be adjusted in the x-axis direction and the y-axis direction. The turntable mechanism 12 is provided on the correction mounting mechanism, the turntable mechanism 12 is rotatable about a vertical line as a rotation axis, and the turntable mechanism 12 adjusts the angle of the chip 101 on the turntable mechanism 12 by rotating. The positioning camera 10 is disposed above the turntable mechanism 12, and after the position of the chip 101 is adjusted by the correction mounting mechanism and the turntable mechanism 12, the position of each chip 101 is photographed and determined by the positioning camera 10. The jacking device 2 includes a jacking installation mechanism, a thimble 22, and a telescopic mechanism, the jacking installation mechanism is disposed on the base 100, and the jacking installation mechanism can move in the z-axis direction. The telescopic mechanism is arranged on the jacking installation mechanism, the thimble 22 is vertically arranged on the telescopic mechanism, and the thimble 22 is positioned below the turntable mechanism 12. The jacking installation mechanism drives the telescopic mechanism to move along the z-axis direction, so that the telescopic mechanism contacts the turntable mechanism 12, the telescopic mechanism drives the ejector pins 22 to extend upwards, and the chip 101 is jacked out of the film on the chip tray through the ejector pins 22. The inspection system employs a dual channel inspection system that includes a top surface inspection camera 20 and first and second inspection devices disposed opposite each other. Each of the first and second inspection devices includes a bottom surface inspection camera 30, an end surface inspection camera 40, and a conveyance mechanism 31. The top surface inspection camera 20 is disposed above the turntable mechanism 12 for performing top surface inspection on the chips 101 on the turntable. The bottom surface detection camera 30 and the end surface detection camera 40 are both arranged on the base 100, the optical axes of the bottom surface detection camera 30 and the end surface detection camera 40 are orthogonal, and the chip 101 located in the orthogonal area can simultaneously detect the end surface and the bottom surface so as to improve the detection efficiency. The conveying mechanism 31 includes a rotating component and a suction nozzle 311, the rotating component is disposed on the base 100, the rotating component can move in the directions of x, y and z axes, the directions of x, y and z axes are perpendicular to each other, the suction nozzle 311 is disposed on the rotating component, the rotating component adjusts the spatial position of the suction nozzle 311 through the movement in the three directions of x, y and z axes, so as to ensure that the suction nozzle 311 can absorb each chip 101 on the turntable mechanism 12, and then the chip 101 is conveyed to the orthogonal region of the optical axes of the bottom surface detection camera 30 and the end surface detection camera 40 through the movement in the three directions of x, y and z axes, so as to perform bottom surface and end surface detection on the chip 101 whose top surface detection is completed. The suction nozzle 311 can rotate by taking a vertical line as a rotating shaft, and the end face detection camera 40 detects each end face of the chip 101 once in the rotating process, so that the automation degree of the detection of the chip 101 is improved, and the detection efficiency is further improved. The correcting device 1 corrects the position of the chip 101, and confirms and records the position of the chip 101 through the positioning camera 10, so as to facilitate the subsequent top surface detection and positioning adsorption of the conveying mechanism 31; the lifting device 2 uses the upward lifting force of the ejector pin 22 to separate the chip 101 from the film, so that the conveying mechanism 31 can adsorb and convey the chip into the detection system. The first detection device and the second detection device share the turntable mechanism 12 as a storage bin, the first detection device and the second detection device operate independently, and end face detection and bottom face detection are respectively carried out on the chip 101 with the top face detection completed, so that the detection efficiency is effectively improved.
