阅读说明：本技术 一种太阳能电池片的检测探针 (Detection probe of solar cell ) 是由 庞朝江 李瑞波 崔国庆 申朝锋 姚亮博 陈博 王维涛 刘锦鹏 于 2021-08-27 设计创作，主要内容包括：本申请提供了一种太阳能电池片的检测探针,包括：针柱、针套和弹簧；针套包括盖板和中空的套筒,盖板覆盖于套筒的一端；弹簧的两端磨平且并紧,弹簧放置于套筒内,并且弹簧能够在套筒中沿套筒的轴线方向自由伸缩,弹簧的一端抵接于盖板；针柱从一端至另一端依次包括穿设段、抵接段、配合和探头；穿设段和抵接段位于套筒内,穿设段靠近盖板,且穿设弹簧的部分,配合段部分位于套筒内,部分伸出套筒,穿设段、抵接段和配合段均与套筒的内壁间隙配合；套筒的内壁上设有向内的凸起结构,凸起结构用于将抵接段限位在凸起结构靠近盖板的一侧。探针在使用过程中,弹簧在受力时会沿着套筒的轴线方向进行伸缩,并引导针柱沿轴线方向移动。(The application provides a solar wafer's test probe includes: a needle cylinder, a needle sleeve and a spring; the needle sleeve comprises a cover plate and a hollow sleeve, and the cover plate covers one end of the sleeve; two ends of the spring are ground flat and tightened, the spring is placed in the sleeve and can freely stretch and retract in the sleeve along the axial direction of the sleeve, and one end of the spring abuts against the cover plate; the needle column sequentially comprises a penetrating section, an abutting section, a matching section and a probe from one end to the other end; the penetrating section and the abutting section are positioned in the sleeve, the penetrating section is close to the cover plate and penetrates through the part of the spring, the matching section is partially positioned in the sleeve and partially extends out of the sleeve, and the penetrating section, the abutting section and the matching section are in clearance fit with the inner wall of the sleeve; be equipped with inside protruding structure on telescopic inner wall, protruding structure is used for spacing the butt section in one side that protruding structure is close to the apron. When the probe is used, the spring can stretch along the axial direction of the sleeve when stressed, and the needle column is guided to move along the axial direction.)

1. A detection probe of a solar cell is characterized by comprising: a needle cylinder (1), a needle sleeve (2) and a spring (3);

the needle sleeve (2) comprises a cover plate (22) and a hollow sleeve (21), and the cover plate (22) covers one end of the sleeve (21);

two ends of the spring (3) are ground flat and tightened, the spring (3) is placed in the sleeve (21), the spring (3) can freely stretch and retract in the sleeve (21) along the axial direction of the sleeve (21), and one end of the spring (3) abuts against the cover plate (22);

the needle column (1) sequentially comprises a penetrating section (100), an abutting section (13), a matching section (14) and a probe (15) from one end to the other end;

the penetrating section (100) and the abutting section (13) are positioned in the sleeve (21), the penetrating section (100) is close to the cover plate (22) and penetrates through the part of the spring (3), the matching section (14) is partially positioned in the sleeve (21) and partially extends out of the sleeve (21), and the penetrating section (100), the abutting section (13) and the matching section (14) are in clearance fit with the inner wall of the sleeve (21);

the inner wall of the sleeve (21) is provided with an inward protruding structure (23), and the protruding structure (23) is used for limiting the abutting section (13) at one side of the protruding structure (23) close to the cover plate (22).

2. The solar cell detection probe according to claim 1, wherein the penetrating segment (100) comprises a lead-in segment (11);

the diameter of the introduction section (11) is smaller than the inner diameter of the spring (3), and the inner diameter of the spring (3) is smaller than the diameter of the abutting section (13);

the diameter of the abutting section (13) is larger than that of the matching section (14);

the diameter of the probe (15) is larger than the inner diameter of the sleeve (21).

3. The solar cell detection probe according to claim 2, wherein the penetrating segment (100) further comprises: a transition section (12), the transition section (12) being located between the abutment section (13) and the introduction section (11);

the diameter of the transition section (12) is smaller than that of the lead-in section (11);

the end face of the leading-in section (11) far away from the transition section (12) is a conical surface.

