阅读说明：本技术 时钟频率的校准方法、校准装置和时钟频率校正系统 (Clock frequency calibration method, calibration device and clock frequency correction system ) 是由 赵志斌 张彦辉 于 2021-08-06 设计创作，主要内容包括：本申请提供了一种时钟频率的校准方法、校准装置和时钟频率校正系统,该方法包括：获取至少两个结温温度对应的温度电压当量和时钟频率,结温温度为时钟信号单元的工作温度,时钟频率为时钟信号单元产生时钟信号的频率；根据温度电压当量和时钟频率确定第一关系式,第一关系式为温度电压当量和时钟频率的关系式；根据当前的结温温度确定对应的温度电压当量,得到当前温度电压当量；根据当前温度电压当量和第一关系式计算得到当前的时钟频率；计算当前的时钟频率和标准时钟频率的差值,得到时钟频率偏差；根据时钟频率偏差校正时钟频率,解决了时钟频率校正的实时性差的问题。(The application provides a calibration method, a calibration device and a clock frequency correction system of clock frequency, wherein the method comprises the following steps: acquiring temperature voltage equivalent and clock frequency corresponding to at least two junction temperature units, wherein the junction temperature is the working temperature of a clock signal unit, and the clock frequency is the frequency of a clock signal generated by the clock signal unit; determining a first relational expression according to the temperature voltage equivalent and the clock frequency, wherein the first relational expression is a relational expression of the temperature voltage equivalent and the clock frequency; determining a corresponding temperature voltage equivalent according to the current junction temperature to obtain a current temperature voltage equivalent; calculating to obtain the current clock frequency according to the current temperature voltage equivalent and the first relational expression; calculating the difference value between the current clock frequency and the standard clock frequency to obtain the clock frequency deviation; the clock frequency is corrected according to the clock frequency deviation, and the problem of poor real-time performance of clock frequency correction is solved.)

1. A method of calibrating a clock frequency, the method comprising:

acquiring temperature voltage equivalent and clock frequency corresponding to at least two junction temperature units, wherein the junction temperature is the working temperature of a clock signal unit, and the clock frequency is the frequency of a clock signal generated by the clock signal unit;

determining a first relation according to the temperature voltage equivalent and the clock frequency, wherein the first relation is a relation between the temperature voltage equivalent and the clock frequency;

determining the corresponding temperature voltage equivalent according to the current junction temperature to obtain the current temperature voltage equivalent;

calculating to obtain the current clock frequency according to the current temperature voltage equivalent and the first relation;

calculating the difference value between the current clock frequency and the standard clock frequency to obtain the clock frequency deviation;

correcting the clock frequency according to the clock frequency deviation.

2. The method according to claim 1, wherein the calibration circuit comprises at least three current sources, at least three switches, a temperature sensor, a voltage dividing resistor and a transistor, the current sources and the switches form a plurality of parallel power supply branches, any one of the power supply branches comprises one current source and one switch connected in series, a common terminal of at least three parallel power supply branches is connected with one end of the temperature sensor, the other end of the temperature sensor is connected with one end of the voltage dividing resistor, the other end of the voltage dividing resistor is connected with a collector of the transistor, a base and an emitter of the transistor are grounded, the temperature sensor is used for converting a temperature signal into a voltage signal, detection currents corresponding to any two of the power supply branches are different, and the detection current is a current flowing through the power supply branches during detection, determining the corresponding temperature voltage equivalent according to the current junction temperature to obtain a current temperature voltage equivalent, including:

detecting voltage values of the temperature sensors corresponding to at least three detection currents at the current junction temperature to obtain at least three first voltages;

and calculating the current temperature voltage equivalent according to at least three first voltages.

3. The method according to claim 2, wherein detecting voltage values of the temperature sensors corresponding to at least three detected currents at the current junction temperature to obtain at least three first voltages comprises:

and sequentially closing the switches and introducing corresponding detection currents at the current junction temperature to obtain at least three first voltages.

4. The method of claim 2, wherein calculating the current temperature voltage equivalent from at least three of the first voltages comprises:

obtaining a relational expression between the first voltage and a second voltage corresponding to the same moment to obtain at least three second relational expressions, wherein the second voltage is the voltage of a collector of the transistor;

substituting a third relation into the second relation to obtain at least three fourth relations, wherein the third relation is a relation between the second voltage and the temperature-voltage equivalent, and the third relation is determined according to a current and voltage formula of a PN junction;

processing at least three fourth relational expressions by using a elimination method to obtain a fifth relational expression, wherein the fifth relational expression is a relational expression of the temperature-voltage equivalent and the first voltage;

substituting at least three first voltages into the fifth relational expression to calculate the temperature voltage equivalent.

5. The method according to claim 2, wherein the number of the power supply branches is four, and the four detection currents are a first detection current, a second detection current, a third detection current and a fourth detection current, the second detection current is 2 times the first detection current, the third detection current is 10 times the first detection current, and the fourth detection current is 10 times the second detection current.

6. The method of claim 1, wherein determining a first relationship based on the temperature-voltage equivalent and the clock frequency comprises:

calculating a first parameter and a second parameter according to at least two temperature voltage equivalent and the corresponding clock frequency, wherein the first parameter is the slope of the first relational expression, and the second parameter is the intercept of the first relational expression;

and determining the first relational expression according to the first parameter and the second parameter.

