阅读说明：本技术 用于全偏振态测量的透射式数字全息显微术试验方法 (Transmission type digital holographic microscopy test method for full polarization state measurement ) 是由 张春熹 王峥 杨艳强 王心 于 2020-10-27 设计创作，主要内容包括：本发明公开了用于全偏振态测量的透射式数字全息显微术试验方法,涉及数字全息显微术技术领域。该用于全偏振态测量的透射式数字全息显微术试验方法包括以下步骤：启动待测光源并记录光束波长记为δ_(基准)、记录光束波长记为δ_1、记录光束波长记为δ_2、求得光源透射式的全偏振态测量γ,其中该用于全偏振态测量的透射式数字全息显微术试验方法能够通过对数字全息显微术的方式对光波的全偏振态测量进行多方位的测量,方便人们对不同光波在不同场合下的全偏振态的数值进行较为准确的测量,并且光波的全偏振态测量的误差更低,有效的解决了全偏振态测量效率低的问题。(The invention discloses a transmission type digital holographic microscopy test method for full polarization state measurement, and relates to the technical field of digital holographic microscopy. The transmission type digital holographic microscopy test method for full polarization state measurement comprises the following steps: starting the light source to be measured and recording the wavelength of the light beam as delta Datum The recording beam wavelength is denoted as delta 1 The recording beam wavelength is denoted as delta 2 Determining a light source transmission-type full polarization measurement gamma, wherein)

1. A transmission type digital holographic microscopy test method for full polarization state measurement is characterized in that: the transmission type digital holographic microscopy test method for full polarization state measurement comprises the following steps:

s1, starting the light source to be measured, emitting a light beam with the wavelength of epsilon, generating interference on the plane of the image sensor by the light beam to form a holographic microscopic picture, recording the wavelength of the light beam at the moment, and recording the wavelength of the light beam at the moment as delta_DatumAnd uploading the holographic microscope image to a computer;

s2, starting a light source to be detected, emitting a light beam with a wavelength of epsilon, sequentially emitting the light beam of the light source to be detected into a first half-wave plate, a first polarization beam splitter prism and a second half-wave plate, emitting the light beam emitted from the second half-wave plate to a single plane reflector, emitting the light beam reflected from the single plane reflector to a binary grating, emitting the light beam from the binary grating to pass through a third half-wave plate, a second polarization beam splitter prism and a fourth half-wave plate, generating interference on an image sensor plane by the light beam emitted from the fourth half-wave plate to form a holographic microscopic image, recording the wavelength of the light beam at the moment, and recording the wavelength of the light beam at the moment as delta₁And uploading the holographic microscope image to a computer;

s3, turning off the light source to be measured in S2, exchanging the positions of the first half-wave plate and the first polarization beam splitter prism in S2, enabling the light source to be measured to pass through the same process as in S2, enabling the light beam emitted by the fourth half-wave plate to generate interference on the plane of the image sensor to form a holographic microscope, recording the wavelength of the light beam at the moment, and recording the wavelength of the light beam at the moment as delta₂And uploading the holographic microscope image to a computer;

s4, turning off the light source to be measured in S2, exchanging the positions of the third half-wave plate and the second polarization beam splitter prism in S2, then turning on the light source to be measured, then generating interference on the plane of the image sensor by the light beam emitted by the fourth half-wave plate to form a holographic microscope, recording the wavelength of the light beam at the moment, and recording the wavelength of the light beam at the momentIs delta₃And uploading the holographic microscope image to a computer;

s4, checking the data to obtain light source transmission type full polarization state measurement gamma, wherein

And S5, repeating the experiment for five times, carrying out data arrangement on the experiment for five times, and finally obtaining the average value of gamma as the final experiment result.

2. The transmissive digital holographic microscopy test method for full polarization state measurement according to claim 1, characterized in that: the light beam emitted by the light source to be tested is a parallel light beam, and the environment of the test is a closed space without influence of other impurities on the light beam.

3. The transmissive digital holographic microscopy test method for full polarization state measurement according to claim 1, characterized in that: in S1, the light beams interfere with each other at the image sensor plane to form a holographic microscope image, and the image sensor is a CCD image sensor with 500 ten thousand pixels.

