阅读说明：本技术 一种光伏系统故障诊断方法及装置 (Photovoltaic system fault diagnosis method and device ) 是由 马铭遥 张志祥 云平 徐君 于 2021-01-19 设计创作，主要内容包括：本申请提供了一种光伏系统故障诊断方法及装置,该方法在获取表征光伏系统的电压和电流的输出特性的I-V曲线之后,从所述I-V曲线中获取至少三组I-V数据,按照电压值大小,对每三组I-V数据进行排列,得到排序后的三组I-V数据,并构造以所述排序后的每三组I-V数据中排列在最前和最后的两组数据为两个端点的直线,由于构造出的直线隐含有理想环境下,光伏系统的电压和电流的输出特性,因此,将构造的直线作为检测曲线,通过比对每条检测曲线与待检测I-V子曲线,能够判断光伏系统是否存在电流失配故障,实现光伏系统的电流失配故障的诊断。(The application provides a photovoltaic system fault diagnosis method and a device, after an I-V curve representing the output characteristics of voltage and current of a photovoltaic system is obtained, at least three groups of I-V data are obtained from the I-V curve, and according to the magnitude of the voltage value, arranging every three groups of I-V data to obtain three groups of I-V data after sequencing, and constructs a straight line with two end points of the two groups of data arranged at the top and the last in each three groups of I-V data after the sorting, because the constructed straight line contains the output characteristics of the voltage and the current of the photovoltaic system under the ideal environment, therefore, the constructed straight line is used as a detection curve, and whether the photovoltaic system has a current mismatch fault or not can be judged by comparing each detection curve with the I-V sub-curve to be detected, so that the current mismatch fault of the photovoltaic system can be diagnosed.)

1. A method for diagnosing faults of a photovoltaic system is characterized by comprising the following steps:

acquiring an I-V curve representing the output characteristics of voltage and current of a photovoltaic system;

acquiring at least three groups of I-V data from the I-V curve, and arranging each three groups of I-V data according to the voltage values to obtain three groups of sorted I-V data;

constructing a straight line taking the two groups of data arranged at the forefront and the last in each three groups of I-V data after sequencing as two end points, and taking the straight line as a detection curve;

and judging whether the photovoltaic system has a current mismatch fault or not by comparing each detection curve with an I-V sub-curve to be detected, wherein the I-V sub-curve to be detected is a part of the I-V curve, which comprises the two groups of data arranged at the top and the bottom in each three groups of I-V data after sequencing.

2. The method of claim 1, further comprising:

and if the photovoltaic system has a current mismatch fault, determining a step interval in the I-V curve.

3. The method of claim 1, wherein after the ranking each of the three sets of I-V data to obtain the sorted three sets of I-V data, further comprising:

and carrying out smooth denoising treatment on each three groups of I-V data after sequencing to obtain I-V data after smooth denoising.

4. The method according to claim 3, wherein the performing smooth denoising processing on each of the three sorted groups of I-V data to obtain smooth denoised I-V data comprises:

if I_i≥I_i-1And I_i≥I_i+1Or, I_i≤I_i-1And I_i≤I_i+1Inputting the current value of the middle data in each three groups of I-V data into the first relational expressionObtaining a current value after smooth denoising, and taking a voltage value in a group of data arranged in the middle of each three groups of I-V data after sequencing and the current value after smooth denoising as I-V data after smooth denoising;

wherein, I_iAnd U_iFor the current and voltage values of the middle data set in each of the three sorted I-V data sets, I_i-1、I_i+1、U_i-1、U_i+1And arranging the current values and the voltage values of the two groups of data at the top and the last in each three groups of I-V data after sorting.

5. The method according to any one of claims 1 to 4, wherein the determining whether the photovoltaic system has a current mismatch fault by comparing each detection curve with an I-V sub-curve to be detected comprises:

taking a current value corresponding to a voltage value in a group of data arranged in the middle of each group of I-V data in each detection curve after sequencing as a detection current value;

calculating the difference value between the detection current value corresponding to each detection curve and the current value in the group of data arranged in the middle in each three groups of I-V data after sorting;

and judging whether the photovoltaic system has a current mismatch fault or not by comparing the difference value with a preset inflection point characteristic detection threshold value.

6. The method according to claim 5, wherein the step of using, as the detected current value, a current value corresponding to a voltage value in a set of data arranged in the middle of each of the three sorted sets of I-V data in each of the detection curves comprises:

determining an expression of each of the detection curves asI_N-1And U_N-1One of the first and last two groups of data, I, belonging to each of the three groups of I-V data after sorting_N+1And U_N+1The other data in the first and the last two groups of data in each three groups of I-V data after the sorting;

and inputting the voltage values in the group of data arranged in the middle in each three groups of I-V data after sequencing into the expression of the detection curve to obtain the detection current value.

7. The method of claim 6, wherein the determining whether the photovoltaic system has a current mismatch fault by comparing the difference value with a preset knee characteristic detection threshold in the case that more than three groups of I-V data are obtained from the I-V curve comprises:

selecting a maximum value from the plurality of difference values as a global maximum difference value;

and judging whether the global maximum difference value is larger than a preset inflection point feature detection threshold value.

8. The method of claim 7, wherein the determining a step interval in the I-V curve comprises:

acquiring the open-circuit voltage of the photovoltaic system based on the I-V curve, and dividing the voltage range corresponding to the I-V curve into a plurality of first voltage intervals according to the open-circuit voltage;

determining a difference value belonging to each first voltage interval from the plurality of difference values, and selecting a maximum value from the difference values belonging to each first voltage interval as a sub-global maximum difference value;

screening out voltage intervals with the sub-global maximum difference value larger than the inflection point feature detection threshold from the plurality of first voltage intervals, taking the screened voltage intervals as second voltage intervals, and recording the number of the second voltage intervals;

performing ascending arrangement on the voltage corresponding to the sub-global maximum difference value in at least one second voltage interval, and taking data consisting of the voltages after ascending arrangement and the currents corresponding to the voltages as step inflection points;

and determining a step starting point and a step ending point according to the number of the second voltage intervals and the step inflection point, and taking an interval between the step starting point and the step ending point as a step interval.

9. The method according to claim 8, wherein the determining a step start point and a step end point according to the number of the second voltage sections and the step inflection point, and using a section between the step start point and the step end point as a step section comprises:

if the k is equal to 1, taking the voltage value of the step inflection point in the second voltage interval as a step starting point, and determining that the voltage value belongs to the step inflection pointSearching for a coordinate corresponding to the minimum value in the I-V curve, taking a voltage value in the searched coordinate as a step end point, and expressing the step end point as UE;

a voltage interval including the step start point and the step end point is taken as a voltage interval with current mismatch and is denoted as [ US _1, UE ];

if the k is larger than 1, the voltage value of the step inflection point in each second voltage interval is taken as a step starting point to respectively determine the step inflection point belongs toThe minimum value of the difference value in the voltage interval corresponding to each step inflection point in the inflection point set is arranged according to the ascending order, and the voltage corresponding to each minimum value in the I-V curve is increasedThe sequenced voltages are used as step end points, the step end points are expressed as UE _ i, and the inflection point set comprises step inflection points in second voltage intervals except the smallest second voltage interval in the second voltage intervals;

a voltage interval including a starting point of each step and an end point of the corresponding step is taken as a voltage interval with current mismatch and is represented as [ US _ i, UE _ i ], wherein i is 1,2, …, k;

wherein, theIs a plurality of first voltage intervalsWherein i is 0 to n-1, and US _1 or US _ i is a voltage value in the step inflection point, which is represented by (U)_{S_i},I_{S_i}) Wherein i is 1,2, …, k, k is the number of the second voltage intervals.