7. An apparatus for calibrating a clock frequency, the apparatus comprising:

the device comprises an acquisition unit, a clock signal unit and a control unit, wherein the acquisition unit is used for acquiring temperature voltage equivalent and clock frequency corresponding to at least two junction temperature, the junction temperature is the working temperature of the clock signal unit, and the clock frequency is the frequency of a clock signal generated by the clock signal unit;

a first determining unit, configured to determine a first relation according to the temperature voltage equivalent and the clock frequency, where the first relation is a relation between the temperature voltage equivalent and the clock frequency;

a second determining unit, configured to determine the corresponding temperature-voltage equivalent according to the current junction temperature to obtain a current temperature-voltage equivalent;

the first calculation unit is used for calculating and obtaining the current clock frequency according to the current temperature voltage equivalent and the first relation;

the second calculating unit is used for calculating the difference value between the current clock frequency and the standard clock frequency to obtain the clock frequency deviation;

a correction unit for correcting the clock frequency according to the clock frequency deviation.

8. A computer-readable storage medium, characterized in that the computer-readable storage medium comprises a stored program, wherein the program performs the method of any one of claims 1 to 6.

9. A processor, characterized in that the processor is configured to run a program, wherein the program when running performs the method of any of claims 1 to 6.

10. A clock frequency correction system comprising a clock signal unit and a means for calibrating a clock frequency, characterized in that the means for calibrating a clock frequency is adapted to perform the method of any one of claims 1 to 6.

Technical Field

The present disclosure relates to the field of clock calibration technologies, and in particular, to a clock frequency calibration method, a calibration apparatus, a computer-readable storage medium, a processor, and a clock frequency correction system.

Background

The PLL is sensitive to temperature, and the internal junction temperature rises to some extent when the chip works for a period of time, which affects the clock accuracy.

The chip needs to support an automatic adjustment function of the clock frequency to ensure the frequency accuracy of the clock generated by the PLL to be kept within 1000ppm after calibration, but the clock frequency deviation is calculated by counting the clock frequency for a period of time, which can cause correction delay.

The above information disclosed in this background section is only for enhancement of understanding of the background of the technology described herein and, therefore, certain information may be included in the background that does not form the prior art that is already known in this country to a person of ordinary skill in the art.

Disclosure of Invention

The present application mainly aims to provide a calibration method, a calibration device, a computer-readable storage medium, a processor, and a clock frequency correction system for clock frequency calibration, so as to solve the problem of poor real-time performance of clock frequency correction in the prior art.

According to an aspect of an embodiment of the present invention, there is provided a method for calibrating a clock frequency, the method including: acquiring temperature voltage equivalent and clock frequency corresponding to at least two junction temperature units, wherein the junction temperature is the working temperature of a clock signal unit, and the clock frequency is the frequency of a clock signal generated by the clock signal unit; determining a first relation according to the temperature voltage equivalent and the clock frequency, wherein the first relation is a relation between the temperature voltage equivalent and the clock frequency; determining the corresponding temperature voltage equivalent according to the current junction temperature to obtain the current temperature voltage equivalent; calculating to obtain the current clock frequency according to the current temperature voltage equivalent and the first relation; calculating the difference value between the current clock frequency and the standard clock frequency to obtain the clock frequency deviation; correcting the clock frequency according to the clock frequency deviation.

Optionally, the calibration circuit includes at least three current sources, at least three switches, a temperature sensor, a voltage dividing resistor and a transistor, where the current sources and the switches form multiple parallel power supply branches, any one of the power supply branches includes one current source and one switch connected in series, a common end of at least three parallel power supply branches is connected to one end of the temperature sensor, the other end of the temperature sensor is connected to one end of the voltage dividing resistor, the other end of the voltage dividing resistor is connected to a collector of the transistor, a base and an emitter of the transistor are grounded, the temperature sensor is configured to convert a temperature signal into a voltage signal, detected currents corresponding to any two of the power supply branches are different, the detected current is a current flowing through the power supply branch during detection, and the corresponding temperature voltage equivalent is determined according to the current junction temperature, obtaining the current temperature voltage equivalent, including: detecting voltage values of the temperature sensors corresponding to at least three detection currents at the current junction temperature to obtain at least three first voltages; and calculating the current temperature voltage equivalent according to at least three first voltages.

Optionally, detecting voltage values of the temperature sensor corresponding to at least three detected currents at the current junction temperature to obtain at least three first voltages, including: and sequentially closing the switches and introducing corresponding detection currents at the current junction temperature to obtain at least three first voltages.

Optionally, calculating the current temperature-voltage equivalent according to at least three first voltages includes: obtaining a relational expression between the first voltage and a second voltage corresponding to the same moment to obtain at least three second relational expressions, wherein the second voltage is the voltage of a collector of the transistor; substituting a third relation into the second relation to obtain at least three fourth relations, wherein the third relation is a relation between the second voltage and the temperature-voltage equivalent, and the third relation is determined according to a current and voltage formula of a PN junction; processing at least three fourth relational expressions by using a elimination method to obtain a fifth relational expression, wherein the fifth relational expression is a relational expression of the temperature-voltage equivalent and the first voltage; substituting at least three first voltages into the fifth relational expression to calculate the temperature voltage equivalent.

Optionally, the number of the power supply branches is four, the four detection currents are respectively a first detection current, a second detection current, a third detection current and a fourth detection current, the second detection current is 2 times the first detection current, the third detection current is 10 times the first detection current, and the fourth detection current is 10 times the second detection current.

Optionally, determining a first relation according to the temperature-voltage equivalent and the clock frequency includes: calculating a first parameter and a second parameter according to at least two temperature voltage equivalent and the corresponding clock frequency, wherein the first parameter is the slope of the first relational expression, and the second parameter is the intercept of the first relational expression; and determining the first relational expression according to the first parameter and the second parameter.

