阅读说明：本技术 一种用于测试冲击电流传感器下垂率的装置及方法 (Device and method for testing sag rate of impact current sensor ) 是由 李文婷 龙兆芝 徐雁 刘少波 范佳威 胡康敏 雷民 周峰 余也凤 李明 于 2020-11-16 设计创作，主要内容包括：本发明公开了一种用于测试冲击电流传感器下垂率的装置及方法,属于传感器测试技术领域。本发明装置包括：可编程功率源,将脉冲电流信号传输至被测冲击电流传感器和标准冲击电流传感器；标准冲击电流传感器,与接入脉冲电流信号的被测冲击电流传感器生成闭合电流回路；示波器,根据测量值获取被测电流传感器的下垂率。本发明解决了目前冲击大电流传感器在低频指标测量方面的缺失的问题,且不需大功率且宽频率范围可调的正弦波电流源,利用可编程脉冲功率源及常规设备,就可实现冲击大电流传感器的低频性能指标的测量。(The invention discloses a device and a method for testing the droop rate of an impulse current sensor, and belongs to the technical field of sensor testing. The device of the invention comprises: the programmable power source transmits a pulse current signal to the measured impact current sensor and the standard impact current sensor; the standard impulse current sensor and the measured impulse current sensor connected with the impulse current signal generate a closed current loop; and the oscilloscope acquires the droop rate of the measured current sensor according to the measured value. The invention solves the problem of the deficiency of the prior impact heavy current sensor in the aspect of measuring the low-frequency index, does not need a sine wave current source with high power and adjustable wide frequency range, and can realize the measurement of the low-frequency performance index of the impact heavy current sensor by utilizing a programmable pulse power source and conventional equipment.)

1. An apparatus for testing sag rate of a inrush current sensor, the apparatus comprising:

the programmable power source outputs a pulse current signal and transmits the pulse current signal to the measured impact current sensor and the standard impact current sensor;

the standard impulse current sensor is connected with the impulse current signal and generates a closed current loop together with the measured impulse current sensor connected with the impulse current signal;

the output voltage signals of the standard impact current sensor and the measured current sensor are transmitted to an oscilloscope;

the oscilloscope is connected with the voltage signal, measures the voltage signal, acquires a voltage signal value, outputs a measured value according to the measured voltage signal value, and acquires the droop rate of the measured current sensor according to the measured value.

2. The apparatus of claim 1, wherein the pulsed current signal is a pulsed current signal with adjustable amplitude and width.

3. The apparatus of claim 1, the measurement, comprising: the current amplitude and the pulse duration output by the standard impact current sensor, and the current amplitude, the pulse duration and the current descending amplitude output by the measured impact current sensor.

4. The apparatus of claim 1, wherein the droop rate determines the lower frequency based on a relationship between the droop rate and the lower frequency.

5. The apparatus of claim 2, the amplitude being adjusted in dependence on the sensitivity of the measured current impacting the sensor.

6. The apparatus of claim 2, the width being adjusted in accordance with a lower frequency range of the measured current impacting the sensor.

7. A method for testing a sag rate of a inrush current sensor, the method comprising:

outputting a pulse current signal, and transmitting the pulse current signal to a measured impact current sensor and a standard impact current sensor;

after the standard impulse current sensor and the measured current sensor are connected with pulse signals, voltage signals are output;

and measuring a voltage signal, acquiring a voltage signal value, outputting a measured value according to the measured voltage signal value, and acquiring the droop rate of the measured current sensor according to the measured value.

8. The method of claim 1, wherein the pulsed current signal is a pulsed current signal with adjustable amplitude and width.

9. The apparatus of claim 1, the measurement, comprising: the current amplitude and the pulse duration output by the standard impact current sensor, and the current amplitude, the pulse duration and the current descending amplitude output by the measured impact current sensor.

10. The method of claim 1, wherein the droop rate determines the lower frequency limit based on a relationship between the droop rate and the lower frequency limit.

11. The method of claim 8, wherein the amplitude is adjusted according to the sensitivity of the measured current impacting the sensor.

12. The method of claim 8, wherein the width is adjusted according to a lower frequency range of the measured current impacting the sensor.

