Method and device for determining exposure power parameter of X-ray high-voltage generator
阅读说明：本技术 一种x射线高压发生器曝光功率参数确定方法及装置 (Method and device for determining exposure power parameter of X-ray high-voltage generator ) 是由 王万全 王德印 何杰 陈飞 于 2020-12-31 设计创作，主要内容包括：本发明提供一种X射线高压发生器曝光功率参数确定方法及装置,高压发生器内部功率器件的功率参数小于高压发生器实际所需功率器件功率参数,方法包括：接收X射线高压发生器使用需求对应的曝光功率参数,曝光功率参数包括曝光时间和曝光电流；判断曝光功率参数是否满足预设限制,预设限制根据高压发生器内部的功率器件的预设短时过载参数确定；当曝光功率参数不满足预设限制,则重复接收X射线高压发生器使用需求对应的曝光功率参数到判断曝光功率参数是否满足预设限制,直至曝光功率参数满足预设限制参数,得到目标曝光功率参数。通过实施本发明,降低了高压发生器内功率器件的性能要求,使器件选型更加容易,降低了X射线高压发生器的故障率。(The invention provides a method and a device for determining exposure power parameters of an X-ray high-voltage generator, wherein the power parameters of internal power devices of the high-voltage generator are smaller than the power parameters of the power devices actually required by the high-voltage generator, and the method comprises the following steps: receiving exposure power parameters corresponding to the use requirements of the X-ray high-voltage generator, wherein the exposure power parameters comprise exposure time and exposure current; judging whether the exposure power parameter meets a preset limit, wherein the preset limit is determined according to a preset short-time overload parameter of a power device in the high-voltage generator; and when the exposure power parameter does not meet the preset limit, repeatedly receiving the exposure power parameter corresponding to the use requirement of the X-ray high-voltage generator until judging whether the exposure power parameter meets the preset limit or not until the exposure power parameter meets the preset limit parameter, and obtaining the target exposure power parameter. By implementing the invention, the performance requirement of the power device in the high-voltage generator is reduced, the device type selection is easier, and the failure rate of the X-ray high-voltage generator is reduced.)
1. A method for determining exposure power parameters of an X-ray high-voltage generator is characterized in that the power parameters of internal power devices of the high-voltage generator are smaller than the power parameters of actually required power devices of the high-voltage generator, and the method comprises the following steps:
receiving exposure power parameters corresponding to the use requirements of an X-ray high-voltage generator, wherein the exposure power parameters comprise exposure time and exposure current;
judging whether the exposure power parameter meets a preset limit, wherein the preset limit is determined according to a preset short-time overload parameter of a power device in the high-voltage generator;
and when the exposure power parameter does not meet the preset limit, repeating the steps from receiving the exposure power parameter corresponding to the use requirement of the X-ray high-voltage generator to judging whether the exposure power parameter meets the preset limit or not until the exposure power parameter meets the preset limit parameter, and obtaining a target exposure power parameter.
2. The method of claim 1, wherein the preset limit is:
y1≥aI1 2t2；
wherein, y1To limit the parameters, a is a parameter, I1Is the magnitude of the current in the exposure power parameter, t2Is the exposure time.
3. The method of claim 1, further comprising:
judging whether the current response exposure starting time and the last exposure time interval meet the preset limit duration or not;
when the interval between the current response exposure starting time and the last exposure time meets the preset limit duration, carrying out exposure;
and when the current response exposure starting time and the last exposure time interval do not meet the preset limit duration, waiting until the previous exposure time interval meets the preset limit duration.
4. The method of claim 3, wherein determining the preset limit duration comprises:
judging whether the last exposure time length exceeds a first preset time length or not;
when the last exposure time length exceeds the first preset time length, taking the second preset time length as a preset limit time length;
and when the last exposure time length does not exceed the first preset time length, taking the third preset time length as the preset limit time length.
5. The method of claim 3, wherein the preset limit duration is:
wherein, t1For presetting the limiting time length, U is the voltage at the last exposure, I is the current at the last exposure, t is the time length at the last exposure, P1Is a power limiting parameter.
