Material analysis method and system based on spectral analysis

文档序号:1962849 发布日期:2021-12-14 浏览:13次 中文

阅读说明:本技术 基于光谱分析的材质分析方法及系统 (Material analysis method and system based on spectral analysis ) 是由 莫卓亚 刘元路 杨日伦 于 2021-08-31 设计创作,主要内容包括:本发明属于材质分析技术领域,尤其涉及一种基于光谱分析的材质分析方法及系统,所述方法包括以下步骤:获取回收材料的待测光谱数据;对所述待测光谱数据进行光谱分析,并生成光谱分析结果;根据所述光谱分析结果生成材料类别数据,并根据所述材料类别数据生成材料类别显示界面,所述材料类别显示界面用于展示所述材料类别数据。本发明实现可视化展示材料类别数据,这样实现对回收材料的高效分辨,提升分辨效率,进而极大提升生产效率。(The invention belongs to the technical field of material analysis, and particularly relates to a material analysis method and system based on spectral analysis, wherein the method comprises the following steps: acquiring spectral data to be detected of the recycled material; carrying out spectral analysis on the spectral data to be detected and generating a spectral analysis result; generating material type data according to the spectral analysis result, and generating a material type display interface according to the material type data, wherein the material type display interface is used for displaying the material type data. The invention realizes the visual display of the material category data, thus realizing the high-efficiency resolution of the recycled materials, improving the resolution efficiency and further greatly improving the production efficiency.)

1. A material analysis method based on spectral analysis is characterized by comprising the following steps:

acquiring spectral data to be detected of the recycled material;

carrying out spectral analysis on the spectral data to be detected and generating a spectral analysis result;

generating material type data according to the spectral analysis result, and generating a material type display interface according to the material type data, wherein the material type display interface is used for displaying the material type data.

2. The method for analyzing material quality based on spectral analysis according to claim 1, wherein the performing spectral analysis on the spectral data to be measured and generating a spectral analysis result specifically comprises:

and inputting the spectral data to be detected into a preset spectral analysis machine learning model, and generating a spectral analysis result, wherein the spectral analysis machine learning model is preset based on machine learning.

3. The method for analyzing material quality based on spectral analysis according to claim 1, wherein the performing spectral analysis on the spectral data to be measured and generating a spectral analysis result specifically comprises:

generating a cloud sending instruction according to the spectral data to be detected;

sending the spectral data to be detected from a current data storage end to a cloud end according to the cloud end sending instruction, performing spectral preprocessing on the spectral data to be detected at the cloud end, comparing the spectral data to be detected with standard spectral data prestored at the cloud end, and generating a spectral analysis result after the comparison is completed;

and acquiring a spectral analysis result sent by the cloud.

4. The method for analyzing material quality based on spectral analysis according to claim 1, wherein the performing spectral analysis on the spectral data to be measured and generating a spectral analysis result specifically comprises:

generating a cloud sending instruction according to the spectral data to be detected;

and sending the spectral data to be detected from a current data storage end to a cloud end according to the cloud end sending instruction, inputting the processed spectral data to be detected to a preset spectral analysis machine learning model after spectral preprocessing is performed on the spectral data to be detected by the cloud end, and generating a spectral analysis result, wherein the spectral analysis machine learning model is preset based on machine learning and is stored in the cloud end.

5. The method for analyzing material quality based on spectral analysis according to claim 1, wherein the performing spectral analysis on the spectral data to be measured and generating a spectral analysis result specifically comprises:

the method comprises the steps of obtaining a spectrum database stored in a cloud in advance, wherein a plurality of standard spectrum data are stored in the spectrum database;

and comparing the spectral data to be detected with the standard spectral data, and generating a spectral analysis result.

6. The method for analyzing material quality based on spectral analysis according to claim 1, wherein the performing spectral analysis on the spectral data to be measured and generating a spectral analysis result specifically comprises:

acquiring a spectral analysis machine learning model stored in a cloud, wherein the spectral analysis machine learning model is preset based on machine learning and is stored in the cloud;

and inputting the spectral data to be detected into a preset spectral analysis machine learning model, and generating a spectral analysis result.

