阅读说明：本技术 测试被测装置的天线的消声测试室、测试系统及测试方法 (Test anechoic test chamber, test macro and the test method of the antenna of tested device ) 是由 樊尚·阿巴迪 科比特·罗威尔 伯努瓦·德拉特 于 2019-05-23 设计创作，主要内容包括：本申请涉及测试被测装置的天线的消声测试室、测试系统及测试方法。用于对被测装置DUT的天线进行测试的消声测试室,测试室包括：测试区域,具有用于接纳DUT的测试表面,其中在测试模式中测试表面形成DUT的测量区域,DUT包括至少一个天线阵列,至少一个天线阵列具有多个多入多出MIMO天线；至少一个反射器紧缩天线测试场CATR,包括第一测量天线和一个成形反射器,其中反射器用于产生第一静区；至少一个第二测量天线,其中第二测量天线被布置在测试室内以在测试表面上产生第二静区；输入/输出端,用于将测试室连接至测试设备,其中输入/输出端连接至第一天线和第二天线。(This application involves anechoic test chamber, test macro and the test methods of the antenna of test tested device.The anechoic test chamber tested for the antenna to tested device DUT, test cabinet includes: test zone, with for receiving the test surfaces of DUT, wherein in test pattern test surfaces formed DUT measured zone, DUT includes at least one aerial array, at least one aerial array has multiple multiple-input, multiple-output mimo antennas；At least one reflector tightens antenna measurement field CATR, including the first measurement antenna and a shaped reflector, and wherein reflector is for generating the first dead zone；At least one second measurement antenna, wherein the second measurement antenna is disposed in test cabinet to generate the second dead zone on test surfaces；Input/output terminal, for test cabinet to be connected to test equipment, wherein input/output terminal is connected to first antenna and the second antenna.)

1. a kind of anechoic test chamber that the antenna for tested device DUT is tested, the test cabinet include:

Test zone, the test zone have the test surfaces for receiving the DUT, wherein testing described in test pattern Surface forms the measured zone of the DUT, and wherein the DUT includes at least one aerial array, at least one described day Linear array has multiple multiple-input, multiple-output mimo antennas；

At least one reflector tightens antenna measurement field CATR, at least one described reflector tightens antenna measurement field CATR and includes First measurement antenna and a shaped reflector, wherein the reflector is for generating the first dead zone；

At least one second measurement antenna, wherein the second measurement antenna is disposed in the test cabinet in test surfaces The second dead zone of upper generation；

Input/output terminal, the input/output terminal are used to the test cabinet being connected to test equipment, wherein the input/defeated Outlet is connected to first antenna and the second antenna.

2. test cabinet according to claim 1, wherein first dead zone is greater than second dead zone, particularly described the Two dead zones are the component parts in first dead zone.

3. test cabinet according to claim 1, wherein first dead zone and second dead zone overlap each other.

4. test cabinet according to any one of the preceding claims, wherein the CATR and the particularly CATR Reflector is configured as establishing first dead zone on the test surfaces, enables the first dead zone established described The DUT is completely covered in DUT when being placed on the test surfaces.

5. test cabinet according to any one of the preceding claims, wherein at least one described second measurement antenna is matched It is set to and establishes second dead zone on the test surfaces, the second dead zone established is placed in the DUT Part covers the DUT when on the test surfaces.

6. test cabinet according to any one of the preceding claims, wherein the first measurement antenna and/or described the Two measurement antennas are electromagnetic horns.

7. test cabinet according to any one of the preceding claims, wherein the test zone, the CATR and described Second measurement antenna is disposed in the test cabinet and is configured as the mimo antenna of at least two space intervals of test DUT The near field antenna of array, especially far field antenna and space interval.

8. test cabinet according to any one of the preceding claims sets up an organization wherein providing first, described first is set Mechanism is set to be coupled to the reflector and be configured as changing the shape of the reflector in test pattern and/or by described anti- The direction of the wave beam of emitter reflection.

9. test cabinet according to any one of the preceding claims sets up an organization wherein providing second, described second is set It sets mechanism and is coupled to the first measurement antenna and/or the second measurement antenna and is configured as changing in test pattern and divide Not by the direction of the first measurement antenna or the wave beam of the second measurement antenna transmitting.

