阅读说明：本技术 一种信息确定方法、电子设备及计算机可读存储介质 (Information determination method, electronic equipment and computer readable storage medium ) 是由 郭金平 杨睿 王凡 杨宇翔 杨柳 袁志林 马雨虹 禤颖仪 于 2019-08-26 设计创作，主要内容包括：本发明实施例公开了一种信息确定方法,该方法包括：设置待测元件的标准角度,并基于所述标准角度获取第一波长的光针对所述待测元件的第一光功率值；获取至少一束第二波长的光针对所述待测元件的第二光功率值；其中,所述第一波长的光和所述至少一束第二波长的光在所述待测元件表面上平行排列；基于所述至少一个第二光功率值,获取所述待测元件的至少一个偏折角度；基于所述标准角度和所述至少一个偏折角度,确定所述待测元件表面平整度信息。本发明实施例同时还公开了一种电子设备及计算机可读存储介质。(the embodiment of the invention discloses an information determination method, which comprises the following steps: setting a standard angle of an element to be tested, and acquiring a first optical power value of light with a first wavelength aiming at the element to be tested based on the standard angle; acquiring a second optical power value of at least one beam of light with a second wavelength for the element to be detected; the light with the first wavelength and the at least one beam of light with the second wavelength are arranged in parallel on the surface of the element to be measured; acquiring at least one deflection angle of the element to be tested based on the at least one second optical power value; and determining the surface flatness information of the element to be tested based on the standard angle and the at least one deflection angle. The embodiment of the invention also discloses electronic equipment and a computer readable storage medium.)

1. A method of information determination, the method comprising:

Setting a standard angle of an element to be tested, and acquiring a first optical power value of light with a first wavelength aiming at the element to be tested based on the standard angle;

acquiring a second optical power value of at least one beam of light with a second wavelength for the element to be detected; the light with the first wavelength and the at least one beam of light with the second wavelength are arranged in parallel on the surface of the element to be measured;

Acquiring at least one deflection angle of the element to be tested based on the at least one second optical power value;

And determining the surface flatness information of the element to be tested based on the standard angle and the at least one deflection angle.

2. The method of claim 1, wherein setting a standard angle of the dut and obtaining a first optical power value of the dut for the first wavelength of light based on the standard angle comprises:

Acquiring a standard area of the element to be tested;

Setting a standard angle of the element to be tested based on the standard area; the standard angle represents an included angle between a first surface and a second surface corresponding to the standard area of the element to be tested;

and acquiring a first optical power value of the light with the first wavelength aiming at the standard area of the element to be tested based on the standard angle.

3. the method of claim 1, wherein obtaining at least one deflection angle of the dut based on the at least one second optical power value comprises:

acquiring a reference loss curve corresponding to the at least one beam of light with the second wavelength; the reference loss curve represents a mapping relation between the second optical power value and the deflection angle;

and acquiring at least one deflection angle of the element to be tested based on the at least one second optical power value and the reference loss curve.

4. The method of claim 3, wherein obtaining the reference loss curve corresponding to the at least one beam of light at the second wavelength comprises:

and calculating to obtain a reference loss curve corresponding to the at least one beam of light with the second wavelength based on the spot diameter and the wavelength of the at least one beam of light with the second wavelength.

5. The method of claim 1, wherein determining the flatness information of the surface of the dut based on the standard angle and the at least one deflection angle comprises:

calculating to obtain at least one reference angle of the element to be measured based on the standard angle and the at least one deflection angle;

and determining the surface flatness information of the element to be tested based on the standard angle and the at least one reference angle.

6. the method of claim 5, wherein the determining the surface flatness information of the dut based on the standard angle and the at least one reference angle comprises:

And if the reference angle is matched with the standard angle, determining that the area corresponding to the deflection angle of the surface of the element to be tested is positioned on the same horizontal plane with the standard area.

7. the method of claim 5, further comprising:

And if the reference angle is not matched with the standard angle, determining that the area corresponding to the deflection angle of the surface of the element to be tested is not in the same horizontal plane with the standard area.

8. An electronic device, characterized in that the electronic device comprises: a processor, a memory, and a communication bus;

The communication bus is used for realizing communication connection between the processor and the memory;

The processor is configured to execute a program of the information determination method stored in the memory to implement the steps of:

Setting a standard angle of an element to be tested, and acquiring a first optical power value of light with a first wavelength aiming at the element to be tested based on the standard angle;

acquiring a second optical power value of at least one beam of light with a second wavelength for the element to be detected; the light with the first wavelength and the at least one beam of light with the second wavelength are arranged in parallel on the surface of the element to be measured;

Acquiring at least one deflection angle of the element to be tested based on the at least one second optical power value;

And determining the surface flatness information of the element to be tested based on the standard angle and the at least one deflection angle.

9. the electronic device of claim 8, wherein the processor performs the steps of setting a standard angle of the device under test and obtaining a first optical power value of the light with the first wavelength for the device under test based on the standard angle, and further performs the steps of:

acquiring a standard area of the element to be tested;

setting a standard angle of the element to be tested based on the standard area; the standard angle represents an included angle between a first surface and a second surface corresponding to the standard area of the element to be tested;

and acquiring a first optical power value of the light with the first wavelength aiming at the standard area of the element to be tested based on the standard angle.

