阅读说明：本技术 一种用于形变测量的散斑制作工具及方法 (speckle manufacturing tool and method for deformation measurement ) 是由 梁建峰 陈灿荣 林隽颖 于 2019-09-27 设计创作，主要内容包括：本发明公开了一种用于形变测量的散斑制作工具及方法。该工具包括光源组件、掩膜板、底板、竖直支撑杆、升降组件和第一喷涂组件,其中光源组件、掩膜板连接于升降组件,掩膜板安装于光源组件的下方,底板安装于掩膜板的下方,所述升降组件在竖直支撑杆上,且位置可上下调节,第一喷涂组件用于对试件喷涂光刻胶。该方法通过使用上述的散斑制作工具制作散斑。通过使用本方法的工具及方法,可以使得制作出的散斑排除人为因素所造成的不良影响,提高散斑的制作良品率。同时制作的散斑不会改变试件的应变分布,保证了将该散斑应用于数字图像相关技术测量时的测量精度和分析结果的准确性。本发明可广泛应用于材料分析技术领域内。(the invention discloses a speckle manufacturing tool and a speckle manufacturing method for deformation measurement. The tool comprises a light source assembly, a mask plate, a bottom plate, a vertical supporting rod, a lifting assembly and a first spraying assembly, wherein the light source assembly and the mask plate are connected to the lifting assembly, the mask plate is installed below the light source assembly, the bottom plate is installed below the mask plate, the lifting assembly is arranged on the vertical supporting rod, the position of the lifting assembly can be adjusted up and down, and the first spraying assembly is used for spraying photoresist on a test piece. The method creates speckle by using the speckle creation tool described above. By using the tool and the method of the method, the manufactured speckles can eliminate the adverse effect caused by human factors, and the manufacturing yield of the speckles is improved. Meanwhile, the manufactured speckles do not change the strain distribution of the test piece, and the measurement precision and the accuracy of an analysis result when the speckles are applied to the digital image correlation technique measurement are ensured. The invention can be widely applied to the technical field of material analysis.)

1. a speckle fabrication tool for deformation measurement, comprising: the device comprises a light source assembly, a mask plate, a bottom plate, a vertical supporting rod, a lifting assembly and a first spraying assembly;

The utility model discloses a test piece, including light source subassembly, mask plate, bottom plate, vertical support rod, lifting unit, first spraying subassembly, the light source subassembly, mask plate are connected in lifting unit, mask plate installs in the below of light source subassembly, the bottom plate is installed in the below of mask plate, the bottom plate is used for placing the test piece, vertical support rod sets up on the bottom plate, lifting unit installs on vertical support rod, just lifting unit can adjust from top to bottom in the position on vertical support rod, first spraying subassembly is used for.

2. A speckle fabrication tool for deformation measurement according to claim 1, wherein:

the light source component comprises a collimation beam expanding lens and a light-emitting device;

the light-emitting device is arranged at a light beam inlet of the collimation and beam expansion lens, and the mask plate is arranged below the light beam outlet of the collimation and beam expansion lens.

3. A speckle fabrication tool for deformation measurement according to claim 2, further comprising: the lens assembly is connected with the lifting assembly, is arranged between the mask plate and the bottom plate and comprises a concave/convex spherical lens and a concave/convex aspheric lens.

4. A speckle fabrication tool for deformation measurement according to claim 3, further comprising: and the second spraying component is used for spraying the primer to the test piece.

5. A speckle producing method for deformation measurement for producing speckles by the speckle producing tool according to claim 4,

The method is characterized by comprising the following steps:

Placing a test piece on the bottom plate and starting a light source assembly;

Adjusting the lens assembly and the lifting assembly to enable an image formed by light rays penetrating through the mask plate to be overlapped with a preset measuring area on the test piece;

spraying photoresist on a preset measuring area on the test piece;

When the preset time is reached after the photoresist is sprayed, closing the light source assembly;

And taking out the test piece from the bottom plate, and cleaning the uncured photoresist on the test piece.

6. A speckle manufacturing method for deformation measurement according to claim 5, characterized in that: the step of adjusting the lens assembly and the lifting assembly to enable the image formed by the light ray penetrating through the mask plate to coincide with the preset measuring area on the test piece specifically comprises the following steps:

when the image fails to cover a preset measuring area on the test piece, adjusting the lens assembly to be in a concave lens effect;

and when the image completely exceeds the preset measuring area on the test piece, adjusting the lens assembly into a convex lens effect.