6. An apparatus for determining exposure power parameters of an X-ray high voltage generator, wherein the power parameters of internal power devices of the high voltage generator are smaller than the power parameters of actually required power devices of the high voltage generator, the apparatus comprising:
the parameter receiving module is used for receiving exposure power parameters corresponding to the use requirements of the X-ray high-voltage generator, and the exposure power parameters comprise exposure time and exposure current;
the first judgment module is used for judging whether the exposure power parameter meets a preset limit, and the preset limit is determined according to a preset short-time overload parameter of a power device in the high-voltage generator;
and the target exposure power parameter determining module is used for repeating the steps from receiving the exposure power parameter corresponding to the use requirement of the X-ray high-voltage generator to judging whether the exposure power parameter meets the preset limit or not when the exposure power parameter does not meet the preset limit, until the exposure power parameter meets the preset limit parameter, and obtaining the target exposure power parameter.
7. The apparatus of claim 6, further comprising:
the second judgment module is used for judging whether the current response exposure starting time and the last exposure time interval meet the preset limit duration or not;
the exposure module is used for carrying out exposure when the interval between the current response exposure starting time and the last exposure time meets the preset limit duration;
and the first waiting module is used for waiting until the interval between the current response exposure starting time and the last exposure time does not meet the preset limit duration.
8. The apparatus of claim 7, wherein the second determining module comprises:
the third judgment module is used for judging whether the last exposure time length exceeds a first preset time length;
the first preset limit duration determining module is used for taking the second preset duration as the preset limit duration when the last exposure duration exceeds the first preset duration;
and the second preset limit duration determining module is used for taking the third preset duration as the preset limit duration when the last exposure duration does not exceed the first preset duration.
9. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the processor implements the steps of the method for determining an exposure power parameter of an X-ray high voltage generator according to any one of claims 1 to 5 when executing the program.
10. A storage medium having stored thereon computer instructions, which when executed by a processor, carry out the steps of the method for X-ray high voltage generator exposure power parameter determination according to any one of claims 1 to 5.
Technical Field
The invention relates to the technical field of high-voltage generators, in particular to a method and a device for determining exposure power parameters of an X-ray high-voltage generator.
Background
The digital X-ray photography system consists of flat panel detector, X-ray tube, high X-ray voltage generator, frame, image processing software, etc. The X-ray high voltage generator is used as a core component in a digital X-ray photography system, and the stability, the failure rate and the cost of equipment also become the factors for the model selection of a whole machine manufacturer.
Various performance indexes of the high-voltage generator are greatly related to internal power devices, and the performance of the power devices determines the highest index of the generator. At present, in order to meet the special index requirements of the high-voltage generator in the actual use process, a high-performance power device needs to be selected, so that the device type selection of the high-voltage generator is difficult, the cost of the whole machine is obviously increased, and the power device can be damaged according to the use requirements of different users.
Disclosure of Invention
In view of this, embodiments of the present invention provide a method and an apparatus for determining an exposure power parameter of an X-ray high voltage generator, so as to solve the defects that in the prior art, device model selection is difficult, the cost of the whole device is significantly increased, and power devices may be damaged according to different user requirements.
According to a first aspect, an embodiment of the present invention provides a method for determining an exposure power parameter of an X-ray high voltage generator, where a power parameter of a power device inside the high voltage generator is smaller than a power parameter of a power device actually required by the high voltage generator, and the method includes the following steps: receiving exposure power parameters corresponding to the use requirements of an X-ray high-voltage generator, wherein the exposure power parameters comprise exposure time and exposure current; judging whether the exposure power parameter meets a preset limit, wherein the preset limit is determined according to a preset short-time overload parameter of a power device in the high-voltage generator; and when the exposure power parameter does not meet the preset limit, repeating the steps from receiving the exposure power parameter corresponding to the use requirement of the X-ray high-voltage generator to judging whether the exposure power parameter meets the preset limit or not until the exposure power parameter meets the preset limit parameter, and obtaining a target exposure power parameter.
Optionally, the preset limit is:
y1≥aI1 2t2；
wherein, y1To limit the parameters, a is a parameter, I1Is the magnitude of the current in the exposure power parameter, t2Is the exposure time.
Optionally, the method further comprises: judging whether the current response exposure starting time and the last exposure time interval meet the preset limit duration or not; when the interval between the current response exposure starting time and the last exposure time meets the preset limit duration, carrying out exposure; and when the current response exposure starting time and the last exposure time interval do not meet the preset limit duration, waiting until the previous exposure time interval meets the preset limit duration.
Optionally, the determining the preset limit duration includes: judging whether the last exposure time length exceeds a first preset time length or not; when the last exposure time length exceeds the first preset time length, taking the second preset time length as a preset limit time length; and when the last exposure time length does not exceed the first preset time length, taking the third preset time length as the preset limit time length.