10. A computer-readable storage medium, characterized in that the computer-readable storage medium stores one or more programs which are executable by one or more processors to implement the steps of the information determination method according to any one of claims 1 to 7.

Technical Field

the present invention relates to the field of electronics and information technologies, and in particular, to an information determining method, an electronic device, and a computer-readable storage medium.

Background

In an optical system with higher precision requirement, the light-passing surfaces of common optical elements such as flat glass, a beam splitter prism, a total reflection prism and the like are all planes, and the flatness of the surfaces of the optical elements has important influence on the performance of an optical module; in the relative technology, the test method for the surface flatness of the optical element mainly comprises interference, diffraction and the like, the test process is relatively complex, and the requirement on the environment is high, so that the test efficiency is reduced.

Disclosure of Invention

In order to solve the above technical problems, embodiments of the present invention desirably provide an information determining method, an electronic device, and a computer-readable storage medium, so that a process for testing surface information of an optical element is relatively simple, and has a low requirement on an environment, thereby improving testing efficiency.

in order to achieve the purpose, the technical scheme of the invention is realized as follows:

A method of information determination, the method comprising:

setting a standard angle of an element to be tested, and acquiring a first optical power value of light with a first wavelength aiming at the element to be tested based on the standard angle;

acquiring a second optical power value of at least one beam of light with a second wavelength for the element to be detected; the light with the first wavelength and the at least one beam of light with the second wavelength are arranged in parallel on the surface of the element to be measured;

acquiring at least one deflection angle of the element to be tested based on the at least one second optical power value;

and determining the surface flatness information of the element to be tested based on the standard angle and the at least one deflection angle.

Optionally, the setting a standard angle of the device to be tested, and obtaining a first optical power value of the light with the first wavelength for the device to be tested based on the standard angle includes:

Acquiring a standard area of the element to be tested;

Setting a standard angle of the element to be tested based on the standard area; the standard angle represents an included angle between a first surface and a second surface corresponding to the standard area of the element to be tested;

And acquiring a first optical power value of the light with the first wavelength aiming at the standard area of the element to be tested based on the standard angle.

Optionally, the obtaining at least one deflection angle of the device under test based on the at least one second optical power value includes:

acquiring a reference loss curve corresponding to the at least one beam of light with the second wavelength; the reference loss curve represents a mapping relation between the second optical power value and the deflection angle;

and acquiring at least one deflection angle of the element to be tested based on the at least one second optical power value and the reference loss curve.

Optionally, the obtaining a reference loss curve corresponding to the at least one beam of light with the second wavelength includes:

And calculating to obtain a reference loss curve corresponding to the at least one beam of light with the second wavelength based on the spot diameter and the wavelength of the at least one beam of light with the second wavelength.

Optionally, the determining the surface flatness information of the device to be tested based on the standard angle and the at least one deflection angle includes:

Calculating to obtain at least one reference angle of the element to be measured based on the standard angle and the at least one deflection angle;

and determining the surface flatness information of the element to be tested based on the standard angle and the at least one reference angle.

Optionally, the determining the surface flatness information of the to-be-measured element based on the standard angle and the at least one reference angle includes:

And if the reference angle is matched with the standard angle, determining that the area corresponding to the deflection angle of the surface of the element to be tested is positioned on the same horizontal plane with the standard area.

Optionally, the method further includes:

And if the reference angle is not matched with the standard angle, determining that the area corresponding to the deflection angle of the surface of the element to be tested is not in the same horizontal plane with the standard area.

An electronic device, the electronic device comprising: a processor, a memory, and a communication bus;

The communication bus is used for realizing communication connection between the processor and the memory;

The processor is configured to execute a program of the information determination method stored in the memory to implement the steps of:

setting a standard angle of an element to be tested, and acquiring a first optical power value of light with a first wavelength aiming at the element to be tested based on the standard angle;

Acquiring a second optical power value of at least one beam of light with a second wavelength for the element to be detected; the light with the first wavelength and the at least one beam of light with the second wavelength are arranged in parallel on the surface of the element to be measured;

acquiring at least one deflection angle of the element to be tested based on the at least one second optical power value;

and determining the surface flatness information of the element to be tested based on the standard angle and the at least one deflection angle.

optionally, the processor executes the step of setting a standard angle of the device to be tested, and obtaining a first optical power value of the light with the first wavelength for the device to be tested based on the standard angle, and may further implement the following steps:

acquiring a standard area of the element to be tested;

Setting a standard angle of the element to be tested based on the standard area; the standard angle represents an included angle between a first surface and a second surface corresponding to the standard area of the element to be tested;

And acquiring a first optical power value of the light with the first wavelength aiming at the standard area of the element to be tested based on the standard angle.

a computer readable storage medium storing one or more programs, the one or more programs being executable by one or more processors to perform the steps of the information determination method described above.