10. The method according to any one of claims 1 to 4, wherein the determining whether the photovoltaic system has a current mismatch fault by comparing each detection curve with an I-V sub-curve to be detected comprises:

determining the relative position relationship between each detection curve and the I-V sub-curve to be detected;

and judging whether the relative position relationship between each detection area and the I-V sub-curve to be detected is related to the relative position relationship representing the existence of the current mismatch fault of the photovoltaic system.

11. A photovoltaic system fault diagnosis apparatus, comprising:

the acquisition module is used for acquiring an I-V curve representing the output characteristics of the voltage and the current of the photovoltaic system;

the sorting module is used for acquiring at least three groups of I-V data from the I-V curve, and sorting each three groups of I-V data according to the voltage value to obtain three groups of sorted I-V data;

the construction module is used for constructing a straight line taking the two groups of data arranged at the forefront and the last in each three groups of I-V data after sequencing as two end points, and taking the straight line as a detection curve;

and the judging module is used for judging whether the photovoltaic system has a current mismatch fault or not by comparing each detection curve with an I-V sub-curve to be detected, wherein the I-V sub-curve to be detected is a part of the I-V curve, which comprises the first and last groups of data arranged in each three groups of I-V data after sequencing.

12. The apparatus of claim 11, further comprising:

and the step interval determining module is used for determining a step interval in the I-V curve if the photovoltaic system has a current mismatch fault.

13. The apparatus of claim 11, further comprising:

and the denoising module is used for carrying out smooth denoising treatment on each three groups of I-V data after sequencing to obtain I-V data after smooth denoising.

14. The apparatus of claim 13, wherein the denoising module is specifically configured to:

if I_i≥I_i-1And I_i≥I_i+1Or, I_i≤I_i-1And I_i≤I_i+1Inputting the current value of the middle data in each three groups of I-V data into the first relational expressionObtaining a current value after smooth denoising, and taking a voltage value in a group of data arranged in the middle of each three groups of I-V data after sequencing and the current value after smooth denoising as I-V data after smooth denoising;

wherein the content of the first and second substances,I_iand U_iFor the current and voltage values of the middle data set in each of the three sorted I-V data sets, I_i-1、I_i+1、U_i-1、U_i+1And arranging the current values and the voltage values of the two groups of data at the top and the last in each three groups of I-V data after sorting.

15. The apparatus according to any one of claims 11 to 14, wherein the determining module is specifically configured to:

taking a current value corresponding to a voltage value in a group of data arranged in the middle of each group of I-V data in each detection curve after sequencing as a detection current value;

calculating the difference value between the detection current value corresponding to each detection curve and the current value in the group of data arranged in the middle in each three groups of I-V data after sorting;

and judging whether the photovoltaic system has a current mismatch fault or not by comparing the difference value with a preset inflection point characteristic detection threshold value.

16. The apparatus of claim 15, wherein the determining module is specifically configured to:

determining an expression of each of the detection curves asI_N-1And U_N-1One of the first and last two groups of data, I, belonging to each of the three groups of I-V data after sorting_N+1And U_N+1The other data in the first and the last two groups of data in each three groups of I-V data after the sorting;

and inputting the voltage values in the group of data arranged in the middle in each three groups of I-V data after sequencing into the expression of the detection curve to obtain the detection current value.

17. The apparatus of claim 16, wherein the determining module is specifically configured to:

selecting a maximum value from the plurality of difference values as a global maximum difference value;

and judging whether the global maximum difference value is larger than a preset inflection point feature detection threshold value.

18. The apparatus of claim 17, wherein the step interval determining module is specifically configured to:

acquiring the open-circuit voltage of the photovoltaic system based on the I-V curve, and dividing the voltage range corresponding to the I-V curve into a plurality of first voltage intervals according to the open-circuit voltage;

determining a difference value belonging to each first voltage interval from the plurality of difference values, and selecting a maximum value from the difference values belonging to each first voltage interval as a sub-global maximum difference value;

screening out voltage intervals with the sub-global maximum difference value larger than the inflection point feature detection threshold from the plurality of first voltage intervals, taking the screened voltage intervals as second voltage intervals, and recording the number of the second voltage intervals;

performing ascending arrangement on the voltage corresponding to the sub-global maximum difference value in at least one second voltage interval, and taking data consisting of the voltages after ascending arrangement and the currents corresponding to the voltages as step inflection points;

and determining a step starting point and a step ending point according to the number of the second voltage intervals and the step inflection point, and taking an interval between the step starting point and the step ending point as a step interval.

19. The apparatus of claim 18, wherein the step interval determining module is specifically configured to:

if the k is equal to 1, taking the voltage value of the step inflection point in the second voltage interval as a step starting point, and determining that the voltage value belongs to the step inflection pointSearching for a coordinate corresponding to the minimum value in the I-V curve, taking a voltage value in the searched coordinate as a step end point, and expressing the step end point as UE;

a voltage interval including the step start point and the step end point is taken as a voltage interval with current mismatch and is denoted as [ US _1, UE ];

if the k is larger than 1, the voltage value of the step inflection point in each second voltage interval is taken as a step starting point to respectively determine the step inflection point belongs toArranging voltages corresponding to the minimum values in the I-V curve according to an ascending order, taking the voltages after ascending order as step end points, and representing the step end points as UE _ I, wherein the inflection point set comprises step inflection points in second voltage intervals except for the smallest second voltage interval in the second voltage intervals;

a voltage interval including a starting point of each step and an end point of the corresponding step is taken as a voltage interval with current mismatch and is represented as [ US _ i, UE _ i ], wherein i is 1,2, …, k;

wherein, theIs a plurality of first voltage intervalsWherein i is 0 to n-1, and US _1 or US _ i is a voltage value in the step inflection point, which is represented by (U)_{S_i},I_{S_i}) Wherein i is 1,2, …, k, k is the number of the second voltage intervals.

20. The apparatus according to any one of claims 11 to 14, wherein the determining module is specifically configured to:

determining the relative position relationship between each detection curve and the I-V sub-curve to be detected;

and judging whether the relative position relationship between each detection area and the I-V sub-curve to be detected is related to the relative position relationship representing the existence of the current mismatch fault of the photovoltaic system.

Technical Field

The application relates to the technical field of new energy, in particular to a photovoltaic system fault diagnosis method and device.

Background

With the large-scale application of photovoltaic power generation, the reliability of a photovoltaic system serving as a core component in the photovoltaic power generation system is a key influencing the performance of the whole system. As the photovoltaic system is installed in an outdoor environment and is continuously exposed to severe environmental conditions, various fault problems become increasingly prominent, and the service life of the photovoltaic system is seriously influenced. The failure of the photovoltaic system not only reduces the power generation efficiency of the system, but also causes a series of safety problems.