7. A material analysis system based on spectral analysis is characterized by comprising a box body, a spectrometer, a near-infrared light source, an optical fiber, a test head and a material analysis unit; the material analysis unit, the spectrometer and the near-infrared light source are all arranged in the box body, and the material analysis unit is also electrically connected with the display unit; the first end of the optical fiber is connected with the near-infrared light source, the second end of the optical fiber is connected with the spectrometer, the test head is connected with the third end of the optical fiber, and the third end of the optical fiber is communicated with the second end and the first end; the test head is used for aligning to a recycled material to be tested, the near-infrared light source emits a light source containing near infrared, light of the light source is transmitted to the third end of the optical fiber through the first end of the optical fiber and then is irradiated to the recycled material through the test head, the light of the light source is transmitted to the second end of the optical fiber through the third end of the optical fiber after being reflected by an object and then is transmitted to the spectrometer, the spectrometer collects a spectral curve of the recycled material, and the spectral curve of the recycled material is spectral data to be tested;

the material analysis unit comprises a spectrum acquisition module, a data comparison module and a category generation module; wherein the content of the first and second substances,

the spectrum acquisition module is used for acquiring spectral data to be detected of the recycled material;

the data comparison module is used for performing spectral analysis on the spectral data to be detected and generating a spectral analysis result;

the category generating module is used for generating material category data according to the spectral analysis result and generating a material category display interface according to the material category data, wherein the material category display interface is used for displaying the material category data.

8. The material analysis system based on spectral analysis of claim 7, wherein the test head is provided with a test start switch, and the test start switch is electrically connected to the material analysis unit.

9. The material analysis system based on spectral analysis of claim 7, further comprising a workbench disposed beside the box and used for placing recycled materials.

10. The material analysis system based on spectral analysis of claim 9, wherein the stage is white.

Technical Field

The invention belongs to the technical field of material analysis, and particularly relates to a material analysis method and system based on spectral analysis.

Background

The economic development mode of recycling renewable resources by continuously recycling materials is becoming a global trend. The strategy of sustainable development is advocated by various countries, the principle of sustainable development is that the method not only meets the requirements of contemporary human beings, but also does not damage the development of the ability of the later generations to meet the requirements, the main mark is that resources can be utilized forever, good ecological environment is kept, and the method is of great importance for recycling the resources in the process.

Currently, in the resource recovery industry, plastic recovery accounts for a significant proportion. In the process of recycling the plastic, the material of the plastic needs to be known, and in the market, when the material of the recycled material is distinguished, a fire burning method is adopted, so that the environmental pollution is easily caused, and the accuracy is not high; or the recycled materials are placed in a professional detection mechanism for detection, which causes the problems of long detection time and low detection efficiency.

Therefore, it is necessary to design a method and a system for analyzing material quality based on spectral analysis.

Disclosure of Invention

The invention aims to provide a material analysis method and system based on spectral analysis, and aims to solve the technical problem that in the prior art, the material discrimination efficiency is low when the material discrimination is carried out on the recycled material in the garbage recycling industry.

In order to achieve the above object, an embodiment of the present invention provides a material analysis method based on spectral analysis, including the following steps:

acquiring spectral data to be detected of the recycled material;

carrying out spectral analysis on the spectral data to be detected and generating a spectral analysis result;

generating material type data according to the spectral analysis result, and generating a material type display interface according to the material type data, wherein the material type display interface is used for displaying the material type data.

Optionally, the performing spectral analysis on the spectral data to be detected and generating a spectral analysis result specifically includes:

generating a cloud sending instruction according to the spectral data to be detected;

sending the spectral data to be detected from a current data storage end to a cloud end according to the cloud end sending instruction, performing spectral preprocessing on the spectral data to be detected at the cloud end, comparing the spectral data to be detected with standard spectral data prestored at the cloud end, and generating a spectral analysis result after the comparison is completed;

and acquiring a spectral analysis result sent by the cloud.

Optionally, the performing spectral analysis on the spectral data to be detected and generating a spectral analysis result specifically includes:

the method comprises the steps of obtaining a spectrum database stored in a cloud in advance, wherein a plurality of standard spectrum data are stored in the spectrum database;

and comparing the spectral data to be detected with the standard spectral data, and generating a spectral analysis result.