The information determining method, the electronic device and the computer readable storage medium provided by the embodiment of the invention set the standard angle of the element to be detected, and obtain the first optical power value of the light with the first wavelength aiming at the element to be detected based on the standard angle; acquiring a second light power value of at least one beam of light with a second wavelength for the element to be detected; the device comprises a component to be tested, a first light source, a second light source and a second light source, wherein the light with the first wavelength and at least one light beam with the second wavelength are arranged in parallel on the surface of the component to be tested; acquiring at least one deflection angle of the element to be tested based on the at least one second optical power value; determining the flatness information of the surface of the element to be tested based on the standard angle and the at least one deflection angle, and thus determining the flatness information of the surface of the element to be tested through the standard angle and the corresponding deflection angle of the element to be tested; instead of testing the flatness information of the surface of the element to be tested by a complicated optical testing method with high environmental requirements in the relative technology, the process of testing the surface information of the optical element is simpler, the environmental requirements are lower, and the testing efficiency is improved.

Drawings

fig. 1 is a schematic flowchart of an information determining method according to an embodiment of the present invention;

FIG. 2 is a schematic diagram of a test structure of surface angle information of an element according to an embodiment of the present invention;

FIG. 3 is a schematic diagram of a test light path for testing a surface angle of an optical element according to an embodiment of the present invention;

FIG. 4 is a schematic diagram illustrating the distribution of light with different wavelengths on the surface of an DUT according to an embodiment of the present invention;

Fig. 5 is a schematic flowchart of another information determination method according to an embodiment of the present invention;

fig. 6 is a schematic flowchart of another information determining method according to an embodiment of the present invention;

FIG. 7 is a schematic diagram of two different wavelengths of light incident on different regions of a surface of an DUT according to an embodiment of the present invention;

Fig. 8 is a schematic diagram of optical power values corresponding to light with different wavelengths acquired by the optical spectrum analyzer according to the embodiment of the present invention;

Fig. 9 is a schematic diagram of a relationship between different regions of a to-be-measured element and corresponding vertex angles obtained by measurement according to an embodiment of the present invention;

Fig. 10 is a schematic diagram illustrating a relationship between angles of light with an incident wavelength λ 1 passing through the device under test and the reflector according to an embodiment of the present invention;

Fig. 11 is a schematic structural diagram of an electronic device according to an embodiment of the present invention.

Detailed Description

The technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention.

it should be appreciated that reference throughout this specification to "an embodiment of the present invention" or "an embodiment described previously" means that a particular feature, structure or characteristic described in connection with the embodiment is included in at least one embodiment of the present invention. Thus, the appearances of the phrase "in an embodiment of the present invention" or "in the foregoing embodiments" in various places throughout the specification are not necessarily all referring to the same embodiment. Furthermore, the particular features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In various embodiments of the present invention, the sequence numbers of the above-mentioned processes do not mean the execution sequence, and the execution sequence of each process should be determined by its function and inherent logic, and should not constitute any limitation on the implementation process of the embodiments of the present invention. The above-mentioned serial numbers of the embodiments of the present invention are merely for description and do not represent the merits of the embodiments.

in a case where no specific description is given, the electronic device may execute any step in the embodiments of the present invention, and the processor of the electronic device may execute the step. It should also be noted that the embodiment of the present invention does not limit the sequence of the steps executed by the electronic device. In addition, the data may be processed in the same way or in different ways in different embodiments.

It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

An embodiment of the present invention provides an information determining method, which is applied to an electronic device, and as shown in fig. 1, the method includes the following steps:

Step 101, setting a standard angle of the element to be measured, and obtaining a first optical power value of light with a first wavelength for the element to be measured based on the standard angle.

The electronic device in the embodiments of the present invention may be any device having data processing capabilities, such as a server, a digital TV, or a desktop computer.

The element to be measured can be an optical element common in the prior art, wherein the optical element is characterized in that an incident surface and a refraction surface of the optical element are planes; in a possible implementation, the common optical element may be a plate glass, a beam splitter prism, an all-reflecting prism, a birefringent crystal, a wave plate, a polarizer, or the like.

In the embodiment of the present invention, based on that the surface of the dut, i.e. the surface on which the optical signal is incident, i.e. the first surface of the dut, mentioned below, has a certain roughness, and the second surface, i.e. the exit surface corresponding to the light incident surface of the dut, is smooth, the standard angle of the dut may correspond to a certain specific area of the dut, when the dut is a shaping prism, the central area of the dut is generally selected as the specific area, i.e. it corresponds to the standard angle, and the vertex angle corresponding to the central area of the shaping prism may be set as the standard angle.

in the embodiment of the present invention, the first optical power value of the light with the first wavelength for the device to be tested may specifically refer to an optical power value of the light with the specific wavelength corresponding to the light with the specific wavelength after the light with the specific wavelength passes through a series of optical elements and enters the device to be tested, and then passes through a series of optical elements again, where the optical power value may be obtained by a spectrum analyzer or a passive device test system generally; the first optical power value may be obtained by adjusting the corresponding optical power value of light with the first wavelength in the optical test system to the optimum value, that is, the maximum value, or the minimum optical power loss value after the light passes through a series of optical elements, in the embodiment of the present invention, the first optical power value may be obtained by adjusting the electronic device through a corresponding application, or by performing multiple calibration adjustments on a specific device in the optical test system; the spectrum analyzer filters an input optical signal into a series of continuous single wavelengths according to a certain wavelength interval, wherein the regular interval is 0.01mm, and performs a scanning test on optical power values of the single wavelengths to obtain optical power values corresponding to different wavelengths in the input optical signal, and the unit of the optical power values generally adopts milliwatt.