The output current of the component is reduced due to the current mismatch type fault, and the output power of the photovoltaic system is seriously influenced due to the step of the I-V characteristic curve.

Therefore, how to diagnose the current mismatch fault becomes an urgent problem to be solved.

Disclosure of Invention

In order to solve the above technical problems, embodiments of the present application provide a method and an apparatus for diagnosing a fault of a photovoltaic system, so as to achieve a purpose of diagnosing a current mismatch fault, and a technical scheme is as follows:

a photovoltaic system fault diagnosis method comprises the following steps:

acquiring an I-V curve representing the output characteristics of voltage and current of a photovoltaic system;

acquiring at least three groups of I-V data from the I-V curve, and arranging each three groups of I-V data according to the voltage values to obtain three groups of sorted I-V data;

constructing a straight line taking the two groups of data arranged at the forefront and the last in each three groups of I-V data after sequencing as two end points, and taking the straight line as a detection curve;

and judging whether the photovoltaic system has a current mismatch fault or not by comparing each detection curve with an I-V sub-curve to be detected, wherein the I-V sub-curve to be detected is a part of the I-V curve, which comprises the two groups of data arranged at the top and the bottom in each three groups of I-V data after sequencing.

The method further comprises the following steps:

and if the photovoltaic system has a current mismatch fault, determining a step interval in the I-V curve.

After each three groups of I-V data are arranged to obtain the three groups of I-V data after sequencing, the method further comprises the following steps:

and carrying out smooth denoising treatment on each three groups of I-V data after sequencing to obtain I-V data after smooth denoising.

The step of performing smooth denoising processing on each three groups of sorted I-V data to obtain the I-V data after smooth denoising comprises the following steps:

if I_i≥I_i-1And I_i≥I_i+1Or, I_i≤I_i-1And I_i≤I_i+1Inputting the current value of the middle data in each three groups of I-V data into the first relational expressionObtaining a current value after smooth denoising, and taking a voltage value in a group of data arranged in the middle of each three groups of I-V data after sequencing and the current value after smooth denoising as I-V data after smooth denoising;

wherein, I_iAnd U_iFor the current and voltage values of the middle data set in each of the three sorted I-V data sets, I_i-1、I_i+1、U_i-1、U_i+1And arranging the current values and the voltage values of the two groups of data at the top and the last in each three groups of I-V data after sorting.

The step of judging whether the photovoltaic system has a current mismatch fault by comparing each detection curve with the I-V sub-curve to be detected comprises the following steps:

taking a current value corresponding to a voltage value in a group of data arranged in the middle of each group of I-V data in each detection curve after sequencing as a detection current value;

calculating the difference value between the detection current value corresponding to each detection curve and the current value in the group of data arranged in the middle in each three groups of I-V data after sorting;

and judging whether the photovoltaic system has a current mismatch fault or not by comparing the difference value with a preset inflection point characteristic detection threshold value.

The step of taking a current value corresponding to a voltage value in a group of data arranged in the middle of each group of sorted I-V data in each detection curve as a detection current value includes:

determining an expression of each of the detection curves asI_N-1And U_N-1One of the first and last two groups of data, I, belonging to each of the three groups of I-V data after sorting_N+1And U_N+1The other data in the first and the last two groups of data in each three groups of I-V data after the sorting;

and inputting the voltage values in the group of data arranged in the middle in each three groups of I-V data after sequencing into the expression of the detection curve to obtain the detection current value.

In a case that more than three groups of I-V data are obtained from the I-V curve, the determining whether the photovoltaic system has a current mismatch fault by comparing the difference value with a preset inflection point feature detection threshold includes:

selecting a maximum value from the plurality of difference values as a global maximum difference value;

and judging whether the global maximum difference value is larger than a preset inflection point feature detection threshold value.

The determining a step interval in the I-V curve includes:

acquiring the open-circuit voltage of the photovoltaic system based on the I-V curve, and dividing the voltage range corresponding to the I-V curve into a plurality of first voltage intervals according to the open-circuit voltage;

determining a difference value belonging to each first voltage interval from the plurality of difference values, and selecting a maximum value from the difference values belonging to each first voltage interval as a sub-global maximum difference value;

screening out voltage intervals with the sub-global maximum difference value larger than the inflection point feature detection threshold from the plurality of first voltage intervals, taking the screened voltage intervals as second voltage intervals, and recording the number of the second voltage intervals;

performing ascending arrangement on the voltage corresponding to the sub-global maximum difference value in at least one second voltage interval, and taking data consisting of the voltages after ascending arrangement and the currents corresponding to the voltages as step inflection points;

and determining a step starting point and a step ending point according to the number of the second voltage intervals and the step inflection point, and taking an interval between the step starting point and the step ending point as a step interval.

Determining a step starting point and a step ending point according to the number of the second voltage intervals and the step inflection point, and taking an interval between the step starting point and the step ending point as a step interval, wherein the step interval comprises:

if the k is equal to 1, taking the voltage value of the step inflection point in the second voltage interval as a step starting point, and determining that the voltage value belongs to the step inflection pointSearching for a coordinate corresponding to the minimum value in the I-V curve, taking a voltage value in the searched coordinate as a step end point, and expressing the step end point as UE;

a voltage interval including the step start point and the step end point is taken as a voltage interval with current mismatch and is denoted as [ US _1, UE ];

if the k is larger than 1, the voltage value of the step inflection point in each second voltage interval is taken as a step starting point to respectively determine the step inflection point belongs toArranging voltages corresponding to the minimum values in the I-V curve according to an ascending order, taking the voltages after ascending order as step end points, and representing the step end points as UE _ I, wherein the inflection point set comprises step inflection points in second voltage intervals except for the smallest second voltage interval in the second voltage intervals;

a voltage interval including a starting point of each step and an end point of the corresponding step is taken as a voltage interval with current mismatch and is represented as [ US _ i, UE _ i ], wherein i is 1,2, …, k;

wherein, theIs a plurality of first voltage intervalsWherein i is 0 to n-1, and US _1 or US _ i is a voltage value in the step inflection point, which is represented by (U)_{S_i},I_{S_i}) Wherein i is 1,2, …, k, k is the number of the second voltage intervals.

The step of judging whether the photovoltaic system has a current mismatch fault by comparing each detection curve with the I-V sub-curve to be detected comprises the following steps:

determining the relative position relationship between each detection curve and the I-V sub-curve to be detected;

and judging whether the relative position relationship between each detection area and the I-V sub-curve to be detected is related to the relative position relationship representing the existence of the current mismatch fault of the photovoltaic system.

A photovoltaic system fault diagnosis apparatus comprising:

the acquisition module is used for acquiring an I-V curve representing the output characteristics of the voltage and the current of the photovoltaic system;

the sorting module is used for acquiring at least three groups of I-V data from the I-V curve, and sorting each three groups of I-V data according to the voltage value to obtain three groups of sorted I-V data;

the construction module is used for constructing a straight line taking the two groups of data arranged at the forefront and the last in each three groups of I-V data after sequencing as two end points, and taking the straight line as a detection curve;

and the judging module is used for judging whether the photovoltaic system has a current mismatch fault or not by comparing each detection curve with an I-V sub-curve to be detected, wherein the I-V sub-curve to be detected is a part of the I-V curve, which comprises the first and last groups of data arranged in each three groups of I-V data after sequencing.