10. test cabinet according to any one of the preceding claims, wherein providing the first regulating mechanism, described first is adjusted Section mechanism is coupled to the test zone and is configured as in the mobile test zone of at least one dimension.

11. test cabinet according to any one of the preceding claims, wherein providing the second regulating mechanism, described second is adjusted Section mechanism can connect with DUT in test pattern and be configured as relative to first dead zone and/or second dead zone The mobile DUT.

12. a kind of test macro that the antenna for tested device DUT is tested, the test macro include:

Anechoic test chamber according to any one of claim 1 to 11；

Test equipment, the test equipment are connected to the input/output terminal, and are configured as via the CATR and at least Test data flow is sent to one the second antenna the DUT being placed on the test surfaces and reception and analysis are corresponding Response traffic.

13. test macro according to claim 12, wherein the test equipment includes for generating test data flow Signal generation apparatus, and wherein institute's test equipment further includes the analysis dress for being analyzed the response traffic received It sets.

14. a kind of test method that the antenna for tested device DUT is tested, particularly by using according to claim Test macro described in 12 or 13, which comprises

DUT is provided, wherein the DUT includes at least two space intervals or isolated mimo antenna array；

On the indoor test surfaces of the test that the DUT is placed in test macro；

Generating the first big dead zone on the test surfaces by using CATR makes the DUT be disposed fully in described In one dead zone；

Lesser second dead zone is generated on the test surfaces by using at least one other measurement antenna, so that described Second dead zone is less than first dead zone and/or Chong Die with first dead zone；

Data flow is received and by analysis response in response to the first of the first test stream sent via the CATR by analyzing Second in the second test stream via other antenna transmission receives data flow, the measurement of Lai Zhihang MIMO type.

15. according to the method for claim 14, making the DUT wherein the DUT is placed on the test surfaces The mimo antenna array be disposed fully in first dead zone and be partially disposed in second dead zone.

Technical field

The present invention relates to the anechoic test chambers tested for the antenna to tested device.The invention further relates to include this Plant the test macro of test cabinet and the test method for being tested using antenna of this test cabinet to tested device.

Background technique

Such as cellular phone wireless electron device and other wireless electron devices have wireless capability.These wireless capabilities It can be used for supporting voice communications versus data communications.During manufacture, wireless electron device is generally tested to determine the wireless of them Whether function correctly works.Test antenna, the characteristic for particularly testing them are especially important.For this purpose and in order to mention For reliable test result, tested wirelessly using including the suitable test equipment of closed noise elimination RF screened room, box or case Electronic device.Dduring test, wireless electron device is placed in anechoic test chamber, which includes setting with test The antenna of standby connection.Test equipment can be carried out wireless communication using antenna and wireless electron device dduring test.US The test cabinet is described in 2010/0113011 A1.

So-called tighten antenna measurement field (CATR) is the width for carrying out electrically large sizes antenna with the extent length of diminution Widespread deployment technology with characterization.Offset reflector is commonly used in generating the dead zone of CATR.In the presence of particular for reflector without If the CATR of same dry type.Caused by the curvature of paraboloid and the property of position and its edge geometry ensure Collimating field includes pseudo- transverse-electromagnetic (TEM) wave.Therefore, by the way that the picture of feed is projected infinite point, CATR has been synthesized and reality Plane wave is coupled to the case where antenna aperature generates typical measurement " far field " radiation diagram on border to compare, antenna is located at distance feedback The wavefront of the type on the antenna of DUT is incident in the case where the much farther away position in source.

Modem radio sub-device not only includes individual antenna.Alternatively, these wireless electron devices typically comprise pass In at least two optimised aerial arrays such as different signal wavelengths, intensity, amplitude, direction --- so-called multiple-input, multiple-output (MIMO) antenna.In addition, signal is often passed to another channel or antenna from a channel or antenna.In telecommunication, This process is represented as switching.

Traditional test equipment only with a CATR cannot test the specific switching function of Modem radio sub-device Energy.

This is to need the case where improving.

Summary of the invention

Therefore it is directed to background technique, it is desirable to provide improved for testing the side of the wireless electron device of such as cellular phone Formula.Particularly it is desirable to provide space MIMO measurement.

This problem test cabinet and/or test macro and/or method solution by being limited in primary claim according to the present invention Certainly.