Optionally, the preset limit duration is:
wherein, t1For presetting the limiting time length, U is the voltage at the last exposure, I is the current at the last exposure, t is the time length at the last exposure, P1Is a power limiting parameter.
According to a second aspect, an embodiment of the present invention provides an apparatus for determining an exposure power parameter of an X-ray high voltage generator, where a power parameter of a power device inside the high voltage generator is smaller than a power parameter of a power device actually required by the high voltage generator, the apparatus including: the parameter receiving module is used for receiving exposure power parameters corresponding to the use requirements of the X-ray high-voltage generator, and the exposure power parameters comprise exposure time and exposure current; the first judgment module is used for judging whether the exposure power parameter meets a preset limit, and the preset limit is determined according to a preset short-time overload parameter of a power device in the high-voltage generator; and the target exposure power parameter determining module is used for repeating the steps from receiving the exposure power parameter corresponding to the use requirement of the X-ray high-voltage generator to judging whether the exposure power parameter meets the preset limit or not when the exposure power parameter does not meet the preset limit, until the exposure power parameter meets the preset limit parameter, and obtaining the target exposure power parameter.
Optionally, the method further comprises: the second judgment module is used for judging whether the current response exposure starting time and the last exposure time interval meet the preset limit duration or not; the exposure module is used for carrying out exposure when the interval between the current response exposure starting time and the last exposure time meets the preset limit duration; and the first waiting module is used for waiting until the interval between the current response exposure starting time and the last exposure time does not meet the preset limit duration.
Optionally, the second determining module includes: the third judgment module is used for judging whether the last exposure time length exceeds a first preset time length; the first preset limit duration determining module is used for taking the second preset duration as the preset limit duration when the last exposure duration exceeds the first preset duration; and the second preset limit duration determining module is used for taking the third preset duration as the preset limit duration when the last exposure duration does not exceed the first preset duration.
According to a third aspect, an embodiment of the present invention provides an electronic device, which includes a memory, a processor, and a computer program stored on the memory and executable on the processor, where the processor implements the steps of the method for determining an exposure power parameter of an X-ray high voltage generator according to the first aspect or any one of the embodiments of the first aspect when executing the program.
According to a third aspect, an embodiment of the present invention provides a storage medium, on which computer instructions are stored, and the instructions, when executed by a processor, implement the steps of the method for determining an exposure power parameter of an X-ray high voltage generator according to the first aspect or any one of the embodiments of the first aspect.
The technical scheme of the invention has the following advantages:
according to the method/device for determining the exposure power parameter of the X-ray high-voltage generator, when the exposure power parameter of the X-ray high-voltage generator is determined, the exposure power parameter is limited, so that the X-ray high-voltage generator can normally work under a short-time overload condition, a low-performance power device can normally complete the work of a high-power device under the short-time overload parameter limitation, the performance requirements of the power device in the high-voltage generator are reduced, the device selection is easier, the cost of the whole machine is reduced, the requirement for possibly damaging the power device is not responded due to the parameter limitation, and the failure rate of the X-ray high-voltage generator is reduced.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.
FIG. 1 is a flowchart illustrating a specific example of a method for determining an exposure power parameter of an X-ray high voltage generator according to an embodiment of the present invention;
FIG. 2 is a schematic block diagram of a specific example of an apparatus for determining an exposure power parameter of an X-ray high voltage generator according to an embodiment of the present invention;
fig. 3 is a schematic block diagram of a specific example of an electronic device in the embodiment of the present invention.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the accompanying drawings, and it should be understood that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; the two elements may be directly connected or indirectly connected through an intermediate medium, or may be communicated with each other inside the two elements, or may be wirelessly connected or wired connected. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
In addition, the technical features involved in the different embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.
The embodiment provides a method for determining an exposure power parameter of an X-ray high voltage generator, where a power parameter of a power device inside the high voltage generator is smaller than a power parameter of a power device actually required by the high voltage generator, as shown in fig. 1, the method includes the following steps:
and S101, receiving exposure power parameters corresponding to the use requirements of the X-ray high-voltage generator, wherein the exposure power parameters comprise exposure time and exposure current.
Illustratively, the exposure power parameters of the X-ray high voltage generator include exposure voltage, exposure current and exposure time, and the manner of receiving the exposure power parameters corresponding to the usage requirements of the X-ray high voltage generator may be to receive parameter information input by a user in a predetermined input frame or to receive information of a specific knob rotated by the user, where the knob information represents a specific parameter value.