The device further comprises:

and the step interval determining module is used for determining a step interval in the I-V curve if the photovoltaic system has a current mismatch fault.

The device further comprises:

and the denoising module is used for carrying out smooth denoising treatment on each three groups of I-V data after sequencing to obtain I-V data after smooth denoising.

The denoising module is specifically configured to:

if I_i≥I_i-1And I_i≥I_i+1Or, I_i≤I_i-1And I_i≤I_i+1Inputting the current value of the middle data in each three groups of I-V data into the first relational expressionObtaining a current value after smooth denoising, and taking a voltage value in a group of data arranged in the middle of each three groups of I-V data after sequencing and the current value after smooth denoising as I-V data after smooth denoising;

wherein, I_iAnd Ui is the current value and the voltage value of one group of data arranged in the middle in each three groups of I-V data after sorting, I_i-1、I_i+1、U_i-1、U_i+1And arranging the current values and the voltage values of the two groups of data at the top and the last in each three groups of I-V data after sorting.

The judgment module is specifically configured to:

taking a current value corresponding to a voltage value in a group of data arranged in the middle of each group of I-V data in each detection curve after sequencing as a detection current value;

calculating the difference value between the detection current value corresponding to each detection curve and the current value in the group of data arranged in the middle in each three groups of I-V data after sorting;

and judging whether the photovoltaic system has a current mismatch fault or not by comparing the difference value with a preset inflection point characteristic detection threshold value.

The judgment module is specifically configured to:

determining an expression of each of the detection curves asI_N-1And U_N-1One of the first and last two groups of data, I, belonging to each of the three groups of I-V data after sorting_N+1And U_N+1The other data in the first and the last two groups of data in each three groups of I-V data after the sorting;

and inputting the voltage values in the group of data arranged in the middle in each three groups of I-V data after sequencing into the expression of the detection curve to obtain the detection current value.

The judgment module is specifically configured to:

selecting a maximum value from the plurality of difference values as a global maximum difference value;

and judging whether the global maximum difference value is larger than a preset inflection point feature detection threshold value.

The step interval determining module is specifically configured to:

acquiring the open-circuit voltage of the photovoltaic system based on the I-V curve, and dividing the voltage range corresponding to the I-V curve into a plurality of first voltage intervals according to the open-circuit voltage;

determining a difference value belonging to each first voltage interval from the plurality of difference values, and selecting a maximum value from the difference values belonging to each first voltage interval as a sub-global maximum difference value;

screening out voltage intervals with the sub-global maximum difference value larger than the inflection point feature detection threshold from the plurality of first voltage intervals, taking the screened voltage intervals as second voltage intervals, and recording the number of the second voltage intervals;

performing ascending arrangement on the voltage corresponding to the sub-global maximum difference value in at least one second voltage interval, and taking data consisting of the voltages after ascending arrangement and the currents corresponding to the voltages as step inflection points;

and determining a step starting point and a step ending point according to the number of the second voltage intervals and the step inflection point, and taking an interval between the step starting point and the step ending point as a step interval.

The step interval determining module is specifically configured to:

if the k is equal to 1, taking the voltage value of the step inflection point in the second voltage interval as a step starting point, and determining that the voltage value belongs to the step inflection pointSearching for a coordinate corresponding to the minimum value in the I-V curve, taking a voltage value in the searched coordinate as a step end point, and expressing the step end point as UE;

a voltage interval including the step start point and the step end point is taken as a voltage interval with current mismatch and is denoted as [ US _1, UE ];

if the k is larger than 1, the voltage value of the step inflection point in each second voltage interval is taken as a step starting point to respectively determine the step inflection point belongs toArranging voltages corresponding to the minimum values in the I-V curve according to an ascending order, taking the voltages after ascending order as step end points, and representing the step end points as UE _ I, wherein the inflection point set comprises step inflection points in second voltage intervals except for the smallest second voltage interval in the second voltage intervals;

a voltage interval including a starting point of each step and an end point of the corresponding step is taken as a voltage interval with current mismatch and is represented as [ US _ i, UE _ i ], wherein i is 1,2, …, k;

wherein, theIs a plurality of first voltage intervalsWherein i is 0 to n-1, and US _1 or US _ i is a voltage value in the step inflection point, which is represented by (U)_{S_i},I_{S_i}) Wherein i is 1,2, …, k, k is the number of the second voltage intervals.

The judgment module is specifically configured to:

determining the relative position relationship between each detection curve and the I-V sub-curve to be detected;

and judging whether the relative position relationship between each detection area and the I-V sub-curve to be detected is related to the relative position relationship representing the existence of the current mismatch fault of the photovoltaic system.

Compared with the prior art, the beneficial effect of this application is:

in the method, after an I-V curve representing the output characteristics of voltage and current of a photovoltaic system is obtained, at least three groups of I-V data are obtained from the I-V curve, each three groups of I-V data are arranged according to the voltage value to obtain the three groups of I-V data after sequencing, a straight line taking the two groups of data arranged at the forefront and the last of the three groups of I-V data after sequencing as two end points is constructed, and because the constructed straight line implicitly contains the output characteristics of the voltage and the current of the photovoltaic system under an ideal environment, the constructed straight line is taken as a detection curve, and by comparing each detection curve with an I-V sub-curve to be detected, whether the photovoltaic system has a current mismatch fault can be judged, so that the current mismatch fault diagnosis of the photovoltaic system is realized.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive labor.

FIG. 1 is a schematic structural view of a photovoltaic system provided for the present application;

FIG. 2 is a schematic structural view of a photovoltaic module provided herein;

fig. 3 is a flowchart of a method for diagnosing a fault of a photovoltaic system according to embodiment 1 of the present application;

fig. 4 is a flowchart of a method for diagnosing a fault of a photovoltaic system according to embodiment 2 of the present application;

fig. 5 is a flowchart of a method for diagnosing a fault of a photovoltaic system according to embodiment 3 of the present application;

fig. 6 is a flowchart of a method for diagnosing a fault of a photovoltaic system according to embodiment 4 of the present application;

FIG. 7 is a schematic illustration of an I-V curve for a photovoltaic system provided herein;

fig. 8 is a flowchart of a method for diagnosing a fault of a photovoltaic system according to embodiment 5 of the present application;

FIG. 9 is an I-V curve and inflection point detection feature Δ I under local occlusion according to the present application_NA distribution map of;

FIG. 10 is a schematic illustration of inflection point detection and step interval identification provided herein;

fig. 11 is a flowchart of a method for diagnosing a fault of a photovoltaic system according to embodiment 6 of the present application;

FIG. 12 is a schematic diagram of a comparison of a test curve with an I-V sub-curve to be tested according to the present application;

fig. 13 is a schematic logical structure diagram of a photovoltaic system fault diagnosis apparatus provided in the present application.