According to another aspect of the embodiments of the present invention, there is also provided a clock frequency calibration apparatus, including: the device comprises an acquisition unit, a clock signal unit and a control unit, wherein the acquisition unit is used for acquiring temperature voltage equivalent and clock frequency corresponding to at least two junction temperature, the junction temperature is the working temperature of the clock signal unit, and the clock frequency is the frequency of a clock signal generated by the clock signal unit; a first determining unit, configured to determine a first relation according to the temperature voltage equivalent and the clock frequency, where the first relation is a relation between the temperature voltage equivalent and the clock frequency; a second determining unit, configured to determine the corresponding temperature-voltage equivalent according to the current junction temperature to obtain a current temperature-voltage equivalent; the first calculation unit is used for calculating and obtaining the current clock frequency according to the current temperature voltage equivalent and the first relation; the second calculating unit is used for calculating the difference value between the current clock frequency and the standard clock frequency to obtain the clock frequency deviation; a correction unit for correcting the clock frequency according to the clock frequency deviation.

According to another aspect of the embodiments of the present invention, there is also provided a computer-readable storage medium including a stored program, wherein the program executes any one of the methods.

According to still another aspect of the embodiments of the present invention, there is further provided a processor, configured to execute a program, where the program executes any one of the methods.

According to another aspect of the embodiments of the present invention, there is also provided a clock frequency correction system, including a clock signal unit and a clock frequency calibration device, the clock frequency calibration device being configured to perform any one of the methods.

In the embodiment of the present invention, in the method for calibrating a clock frequency, first, temperature-voltage equivalent and a clock frequency corresponding to at least two junction temperature are obtained, where the junction temperature is a working temperature of a clock signal unit, and the clock frequency is a frequency of a clock signal generated by the clock signal unit; then, determining a first relational expression according to the temperature voltage equivalent and the clock frequency, wherein the first relational expression is a relational expression of the temperature voltage equivalent and the clock frequency; then, determining the corresponding temperature voltage equivalent according to the current junction temperature to obtain the current temperature voltage equivalent; then, calculating the current clock frequency according to the current temperature voltage equivalent and the first relational expression; then, calculating the difference value between the current clock frequency and the standard clock frequency to obtain the clock frequency deviation; and finally, correcting the clock frequency according to the clock frequency deviation. The calibration method determines the first relational expression by acquiring the temperature voltage equivalent and the clock frequency corresponding to at least two junction temperature, namely, the current temperature voltage equivalent can be acquired in real time, and the clock frequency at the current junction temperature is calculated according to the first relational expression, so that the clock frequency deviation can be obtained by calculating the difference value between the current clock frequency and the standard clock frequency, the problem of correction delay caused by calculating the clock frequency deviation by counting the clock frequency for a period of time is solved, the real-time performance of clock frequency calibration is improved, and the problem of poor real-time performance of clock frequency correction in the prior art is solved.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of this application, illustrate embodiments of the application and, together with the description, serve to explain the application and are not intended to limit the application. In the drawings:

FIG. 1 shows a flow diagram of a method of calibration of a clock frequency according to an embodiment of the present application;

FIG. 2 shows a schematic diagram of a calibration circuit according to an embodiment of the present application;

fig. 3 shows a schematic diagram of a calibration arrangement of clock frequencies according to an embodiment of the present application.

Wherein the figures include the following reference numerals:

10. a current source; 20. a switch; 30. a temperature sensor; 40. a voltage dividing resistor; 50. a transistor.

Detailed Description

It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict. The present application will be described in detail below with reference to the embodiments with reference to the attached drawings.

In order to make the technical solutions better understood by those skilled in the art, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only partial embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

It should be noted that the terms "first," "second," and the like in the description and claims of this application and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It should be understood that the data so used may be interchanged under appropriate circumstances such that embodiments of the application described herein may be used. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.

It will be understood that when an element such as a layer, film, region, or substrate is referred to as being "on" another element, it can be directly on the other element or intervening elements may also be present. Also, in the specification and claims, when an element is described as being "connected" to another element, the element may be "directly connected" to the other element or "connected" to the other element through a third element.

As mentioned in the background of the invention, in order to solve the above problem, in the prior art, the clock frequency correction has poor real-time performance, and in an exemplary embodiment of the present application, a calibration method, a calibration apparatus, a computer-readable storage medium, a processor, and a clock frequency correction system for clock frequency are provided.

According to an embodiment of the present application, a method of calibrating a clock frequency is provided.

Fig. 1 is a flowchart of a method for calibrating a clock frequency according to an embodiment of the present application. As shown in fig. 1, the method comprises the steps of:

step S101, obtaining temperature voltage equivalent and clock frequency corresponding to at least two junction temperature, wherein the junction temperature is the working temperature of a clock signal unit, and the clock frequency is the frequency of a clock signal generated by the clock signal unit;

step S102, determining a first relational expression according to the temperature voltage equivalent and the clock frequency, wherein the first relational expression is a relational expression of the temperature voltage equivalent and the clock frequency;

step S103, determining the corresponding temperature voltage equivalent according to the current junction temperature to obtain the current temperature voltage equivalent;

step S104, calculating the current clock frequency according to the current temperature voltage equivalent and the first relational expression;

step S105, calculating the difference value between the current clock frequency and the standard clock frequency to obtain the clock frequency deviation;

step S106, correcting the clock frequency according to the clock frequency deviation.