Technical Field

The invention relates to the technical field of sensor testing, in particular to a device and a method for testing the droop rate of an impulse current sensor.

Background

The impact large current has large amplitude and fast change, and the frequency range covered by the signal is wide. For the current shock wave with short rise time and long duration, theoretical analysis and simulation calculation show that the upper limit frequency of the current shock wave can exceed MHz, the lower limit frequency can be as low as several Hz or below, and a sensor for measuring the impact large current must have higher upper limit frequency and lower limit frequency than the impact large current wave.

The existing common calibration test method is a time domain measurement method for providing standard impact current waves, and can better calibrate amplitude scale factors and rise time, but cannot calibrate the low-frequency response indexes of the sensor.

The upper and lower limit frequency calibration of a general sensor mostly adopts a sine wave signal frequency sweeping method, under the condition of keeping the amplitude of an input signal unchanged, the frequency of the signal is changed, and the attenuation change of an output signal of the sensor under different frequencies is measured, so that the available passband, namely the corresponding upper and lower limit frequency is determined, the signal amplitude of an impact heavy current sensor is generally more than thousands of amperes, the sine wave signal frequency sweeping method is adopted, a sine wave current source with large power and adjustable wide frequency range is needed, and the equipment condition is not provided in a general laboratory at present.

Disclosure of Invention

In view of the above problems, the present invention provides an apparatus for testing a droop rate of a rush current sensor, comprising:

the programmable power source outputs a pulse current signal and transmits the pulse current signal to the measured impact current sensor and the standard impact current sensor;

the standard impulse current sensor is connected with the impulse current signal to form a loop and forms a closed current loop with the measured impulse current sensor connected with the impulse current signal;

the output voltage signals of the standard impact current sensor and the measured current sensor are transmitted to an oscilloscope;

the oscilloscope is connected with the voltage signal, measures the voltage signal, acquires a voltage signal value, outputs a measured value according to the measured voltage signal value, and acquires the droop rate of the measured current sensor according to the measured value.

Optionally, the pulse current signal is a pulse current signal with adjustable amplitude and width.

Optionally, the measured values include: the current amplitude and the pulse duration output by the standard impact current sensor, and the current amplitude, the pulse duration and the current descending amplitude output by the measured impact current sensor.

Optionally, the droop rate determines the lower limit frequency of the sensor to be tested according to the relation between the droop rate and the lower limit frequency.

Optionally, the amplitude is adjusted according to the sensitivity of the measured current impacting the sensor.

Optionally, the width is adjusted according to a lower frequency range of the measured current impacting the sensor.

The invention also provides a method for testing the droop rate of the impact current sensor, which comprises the following steps:

outputting a pulse current signal, and transmitting the pulse current signal to a measured impact current sensor and a standard impact current sensor;

after the standard impulse current sensor and the measured current sensor are connected with pulse signals, voltage signals are output;

and measuring a voltage signal, acquiring a voltage signal value, outputting a measured value according to the measured voltage signal value, and acquiring the droop rate of the measured current sensor according to the measured value.

Optionally, the pulse current signal is a pulse current signal with adjustable amplitude and width.

Optionally, the measured values include: the current amplitude and the pulse duration output by the standard impact current sensor, and the current amplitude, the pulse duration and the current descending amplitude output by the measured impact current sensor.

Optionally, the droop rate determines the lower limit frequency according to a relationship between the droop rate and the lower limit frequency.

Optionally, the amplitude is adjusted according to the sensitivity of the measured current impacting the sensor.

Optionally, the width is adjusted according to a lower frequency range of the measured current impacting the sensor.

The invention solves the problem of the deficiency of the prior impact heavy current sensor in the aspect of measuring the low-frequency index, does not need a sine wave current source with high power and adjustable wide frequency range, and can realize the measurement of the low-frequency performance index of the impact heavy current sensor by utilizing a programmable pulse power source and conventional equipment.

