阅读说明：本技术 Pon光模块检测装置及测试系统 (PON optical module detection device and test system ) 是由 汤朝辉 于 2020-06-28 设计创作，主要内容包括：本发明实施例公开了一种PON光模块检测装置及测试系统。该PON光模块检测装置,包括：处理单元、第一光模块单元、第二光模块单元和光衰减单元,其中：所述第一光模块单元和所述第二光模块单元相互作为对方的检测方和待测方；所述光衰减单元设置在所述第一光模块单元和所述第二光模块单元之间通信连接于所述处理单元,并且基于所述处理单元发送的控制指令控制链路的光功率；所述处理单元发送测试指令至所述第一光模块单元和所述第二光模块单元以对所述待测方进行测试,结构简单价格适中,并且使用方便。(The embodiment of the invention discloses a PON optical module detection device and a PON optical module test system. The PON optical module detection device comprises: processing unit, first optical module unit, second optical module unit and optical attenuation unit, wherein: the first optical module unit and the second optical module unit are mutually used as a detection party and a party to be detected of each other; the optical attenuation unit is arranged between the first optical module unit and the second optical module unit, is in communication connection with the processing unit, and controls the optical power of the link based on a control instruction sent by the processing unit; the processing unit sends a test instruction to the first optical module unit and the second optical module unit to test the party to be tested, and the optical module testing device is simple in structure, moderate in price and convenient to use.)

1. A PON optical module detection device comprises: processing unit, first optical module unit, second optical module unit and optical attenuation unit, wherein:

the first optical module unit and the second optical module unit are mutually used as a detection party and a party to be detected of each other;

the optical attenuation unit is arranged between the first optical module unit and the second optical module unit, is in communication connection with the processing unit, and controls the optical power of the link based on a control instruction sent by the processing unit;

and the processing unit sends a test instruction to the first optical module unit and the second optical module unit so as to test the party to be tested.

2. The PON optical module detection apparatus of claim 1, wherein the first optical module unit comprises m OLT optical modules, the second optical module unit comprises m ONU optical module groups, the m OLT optical modules and the m ONU optical module groups correspond to form m test groups, the ONU optical module group comprises n ONU optical modules, m is a positive integer less than or equal to 8, and n is a positive integer less than or equal to 4.

3. The PON optical module detection apparatus of claim 2, when m is equal to or less than 8 and n is not equal to 1, the apparatus further comprises an optical splitter unit disposed between the first optical module unit and the optical attenuation unit.

4. The PON optical module detection apparatus in accordance with any one of claims 1 to 3, wherein when performing a test, the processing unit sends a first data flow service to the party to be tested, and correspondingly receives a second data flow service returned by the detecting party, and analyzes a data flow packet loss rate of the party to be tested after counting the first data flow service and the second data flow service.

5. The PON optical module detection apparatus of claim 4, further comprising a control unit, configured to be in communication connection with an upper computer, where the control unit uploads test data to the upper computer and sends test contents to the processing unit.

6. A PON optical module detecting device as claimed in claim 4, wherein when different tests are performed, at least the first optical module unit or the second optical module unit includes optical modules in different packaging forms, the device further includes a base and a plurality of daughter cards, at least the processing unit is disposed on the base, the plurality of daughter cards are used for respectively mounting the optical modules in different packaging forms, the base and the daughter cards respectively include sockets, and after one of the optical modules in different packaging forms is correspondingly plugged into the socket of one of the daughter cards, the daughter card is plugged into the socket of the base, so that one of the optical modules in different packaging forms is connected to the processing unit.

7. The PON optical module detection apparatus of claim 6, wherein at least the first optical module unit or the second optical module unit includes different types of optical modules when different tests are performed, and pins having the same characteristics of the different types of optical modules are connected to the same interface of the processing unit.

8. The PON optical module detection apparatus as claimed in claim 7, wherein a pull-down resistor is disposed on the base, and the pull-down resistor is connected to or disconnected from the processing unit by BOM selective soldering so as to perform compatible processing on pins of the different types of optical modules.

9. The PON optical module detection apparatus of claim 7, wherein, when different tests are performed, different data pins of different rates or different control pins of different functions of the different types of optical modules are connected to the same interface of the processing unit; and/or connecting the low-speed control pin and the NC pin of the different types of optical modules to the same interface of the processing unit when different tests are carried out.

10. A PON optical module test system comprising an upper computer and the PON optical module detection apparatus of any one of claims 1 to 9, the PON optical module detection apparatus being connected in parallel to the upper computer.

Technical Field

The embodiment of the invention relates to the technical field of optical communication testing, in particular to a PON optical module detection device and a PON optical module testing system.

Background

The passive optical network PON comprises an optical line terminal OLT, an optical network unit ONU and an optical distribution network ODN, and has the characteristics of excellent performance and low operation and maintenance cost. Currently, the mainstream PON technologies include EPON, 10GEPON, GPON, XGPON, XGSPON, Combo PON, and the like. The PON optical module is an important component of the PON, is used on both OLT and ONU equipment, and the performance of the PON optical module directly influences the performance of the PON. Currently, a common PON optical module mainly has three packaging modes of XFP, SFP, and SFP +.

Index testing of the PON optical module is mainly completed by a module manufacturer, a relatively expensive instrument is used, the built environment is complex, the testing period is long, and users of the PON optical module often lack a special testing device. Therefore, a PON optical module detection device which has a simple structure and a moderate price and is convenient to use is needed to solve the problem.