Optionally, a material analysis system based on spectral analysis includes a box, a spectrometer, a near-infrared light source, an optical fiber, a test head, and a material analysis unit; the material analysis unit, the spectrometer and the near-infrared light source are all arranged in the box body, and the material analysis unit is also electrically connected with the display unit; the first end of the optical fiber is connected with the near-infrared light source, the second end of the optical fiber is connected with the spectrometer, the test head is connected with the third end of the optical fiber, and the third end of the optical fiber is communicated with the second end and the first end; the test head is used for aligning to a recycled material to be tested, the near-infrared light source emits a light source containing near infrared, light of the light source is transmitted to the third end of the optical fiber through the first end of the optical fiber and then is irradiated to the recycled material through the test head, the light of the light source is transmitted to the second end of the optical fiber through the third end of the optical fiber after being reflected by an object and then is transmitted to the spectrometer, the spectrometer collects a spectral curve of the recycled material, and the spectral curve of the recycled material is spectral data to be tested;

the material analysis unit comprises a spectrum acquisition module, a data comparison module and a category generation module; wherein the content of the first and second substances,

the spectrum acquisition module is used for acquiring spectral data to be detected of the recycled material;

the data comparison module is used for performing spectral analysis on the spectral data to be detected and generating a spectral analysis result;

the category generating module is used for generating material category data according to the spectral analysis result and generating a material category display interface according to the material category data, wherein the material category display interface is used for displaying the material category data.

Optionally, a test starting switch is arranged on the test head, and the test starting switch is electrically connected with the material analysis unit.

Optionally, still include the workstation, the workstation set up in the side of box body for place the recovery material.

Optionally, the table is white.

Optionally, the optical fiber testing device further comprises a support, the support is detachably connected with the box body, and the part of the optical fiber extending out of the box body and between the testing heads is hung on the support.

Optionally, the support includes installation piece, pole setting, extension rod and two grip blocks, installation piece detachably install in the side of box body can be dismantled to get the spiro union, the pole setting with the installation piece is connected, the extension rod install in the pole setting, two the grip block install respectively in the extension rod with in the pole setting, optic fibre stretches out the box body is external extremely part between the test head is hung and is located two on the grip block.

Optionally, a first supporting plate and a second supporting plate are arranged in the box body, the first supporting plate is installed at the bottom in the box body, the near-infrared light source is installed on the first supporting plate, the second supporting plate is installed at the bottom in the box body, the second supporting plate is erected on the near-infrared light source, and the spectrometer is installed on the second supporting plate.

The technical scheme or the technical schemes in the material analysis method and the material analysis system based on the spectral analysis provided by the embodiment of the invention at least have one of the following technical effects:

firstly, acquiring spectral data to be detected of a recycled material; and then carrying out spectral analysis on the spectral data to be detected, generating a spectral analysis result, then generating material category data according to the spectral analysis result, further realizing generation of categories of materials of the recycled materials, next generating a material category display interface according to the material category data, displaying the material category data through the material category display interface, further realizing visual display of the material category data, thus realizing efficient resolution of the recycled materials, improving the resolution efficiency and further greatly improving the production efficiency.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive exercise.

FIG. 1 is a flow chart of a method for analyzing a material based on spectral analysis according to an embodiment of the present invention;

FIG. 2 is a schematic flow chart of generating a spectrum analysis result according to an embodiment of the present invention;

FIG. 3 is a schematic flow chart of generating a spectrum analysis result according to another embodiment of the present invention;

FIG. 4 is a block diagram of a texture analysis unit according to an embodiment of the present invention;

FIG. 5 is a schematic diagram illustrating an overall structure of a material analysis system based on spectral analysis according to an embodiment of the present invention;

FIG. 6 is a schematic view of the structure of FIG. 5 from another perspective;

FIG. 7 is a schematic diagram of a connection structure of a material analysis system based on spectral analysis according to an embodiment of the present invention;

fig. 8 is a schematic diagram of a splitting structure of the box body according to the embodiment of the present invention.

Detailed Description

Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary and intended to be illustrative of the embodiments of the present invention, and should not be construed as limiting the invention.

In the description of the embodiments of the present invention, it should be understood that the terms "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience in describing the embodiments of the present invention and simplifying the description, but do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the embodiments of the present invention, "a plurality" means two or more unless specifically limited otherwise.

In the embodiments of the present invention, unless otherwise explicitly specified or limited, the terms "mounted," "connected," "fixed," and the like are to be construed broadly, e.g., as being fixedly connected, detachably connected, or integrated; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. Specific meanings of the above terms in the embodiments of the present invention can be understood by those of ordinary skill in the art according to specific situations.