7. A speckle manufacturing method for deformation measurement according to claim 6, characterized in that: the step of adjusting lens subassembly and lifting unit for the image that light passed through the mask plate and formed coincides with the measurement area of predetermineeing on the test piece, it still includes:

When the lens assembly has a concave lens effect and the image fails to cover the preset measuring area on the test piece, the lifting assembly is adjusted upwards to enable the image formed by the light ray penetrating through the mask plate to coincide with the preset measuring area on the test piece;

when the lens assembly has a concave lens effect and the image completely exceeds the preset measuring area on the test piece, the lifting assembly is adjusted downwards to enable the image formed by the light rays penetrating through the mask plate to be overlapped with the preset measuring area on the test piece;

when the lens assembly has a convex lens effect and the image fails to cover the preset measuring area on the test piece, the lifting assembly is adjusted downwards to enable the image formed by the light rays penetrating through the mask plate to coincide with the preset measuring area on the test piece;

When the lens assembly has a convex lens effect and the image completely exceeds the preset measuring area on the test piece, the lifting assembly is adjusted upwards to enable the image formed by the light penetrating through the mask plate to coincide with the preset measuring area on the test piece.

8. A speckle manufacturing method for deformation measurement according to any one of claims 5-7, further comprising the steps of: and adjusting the position of the test piece on the base plate to enable the image formed by the light penetrating through the mask plate to coincide with the preset measuring area on the test piece.

9. A speckle manufacturing method for deformation measurement according to claim 5, characterized in that: before the step of spraying the photoresist on the preset measuring area on the test piece, the method further comprises the following steps: and spraying primer on a preset measuring area on the test piece.

Technical Field

the invention relates to the technical field of material analysis, in particular to a speckle manufacturing tool and a speckle manufacturing method for deformation measurement.

background

with the development of technologies such as computer science and Image recognition, a new method for analyzing material strain by using images, namely a Digital Image Correlation (DIC), has attracted wide attention and application. According to the method, the deformation information of the region of interest is obtained through two digital images before and after the deformation of the test piece in combination with a correlation algorithm, so that the results of mechanical elasticity and the like of the material are obtained through analysis, the requirements on the experimental environment are very loose, and the method has the advantages of full-field measurement, strong anti-interference capability, high measurement precision and the like.

When the digital image correlation technology is applied, speckles with certain characteristics need to be coated on a test piece in advance, and the whole-field strain and deformation are analyzed by acquiring the speckle images of the test piece at all deformation stages in real time. The manufacturing scheme of speckles in the prior art comprises a traditional manual spraying method and a laser burning method, wherein the manual spraying method comprises the steps of spraying a layer of white primer on the surface of a test piece, and then spraying a layer of discrete and uneven black speckles on the primer by a manual control method. The laser burning method is to burn black characteristic points on the surface of a test piece by using a laser with a small light beam, and the manufacturing method can damage the surface of the test piece during burning, so that the strain distribution of the test piece can be changed, and the measurement precision and the accuracy of an analysis result can be influenced. In the prior art, no good technical scheme is available for effectively solving the disadvantages of the manufacturing method.

disclosure of Invention

The present invention is directed to solving at least one of the problems of the prior art. Therefore, the speckle manufacturing tool and the speckle manufacturing method for deformation measurement provided by the embodiment of the invention can eliminate adverse effects caused by human factors when the speckles are manufactured, improve the yield of the manufactured speckles, simultaneously have no adverse effect on the surface of a test piece, and ensure the measurement precision and the accuracy of an analysis result when the speckles are applied to digital image correlation technique measurement.