4. The transmissive digital holographic microscopy test method for full polarization state measurement according to claim 1, characterized in that: the thickness of the first half-wave plate and the thickness of the third half-wave plate are both 0.08mm, and the deflection refractive index is n_e＝1.59。

5. The transmissive digital holographic microscopy test method for full polarization state measurement according to claim 1, characterized in that: the thickness of the second half-wave plate and the thickness of the fourth half-wave plate are both 0.06mm, and the refraction index is n_e＝1.32。

6. The transmissive digital holographic microscopy test method for full polarization state measurement according to claim 1, characterized in that: the thickness of the binary grating is 0.9mm, and the grating line number of the binary grating is 60 LPI.

7. The transmissive digital holographic microscopy test method for full polarization state measurement according to claim 1, characterized in that: the thickness of the first polarization beam splitter prism is 0.9mm, the thickness of the second polarization beam splitter prism is 0.6mm, and the polarization light transmittance of the first polarization beam splitter prism is equal to that of the second polarization beam splitter prism.

8. The transmissive digital holographic microscopy test method for full polarization state measurement according to claim 1, characterized in that: the thickness of the single plane reflector is 0.9 mm.

9. The transmissive digital holographic microscopy test method for full polarization state measurement according to claim 1, characterized in that: the first half-wave plate, the first polarization splitting prism, the second half-wave plate, the single plane reflector, the binary grating, the third half-wave plate, the second polarization splitting prism and the fourth half-wave plate are all in the same size specification.

Technical Field

The invention relates to the technical field of digital holographic microscopy, in particular to a transmission type digital holographic microscopy test method for full polarization state measurement.

Background

Digital Holographic Microscopy (DHM) is an imaging technique that provides the ability to quantitatively track sub-nanometer optical thickness changes in transparent samples. Unlike traditional digital microscopy, where only intensity (amplitude) information about the sample is captured, DHM captures both phase and intensity. The phase information captured as a hologram can be used to reconstruct extended morphological information about the sample (such as depth and surface properties) using computer algorithms. Modern DHM implementations provide several additional benefits, such as fast scan/digital acquisition speed, low noise, high resolution, and potential for label-free sample acquisition.

In the prior art, the full polarization state of the transmission-type light wave cannot be measured through digital holographic microscopy, so that the full polarization state of the light wave cannot be measured through the digital holographic microscopy, and the measurement efficiency of the full polarization state measurement of the light wave is greatly reduced.

Disclosure of Invention

Technical problem to be solved

In view of the deficiencies of the prior art, the present invention provides a transmission type digital holographic microscopy test method for full polarization state measurement, which solves the problems mentioned in the background art.

(II) technical scheme

In order to achieve the purpose, the invention is realized by the following technical scheme: a transmission type digital holographic microscopy test method for full polarization state measurement comprises the following steps:

s1, starting the light source to be measured, emitting a light beam with the wavelength of epsilon, generating interference on the plane of the image sensor by the light beam to form a holographic microscopic picture, recording the wavelength of the light beam at the moment, and recording the wavelength of the light beam at the moment as delta_DatumAnd uploading the holographic microscope image to a computer;

s2, starting the light source to be measured, emitting a light beam with the wavelength of epsilon, sequentially emitting the light beam of the light source to be measured into the first half-wave plate, the first polarization beam splitter prism and the second half-wave plate, and emitting the light beam from the second half-wave plate into the single half-wave plateThe light beam reflected from the single plane mirror is reflected to the binary grating, the light beam emitted from the binary grating passes through the third half-wave plate, the second polarization splitting prism and the fourth half-wave plate, the light beam emitted from the fourth half-wave plate generates interference on the plane of the image sensor to form a holographic microscope, the wavelength of the light beam at the moment is recorded, and the wavelength of the light beam at the moment is recorded as delta₁And uploading the holographic microscope image to a computer;

s3, turning off the light source to be measured in S2, exchanging the positions of the first half-wave plate and the first polarization beam splitter prism in S2, enabling the light source to be measured to pass through the same process as in S2, enabling the light beam emitted by the fourth half-wave plate to generate interference on the plane of the image sensor to form a holographic microscope, recording the wavelength of the light beam at the moment, and recording the wavelength of the light beam at the moment as delta₂And uploading the holographic microscope image to a computer;

s4, turning off the light source to be detected in S2, exchanging the positions of the third half-wave plate and the second polarization beam splitter prism in S2, then turning on the light source to be detected, then generating interference on the plane of the image sensor by the light beam emitted by the fourth half-wave plate to form a holographic microscope, recording the wavelength of the light beam at the moment, and recording the wavelength of the light beam at the moment as delta₃And uploading the holographic microscope image to a computer;

s4, checking the data to obtain light source transmission type full polarization state measurement gamma, wherein

And S5, repeating the experiment for five times, carrying out data arrangement on the experiment for five times, and finally obtaining the average value of gamma as the final experiment result.