In one embodiment of the present invention, the method for analyzing material based on spectral analysis provided in the present invention can be performed based on an electronic device (not shown).

The electronic equipment acquires spectral data to be detected of the recycled material; performing spectral analysis on the spectral data to be detected and generating a spectral analysis result; and then the electronic equipment generates material type data according to the spectral analysis result and generates a material type display interface according to the material type data, wherein the material type display interface is used for displaying the material type data.

The electronic device may be an electronic control device having data acquisition, and data analysis functions.

In one embodiment of the present invention, as shown in fig. 1, there is provided a method for analyzing a material based on a spectral analysis, the method comprising the steps of:

step S100: acquiring spectral data to be detected of the recycled material;

specifically, the spectral data to be measured is a spectral curve of a recycled material, and the recycled material includes but is not limited to PVC, HDPE, PVC, LDPE, PP, and PS.

Step S200: carrying out spectral analysis on the spectral data to be detected and generating a spectral analysis result;

specifically, the number of the standard spectrum data is multiple, and each standard spectrum data corresponds to one material class. After the spectral data to be detected is obtained, spectral analysis is carried out on the spectral data to be detected during comparison, similarity values obtained after the spectral data to be detected is compared with pre-stored standard spectral data are obtained, and the similarity values are summarized to obtain the spectral analysis result.

Step S300: generating material type data according to the spectral analysis result, and generating a material type display interface according to the material type data, wherein the material type display interface is used for displaying the material type data.

Specifically, in this step, standard spectral data corresponding to the similarity value reaching the predetermined threshold value is selected according to the spectral analysis result, and the material category corresponding to the standard spectral data is recorded as the category of the material corresponding to the spectral data to be measured.

Further, in order to improve user experience of a user, a material category display interface is generated according to the material category data, and the material category display interface is used for displaying the material category data to realize visual display of the material category data.

In another embodiment of the present invention, the performing a spectrum analysis on the spectral data to be measured and generating a spectrum analysis result specifically includes:

and inputting the spectral data to be detected into a preset spectral analysis machine learning model, and generating a spectral analysis result, wherein the spectral analysis machine learning model is preset based on machine learning.

Specifically, a machine learning method can be adopted, a spectral analysis machine learning model is generated according to a pre-stored spectrum library, and then a prediction result can be directly output according to the to-be-detected spectrum data, so that the efficiency of result generation is improved.

In another embodiment of the present invention, as shown in fig. 2, the performing a spectrum analysis on the spectral data to be measured and generating a spectrum analysis result specifically includes:

step S211: generating a cloud sending instruction according to the spectral data to be detected;

step S212: sending the spectral data to be detected from a current data storage end to a cloud end according to the cloud end sending instruction, performing spectral preprocessing on the spectral data to be detected at the cloud end, comparing the spectral data to be detected with standard spectral data prestored at the cloud end, and generating a spectral analysis result after the comparison is completed;

specifically, in this embodiment, the standard spectrum data is not stored in the current data storage end, but is stored in the cloud.

Therefore, after the standard spectrum data are obtained, a cloud sending instruction is generated according to the standard spectrum data, meanwhile, the spectrum data to be detected are sent to the cloud from the current data storage end according to the cloud sending instruction, spectrum preprocessing is performed on the spectrum data to be detected at the cloud, then the standard spectrum data prestored at the cloud are compared, and then a spectrum analysis result is generated after the comparison is completed.

Step S213: and acquiring a spectral analysis result sent by the cloud.

Specifically, the spectrum comparison result sent by the cloud is obtained, so that the comparison data is obtained, and local resources are saved by comparison at the cloud.

In another embodiment of the present invention, the performing a spectrum analysis on the spectral data to be measured and generating a spectrum analysis result specifically includes:

firstly, generating a cloud sending instruction according to the spectral data to be detected;

and then, according to the cloud sending instruction, sending the spectral data to be detected from the current data storage end to a cloud, performing spectral preprocessing on the spectral data to be detected at the cloud, inputting the processed spectral data to be detected to a preset spectral analysis machine learning model, and generating a spectral analysis result.

The spectrum analysis machine learning model is preset based on machine learning and stored in the cloud.

Therefore, analysis without occupying local resources is realized by utilizing the spectral analysis machine learning model stored in the cloud in advance.