4. The solar cell detection probe according to claim 1, wherein the needle cylinder (1) is made of beryllium copper, the needle sleeve (2) is made of brass, and the spring (3) is made of titanium alloy.

5. The solar cell detection probe according to claim 1, wherein the spring (3) is a compression spring;

the length of the spring (3) in a natural state is smaller than a first distance, so that the spring (3) is in a pre-compression state, when the abutting section (13) is far away from the end face of the cover plate (22) and abuts against the protruding structure (23), the first distance is the distance between the end face of the abutting section (13) close to the cover plate (22) and the surface of the cover plate (22) close to the spring (3).

6. The solar cell detection probe according to claim 5, wherein the number of tight turns of the spring (3) at both ends is between 2 and 11.

7. The solar cell detection probe according to claim 1, wherein the cover plate (22) is a flat plate structure.

8. The detection probe of the solar cell piece is characterized in that a first nickel coating is arranged on the needle cylinder (1), and a first gold coating is arranged on the first nickel coating;

the needle sleeve (2) is provided with a second nickel coating, and a second gold coating is arranged on the second nickel coating;

a third nickel coating is arranged on the spring (3), and a third gold coating is arranged on the third nickel coating;

the thickness of first nickel coating, second nickel coating with the third nickel coating all is between 1-3um, the thickness of first gold coating, the second gold coating with the third gold coating all is between 0.2-2 um.

9. The solar cell detection probe according to claim 1, wherein the raised structure (23) comprises at least two annular projections (231);

at least two annular protrusions (231) are arranged at intervals along the axial direction of the sleeve (21).

10. The inspection probe for solar cells according to claim 9, wherein the cross-sectional shape of the annular protrusion (231) is any one of arc, square and triangle;

the height of the annular bulge (231) protruding out of the inner wall of the sleeve (21) is greater than 0mm and less than or equal to 0.3 mm.

Technical Field

The application relates to the technical field of solar cell production and manufacturing, in particular to a detection probe of a solar cell.

Background

Before the solar cell is finished, the solar cell must be subjected to a current Voltage test (IV) and an Electroluminescence (EL) test. The IV test is mainly used for testing the efficiency of the solar cell, and the EL test is mainly used for testing the defects of the solar cell. Currently, the solar cell is subjected to an IV test and an EL test by a probe.

However, when a force is applied to a spring in the conventional probe, axial distortion is easily generated, so that not only is the friction between a needle column of the probe and a sleeve of the probe abnormal and clamping stagnation generated, but also the probe of the probe is difficult to accurately position, and the reliability of the test is influenced.

Disclosure of Invention

The embodiment of the application provides a solar wafer's test probe to solve spring in the probe among the correlation technique and produce the axis distortion easily when the atress, lead to the probe of probe hardly to contact with solar wafer completely, influence the accuracy and the reliability of test.

In order to solve the technical problem, the present application is implemented as follows:

the embodiment of the application provides a solar wafer's test probe, its characterized in that includes: a needle cylinder, a needle sleeve and a spring;

the needle sleeve comprises a cover plate and a hollow sleeve, and the cover plate covers one end of the sleeve;

two ends of the spring are ground flat and tightened, the spring is placed in the sleeve, the spring can freely stretch and retract in the sleeve along the axial direction of the sleeve, one end of the spring abuts against the cover plate, and one end of the spring abuts against the cover plate;

the needle column sequentially comprises a penetrating section, an abutting section, a matching section and a probe from one end to the other end;

the penetrating section and the abutting section are positioned in the sleeve, the penetrating section is close to the cover plate and penetrates through the part of the spring, the matching section is partially positioned in the sleeve and partially extends out of the sleeve, and the penetrating section, the abutting section and the matching section are in clearance fit with the inner wall of the sleeve;

the inner wall of the sleeve is provided with a protruding structure, and the protruding structure is used for limiting the abutting section at one side of the protruding structure close to the cover plate.