Disclosure of Invention

One or more embodiments of the present disclosure provide a PON optical module detection apparatus and a test system, which have a simple structure, a moderate price, and a convenient use.

To solve the above technical problem, one or more embodiments of the present specification are implemented as follows:

in a first aspect, a PON optical module detection apparatus is provided, including: processing unit, first optical module unit, second optical module unit and optical attenuation unit, wherein: the first optical module unit and the second optical module unit are mutually used as a detection party and a party to be detected of each other; the optical attenuation unit is arranged between the first optical module unit and the second optical module unit, is in communication connection with the processing unit, and controls the optical power of the link based on a control instruction sent by the processing unit; and the processing unit sends a test instruction to the first optical module unit and the second optical module unit so as to test the party to be tested.

In a second aspect, a PON optical module testing system is provided, which comprises an upper computer and the PON optical module detecting device as described above, wherein the PON optical module detecting device is connected to the upper computer in parallel.

As can be seen from the technical solutions provided in one or more embodiments of the present disclosure, the PON optical module detection apparatus provided in an embodiment of the present disclosure may simulate a PON link, where an optical attenuation unit disposed on the PON link may control optical power on the link to simulate loss on different PON links, a first optical module unit and a second optical module unit disposed on the link may be used as a detection party and a to-be-tested party of each other, and the detection party may be used as a test tool to participate in a test when the to-be-tested party is tested, and a test flow of the entire PON optical module detection apparatus is uniformly controlled by a processing unit. The PON optical module detection device is simple in structure and moderate in price, a complex test environment does not need to be built, automatic testing can be achieved through the processing unit when the PON optical module detection device is used for detection, and the PON optical module detection device is convenient to use and quick in testing. Each PON optical module detection device can be connected to an upper computer through an Ethernet interface network, so that the PON optical module detection devices can be deployed in batches, and the optical modules can be tested in batches.

Drawings

In order to more clearly illustrate one or more embodiments or prior art solutions of the present specification, reference will now be made briefly to the attached drawings, which are needed in the description of one or more embodiments or prior art, and it should be apparent that the drawings in the description below are only some of the embodiments described in the specification, and that other drawings may be obtained by those skilled in the art without inventive exercise.

Fig. 1 is a block diagram of a PON optical module detection apparatus according to an embodiment of the present invention.

Fig. 2 is a block diagram of another PON optical module detection apparatus according to an embodiment of the present invention.

Fig. 3 is a block diagram of a PON optical module detection apparatus according to an embodiment of the present invention.

Fig. 4 is a block diagram of a PON optical module detection apparatus according to an embodiment of the present invention.

Fig. 5 is a block diagram of a PON optical module detection apparatus according to an embodiment of the present invention.

Fig. 6 is a schematic diagram of a pull-down resistor in another PON optical module detection apparatus according to an embodiment of the present invention.

Fig. 7 is a timing chart of test parameters t _ on and t _ off of a PON optical module detection apparatus according to an embodiment of the present invention.

Fig. 8 is a schematic structural diagram of a PON optical module detection system according to an embodiment of the present invention.

10-a processing unit, a first light module unit-20; a second light module unit-30; a light attenuation unit-40; an OLT optical module-200; an ONU optical module group-31; 41-attenuator group; 50-an optical splitter unit; 500-a beam splitter; 400-an attenuator; 300-ONU optical module; 60-a control unit; 70-an upper computer; 101-a pull-down resistor; 100 — interface to the processing unit.

Detailed Description

In order to make the technical solutions in the present specification better understood, the technical solutions in one or more embodiments of the present specification will be clearly and completely described below with reference to the accompanying drawings in one or more embodiments of the present specification, and it is obvious that the one or more embodiments described are only a part of the embodiments of the present specification, and not all embodiments. All other embodiments that can be derived by a person skilled in the art from one or more of the embodiments described herein without making any inventive step shall fall within the scope of protection of this document.

The PON optical module detection device provided by the embodiment of the invention simulates the PON link, the optical modules on the PON link can be used as a detection party and a party to be tested, and the detection party is used as a test tool to participate in the test when the party to be tested is tested. The PON optical module detection apparatus provided in this specification and its respective parts will be described in detail below.

It should be noted that the PON optical module detection apparatus provided in the embodiment of the present invention is suitable for detecting a PON optical module, and certainly, the PON optical module detection apparatus is also suitable for a case where an optical module needs to be tested by another similar optical transmission network, and also belongs to the protection scope of the present application.

Example one

Fig. 1 is a schematic diagram of a PON optical module detection apparatus according to an embodiment of the present invention. It can be understood that the PON optical module detection apparatus provided in the embodiment of the present invention simulates a PON link, and sets an optical module on the PON link to test the optical module, and then determines a qualified optical module and an unqualified optical module. The PON optical module detection device comprises: a processing unit 10, a first light module unit 20, a second light module unit 30 and a light attenuating unit 40, wherein:

the first optical module unit 20 and the second optical module unit 30 are mutually used as a detection party and a to-be-detected party of each other;

the first optical module unit 20 and the second optical module unit 30 respectively include at least one optical module, such as an OLT optical module or an optical ONU optical module, and since the PON optical module detection apparatus is an analog PON link, the first optical module unit 20 may be an OLT optical module or an ONU optical module, and the corresponding second optical module unit 20 is an ONU optical module or an OLT optical module. Of course, other modules to be tested for testing may be used to ensure that a link is formed. If the first optical module unit 20 or the second optical module unit 30 includes a plurality of optical modules, different types of optical modules may be included between the plurality of optical modules, and for convenience of testing, the plurality of optical modules included in the first optical module unit 20 or the second optical module unit 30 may include the same type of optical modules, such as an OLT optical module or an ONU optical module.