Firstly, acquiring temperature voltage equivalent and clock frequency corresponding to at least two junction temperature, wherein the junction temperature is the working temperature of a clock signal unit, and the clock frequency is the frequency of a clock signal generated by the clock signal unit; then, determining a first relational expression according to the temperature voltage equivalent and the clock frequency, wherein the first relational expression is a relational expression of the temperature voltage equivalent and the clock frequency; then, determining the corresponding temperature voltage equivalent according to the current junction temperature to obtain the current temperature voltage equivalent; then, calculating the current clock frequency according to the current temperature voltage equivalent and the first relational expression; then, calculating the difference value between the current clock frequency and the standard clock frequency to obtain the clock frequency deviation; and finally, correcting the clock frequency according to the clock frequency deviation. The calibration method determines the first relational expression by acquiring the temperature voltage equivalent and the clock frequency corresponding to at least two junction temperature, namely, the current temperature voltage equivalent can be acquired in real time, and the clock frequency at the current junction temperature is calculated according to the first relational expression, so that the clock frequency deviation can be obtained by calculating the difference value between the current clock frequency and the standard clock frequency, the problem of correction delay caused by calculating the clock frequency deviation by counting the clock frequency for a period of time is solved, the real-time performance of clock frequency calibration is improved, and the problem of poor real-time performance of clock frequency correction in the prior art is solved.

It should be noted that the clock signal unit may be a phase-locked loop, and certainly not limited to a phase-locked loop, and a person skilled in the art may apply the calibration method to other clock signal units as needed.

It should also be noted that the steps illustrated in the flowcharts of the figures may be performed in a computer system such as a set of computer-executable instructions and that, although a logical order is illustrated in the flowcharts, in some cases, the steps illustrated or described may be performed in an order different than presented herein.

In one embodiment of the present application, as shown in fig. 2, the calibration circuit includes at least three current sources 10, at least three switches 20, a temperature sensor 30, a voltage dividing resistor 40 and a transistor 50, the current sources 10 and the switches 20 form a plurality of parallel power supply branches, any one of the power supply branches includes one of the current sources 10 and one of the switches 20 connected in series, a common terminal of at least three parallel power supply branches is connected to one end of the temperature sensor 30, the other end of the temperature sensor 30 is connected to one end of the voltage dividing resistor 40, the other end of the voltage dividing resistor 40 is connected to a collector of the transistor 50, a base and an emitter of the transistor 50 are grounded, the temperature sensor 30 is configured to convert a temperature signal into a voltage signal, and detection currents corresponding to any two of the power supply branches are different, the step of determining the corresponding temperature-voltage equivalent according to the current junction temperature to obtain a current temperature-voltage equivalent includes: detecting voltage values of the temperature sensors corresponding to at least three detection currents at the current junction temperature to obtain at least three first voltages; and calculating the current temperature voltage equivalent according to at least three first voltages. Specifically, the current sources of different power supply branches may input different detection currents to the temperature sensors, so as to detect voltage values of the temperature sensors corresponding to at least three detection currents, obtain at least three first voltages, and calculate the current temperature voltage equivalent according to a relation between the first voltages and the current temperature voltage equivalent.

In an embodiment of the present application, detecting a voltage value of the temperature sensor at the current junction temperature to obtain at least three first voltages includes: and at the current junction temperature, sequentially closing the switches and introducing corresponding detection currents to obtain at least three first voltages. Specifically, at the current junction temperature, the switches are sequentially closed and corresponding detection currents are introduced, that is, the switch of one power supply branch is closed, and the switches of other power supply branches are all opened, so that at least three detection currents are input to the temperature sensor, and thus at least three first voltages are obtained.

In an embodiment of the application, calculating the equivalent of the current temperature voltage according to at least three first voltages includes: obtaining a relational expression between the first voltage and a second voltage corresponding to the same moment to obtain at least three second relational expressions, wherein the second voltage is the voltage of a collector of the transistor; substituting a third relational expression into the second relational expression to obtain at least three fourth relational expressions, wherein the third relational expression is a relational expression of the second voltage and the temperature voltage equivalent, and the third relational expression is determined according to a current and voltage formula of a PN junction; processing at least three of the fourth relational expressions by a subtractive method to obtain a fifth relational expression, wherein the fifth relational expression is a relational expression between the temperature-voltage equivalent and the first voltage; and substituting at least three first voltages into the fifth relational expression to calculate the temperature-voltage equivalent. Specifically, there is V at the first voltage_SEN1、V_SEN2And V_SEN3In the case of three, the three second relational expressions are respectively V_SEN1＝V_BE1+I_c1R_p，V_SEN2＝V_BE2+I_c2R_p，V_SEN3＝V_BE3+I_c3R_pWherein, I_c1、I_c2And I_c3For detecting current, V_BE1、V_BE2And V_BE3Are all the second voltage, R_pIs a voltage-dividing resistor, the calibration circuit is an equivalent circuit, R_pIs the integrated resistance of the transistor, cannot be measured, and the current and voltage formula of the PN junction is I_c＝I_s[exp(V_BE/V_T)-1]≈I_sexp(V_BE/V_T) Wherein, I_sFor reverse saturation leakage current, V_TIs equivalent to temperature and voltage, so that a third relation V can be derived_BE＝V_T ln(I_c/I_s) Substituting the third relational expression into the three second relational expressions to obtain three fourth relational expressions V_SEN1＝V_T ln(I_c1/I_s)+I_c1R_p，V_SEN2＝V_T ln(I_c2/I_s)+I_c2R_p，V_SEN3＝V_T ln(I_c3/I_s)+I_c3R_pProcessing the three fourth relational expressions by using a elimination method to eliminate R which cannot be measured_pAnd I_sTo obtain a fifth relation, e.g. I_c3+I_c2＝2I_c1Then the fifth relation V_T＝(2V_SEN1-V_SEN2-V_SEN3)/[ln(I_c1/I_c2)+ln(I_c1/I_c3)]Will V_SEN1、V_SEN2、V_SEN3、I_c1、I_c2And I_c3And substituting to obtain the temperature voltage equivalent.