In the embodiment of the present invention, a schematic diagram of a test structure of surface angle information of an element is provided, as shown in fig. 2, an overall structure of an optical test system is provided for testing surface angle or flatness information of an optical element, and is composed of several components; after an Amplified Spontaneous Emission (ASE) light source 201 passes through an input port to test a light path 202, an optical signal is incident to a device 203 to be tested or an element to be tested, emergent light is obtained after the refraction of the device 203 to be tested and then enters a reflector 204, the reflected light passes through a front test light path 202 again and then passes through an output port, an optical spectrum analyzer 206 is used for testing an optical power value corresponding to the corresponding light, and the optical spectrum analyzer records the optical power value of the emergent light of the output port; and simultaneously, the electrically controlled adjustable device 205 is used for adjusting the reflector 204, wherein the electrically controlled adjustable device 205 can realize translation and rotation angles of the reflector in three axial directions of x, y and z, and is used for changing the angle and the position of the reflector 204.

in the embodiment of the present invention, as shown in fig. 3, a schematic diagram of a test optical path for testing a surface angle of an optical element is provided, where 101 is an optical signal input port, 102 is an optical signal output port, the optical signal input port and the optical signal output port respectively input and output an optical signal to the test optical path, and the input port and the output port may be a collimator array or a separate single collimator; 111 and 112 are beam expanding units, i.e. beam expanding lenses, wherein the beam expanding units shape the light beams input from the input ports, and the beam expanding units can be lens groups or prism groups; 121 is a light splitting device, wherein the light splitting device emits light with different wavelengths in the input optical signal at different angles, and the light splitting device may be a grating, a prism, or a combination of the grating and the prism; 131 is a converging unit, wherein the converging unit converges the light with different wavelengths to corresponding regions, and the converging unit may be a single lens, a single concave mirror, or a combination of lenses; 141 is a device to be tested, wherein the device to be tested can be a flat glass, a beam splitter prism, etc., and in the embodiment of the present invention, the device to be tested is a shaping prism; reference numeral 151 denotes a reflection unit, generally a plane mirror, on which incident optical signals are sequentially arranged in a predetermined order at different wavelengths and linearly distributed, and reflects all the incident optical signals, and outputs the reflected signals through an optical system and an output port.

meanwhile, the test light path has the following characteristics: the angle and position of the reflection unit of the test light path can be adjusted manually or by corresponding electronic equipment such as an electric adjusting frame, and when the element to be tested is not added and the reflection unit is at a certain fixed angle and position, the power value of the incident light of the test light path measured by the optical power test equipment such as a spectrum analyzer can reach the maximum value at the same time.

in the embodiment of the invention, the element to be detected is arranged in front of the reflection unit, the incident light passes through the element to be detected, and then the light is refracted, so that the angle of the light is changed to a certain extent, and the angle of the reflection unit is adjusted, so that the light is output from the exit port. The information of the surface angle and the first surface angle of the element to be tested influences the deflection angles of different areas of the element to be tested on light rays, and when the deflection angles of the element to be tested on light rays with all wavelengths are consistent, the reflection unit is adjusted to be at a certain fixed angle and position, and the power values of all wavelengths in the optical power testing equipment can reach the maximum value simultaneously. When the deflection angles of different areas of the element to be measured to light are not consistent, the light power values of the wavelengths corresponding to the corresponding areas reach the maximum value when the reflection units are required to be adjusted at different angles and positions respectively.

In the embodiment of the invention, the deflection angle of the corresponding area of the element to be measured to the light can be calculated according to the corresponding angle and position of the reflection unit when the power value of the light with different wavelengths reaches the maximum value, and the surface characteristics of the different areas of the element to be measured can be calculated by combining the optical material characteristics of the element to be measured, so that the surface characteristics of the element to be measured can be calculated.

in the embodiment of the invention, the light splitting device, the converging unit and the like are utilized in the test light path to converge different wavelengths to different spatial positions, the wavelengths are continuously distributed and linearly pass through the element to be tested, and the deflection angles of different areas of the element to be tested to light rays are calculated by the reflecting unit with adjustable angle and position and the optical power test equipment, so as to finally obtain the surface characteristics of the element to be tested. In the test optical path, the input/output port may be two different ports, or may be the same port.

and 102, acquiring a second optical power value of at least one beam of light with a second wavelength for the element to be tested.

The light with the first wavelength and at least one light beam with the second wavelength are arranged in parallel on the surface of the element to be measured.