If the first optical module unit 20 or the second optical module unit 30 includes a plurality of optical modules, after one end of each of the optical modules is connected to a different pin of the processing unit, the other end of each of the optical modules is connected to a different attenuator (in this case, the optical attenuation unit includes a plurality of attenuators), and then correspondingly connected to the plurality of optical modules in the second optical module unit 30 or the first optical module unit 20, so that each optical module is on the PON link.

The first optical module unit 20 and the second optical module unit 30 are the party to be tested and the party to be detected, and the party to be detected is the detecting tool for testing the party to be tested. When the first optical module unit 20 is a party to be tested, the second optical module unit is a standard component, that is, the second optical module unit adopts the standard component to assist in completing the test of the first optical module unit; similarly, when the second optical module unit 30 is the party to be tested, the first optical module unit is a standard component, that is, the first optical module unit adopts the standard component to assist in completing the test of the second optical module unit 30. The test indexes related to the optical power depend on the detection accuracy inside the detection party, and the precision and the accuracy are not as high as those of an optical power meter, but the test requirements can be basically met.

The first optical module unit 20 and the second optical module unit 30 are a detecting party and a party to be detected, and when one of them may include an OLT optical module, the other may include an ONU optical module, and a PON link may be formed. And when the party to be tested comprises the OLT optical module, the detecting party uses the standard ONU optical module to test. At this time, the ONU optical module realizes 2 functions: 1. the ONU optical module realizes downlink receiving and uplink sending of test data, and forms a complete PON service network with the OLT optical module and other passive optical devices included by a party to be tested, thereby simulating the networking mode of a real network; 2. the ONU optical module is a part of the detection device as a detection tool, and is responsible for detecting part of the test items, for example, when performing a test, the ONU optical module uses an optical power detection function inside the ONU optical module instead of an optical power meter to measure the optical power. On the contrary, when the party to be tested includes the ONU optical module, the OLT optical module included in the detecting party serves a similar function. Certainly, for convenience of operation, the multiple optical modules included by the party to be tested or the detecting party are all the same type of optical module, such as an OLT optical module or an ONU optical module.

The optical attenuation unit 40 is disposed between the first optical module unit 20 and the second optical module unit 30, is in communication connection with the processing unit 10, and controls optical power of the link based on a control instruction sent by the processing unit 10;

the optical attenuator unit 40 is an important component of the PON optical module detection apparatus, and particularly can replace an adjustable optical attenuation meter when the sensitivity and the overload optical power index of the optical module are tested, and is responsible for effectively controlling the optical power of the entire PON link.

The optical attenuation unit 40 may include a plurality of attenuators, the number of the attenuators depends on the number of links and the number of ONU optical modules in the links (considering that the ONU optical modules may be grouped on the same PON link), the plurality of attenuators are connected in parallel to the first optical module unit 20 and the second optical module unit 30, and different attenuation values may be output under the control of the processing unit 10 to simulate different link losses. The first optical module unit 20, the optical attenuation unit 40, and the second optical module unit 30 may be connected to each other by optical fibers.

The optical attenuation unit 40 is communicatively coupled to the processing unit 10. the processing unit 10 may implement programmed control of the attenuation values for the optical attenuation unit 40. When the optical attenuation unit is used for the first time, each attenuation value of the optical attenuation unit 40 needs to be calibrated by using an optical power meter, and the test range and the test interval of the attenuation value can be calibrated according to the test requirement, so that different configurations can be performed during subsequent tests. The formed attenuation value adjustment table is recorded in the memory, so that the processing unit 10 can conveniently call the attenuation value adjustment table in the later test process.

The processing unit 10 sends a test command to the first optical module unit 20 and the second optical module unit 30 to test the party to be tested.

The processing unit 10 is a core of the entire PON optical module detection device, and may adopt a common microprocessor, or may be an FPGA circuit having a microprocessor, and main detection logic and algorithms are implemented in the processing unit 10, so that an automated test of the PON optical module can be implemented. The processor unit 10 may be responsible for logic implementation of the test function and connection of the service interface, including generation of data stream service and statistics of the received and transmitted data, timing detection and decision of the digital signal, level decision of the digital signal, and the like. The parameters related to the above operations can be changed according to the difference of the types of the optical modules and the definition difference of the pin functions. In order to connect the optical modules for batch test, the interface of the processing unit 10 needs to be extended, for example, to IIC, SPI, and the like.

As can be seen from the above analysis, the networking mode of the PON optical module detection apparatus provided in the embodiments of the present specification is a typical PON networking mode, and the PON networking includes an OLT, an ODN, and an ONU. In the PON optical module detection apparatus, the processing unit 10, the first optical module unit, and the second optical module unit correspond to an OLT and an ONU in a PON network, and the optical attenuation unit plus an optical splitter (in the case where an optical splitter is present) corresponds to an ODN. In a typical networking mode, the first optical module unit 20 is connected to the optical splitter group 50, the optical splitter group 50 is connected to the optical attenuation unit 40, and the optical attenuation unit 40 is connected to the second optical module unit 30 to form a closed loop with the processing unit 10.