The technical scheme adopted by the embodiment of the invention is as follows:

in a first aspect, an embodiment of the present invention provides a speckle making tool for deformation measurement, including: the device comprises a light source assembly, a mask plate, a bottom plate, a vertical supporting rod, a lifting assembly and a first spraying assembly;

The utility model discloses a test piece, including light source subassembly, mask plate, bottom plate, vertical support rod, lifting unit, first spraying subassembly, the light source subassembly, mask plate are connected in lifting unit, mask plate installs in the below of light source subassembly, the bottom plate is installed in the below of mask plate, the bottom plate is used for placing the test piece, vertical support rod sets up on the bottom plate, lifting unit installs on vertical support rod, just lifting unit can adjust from top to bottom in the position on vertical support rod, first spraying subassembly is used for.

further, the light source assembly comprises a collimating beam expander and a light emitting device;

The light-emitting device is arranged at a light beam inlet of the collimation and beam expansion lens, and the mask plate is arranged below the light beam outlet of the collimation and beam expansion lens.

further, still include: the lens assembly is connected with the lifting assembly, is arranged between the mask plate and the bottom plate and comprises a concave/convex spherical lens and a concave/convex aspheric lens.

Further, still include: and the second spraying component is used for spraying the primer to the test piece.

in a second aspect, an embodiment of the present invention provides a speckle manufacturing method for deformation measurement, which is used for manufacturing speckles by using the speckle manufacturing tool, and includes the following steps:

Placing a test piece on the bottom plate and starting a light source assembly;

Adjusting the lens assembly and the lifting assembly to enable an image formed by light rays penetrating through the mask plate to be overlapped with a preset measuring area on the test piece;

spraying photoresist on a preset measuring area on the test piece;

when the preset time is reached after the photoresist is sprayed, closing the light source assembly;

And taking out the test piece from the bottom plate, and cleaning the uncured photoresist on the test piece.

Further, adjust lens subassembly and lifting unit spare for the image that light passed through the mask plate and formed coincides with the measurement area of predetermineeing on the test piece this step, it specifically includes:

When the image fails to cover a preset measuring area on the test piece, adjusting the lens assembly to be in a concave lens effect;

And when the image completely exceeds the preset measuring area on the test piece, adjusting the lens assembly into a convex lens effect.

further, the step of adjusting lens subassembly and lifting unit for the image that light passed through the mask plate and formed coincides with the measurement area of predetermineeing on the test piece still includes:

when the lens assembly has a concave lens effect and the image fails to cover the preset measuring area on the test piece, the lifting assembly is adjusted upwards to enable the image formed by the light ray penetrating through the mask plate to coincide with the preset measuring area on the test piece;

when the lens assembly has a concave lens effect and the image completely exceeds the preset measuring area on the test piece, the lifting assembly is adjusted downwards to enable the image formed by the light rays penetrating through the mask plate to be overlapped with the preset measuring area on the test piece;

when the lens assembly has a convex lens effect and the image fails to cover the preset measuring area on the test piece, the lifting assembly is adjusted downwards to enable the image formed by the light rays penetrating through the mask plate to coincide with the preset measuring area on the test piece;

When the lens assembly has a convex lens effect and the image completely exceeds the preset measuring area on the test piece, the lifting assembly is adjusted upwards to enable the image formed by the light penetrating through the mask plate to coincide with the preset measuring area on the test piece.

further, the method also comprises the following steps: and adjusting the position of the test piece on the base plate to enable the image formed by the light penetrating through the mask plate to coincide with the preset measuring area on the test piece.

further, before the step of spraying the photoresist on the preset measuring area on the test piece, the method further comprises the following steps: and spraying primer on a preset measuring area on the test piece.

advantages and benefits of the present invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention: by using the speckle manufacturing tool and the speckle manufacturing method, the manufactured speckles can eliminate adverse effects caused by human factors, and the manufacturing yield of the speckles is improved. The manufacturing method can not cause adverse effect on the surface of the test piece, can ensure that the manufactured speckles can not change the strain distribution of the test piece, and simultaneously ensures the measurement precision and the accuracy of an analysis result when the speckles are used for carrying out digital image correlation technique measurement. In addition, the speckles manufactured by the method are stably adhered to the test piece and are not easy to fall off, the whole speckle manufacturing and forming process is very quick, and the manufacturing time of the speckles can be greatly saved.

Drawings

FIG. 1 is a schematic structural diagram of a speckle manufacturing tool for deformation measurement according to an embodiment of the present invention;

FIG. 2 is a schematic structural diagram of a mask of a speckle manufacturing tool for deformation measurement according to an embodiment of the present invention;

Fig. 3 is a flow chart of a speckle manufacturing method for deformation measurement according to an embodiment of the present invention.