As shown in fig. 3, the correcting mounting mechanism includes a first correcting mounting plate 111, a second correcting mounting plate 112, a first correcting driving component 113, and a second correcting driving component 114. The first correction mounting plate 111 is slidably disposed on the base 100 through a first correction slide rail, the second correction mounting plate 112 is slidably disposed on the first correction mounting plate 111 through a second correction slide rail, the first correction slide rail is parallel to the x-axis direction, and the second correction slide rail is parallel to the y-axis direction. The first correction driving assembly 113 is arranged on the base 100, the first correction driving assembly 113 comprises a motor and a screw rod assembly, a sliding block of the screw rod assembly is connected with the first correction mounting plate 111, a rotating shaft of the motor is connected with a screw rod of the screw rod assembly, and the motor drives the screw rod to rotate so as to drive the first correction mounting plate 111 to move along a first correction sliding rail. The second correction driving element 114 is disposed on the first correction mounting plate 111, and the structure of the second correction driving element 114 is the same as that of the first correction driving element 113, so as to drive the second correction mounting plate 112 to move along the second correction sliding rail. The turntable mechanism 12 is disposed on the second correcting mounting plate 112, and the horizontal position of the turntable mechanism 12 is adjusted by the correcting mounting mechanism to match the operation of other devices and mechanisms. The chip tray with the chips 101 is manually placed on the rotating tray 122, the placed chips 101 are photographed by the positioning camera 10, the position difference is determined, and the chips 101 are horizontally adjusted by the correction mounting mechanism to be positioned at the preset position.
As shown in fig. 4, the turntable mechanism 12 includes a turntable drive assembly 121 and a rotary disk 122. The rotating disc 122 is rotatably arranged on the second correcting mounting plate 112 through an end face bearing, the turntable driving assembly 121 is arranged on the second correcting mounting plate 112, and the turntable driving assembly 121 is used for driving the rotating disc 122 to rotate. Specifically, the turntable drive assembly 121 includes at least a motor and a gear set, and the motor drives the rotary disk 122 to rotate through the gear set. The turntable driving assembly 121 preferably includes a motor, a timing belt, a plurality of timing wheels, and a gear set, wherein the motor drives a driving gear of the gear set to rotate through the timing belt, and drives the rotary plate 122 to rotate through a driven gear. A first circular through hole is formed in the rotating disc 122, a second circular through hole is formed in the second correcting and installing plate 112, and the central axes of the first circular through hole and the second circular through hole are collinear with the rotation axis of the rotating disc 122. The thimble 22 is located below the second through hole, and the top end of the thimble 22 faces upward. The chip tray with the chips 101 is placed on the rotary plate 122, the bottom of the chip tray is placed above the first circular through hole, the position of the chip 101 is adjusted by the aligning and mounting mechanism, so that each chip 101 is sequentially positioned above the ejector pins 22, and the chips 101 are sequentially ejected from the film of the chip tray by the ejector mechanism. The positioning camera 10 is located above the rotating disc 122, the lens of the positioning camera 10 faces downwards, the positions of the chips 101 are shot, the shot pictures are sent to the control system, the positions of the chips 101 are labeled and recorded through the control system, and the chips 101 with the defects detected are recorded in the form of labels.
As shown in fig. 5, the correcting device 1 further includes a first pressing mechanism 13 and a second pressing mechanism 14 which are oppositely disposed. Each of the first pressing mechanism 13 and the second pressing mechanism 14 includes a pressing cylinder 131, a pressing plate 132, and a lifter block 133. The pressing cylinder 131 is arranged on the second correcting and mounting plate 112, and a piston rod of the first pressing cylinder 131 is arranged vertically upwards. The pressing plate 132 is horizontally disposed on the piston rod of the pressing cylinder 131, and when the piston rod of the pressing cylinder 131 retracts, the lower surface of the pressing plate 132 can abut against the edge of the upper surface of the rotating disc 122. The lifter block 133 is disposed on the lower surface of the pressing plate 132. The edge of the chip tray placed on the rotary tray 122 is located between the material lifting block 133 and the pressing plate 132, the chip tray is fixed on the rotary tray 122 through the pressing plate 132 during detection, the chip tray is lifted through the material lifting block 133 after detection is finished, and then the chip tray is replaced manually. The pressing plate 132 of the first pressing mechanism 13 and the pressing plate 132 of the second pressing mechanism 14 are point-symmetric about the symmetric center of the rotating disc 122, and respectively clamp or lift two symmetric positions of the chip tray, so that the chip tray is prevented from moving due to unbalanced stress, and stability is improved.