Referring to fig. 5, in some embodiments, in the PON optical module detection apparatus provided in this specification, the first optical module unit 20 includes m OLT optical modules 200, the second optical module unit 30 includes m ONU optical module groups 31, the m OLT optical modules 200 and the m ONU optical module groups 31 correspondingly form m test groups, each ONU optical module group 31 includes n ONU optical modules, m is a positive integer less than or equal to 8, and n is a positive integer less than or equal to 4.

Due to the characteristics of the PON network, the PON optical module detection apparatus provided in the embodiments of this specification supports simultaneous concurrence of multiple groups of links, and supports a PON link networking mode in which one OLT optical module corresponds to multiple ONU optical modules. Therefore, multiple PON links can be copied, including networking one OLT optical module corresponding to one ONU optical module or networking one OLT optical module corresponding to multiple ONU optical modules (the multiple ONU optical modules are connected in parallel), so that the test efficiency can be effectively improved, and the method is suitable for large-scale test scenes. Each group is the smallest networking unit and can be configured into different networking modes, and in order to deal with large-scale tests, a certain fixed networking mode can be configured for one PON optical module detection device, so that management is facilitated.

The first optical module unit 20 and the second optical module unit 30 have a fixed corresponding relationship, and can be divided into eight test groups at most, each test group includes an OLT optical module and an ONU optical module group, and each ONU optical module group includes four ONU optical modules at most. In specific application, the first optical module unit 20 or the second optical module unit 30 includes an OLT optical module, which may be all OLT optical modules, that is, all units in the eight test groups are OLT optical modules or ONU optical modules, and the corresponding second optical module unit 30 or the corresponding first optical module unit 20 includes ONU optical modules, which may be all ONU optical modules, that is, all units in the other test group are ONU optical modules or OLT optical modules. In addition, the number of ONU optical modules in each ONU optical module group can be determined according to the characteristics of the optical modules, and a test group may include 1 OLT optical module and 4 corresponding ONU optical modules in the ONU optical modules, and may also include 1 OLT optical module and 1 corresponding ONU optical module in the ONU optical modules.

Referring to fig. 3, in some embodiments, the simplest networking diagram of the PON optical module detection apparatus provided in the embodiments of this specification includes an OLT optical module 200, an ONU optical module 300, an attenuator 400 (variable optical attenuator), and a processing unit 10. One OLT optical module 200, one ONU optical module 300, and one optical attenuator 400 form the smallest PON link for testing.

The automatic detection device for the PON optical modules, provided by the embodiment of the specification, solves the problem of batch test of the PON optical modules, and particularly solves the problems that a special instrument used in the batch test is expensive, the built test environment is complex, the test period is long, and the use is inconvenient.

Referring to fig. 2 and 5, in some embodiments, when m is less than or equal to 8 and n is not equal to 1, the PON optical module detection apparatus provided in the embodiments of this specification further includes an optical splitter unit 50, where the optical splitter unit 50 is disposed between the first optical module unit 20 and the optical attenuation unit 40.

The optical splitter unit 50 may include a plurality of optical splitters 500, where each optical splitter 500 is respectively located on a PON optical link where one OLT optical module and one ONU optical module group are located, and the number of optical splitters in the optical splitter unit corresponds to the number of OLT optical modules in the optical module unit.

Each test group in which the optical splitter 500 is located is the smallest networking unit, and a plurality of networking units can be configured into different networking modes. In order to deal with large-scale tests, a certain fixed networking mode can be configured for the same PON optical module detection device to perform a plurality of tests, so that management is facilitated.

In some embodiments, in the PON optical module detection apparatus provided in this description, when performing a test, the processing unit 10 sends a first data flow service to a party to be tested, and correspondingly receives a second data flow service returned by the party to be tested, and analyzes a data flow packet loss rate of the party to be tested after counting the first data flow service and the second data flow service.

The processor unit 10 is a core of logic of the entire PON optical module testing apparatus, and for a packet loss rate test item, it needs to send code streams with different rates according to the type of the optical module to send a first data stream service, and calculates a packet loss rate of a party to be tested after receiving a second data stream service according to the received code stream. The code patterns can be configured into PRBS31, PRBS21, custom code patterns and the like, the packet length can be configured into 128, 256 and the like, and the test duration and the test times can be configured. For the time sequence test item of the digital signal, the reset time sequence and bit width can be configured, LOS/SD jump response time can be tested, RSSI time sequence can be configured, and the like.

Referring to fig. 4 and 5, in some embodiments, the PON optical module detection apparatus provided in this specification further includes a control unit 60, which is used for being in communication connection with an upper computer, and the control unit 60 uploads test data to the upper computer and sends test contents to the processing unit 10.

The control unit 60 may adopt a common microprocessor, and not only communicates with an external upper computer to upload test data and issue test contents, but also communicates with other modules inside the PON optical module detection apparatus, monitors and manages the internal operation state of the PON optical module detection apparatus, and so on, so as to maintain the normal operation of the apparatus. The communication interface between the control unit 60 and the external upper computer can be a common interface such as an ethernet interface or a serial port, which can realize flexible networking, complete batch deployment of the device, and meet the test of a large batch of PON optical modules. In this case, the processing unit 10 may be an FPGA circuit.