Reference numerals: 1. a light source assembly; 2. a mask plate; 3. a test piece; 4. a collimating beam expander; 5. a light emitting device; 6. a lens assembly; 7. a base plate; 8. a vertical support bar; 9. a first cross bar; 10. a second cross bar; 11. a third cross bar; 12. a lifting assembly; 13. a slide block.

Detailed Description

The invention is described in further detail below with reference to the figures and the specific embodiments. The step numbers in the following embodiments are provided only for convenience of illustration, the order between the steps is not limited at all, and the execution order of each step in the embodiments can be adapted according to the understanding of those skilled in the art.

referring to fig. 1, an embodiment of the present invention provides a speckle making tool for deformation measurement, including: the device comprises a light source assembly 1, a mask plate 2, a bottom plate 7, a vertical supporting rod 8, a lifting assembly 12 and a first spraying assembly;

Light source subassembly 1, mask plate 2 are connected in lifting unit 12, mask plate 2 is installed in the below of light source subassembly 1, bottom plate 7 is installed in the below of mask plate 2, bottom plate 7 is used for placing test piece 3, vertical support bar 8 sets up on bottom plate 7, lifting unit 12 is connected with vertical support bar 8 just lifting unit 12 can slide from top to bottom at vertical support bar, first spraying subassembly is used for spraying the photoetching glue to test piece 3.

in the embodiment of the invention, a tool for manufacturing speckles on a test piece 3 based on photoresist characteristics is provided, the speckles can be applied to the material analysis technology such as DIC (digital computer), the test piece 3 is made of a material which needs to be subjected to strain measurement and analysis, and particularly, the test piece 3 can be made into a flat plate shape for facilitating material analysis and speckle manufacturing. The tool comprises a light source assembly 1, a mask plate 2, a bottom plate 7, a vertical supporting rod 8, a lifting assembly 12 and a first spraying assembly. The first spraying assembly is used for spraying photoresist on the test piece 3, and the color of the photoresist and the color of the test piece 3 have obvious distinguishing degree, so that the speckle manufactured subsequently is suitable for image analysis. Specifically, when the test piece 3 itself is white, a black UV adhesive T-9508 may be selected. The mask 2 is installed below the light source assembly 1, and referring to fig. 2, a plurality of discrete and irregularly distributed holes are formed in the mask (the black part in fig. 2 is a hole), and it should be understood that the specific shape and number of the holes of each mask can be freely set according to actual needs. The mask plate 2 is used for enabling a light source emitted by the light source component 1 to penetrate through the hole to irradiate the test piece 3, so that a certain illumination pattern is formed on the test piece 3, and the photoresist part sprayed on the test piece 3 in advance is solidified due to irradiation of the light source and is adhered to the test piece 3; the photoresist which is not irradiated by the light source can not be solidified, and can be removed by simple cleaning after the light source assembly 1 is closed, so that an ideal speckle pattern can be obtained on the test piece 3. The light source assembly 1 and the photoresist should be selected to be corresponding, for example, when the ultraviolet light source is selected, the photoresist should also be selected to be a photoresist sensitive to ultraviolet light, and specifically, the light source assembly 1 may include, but is not limited to, the following modes: light sources such as ultraviolet light, excimer laser, electron beam, ion beam, and X-ray; the selected types of photoresist may include: ultraviolet photoresist, deep ultraviolet photoresist, extreme ultraviolet photoresist, electron beam photoresist, ion beam photoresist, and X-ray photoresist. The photoresists with different exposure wavelengths have different applicable photoetching limit resolutions, and generally, the smaller the exposure wavelength is, the better the processing resolution is, and the better the speckle effect of the manufactured test piece 3 is. The speckle pattern is determined by the mask 2 which is manufactured in advance because the finally formed speckles are the photoresist which is solidified on the surface of the test piece 3 and the solidification condition of the photoresist is formed based on the holes of the mask 2. Therefore, the speckles manufactured by the speckle manufacturing tool in the embodiment of the invention eliminate the influence caused by human factors, and the yield of manufacturing the speckles is greatly improved.

