阅读说明：本技术 一种小孔内壁缺陷检测探头 (Small hole inner wall defect detection probe ) 是由 周勇 于 2021-08-03 设计创作，主要内容包括：本发明属于非接触视觉检测技术领域,且公开了一种小孔内壁缺陷检测探头,包括支撑座,所述支撑座的底面固定安装有薄壁中空管,所述支撑座的顶面开设有摄像头连接口,所述支撑座底部位于薄壁中空管的四周处开设有观察孔,所述支撑座的右侧开设有光源入射口。本发明通过光源发射装置向分光镜发射光源,经过分光镜的反射照射在反射镜上,再通过反射镜倾斜面的反射照在小孔工件的内壁上,此时小孔内壁的图像经过反射镜的反射呈现在分光镜上,CCD相机可以对分光镜上呈现的CCD图像进行采集,并利用CCD相机采集的图像进行保存、显示、裁剪和拼接,由于整个光路不存在非线性畸变,保证了所获图像的质量,可以实现对所检出的缺陷进行精确的定量分析。(The invention belongs to the technical field of non-contact visual inspection, and discloses a small hole inner wall defect detection probe which comprises a supporting seat, wherein a thin-wall hollow tube is fixedly arranged on the bottom surface of the supporting seat, a camera connecting port is formed in the top surface of the supporting seat, observation holes are formed in the positions, located on the periphery of the thin-wall hollow tube, of the bottom of the supporting seat, and a light source entrance port is formed in the right side of the supporting seat. The invention emits light source to the spectroscope through the light source emitting device, irradiates on the reflector through the reflection of the spectroscope, irradiates on the inner wall of the small hole workpiece through the reflection of the inclined surface of the reflector, and at the moment, the image of the inner wall of the small hole is reflected on the spectroscope through the reflector, the CCD camera can collect the CCD image presented on the spectroscope, and the image collected by the CCD camera is used for storing, displaying, cutting and splicing.)

1. The utility model provides an aperture inner wall defect detecting probe, includes supporting seat (1), its characterized in that: a thin-wall hollow tube (2) is fixedly arranged on the bottom surface of the supporting seat (1), a camera connecting port (3) is arranged on the top surface of the supporting seat (1), the bottom of the supporting seat (1) is provided with observation holes (11) at the periphery of the thin-wall hollow pipe (2), a light source entrance port (4) is arranged on the right side of the supporting seat (1), a CCD camera (5) is engaged in the inner cavity of the camera connecting port (3), the right end of the light source entrance port (4) is movably connected with a light source emitting device (6), a detection port (7) is arranged on the side surface of the bottom of the thin-wall hollow tube (2), a reflector (8) is fixedly arranged on the bottom surface of the inner cavity of the thin-wall hollow tube (2), the inner chamber fixed mounting of supporting seat (1) has linking bridge (9), the middle part fixed mounting of linking bridge (9) has spectroscope (10).

2. The small hole inner wall defect detecting probe according to claim 1, characterized in that: the top of speculum (8) is two forty-five degrees inclined planes, detect mouthful (7) total two, two detect mouthful (7) and correspond with two inclined planes of speculum (8) respectively.

3. The small hole inner wall defect detecting probe according to claim 1, characterized in that: the top of speculum (8) is three forty-five degrees inclined planes, it is total three to detect mouth (7) three it corresponds to detect the three inclined plane of mouth (7) and speculum (8).

4. The small hole inner wall defect detecting probe according to claim 1, characterized in that: the top end of the reflector (8) is four inclined planes with forty-five degrees, the number of the detection ports (7) is four, and the four inclined planes of the detection ports (7) and the reflector (8) correspond to each other.

5. The small hole inner wall defect detecting probe according to claim 1, characterized in that: the thin-wall hollow pipe (2) is communicated with the inner cavity of the supporting seat (1), the inner wall of the thin-wall hollow pipe (2) is smooth, and the axis of the thin-wall hollow pipe (2) and the axis of the supporting seat (1) are in the same straight line.

6. The small hole inner wall defect detecting probe according to claim 1, characterized in that: the inclination angle of spectroscope (10) is forty-five degrees, spectroscope (10) are located the left side of light source incident port (4), spectroscope (10) are located the below of camera connector (3).

Technical Field

The invention belongs to the technical field of non-contact visual inspection, and particularly relates to a probe for detecting defects of an inner wall of a small hole.