In some embodiments, in the PON optical module detection apparatus provided in this specification, when different tests are performed, at least the first optical module unit or the second optical module unit includes optical modules in different packaging forms, the apparatus further includes a base and a plurality of daughter cards, at least the processing unit is disposed on the base, the plurality of daughter cards are used to mount optical modules in different packaging forms, the base and the daughter cards include sockets respectively, one of the optical modules in different packaging forms is correspondingly plugged into the socket of one of the plurality of daughter cards, and then the daughter card is plugged into the socket of the base, so that one of the optical modules in different packaging forms is connected to the processing unit.

The PON optical module detection apparatus provided in the embodiment of the present specification supports multiple types of packaged and multiple types of optical module tests, and the supported packaging forms include SFP, SFP +, XFP; the supported optical module types include EPON, GPON, 10GEPON, XGPON, XGSPON, COMBO PON, 10G ethernet, 1G ethernet, and the like. In order to meet the optical module test of various types and various packages, the first optical module unit and the second optical module unit are specially processed on circuit matching, pin definition and a base structure.

The base can be a PCB board, at least the processing unit is arranged on the base, and in order to be compatible with the XFP, SFP and SFP + optical modules in three different packaging forms, the daughter card which can be provided with the optical module in the corresponding packaging form is detachably arranged on the base for testing. The daughter card comprises three types, namely an optical module for installing and testing an XFP package, a low-speed optical module for installing and testing an SFP package and a high-speed optical module for installing and testing an SFP/SFP + package. The base is provided with an XFP socket, and the daughter card is inserted into the XFP socket on the base through a gold finger to realize the communication connection with the processing unit on the base. The sub-card is a PCB similar to the optical module and provided with a golden finger, the PCB of the sub-card is respectively welded with an SFP or XFP socket according to different compatible SFP or XFP packaging forms, the optical module in a corresponding packaging form can be inserted, and finally the sub-card and the base are fixed through screws.

Referring to fig. 6, in some embodiments, in the PON optical module detection apparatus provided in this specification, when performing different tests, at least the first optical module unit or the second optical module unit includes different types of optical modules, and pins having the same characteristics of the different types of optical modules are connected to the same interface of the processing unit.

Currently, the mainstream PON technologies in the industry include EPON, 10GEPON, GPON, XGPON, XGSPON, Combo PON, and the like. In implementation, in order to be compatible with all types of optical modules, the ONU and OLT optical modules are respectively subjected to compatible design: the pins of the optical module are classified according to low-speed data transceiving, high-speed data transceiving, power, ground, control pins, etc., and the pins with the same characteristics are connected to the same interface of the processing unit 10. For example, the low-speed receiving pins of different types of optical modules are connected to the same pair of serial ports serdes of the processing unit 10, the low-speed sending pins of different types of optical modules are connected to the same pair of serial ports serdes of the processing unit 10, the high-speed receiving pins of different types of optical modules are connected to the same pair of serdes of the processing unit 10, the high-speed sending pins of different types of optical modules are connected to the same pair of serdes of the processing unit 10, the tx _ dis pins of different types of optical modules are connected to the same IO interface of the processing unit 10, and the Mode _ abs pins of different types of optical modules are connected to the same IO interface of the processing unit 10.

In some embodiments, in the PON optical module detection apparatus provided in this specification, a pull-down resistor is provided on a base, and the pull-down resistor is connected or disconnected with the processing unit 10 by BOM selective welding to perform compatible processing on pins of different types of optical modules.

Generally, the definition difference of the optical module pins is not large, pins with the same characteristics in the optical modules subjected to different tests are connected to the same interface of the processing unit, and only a few pins need to be specially processed.

As the case of performing special processing on a small number of pins, level matching for high-speed data pins is compatible. Because the signals of the pins of the processing unit are all differential signals, for different levels of the same pin 100 of the processing unit 10, connection and disconnection between the pull-down resistor 101 and the pin 100 of the processing unit 10 can be realized through BOM selective welding, and for levels of the pin, if the levels of the pin need to be pulled down, the pull-down resistor 101 is connected to the pin 100 of the processing unit 10 through BOM welding, logic switching can be performed on the pins of the processing unit 10, and compatible processing is performed on the pins of the first optical module unit 20 and the second optical module unit 30, so that the functional requirements of the pins of the optical modules are met.

For example, the following steps are carried out: the optical module packaged by 10GEPON OLT XFP is sent downstream as a pair of data channels with LVPECL level, and the optical module packaged by 10GEPON OLT SFP + is sent downstream as a pair of data channels with CML level, so a 150-ohm pull-down resistor 101 shown in fig. 6 is designed on the base, when the optical module packaged by 10GEPON OLT XFP is used for testing, the pull-down resistor 101 is welded on the BOM to connect to the downstream data channel of the processing unit, and when the optical module packaged by 10GEPON OLT SFP + is used for testing, the pull-down resistor 101 is not welded on the BOM, that is, the pull-down resistor 101 is disconnected from the downstream data channel of the processing unit. It should be noted that, in order to reduce the impact of compatibility, the resistance pad and the data line do not need to be branched.

In some embodiments, in the PON optical module detection apparatus provided in this specification, when different tests are performed, data pins with different rates or control pins with different functions of different types of optical modules are connected to the same interface of the processing unit.