Preferably, the light beam emitted by the light source to be tested is a parallel light beam, and the environment of the test is a closed space without influence of other impurities on the light beam.

Preferably, in S1, the light beam interferes at the image sensor plane to form a holographic microscope image, and the image sensor is a CCD image sensor with 500 ten thousand pixels.

Preferably, the thickness of the first half wave plate and the thickness of the third half wave plate are both 0.08mm, and the refractive index of the polarization is n_e＝1.59。

Preferably, the thickness of the second half-wave plate and the thickness of the fourth half-wave plate are both 0.06mm, and the refraction index is n_e＝1.32。

Preferably, the thickness of the binary grating is 0.9mm, and the grating line number of the binary grating is 60 LPI.

Preferably, the thickness of the first polarization beam splitter prism is 0.9mm, the thickness of the second polarization beam splitter prism is 0.6mm, and the polarization light transmittance of the first polarization beam splitter prism is equal to that of the second polarization beam splitter prism.

Preferably, the thickness of the single plane mirror is 0.9 mm.

Preferably, the first half-wave plate, the first polarization splitting prism, the second half-wave plate, the single plane mirror, the binary grating, the third half-wave plate, the second polarization splitting prism and the fourth half-wave plate are all in the same size specification.

(III) advantageous effects

The invention provides a transmission type digital holographic microscopy test method for full polarization state measurement. The method has the following beneficial effects:

this a transmission-type digital holographic microscopy test method for full polarization state measurement can carry out diversified measurement to the full polarization state measurement of light wave through the mode to digital holographic microscopy, makes things convenient for people to carry out comparatively accurate measurement to the numerical value of the full polarization state of different light waves under different occasions, has promoted staff by a wide margin to the efficiency of the full polarization state measurement of different light waves under different occasions to the error of the full polarization state measurement of light wave is lower, the effectual problem of having solved full polarization state measurement inefficiency.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

The first embodiment is as follows:

the transmission type digital holographic microscopy test method for full polarization state measurement comprises the following steps:

s1, starting the light source to be measured, emitting a light beam with the wavelength of epsilon, generating interference on the plane of the image sensor by the light beam to form a holographic microscopic picture, recording the wavelength of the light beam at the moment, and recording the wavelength of the light beam at the moment as delta_DatumAnd uploading the holographic microscope image to a computer;

s2, starting a light source to be detected, emitting a light beam with a wavelength of epsilon, sequentially emitting the light beam of the light source to be detected into a first half-wave plate, a first polarization beam splitter prism and a second half-wave plate, emitting the light beam emitted from the second half-wave plate to a single plane reflector, emitting the light beam reflected from the single plane reflector to a binary grating, emitting the light beam from the binary grating to pass through a third half-wave plate, a second polarization beam splitter prism and a fourth half-wave plate, generating interference on an image sensor plane by the light beam emitted from the fourth half-wave plate to form a holographic microscopic image, recording the wavelength of the light beam at the moment, and recording the wavelength of the light beam at the moment as delta₁And uploading the holographic microscope image to a computer;

s3, turning off the light source to be measured in S2, exchanging the positions of the first half-wave plate and the first polarization beam splitter prism in S2, enabling the light source to be measured to pass through the same process as in S2, enabling the light beam emitted by the fourth half-wave plate to generate interference on the plane of the image sensor to form a holographic microscope, recording the wavelength of the light beam at the moment, and recording the wavelength of the light beam at the moment as delta₂And uploading the holographic microscope image to a computer;

s4, turning off the light source to be detected in S2, exchanging the positions of the third half-wave plate and the second polarization beam splitter prism in S2, then turning on the light source to be detected, then generating interference on the plane of the image sensor by the light beam emitted by the fourth half-wave plate to form a holographic microscope, recording the wavelength of the light beam at the moment, and recording the wavelength of the light beam at the moment as delta₃And will beUploading the holographic microscope image to a computer;

s4, checking the data to obtain light source transmission type full polarization state measurement gamma, wherein

And S5, repeating the experiment for five times, carrying out data arrangement on the experiment for five times, and finally obtaining the average value of gamma as the final experiment result.

