阅读说明：本技术 一种磁通门磁路传感器 (Fluxgate magnetic circuit sensor ) 是由 刘玉正 唐新颖 于 2020-12-21 设计创作，主要内容包括：一种磁通门磁路传感器,所述功能端子设置在所述电路板上,并且与所述第二反馈线圈骨架连接,所述磁晶片设置在所述探头骨架上,所述驱动电流线圈缠绕在所述探头骨架上,所述探头骨架设置在所述第二反馈线圈骨架内部,所述第一磁芯与所述第二磁芯相互配合并且设置在所述第二反馈线圈骨架两侧,所述第三磁芯设置在所述第一磁芯下侧,所述第二反馈线圈缠绕在所述第二反馈线圈骨架上,所述第一反馈线圈缠绕在所述第一反馈线圈骨架上并且连接在所述第二反馈线圈骨架的上侧；所述原边过流母线架设在所述第二反馈线圈骨架上,提升产品测量精度,磁通门原理电流传感器精度误差在0.5％以内,工作温度-40～85度,全温区范围内精度误差500ppm,响应时间可以达到nS级别。(A fluxgate magnetic circuit sensor, the functional terminal being disposed on the circuit board and connected to the second feedback coil bobbin, the magneto-resistive chip being disposed on the probe bobbin, the driving current coil being wound on the probe bobbin, the probe bobbin being disposed inside the second feedback coil bobbin, the first magnetic core being fitted with the second magnetic core and disposed on both sides of the second feedback coil bobbin, the third magnetic core being disposed under the first magnetic core, the second feedback coil being wound on the second feedback coil bobbin, the first feedback coil being wound on the first feedback coil bobbin and connected to an upper side of the second feedback coil bobbin; the primary side overcurrent bus is erected on the second feedback coil framework, the product measurement precision is improved, the precision error of the current sensor based on the fluxgate principle is within 0.5%, the working temperature is minus 40-85 ℃, the precision error in the full temperature range is 500ppm, and the response time can reach the nS level.)

1. A fluxgate magnetic circuit sensor characterized in that: the probe comprises a functional terminal (1), a circuit board (2), a probe coil pin (3), a magnetic wafer (4), a driving current coil (5), a probe framework (6), a first magnetic core (7), a first feedback coil pin (8), a first feedback coil (9), a first feedback coil framework (10), a second magnetic core (11), a third magnetic core (12), a second feedback coil pin (13), a second feedback coil (14), a primary overcurrent bus (15) and a second feedback coil framework (16);

the functional terminal (1) is arranged on the circuit board (2) and is connected with the second feedback coil framework (16), the magnetic wafer (4) is arranged on the probe framework (6), the driving current coil (5) is wound on the probe framework (6), the probe framework (6) is arranged inside the second feedback coil framework (16), the first magnetic core (7) and the second magnetic core (11) are mutually matched and arranged at two sides of the second feedback coil framework (16), the third magnetic core (12) is arranged at the lower side of the first magnetic core (7), the second feedback coil (14) is wound on the second feedback coil framework (16), the first feedback coil (9) is wound on the first feedback coil bobbin (10) and connected to the upper side of the second feedback coil bobbin (16);

and the primary side overcurrent bus (15) is erected on the second feedback coil framework (16).

2. A fluxgate magnetic circuit sensor according to claim 1, characterized in that: the first magnetic core (7) and the second magnetic core (11) are U-shaped, a clamping portion is convexly arranged on one side of the first magnetic core (7), and a clamping cavity matched with the clamping portion is formed in the second magnetic core (11).

3. A fluxgate magnetic circuit sensor according to claim 2, characterized in that: second feedback coil skeleton (16) one end is equipped with first spout (161), first feedback coil skeleton (10) one end is equipped with and can slide in first installation department (101) of first spout (161), first installation department (101) one side is equipped with first step (102), first spout (161) one side be equipped with first step (102) location portion (162) of location complex.

4. A fluxgate magnetic circuit sensor according to claim 3, characterized in that: the second feedback coil skeleton (16) other end is equipped with second spout (163), first feedback coil skeleton (10) other end be equipped with second spout (163) complex second installation department (103), second installation department (103) inboard is equipped with second step (104).

5. A fluxgate magnetic circuit sensor according to claim 4, characterized in that: and the upper end of the probe framework (6) is provided with an accommodating cavity (61) for placing the magnetic wafer (4).