Following content is provided accordingly:

Anechoic test chamber of the one kind for being tested the antenna of tested device (DUT), the test cabinet include: test Region has the test surfaces for receiving DUT, wherein test surfaces form the measured zone of DUT in test pattern, and Wherein the DUT includes at least one aerial array, which has multiple multiple-input, multiple-output (MIMO) antenna；Extremely A few reflector tightens antenna measurement field (CATR), including the first measurement antenna and a shaped reflector, wherein reflector For generating the first dead zone；At least one second measurement antenna, wherein the second measurement antenna be disposed in the test cabinet with The second dead zone is generated on test surfaces；Input/output terminal, for test cabinet to be connected to test equipment, wherein input/output terminal It is connected to first antenna and the second antenna.

For one kind for testing the test macro of tested device (DUT), which includes: noise elimination according to the present invention Test cabinet；Test equipment, the test equipment are connected to input/output terminal and are configured as via CATR and at least one second day Test data flow is sent to the DUT being placed on test surfaces and the corresponding response traffic of reception and analysis by line.

It is a kind of for testing the test method of tested device, particularly by use test macro according to the present invention, the packet It includes: DUT is provided, wherein DUT includes at least two mimo antenna arrays；The indoor survey of the test that DUT is placed in test macro It takes temperature on face；Generating the first big dead zone on test surfaces by using CATR makes DUT be disposed fully in the first dead zone It is interior；Lesser second dead zone is generated on test surfaces by using at least one other measurement antenna makes the second dead zone small In the first dead zone and/or Chong Die with the first dead zone；It is connect by analyzing in response to the first of the first test stream sent via CATR It receives data flow and receives data flow, Lai Zhihang in response to second of the second test stream via other antenna transmission by analyzing MIMO type measurement.

The present invention by can to the tested device of such as wireless electron device carry out space MIMO measurement theory based on, Two measurement antennas are needed in order to carry out space MIMO measurement.Discovery of the invention is the provision of more than one and is used for as a result, The dead zone with the DUT of aerial array of space interval is tested, and there is provided at least two for testing the dead zone of the DUT. Dead zone is the region that radio transmitting is limited or is at least reduced.

First dead zone is generated by using indoor specific CATR is tested.This test cabinet is the envelope for wireless test DUT The shielding test cabinet closed.CATR includes the first measurement antenna and shaped reflector.First measurement antenna is about shaped reflector quilt It is arranged in test cabinet, shaped reflector is shaped and arranged in test cabinet to form the first dead zone on test surfaces.

This CATR uses specific mimo antenna, which sends test number along the direction of the reflector of specific forming According to stream.The reflector is arranged and shapes so that the test data flow reflected focuses on the first dead zone on test surfaces.If DUT is placed in the region in this first dead zone, and the antenna or aerial array of DUT can be tested.In addition, the second dead zone uses Second mimo antenna of space interval generates, and the second mimo antenna sends the second test data flow.This second mimo antenna is by cloth It sets and shapes so that test data flow focuses on the second dead zone on test surfaces.If DUT is placed on the first dead zone and In the region in two dead zones, then it can be carried out the consistent test of the antenna of DUT.

By providing at least two measurement antennas thus generating at least two dead zones on test surfaces, can test has The DUT of identical quantity antenna or aerial array.Particularly, it can test now from a DUT antenna (or aerial array) to another The switching of one DUT antenna (or aerial array).In addition, provided for radio resources management (RRM) test can also be carried out by this setting.

Present invention generally provides the antenna measurement of optimization, the antenna measurement of this optimization is measurement antenna to ensure that antenna is full Sufficient specification or required for simply being characterized to it.The canonical parameter of antenna be gain, radiation pattern, beam angle, polarization, Impedance etc..

Solution according to the present invention is easily integrated and provides the preferred of existing deflation antenna measurement field (CATR) system Extension.

Advantageous configuration and improvement are generated according to other dependent claims and according to the description of reference attached drawing.

In a preferred embodiment, the first dead zone is greater than the second dead zone.Particularly, the second dead zone is the group in the first dead zone At part.In such manner, it is possible to more effectively test switching, such as the first DUT antenna (array) and the 2nd DUT are covered in the first dead zone In the case where antenna (array) and in the case where the second dead zone only covers DUT antenna (array).