For example, for two types of downstream low-speed data pins, one is EPON 1.25G and the other is GPON 2.488G, of 10GEPON OLT SFP + and XGPON COMBO OLT SFP, the rates of the two types of downstream low-speed data pins are not the same, the two types of downstream low-speed data pins may be connected to the same serdes lane of the processing unit 10 in hardware, and logically configured differently according to the module types, so that data with different rates may be sent.

In some embodiments, the PON optical module detection apparatus provided in this specification connects the low-speed control pin and the NC pin of different types of optical modules to the same interface of the processing unit when performing different tests.

For example, for an optical module of 10GEPON OLT type and SFP + package, pin 7 is NC; the 7 th pin of the XGPON COMBO OLT type SFP packaged optical module is xgponeset, and the 7 th pin can be connected to the same IO interface of the processing unit 10, and the processing unit 10 only processes the functional test of xgponeset, but does not process the functional test of NC.

The PON optical module detection device provided by the embodiment of the specification can be used for rapidly testing key indexes of PON optical modules of all types and packaging forms in a large batch, and is moderate in price and convenient to use.

When testing is carried out, the type and basic information query of the optical module comprises three test items of bias current, product serial number SN, brand, model, package, temperature and luminous power test, the information of an internal register of the optical module can be queried through an IIC interface of a processing unit 10 connected with the optical module to obtain, and the accuracy depends on the module.

When testing, the method for testing the uplink and downlink error rate, the overload and the sensitivity of the optical module is similar. Taking the OLT optical module as an example, first, a corresponding ONU optical module standard is selected to be inserted into a socket of a corresponding daughter card of the PON optical module detection apparatus and the daughter card is connected to the base, and at this time, the ONU optical module is a part of the detection apparatus as a detection party. Then, a test network is built, an optical power meter is connected in series at an inlet of the OLT optical module, and optical power verification is carried out on the whole link: adding a receiving power range of-7 dBm to-29 dBm, configuring a VOA value of an optical attenuator to enable the measured value of an optical power meter to be-6 dBm, adding the configured value of the VOA into an attenuation value adjusting table, and checking 25 points until-30 dBm by taking 1dBm as a step through according to the method. When the uplink and downlink error rate is tested, the VOA value can be configured with a value with the link loss of-15 dBm, PRBS31 data is sent to serdes of the processing unit according to requirements, the processing unit counts the error rate according to the PRBS31 data received by the serdes, and a test result is reported to the upper computer after the test is finished. Similarly, the overload and sensitivity tests only change the corresponding parameters of the optical attenuator VOA, and the others are the same. The change of the parameters of a PON link is very small in a period of time, and the PON link does not need to be checked for many times, so that the PON link is suitable for batch testing.

When testing, because the step transmission rates of different optical modules are different, the processing unit can automatically configure corresponding rates according to the types of the optical modules, and the internal code patterns of the optical modules can be configured into PRBS31, PRBS23, PRBS15, PRBS9, PRBS7 or fixed content and the like according to requirements. Meanwhile, in order to meet the signal standard of 10G, the processing unit supports the FEC algorithm.

During testing, for the time sequence test of effective and ineffective switching time of Tx _ DIS and Los/SD, the period of LOS lock LOSs and recovery can be detected by continuously transmitting data and closing TX _ DIS signals in the middle, and the transmitted data are continuously transmitted in a cycle of 0000-FFFF. Referring to fig. 7, starting from TX _ DIS pull-up, the difference between the first data position with failed reception and the first TX _ DIS = =1 cycle is the number of cycles occupied by t _ off, similarly, the first cycle from TX _ DIS =0 to the first cycle of data recovery is t _ on, each test records a piece of data, and the same principle tests two parameters t _ on and t _ off corresponding to LOS.

When testing, when testing the received optical power, firstly checking the VOA value according to the implementation items; and then the processing unit opens the ONU optical module as the detection party to send test data and sends trig signals with different time sequences and pulse widths according to different module types, and at the moment, the OLT optical module as the party to be detected carries out optical power detection by the trig signals. And finally, the processing unit acquires the detection value through the IIC interface, compares the detection value with the set value of the VOA and judges whether the difference value meets the test error. Typically 3 points are selected for testing, namely the normal power point, near sensitivity, near overload point.

When testing is carried out, the power of the optical module is completed through the power detection chip, the power detection chip is calibrated by using a universal meter during debugging, mainly a detection value is compared with an actual value, and compensation can be carried out by using a software method. And when the power detection chip is used for testing in the later period, directly acquiring the voltage value and the current value of the optical module, and multiplying the current value and the voltage value to acquire the power of the optical module. The upper and lower thresholds of the power of the optical module may be set according to the type of the optical module.

As can be seen from the above analysis, the PON optical module detection apparatus provided in the embodiment of the present invention can simulate a PON link, an optical attenuation unit disposed on the PON link can control optical power on the link to simulate loss on different PON links, a first optical module unit and a second optical module unit disposed on the link are mutually used as a detecting party and a to-be-tested party of each other, the detecting party can participate in a test as a test tool when the to-be-tested party is tested, and a test flow of the entire PON optical module detection apparatus is uniformly controlled by a processing unit. The PON optical module detection device is simple in structure and moderate in price, a complex test environment does not need to be built, automatic testing can be achieved through the processing unit when the PON optical module detection device is used for detection, and the PON optical module detection device is convenient to use and quick in testing. Each PON optical module detection device can be connected to an upper computer through an Ethernet interface network, so that the PON optical module detection devices can be deployed in batches, and the optical modules can be tested in batches.