Background

Functional parts with small hole shapes are widely applied in the fields of automobile manufacturing, aerospace and the like, higher and higher requirements are also put forward on the surface quality of the inner walls of the parts, the general method is to use a magnifier to observe whether the inner walls of hole parts have defects through human eyes, the method is easy to miss detection, cannot store the observed images, and has low efficiency, and the observation method adopting an industrial endoscope has the defects that a detection device cannot obtain the required result according to the actual detection requirement and has high price.

Chinese utility model patent application No. CN204924982U discloses an internal surface inspection device, its probe portion is a cylindrical glass lens, the terminal reflection part of lens is the cone shape of expanding from the base end side towards the terminal end side, when inspecting the internal surface, need not rotatory work piece or probe, only need along work piece axis scan inner wall from top to bottom once can, can improve the operating efficiency, but adopt the image distortion that the image that the conical reflection part obtained inevitably exists, it is difficult to carry out accurate quantitative analysis to detected defect.

The chinese utility model patent application with application number CN206497058U discloses an internal surface inspection device, it has adopted light source and CCD camera in the outside upper end of work piece, the reflection part is inside the work piece, the plane of reflection is the mode of the speculum of 45 degrees settings, when examining the internal surface, the speculum of lower extreme must rotate the round and obtain the image of the complete round of work piece inner wall, the advantage of this kind of mode is that the image that obtains is undistorted, the horizontal concatenation of accessible obtains complete round image, the shortcoming is that need scan the inner wall from top to bottom along the work piece axis in order to obtain complete inner wall image, and all will rotate the speculum a week at each step, the operating efficiency is lower.

The chinese patent application No. CN110687130A discloses an automatic detection device and method for defects on the inner wall of a micro-hole, wherein the probe part is a cylindrical glass lens, and the reflection part at the end of the lens has a 45-degree oblique plane as the reflection plane, the imaging principle of this method is similar to that described in the above patent No. 2.

Disclosure of Invention

The invention aims to provide a probe for detecting defects of an inner wall of a small hole, which aims to solve the problems in the background technology.

In order to achieve the above purpose, the invention provides the following technical scheme: a pinhole inner wall defect detection probe comprises a supporting seat, wherein a thin-wall hollow tube is fixedly installed on the bottom surface of the supporting seat, a camera connecting port is formed in the top surface of the supporting seat, observation holes are formed in the position, located on the periphery of the thin-wall hollow tube, of the bottom of the supporting seat, a light source entrance port is formed in the right side of the supporting seat, a CCD camera is meshed in the inner cavity of the camera connecting port and records images displayed on a spectroscope, a light source emitting device is movably connected to the right end of the light source entrance port and provides a light source for the device after the thin-wall hollow tube is inserted into a pinhole workpiece, the light source is emitted leftwards from the light source emitting device to be in contact with the spectroscope and enters the thin-wall hollow tube through reflection of the spectroscope and finally irradiates on an inclined surface of the spectroscope, so that the light source is reflected on the inner wall of the pinhole workpiece, and the images on the inner wall of the pinhole are upwards transmitted on the spectroscope through reflection of the inclined surface of the reflector, the detection device is characterized in that a detection port is formed in the side face of the bottom of the thin-wall hollow pipe, a reflector is fixedly mounted on the bottom face of the inner cavity of the thin-wall hollow pipe, a connecting support is fixedly mounted in the inner cavity of the supporting seat, and a spectroscope is fixedly mounted in the middle of the connecting support.

Preferably, the top of speculum is two forty-five degrees inclined planes, detect mouthful totally two, two detect the mouth respectively with two inclined planes of speculum correspond.

Preferably, the top of speculum is three forty-five degrees inclined planes, three in total are detected the mouth, three detect the mouth and the three inclined plane of speculum corresponds.

Preferably, the speculum top is four forty-five degrees inclined planes, it is total four, four to detect the mouth four inclined planes of detection mouth and speculum correspond, set up to two, three or four inclined planes through the top with the speculum, when detecting, only need rotate ninety degrees or less with the device can realize detecting the whole week of aperture work piece, the improvement of very big degree device work efficiency.

Preferably, the thin-wall hollow tube is communicated with the inner cavity of the supporting seat, the inner wall of the thin-wall hollow tube is smooth, the axis of the thin-wall hollow tube and the axis of the supporting seat are on the same straight line, and the thin-wall hollow tube is not easy to damage and convenient to store and maintain compared with the direction of adopting the glass light guide column due to good smooth reflection performance of the inner wall of the thin-wall hollow tube.