In one embodiment of the present application, the number of the power supply branches is four, and the four detection currents are a first detection current, a second detection current, a third detection current and a fourth detection current, respectively, where the second detection current is 2 times the first detection current, the third detection current is 10 times the first detection current, and the fourth detection current is 10 times the second detection current. Specifically, the number of the power supply branches is four, and the first voltage has V_SEN1、V_SEN2、V_SEN3And V_SEN4Four, four second relational expressions are respectively V_SEN1＝V_BE1+I_c1R_p，V_SEN2＝V_BE2+I_c2R_p，V_SEN3＝V_BE3+I_c3R_p，V_SEN4＝V_BE4+I_c4R_pWherein, I_c1、I_c2、I_c3And I_c4For detecting current, V_BE1、V_BE2、V_BE3And V_BE4Are all the second voltage, R_pSubstituting the third relational expression into the four second relational expressions to obtain four fourth relational expressions V_SEN1＝V_T ln(I_c1/I_s)+I_c1R_p，V_SEN2＝V_T ln(I_c2/I_s)+I_c2R_p，V_SEN3＝V_T ln(I_c3/I_s)+I_c3R_p，V_SEN4＝V_T ln(I_c4/I_s)+I_c4R_pWherein, I_c2＝2I_c1，I_c3＝10I_c1，I_c4＝20I_c1Processing four fourth relational expressions by using a elimination method to eliminate R which cannot be measured_pAnd I_sTo obtain a fifth relation, a fifth relation V_T＝[2(V_SEN3-V_SEN1)-(V_SEN4-V_SEN2)]/ln10, from V_SEN1、V_SEN2、V_SEN3And V_SEN4And substituting to obtain the temperature voltage equivalent.

In an embodiment of the present application, determining the first relation according to the equivalent of the temperature voltage and the clock frequency includes: calculating a first parameter and a second parameter according to at least two temperature-voltage equivalents and the corresponding clock frequency, wherein the first parameter is a slope of the first relational expression, and the second parameter is an intercept of the first relational expression; and determining the first relational expression according to the first parameter and the second parameter. Specifically, simulation experiments show that the temperature voltage equivalent and the clock frequency have a linear relationship, i.e., the first relation is F_T＝k*V_TAnd b, wherein k is a first parameter, b is a second parameter, and the first parameter k and the second parameter b are obtained by calculation according to at least two temperature-voltage equivalent values and the corresponding clock frequencies, so that a first relational expression is obtained.

The embodiment of the present application further provides a calibration apparatus for clock frequency, and it should be noted that the calibration apparatus for clock frequency of the embodiment of the present application may be used to execute the calibration method for clock frequency provided by the embodiment of the present application. The following describes a clock frequency calibration apparatus provided in an embodiment of the present application.

Fig. 3 is a schematic diagram of a device for calibrating a clock frequency according to an embodiment of the present application. As shown in fig. 3, the apparatus includes:

an obtaining unit 100, configured to obtain at least two temperature voltage equivalents and a clock frequency corresponding to the junction temperature, where the clock frequency is a frequency of a clock signal generated by the clock signal unit;

a first determining unit 200 configured to determine a first relational expression based on the temperature-voltage equivalent and the clock frequency, the first relational expression being a relational expression between the temperature-voltage equivalent and the clock frequency;

a second determining unit 300, configured to determine the corresponding temperature-voltage equivalent according to the current junction temperature to obtain a current temperature-voltage equivalent;

a first calculating unit 400, configured to calculate a current clock frequency according to the current temperature-voltage equivalent and the first relation;

a second calculating unit 500, configured to calculate a difference between the current clock frequency and a standard clock frequency to obtain a clock frequency deviation;

a correcting unit 600, configured to correct the clock frequency according to the current clock frequency deviation.

In the calibration device of the clock frequency, an obtaining unit obtains temperature voltage equivalent and clock frequency corresponding to at least two junction temperature, wherein the junction temperature is the working temperature of a clock signal unit, and the clock frequency is the frequency of a clock signal generated by the clock signal unit; a first determining unit that determines a first relational expression, which is a relational expression between the temperature voltage equivalent and the clock frequency, based on the temperature voltage equivalent and the clock frequency; the second determining unit determines the corresponding temperature voltage equivalent according to the current junction temperature to obtain the current temperature voltage equivalent; the first calculating unit calculates the current clock frequency according to the current temperature voltage equivalent and the first relational expression; the second calculating unit calculates the difference value between the current clock frequency and the standard clock frequency to obtain the clock frequency deviation; the correcting unit corrects the clock frequency according to the clock frequency deviation. The calibration device determines the first relational expression by acquiring the temperature voltage equivalent and the clock frequency corresponding to at least two junction temperature, namely, the current temperature voltage equivalent can be acquired in real time, and the clock frequency at the current junction temperature is calculated according to the first relational expression, so that the clock frequency deviation can be obtained by calculating the difference value between the current clock frequency and the standard clock frequency, the problem of correction delay caused by calculating the clock frequency deviation by counting the clock frequency for a period of time is solved, the real-time performance of clock frequency calibration is improved, and the problem of poor real-time performance of clock frequency correction in the prior art is solved.