As shown in fig. 6, each of the first pressing mechanism 13 and the second pressing mechanism 14 further includes a pull rod assembly and a plurality of guide assemblies. The pull rod assembly comprises a first guide shaft 134 and a spring 135, the first guide shaft 134 is vertically arranged on the lower surface of the pressing plate 132, the spring 135 is sleeved on the first guide shaft 134, the lower end of the spring 135 is connected with the second correction mounting plate 112 through a connecting block, and the second end of the spring 135 is connected with the pressing plate 132. The pressing plate 132 is tensioned and abutted on the rotary disk 122 by a spring 135 to fix the chip tray, and the piston rod of the air cylinder is moved upward against the tension of the spring 135 to release the chip tray when being extended. The guide assembly comprises a second guide shaft 136 and a guide sleeve 137, the second guide shaft 136 is vertically arranged on the lower surface of the pressing plate 132, the guide sleeve 137 is vertically arranged on a connecting block arranged on the second correcting mounting plate 112, and the second guide shaft 136 is slidably sleeved in the guide sleeve 137. The pressure strip 132 is positioned through a plurality of guide assemblies, the pressure strip 132 is prevented from shaking left and right, the pressure strip 132 is guaranteed to move vertically in a linear mode, and the stability of the pressure strip 132 is improved.
As shown in fig. 7, the retractable mechanism includes a retractable mounting plate 231, a retractable driving assembly 232, a retractable rod 233, a needle guide 234, and a needle mounting block 235. The telescopic installation plate 231 is arranged on the jacking installation mechanism, and the telescopic installation plate 231 is driven to move up and down through the jacking installation mechanism. Thimble guide pipe 234 is disposed on telescopic installation plate 231, and thimble guide pipe 234 is provided with a through hole, and thimble guide pipe 234 is connected to the vacuum generator through the through hole. Thimble installation piece 235 sets up on flexible installation version 231 through flexible slide rail is sliding, and thimble installation piece 235 is connected to the first end of telescopic link 233, and thimble installation piece 235 still plays the stabilizing effect to the first end of telescopic link 233, guarantees that the first end of telescopic link 233 can only follow flexible slide rail motion. The second end of the telescopic rod 233 is connected to the thimble 22 through a thimble guide mounting block 236, the telescopic rod 233 is slidably sleeved in the thimble guide tube 234, and the telescopic rod 233 can position the thimble 22 in the thimble guide tube 234. The thimble guide mounting block 236 is slidably connected to the inner wall of the thimble guide tube 234 to prevent the second end of the telescopic rod 233 from shaking during movement, and the telescopic slide rail is used to limit the first end of the telescopic rod 233, so as to effectively improve the movement stability of the thimble 22. The telescopic slide rail and the telescopic rod 233 are both parallel to the z-axis direction. A sealing ring is arranged between the telescopic rod 233 and the ejector pin guide pipe 234, a vacuum generator inputs vacuum to the ejector pin guide pipe 234, the top end of the guide end of the ejector pin 22 contacts the lower surface of the chip tray and adsorbs the chip tray, and the chip 101 is jacked upwards through the ejector pin 22 without driving the chip tray. The telescopic driving assembly 232 is arranged on the telescopic installation plate 231, the telescopic driving assembly 232 comprises a screw rod assembly of a motor, the motor drives a screw rod of the screw rod assembly to rotate, a sliding block of the screw rod assembly is connected with the ejector pin installation block 235, the ejector pin installation block 235 can only do linear motion along the telescopic slide rail under the limitation of the telescopic slide rail, so that the telescopic rod 233 on the ejector pin assembly is driven to move in the z-axis direction, and the chip 101 is jacked up to be separated from a film through the ejector pin 22 during upward motion.
As shown in fig. 8, the jacking mounting mechanism includes a first jacking mounting plate 211, a second jacking mounting plate 212, and a jacking driving assembly 213. First jacking mounting panel 211 sets up on base 100, and second jacking mounting panel 212 slides through the jacking slide rail and sets up on first jacking mounting panel 211, and the jacking slide rail is parallel with the z axle direction.