Preferably, the inclination of spectroscope is forty-five degrees, the spectroscope is located the left side of light source incident port, the spectroscope is located the below of camera connector mouth, has guaranteed that the illumination that the light source can be smooth is on the spectroscope, has guaranteed that the inside illumination of device is clear, can guarantee the presentation that the image after the reflection of speculum can be clear on the spectroscope simultaneously.

The invention has the following beneficial effects:

1. the invention emits light source to the spectroscope through the light source emitting device, irradiates on the reflector through the reflection of the spectroscope, irradiates on the inner wall of the small hole workpiece through the reflection of the inclined surface of the reflector, and at the moment, the image of the inner wall of the small hole is reflected on the spectroscope through the reflector, the CCD camera can collect the CCD image presented on the spectroscope, and the image collected by the CCD camera is used for storing, displaying, cutting and splicing.

2. According to the invention, two or more reflectors with forty-five degrees are arranged at the bottom end of the thin-wall hollow pipe in a back-to-back manner, so that an image of the inner wall of a circumferential angle larger than one hundred eighty degrees can be returned to the spectroscope, and when the device is used for detection, the whole circumference detection of the inner wall of the small-hole workpiece can be realized only by rotating the device once at an angle of ninety degrees or less, and the operation efficiency of the device is improved.

3. According to the invention, the thin-wall hollow tube is arranged at the bottom end of the supporting seat, the supporting seat is used for supporting the thin-wall hollow tube, and meanwhile, the bottom end of the supporting seat is provided with the plurality of observation holes, before measurement is carried out, the CCD camera can observe the outline of the outer wall of the small hole and the thin-wall hollow tube through the plurality of observation holes arranged at the bottom end of the supporting seat, so that whether the thin-wall hollow tube is in contact with the inner wall of the small hole or not is judged, and the inner wall of the thin-wall hollow tube has good smooth reflection performance, so that the thin-wall hollow tube is difficult to damage and convenient to store and maintain compared with a method adopting a glass light guide column.

Drawings

FIG. 1 is a schematic structural view of the present invention;

FIG. 2 is a schematic view of a connection structure of a light source entrance port according to the present invention;

FIG. 3 is a schematic cross-sectional view of the support base of the present invention;

FIG. 4 is a schematic view of the detection process of the present invention;

FIG. 5 is an enlarged view of the structure at A in FIG. 3 according to the present invention;

FIG. 6 is a schematic view of a reflector according to an embodiment of the present invention;

fig. 7 is a schematic structural diagram of a third reflector according to an embodiment of the invention.

In the figure: 1. a supporting seat; 2. a thin-walled hollow tube; 3. a camera connector; 4. a light source entrance port; 5. a CCD camera; 6. a light source emitting device; 7. a detection port; 8. a mirror; 9. connecting a bracket; 10. a beam splitter; 11. and (6) observing holes.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Example one

The invention provides a pinhole inner wall defect detection probe, as shown in figures 1 to 5, comprising a support seat 1, a thin-wall hollow tube 2 is fixedly arranged on the bottom surface of the support seat 1, a camera connecting port 3 is arranged on the top surface of the support seat 1, observation holes 11 are arranged at the bottom of the support seat 1 and positioned at the periphery of the thin-wall hollow tube 2, a light source entrance port 4 is arranged on the right side of the support seat 1, a CCD camera 5 is engaged with the inner cavity of the camera connecting port 3, the CCD camera 5 records the image displayed on a spectroscope 10, a light source emitting device 6 is movably connected with the right end of the light source entrance port 4, after the thin-wall hollow tube 2 is inserted into a pinhole workpiece, the light source emitting device 6 provides a light source for the device, the light source emits leftwards from the light source emitting device 6 to be contacted with the spectroscope 10, enters the thin-wall hollow tube 2 through the reflection of the spectroscope 10 and finally irradiates on the inclined plane of a reflecting mirror 8, therefore, a light source is reflected on the inner wall of the small-hole workpiece, at the moment, an image on the inner wall of the small hole is upwards transmitted to the spectroscope 10 through reflection of the inclined plane of the reflector 8, the side surface of the bottom of the thin-wall hollow tube 2 is provided with the detection port 7, the bottom surface of the inner cavity of the thin-wall hollow tube 2 is fixedly provided with the reflector 8, the inner cavity of the supporting seat 1 is fixedly provided with the connecting support 9, and the middle part of the connecting support 9 is fixedly provided with the spectroscope 10.