In one embodiment of the present application, as shown in fig. 2, the calibration circuit includes at least three current sources 10, at least three switches 20, a temperature sensor 30, a voltage dividing resistor 40 and a transistor 50, the current sources 10 and the switches 20 form a plurality of parallel power supply branches, any one of the power supply branches includes one of the current sources 10 and one of the switches 20 connected in series, a common terminal of at least three parallel power supply branches is connected to one end of the temperature sensor 30, the other end of the temperature sensor 30 is connected to one end of the voltage dividing resistor 40, the other end of the voltage dividing resistor 40 is connected to a collector of the transistor 50, a base and an emitter of the transistor 50 are grounded, the temperature sensor 30 is configured to convert a temperature signal into a voltage signal, and detection currents corresponding to any two of the power supply branches are different, the detection current is a current flowing through the power supply branch circuit during detection, the electrical characteristics of the transistor are the same as those of the clock signal unit, and the second determination unit comprises a detection module and a first calculation module, wherein the detection module is used for detecting voltage values of the temperature sensors corresponding to at least three detection currents at the current junction temperature to obtain at least three first voltages; the first calculating module is used for calculating the current temperature voltage equivalent according to at least three first voltages. Specifically, the current sources of different power supply branches may input different detection currents to the temperature sensors, so as to detect voltage values of the temperature sensors corresponding to at least three detection currents, obtain at least three first voltages, and calculate the current temperature voltage equivalent according to a relation between the first voltages and the current temperature voltage equivalent.

In an embodiment of the application, the detection module is configured to, at the current junction temperature, sequentially close the switches and supply the corresponding detection currents to obtain at least three first voltages. Specifically, at the current junction temperature, the switches are sequentially closed and corresponding detection currents are introduced, that is, the switch of one power supply branch is closed, and the switches of other power supply branches are all opened, so that at least three detection currents are input to the temperature sensor, and thus at least three first voltages are obtained.

In an embodiment of the application, the first calculation module includes an obtaining submodule, a first calculation submodule, a second calculation submodule, and a third calculation submodule, where the obtaining submodule is configured to obtain a relational expression between the first voltage and a second voltage corresponding to the same time to obtain at least three second relational expressions, where the second voltage is a voltage of a collector of the transistor; the first calculation submodule is used for substituting a third relational expression into the second relational expression to obtain at least three fourth relational expressions, wherein the third relational expression is a relational expression of the second voltage and the temperature voltage equivalent, and the third relational expression is determined according to a current and voltage formula of a PN junction; the second calculation submodule is configured to process at least three of the fourth relational expressions by using a elimination method to obtain a fifth relational expression, where the fifth relational expression is a relational expression between the temperature-voltage equivalent and the first voltage; and the third calculation submodule is used for substituting at least three first voltages into the fifth relational expression to calculate the temperature-voltage equivalent. Specifically, there is V at the first voltage_SEN1、V_SEN2And V_SEN3Three cases, three second relational expressionsAre each V_SEN1＝V_BE1+I_c1R_p，V_SEN2＝V_BE2+I_c2R_p，V_SEN3＝V_BE3+I_c3R_pWherein, I_c1、I_c2And I_c3For detecting current, V_BE1、V_BE2And V_BE3Are all the second voltage, R_pIs a voltage-dividing resistor, the calibration circuit is an equivalent circuit, R_pIs the integrated resistance of the transistor, cannot be measured, and the current and voltage formula of the PN junction is I_c＝I_s[exp(V_BE/V_T)-1]≈I_sexp(V_BE/V_T) Wherein, I_sFor reverse saturation leakage current, V_TIs equivalent to temperature and voltage, so that a third relation V can be derived_BE＝V_T ln(I_c/I_s) Substituting the third relational expression into the three second relational expressions to obtain three fourth relational expressions V_SEN1＝V_T ln(I_c1/I_s)+I_c1R_p，V_SEN2＝V_T ln(I_c2/I_s)+I_c2R_p，V_SEN3＝V_T ln(I_c3/I_s)+I_c3R_pProcessing the three fourth relational expressions by using a elimination method to eliminate R which cannot be measured_pAnd I_sTo obtain a fifth relation, e.g. I_c3+I_c2＝2I_c1Then the fifth relation V_T＝(2V_SEN1-V_SEN2-V_SEN3)/[ln(I_c1/I_c2)+ln(I_c1/I_c3)]Will V_SEN1、V_SEN2、V_SEN3、I_c1、I_c2And I_c3And substituting to obtain the temperature voltage equivalent.

In one embodiment of the present application, the number of the power supply branches is four, the four detection currents are a first detection current, a second detection current, a third detection current and a fourth detection current, the second detection current is 2 times the first detection current, the third detection current is 10 times the first detection current, and the fourth detection current isThe current is 10 times the second detection current. Specifically, the number of the power supply branches is four, and the first voltage has V_SEN1、V_SEN2、V_SEN3And V_SEN4Four, four second relational expressions are respectively V_SEN1＝V_BE1+I_c1R_p，V_SEN2＝V_BE2+I_c2R_p，V_SEN3＝V_BE3+I_c3R_p，V_SEN4＝V_BE4+I_c4R_pWherein, I_c1、I_c2、I_c3And I_c4For detecting current, V_BE1、V_BE2、V_BE3And V_BE4Are all the second voltage, R_pSubstituting the third relational expression into the four second relational expressions to obtain four fourth relational expressions V_SEN1＝V_T ln(I_c1/I_s)+I_c1R_p，V_SEN2＝V_T ln(I_c2/I_s)+I_c2R_p，V_SEN3＝V_T ln(I_c3/I_s)+I_c3R_p，V_SEN4＝V_T ln(I_c4/I_s)+I_c4R_pWherein, I_c2＝2I_c1，I_c3＝10I_c1，I_c4＝20I_c1Processing four fourth relational expressions by using a elimination method to eliminate R which cannot be measured_pAnd I_sTo obtain a fifth relation, a fifth relation V_T＝[2(V_SEN3-V_SEN1)-(V_SEN4-V_SEN2)]/ln10, from V_SEN1、V_SEN2、V_SEN3And V_SEN4And substituting to obtain the temperature voltage equivalent.