Furthermore, the light beam emitted by the light source to be tested is a parallel light beam, and the environment of the test is a closed space without influence of other impurities on the light beam.

Further, the light beam interferes at the image sensor plane to form a holographic microscope image in S1, and the image sensor is a CCD image sensor having 500 ten thousand pixels.

Further, the thickness of the first half wave plate and the thickness of the third half wave plate are both 0.08mm, and the refraction index is n_e＝1.59。

Further, the thickness of the second half-wave plate and the thickness of the fourth half-wave plate are both 0.06mm, and the refraction index is n_e＝1.32。

Further, the thickness of the binary grating is 0.9mm, and the grating line number of the binary grating is 60 LPI.

Further, the thickness of the first polarization beam splitter prism is 0.9mm, the thickness of the second polarization beam splitter prism is 0.6mm, and the polarization light transmittance of the first polarization beam splitter prism is equal to that of the second polarization beam splitter prism.

Further, the thickness of the single plane mirror is 0.9 mm.

Furthermore, the first half-wave plate, the first polarization splitting prism, the second half-wave plate, the single plane reflector, the binary grating, the third half-wave plate, the second polarization splitting prism and the fourth half-wave plate are all in the same size specification.

Example two:

the transmission type digital holographic microscopy test method for full polarization state measurement comprises the following steps:

s1, starting the light source to be measured, emitting a light beam with the wavelength of epsilon, generating interference on the plane of the image sensor by the light beam to form a holographic microscopic picture, recording the wavelength of the light beam at the moment, and recording the wavelength of the light beam at the moment as delta_DatumAnd uploading the holographic microscope image to a computer;

s2, starting a light source to be detected, emitting a light beam with a wavelength of epsilon, sequentially emitting the light beam of the light source to be detected into a first half-wave plate, a second half-wave plate and a first polarization beam splitter prism, emitting the light beam from the second half-wave plate to a single plane reflector, emitting the light beam reflected from the single plane reflector to a binary grating, passing the light beam emitted from the binary grating through a third half-wave plate, a fourth half-wave plate and a second polarization beam splitter prism, generating interference on the plane of an image sensor by the light beam emitted from the fourth half-wave plate to form a holographic microscopic image, recording the wavelength of the light beam at the moment, and recording the wavelength of the light beam at the moment as delta₁And uploading the holographic microscope image to a computer;

s3, turning off the light source to be measured in S2, exchanging the positions of the first half-wave plate and the first polarization beam splitter prism in S2, enabling the light source to be measured to pass through the same process as in S2, enabling the light beam emitted by the fourth half-wave plate to generate interference on the plane of the image sensor to form a holographic microscope, recording the wavelength of the light beam at the moment, and recording the wavelength of the light beam at the moment as delta₂And uploading the holographic microscope image to a computer;

s4, turning off the light source to be detected in S2, exchanging the positions of the third half-wave plate and the second polarization beam splitter prism in S2, then turning on the light source to be detected, then generating interference on the plane of the image sensor by the light beam emitted by the fourth half-wave plate to form a holographic microscope, recording the wavelength of the light beam at the moment, and recording the wavelength of the light beam at the moment as delta₃And uploading the holographic microscope image to a computer;

s4, checking the data to obtain light source transmission type full polarization state measurement gamma, wherein

And S5, repeating the experiment for five times, carrying out data arrangement on the experiment for five times, and finally obtaining the average value of gamma as the final experiment result.

Furthermore, the light beam emitted by the light source to be tested is a parallel light beam, and the environment of the test is a closed space without influence of other impurities on the light beam.

Further, the light beam interferes at the image sensor plane to form a holographic microscope image in S1, and the image sensor is a CCD image sensor having 500 ten thousand pixels.

Further, the thickness of the first half wave plate and the thickness of the third half wave plate are both 0.08mm, and the refraction index is n_e＝1.59。

Further, the thickness of the second half-wave plate and the thickness of the fourth half-wave plate are both 0.06mm, and the refraction index is n_e＝1.32。

Further, the thickness of the binary grating is 0.9mm, and the grating line number of the binary grating is 60 LPI.