In the embodiment of the present invention, the second optical power value of the light with the second wavelength for the to-be-tested element may be, on the premise of the above-mentioned test light path, adjusting the angle or position of the reflector by the electrically controlled adjustable device, so that when the optical power value measured after the light with the first wavelength passes through the specific area of the to-be-tested element after the light with the first wavelength for the to-be-tested element reaches a maximum value, the optical power value corresponding to at least one beam of light with the second wavelength at that time, that is, the second optical power value, is obtained correspondingly; because the deflection angles of the first surface of the element to be tested, namely the areas of the incident surface of the light, to the light are inconsistent, and the loss values of the areas corresponding to the wavelengths are inconsistent, the corresponding second optical power value of the optical loss value can be obtained through an optical spectrum analyzer or a passive device testing system.

in other embodiments of the present invention, the light with the second wavelength and the light with at least one wavelength are arranged in parallel on the surface of the device under test, as shown in fig. 4, which shows a schematic distribution diagram of the light with different wavelengths on the surface of the device under test. The light beams with different wavelengths, such as λ 1 and λ 2 … λ n, are arranged in parallel on the first surface of the dut 141.

and 103, acquiring at least one deflection angle of the element to be tested based on the at least one second optical power value.

In the embodiment of the present invention, at least one deflection angle of the device under test may be obtained through at least one second optical power value, that is, at least one optical loss value corresponding to light with different wavelengths, where based on that the deflection angles of a certain region of the surface of the device under test to light rays are not consistent, the loss values of the wavelengths corresponding to the region are also not consistent, and further, a corresponding deflection angle may be obtained through different loss values, that is, a corresponding at least one deflection angle may be obtained through at least one second optical power value, where the deflection angle is for the standard angle.

And step 104, determining the surface flatness information of the element to be measured based on the standard angle and the at least one deflection angle.

In the embodiment of the present invention, the angle information or the flatness information of a specific area on the surface of the device to be tested may be obtained through the standard angle and the at least one deflection angle, that is, the angle information or the flatness information of the corresponding area on the surface of the device to be tested may be obtained through the standard angle, and the angle information or the flatness information of the corresponding area on the surface of the device to be tested may be obtained through the at least one deflection angle, so that the surface angle information or the flatness information of the corresponding area on the surface of the device to be tested may be obtained through multiple tests, and the angle information or the flatness information of the entire surface of the device to be tested, that is, the first surface of the device to be tested may be obtained finally.

The flatness information of the dut may be angle accuracy information or flatness information of any surface of the dut, depending on which surface of the dut is used as the incident surface for the optical signal during the test.

the information determining method provided by the embodiment of the invention comprises the steps of setting a standard angle of a component to be detected, and acquiring a first optical power value of light with a first wavelength aiming at the component to be detected based on the standard angle; acquiring a second light power value of at least one beam of light with a second wavelength for the element to be detected; the device comprises a component to be tested, a first light source, a second light source and a second light source, wherein the light with the first wavelength and at least one light beam with the second wavelength are arranged in parallel on the surface of the component to be tested; acquiring at least one deflection angle of the element to be tested based on the at least one second optical power value; determining the flatness information of the surface of the element to be tested based on the standard angle and the at least one deflection angle, and thus determining the flatness information of the surface of the element to be tested through the standard angle and the corresponding deflection angle of the element to be tested; instead of testing the flatness information of the surface of the element to be tested by a complicated optical testing method with high environmental requirements in the relative technology, the process of testing the surface information of the optical element is simpler, the environmental requirements are lower, and the testing efficiency is improved.

Based on the foregoing embodiments, an embodiment of the present invention provides an information determining method, as shown in fig. 5, where the method includes the following steps:

step 201, the electronic device acquires a standard area of the device to be tested.

In the embodiment of the present invention, the electronic device may select any region of the to-be-tested element as the standard region, generally may use the central region of the to-be-tested element as the standard region, or may select a certain region as the standard region according to test prediction measurement performed by the corresponding device, and the selection of the standard region may also be determined based on a certain rule, and the general standard region is relatively smooth with respect to other regions.

step 202, the electronic device sets a standard angle of the device to be tested based on the standard area.

The standard angle represents an included angle between a first surface and a second surface corresponding to the standard area of the element to be tested.

in the embodiment of the invention, the standard area of the element to be measured corresponds to the standard angle, the standard area of the element to be measured is selected, namely the standard angle of the element to be measured is selected, and the standard angle is generally obtained by manual or system measurement of electronic equipment; in the embodiment of the present invention, when the to-be-measured element is the shaping prism, the standard angle may be an included angle between the light incident surface and the light exit surface corresponding to the standard region of the to-be-measured element, that is, a vertex angle corresponding to the standard region of the prism.

Step 203, the electronic device obtains a first optical power value of the light with the first wavelength for the standard area of the device under test based on the standard angle.

In the embodiment of the present invention, the electronic device obtains the first optical power value through the standard area corresponding to the standard angle of the device under test, and the incident optical power value with the first wavelength, that is, the optical power value with the first wavelength is incident to the standard area of the device under test.