According to another preferred embodiment, the first dead zone and the second dead zone overlap each other.Caused by overlapping means Overlapping region is less than the first dead zone and the second dead zone.

In the preferred embodiment, CATR and especially its reflector are configured as establishing first on test surfaces quiet Area enables the first established dead zone that DUT is completely covered when DUT is placed on test surfaces.

In another preferred embodiment, at least one second measurement antenna is configured as establishing second on test surfaces Dead zone makes the second established dead zone only partially cover DUT when DUT is placed on test surfaces.

Preferably, the first and/or second measurement antenna is electromagnetic horn.Particularly, the first and/or second measurement antenna is Directional aerial.Electromagnetic horn or microwave horn be made of the flaring metal waveguide shaped like loudspeaker it is wireless in the form of lead beam The antenna of electric wave.They be used as standard calibration antenna feed antennas with measure other antennas gain and other attributes, And it is used as directional aerial.They the advantages of are that have steady directionality and simple construction and adjust simple.Electromagnetic horn Another important advantage is since they do not have resonant element, they can be in the width of wide frequency ranges and up to GHz area It is operated in bandwidth.However, instead of electromagnetic horn, other types of antenna is also feasible, such as direct broadcast satellite reflector antenna Or antenna is matched in local microenvironment wavelength-division.

In the preferred embodiment, the measurement of CATR and second antenna is disposed in test cabinet and is configured as to DUT's The mimo antenna array of at least two space intervals is tested.For example, the first mimo antenna or aerial array of DUT include remote Antenna and/or DUT include near field day with second mimo antenna or aerial array at the first mimo antenna array manifold interval Line.Wireless electron device generallys use aerial array, because aerial array can be realized the high gain being able to achieve than individual antenna Gain (that is, relatively narrow beam of radio wave).Aerial array is the antenna of the multiple connections to work together as individual antenna The set of element is to send or receive radio wave.

It provides first in particularly preferred embodiments to set up an organization, first, which sets up an organization, couples or connects to CATR's Shaped reflector.First, which sets up an organization, is configured as changing the shape of reflector in test pattern and/or be reflected by reflector Wave beam direction.Additionally or in the alternative, second is provided to set up an organization, second sets up an organization couple or connect to first and/ Or second measurement antenna.Second, which sets up an organization, is configured as changing in test pattern respectively by the first measurement antenna or the second survey Measure the direction of the wave beam of antenna transmitting.In such manner, it is possible to it is in situ be afoot test during change test condition without Stop test pattern and/or do not need replacement to test indoor DUT.

According to preferred embodiment, the first regulating mechanism is provided, the first regulating mechanism is coupled or connected to test section.First Regulating mechanism is configured as at least one dimension (direction x, y or z) mobile test area.Additionally or in the alternative, second is provided Regulating mechanism, second regulating mechanism can be connect in test pattern with DUT.Second regulating mechanism is configured as relative to The one and/or second mobile DUT in dead zone.Test condition can additionally be changed in situ by these embodiments.

Typically, test equipment includes signal generation apparatus for generating test data flow and for received response The analytical equipment that data flow is analyzed.

In the embodiment of method, DUT is placed in and makes all mimo antenna arrays of DUT complete on test surfaces It is disposed in the first dead zone and is only partially disposed in the second dead zone.

In a suitable case, above-mentioned configuration and improvement can be combined in any way.Of the invention is other possible Feature of the invention that configuration, improvement and realization describe before further including or below with reference to embodiment description not yet explicitly mentions And combination.Particularly, in this case, those skilled in the art can also add individually aspect as of the invention basic The improvement or supplement of form.

Detailed description of the invention

The present invention is described in more detail below based on the embodiment shown in the schematic diagram of attached drawing, in attached drawing In:

Fig. 1 shows the block diagram of the test macro according to the present invention for being tested the antenna of tested device；

Fig. 2 shows the three-dimensional views of the test cabinet of the test macro of Fig. 1；

Fig. 3 shows the first embodiment party of the arrangement in the first and second dead zones in the projection top view on test zone Formula；

Fig. 4 shows the second embodiment party of the arrangement in the first and second dead zones in the projection top view on test zone Formula；And

Fig. 5 is shown for illustrating flow chart according to the method for the present invention.