In another embodiment of the present invention, as shown in fig. 3, the performing a spectrum analysis on the spectral data to be measured and generating a spectrum analysis result specifically includes:

step S221: the method comprises the steps of obtaining a spectrum database stored in a cloud in advance, wherein a plurality of standard spectrum data are stored in the spectrum database;

specifically, before the comparison of the spectrum data, the spectrum database stored in the cloud is acquired in advance, that is, the spectrum database is downloaded to the local, so that the subsequent comparison is facilitated.

Step S222: and comparing the spectral data to be detected with the standard spectral data, and generating a spectral analysis result.

Specifically, in this step, the spectral data to be detected is compared with the standard spectral data to generate a spectral analysis result, so that the spectral data to be detected is compared based on a locally stored spectral database, and the method is suitable for a scene with a strong local calculation ratio and a need of giving a detection result in real time.

In another embodiment of the present invention, the performing a spectrum analysis on the spectral data to be measured and generating a spectrum analysis result specifically includes:

firstly, acquiring a spectral analysis machine learning model stored in a cloud, wherein the spectral analysis machine learning model is preset based on machine learning and is stored in the cloud;

and then, inputting the spectral data to be detected into a preset spectral analysis machine learning model, and generating a spectral analysis result.

That is, in this embodiment, the spectral analysis machine learning model is pre-stored locally, so that spectral analysis is performed based on the locally stored spectral analysis machine learning model.

In another embodiment of the present invention, as shown in fig. 4 to 8, a material analysis system based on spectral analysis is provided, the system includes a box 100, a spectrometer 220, a near infrared light source 230, an optical fiber 240, a test head 250, and a material analysis unit 210; the material analysis unit 210, the spectrometer 220 and the near-infrared light source 230 are all installed in the box body 100, and the material analysis unit 210 is further electrically connected with the display unit; the first end of the optical fiber 240 is connected to the near-infrared light source 230, the second end of the optical fiber 240 is connected to the spectrometer 220, the test head 250 is connected to the third end of the optical fiber 240, and the third end and the second end of the optical fiber 240 are both communicated with the first end.

The test head 250 is used for aligning the recovered material to be tested, the near-infrared light source 230 emits a light source containing near infrared, light of the light source is transmitted to the third end of the optical fiber 240 through the first end of the optical fiber 240 and then is irradiated onto the recovered material through the test head 250, the light of the light source is transmitted to the spectrometer 220 after being reflected by an object and then being transmitted to the second end of the optical fiber 240 through the third end of the optical fiber 240, the spectrometer 220 collects a spectrum curve of the recovered material, wherein the spectrum curve of the recovered material is spectrum data to be tested.

As shown in fig. 4, the material analyzing unit 210 includes a spectrum obtaining module 10, a data comparing module 20, and a category generating module 30.

The spectrum acquisition module 10 is configured to acquire spectral data to be detected of the recycled material;

the data comparison module 20 is configured to perform spectral analysis on the spectral data to be detected and generate a spectral analysis result;

the category generating module 30 is configured to generate material category data according to the spectral analysis result, and generate a material category display interface according to the material category data, where the material category display interface is used to display the material category data.

In another embodiment of the present invention, the material analysis unit 210 may further include a bluetooth communication module (shown in the figure), so as to implement communication connection with a mobile phone APP of a user through the bluetooth communication module, and further perform data transmission related to a spectrum.

In another embodiment of the present invention, the data alignment module 20 is configured to: generating a cloud sending instruction according to the spectral data to be detected; sending the spectral data to be detected from a current data storage end to a cloud end according to the cloud end sending instruction, performing spectral preprocessing on the spectral data to be detected at the cloud end, comparing the spectral data to be detected with standard spectral data prestored at the cloud end, and generating a spectral analysis result after the comparison is completed; and acquiring a spectral analysis result sent by the cloud.

In another embodiment of the present invention, the data alignment module 20 is further configured to: the method comprises the steps of obtaining a spectrum database stored in a cloud in advance, wherein a plurality of standard spectrum data are stored in the spectrum database; and comparing the spectral data to be detected with the standard spectral data, and generating a spectral analysis result.