Detailed Description

The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in further detail below.

The photovoltaic system fault diagnosis method provided by the embodiment of the application is mainly used for diagnosing current mismatch faults of a photovoltaic system, wherein the photovoltaic system can be a photovoltaic module or a photovoltaic group string, the photovoltaic group string is formed by connecting m photovoltaic modules with the same structure in series, as shown in fig. 1, each photovoltaic module is formed by connecting N photovoltaic sub-strings with the same structure in series, two ends of each sub-string are connected with a bypass diode in anti-parallel, as shown in fig. 2, the number of the photovoltaic sub-strings in the photovoltaic system is N & ltmN & gt.

Next, a photovoltaic system fault diagnosis method disclosed in an embodiment of the present application is introduced, and as shown in fig. 3, a flowchart of a photovoltaic system fault diagnosis method provided in embodiment 1 of the present application may include the following steps:

and step S11, acquiring an I-V curve representing the output characteristics of the voltage and the current of the photovoltaic system.

In this embodiment, an optimizer and an inverter having an I-V scanning function may be used, but not limited to, to obtain an I-V curve representing output characteristics of voltage and current of a photovoltaic system.

And step S12, acquiring at least three groups of I-V data from the I-V curve, and arranging each three groups of I-V data according to the voltage values to obtain three groups of sorted I-V data.

According to the voltage value, arranging each three groups of I-V data to obtain the three groups of sorted I-V data, which may be but is not limited to: arranging every three groups of I-V data according to the sequence of the voltage values from large to small to obtain three groups of I-V data after sequencing; or, arranging every three groups of I-V data according to the sequence of the voltage values from small to large to obtain the three groups of I-V data after sequencing.

In the embodiment, each three groups of I-V data are arranged according to the voltage value to obtain three groups of sorted I-V data, so that the I-V data to be processed are ensured to be ordered, and the subsequent processing efficiency is improved.

And step S13, constructing a straight line taking the two groups of data arranged at the top and the last in each three groups of I-V data after sorting as two end points, and taking the straight line as a detection curve.

In this embodiment, the two groups of data arranged at the top and the last in each three groups of sorted I-V data are constructed as straight lines of two end points, which implicitly includes the output characteristics of the voltage and current of the photovoltaic system in an ideal environment.

And step S14, judging whether the photovoltaic system has a current mismatch fault or not by comparing each detection curve with an I-V sub-curve to be detected, wherein the I-V sub-curve to be detected is a part of the I-V curve, which comprises the two groups of data arranged at the top and the bottom in each three groups of I-V data after sequencing.

Because each detection curve implicitly contains the output characteristics of the voltage and the current of the photovoltaic system under an ideal environment, whether the current mismatch fault exists in the photovoltaic system can be judged by comparing each detection curve with the I-V sub-curve to be detected of the photovoltaic system under the actual environment condition.

By comparing each detection curve with the I-V sub-curve to be detected, whether the output current of the photovoltaic system is reduced and/or the I-V curve has steps can be detected, and if the output current is reduced and/or the I-V curve has steps, the photovoltaic system can be judged to have a current mismatch fault.

The current mismatch fault may include, but is not limited to: any one or more of shadows, hot spots, and glass fragmentation.

Because the detection curve is a straight line taking the two groups of data arranged at the forefront and the last in each three groups of I-V data after sequencing as two end points, the part of the I-V curve containing the two groups of data arranged at the forefront and the last in each three groups of I-V data after sequencing is taken as an I-V sub-curve to be detected, and the comparison range can be narrowed, the comparison precision can be improved, and the accuracy for judging whether the photovoltaic system has the current mismatch fault can be improved.

In the method, after an I-V curve representing the output characteristics of voltage and current of a photovoltaic system is obtained, at least three groups of I-V data are obtained from the I-V curve, each three groups of I-V data are arranged according to the voltage value to obtain the three groups of I-V data after sequencing, a straight line taking the two groups of data arranged at the forefront and the last of the three groups of I-V data after sequencing as two end points is constructed, and because the constructed straight line implicitly contains the output characteristics of the voltage and the current of the photovoltaic system under an ideal environment, the constructed straight line is taken as a detection curve, and by comparing each detection curve with an I-V sub-curve to be detected, whether the photovoltaic system has a current mismatch fault can be judged, so that the current mismatch fault diagnosis of the photovoltaic system is realized.

As another alternative embodiment of the present application, referring to fig. 4, a flowchart of a photovoltaic system fault diagnosis method provided in embodiment 2 of the present application is shown, where this embodiment is mainly an extension of the photovoltaic system fault diagnosis method described in embodiment 1 above, and as shown in fig. 4, the method may include, but is not limited to, the following steps:

and step S21, acquiring an I-V curve representing the output characteristics of the voltage and the current of the photovoltaic system.

And step S22, acquiring at least three groups of I-V data from the I-V curve, and arranging each three groups of I-V data according to the voltage values to obtain three groups of sorted I-V data.

And step S23, constructing a straight line taking the two groups of data arranged at the top and the last in each three groups of I-V data after sorting as two end points, and taking the straight line as a detection curve.

And step S24, judging whether the photovoltaic system has a current mismatch fault or not by comparing each detection curve with an I-V sub-curve to be detected, wherein the I-V sub-curve to be detected is a part of the I-V curve, which comprises the two groups of data arranged at the top and the bottom in each three groups of I-V data after sequencing.

The detailed procedures of steps S21-S24 can be found in the related descriptions of steps S11-S14 in embodiment 1, and are not repeated herein.

And step S25, if the photovoltaic system has a current mismatch fault, determining a step interval in the I-V curve.

Step interval, can be understood as: a voltage interval of steps occurs.

If the photovoltaic system has a current mismatch fault, the fact that the output current of the photovoltaic system is reduced is reflected to an I-V curve of the photovoltaic system, the I-V curve can have steps, and under the condition that the steps of the I-V curve are determined, the step interval in the I-V curve can be determined.

After the step interval in the I-V curve is determined, the type of the current mismatch fault, the number of photovoltaic modules with the current mismatch fault or the severity of the current mismatch fault can be determined according to the step interval, so that the current mismatch fault can be accurately diagnosed, the power generation benefit of a photovoltaic system is increased, and the operation and maintenance efficiency is improved.

As another alternative embodiment of the present application, referring to fig. 5, there is provided a flowchart of a photovoltaic system fault diagnosis method in embodiment 3 of the present application, where this embodiment is mainly an extension of the photovoltaic system fault diagnosis method described in embodiment 1 above, and as shown in fig. 5, the method may include, but is not limited to, the following steps:

and step S31, acquiring an I-V curve representing the output characteristics of the voltage and the current of the photovoltaic system.

And step S32, acquiring at least three groups of I-V data from the I-V curve, and arranging each three groups of I-V data according to the voltage values to obtain three groups of sorted I-V data.

The detailed procedures of steps S31-S32 can be found in the related descriptions of steps S11-S12 in embodiment 1, and are not repeated herein.

And S33, performing smooth denoising treatment on each three groups of sorted I-V data to obtain the I-V data subjected to smooth denoising.