Jacking drive assembly 213 sets up on first jacking mounting panel 211, jacking drive assembly 213 includes motor and lead screw subassembly, the motor is connected with the lead screw of lead screw subassembly, second jacking mounting panel 212 is connected with the slider of lead screw subassembly, drive second jacking mounting panel 212 along the motion of jacking slide rail, flexible installation version 231 sets up on second jacking mounting panel 212, flexible installation version 231 moves along with second jacking mounting panel 212, thereby drive telescopic machanism and move in the z axle direction.
As shown in fig. 9, the transport mechanism 31 further includes a beam 312, and a first motion assembly 313, a second motion assembly 314, and a third motion assembly 315, wherein the beam 312 is disposed on the base 100 through a column, and the beam 312 is parallel to the x-axis direction. The first 313, second 314 and third 315 motion assemblies each include a motion mounting plate and motion drive assemblies, each of which is a conventional motor and screw assembly or motor and gear set combination. The motion mounting plate of the first motion assembly 313 is slidably disposed on the cross beam 312 through a first motion sliding rail, and the first motion sliding rail is parallel to the x-axis direction; the motion driving assembly of the first motion assembly 313 is disposed on the motion mounting plate of the first motion assembly 313, and is configured to drive the motion mounting plate of the first motion assembly 313 to move along the first sliding rail. The motion mounting plate of the second motion assembly 314 is slidably disposed on the motion mounting plate of the first motion assembly 313 through a second motion sliding rail, and the second motion sliding rail is parallel to the y-axis direction; the motion driving assembly of the second motion assembly 314 is disposed on the motion mounting plate of the first motion assembly 313, and is configured to drive the motion mounting plate of the second motion assembly 314 to move along the second sliding rail. The motion mounting plate of the third motion assembly 315 is slidably disposed on the motion mounting plate of the second motion assembly 314 through a third motion sliding rail, which is parallel to the z-axis direction; the motion driving assembly of the third motion assembly 315 is disposed on the motion mounting plate of the second motion assembly 314, and is configured to drive the motion mounting plate of the third motion assembly 315 to move along the third sliding rail. The rotating assembly is disposed on the motion mounting plate of the third motion assembly 315, and the spatial position of the rotating assembly is controlled by the first motion assembly 313, the second motion assembly 314 and the third motion assembly 315, so that the suction nozzle 311 on the rotating assembly can correspondingly suck each chip 101 on the rotating disc 122 and convey the chip 101 to the inspection camera for defect inspection.
Preferably, the rotating assembly includes a rotating driving motor 3161, a rotating housing, and a rotating head 3162, the rotating driving motor 3161 and the rotating housing are both disposed on the moving mounting plate of the third moving assembly 315, and a rotating shaft of the rotating driving motor 3161 is disposed vertically downward. The lower end of the rotation shaft of the rotation driving motor 3161 is connected to the rotation head 3162 after passing through the rotation housing, the suction nozzle 311 is disposed at the lower end of the rotation head 3162, and the suction nozzle 311 can independently open vacuum for sucking the chip 101. The rotary driving motor 3161 drives the suction nozzle 311 to rotate through the rotary head 3162, thereby rotating the chip 101, and the end surface detection camera 40 sequentially detects the end surfaces of the chip 101.