In an embodiment of the application, the first determining unit includes a second calculating module and a determining module, wherein the second calculating module is configured to calculate a first parameter and a second parameter according to at least two of the temperature-voltage equivalents and the corresponding clock frequency, the first parameter is a slope of the first relation, and the second parameter is an intercept of the first relation; the above-mentionedThe fixed module is used for determining the first relational expression according to the first parameter and the second parameter. Specifically, simulation experiments show that the temperature voltage equivalent and the clock frequency have a linear relationship, i.e., the first relation is F_T＝k*V_TAnd b, wherein k is a first parameter, b is a second parameter, and the first parameter k and the second parameter b are obtained by calculation according to at least two temperature-voltage equivalent values and the corresponding clock frequencies, so that a first relational expression is obtained.

The embodiment of the present application further provides a clock frequency correction system, which includes a clock signal unit and a clock frequency calibration device, where the clock frequency calibration device is configured to perform any one of the above methods.

The clock frequency correction system comprises a clock signal unit and a clock frequency calibration device, wherein an acquisition unit acquires temperature voltage equivalent and clock frequency corresponding to at least two junction temperature units, the junction temperature is the working temperature of the clock signal unit, and the clock frequency is the frequency of a clock signal generated by the clock signal unit; a first determining unit that determines a first relational expression, which is a relational expression between the temperature voltage equivalent and the clock frequency, based on the temperature voltage equivalent and the clock frequency; the second determining unit determines the corresponding temperature voltage equivalent according to the current junction temperature to obtain the current temperature voltage equivalent; the first calculating unit calculates the current clock frequency according to the current temperature voltage equivalent and the first relational expression; the second calculating unit calculates the difference value between the current clock frequency and the standard clock frequency to obtain the clock frequency deviation; the correcting unit corrects the clock frequency according to the clock frequency deviation. The calibration device determines the first relational expression by acquiring the temperature voltage equivalent and the clock frequency corresponding to at least two junction temperature, namely, the current temperature voltage equivalent can be acquired in real time, and the clock frequency at the current junction temperature is calculated according to the first relational expression, so that the clock frequency deviation can be obtained by calculating the difference value between the current clock frequency and the standard clock frequency, the problem of correction delay caused by calculating the clock frequency deviation by counting the clock frequency for a period of time is solved, the real-time performance of clock frequency calibration is improved, and the problem of poor real-time performance of clock frequency correction in the prior art is solved.

The calibration device for the clock frequency comprises a processor and a memory, wherein the acquisition unit, the first determination unit, the second determination unit, the calculation unit, the correction unit and the like are stored in the memory as program units, and the processor executes the program units stored in the memory to realize corresponding functions.

The processor comprises a kernel, and the kernel calls the corresponding program unit from the memory. The kernel can be set to be one or more than one, and the problem of poor real-time performance of clock frequency correction in the prior art is solved by adjusting kernel parameters.

The memory may include volatile memory in a computer readable medium, Random Access Memory (RAM) and/or nonvolatile memory such as Read Only Memory (ROM) or flash memory (flash RAM), and the memory includes at least one memory chip.

An embodiment of the present invention provides a computer-readable storage medium on which a program is stored, which when executed by a processor implements the above-described method.

The embodiment of the invention provides a processor, which is used for running a program, wherein the method is executed when the program runs.

The embodiment of the invention provides equipment, which comprises a processor, a memory and a program which is stored on the memory and can run on the processor, wherein when the processor executes the program, at least the following steps are realized:

step S101, obtaining temperature voltage equivalent and clock frequency corresponding to at least two junction temperature, wherein the junction temperature is the working temperature of a clock signal unit, and the clock frequency is the frequency of a clock signal generated by the clock signal unit;

step S102, determining a first relational expression according to the temperature voltage equivalent and the clock frequency, wherein the first relational expression is a relational expression of the temperature voltage equivalent and the clock frequency;

step S103, determining the corresponding temperature voltage equivalent according to the current junction temperature to obtain the current temperature voltage equivalent;

step S104, calculating the current clock frequency according to the current temperature voltage equivalent and the first relational expression;

step S105, calculating the difference value between the current clock frequency and the standard clock frequency to obtain the clock frequency deviation;

step S106, correcting the clock frequency according to the clock frequency deviation.

The device herein may be a server, a PC, a PAD, a mobile phone, etc.