And S102, judging whether the exposure power parameter meets a preset limit, wherein the preset limit is determined according to a preset short-time overload parameter of a power device in the high-voltage generator.
Illustratively, the short-time overload parameter characterizes the maximum power parameter that the power device can withstand without damaging the device when the power device is subjected to short-time overload, and the allowable overload time. Heat generation of power device and I2the t limit has a positive relationship, and the preset limit at this time may satisfy the following formula:
y1≥aI1 2t2；
wherein, y1The parameters can be preset according to actual settings, a is a parameter, the specific size is related to the models of the high-voltage diode in the oil tank and the MOSFET of the inverter board, and the parameter can be calculated according to a corresponding specification and verified through actual tests, and generally 1 can be selected; i is1Is the magnitude of the current in the exposure power parameter, t2Exposure time (overload time).
In this embodiment, a diode is taken as an example for explanation, and if the power parameter actually required by the diode needs to satisfy the current output of the maximum 1000mA, theoretically, the diode needs to support the current output of 1000mA, so that the parameter requirement on the diode is very high, and the model selection is difficult. At this time, a diode with a limit value of 500mA can be selected in the high voltage generator, so that the short-time overload current of the diode with the limit value of 500mA reaches 1000mA, and at this time, the limit parameter y is assumed to be1＝100(A2Ms), a is 1, then the exposure time (overload time) t is calculated according to the above formula2A diode with a value of 100ms, i.e. a limit of 500mA, can achieve a current output requirement of up to 1000mA by short-time overload without damaging the diode. It can be understood that the diode with the limit value of 500mA can be realized by the formulaWhen the current output of 800mA is required to be met, the overload time can be finished within 156.25 ms. The power device may also include a field effect transistor MOSFET.
The manner of determining whether the exposure power parameter meets the preset limit may be to substitute the exposure power parameter into the above formula, and determine whether the result meets the equation requirement, for example, if the received exposure current and the exposure time are 1000mA and 110ms respectively, the preset limit is obviously not met.
S103, when the exposure power parameter does not meet the preset limit, the steps from receiving the exposure power parameter corresponding to the use requirement of the X-ray high-voltage generator to judging whether the exposure power parameter meets the preset limit are repeated until the exposure power parameter meets the preset limit parameter, and the target exposure power parameter is obtained. The target exposure power parameter represents a power parameter meeting a preset limiting parameter condition.
According to the method for determining the exposure power parameter of the X-ray high-voltage generator, when the exposure power parameter of the X-ray high-voltage generator is determined, the exposure power parameter is limited, so that the X-ray high-voltage generator can normally work under a short-time overload condition, a low-performance power device can normally complete the work of a high-power device under the short-time overload parameter limitation, the performance requirement of the power device in the high-voltage generator is lowered, the device is easier to select, the cost of the whole machine is lowered, the requirement for possibly damaging the power device is not responded due to the parameter limitation, and the failure rate of the X-ray high-voltage generator is lowered.
As an optional implementation manner of this embodiment, the method further includes:
judging whether the current response exposure starting time and the last exposure time interval meet the preset limit duration or not;
illustratively, when a target exposure power parameter meeting preset limits is obtained, it indicates that an actual exposure link can be entered, at this time, exposure starting can be automatically performed, information of the obtained target exposure power parameter can also be fed back to a user, an exposure hand brake signal pressed by the user according to the self requirement is received, and the exposure hand brake signal is used as an exposure starting signal. Before the actual exposure, it is necessary to determine whether the current response exposure start time and the last exposure time interval satisfy the preset limit duration. The preset limit duration may be a preset fixed duration, such as 20 s; the preset limit duration can also limit the last exposure duration, and is determined according to the corresponding preset time interval of the last exposure duration, for example, when the last exposure duration exceeds 3000ms, the preset limit duration is 300S, and when the last exposure duration does not exceed 3000ms, the preset limit duration is determined according to the voltage, the current and the time of the last exposure; the preset limit duration can also be determined directly according to the voltage, current and time of the last exposure.
The specific manner of determining the preset limit duration according to the voltage, the current and the time of the last exposure may be:
wherein, t1For presetting the limiting time length, U is the voltage at the last exposure, I is the current at the last exposure, t is the time length at the last exposure, P1The specific value of the power limiting parameter is related to the types of the high-voltage diode in the oil tank and the MOSFET of the inverter board, and is also related to the heat capacity of the high-voltage oil tank, and the power limiting parameter can be calculated and actually tested and verified according to the corresponding specification.