In the embodiment of the application, the detection probe of the solar cell has at least the following advantages;

because the both ends of spring are for grinding flat and tight, the one end butt in the apron of spring, the spring can freely stretch out and draw back along telescopic axis direction in the sleeve, the section of wearing to establish of stylophore wears to establish the part of spring, like this, the test probe is in the use, the spring can stretch out and draw back along telescopic axis direction when the atress, and the guide stylophore removes along axis direction, thereby reduce the jamming that friction and lead to between stylophore and the sleeve inner wall, long-term use is because the rigid action of spring, still can keep better guide effect, thereby the reliability of probe has been guaranteed, the life of test probe has been prolonged.

Drawings

FIG. 1 is a schematic diagram of a detection probe according to an embodiment of the present disclosure;

FIG. 2 is a schematic structural diagram of a needle sheath of a detection probe according to an embodiment of the present disclosure;

FIG. 3 is a schematic structural diagram of a stylus of a detection probe according to an embodiment of the present disclosure;

fig. 4 is a schematic structural diagram of a spring of a detection probe according to an embodiment of the present disclosure.

Reference numerals:

1-needle column, 100-penetrating section, 11-leading-in section, 12-transition section, 13-abutting section, 14-matching section, 15-probe, 2-needle sleeve, 21-sleeve, 22-cover plate, 23-bulge structure, 231-annular bulge and 3-spring.

Detailed Description

The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some, but not all, embodiments of the present application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

It should be appreciated that reference throughout this specification to "one embodiment" or "an embodiment" means that a particular feature, structure or characteristic described in connection with the embodiment is included in at least one embodiment of the present application. Thus, the appearances of the phrases "in one embodiment" or "in an embodiment" in various places throughout this specification are not necessarily all referring to the same embodiment. Furthermore, the particular features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.

In the embodiment of the present application, a solar cell detection probe is provided, referring to fig. 1 to 4, the solar cell detection probe specifically may include a needle cylinder 1, a needle sleeve 2 and a spring 3, the needle sleeve 2 includes a cover plate 22 and a hollow sleeve 21, the cover plate 22 covers one end of the sleeve 21, two ends of the spring 3 are ground flat and tight, the spring 3 is placed in the sleeve 21, and the spring 3 can freely extend and retract in the sleeve 21 along an axial direction of the sleeve 21; the needle column 1 comprises a penetrating section 100, an abutting section 13, a matching section 14 and a probe 15 from one end to the other end in sequence; the penetrating section 100 and the abutting section 13 are positioned in the sleeve 21, the penetrating section 100 is close to the cover plate 22 and penetrates through the part of the spring 3, the matching section 14 is partially positioned in the sleeve 21 and partially extends out of the sleeve 21, and the penetrating section 100, the abutting section 13 and the matching section 14 are in clearance fit with the inner wall of the sleeve 21; an inward protruding structure 23 is arranged on the inner wall of the sleeve 21, and the protruding structure 23 is used for limiting the abutting section 13 at one side of the protruding structure 23 close to the cover plate 22. The detecting probe of this embodiment is in the use, and spring 3 can stretch out and draw back along telescopic axis direction when the atress to the guide stylar removes along axis direction, thereby reduces the jamming that friction and lead to between stylar and the sleeve inner wall, uses for a long time because the rigid action of spring, still can keep better guide effect, thereby has guaranteed the reliability of probe, has prolonged the life of probe.

Specifically, as shown in fig. 1, the detection probe (hereinafter, referred to as detection probe) of the solar cell may include a needle cylinder 1, a needle sleeve 2 and a spring 3. As shown in fig. 2, the needle hub 2 includes a cover plate 22 and a hollow sleeve 21, that is, the sleeve 21 has a receiving space, and the cover plate 22 covers one end of the sleeve 21. In practical application, the sleeve 21 and the cover plate 22 are integrally formed, so that the strength of the needle sleeve 2 is higher, and the strength of the detection probe is higher, thereby prolonging the service life of the detection probe.

Specifically, as shown in fig. 4, the two ends of the spring 3 are ground flat and tight, so that the contact area between the spring 3 and its supporting surface can be increased, and the spring 3 can keep the reverse extension of the acting force direction without twisting the axis of the spring 3 as much as possible in the range of the working elastic force. As shown in fig. 1, the spring 3 is placed in the sleeve 21, one end of the spring 3 abuts on a surface of the cover plate 22 close to the sleeve 21 (simply referred to as an inner surface of the cover plate 22), and the spring 3 can freely expand and contract in the sleeve 21 in an axial direction (a vertical direction in the drawing) of the sleeve 21.