in the embodiment of the invention, a bottom plate 7 for placing a test piece 3 is arranged below the mask plate 2, a vertical support rod 8 is arranged on one side of the bottom plate 7, the light source assembly 1 and the mask plate 2 are connected to a lifting assembly 12, the lifting assembly 12 comprises a sliding block 13, a first cross rod 9, a second cross rod 10 and a third cross rod 11, wherein the first cross rod 9 is used for fixing the light source assembly 1, the second cross rod 10 is used for fixing the mask plate 2, the third cross rod 11 is used for fixing the lens assembly 6, and the first cross rod 9, the second cross rod 10 and the third cross rod 11 are all connected to the sliding block 13. The slide block 13 is installed on the vertical support bar 8, and the position thereof can be adjusted up and down on the vertical support bar 8, and also can be fixed at a certain position on the vertical support bar 8. Specifically, the connection mode of the sliding block 13 and the vertical support rod 8 can adopt any adjustable mode such as a sliding rail, a bolt detachable connection and the like. The structure makes the invention more convenient and faster when in use, and the lifting component 12 can be flexibly adjusted up and down to ensure that the emitted light source can be completely mapped on the test piece 3.

further as a preferred embodiment, the light source assembly 1 comprises a collimating beam expander 4 and a light emitting device 5;

the light emitting device 5 is installed at a light beam inlet of the collimation and beam expansion lens 4, and the mask plate 2 is installed below a light beam outlet of the collimation and beam expansion lens 4.

In the embodiment of the invention, in order to make the light source emitted by the light source assembly 1 have an even effect when reaching the surface of the test piece 3, the adopted light source assembly 1 comprises a collimation beam expander 4 and a light-emitting device 5. Light emitting device 5 installs in collimation beam expander lens 4's light beam entrance, and collimation beam expander lens 4 expands the beam and the collimation to the light source of light emitting device 5 transmission, shines the light beam that originally is focus state transmission promptly on mask plate 2 with the form of parallel light with the pointolite. Therefore, the photo-resist on each position of the test piece 3 can receive light more uniformly, and the finally obtained speckle effect is better.

Further, as a preferred embodiment, the method further comprises: and the lens assembly 6 is connected to the lifting assembly 12, the lens assembly 6 is arranged between the mask plate 2 and the bottom plate 7, and the lens assembly 6 comprises a concave/convex spherical lens and a concave/convex aspheric lens.

in the embodiment of the invention, the lens assembly 6 is additionally arranged below the mask plate 2, and the lens assembly 6 is connected to the sliding block 13 through the third cross rod 11. The lens assembly 6 is used for adjusting the size of the pattern of the mask plate 2 irradiated on the test piece 3, and specifically, when the test piece 3 is small, the lens assembly 6 can adopt a convex lens to focus the pattern of the mask plate 2 on the test piece 3; when the test piece 3 is large, the lens assembly 6 can adopt a concave lens to disperse the pattern of the mask plate 2 onto the test piece 3. The arrangement of the lens assembly 6 can greatly improve the flexibility of the speckle manufacturing method, the speckle manufacturing method can be suitable for test pieces 3 of various sizes without changing a mask plate, meanwhile, the operation is very simple when the speckle manufacturing method is used, and only a proper lens is needed to be selected, and the position of the lens is adjusted up and down, so that a speckle pattern can be completely projected and overlapped with an area to be manufactured on the test piece 3. It should be understood here that, in the case of too large or too small surface of the test piece 3, when the lens assembly 6 cannot be used to complete the operation effectively, the mask 2 should be replaced to ensure the manufacturing effect.

Further, as a preferred embodiment, the method further comprises: and the second spraying component is used for spraying primer to the test piece 3.

in the embodiment of the invention, the second spraying component is additionally arranged, the primer can be sprayed on the test piece 3, the surface color of the test piece 3 is rich, or the test piece 3 and speckles can be distinguished more easily, a layer of primer can be sprayed before the photoresist is sprayed on the test piece 3, similarly, the color of the primer and the photoresist have a clear distinction degree, and specifically, when T-9508 black UV photoresist is adopted, white primer can be selected as the spraying material of the second spraying component.

referring to fig. 3, an embodiment of the present invention provides a speckle manufacturing method for deformation measurement, including the following steps:

s1: placing a test piece on the bottom plate and starting a light source assembly;

S2: adjusting the lens assembly and the lifting assembly to enable an image formed by light rays penetrating through the mask plate to be overlapped with a preset measuring area on the test piece;

S3: spraying photoresist on a preset measuring area on the test piece;

S4: when the preset time is reached after the photoresist is sprayed, closing the light source assembly;

S5: and taking out the test piece from the bottom plate, and cleaning the uncured photoresist on the test piece.