In this embodiment, the process of performing smooth denoising processing on each three groups of sorted I-V data to obtain smooth denoised I-V data may include, but is not limited to:

if I_i≥I_i-1And I_i≥I_i+1Or, I_i≤I_i-1And I_i≤I_i+1Inputting the current value of the middle data in each three groups of I-V data into the first relational expressionObtaining a current value after smooth denoising, and taking a voltage value in a group of data arranged in the middle of each three groups of I-V data after sequencing and the current value after smooth denoising as I-V data after smooth denoising;

wherein, I_iAnd U_iFor the current and voltage values of the middle data set in each of the three sorted I-V data sets, I_i-1、I_i+1、U_i-1、U_i+1And arranging the current values and the voltage values of the two groups of data at the top and the last in each three groups of I-V data after sorting.

And step S34, constructing a straight line taking the two groups of data arranged at the front and the last in each three groups of the sorted I-V data after smooth denoising as two end points, and taking the straight line as a detection curve.

And step S35, judging whether the photovoltaic system has a current mismatch fault or not by comparing each detection curve with an I-V sub-curve to be detected, wherein the I-V sub-curve to be detected is a part of the I-V curve, which comprises the two groups of data arranged at the front and the last in each three groups of smoothly denoised I-V data after sequencing.

The detailed procedures of steps S34-S35 can be found in the related descriptions of steps S13-S14 in embodiment 1, and are not repeated herein.

In the embodiment, smooth denoising processing is performed on each three groups of sorted I-V data, so that the accuracy of the I-V data participating in current mismatch fault diagnosis can be improved, and the accuracy of the current mismatch fault diagnosis is further improved.

As another alternative embodiment of the present application, referring to fig. 6, there is provided a flowchart of a photovoltaic system fault diagnosis method in embodiment 4 of the present application, where this embodiment mainly relates to a refinement of the photovoltaic system fault diagnosis method described in embodiment 1 above, as shown in fig. 6, the method may include, but is not limited to, the following steps:

and step S41, acquiring an I-V curve representing the output characteristics of the voltage and the current of the photovoltaic system.

And step S42, acquiring at least three groups of I-V data from the I-V curve, and arranging each three groups of I-V data according to the voltage values to obtain three groups of sorted I-V data.

And step S43, constructing a straight line taking the two groups of data arranged at the top and the last in each three groups of I-V data after sorting as two end points, and taking the straight line as a detection curve.

The detailed procedures of steps S41-S43 can be found in the related descriptions of steps S11-S13 in embodiment 1, and are not repeated herein.

And step S44, taking a current value corresponding to the voltage value in the middle data group arranged in each sorted three groups of I-V data in each detection curve as a detection current value.

In this embodiment, the process of using, as the detected current value, a current value corresponding to a voltage value in a group of data arranged in the middle of each of the three groups of sorted I-V data in each of the detection curves may be, but is not limited to:

s441, determining the expression of each detection curve asI_N-1And U_N-1One of the first and last two groups of data, I, belonging to each of the three groups of I-V data after sorting_N+1And U_N+1And the other data in the first and the last two groups of data in each three groups of I-V data after the sorting.

Because the expression corresponding to the straight line can be determined according to the two points on the straight line, the expression of the straight line is determined according to the data of the two end points of the constructed straight line, namely the two groups of data arranged at the top and the last in each three groups of I-V data after sequencing. Specifically, the two sets of data arranged at the top and the last in each of the three sets of I-V data after sorting are (U)_N-1，I_N-1) And (U)_N+1，I_N+1) Then, it can be determined that the expression of the straight line is:

and S442, inputting the voltage values in the group of data arranged in the middle of each of the three groups of sorted I-V data into the expression of the detection curve to obtain the detection current value.

And step S45, calculating the difference value between the detection current value corresponding to each detection curve and the current value in the middle group of data in each two groups of sorted I-V data.

And step S46, judging whether the photovoltaic system has a current mismatch fault or not by comparing the difference value with a preset inflection point characteristic detection threshold value.

The step of determining whether the photovoltaic system has a current mismatch fault by comparing the difference with a preset inflection point feature detection threshold may include:

and S461, judging whether the difference value is larger than a preset inflection point characteristic detection threshold value.

If yes, go to step S462; if not, step S463 is executed.

And S462, determining that the photovoltaic system has a current mismatch fault.

And S463, determining that the photovoltaic system has no current mismatch fault.

It can be understood that when the difference is greater than 0, it can be determined that there is a dip in the I-V curve of the photovoltaic system at that point, whereas, as shown in fig. 7, in the case where there is no current mismatch fault, the I-V curve of the photovoltaic system is monotonically decreasing and has a convex trend, and thus, when it is determined that there is a dip in the I-V curve of the photovoltaic system at a certain point, it can be determined that there is a current mismatch fault in the photovoltaic system. On the basis, the data fluctuation is considered, and therefore, the judgment accuracy is improved by judging whether the difference value is larger than a preset inflection point feature detection threshold value.

In this embodiment, when more than three groups of I-V data are obtained from the I-V curve, the step of determining whether the photovoltaic system has a current mismatch fault by comparing the difference with a preset knee characteristic detection threshold may include:

and S464, selecting a maximum value from the difference values to be used as a global maximum difference value.

In this embodiment, the difference corresponding to the portion of the I-V curve that dips most severely is the largest, so in order to more accurately determine whether the photovoltaic system has a current mismatch fault, the largest difference may be compared with a preset inflection point feature detection threshold. Specifically, a maximum value is selected from the plurality of difference values as a global maximum difference value.

And S465, judging whether the global maximum difference value is larger than a preset inflection point feature detection threshold value.

If yes, go to step S466; if not, step S467 is performed.

S466, determining that the photovoltaic system has a current mismatch fault.

And S467, determining that the photovoltaic system has no current mismatch fault.

Steps S44-S46 are a specific implementation of step S14 in example 1.

In this embodiment, in each detection curve, a current value corresponding to a voltage value in a group of data arranged in the middle of each of the three groups of sorted I-V data is used as a detection current value, a difference between the detection current value corresponding to each detection curve and a current value in a group of data arranged in the middle of each of the three groups of sorted I-V data is calculated, and whether a current mismatch fault exists in the photovoltaic system is determined by comparing the difference with a preset inflection point characteristic detection threshold, so that a manner of obtaining a characteristic value and processing the characteristic value is adopted to determine whether the current mismatch fault exists in the photovoltaic system, and a determination result is more accurate.

As another alternative embodiment of the present application, referring to fig. 8, a flowchart of a photovoltaic system fault diagnosis method provided in embodiment 5 of the present application is provided, and this embodiment mainly provides a refinement of the photovoltaic system fault diagnosis method described in embodiment 2 above, as shown in fig. 8, the method may include, but is not limited to, the following steps:

and step S51, acquiring an I-V curve representing the output characteristics of the voltage and the current of the photovoltaic system.

And step S52, acquiring at least three groups of I-V data from the I-V curve, and arranging each three groups of I-V data according to the voltage values to obtain three groups of sorted I-V data.

And step S53, constructing a straight line taking the two groups of data arranged at the top and the last in each three groups of I-V data after sorting as two end points, and taking the straight line as a detection curve.