Specifically, as shown in fig. 3, the needle cylinder 1 includes a penetrating section 100, an abutting section 13, a matching section 14 and a probe 15 in sequence from one end to the other end, and the probe 15 is mainly used for performing an IV test and an EL test on a solar cell. The end face of the probe 15 remote from the fitting section 14 is flat so as to be stably contacted with the solar cell sheet for IV test and EL test.

Specifically, as shown in fig. 1, the penetrating section 100 and the abutting section 13 are located in the sleeve 21, and the penetrating section 100 is close to the cover plate 22, that is, the needle cylinder 1 penetrates into the accommodating space of the sleeve 21 from one end thereof. The piercing section 100 pierces the portion of the spring 3, and as can be seen in fig. 1, the piercing section 100 pierces from the other end of the spring 3, a distance towards one end of the spring 3. The mating segment 14 is partially located within the sleeve 21 and partially extends from the other end of the sleeve 21. Wear to establish section 100, butt section 13 and cooperation section 14 (specifically the part that cooperation section 14 is located sleeve 21) and the inner wall clearance fit of sleeve 21, like this, at the free flexible in-process of spring 3 along the axis direction of sleeve 21, also be in the spring 3 compressed or spring 3 is from the state of compressed to the in-process that original state recovered, the stylophore 1 can drive the probe and move along the axis direction of sleeve 21.

Specifically, as shown in fig. 1 and 2, the inner wall of the sleeve 21 is provided with an inward protruding structure 23, that is, the protruding structure 23 protrudes from the inner wall of the sleeve 21 in a direction from the outer wall to the inner wall of one side of the sleeve 21. The protruding structure 23 is mainly used for limiting the abutting section 13 at one side of the protruding structure 23 close to the cover plate 22, so as to prevent the needle column 1 from slipping out of the needle sleeve 2 in the using process of the detection probe, thereby influencing the detection of the detection probe. It should be noted that the protruding structure 23 is usually disposed at a position close to the other end of the sleeve 21, and of course, the specific disposition position of the protruding structure 23 may also be in the middle region of the sleeve 21.

Specifically, because both ends of the spring 3 are ground flat and tight, not only the contact area between the other end of the spring 3 and the lower end face of the abutting section 13 can be increased, but also the contact area between one end of the spring 3 and the inner surface of the cover plate 22 can be increased, so that the axial line distortion of the spring 3 is not generated as much as possible in the working elastic force range of the spring 3. And, detection probe is in the use, and spring 3 can stretch out and draw back along telescopic axis direction when the atress to guide the stylar to remove along axis direction, thereby reduce the jamming that leads to between stylar and the sleeve inner wall, long-term the use because the rigid action of spring, still can keep better guide effect, thereby guaranteed the accuracy and the reliability of probe, prolonged detection probe's life.

In the present embodiment, as shown in fig. 3, the piercing section 100 includes a lead-in section 11; the diameter of the lead-in section 11 is smaller than the inner diameter of the spring 3, and the inner diameter of the spring 3 is smaller than the diameter of the abutting section 13; the diameter of the abutment section 13 is greater than the diameter of the mating section 14; the diameter of the probe is larger than the inner diameter of the sleeve 21.

Specifically, when the introduction section 11 is inserted into the spring 3, the inner diameter of the spring 3 is in clearance fit with the outer diameter of the introduction section 11, that is, the inner diameter of the spring 3 is larger than the diameter of the introduction section 11, so that the spring 3 can be deformed. The clearance between the inner diameter of the spring 3 and the outer diameter of the lead-in section 11 is as small as possible to ensure that the spring 3 does not twist its axis when deformed.

Specifically, the diameter of the abutting section 13 should be larger than the inner diameter of the spring 3, that is, the diameter of the abutting section 13 is also larger than the diameter of the leading-in section 11, for example, the diameter of the abutting section 13 is 1.05-1.08mm, and the diameter of the leading-in section 11 is 0.9-0.95mm, so that when the spring 3 is compressed, the other end (the end far away from the cover plate 22) of the spring 3 can abut against the end surface (the lower end surface for short) of the abutting section 13 close to the cover plate 22, the lower end surface of the abutting section 13 can support the other end of the spring 3, and the axial position of the spring 3 is limited.