The present application further provides a computer program product adapted to perform a program of initializing at least the following method steps when executed on a data processing device:

step S101, obtaining temperature voltage equivalent and clock frequency corresponding to at least two junction temperature, wherein the junction temperature is the working temperature of a clock signal unit, and the clock frequency is the frequency of a clock signal generated by the clock signal unit;

step S102, determining a first relational expression according to the temperature voltage equivalent and the clock frequency, wherein the first relational expression is a relational expression of the temperature voltage equivalent and the clock frequency;

step S103, determining the corresponding temperature voltage equivalent according to the current junction temperature to obtain the current temperature voltage equivalent;

step S104, calculating the current clock frequency according to the current temperature voltage equivalent and the first relational expression;

step S105, calculating the difference value between the current clock frequency and the standard clock frequency to obtain the clock frequency deviation;

step S106, correcting the clock frequency according to the clock frequency deviation.

In the above embodiments of the present invention, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.

In the embodiments provided in the present application, it should be understood that the disclosed technology can be implemented in other ways. The above-described embodiments of the apparatus are merely illustrative, and for example, the above-described division of the units may be a logical division, and in actual implementation, there may be another division, for example, multiple units or components may be combined or may be integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, units or modules, and may be in an electrical or other form.

The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.

In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.

The integrated unit may be stored in a computer-readable storage medium if it is implemented in the form of a software functional unit and sold or used as a separate product. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a computer-readable storage medium and includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned computer-readable storage media comprise: a U-disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a removable hard disk, a magnetic or optical disk, and other various media capable of storing program codes.

From the above description, it can be seen that the above-described embodiments of the present application achieve the following technical effects:

1) in the clock frequency calibration method, firstly, temperature voltage equivalent and clock frequency corresponding to at least two junction temperature are obtained, wherein the junction temperature is the working temperature of a clock signal unit, and the clock frequency is the frequency of a clock signal generated by the clock signal unit; then, determining a first relational expression according to the temperature voltage equivalent and the clock frequency, wherein the first relational expression is a relational expression of the temperature voltage equivalent and the clock frequency; then, determining the corresponding temperature voltage equivalent according to the current junction temperature to obtain the current temperature voltage equivalent; then, calculating the current clock frequency according to the current temperature voltage equivalent and the first relational expression; then, calculating the difference value between the current clock frequency and the standard clock frequency to obtain the clock frequency deviation; and finally, correcting the clock frequency according to the clock frequency deviation. The calibration method determines the first relational expression by acquiring the temperature voltage equivalent and the clock frequency corresponding to at least two junction temperature, namely, the current temperature voltage equivalent can be acquired in real time, and the clock frequency at the current junction temperature is calculated according to the first relational expression, so that the clock frequency deviation can be obtained by calculating the difference value between the current clock frequency and the standard clock frequency, the problem of correction delay caused by calculating the clock frequency deviation by counting the clock frequency for a period of time is solved, the real-time performance of clock frequency calibration is improved, and the problem of poor real-time performance of clock frequency correction in the prior art is solved.

2) In the clock frequency calibration device, an obtaining unit obtains temperature voltage equivalent and clock frequency corresponding to at least two junction temperature units, wherein the junction temperature is the working temperature of a clock signal unit, and the clock frequency is the frequency of a clock signal generated by the clock signal unit; a first determining unit that determines a first relational expression, which is a relational expression between the temperature voltage equivalent and the clock frequency, based on the temperature voltage equivalent and the clock frequency; the second determining unit determines the corresponding temperature voltage equivalent according to the current junction temperature to obtain the current temperature voltage equivalent; the first calculating unit calculates the current clock frequency according to the current temperature voltage equivalent and the first relational expression; the second calculating unit calculates the difference value between the current clock frequency and the standard clock frequency to obtain the clock frequency deviation; the correcting unit corrects the clock frequency according to the clock frequency deviation. The calibration device determines the first relational expression by acquiring the temperature voltage equivalent and the clock frequency corresponding to at least two junction temperature, namely, the current temperature voltage equivalent can be acquired in real time, and the clock frequency at the current junction temperature is calculated according to the first relational expression, so that the clock frequency deviation can be obtained by calculating the difference value between the current clock frequency and the standard clock frequency, the problem of correction delay caused by calculating the clock frequency deviation by counting the clock frequency for a period of time is solved, the real-time performance of clock frequency calibration is improved, and the problem of poor real-time performance of clock frequency correction in the prior art is solved.

3) The clock frequency correction system comprises a clock signal unit and a clock frequency calibration device, wherein an acquisition unit acquires temperature voltage equivalent and clock frequency corresponding to at least two junction temperature units, the junction temperature is the working temperature of the clock signal unit, and the clock frequency is the frequency of a clock signal generated by the clock signal unit; a first determining unit that determines a first relational expression, which is a relational expression between the temperature voltage equivalent and the clock frequency, based on the temperature voltage equivalent and the clock frequency; the second determining unit determines the corresponding temperature voltage equivalent according to the current junction temperature to obtain the current temperature voltage equivalent; the first calculating unit calculates the current clock frequency according to the current temperature voltage equivalent and the first relational expression; the second calculating unit calculates the difference value between the current clock frequency and the standard clock frequency to obtain the clock frequency deviation; the correcting unit corrects the clock frequency according to the clock frequency deviation. The calibration device determines the first relational expression by acquiring the temperature voltage equivalent and the clock frequency corresponding to at least two junction temperature, namely, the current temperature voltage equivalent can be acquired in real time, and the clock frequency at the current junction temperature is calculated according to the first relational expression, so that the clock frequency deviation can be obtained by calculating the difference value between the current clock frequency and the standard clock frequency, the problem of correction delay caused by calculating the clock frequency deviation by counting the clock frequency for a period of time is solved, the real-time performance of clock frequency calibration is improved, and the problem of poor real-time performance of clock frequency correction in the prior art is solved.

The above description is only a preferred embodiment of the present application and is not intended to limit the present application, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application.