6. A fluxgate magnetic circuit sensor according to claim 5, characterized in that: the other end of the first magnetic core (7) and the other end of the second magnetic core (11) penetrate through the inner side of the first feedback coil framework (10) to be connected.

Technical Field

The invention relates to the field of leakage current sensors, in particular to a fluxgate magnetic circuit sensor.

Background

In the field of current measurement, the measurement modes include a current divider, a mutual inductor and a Hall current sensor, and the Rogowski coil is used for current detection in some special application occasions. The shunt can only be connected in series in the measuring circuit, the shunt can be heated after the current duration is long, the precision error is correspondingly increased, and the rear end needs to be provided with an isolation processing circuit for signal extraction, so that the application cost is increased; the mutual inductor can be used for isolated measurement, but only can measure alternating current signals, and cannot measure direct current signals; the Hall current sensor can achieve isolation measurement and measure alternating current and direct current signals, a core device of the Hall current sensor is a Hall element, the Hall element is a semiconductor device essentially, the problem of electrical performance drift of the Hall element is solved, temperature deviation is large in a full temperature range, although rear-end compensation is performed, product precision errors can be controlled to be only about 2% under the influence of temperature, and response time is within 3 uS.

Disclosure of Invention

In order to solve the above problems, the present technical solution provides a fluxgate magnetic circuit sensor.

In order to achieve the purpose, the technical scheme is as follows:

a magnetic circuit sensor of a fluxgate comprises a functional terminal, a circuit board, a probe coil pin, a magnetic wafer, a driving current coil, a probe framework, a first magnetic core, a first feedback coil pin, a first feedback coil framework, a second magnetic core, a third magnetic core, a second feedback coil pin, a second feedback coil, a primary overcurrent bus and a second feedback coil framework;

the functional terminal is arranged on the circuit board and connected with the second feedback coil framework, the magnetic wafer is arranged on the probe framework, the driving current coil is wound on the probe framework, the probe framework is arranged in the second feedback coil framework, the first magnetic core and the second magnetic core are matched with each other and arranged on two sides of the second feedback coil framework, the third magnetic core is arranged on the lower side of the first magnetic core, the second feedback coil is wound on the second feedback coil framework, and the first feedback coil is wound on the first feedback coil framework and connected to the upper side of the second feedback coil framework;

the primary side overcurrent bus is erected on the second feedback coil framework.

In some embodiments, the first magnetic core and the second magnetic core are U-shaped, a clamping portion is convexly disposed on one side of the first magnetic core, and the second magnetic core is provided with a clamping cavity which is matched with the clamping portion.

In some embodiments, one end of the second feedback coil skeleton is provided with a first sliding groove, one end of the first feedback coil skeleton is provided with a first installation portion capable of sliding into the first sliding groove, one side of the first installation portion is provided with a first step, and one side of the first sliding groove is provided with a positioning portion matched with the first step in a positioning manner.

In some embodiments, the other end of the second feedback coil skeleton is provided with a second sliding groove, the other end of the first feedback coil skeleton is provided with a second installation part matched with the second sliding groove, and a second step is arranged on the inner side of the second installation part.

In some embodiments, the upper end of the probe framework is provided with a containing cavity for placing the magnetic wafer.

In some embodiments, the other end of the first magnetic core and the other end of the second magnetic core are connected through an inner side of the first feedback bobbin.

The beneficial effect of this application does: the measurement precision of the product is improved, the precision error of the current sensor based on the fluxgate principle is within 0.5%, the working temperature is minus 40-85 ℃, the precision error within the full temperature range is 500ppm, and the response time can reach the nS level.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings used in the description of the embodiments will be briefly introduced below.

FIG. 1 is a first schematic diagram of the overall structure of an embodiment of the present invention;

FIG. 2 is a second partial schematic structural diagram of an embodiment of the present invention;

FIG. 3 is a third schematic diagram of a portion of the structure of an embodiment of the present invention;

FIG. 4 is an exploded view of a magnetic wafer and probe skeleton according to an embodiment of the present invention;

fig. 5 is an overall exploded view of the embodiment of the present invention.