And step S54, taking a current value corresponding to the voltage value in the middle data group arranged in each sorted three groups of I-V data in each detection curve as a detection current value.

And step S55, calculating the difference value between the detection current value corresponding to each detection curve and the current value in the middle group of data in each two groups of sorted I-V data.

And step S56, selecting a maximum value from the plurality of difference values as a global maximum difference value.

And step S57, judging whether the global maximum difference is larger than a preset inflection point feature detection threshold.

If yes, go to step S58; if not, go to step S459.

And step S58, determining that the photovoltaic system has a current mismatch fault.

And step S59, determining that the photovoltaic system has no current mismatch fault.

Step S510, acquiring the open-circuit voltage of the photovoltaic system based on the I-V curve, and dividing the voltage range corresponding to the I-V curve into a plurality of first voltage intervals according to the open-circuit voltage.

In this embodiment, according to the open-circuit voltage, a specific implementation manner of dividing the voltage range corresponding to the I-V curve into a plurality of first voltage intervals may be:

dividing the voltage range corresponding to the I-V curve intoA plurality of the first voltage intervals are respectivelyi＝0～n-1。

Step S511, determining the difference value belonging to each of the first voltage intervals from the plurality of difference values, and selecting the maximum value from the difference values belonging to each of the first voltage intervals as a sub-global maximum difference value.

Since the plurality of difference values are the difference values between the detected current value corresponding to each detection curve and the current value in the middle group of data arranged in each of the three groups of sorted I-V data, it can be determined based on which I-V data the plurality of difference values are calculated, after the I-V data are determined, the voltage interval corresponding to the I-V curve can be determined, and the difference value belonging to each first voltage interval can be determined by matching the determined voltage interval with the first voltage interval.

In this embodiment, the sub-global maximum difference value may be represented as Δ I_{Nmax_i}。

Step S512, screening out the voltage intervals with the sub-global maximum difference value larger than the inflection point feature detection threshold from the plurality of first voltage intervals, taking the screened voltage intervals as second voltage intervals, and recording the number of the second voltage intervals.

Step S513, performing ascending arrangement on the voltages corresponding to the sub-global maximum difference in at least one of the second voltage intervals, and using data formed by the voltages and the currents corresponding to the voltages after the ascending arrangement as step inflection points.

In this embodiment, the step inflection point may be represented as (U)_{S_i},I_{S_i}) Wherein i is 1,2, …, k, k is the number of the second voltage intervals.

Step S514, determining a step start point and a step end point according to the number of the second voltage intervals and the step inflection point, and using an interval between the step start point and the step end point as a step interval.

In this embodiment, the determining a step start point and a step end point according to the number of the second voltage intervals and the step inflection point, and using an interval between the step start point and the step end point as a step interval process may include:

s5141, judging whether k is equal to 1.

If yes, go to step S5142; if not, step S5144 is executed.

Step S5142, using the voltage value of the step inflection point in the second voltage interval as the step starting point, and determining that the voltage value belongs to the step inflection pointFinding the coordinate corresponding to the minimum value in the I-V curve, taking the voltage value in the found coordinate as the step end point, and expressing the step end point as U_E。

In this embodiment, if k is equal to 1, it indicates that there is only one step in the I-V curve of the photovoltaic system, and the inflection point of the step is Δ I in the I-V curve of the photovoltaic system_{Nmax_i}Corresponding to the point, but in this case there are two upper peaks on the I-V curve of the photovoltaic system, i.e. the difference has two negative peaks, while the step ends correspond to the point at Δ I_{Nmax_i}The latter negative peak point, therefore, the step end point will only be atThus, is determined to belong toFinding the coordinate corresponding to the minimum value in the I-V curve, taking the voltage value in the found coordinate as the step end point, and expressing the step end point as U_E。

Step S5143 represents a voltage interval including the step start point and the step end point as a voltage interval in which a current mismatch exists, as [ U_{S_1},U_E]。

Step S5144, the voltage value of the step inflection point in each of the second voltage intervals is used as the step starting pointRespectively determine to belong toArranging the voltages corresponding to the minimum values in the I-V curve according to an ascending order, taking the voltages after ascending order as step end points, and expressing the step end points as U_{E_i}The set of inflection points includes a step inflection point in a second voltage interval other than a smallest second voltage interval among the plurality of second voltage intervals.

The minimum second voltage interval can be understood as: and obtaining an arrangement result after the plurality of second voltage intervals are arranged in an ascending order, wherein the arrangement result is arranged in the first second voltage interval.

If k is greater than 1, it indicates that there are multiple steps on the I-V curve of the photovoltaic system, as shown in FIGS. 9 and 10, there are k steps (k depressed points, i.e., positive peaks of k differences), i.e., there are k Δ I_{Nmax_i}Corresponding to the inflection point of the step on the I-V curve. Correspondingly, k +1 upper salient points are arranged on the I-V curve (the upper salient points are one more than the lower salient points, namely the negative peak values of k +1 difference values), so that the negative peak values of the second difference value to the last difference value respectively correspond to the end points of the k step intervals from small to large voltage values. On the basis, the voltage value of the step inflection point in each second voltage interval is taken as a step starting point to respectively determine the voltage values belonging to the step inflection pointsThe minimum values of the difference values in the voltage interval corresponding to the inflection point of each step in the inflection point set are arranged according to ascending order, and the voltages arranged in ascending order are used as the step end points.

Step S5145, regarding a voltage interval including each step start point and the corresponding step end point as a voltage interval with current mismatch, and representing the voltage interval as [ U_{S_i},U_{E_i}]Where i is 1,2, …, k.

As another alternative embodiment of the present application, referring to fig. 11, there is provided a flowchart of a photovoltaic system fault diagnosis method in embodiment 6 of the present application, where this embodiment mainly relates to a refinement of the photovoltaic system fault diagnosis method described in embodiment 1 above, as shown in fig. 11, the method may include, but is not limited to, the following steps:

and step S61, acquiring an I-V curve representing the output characteristics of the voltage and the current of the photovoltaic system.

And step S62, acquiring at least three groups of I-V data from the I-V curve, and arranging each three groups of I-V data according to the voltage values to obtain three groups of sorted I-V data.

And step S63, constructing a straight line taking the two groups of data arranged at the top and the last in each three groups of I-V data after sorting as two end points, and taking the straight line as a detection curve.

The detailed procedures of steps S61-S63 can be found in the related descriptions of steps S11-S13 in embodiment 1, and are not repeated herein.

And step S64, determining the relative position relationship between each detection curve and the I-V sub-curve to be detected, wherein the I-V sub-curve to be detected is a part of the I-V curve, which comprises the two groups of data arranged at the top and the bottom of each three groups of I-V data after sequencing.

In this embodiment, each detection curve and the I-V curve of the photovoltaic system may be plotted in the same coordinate system, and further, the relative position relationship between each detection curve and the I-V sub-curve to be detected is determined.

And step S65, judging whether the relative position relationship between each detection curve and the I-V sub-curve to be detected is related to the relative position relationship representing the existence of the current mismatch fault of the photovoltaic system.