Drawings

FIG. 1 is a block diagram of an apparatus for measuring sag of an impulse current sensor according to the present invention;

FIG. 2 is a schematic diagram of a droop rate test waveform for an apparatus for testing the droop rate of an impulse current sensor according to the present invention;

FIG. 3 is a flow chart of a method for measuring sag rate of an impulse current sensor according to the present invention;

in fig. 1: firstly, a programmable power source; secondly, a standard impact current sensor; thirdly, a measured impact current sensor; fourthly, an oscilloscope is used;

in fig. 2: u shape_RThe output of the standard impact current sensor II; u shape_XIs the output of the measured impact current sensor (c); delta U_XThe variation quantity output by the impulse current sensor to be measured is shown; t is the pulse high duration.

Detailed Description

The exemplary embodiments of the present invention will now be described with reference to the accompanying drawings, however, the present invention may be embodied in many different forms and is not limited to the embodiments described herein, which are provided for complete and complete disclosure of the present invention and to fully convey the scope of the present invention to those skilled in the art. The terminology used in the exemplary embodiments illustrated in the accompanying drawings is not intended to be limiting of the invention. In the drawings, the same units/elements are denoted by the same reference numerals.

Unless otherwise defined, terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. Further, it will be understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and will not be interpreted in an idealized or overly formal sense.

The invention provides a device for testing the droop rate of an impulse current sensor, as shown in figure 1, comprising:

the programmable power source outputs a pulse current signal and transmits the pulse current signal to the measured impact current sensor and the standard impact current sensor;

the standard impulse current sensor is connected with the impulse current signal and generates a closed current loop together with the measured impulse current sensor connected with the impulse current signal;

the output voltage signals of the standard impact current sensor and the measured current sensor are transmitted to an oscilloscope;

the oscilloscope is connected with the voltage signal, measures the voltage signal, acquires a voltage signal value, outputs a measured value according to the measured voltage signal value, and acquires the droop rate of the measured current sensor according to the measured value.

The pulse current signal is a pulse current signal with adjustable amplitude and width.

Measured values, comprising: the current amplitude and the pulse duration output by the standard impact current sensor, and the current amplitude, the pulse duration and the current descending amplitude output by the measured impact current sensor.

The droop rate determines the lower limit frequency according to the relation between the droop rate and the lower limit frequency.

The amplitude is adjusted according to the sensitivity of the sensor to which the measured current impacts.

The width is adjusted according to the lower frequency range of the current to be measured impacting the sensor.

The implementation process of the invention is as follows:

the programmable power source outputs pulse current signals with adjustable amplitude and width, a closed current loop is formed by the standard impulse current sensor and the impulse current sensor to be measured, and the outputs of the two impulse current sensors are respectively connected to two channels of the oscilloscope.

The programmable power source selects and outputs pulse current with certain amplitude and width, and the standard impact current sensor and the measured impact current sensor output corresponding voltage signals; according to the sensitivity of the current sensor, the standard current amplitude and pulse duration can be obtained by the measurement value of the oscilloscope, and the current amplitude, pulse duration and current falling amplitude output by the measured sensor can also be obtained in the same way;

from two channelsCalculating the droop rate of the current sensor to be measured, and obtaining a oscillogram as shown in FIG. 2 according to the relation D of the droop rate and the lower limit frequency of 2 pi f_LThe lower limit frequency can be obtained.

Lower limit frequency f of programmable power source_L1Lower cut-off frequency f of current sensor to be measured_L3The relationship between them is: f. of_L1≤f_L3；

Upper limit frequency f of standard current sensor_H2With the upper limit frequency f of the output current of the programmable power source_H1The relationship between them is: f. of_H2≥f_H1Lower limit frequency f of standard current sensor_L2The relationship between the lower limit frequency of the output current of the programmable power source and the frequency of the lower limit of the output current of the programmable power source is as follows: f. of_L2≤f_L1；

Selecting the amplitude of the output current of the programmable power source according to the sensitivity of the current sensor to ensure that the output of the sensor is suitable for measurement by an oscilloscope; if the sensitivity of the impact current sensor is low, the single-turn current output by the power source is not large enough, and an equal ampere-turn method can be adopted to ensure that the output voltage of the sensor is suitable for measurement by an oscilloscope;

and selecting the pulse frequency and adjusting the duty ratio according to the lower limit frequency range of the current sensor to be measured, so that the falling amplitude output by the sensor to be measured in the pulse width is ensured to be convenient for measurement of an oscilloscope.