Further, in use, the material analysis system based on spectral analysis may be used by a user holding the test head 250, aligning the test head 250 with the recycled material to be tested, then, the near-infrared light source 230 emits a light source containing near-infrared light, light of the light source is transmitted to the third end of the optical fiber 240 through the first end of the optical fiber 240 and then is irradiated onto the recycled material through the test head 250, light of the light source is transmitted to the second end of the optical fiber 240 through the third end of the optical fiber 240 after being reflected by an object and then is transmitted to the spectrometer 220, the spectrometer 220 collects a spectral curve of the recycled material, the material analysis unit 210 analyzes according to the spectral curve collected by the spectrometer 220, the material of the recycled material is obtained after the analysis is completed and is displayed on the display unit, and then realize convenient and fast ground to the material of retrieving the material and carry out the analysis to the material analysis efficiency of retrieving the material.

In another embodiment of the present invention, the near-infrared light source 230 is a halogen lamp light source capable of providing light containing near-infrared light.

In another embodiment of the present invention, as shown in fig. 5 to 8, a test start switch 251 is disposed on the test head 250, and the test start switch 251 is electrically connected to the material analysis unit 210. By setting the test starting switch 251, the test can be performed after the test starting switch 251 is started, and the test starting can be quickly and conveniently controlled.

In another embodiment of the present invention, as shown in fig. 5-7, the material analysis system based on spectral analysis further includes a workbench 310, and the workbench 310 is disposed beside the box 100 and is used for placing recycled materials. Specifically, the table 310 is configured to facilitate placement of recycled materials to be tested.

In another embodiment of the present invention, the table 310 is white. That is, the background color of the workbench 310 is white, so that when the transparent recycled material is tested, the light of the light source is irradiated to the transparent object and then reflected by the white workbench 310 and transmitted to the spectrometer 220, and further the spectrum of the material of the white recycled material is obtained.

In another embodiment of the present invention, as shown in fig. 5-6, the material analysis system based on spectral analysis further includes a bracket 320, the bracket 320 is detachably connected to the box 100, and a portion of the optical fiber 240 extending out of the box 100 to the test head 250 is hung on the bracket 320. Specifically, the holder 320 facilitates the storage of the portion of the optical fiber 240 extending out of the box 100, thereby improving the convenience of use.

Specifically, the cartridge 100 includes a bottom shell 130 and a cover plate 140, the first support plate 110 and the second support plate 120 are both mounted on the bottom shell 130, the cover plate 140 is covered on the bottom shell 130, and the material analysis unit 210, the spectrometer 220, the near infrared light source 230 and the optical fiber 240 are partially sealed in a cavity formed by the cover plate 140 and the bottom shell 130. Specifically, through the design of the bottom case 130 and the cover plate 140, the bottom case 130 and the cover plate 140 enclose each component therein, thereby protecting each component.

In another embodiment of the present invention, as shown in fig. 5-6, the bracket 320 includes a mounting block 321, an upright rod 322, an extension rod 323, and two clamping blocks 324, the mounting block 321 is detachably mounted at a side end of the box body 100 and is detachably screwed, the upright rod 322 is connected to the mounting block 321, the extension rod 323 is mounted on the upright rod 322, the two clamping blocks 324 are respectively mounted on the extension rod 323 and the upright rod 322, and a portion of the optical fiber 240 extending out of the box body 100 to the test head 250 is hung on the two clamping blocks 324. Specifically, the mounting block 321 is screwed with the side end of the box 100 by a screw. The upright rod 322 is fixedly connected with the mounting block 321, and the two clamping blocks 324 are movably mounted on the extension rod 323 and the upright rod 322 respectively, so that the clamping blocks 324 can be dragged to slide on the upright rod 322 and the extension rod 323, the optical fiber 240 is driven to move, the position of the optical fiber 240 is adjusted, and the use requirement is met.

In another embodiment of the present invention, the upright 322 is movably connected to the mounting block 321, so that the relative position between the upright 322 and the mounting block 321 can be conveniently adjusted, and the convenience of use can be improved. The structure of the movable connection is set by those skilled in the art according to actual needs, and the present application is not particularly limited.

In another embodiment of the present invention, as shown in fig. 7-8, a first support plate 110 and a second support plate 120 are disposed in the case 100, the first support plate 110 is mounted at the bottom of the case 100, the near-infrared light source 230 is mounted on the first support plate 110, the second support plate 120 is mounted at the bottom of the case 100, the second support plate 120 is erected on the near-infrared light source 230, and the spectrometer 220 is mounted on the second support plate 120. By erecting the second supporting plate 120 on the near-infrared light source 230, the space in the box 100 is efficiently utilized, and the volume of the whole material analyzer is reduced.

The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.

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