As shown in fig. 10, the precision chip 101 inspection apparatus further includes a first blanking device 4 and a second blanking device 5 which are oppositely disposed. The first discharging device 4 is close to the first detection device and used for placing the chip 101 which is detected by the first detection device; the second blanking device 5 is close to the second detection device and is used for placing the chip 101 which is detected by the second detection device. The first blanking device 4 and the second blanking device 5 each include a blanking moving table 41, a blanking driving assembly 42, and an empty material detection camera. The blanking moving table 41 is horizontally disposed on the base 100 by a moving slide rail, which is parallel to the y-axis direction. The blanking driving assembly 42 is disposed on the blanking moving stage 41, the blanking driving assembly 42 includes a motor and a screw rod assembly, and the motor drives the blanking moving stage 41 to move along the moving slide rail through the screw rod assembly. The empty containing box 43 for storing the chips 101 is manually placed on the discharging moving table 41, and the chips 101 subjected to the detection are placed in the containing box 43 by the conveying mechanism 31. The empty material detection camera is disposed above the blanking moving table 41, and detects whether each placement area in the containing box 43 is empty or not by the empty material detection camera. Preferably, as shown in fig. 11, a fine adjustment platform 501 is installed on the base of each camera, and an adjustment micrometer is disposed on the fine adjustment platform 501 to perform fine adjustment on the position of the camera. Blanking: firstly, the empty material detection camera takes a picture of the containing box 43 to judge, whether the containing box 43 is initially an empty box is detected, a signal is given, and the empty box is determined. After the detection is completed, the chip 101 is transported by the transport mechanism 31, the spatial position of the chip is adjusted, the chip 101 is finally placed at the target position on the containing box 43, and the chip 101 is placed in different containing boxes 43 to be distinguished by combining the judgment results given by all the cameras in the front. After the box is loaded, the empty material detection camera is required to photograph the containing box 43 on the blanking moving platform 41 before taking away, whether the box is full is judged, and a signal is given. After all the determinations are completed, the containing box 43 containing the chips 101 is taken away, and the final work flow is realized.
The correcting device 1 corrects the position of the chip 101, the positioning camera 10 is arranged above the turntable mechanism 12, and after the position of the chip 101 is adjusted by the correcting installation mechanism and the turntable mechanism 12, the positioning camera 10 shoots and determines the position of each chip 101, so that the subsequent top surface detection and positioning adsorption of the conveying mechanism 31 are facilitated; the lifting device 2 uses the upward lifting force of the ejector pin 22 to separate the chip 101 from the film, so that the conveying mechanism 31 can adsorb and convey the chip into the detection system. The bottom surface detection camera 30 is orthogonal to the optical axis of the end surface detection camera 40, and the chip 101 located in the orthogonal region can simultaneously perform end surface detection and bottom surface detection to improve detection efficiency. The rotating assembly adjusts the spatial position of the suction nozzle 311 through the movement in the three directions of the x-axis, the y-axis and the z-axis, so as to ensure that the suction nozzle 311 can be attached to each chip 101 on the turntable mechanism 12, and then the chip 101 is transported to the orthogonal area of the optical axes of the bottom surface detection camera 30 and the end surface detection camera 40 through the movement in the three directions of the x-axis, the y-axis and the z-axis, so as to perform bottom surface and end surface detection on the chip 101 whose top surface detection is completed. The suction nozzle 311 can rotate by taking a vertical line as a rotating shaft, and the end face detection camera 40 detects each end face of the chip 101 once in the rotating process, so that the automation degree of the detection of the chip 101 is improved, and the detection efficiency is further improved. The first detection device and the second detection device share the turntable mechanism 12 as a storage bin, the first detection device and the second detection device operate independently, and end face detection and bottom face detection are respectively carried out on the chip 101 with the top face detection completed, so that the detection efficiency is effectively improved.
In the description of the present invention, it is to be understood that the terms "first", "second" and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implying any number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically defined otherwise.
In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium; either as communication within the two elements or as an interactive relationship of the two elements. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
In the present invention, unless otherwise expressly stated or limited, a first feature may be "on" or "under" a second feature, and the first and second features may be in direct contact, or the first and second features may be in indirect contact via an intermediate. Also, a first feature "on," "above," and "over" a second feature may be directly or obliquely above the second feature, or simply mean that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the second feature, or may simply mean that the first feature is at a lower level than the second feature.
In the description herein, the description of the terms "one embodiment," "some embodiments," "an embodiment," "an example," "a specific example" or "some examples" or the like, means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.
Although embodiments of the present invention have been shown and described above, it should be understood that the above embodiments are illustrative and not restrictive, and that those skilled in the art may make changes, modifications, substitutions and alterations to the above embodiments without departing from the scope of the present invention.