The engagement between the abutment section 13 (referred to as a shaft) and the inner wall (referred to as a hole) of the sleeve 21 is a clearance fit, for example: the basic size can be between phi 1.05 mm and phi 1.08mm, the clearance fit is formed by a hole tolerance zone H7 and a shaft tolerance zone g6, the fit precision is low, the abrasion degree of the needle column 1 and the sleeve 21 is low when the needle column and the sleeve 21 move, and the use frequency of the detection probe is improved. The clearance fit between the raised formations 23 and the mating segment 14 may also be in combination H7/g 6.

Specifically, as shown in fig. 3, since the inner wall of the sleeve 21 is provided with the protruding structures 23, it can be seen that the length of the radial space where the sleeve 21 is provided with the protruding structures 23 is smaller than the inner diameter of the sleeve 21. The protruding structure 23 limits the abutting section 13 on one side of the protruding structure 23 close to the cover plate 22, that is, part of the matching section 14 is located at the position where the protruding structure 23 is located on the sleeve 21, and since the matching section 14 is in clearance fit with the inner wall of the sleeve 21, the diameter of the matching section 14 should be smaller than the length of the radial space where the protruding structure 23 is located on the sleeve 21, and thus, the diameter of the abutting section 13 should be larger than the diameter of the matching section 14. For example, the maximum height of the raised formation 23 projecting beyond the inner wall of the sleeve 21 is less than 0.3mm, and the diameter of the mating segment 14 may be between 0.8 and 0.95 mm.

Specifically, as shown in fig. 3, the diameter of the probe is between 2-2.2mm, which is larger than the inner diameter of the sleeve 21, so that the probe enters the sleeve 21 when the needle cylinder 1 is moving towards the cover plate 22. As shown in fig. 3, the junction of the probe and the mating segment 14 is tapered to facilitate machining.

In the embodiment of the present application, as shown in fig. 3, the piercing section 100 further includes: a transition section 12, the transition section 12 being located between the abutment section 13 and the lead-in section 11; the diameter of the transition section 12 is smaller than that of the lead-in section 11; the end face of the lead-in section 11, which is far away from the transition section 12, is a conical surface.

Specifically, as shown in fig. 3, the penetrating segment 100 further includes a transition segment 12, the transition segment 12 is located between the abutting segment 13 and the introducing segment 11, the diameter of the transition segment 12 is smaller than that of the introducing segment 11, for example, the diameter of the transition segment 12 may be between 0.7 mm and 0.85mm, so that the abutting segment 13 is larger than that of the transition segment 12, and the area of the lower end surface of the abutting segment 13 abutting against the other end of the spring 3 may be increased to increase the contact area with the spring 3, so that the spring 3 may not generate axial distortion of the spring 3 within the working elastic force range as much as possible.

Specifically, as shown in fig. 3, the end surface of the leading-in section 11 far from the transition section 12 is a conical surface, so that the needle cylinder 1 can be conveniently guided into the sleeve 21 and can be arranged in the spring 3 in a penetrating way.

In the embodiment of the present application, the needle cylinder 1 is made of beryllium copper, the needle sleeve 2 is made of brass, and the spring 3 is made of titanium alloy.

Specifically, because beryllium copper has the advantages of high strength, high hardness, wear resistance, corrosion resistance, conductivity and the like, the pin 1 of the embodiment is made of beryllium copper, so that the pin 1 can be suitable for repeated contact testing of solar cells.

Particularly, because brass has advantages such as wearability and electric conductivity, the needle cover 2 of this embodiment adopts the brass material, promptly, the material of sleeve 21 and apron 22 adopts the brass material, mainly used avoids pin 1 and sleeve 21 to appear the friction damage in relative motion's process to improve detection probe's life.

Specifically, the spring 3 of the present embodiment is made of a titanium alloy material to improve the service life of the detection probe, because the titanium alloy has the advantages of high strength, good corrosion resistance, high heat resistance, good fatigue limit, and the like.