Further, the thickness of the first polarization beam splitter prism is 0.9mm, the thickness of the second polarization beam splitter prism is 0.6mm, and the polarization light transmittance of the first polarization beam splitter prism is equal to that of the second polarization beam splitter prism.

Further, the thickness of the single plane mirror is 0.9 mm.

Furthermore, the first half-wave plate, the first polarization splitting prism, the second half-wave plate, the single plane reflector, the binary grating, the third half-wave plate, the second polarization splitting prism and the fourth half-wave plate are all in the same size specification.

Example three:

the transmission type digital holographic microscopy test method for full polarization state measurement comprises the following steps:

s1, starting the light source to be measured, emitting a light beam with the wavelength of epsilon, generating interference on the plane of the image sensor by the light beam to form a holographic microscopic picture, recording the wavelength of the light beam at the moment, and recording the wavelength of the light beam at the moment as delta_DatumAnd will be allUploading the microscopic picture to a computer;

s2, starting a light source to be detected, emitting a light beam with the wavelength of epsilon, sequentially emitting the light beam of the light source to be detected into a first half-wave plate, a first polarization splitting prism and a second half-wave plate, emitting the light beam emitted from the second half-wave plate to a single plane reflector, emitting the light beam reflected from the single plane reflector to a third half-wave plate, a second polarization splitting prism and a fourth half-wave plate in sequence, generating interference on the plane of an image sensor by the light beam emitted from the fourth half-wave plate to form a holographic micrograph, recording the wavelength of the light beam at the moment, and recording the wavelength of the light beam as delta₁And uploading the holographic microscope image to a computer;

s3, turning off the light source to be measured in S2, exchanging the positions of the first half-wave plate and the first polarization beam splitter prism in S2, enabling the light source to be measured to pass through the same process as in S2, enabling the light beam emitted by the fourth half-wave plate to generate interference on the plane of the image sensor to form a holographic microscope, recording the wavelength of the light beam at the moment, and recording the wavelength of the light beam at the moment as delta₂And uploading the holographic microscope image to a computer;

s4, turning off the light source to be detected in S2, exchanging the positions of the third half-wave plate and the second polarization beam splitter prism in S2, then turning on the light source to be detected, then generating interference on the plane of the image sensor by the light beam emitted by the fourth half-wave plate to form a holographic microscope, recording the wavelength of the light beam at the moment, and recording the wavelength of the light beam at the moment as delta₃And uploading the holographic microscope image to a computer;

s4, checking the data to obtain light source transmission type full polarization state measurement gamma, wherein

And S5, repeating the experiment for five times, carrying out data arrangement on the experiment for five times, and finally obtaining the average value of gamma as the final experiment result.

Furthermore, the light beam emitted by the light source to be tested is a parallel light beam, and the environment of the test is a closed space without influence of other impurities on the light beam.

Further, the light beam interferes at the image sensor plane to form a holographic microscope image in S1, and the image sensor is a CCD image sensor having 500 ten thousand pixels.

Further, the thickness of the first half wave plate and the thickness of the third half wave plate are both 0.08mm, and the refraction index is n_e＝1.59。

Further, the thickness of the second half-wave plate and the thickness of the fourth half-wave plate are both 0.06mm, and the refraction index is n_e＝1.32。

Further, the thickness of the binary grating is 0.9mm, and the grating line number of the binary grating is 60 LPI.

Further, the thickness of the first polarization beam splitter prism is 0.9mm, the thickness of the second polarization beam splitter prism is 0.6mm, and the polarization light transmittance of the first polarization beam splitter prism is equal to that of the second polarization beam splitter prism.

Further, the thickness of the single plane mirror is 0.9 mm.

Furthermore, the first half-wave plate, the first polarization splitting prism, the second half-wave plate, the single plane reflector, the binary grating, the third half-wave plate, the second polarization splitting prism and the fourth half-wave plate are all in the same size specification.

This a transmission-type digital holographic microscopy test method for full polarization state measurement can carry out diversified measurement to the full polarization state measurement of light wave through the mode to digital holographic microscopy, makes things convenient for people to carry out comparatively accurate measurement to the numerical value of the full polarization state of different light waves under different occasions, has promoted staff by a wide margin to the efficiency of the full polarization state measurement of different light waves under different occasions to the error of the full polarization state measurement of light wave is lower, the effectual problem of having solved full polarization state measurement inefficiency.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.