And 204, the electronic equipment acquires a second optical power value of at least one beam of light with a second wavelength for the element to be tested.

The light with the first wavelength and at least one light beam with the second wavelength are arranged in parallel on the surface of the element to be measured.

step 205, the electronic device obtains at least one deflection angle of the to-be-measured device based on the at least one second optical power value and the reference loss curve.

And step 206, the electronic equipment determines the surface flatness information of the element to be measured based on the standard angle and the at least one deflection angle.

it should be noted that, for the descriptions of the same steps and the same contents in this embodiment as those in other embodiments, reference may be made to the descriptions in other embodiments, which are not described herein again.

The information determining method provided by the embodiment of the invention determines the flatness information of the surface of the element to be measured through the standard angle and the corresponding deflection angle of the element to be measured; instead of testing the flatness information of the surface of the element to be tested by a complicated optical testing method with high environmental requirements in the relative technology, the process of testing the surface information of the optical element is simpler, the environmental requirements are lower, and the testing efficiency is improved.

based on the foregoing embodiments, an embodiment of the present invention provides an information determining method, as shown in fig. 6, including the following steps:

Step 301, the electronic device acquires a standard area of the device under test.

step 302, the electronic device sets a standard angle of the device to be tested based on the standard area.

The standard angle represents an included angle between a first surface and a second surface corresponding to the standard area of the element to be tested.

Step 303, the electronic device obtains a first optical power value of the light with the first wavelength for the standard area of the device to be measured based on the standard angle.

step 304, the electronic device obtains a second optical power value of at least one beam of light with a second wavelength for the device under test.

The light with the first wavelength and at least one light beam with the second wavelength are arranged in parallel on the surface of the element to be measured.

Step 305, the electronic device obtains a reference loss curve corresponding to at least one beam of light with the second wavelength.

And the reference loss curve represents a mapping relation between the second optical power value and the deflection angle.

In the embodiment of the invention, the reference loss curve is obtained by the electronic equipment through repeated tests, wherein the deflection angles of different areas of the element to be tested to the light can be obtained through corresponding calculation according to the reference loss curve.

In other embodiments of the present invention, step 305 may be implemented by the following step 305 a:

Step 305a, the electronic device calculates a reference loss curve corresponding to at least one beam of light with the second wavelength based on the spot diameter and the wavelength of the at least one beam of light with the second wavelength.

in the embodiment of the present invention, the spot diameter of the light with the second wavelength may obtain the spot radius of the light with the second wavelength, and based on the aforementioned test light path, in a case that the to-be-tested element may be a shaping prism, a beam of light is incident on the surface of the to-be-tested element through the test light path, where, as shown in fig. 7, schematic diagrams of two different wavelengths of light incident on different areas of the surface of the to-be-tested element are given, where 141 is the to-be-tested element, and 151 is a reflection unit; wherein the incident wavelength is λ 1, and the vertex angle corresponding to the standard region of the device under test_λ1The vertex angle of the corresponding position of the incident light with the incident wavelength of lambda 2, namely the light with the second wavelength, incident to any region of the element to be measured is theta_λ2here, the second wavelength is given as a beam, and in the embodiment of the present invention, the standard region corresponding to λ 1 is parallel to any region corresponding to λ 2; when theta is_λ1And theta_λ2At different times, the reflection angle of the corresponding light at the wavelength λ 1 and the wavelength λ 2 may have an angle of Δ θ. The electrically controlled adjustable device in fig. 2 adjusts the angle and position of the mirror 204 shown in fig. 2, so that the coupling loss of the light corresponding to the wavelength λ 1 reaches an optimal state, and at this time, the light corresponding to the wavelength λ 2 has a fixed coupling loss. The coupling loss is related to the angular deviation Δ θ by equation 1:

in the formula 1, ω_yThe spot radius in the Y direction and λ are the wavelength of the test light. The coupling loss of the light corresponding to the wavelength lambda 2 can be obtained through testing or calculation by a spectrum analyzer, so that the angle deviation of delta theta can be calculated. By adopting the method, the angular deviation of the light rays corresponding to the rest wavelengths and the light rays corresponding to the wavelength lambda 1 can be respectively calculated, namely the angular deviation of at least one light ray corresponding to the light ray with the second wavelength and the light ray with the first wavelength is calculated.