Example two

Referring to fig. 8, a frame diagram of a PON optical module testing system according to an embodiment of the present invention is shown, where the PON optical module testing system includes an upper computer and the PON optical module detecting device as described above, and the PON optical module detecting device is connected to the upper computer in parallel.

The upper computer can be a PC or a mobile phone terminal and the like, can send a control instruction to the processing unit or send the control instruction to the processing unit through the control unit, and can receive test data sent by the processing unit or the control unit and then perform corresponding analysis by using locally installed test analysis software to finally obtain a test result.

Each PON optical module detection device can be connected to an upper computer through an Ethernet interface network, so that the PON optical module detection devices can be deployed in batches, and the optical modules can be tested in batches.

PON optical module detection device includes: a processing unit 10, a first light module unit 20, a second light module unit 30 and a light attenuating unit 40, wherein:

the first optical module unit 20 and the second optical module unit 30 are mutually used as a detection party and a to-be-detected party of each other;

the first optical module unit 20 and the second optical module unit 30 respectively include at least one optical module, such as an OLT optical module or an optical ONU optical module, and since the PON optical module detection apparatus is an analog PON link, the first optical module unit 20 may be an OLT optical module or an ONU optical module, and the corresponding second optical module unit 20 is an ONU optical module or an OLT optical module. Of course, other modules to be tested for testing may be used to ensure that a link is formed. If the first optical module unit 20 or the second optical module unit 30 includes a plurality of optical modules, different types of optical modules may be included between the plurality of optical modules, and for convenience of testing, the plurality of optical modules included in the first optical module unit 20 or the second optical module unit 30 may include the same type of optical modules, such as an OLT optical module or an ONU optical module. If the first optical module unit 20 or the second optical module unit 30 includes a plurality of optical modules, after one end of each of the optical modules is connected to a different pin of the processing unit, the other end of each of the optical modules is connected to a different attenuator (in this case, the optical attenuation unit includes a plurality of attenuators), and then correspondingly connected to the plurality of optical modules in the second optical module unit 30 or the first optical module unit 20, so that each optical module is on the PON link.

The first optical module unit 20 and the second optical module unit 30 are the party to be tested and the party to be detected, and the party to be detected is the detecting tool for testing the party to be tested. When the first optical module unit 20 is a party to be tested, the second optical module unit is a standard component, that is, the second optical module unit adopts the standard component to assist in completing the test of the first optical module unit; similarly, when the second optical module unit 30 is the party to be tested, the first optical module unit is a standard component, that is, the first optical module unit adopts the standard component to assist in completing the test of the second optical module unit 30. The test indexes related to the optical power depend on the detection accuracy inside the detection party, and the precision and the accuracy are not as high as those of an optical power meter, but the test requirements can be basically met.

The first optical module unit 20 and the second optical module unit 30 are a detecting party and a party to be detected, and when one of them may include an OLT optical module, the other may include an ONU optical module, and a PON link may be formed. And when the party to be tested comprises the OLT optical module, the detecting party uses the standard ONU optical module to test. At this time, the ONU optical module realizes 2 functions: 1. the ONU optical module realizes downlink receiving and uplink sending of test data, and forms a complete PON service network with the OLT optical module and other passive optical devices included by a party to be tested, thereby simulating the networking mode of a real network; 2. the ONU optical module is a part of the detection device as a detection tool, and is responsible for detecting part of the test items, for example, when performing a test, the ONU optical module uses an optical power detection function inside the ONU optical module instead of an optical power meter to measure the optical power. On the contrary, when the party to be tested includes the ONU optical module, the OLT optical module included in the detecting party serves a similar function. Certainly, for convenience of operation, the multiple optical modules included by the party to be tested or the detecting party are all the same type of optical module, such as an OLT optical module or an ONU optical module.

The optical attenuation unit 40 is disposed between the first optical module unit 20 and the second optical module unit 30, is in communication connection with the processing unit 10, and controls optical power of the link based on a control instruction sent by the processing unit 10;

the optical attenuator unit 40 is an important component of the PON optical module detection apparatus, and particularly can replace an adjustable optical attenuation meter when the sensitivity and the overload optical power index of the optical module are tested, and is responsible for effectively controlling the optical power of the entire PON link.

The optical attenuation unit 40 may include a plurality of attenuators, the number of the attenuators depends on the number of links and the number of ONU optical modules in the links (considering that the ONU optical modules may be grouped on the same PON link), the plurality of attenuators are connected in parallel to the first optical module unit 20 and the second optical module unit 30, and different attenuation values may be output under the control of the processing unit 10 to simulate different link losses. The first optical module unit 20, the optical attenuation unit 40, and the second optical module unit 30 may be connected to each other by optical fibers.

The optical attenuation unit 40 is communicatively coupled to the processing unit 10. the processing unit 10 may implement programmed control of the attenuation values for the optical attenuation unit 40. When the optical attenuation unit is used for the first time, each attenuation value of the optical attenuation unit 40 needs to be calibrated by using an optical power meter, and the test range and the test interval of the attenuation value can be calibrated according to the test requirement, so that different configurations can be performed during subsequent tests. The formed attenuation value adjustment table is recorded in the memory, so that the processing unit 10 can conveniently call the attenuation value adjustment table in the later test process.