For example, for a certain medical X-ray high voltage generator, the voltage at the time of the last exposure is 80kv, the current at the time of the last exposure is 1000mA, the time length at the time of the last exposure is 100ms, and the power limiting parameter is 400(W/S), then the preset limiting time duration is 20S.
Compared with the preset time interval, the preset limit time is determined according to the voltage, the current and the time of the last exposure, so that the preset limit time at each time is more suitable for the use condition of the X-ray high-voltage generator, and the use efficiency of the X-ray high-voltage generator can be ensured under the condition of ensuring safe use.
When the interval between the current response exposure starting time and the last exposure time meets the preset limit duration, carrying out exposure; and when the current response exposure starting time and the last exposure time interval do not meet the preset limit duration, waiting until the previous exposure time interval meets the preset limit duration.
Illustratively, the preset limit duration is 20 seconds for example, when the current response exposure starting time and the last exposure time interval satisfy the preset limit duration, that is, exceed 20 seconds, the exposure can be performed, when the current response exposure starting time and the last exposure time interval do not exceed 20 seconds, the exposure can be automatically started after the time exceeds 20 seconds, the information of completion of the waiting can be fed back to the user, the exposure hand brake signal pressed by the user according to the requirement of the user is received, the exposure hand brake signal is used as the exposure starting signal, and the step of judging whether the current response exposure starting time and the last exposure time interval satisfy the preset limit duration or not is executed again until the current response exposure starting time and the last exposure time interval satisfy the preset limit duration, and the exposure is performed.
The method for determining the exposure power parameter of the X-ray high voltage generator further determines whether the exposure time meets the preset limit duration with the last time before exposure, and performs exposure when the exposure time meets the preset limit duration, so that the X-ray high voltage generator works within the interval time, the X-ray high voltage generator is guaranteed to dissipate heat after exposure every time, the use safety of the X-ray high voltage generator is improved, and the service life of the X-ray high voltage generator is prolonged.
As an optional implementation manner of this embodiment, the determining manner of the preset limit duration includes:
judging whether the last exposure time length exceeds a first preset time length or not; when the last exposure time length exceeds the first preset time length, taking the second preset time length as a preset limit time length; when the last exposure time length does not exceed the first preset time length, taking a third preset time length as a preset limit time length; the second preset duration is greater than the third preset duration.
Illustratively, the first preset duration may be 3000ms, the second preset duration may be 300S, and the third preset duration may be determined according to the voltage, the current and the time of the last exposure, such as the above formula (1). When the last exposure time length exceeds 3000ms, the next exposure needs to be performed with a time interval of 300s from the last exposure time interval. When the last exposure time length does not exceed 3000ms, then the time interval between the last exposure and the exposure time of the next exposure needs to be different by a third preset time length. In this embodiment, the first preset time length, the second preset time length, and the third preset time length are not limited, and the second preset time length is greater than the third preset time length, which can be determined by a person skilled in the art as needed.
The method for determining the exposure power parameter of the X-ray high voltage generator further limits the preset limit duration, divides the last exposure duration, takes the second preset duration as the preset limit duration when the first preset duration is exceeded, takes the third preset duration as the preset limit duration when the second preset duration is not exceeded, and makes the second preset duration greater than the third preset duration, so that the X-ray high voltage generator can perform next exposure at a longer time interval when the last exposure duration is too long, thereby further reducing the failure rate of the X-ray high voltage generator.
An embodiment of the present invention provides an apparatus for determining an exposure power parameter of an X-ray high voltage generator, as shown in fig. 2, where a power parameter of a power device corresponding to the high voltage generator is smaller than a power parameter of a power device actually required, and the apparatus includes:
the parameter receiving module 201 is configured to receive an exposure power parameter corresponding to a use requirement of the X-ray high voltage generator, where the exposure power parameter includes an exposure time and an exposure current; for details, reference is made to the corresponding parts of the above embodiments, and details are not repeated here.
A first judging module 202, configured to judge whether the exposure power parameter meets a preset limit, where the preset limit is determined according to a preset short-time overload parameter of a power device corresponding to the high-voltage generator; for details, reference is made to the corresponding parts of the above embodiments, and details are not repeated here.
A target exposure power parameter determining module 203, configured to repeat, when the exposure power parameter does not meet the preset limit, the step from receiving the exposure power parameter corresponding to the usage requirement of the X-ray high voltage generator to determining whether the exposure power parameter meets the preset limit until the exposure power parameter meets the preset limit parameter, so as to obtain a target exposure power parameter. For details, reference is made to the corresponding parts of the above embodiments, and details are not repeated here.