In the embodiment of the present invention, since the spectrum analyzer can correspondingly measure the power values of the light with different wavelengths to obtain the corresponding power values, as shown in fig. 8, a schematic diagram of the corresponding power values of the light with different wavelengths obtained by the spectrum analyzer is given; meanwhile, the electronic device obtains the relationship between the optical loss value and the angle deviation value through the following optical parameters, such as the spot radius of the incident light in the vertical direction of the element to be measured and the wavelength parameter of the incident light, and obtains a corresponding reference loss curve through multiple tests, as shown in fig. 9, a measured relationship diagram between different areas of the element to be measured and corresponding vertex angles is provided.

in the embodiment of the present invention, a relationship diagram of refraction angles of incident optical signals on the device under test is also provided, that is, how to calculate and obtain vertex angles of different regions corresponding to all incident optical signals incident on the surface of the device under test, and an angle optical system diagram before and after the incident light with the incident wavelength λ 1, that is, the light with the first wavelength passes through the device under test 141 and the reflector 151 is provided in fig. 10. The incident angle of the incident light with the incident wavelength λ 1 incident on the first surface of the dut 141 is θ₁Angle of refraction theta₂，θ₁And theta₂Is given by equation 2:

n₁sin(θ₁)＝n₂sin(θ₂) (2)

In formula 2, n1 is the refractive index of air, n2 is the refractive index of the dut 141, and the incident angle of the optical signal with the incident wavelength λ 1, i.e. the first wavelength, incident on the second surface of the dut 141 is θ₃angle of refraction theta₄The relationship between the two is formula 3:

n₂sin(θ₃)＝n₁sin(θ₄) (3)

From this, θ can be deduced₂and theta₃is given by equation 4:

θ_λ1+θ₂＝θ₃ (4)

meanwhile, the incident angle of the light having the incident wavelength λ 1, i.e., the first wavelength, on the reflecting mirror 151 is θ₅Angle of reflection theta₆in order to facilitate the calculation process, in the embodiment of the present invention, the second surface of the dut 141 and the second surface of the mirror 151 are parallel to each other, so that the following formula 5 can be obtained:

θ₄＝θ₅＝θ₆ (5)

in the embodiment of the invention, for the light with the second wavelength, namely the incident wavelength λ 2, the corresponding vertex angle θ where the incident wavelength λ 2 is incident to a certain area of the element to be measured can be obtained by calculating according to the angle deviation between the incident wavelength λ 2 and the incident wavelength λ 1_λ2further, the vertex angles corresponding to the incidence of all incident light signals of the device 141 to be tested in different areas can be obtained through multiple tests.

step 306, the electronic device obtains at least one deflection angle of the to-be-measured element based on the at least one second optical power value and the reference loss curve.

In the embodiment of the present invention, at least one vertex angle corresponding to a certain area in the device under test, that is, an included angle between different areas of the first surface of the device under test and the second surface, which is relative to the standard angle, can be obtained correspondingly through the corresponding relationship between the reference loss curve and the second optical power value.

And 307, calculating by the electronic equipment at least one reference angle of the element to be measured based on the standard angle and the at least one deflection angle.

in the embodiment of the present invention, vertex angles of the first surface of the device under test corresponding to the plurality of different regions and the second surface, that is, included angles between the first surface and the second surface of the device under test corresponding to the plurality of different regions on the first surface, may be obtained by performing superposition calculation on the standard angle and each of the deflection angles.

And 308, the electronic equipment determines the surface flatness information of the element to be measured based on the standard angle and at least one reference angle.

in one embodiment, step 308 may be implemented by way of step 308 a:

step 308a, if the reference angle is matched with the standard angle, the electronic device determines that the area corresponding to the deflection angle of the surface of the element to be tested and the standard area are in the same horizontal plane.

in the embodiment of the present invention, if the standard angle is matched with any reference angle, the standard angle may be equal to or the deviation of the angle is smaller than a standard value, so that it can be determined that the angle accuracy or flatness information of the standard area of the surface of the device under test is consistent with that of the area corresponding to any deflection angle, that is, the standard area and the area are located on the same horizontal plane.

In another embodiment, step 308 can also be implemented by the following step 308 b:

step 308b, if the reference angle is not matched with the standard angle, the electronic device determines that the area corresponding to the deflection angle of the surface of the element to be measured is not on the same horizontal plane with the standard area.

In the embodiment of the invention, if the standard angle is not matched with any reference angle, the standard angle is not equal or the angle deviation of the difference is obviously greater than a certain standard value, so that the angle precision or the flatness of the standard area of the surface of the element to be measured and the area corresponding to any deflection angle are inconsistent, namely the standard area and the reference area are not on the same horizontal plane.

It should be noted that, for the descriptions of the same steps and the same contents in this embodiment as those in other embodiments, reference may be made to the descriptions in other embodiments, which are not described herein again.

the information determining method provided by the embodiment of the invention determines the flatness information of the surface of the element to be measured through the standard angle and the corresponding deflection angle of the element to be measured; instead of testing the flatness information of the surface of the element to be tested by a complicated optical testing method with high environmental requirements in the relative technology, the process of testing the surface information of the optical element is simpler, the environmental requirements are lower, and the testing efficiency is improved.

Based on the foregoing embodiment, an embodiment of the present invention provides an electronic device 11, where the electronic device 11 may be applied to the information determining method provided in any embodiment corresponding to fig. 1, fig. 5, and fig. 6, and as shown in fig. 11, the electronic device 11 may include: a processor 111, a memory 112, and a communication bus 113, wherein:

The communication bus 113 is used to implement a communication connection between the processor 111 and the memory 112.