The processing unit 10 sends a test command to the first optical module unit 20 and the second optical module unit 30 to test the party to be tested.

The processing unit 10 is a core of the entire PON optical module detection apparatus, and may adopt a common microprocessor or an FPGA circuit with a microprocessor, and main detection logic and algorithms are implemented in the processing unit 10. The processor unit 10 may be responsible for logic implementation of the test function and connection of the service interface, including generation of data stream service and statistics of the received and transmitted data, timing detection and decision of the digital signal, level decision of the digital signal, and the like. The parameters related to the above operations can be changed according to the difference of the types of the optical modules and the definition difference of the pin functions. In order to connect the optical modules for batch test, the interface of the processing unit 10 needs to be extended, for example, to IIC, SPI, and the like.

The networking mode of the PON optical module detection apparatus provided in the embodiments of the present specification is a typical PON networking mode, where a PON networking includes an OLT, an ODN, and an ONU. In the PON optical module detection apparatus, the processing unit 10, the first optical module unit, and the second optical module unit correspond to an OLT and an ONU in a PON network, and the optical attenuation unit plus an optical splitter (in the case where an optical splitter is present) corresponds to an ODN. In a typical networking mode, the first optical module unit 20 is connected to the optical splitter group 50, the optical splitter group 50 is connected to the optical attenuation unit 40, and the optical attenuation unit 40 is connected to the second optical module unit 30 to form a closed loop with the processing unit 10.

When the PON optical module detection system is used for testing, the PON optical module detection device can be connected with a PC (personal computer) end or a server through a network cable, an upper computer can select different test items according to different modules to carry out automatic testing, and a test result is displayed on the upper computer. The method comprises the following specific steps:

the first step is as follows: the corresponding test device is selected according to the type of optical module placement and the form of packaging (XFP, SFP +). In a debugging stage, different ports of the processing unit can be configured as test ports of different types of optical modules, when a PON optical module detection system is used for batch testing, the ports of the processing unit of the same device are generally configured as test ports of the same type of optical modules, and then different numbers of PON optical module detection devices are brought on line according to specific test requirements.

The second step is that: and building a test network. And connecting the optical module as the party to be tested with the debugged PON optical module detection device to form a test network. Note that the PON optical module detection apparatus supports 8-channel concurrent tests, and the connection between the party to be detected and the detecting party needs to be connected according to a corresponding relationship.

The third step: the PON optical module detection device is connected with an upper computer or a server, and a PON optical module detection system is powered on. And after the PON optical module detection system is completely started, the upper computer and the PON optical module detection device are configured to enable the PON optical module detection system and the PON optical module detection device to normally communicate.

The fifth step: and selecting a test item on the upper computer according to the test requirement to start the test.

And a sixth step: and after the test is finished, automatically generating a test report, and manually removing the unqualified optical modules for analysis.

And (3) subsequently testing the same type of optical module, and obtaining the test result of the optical module only by replacing the optical module as the party to be tested and performing click test.

The PON optical module detection system has the advantages of simple structure, low cost, no need of any special optical module test instrument except for the optical fiber and the optical splitter, high test efficiency and support of multi-module parallel test. Meanwhile, the method is simple to operate, can be used for automatic testing, and is suitable for application environments with strict requirements such as high-temperature aging and batch testing. The test of various functional performances such as sensitivity, overload, LOS, RSSI, module plaintext information check, optical module in-place, power consumption, sending off/on and the like can be realized, and the coverage rate is wider.

As can be seen from the above analysis, the PON optical module detection apparatus provided in the embodiment of the present invention can simulate a PON link, an optical attenuation unit disposed on the PON link can control optical power on the link to simulate loss on different PON links, a first optical module unit and a second optical module unit disposed on the link are mutually used as a detecting party and a to-be-tested party of each other, the detecting party can participate in a test as a test tool when the to-be-tested party is tested, and a test flow of the entire PON optical module detection apparatus is uniformly controlled by a processing unit. The PON optical module detection device is simple in structure and moderate in price, a complex test environment does not need to be built, automatic testing can be achieved through the processing unit when the PON optical module detection device is used for detection, and the PON optical module detection device is convenient to use and quick in testing. Each PON optical module detection device can be connected to an upper computer through an Ethernet interface network, so that the PON optical module detection devices can be deployed in batches, and the optical modules can be tested in batches.

In short, the above description is only a preferred embodiment of the present disclosure, and is not intended to limit the scope of the present disclosure. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present specification shall be included in the protection scope of the present specification.

It should also be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.

The embodiments in the present specification are described in a progressive manner, and the same and similar parts among the embodiments are referred to each other, and each embodiment focuses on the differences from the other embodiments. In particular, for the system embodiment, since it is substantially similar to the method embodiment, the description is simple, and for the relevant points, reference may be made to the partial description of the method embodiment.

The foregoing description has been directed to specific embodiments of this disclosure. Other embodiments are within the scope of the following claims. In some cases, the actions or steps recited in the claims may be performed in a different order than in the embodiments and still achieve desirable results. In addition, the processes depicted in the accompanying figures do not necessarily require the particular order shown, or sequential order, to achieve desirable results. In some embodiments, multitasking and parallel processing may also be possible or may be advantageous.