Steps S64-S65 are a specific implementation of step S14 in example 1.

And if the relative position relationship between each detection curve and the I-V sub-curve to be detected is related to the relative position relationship representing that the photovoltaic system has the current mismatch fault, determining that the photovoltaic system has the current mismatch fault. As shown in fig. 12, the detection curve is above the I-V sub-curve to be detected, indicating that the photovoltaic system has a current mismatch fault.

The photovoltaic system fault diagnosis device provided by the present application is described next, and the photovoltaic system fault diagnosis device described below and the photovoltaic system fault diagnosis method described above may be referred to correspondingly.

Referring to fig. 13, the photovoltaic system fault diagnosis apparatus includes: an acquisition module 100, a ranking module 200, a construction module 300, and a determination module 400.

The acquisition module 100 is configured to acquire an I-V curve representing output characteristics of voltage and current of the photovoltaic system.

And the sorting module 200 is used for acquiring at least three groups of I-V data from the I-V curve, and sorting each three groups of I-V data according to the voltage values to obtain three groups of sorted I-V data.

And a constructing module 300, configured to construct a straight line with two end points of the two groups of data arranged at the top and the last in each of the three groups of sorted I-V data, as a detection curve.

The judging module 400 is configured to judge whether the photovoltaic system has a current mismatch fault by comparing each of the detection curves with an I-V sub-curve to be detected, where the I-V sub-curve to be detected is a portion of the I-V curve that includes two sets of data arranged at the top and the bottom of each of the three sets of sorted I-V data.

In this embodiment, the photovoltaic system fault diagnosis device may further include:

and the step interval determining module is used for determining a step interval in the I-V curve if the photovoltaic system has a current mismatch fault.

In this embodiment, the photovoltaic system fault diagnosis apparatus may further include:

and the denoising module is used for carrying out smooth denoising treatment on each three groups of I-V data after sequencing to obtain I-V data after smooth denoising.

In this embodiment, the denoising module may be specifically configured to:

if I_i≥I_i-1And I_i≥I_i+1Or, I_i≤I_i-1And I_i≤I_i+1Inputting the current value of the middle data in each three groups of I-V data into the first relational expressionObtaining a current value after smooth denoising, and taking a voltage value in a group of data arranged in the middle of each three groups of I-V data after sequencing and the current value after smooth denoising as I-V data after smooth denoising;

wherein, I_iAnd U_iFor the current and voltage values of the middle data set in each of the three sorted I-V data sets, I_i-1、I_i+1、U_i-1、U_i+1And arranging the current values and the voltage values of the two groups of data at the top and the last in each three groups of I-V data after sorting.

In this embodiment, the determining module 400 may be specifically configured to:

taking a current value corresponding to a voltage value in a group of data arranged in the middle of each group of I-V data in each detection curve after sequencing as a detection current value;

calculating the difference value between the detection current value corresponding to each detection curve and the current value in the group of data arranged in the middle in each three groups of I-V data after sorting;

and judging whether the photovoltaic system has a current mismatch fault or not by comparing the difference value with a preset inflection point characteristic detection threshold value.

In this embodiment, the determining module 400 may be specifically configured to:

determining an expression of each of the detection curves asI_N-1And U_N-1One of the first and last two groups of data, I, belonging to each of the three groups of I-V data after sorting_N+1And U_N+1The other data in the first and the last two groups of data in each three groups of I-V data after the sorting；

And inputting the voltage values in the group of data arranged in the middle in each three groups of I-V data after sequencing into the expression of the detection curve to obtain the detection current value.

In this embodiment, the determining module 400 may be specifically configured to:

selecting a maximum value from the plurality of difference values as a global maximum difference value;

and judging whether the global maximum difference value is larger than a preset inflection point feature detection threshold value.

In this embodiment, the step interval determining module may be specifically configured to:

acquiring the open-circuit voltage of the photovoltaic system based on the I-V curve, and dividing the voltage range corresponding to the I-V curve into a plurality of first voltage intervals, wherein the first voltage intervals representi＝0～n-1；

Determining a difference value belonging to each first voltage interval from the plurality of difference values, and selecting a maximum value from the difference values belonging to each first voltage interval as a sub-global maximum difference value;

screening out voltage intervals with the sub-global maximum difference value larger than the inflection point feature detection threshold from the plurality of first voltage intervals, taking the screened voltage intervals as second voltage intervals, and recording the number of the second voltage intervals;

performing ascending arrangement on the voltage corresponding to the sub-global maximum difference value in at least one second voltage interval, taking data consisting of the voltages and the currents corresponding to the voltages after the ascending arrangement as a step inflection point, and expressing the step inflection point as (U)_{S_i},I_{S_i}) Wherein i is 1,2, …, k, k is the number of the second voltage intervals;

if the k is equal to 1, taking the voltage value of the step inflection point in the second voltage interval as a step starting point, and determining that the voltage value belongs to the step inflection pointFinding the coordinate corresponding to the minimum value in the I-V curve, taking the voltage value in the found coordinate as the step end point, and expressing the step end point as U_E；

The voltage interval including the start point and the end point of the step is denoted as a voltage interval in which a current mismatch exists, and is denoted as [ U_{S_1},U_E]；

If the k is larger than 1, the voltage value of the step inflection point in each second voltage interval is taken as a step starting point to respectively determine the step inflection point belongs toArranging the voltages corresponding to the minimum values in the I-V curve according to an ascending order, taking the voltages after ascending order as step end points, and expressing the step end points as U_{E_i}；

The voltage interval including the start point of each step and the end point of the corresponding step is taken as the voltage interval with current mismatch and is expressed as [ U ]_{S_i},U_{E_i}]Where i is 1,2, …, k.

In this embodiment, the determining module 400 may be specifically configured to:

determining the relative position relationship between each detection curve and the I-V sub-curve to be detected;

and judging whether the relative position relationship between each detection area and the I-V sub-curve to be detected is related to the relative position relationship representing the existence of the current mismatch fault of the photovoltaic system.

It should be noted that each embodiment is mainly described as a difference from the other embodiments, and the same and similar parts between the embodiments may be referred to each other. For the device-like embodiment, since it is basically similar to the method embodiment, the description is simple, and for the relevant points, reference may be made to the partial description of the method embodiment.

Finally, it should also be noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.

For convenience of description, the above devices are described as being divided into various units by function, and are described separately. Of course, the functionality of the units may be implemented in one or more software and/or hardware when implementing the present application.

From the above description of the embodiments, it is clear to those skilled in the art that the present application can be implemented by software plus necessary general hardware platform. Based on such understanding, the technical solutions of the present application may be essentially or partially implemented in the form of a software product, which may be stored in a storage medium, such as a ROM/RAM, a magnetic disk, an optical disk, etc., and includes several instructions for enabling a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the method according to the embodiments or some parts of the embodiments of the present application.

The method and the device for diagnosing the fault of the photovoltaic system provided by the application are described in detail above, a specific example is applied in the description to explain the principle and the implementation manner of the application, and the description of the above embodiment is only used for helping to understand the method and the core idea of the application; meanwhile, for a person skilled in the art, according to the idea of the present application, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present application.