Detailed Description

In order to make the technical problems, technical solutions and advantageous effects solved by the present invention more clearly apparent, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

Referring to fig. 1-5, a fluxgate magnetic circuit sensor includes a functional terminal 1, a circuit board 2, a probe coil pin 3, a magnetic wafer 4, a driving current coil 5, a probe frame 6, a first magnetic core 7, a first feedback coil pin 8, a first feedback coil 9, a first feedback coil frame 10, a second magnetic core 11, a third magnetic core 12, a second feedback coil pin 13, a second feedback coil 14, a primary overcurrent bus 15, and a second feedback coil frame 16;

the functional terminal 1 is disposed on the circuit board 2 and connected to the second feedback coil bobbin 16, the magnetic wafer 4 is disposed on the probe bobbin 6, the driving current coil 5 is wound on the probe bobbin 6, the probe bobbin 6 is disposed inside the second feedback coil bobbin 16, the first magnetic core 7 and the second magnetic core 11 are fitted to each other and disposed on both sides of the second feedback coil bobbin 16, the third magnetic core 12 is disposed on a lower side of the first magnetic core 7, the second feedback coil 14 is wound on the second feedback coil bobbin 16, and the first feedback coil 9 is wound on the first feedback coil bobbin 10 and connected to an upper side of the second feedback coil bobbin 16;

the primary overcurrent bus 15 is bridged on the second feedback coil bobbin 16.

The fluxgate mode is a relatively novel current measurement principle, the fluxgate principle has no two modes, one mode is an average current method, the other mode is a duty ratio method, and no matter which mode is adopted, a sensitive fluxgate probe and a whole magnetic field loop are needed to realize the fluxgate mode;

placing a high-permeability wafer (magnetic wafer) on a probe framework, uniformly winding a probe coil on the probe framework, inserting the probe framework wound with a driving coil into a U-shaped air gap groove of a closed-loop magnetic core formed by oppositely inserting and combining a first magnetic core and a second magnetic core, respectively placing a first feedback coil framework wound with a first feedback coil and a second feedback coil framework wound with a second feedback coil on two opposite arms of the closed-loop magnetic core, inserting a third magnetic core with a surface circular boss into the inner wall of the first feedback coil framework, and tightly combining the first magnetic core and the second magnetic core through a tight fit structure of the third magnetic core to form a reliable complete closed-loop magnetic circuit; the two ends of the probe coil are connected to a rear-end processing circuit board, the processing circuit provides a driving current to drive the probe coil, the wafer with high magnetic conductivity is in a continuous saturation state under the action of the driving current, when a measured current passes through a primary side bus, the saturation state of the wafer is broken due to a magnetic field generated by the measured current, the driving current makes corresponding changes to maintain the saturation state of the wafer, the rear-end processing circuit acquires the variation of the driving current, the variation can be processed by an average current method or a duty ratio method, the processed signal is fed back by a feedback coil, the feedback signal is in linear relation with the magnitude and direction of the primary side current, the variation of the magnitude and direction of the primary side current can be measured in real time through the feedback signal, and the signal is output to a system end through a functional terminal of a PCB (printed circuit board), the system performs system management and control according to the signal.

In this embodiment, the first magnetic core 7 and the second magnetic core 11 are U-shaped, a clamping portion is convexly disposed on one side of the first magnetic core 7, and the second magnetic core 11 is disposed with a clamping cavity matched with the clamping portion, so that the magnetic core is fast assembled and can be tightly attached to the clamping portion.

In this embodiment, second feedback coil skeleton 16 one end is equipped with first spout 161, first feedback coil skeleton 10 one end is equipped with and can slide in first installation department 101 of first spout 161, first installation department 101 one side is equipped with first step 102, first spout 161 one side be equipped with first step 102 location complex location portion 162, but the quick assembly skeleton of the installation of sliding in, stable in structure is reliable.

In this embodiment, the other end of the second feedback coil bobbin 16 is provided with a second sliding groove 163, the other end of the first feedback coil bobbin 10 is provided with a second installation portion 103 matched with the second sliding groove 163, and a second step 104 is arranged on the inner side of the second installation portion 103, so that the coil safety space is ensured through positioning and installation.

In this embodiment, the upper end of the probe framework 6 is provided with an accommodating cavity 61 for placing the magnetic wafer 4, and the magnetic wafer is installed in a matching manner.

In this embodiment, the other end of the first magnetic core 7 and the other end of the second magnetic core 11 are connected through the inside of the first feedback bobbin 10.

The above description is only for the purpose of illustrating the preferred embodiments of the present application and is not intended to limit the scope of the present application, which is within the scope of the present application, except that the same or similar principles and basic structures as the present application may be used.