Attached drawing, which is intended to provide, further understands embodiments of the present invention.They are illustrated and tie to embodiment It closes description and helps explain the principle of the present invention and concept.Other embodiment and mentioned many advantages become more according to attached drawing It is clear.Element in attached drawing is not necessarily to scale display.

In the accompanying drawings, similar, function is equivalent and element, feature and the component of equality operation are set in each situation It is equipped with similar reference label, unless otherwise indicated.

Specific embodiment

Fig. 1 shows the block diagram for the test macro that the antenna according to the present invention to tested device is tested.

In Fig. 1, test macro is indicated by appended drawing reference 10.Test macro 10 is configured as to tested device (DUT) 11 It is tested.For this purpose, test macro 10 includes anechoic test chamber 12 and test equipment 13.Test cabinet 12 includes at least one A input/output (I/O) end 14.Test equipment 13 is connected to the input of test cabinet 12/defeated via suitable cable and connector Outlet 14.

Test equipment 13 includes signal generation apparatus 15, and signal generation apparatus 15 is provided to test cabinet 12 for generating Test data flow 16.Test equipment 13 further includes analytical equipment 17, and analytical equipment 17 is used for test equipment 13 in response to sending The received corresponding response traffic 18 of data flow 16 analyzed.

For test purpose, DUT 11 is placed in test cabinet 12.This is described below with reference to Fig. 2 to Fig. 4.

Fig. 2 shows the perspective views of the test cabinet 12 of the test macro 10 of Fig. 1.

In the embodiment of Fig. 2, test cabinet 12 is that closed cabinet shape dress is set.However, the present invention should not necessarily be limited by it is this The test chamber shape of type.Moreover, test cabinet 12 can also be room, room, cupboard, box, packet etc..Test cabinet 12 is in an appropriate manner It is shielded, especially shields Electrical and Electronic interference, such as RF signal and noise.

Test cabinet 12 is configured as wirelessly testing DUT 11, especially to such as smart phone, board device, cellular phone Deng mobile communications device antenna carry out wireless test.More specifically, test cabinet 12 is configured as the antenna to those DUT The RF test cabinet 12 tested.For this purpose, test cabinet 12 is configured as all demands of processing automatic production line.This A little demands include the automatic switch and long service life of the room RF 12.Test cabinet 12 provides high shielding effect in wide frequency ranges Can, this allows it to execute test to the DUT with radio interface according to many standards.These standards include GSM, ISM, LTE, Cdma2000, WCDMA, WiMAX, bluetooth, SLAN and ZigBee.The automatically and/or manually processing of test cabinet 12 is also feasible.

Test cabinet 12 includes shell 20, and shell 20 has enclosure interior 21.Suitable shielding element (being not shown in Fig. 2) is attached The inner wall of shell 20 is connected to ensure the test environment optimized.

Test cabinet 12 further includes test zone 22, CATR 23 (or first antenna arrangement) and the second antenna arrangement 24.

Test zone 22 is located at the pact center of enclosure interior 21 and is attached to housing wall via bracket 25.Test zone 22 Including for receiving the test surfaces 26 of DUT 11.

CATR 23 includes at least one the first measurement antenna 27 and a reflector 28 suitably shaped.First measurement day Line 27 and shaped reflector 28 are mounted on housing wall by suitable bracket 34,35.In the embodiment of Fig. 2, first is surveyed Amount antenna 27 is mounted on left housing body wall via bracket 34, and shaped reflector 28 is mounted on top shell body wall via bracket 35.

CATR 23 forms the first dead zone 29 on test surfaces 26.This dead zone 29 depends on the shape of reflector 28 substantially With size A × A.

Preferably, the first measurement antenna 27 is electromagnetic horn.First measurement antenna 27 is configured and aligned so that it emits Signal be directly directed to reflector 28.Reflector 28 is shaped, is mounted on a wall and is aligned will measure antenna from first 27 received signals are directly reflected into test surfaces 26.

Second antenna arrangement 24 includes at least one second measurement antenna 30, and the second measurement antenna 30 passes through suitable bracket 36 are mounted on housing wall.In the embodiment of Fig. 2, the second measurement antenna 30 is mounted on right shell body wall.Second measurement day Line 30 can be configured as being randomly oriented antenna for what signal directly (that is, without reflector) was directed to test surfaces 26.The Two antennas arrangement 24 forms the second dead zone 31, and the orientation that the second dead zone 31 depends on the second measurement antenna 30 has substantially ruler Very little B × B.