The processor 111 is configured to execute a program of the information determination method stored in the memory 112 to implement the steps of:

setting a standard angle of the element to be detected, and acquiring a first optical power value of light with a first wavelength aiming at the element to be detected based on the standard angle;

acquiring a second light power value of at least one beam of light with a second wavelength for the element to be detected; the device comprises a component to be tested, a first light source, a second light source and a second light source, wherein the light with the first wavelength and at least one light beam with the second wavelength are arranged in parallel on the surface of the component to be tested;

Acquiring at least one deflection angle of the element to be tested based on the at least one second optical power value;

And determining the surface flatness information of the element to be measured based on the standard angle and the at least one deflection angle.

in other embodiments of the present invention, the processor 111 is configured to execute the steps of setting the standard angle of the dut stored in the memory 112, and obtaining the first optical power value of the light with the first wavelength for the dut based on the standard angle, and may implement the following steps:

acquiring a standard area of a to-be-detected element;

setting a standard angle of the element to be tested based on the standard area; the standard angle represents an included angle between a first surface and a second surface corresponding to a standard area of the element to be tested;

Based on the standard angle, a first optical power value of the light with the first wavelength for the standard area of the element to be tested is obtained.

In other embodiments of the present invention, the processor 111 is configured to execute the step of obtaining at least one deflection angle of the device under test based on the at least one second optical power value stored in the memory 112, and may implement the following steps:

acquiring a reference loss curve corresponding to at least one beam of light with a second wavelength; the reference loss curve represents a mapping relation between the second optical power value and the corresponding deflection angle;

And acquiring at least one deflection angle of the element to be tested based on the at least one second optical power value and the reference loss curve.

in other embodiments of the present invention, the processor 111 is configured to execute the step of obtaining the reference loss curve corresponding to at least one beam of light with the second wavelength stored in the memory 112, and may implement the following steps:

And calculating to obtain a reference loss curve corresponding to the at least one beam of light with the second wavelength based on the spot diameter and the wavelength of the at least one beam of light with the second wavelength.

In other embodiments of the present invention, the processor 111 is configured to execute the step of determining the surface flatness information of the dut based on the standard angle and the at least one deflection angle stored in the memory 112, and may implement the following steps:

Calculating to obtain at least one reference angle of the element to be measured based on the standard angle and the at least one deflection angle;

and determining the surface flatness information of the element to be measured based on the standard angle and at least one reference angle.

in other embodiments of the present invention, the processor 111 is configured to execute the step of determining the surface flatness information of the device under test based on the standard angle and at least one reference angle stored in the memory 112, and may implement the following steps:

and if the reference angle is matched with the standard angle, determining that the area corresponding to the deflection angle of the surface of the element to be tested is positioned on the same horizontal plane with the standard area.

In other embodiments of the present invention, the processor 111 is configured to execute the information determination method stored in the memory 112, and may further implement the following steps:

And if the reference angle is not matched with the standard angle, determining that the area corresponding to the deflection angle of the surface of the element to be tested is not in the same horizontal plane with the standard area.

It should be noted that, for a specific implementation process of the step executed by the processor in this embodiment, reference may be made to an implementation process in the information determination method provided in the embodiments corresponding to fig. 1, fig. 5, and fig. 6, and details are not described here again.

According to the electronic equipment provided by the embodiment of the invention, the flatness information of the surface of the element to be detected is determined through the standard angle and the corresponding deflection angle of the element to be detected; instead of testing the flatness information of the surface of the element to be tested by a complicated optical testing method with high environmental requirements in the relative technology, the process of testing the surface information of the optical element is simpler, the environmental requirements are lower, and the testing efficiency is improved.

Based on the foregoing embodiments, embodiments of the present invention provide a computer-readable storage medium storing one or more programs, which are executable by one or more processors to implement the steps of the information determination method corresponding to fig. 1, 5 and 6.

The computer-readable storage medium may be a Read Only Memory (ROM), a Programmable Read Only Memory (PROM), an Erasable Programmable Read Only Memory (EPROM), an Electrically Erasable Programmable Read Only Memory (EEPROM), a magnetic Random Access Memory (FRAM), a Flash Memory (Flash Memory), a magnetic surface Memory, an optical Disc, or a Compact Disc Read-Only Memory (CD-ROM); and may be various electronic devices such as mobile phones, computers, tablet devices, personal digital assistants, etc., including one or any combination of the above-mentioned memories.

It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.

The above-mentioned serial numbers of the embodiments of the present invention are merely for description and do not represent the merits of the embodiments.

Through the above description of the embodiments, those skilled in the art will clearly understand that the method of the above embodiments can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware, but in many cases, the former is a better implementation manner. Based on such understanding, the technical solutions of the present invention may be embodied in the form of a software product, which is stored in a storage medium (such as ROM/RAM, magnetic disk, optical disk) and includes instructions for enabling a terminal device (such as a mobile phone, a computer, a server, an air conditioner, or a network device) to execute the method described in the embodiments of the present invention.

The present invention is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.

These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.

These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.

The above description is only a preferred embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes, which are made by using the contents of the present specification and the accompanying drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.