Wherein, the top of speculum 8 is two forty-five degrees inclined planes, detects mouthful 7 total two, and two detect mouthful 7 correspond with two inclined planes of speculum 8 respectively, can realize only need once can realizing gathering convenient operation once with the device with ninety degrees or less angle rotation when rotating to the whole week of aperture inner wall.

The thin-wall hollow tube 2 is communicated with the inner cavity of the supporting seat 1, the inner wall of the thin-wall hollow tube 2 is smooth, the axis of the thin-wall hollow tube 2 and the axis of the supporting seat 1 are in the same straight line, and the thin-wall hollow tube 2 is not easy to damage and convenient to store and maintain compared with a method adopting a glass light guide column due to good smooth reflection performance of the inner wall of the thin-wall hollow tube 2.

Wherein, the inclination of spectroscope 10 is forty-five degrees, and spectroscope 10 is located the left side of light source incident port 4, and spectroscope 10 is located the below of camera connector 3, has guaranteed that the illumination that the light source can be smooth is on spectroscope 10, has guaranteed that the inside illumination of device is clear, can guarantee the presentation that the image after the reflection of speculum 8 can be clear on spectroscope 10 simultaneously.

Example two

The invention provides a pinhole inner wall defect detection probe, as shown in figure 6, comprising a support seat 1, a thin-wall hollow tube 2 is fixedly arranged on the bottom surface of the support seat 1, a camera connecting port 3 is arranged on the top surface of the support seat 1, an observation hole 11 is arranged at the bottom of the support seat 1 and positioned at the periphery of the thin-wall hollow tube 2, a light source entrance port 4 is arranged on the right side of the support seat 1, a CCD camera 5 is engaged with the inner cavity of the camera connecting port 3, the CCD camera 5 records the image displayed on a spectroscope 10, a light source emitting device 6 is movably connected with the right end of the light source entrance port 4, after the thin-wall hollow tube 2 is inserted into a pinhole workpiece, the light source emitting device 6 provides a light source for the device, the light source emits leftwards from the light source emitting device 6 to be contacted with the spectroscope 10, enters the thin-wall hollow tube 2 through the reflection of the spectroscope 10 and finally irradiates on the inclined plane of a reflecting mirror 8, therefore, a light source is reflected on the inner wall of the small-hole workpiece, at the moment, an image on the inner wall of the small hole is upwards transmitted on the spectroscope 10 through reflection of the inclined surface of the reflector 8, the side surface of the bottom of the thin-wall hollow tube 2 is provided with the detection port 7 and the detection port 7, the reflector 8 is fixedly installed on the bottom surface of the inner cavity of the thin-wall hollow tube 2, the inner cavity of the supporting seat 1 is fixedly provided with the connecting support 9, and the middle part of the connecting support 9 is fixedly provided with the spectroscope 10.

Wherein, the top of speculum 8 is three forty-five degrees inclined planes, detects mouthful 7 three in total, and three detection mouthful 7 corresponds with the three inclined plane of speculum 8, can realize rotating sixty degrees or less angle and can realize carrying out whole week to the aperture inside and detect.

The thin-wall hollow tube 2 is communicated with the inner cavity of the supporting seat 1, the inner wall of the thin-wall hollow tube 2 is smooth, the axis of the thin-wall hollow tube 2 and the axis of the supporting seat 1 are in the same straight line, and the thin-wall hollow tube 2 is not easy to damage and convenient to store and maintain due to the good smooth reflection performance of the inner wall of the thin-wall hollow tube 2 compared with the direction of adopting a glass light guide column.

Wherein, the inclination of spectroscope 10 is forty-five degrees, and spectroscope 10 is located the left side of light source incident port 4, and spectroscope 10 is located the below of camera connector 3, has guaranteed that the illumination that the light source can be smooth is on spectroscope 10, has guaranteed that the inside illumination of device is clear, can guarantee the presentation that the image after the reflection of speculum 8 can be clear on spectroscope 10 simultaneously.