In the embodiment of the invention, the speckle manufacturing method for deformation measurement is provided, the method is based on the speckle manufacturing tool for deformation measurement, the speckle can be manufactured through the tool, and the speckle can be applied to material analysis technologies such as DIC and the like. In the embodiment of the method, a test piece needing material analysis and strain measurement is obtained, and an interested analysis measurement area is determined on the test piece and is used as a preset measurement area, so that the preset measurement area is a speckle area needing to be manufactured on the test piece at this time. The test piece is placed on a bottom plate of the speckle manufacturing tool, the light source assembly is started, light rays emitted by the light source assembly form parallel light beams after being expanded and collimated to irradiate the mask plate, and due to the fact that a plurality of discrete holes and irregularly distributed holes exist in the mask plate and the mask plate is not transparent except for other parts of the holes, light rays penetrating through the holes of the mask plate form illumination images corresponding to the hole patterns of the mask plate on the test piece. By adjusting the lens assembly and the lifting assembly of the speckle manufacturing tool, specifically, for example, changing the type of the lens or the concave/convex degree, and lowering or raising the lifting assembly, the size of the illumination image formed by the light ray penetrating through the mask plate can be changed, and when the size of the illumination image to be adjusted is coincident with the preset measurement area on the test piece, the lifting assembly is fixed. And then spraying photoresist on a preset measuring area on the test piece, wherein the type of the photoresist should correspond to the light-emitting device in the light source assembly, for example, when the light-emitting device selects an ultraviolet light emitter, the photoresist should also be selected to be photoresist sensitive to ultraviolet light. Specifically, the light emitting devices in the light source assembly may include, but are not limited to, the following: light sources such as ultraviolet light, excimer laser, electron beam, ion beam, and X-ray; the selected types of photoresist may include: ultraviolet photoresist, deep ultraviolet photoresist, extreme ultraviolet photoresist, electron beam photoresist, ion beam photoresist, and X-ray photoresist. The photoresists with different exposure wavelengths have different applicable photoetching limit resolutions, and generally, the smaller the exposure wavelength is, the better the processing resolution is, and the better the speckle effect of the manufactured test piece is.

after the photoresist is sprayed, the photoresist on the test piece can be cured under the irradiation of the light due to the existence of the light, the photoresist is firmly attached to the surface of the test piece, the light source assembly can be closed after waiting for a preset time, the length of the preset time is determined according to the photosensitive curing property of the photoresist and the specific setting of the light-emitting device, the preset time cannot be too short, otherwise, the photoresist is possibly incompletely cured, the finally formed speckles are easy to fall off, relatively, the preset time is not too long, otherwise, the photoresist which is not illuminated is likely to be bonded due to long-term exposure, and the uncured photoresist is difficult to remove or the finally formed speckles are connected. Therefore, the length of the preset time can be flexibly adjusted according to the specific speckle manufacturing condition.

And finally, taking down the test piece from the bottom plate, cleaning the uncured photoresist through simple washing work, and obtaining the finally prepared speckles, wherein the photoresist which is irradiated by light rays, cured and attached to the surface of the test piece is the photoresist.

Further as a preferred embodiment, the step of adjusting the lens assembly and the lifting assembly to make the image formed by the light passing through the mask coincide with a preset measurement area on the test piece specifically includes:

s21: when the image fails to cover a preset measuring area on the test piece, adjusting the lens assembly to be in a concave lens effect;

s22: and when the image completely exceeds the preset measuring area on the test piece, adjusting the lens assembly into a convex lens effect.