It should be noted that the materials of the needle cylinder 1, the needle sleeve 2, and the spring 3 are not limited to the above examples, and may be other materials, for example, the needle cylinder 1, the needle sleeve 2, and the spring 3 may all be made of stainless steel or an alloy material, and the specific materials of the needle cylinder 1, the needle sleeve 2, and the spring 3 in this embodiment may not be limited, and may be radially set according to the actual situation.

In the embodiment of the present application, the spring 3 is a compression spring; the length of the spring 3 in the natural state is smaller than the first distance, so that the spring 3 is in the pre-compression state, and when the end surface of the abutting section 13 far from the cover plate 22 abuts against the protruding structure 23, the first distance is the distance between the end surface of the abutting section 13 close to the cover plate 22 and the surface of the cover plate 22 close to the spring 3.

Specifically, when the spring 3 is in a natural state, the length of the spring 3 is smaller than the first distance, so that the spring 3 is in a pre-compressed state, thus, one end of the spring 3 can be tightly attached to the inner surface of the cover plate 22, and the other end of the spring 3 can be tightly attached to the lower end surface of the abutting section 13, so that the spring 3 does not generate axial line distortion when being subjected to a force in an axial direction (a vertical direction in the figure), thereby ensuring the accuracy of a probe test, and avoiding abnormal friction when the needle cylinder 1 and the sleeve 21 move relatively, thereby improving the use frequency of the detection probe. When the end surface of the abutting section 13 far from the cover plate 22 abuts against the protruding structure 23, the first distance is a distance between the end surface of the abutting section 13 close to the cover plate 22 and the surface of the cover plate 22 close to the spring 3, that is, the first distance is a distance between the lower end surface of the abutting section 13 and the inner surface of the cover plate 22. The compression distance of the pre-compression of the spring 3 is between 1 and 4mm, that is, the difference between the first distance and the length of the spring 3 is between 1 and 4mm, and the specific compression distance of the pre-compression of the spring 3 in the embodiment is not limited, and can be set according to actual conditions.

In the embodiment of the application, the number of the tight coils at the two ends of the spring 3 is between 2 and 11.

In practical application, in order to make the spring 3 uniformly stressed during operation and ensure that the axis of the spring 3 is perpendicular to the end surface of the spring 3, both ends of the spring 3 are often tightened when the spring 3 is manufactured. The number of tight turns at the two ends of the spring 3 is 2-11, so that the spring 3 does not generate axial line distortion when being subjected to force in the axial direction (the vertical direction of the figure), the accuracy of probe test is ensured, the use frequency of the test probe can be greatly improved, and the gallium mobility is improved.

Specifically, the wire diameter d of the spring 3 is the diameter of the material (such as titanium alloy, stainless steel, etc.) for manufacturing the spring 3, d is between 0.1 and 0.3mm, and the number of turns of the spring 3 is between 50 and 100, so that when the detection probe is used, the elastic force F of the spring 3 can be between 0.5 and 3N, so that the spring 3 can better drive the needle column 1 to move along the axial direction. Where F ═ kx, k is the stiffness coefficient (or stiffness coefficient), and x is the length of the spring 3 that is elongated (or shortened).

In the embodiment of the present application, the cover plate 22 is a flat plate structure.

Particularly, apron 22 is the flat plate structure, like this, when the other end butt of spring 3 in the internal surface of apron 22, can improve spring 3's stability to make spring 3 more perpendicular, spring 3's atress is more even, thereby can make spring 3 when receiving axial direction's power, do not produce the axis distortion, ensures the accuracy of probe test, and can promote the frequency of use of test probe by a wide margin.

In the embodiment of the application, a first nickel coating is arranged on the needle cylinder 1, and a first gold coating is arranged on the first nickel coating; the needle sleeve 2 is provided with a second nickel coating, and a second gold coating is arranged on the second nickel coating; a third nickel coating is arranged on the spring 3, and a third gold coating is arranged on the third nickel coating; the thicknesses of the first nickel coating, the second nickel coating and the third nickel coating are all between 1 and 3um, and the thicknesses of the first gold coating, the second gold coating and the third gold coating are all between 0.2 and 2 um. Therefore, when the detection probe is used, the resistivity of the detection probe is small, the resistance of the detection probe is stable in the detection process so as to improve the detection accuracy, and the use frequency of the detection probe can be improved.