EXAMPLE III

The invention provides a pinhole inner wall defect detection probe, as shown in figure 7, comprising a support seat 1, a thin-wall hollow tube 2 is fixedly arranged on the bottom surface of the support seat 1, a camera connecting port 3 is arranged on the top surface of the support seat 1, an observation hole 11 is arranged at the bottom of the support seat 1 and positioned at the periphery of the thin-wall hollow tube 2, a light source entrance port 4 is arranged on the right side of the support seat 1, a CCD camera 5 is engaged with the inner cavity of the camera connecting port 3, the CCD camera 5 records the image displayed on a spectroscope 10, a light source emitting device 6 is movably connected with the right end of the light source entrance port 4, after the thin-wall hollow tube 2 is inserted into a pinhole workpiece, the light source emitting device 6 provides a light source for the device, the light source emits leftwards from the light source emitting device 6 to be contacted with the spectroscope 10, enters the thin-wall hollow tube 2 through the reflection of the spectroscope 10 and finally irradiates on the inclined plane of a reflecting mirror 8, therefore, a light source is reflected on the inner wall of the small-hole workpiece, at the moment, an image on the inner wall of the small hole is upwards transmitted on the spectroscope 10 through the reflection of the inclined surface of the reflector 8, the side surface of the bottom of the thin-wall hollow tube 2 is provided with the detection port 7 and the detection port 7, the reflector 8 is fixedly installed on the bottom surface of the inner cavity of the thin-wall hollow tube 2, the inner cavity of the supporting seat 1 is fixedly provided with the connecting support 9, and the middle part of the connecting support 9 is fixedly provided with the spectroscope 10.

Wherein, 8 tops of speculum are four forty-five degrees inclined planes, detect mouthful 7 four in total, and four are detected mouthful 7 and 8 four inclined planes of speculum and are corresponded, when detecting, only need can realize the whole week of aperture work piece inner wall detecting with the device rotation angle of forty-five degrees or less.

The thin-wall hollow tube 2 is communicated with the inner cavity of the supporting seat 1, the inner wall of the thin-wall hollow tube 2 is smooth, the axis of the thin-wall hollow tube 2 and the axis of the supporting seat 1 are in the same straight line, and the thin-wall hollow tube 2 is not easy to damage and convenient to store and maintain due to the good smooth reflection performance of the inner wall of the thin-wall hollow tube 2 compared with the direction of adopting a glass light guide column.

Wherein, the inclination of spectroscope 10 is forty-five degrees, and spectroscope 10 is located the left side of light source incident port 4, and spectroscope 10 is located the below of camera connector 3, has guaranteed that the illumination that the light source can be smooth is on spectroscope 10, has guaranteed that the inside illumination of device is clear, can guarantee the presentation that the image after the reflection of speculum 8 can be clear on spectroscope 10 simultaneously.

The working principle and the using process of the invention are as follows:

when in use

The first step is as follows: inserting the bottom end of the thin-wall hollow pipe 2 into the small-hole workpiece, and enabling the lower end of the thin-wall hollow pipe 2 to be located at the lowest end of the inner wall of the small-hole workpiece;

the second step is that: after the thin-wall hollow tube 2 is inserted into a small-hole workpiece, the light source emitting device 6 provides a light source for the device, the light source emits light leftwards from the light source emitting device 6 to be contacted with the spectroscope 10, enters the thin-wall hollow tube 2 through reflection of the spectroscope 10, and finally irradiates on the inclined surface of the reflector 8, so that the light source is reflected on the inner wall of the small-hole workpiece, and at the moment, an image on the inner wall of the small hole is upwards transmitted on the spectroscope 10 through reflection of the inclined surface of the reflector 8;

the third step: the CCD camera 5 records the image presented on the spectroscope 10;

the fourth step: moving the device upwards by a step length along the axis of the workpiece, wherein the step length does not exceed the height of a local image of the inner wall of the small hole which can be displayed at one time by the inclined surface of the reflector 8;

the fifth step: repeating the third step and the fourth step until the bottom end of the thin-wall hollow tube 2 is completely positioned above the inner wall of the small-hole workpiece;

and a sixth step: horizontally rotating the device;

the seventh step: moving the device downwards along the axis of the workpiece until the bottom end of the thin-wall hollow tube 2 is positioned at the lowest part of the inner wall of the small-hole workpiece;

eighth step; repeating the third step and the fourth step until the bottom end of the thin-wall hollow tube 2 is positioned above the inner wall of the small-hole workpiece;

the ninth step: and (3) cutting and splicing the CCD images acquired by the CCD camera 5 according to the mutual relation among the images to obtain a complete space inner wall image.

It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.