Further as a preferred embodiment, the step of adjusting the lens assembly and the lifting assembly to make the image formed by the light passing through the mask plate coincide with a preset measurement area on the test piece further includes:

s23: when the lens assembly has a concave lens effect and the image fails to cover the preset measuring area on the test piece, the lifting assembly is adjusted upwards to enable the image formed by the light ray penetrating through the mask plate to coincide with the preset measuring area on the test piece;

S24: when the lens assembly has a concave lens effect and the image completely exceeds the preset measuring area on the test piece, the lifting assembly is adjusted downwards to enable the image formed by the light rays penetrating through the mask plate to be overlapped with the preset measuring area on the test piece;

S25: when the lens assembly has a convex lens effect and the image fails to cover the preset measuring area on the test piece, the lifting assembly is adjusted downwards to enable the image formed by the light rays penetrating through the mask plate to coincide with the preset measuring area on the test piece;

s26: when the lens assembly has a convex lens effect and the image completely exceeds the preset measuring area on the test piece, the lifting assembly is adjusted upwards to enable the image formed by the light penetrating through the mask plate to coincide with the preset measuring area on the test piece.

Further as a preferred embodiment, the method further comprises the following steps:

s6: and adjusting the position of the test piece on the base plate to enable the image formed by the light penetrating through the mask plate to coincide with the preset measuring area on the test piece.

In the embodiment of the invention, several feasible implementation means are provided for adjusting the speckle manufacturing tool and the test piece to enable the image formed by the light penetrating through the mask plate to coincide with the preset measuring area on the test piece. Specifically, to achieve the above purpose, the lens assembly and the lifting assembly of the speckle manufacturing tool may be adjusted or the position of the specimen may be directly adjusted by moving. Place the bottom plate with the test piece on, open the light source subassembly, can take out earlier this moment or dismantle the lens of placing in the lens subassembly, the purpose judges this test piece earlier and needs the lens of which kind type: when the image fails to cover the preset measurement area on the test piece, the illumination image on the test piece is over small and needs to be amplified, and the needed lens is a concave lens; when the image completely exceeds the preset measuring area on the test piece, the illumination image on the test piece is too large and needs to be reduced, and the needed lens is a convex lens. Furthermore, after the lens is replaced, due to the fact that the degree (concave-convex degree) of the lens is different, the lens cannot meet the requirement, at the moment, the lens needs to be further adjusted through the lifting assembly, when the lens assembly is in a concave lens effect, the lifting assembly is adjusted upwards, so that the image formed by the light penetrating through the mask plate is enlarged, and the lifting assembly is adjusted downwards, so that the image formed by the light penetrating through the mask plate is reduced; when the lens assembly is the convex lens effect, the upward adjustment lifting assembly can enable the image formed by the light ray penetrating through the mask plate to be reduced, the downward adjustment lifting assembly can enable the image formed by the light ray penetrating through the mask plate to be increased, and whether the adjustment meets the requirements or not is judged according to the coincidence condition of the preset measurement area on the specific image and the test piece. It should be understood that the coincidence does not mean that the size and the shape of the image formed by the light passing through the mask plate completely coincide with the size and the shape of the preset measurement area on the test piece, and the difference between the size and the shape is allowed within an acceptable error range, and in the actual speckle manufacturing process, the situation that the image formed by the light passing through the mask plate is slightly larger than and covers the preset measurement area on the test piece often occurs. That is, the method of the embodiment of the present invention provides how to adjust the relationship between the image formed by the light passing through the mask and the preset measurement area on the test piece, and the specific coincidence standard can be flexibly changed according to the actual production requirement.

Further, as a preferred embodiment, before the step of spraying the photoresist on the preset measurement area on the test piece, the method further comprises the following steps:

S7: and spraying primer on a preset measuring area on the test piece.

In the embodiment of the invention, the implementation step of spraying the primer is added, and the purpose of spraying the primer on the test piece is as follows: for the surface color condition of the test piece, or for the purpose of enabling the test piece and the speckles to be more easily distinguished, the embodiment of the invention selects to spray a layer of primer before spraying the photoresist on the test piece. Also, the color of the primer should be clearly distinguishable from the photoresist, and specifically, when a black UV resist such as T-9508 is used, a white primer may be used as the spray material.

In the description herein, references to the description of "one embodiment," "another embodiment," or "certain embodiments," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

While embodiments of the present invention have been shown and described, it will be understood by those of ordinary skill in the art that: various changes, modifications, substitutions and alterations can be made to the embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the claims and their equivalents.