As shown in fig. 2, the cover plate 22 is provided with a through hole to facilitate nickel plating and gold plating of the inner wall of the sleeve 21.

In the present embodiment, the projection structure 23 includes at least two annular projections 231; at least two annular protrusions (231) are provided at intervals in the axial direction of the sleeve (21).

Specifically, in the axial direction of the sleeve 21, the projection structure 23 includes at least two annular projections 231 disposed at intervals. Therefore, the matching stability of the annular protrusion 231 and the matching section 14 can be improved, so that the needle column 1 and the sleeve 21 are coaxial as much as possible, the accuracy of probe detection is guaranteed, the needle column 1 can move along the straight line determined by the at least two annular protrusions 231, and the clamping stagnation caused by abnormal friction between the needle column and the sleeve of the probe is avoided. Illustratively, two annular protrusions 231 are shown in fig. 2, and the two annular protrusions 231 are spaced apart from each other in the axial direction of the sleeve 21.

It should be noted that, if 3 or more than 3 annular protrusions 231 are provided, the distance between each two adjacent annular protrusions 231 may be the same or different, and the specific arrangement position of each annular protrusion 231 may be set according to the actual situation, which is not limited in this embodiment.

In the embodiment of the present application, the cross-sectional shape of the annular protrusion 231 may be any one of an arc shape, a square shape and a triangular shape, and the illustrated arc shape shows an arc shape, and the arc shape is recessed from the outer wall to the inner wall of the sleeve 21. If the annular protrusion 231 comprises more than 2 annular protrusions 231, the distance between two adjacent annular protrusions 231 is equal, so as to further improve the stability of the engagement between the annular protrusions 231 and the engagement section 14, so that the needle cylinder 1 and the sleeve 21 are coaxial as much as possible.

In the embodiment of the present application, the height of the annular protrusion 231 protruding from the inner wall of the sleeve 21 is greater than 0mm and less than or equal to 0.3 mm.

Specifically, the height of the annular protrusion 231 protruding the inner wall of the sleeve 21 refers to the highest height of the annular protrusion 231 protruding the inner wall of the sleeve 21, for example, the illustrated cross-sectional shape of the annular protrusion 231 is an arc, and the distance between the center of the arc and the inner wall of the sleeve 21 is between 0mm and 0.3 mm.

It should be noted that the above written a-b refers to [ a, b ], i.e., the closed interval between a and b. For example, 2-11 is a closed interval [2,11], referring to 2, (2,11) and 11.

In the embodiment of the application, the detection probe of the solar cell has at least the following advantages;

because the both ends of spring are for grinding flat and tight, the one end butt in the apron of spring, and the spring can freely stretch out and draw back along sleeve 21's axis direction in the sleeve, the section of wearing to establish of stylar wears to establish the part of spring, thus, the test probe is in the use, the spring can stretch out and draw back along telescopic axis direction when the atress, and the guide stylar removes along axis direction, thereby reduce the jamming that friction between stylar and the sleeve inner wall and lead to, long-term use is because the rigid action of spring, still can keep better guide effect, thereby the reliability of probe has been guaranteed, the life of test probe has been prolonged.

It should be noted that, in the present specification, the embodiments are all described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments may be referred to each other.

While alternative embodiments of the present application have been described, additional variations and modifications of these embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. It is therefore intended that the following claims be interpreted as including alternative embodiments and all such alterations and modifications as fall within the true scope of the embodiments of the application.

Finally, it should also be noted that, in this document, relational terms such as first and second, and the like may be used solely to distinguish one entity from another entity without necessarily requiring or implying any actual such relationship or order between such entities. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that an article or terminal apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such article or terminal apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of additional like elements in the article or terminal device comprising the element.

The technical solutions provided in the present application are described in detail above, and the principles and embodiments of the present application are described herein by using specific examples, and meanwhile, for a person of ordinary skill in the art, according to the principles and implementation manners of the present application, changes may be made in the specific embodiments and application ranges.