Example 1

The programmable power source is a commercial product, the range of the pulse current amplitude is 0-50A, the frequency range is: 0-70 kHz; the standard current sensor is built in a programmable power source, and the sensitivity is 0.1V/A. The measured current sensor is a commercial broadband current sensor, Pearson CT101, nominal lower limit frequency: 0.25Hz, and a sensitivity of 10 mV/A.

According to the figure 1, a loop is connected, wherein two channels are respectively connected with the output of a standard current sensor and the output of a measured current sensor, and as the sensitivity of the measured sensor is lower, an ampere-turn method is selected, a current wire is wound through a central hole of the measured sensor for 6 turns, namely the measured current of the sensor is equivalent to 6 IX.

Selecting a programmable power source to output an amplitude of 50A, a frequency of 25Hz and a duty ratio of 0.1; the pulse high level duration time T is 4mS, and the droop rate D of the measured current sensor is measured and calculated to be 0.31%/mS. The corresponding lower frequency limit is calculated to be 0.49Hz and substantially coincides with the nominal lower frequency limit.

Example 2

The programmable power source is a commercial product; the range of the pulse current amplitude is 0-50A, and the frequency range is: 0-70 kHz; the standard current sensor is built in a programmable power source, and the sensitivity is 0.1V/A. The measured current sensor is an air-core coil impact current sensor, and the lower limit frequency is calculated theoretically: 350Hz, and the sensitivity is 1 mV/A.

According to the figure 1, a loop is connected, wherein two channels are respectively connected with the output of a standard current sensor and the output of a current sensor to be measured, and as the sensitivity of the sensor to be measured is lower, an ampere-turn method is selected, a current wire is wound for 10 turns through a central hole of the sensor to be measured, namely the measured current of the sensor is equivalent to 10 IX.

Selecting a programmable power source to output an amplitude value of 50A, a frequency of 50Hz and a duty ratio of 0.1; the pulse high level duration time T is 2mS, and the droop rate D of the measured current sensor is measured and calculated to be 196%/mS. And calculating the corresponding lower limit frequency to be 312Hz, and conforming to the theoretical lower limit frequency.

The invention also provides a method for testing the droop rate of the impulse current sensor, as shown in fig. 3, comprising the following steps:

outputting a pulse current signal, and transmitting the pulse current signal to a measured impact current sensor and a standard impact current sensor;

after the standard impulse current sensor and the measured current sensor are connected with pulse signals, voltage signals are output;

and measuring a voltage signal, acquiring a voltage signal value, outputting a measured value according to the measured voltage signal value, and acquiring the droop rate of the measured current sensor according to the measured value.

Optionally, the pulse current signal is a pulse current signal with adjustable amplitude and width.

Optionally, the measured values include: the current amplitude and the pulse duration output by the standard impact current sensor, and the current amplitude, the pulse duration and the current descending amplitude output by the measured impact current sensor.

Optionally, the droop rate determines the lower limit frequency according to a relationship between the droop rate and the lower limit frequency.

Optionally, the amplitude is adjusted according to the sensitivity of the measured current impacting the sensor.

Optionally, the width is adjusted according to a lower frequency range of the measured current impacting the sensor.

The invention solves the problem of the deficiency of the prior impact heavy current sensor in the aspect of measuring the low-frequency index, does not need a sine wave current source with high power and adjustable wide frequency range, and can realize the measurement of the low-frequency performance index of the impact heavy current sensor by utilizing a programmable pulse power source and conventional equipment.

As will be appreciated by one skilled in the art, embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein. The scheme in the embodiment of the application can be implemented by adopting various computer languages, such as object-oriented programming language Java and transliterated scripting language JavaScript.

The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.

These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.

These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.

While the preferred embodiments of the present application have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including preferred embodiments and all alterations and modifications as fall within the scope of the application.

It will be apparent to those skilled in the art that various changes and modifications may be made in the present application without departing from the spirit and scope of the application. Thus, if such modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is intended to include such modifications and variations as well.