Second antenna arrangement 24 is also possible to CATR.

Antenna arrangement 23,24 is connected to test equipment 13 via input/output terminal.

In test pattern, DUT 11 is placed on test surfaces 26, and test surfaces 26 form the measurement zone for being used for DUT11 Domain.

Test cabinet 13 according to the present invention has the multiple-input, multiple-output (MIMO) of at least two space intervals more particularly to test The DUT 11 of aerial array 32,33.For example, the first mimo antenna array 32 includes far field antenna, the MIMO at second space interval Aerial array 33 includes near field antenna.

Test cabinet 12 may include setting device (being not shown in Fig. 2), which sets up and or changes feed measurement The position and direction of antenna and/or reflector.Test cabinet 12 can also include regulating device (being not shown in Fig. 2), adjusting dress Set the position for changing test surfaces or DUT.By these mechanisms, measuring condition can be changed dduring test without interrupting Ongoing test.

Fig. 3 to Fig. 4 shows two embodiment party of second dead zone 31 about the arrangement in the first dead zone 29 in projection top view Formula.

In Fig. 3, the size A × A in the first dead zone 29 is greater than the size B × B in the second dead zone 31.Here, the second dead zone 31 It is the component part in the first dead zone 29, is so completely contained in the first dead zone 29.

In Fig. 4, the first dead zone 29 is greater than the second dead zone 31 again.However, the first dead zone 29 and the second dead zone 31 here It overlaps each other.

In the embodiment of Fig. 3 and Fig. 4, the first dead zone 29 is completely covered when DUT 11 is placed on test surfaces 26 DUT 11.Second dead zone 31 only partially covers DUT 11 when DUT 11 is placed on test surfaces 26.

In Fig. 3, the first antenna array 32 of DUT 11 is covered by two dead zones 29,31.The second antenna array of DUT 11 Column 33 are only covered by the first dead zone 29.

In Fig. 4, the first antenna array 32 of DUT 11 is only covered by the first dead zone 29.The second aerial array of DUT 11 33 are only covered by the second dead zone 31.

Fig. 5 shows the flow chart for illustrating method that the antenna according to the present invention to tested device is tested.

In first step (S1), DUT is provided.This DUT includes the mimo antenna array of at least two space intervals.

In second step (S2), DUT is placed in provided by the indoor test zone of test of test macro it is specific On test surfaces.Then closed test room.

In next step (S3), the first dead zone is generated on test surfaces by using CATR.DUT is fully disposed in In first dead zone.

In the other step (S4) that can be completed before or after step S3, by using at least one other survey Amount antenna generates the second dead zone on test surfaces.Second dead zone is less than the first dead zone and/or the second dead zone and the first dead zone weight It is folded.Particularly, DUT is placed on test surfaces for the mimo antenna array of DUT to be fully disposed in the first dead zone simultaneously And it is partially disposed in the second dead zone.

In last step (S5), MIMO type is executed using CATR and other measurement antenna and is measured.In test pattern In, analyze in response to via CATR send first test flow and receive first receive data flow, analysis in response to via Second that second test of other antenna transmission is flowed and received receives data flow.

Although describing the present invention by preferred embodiment above, it is without being limited thereto, but can be with extensive Mode is modified.Particularly, the present invention can be changed in various ways under the premise of without departing from core of the present invention or Modification.

The list of the appended drawing reference used

10 test macros

11 tested devices, DUT

12 (noise reduction/closing/shielding) test cabinets

13 test equipments

14 input/output terminals, the end I/O

15 signal generation apparatus

16 test data flows

17 analytical equipments

18 response traffics

20 shells

21 enclosure interiors

22 test zones

23 tighten antenna measurement field, CATR, first antenna arrangement

24 second antennas arrangement

25 brackets

26 test surfaces

27 first measurement antennas

28 shaped reflectors

29 first dead zones

30 second measurement antennas

31 second dead zones

32 first antennas (array), MIMO

33 second antennas (array), MIMO

34 brackets

35 brackets

36 brackets

S1-S5 step