As an optional implementation manner of this embodiment, the preset limit in the first determining module 202 is:
y1≥aI1 2t2；
wherein, y1To limit the parameters, a is a parameter, I1Is the magnitude of the current in the exposure power parameter, t2Is the exposure time. For details, reference is made to the corresponding parts of the above embodiments, and details are not repeated here.
As an optional implementation manner of this embodiment, the apparatus for determining an exposure power parameter of an X-ray high voltage generator further includes:
the second judgment module is used for judging whether the current response exposure starting time and the last exposure time interval meet the preset limit duration or not; for details, reference is made to the corresponding parts of the above embodiments, and details are not repeated here.
The exposure module is used for carrying out exposure when the interval between the current response exposure starting time and the last exposure time meets the preset limit duration; for details, reference is made to the corresponding parts of the above embodiments, and details are not repeated here.
And the first waiting module is used for waiting until the interval between the current response exposure starting time and the last exposure time does not meet the preset limit duration. For details, reference is made to the corresponding parts of the above embodiments, and details are not repeated here.
As an optional implementation manner of this embodiment, the second determining module includes:
the third judgment module is used for judging whether the last exposure time length exceeds a first preset time length; for details, reference is made to the corresponding parts of the above embodiments, and details are not repeated here.
The first preset limit duration determining module is used for taking the second preset duration as the preset limit duration when the last exposure duration exceeds the first preset duration; for details, reference is made to the corresponding parts of the above embodiments, and details are not repeated here.
And the second preset limit duration determining module is used for taking the third preset duration as the preset limit duration when the last exposure duration does not exceed the first preset duration. For details, reference is made to the corresponding parts of the above embodiments, and details are not repeated here.
As an optional implementation manner of this embodiment, the preset limit duration in the exposure module is:
wherein, t1For presetting the limiting time length, U is the voltage at the last exposure, I is the current at the last exposure, t is the time length at the last exposure, P1Is a power limiting parameter. For details, reference is made to the corresponding parts of the above embodiments, and details are not repeated here.
The embodiment of the present application also provides an electronic device, as shown in fig. 3, including a processor 310 and a memory 320, where the processor 310 and the memory 320 may be connected by a bus or in other manners.
Processor 310 may be a Central Processing Unit (CPU). The Processor 310 may also be other general purpose processors, Digital Signal Processors (DSPs), Application Specific Integrated Circuits (ASICs), Field Programmable Gate Arrays (FPGAs) or other Programmable logic devices, discrete Gate or transistor logic devices, discrete hardware components, or any combination thereof.
The memory 320 is a non-transitory computer readable storage medium, and can be used to store non-transitory software programs, non-transitory computer executable programs, and modules, such as program instructions/modules corresponding to the method for determining the exposure power parameter of the X-ray high voltage generator in the embodiment of the present invention. The processor executes various functional applications and data processing of the processor by executing non-transitory software programs, instructions, and modules stored in the memory.
The memory 320 may include a storage program area and a storage data area, wherein the storage program area may store an operating system, an application program required for at least one function; the storage data area may store data created by the processor, and the like. Further, the memory may include high speed random access memory, and may also include non-transitory memory, such as at least one disk storage device, flash memory device, or other non-transitory solid state storage device. In some embodiments, memory 320 may optionally include memory located remotely from the processor, which may be connected to the processor via a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.
The one or more modules are stored in the memory 320 and, when executed by the processor 310, perform the X-ray high voltage generator exposure power parameter determination method as in the embodiment shown in fig. 1.
The details of the electronic device may be understood with reference to the corresponding related description and effects in the embodiment shown in fig. 1, and are not described herein again.
The present embodiment also provides a computer storage medium, where the computer storage medium stores computer executable instructions, where the computer executable instructions can execute the method for determining the exposure power parameter of the X-ray high voltage generator in any of the method embodiments 1. The storage medium may be a magnetic Disk, an optical Disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a Flash Memory (Flash Memory), a Hard Disk (Hard Disk Drive, abbreviated as HDD), a Solid State Drive (SSD), or the like; the storage medium may also comprise a combination of memories of the kind described above.
It should be understood that the above examples are only for clarity of illustration and are not intended to limit the embodiments. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. And obvious variations or modifications therefrom are within the scope of the invention.