阅读说明：本技术 波长测量装置和波长测量的方法 (Wavelength measuring device and method for measuring wavelength ) 是由 李裔 秦华强 于 2020-03-19 设计创作，主要内容包括：本申请公开了一种波长测量装置和波长测量的方法,属于波长测量技术领域。该波长测量装置包括标准具、转动部件、分光部件和多个探测器,其中分光部件用于接收待测激光并将其分束得到多个光束；转动部件上安装有反射镜,反射镜位于第一光束所在的光路上,标准具位于反射镜的反射光路上,第一探测器位于标准具的透射光路上,第二探测器位于第二光束所在的光路上；转动部件用于转动反射镜以获得多个透射率曲线并使第一探测器输出多个光强值,其中转角分别与透射率曲线和第一探测器输出的光强值一一对应；第二探测器输出的光强值、多个透射率曲线和第一探测器输出的多个光强值用于确定待测激光的波长值。采用本申请,可以提高的波长值的测量精度。(The application discloses a wavelength measuring device and a wavelength measuring method, and belongs to the technical field of wavelength measurement. The wavelength measuring device comprises an etalon, a rotating component, a light splitting component and a plurality of detectors, wherein the light splitting component is used for receiving laser to be measured and splitting the laser to be measured into a plurality of light beams; the rotating component is provided with a reflector, the reflector is positioned on a light path where the first light beam is positioned, the etalon is positioned on a reflection light path of the reflector, the first detector is positioned on a transmission light path of the etalon, and the second detector is positioned on a light path where the second light beam is positioned; the rotating component is used for rotating the reflector to obtain a plurality of transmissivity curves and enabling the first detector to output a plurality of light intensity values, wherein the rotation angles are in one-to-one correspondence with the transmissivity curves and the light intensity values output by the first detector respectively; the light intensity value output by the second detector, the plurality of transmissivity curves and the plurality of light intensity values output by the first detector are used for determining the wavelength value of the laser to be detected. By adopting the method and the device, the measurement precision of the wavelength value can be improved.)

1. A wavelength measuring device, characterized in that it comprises an etalon (2), a rotating member (3), a spectroscopic member (4) and a plurality of detectors (5), wherein:

the light splitting component (4) is used for receiving laser to be detected and splitting the laser to be detected into a plurality of light beams;

a reflector (6) is mounted on the rotating component (3), the reflector (6) is located on a light path where a first light beam of the light beams is located, the etalon (2) is located on a light reflection path of the reflector (6), a first detector (51) of the detectors (5) is located on a light transmission path of the etalon (2), and a second detector (52) of the detectors (5) is located on a light path where a second light beam of the light beams is located;

the rotating component (3) is used for rotating the reflector (6) to obtain a plurality of transmittance curves of the etalon (2) under a plurality of rotating angles of the reflector (6), wherein the rotating angles correspond to the transmittance curves one by one;

the rotating component (3) is further used for rotating the reflector (6) to enable the first detector (51) to output a plurality of light intensity values under a plurality of rotating angles of the reflector (6), wherein the rotating angles correspond to the light intensity values output by the first detector (51) in a one-to-one mode;

the light intensity value output by the second detector (52), the plurality of transmissivity curves and the plurality of light intensity values output by the first detector (51) are used for determining the wavelength value of the laser to be measured.

2. The wavelength measurement device according to claim 1, further comprising a processing component (7), said processing component (7) being electrically connected to said rotating component (3) and said plurality of probes (5), respectively;

the processing component (7) is configured to determine, according to the light intensity value output by the second detector (52) and the light intensity value output by the first detector (51) at each of the plurality of rotation angles, the transmittance of the laser to be measured through the etalon (2) at each rotation angle, where the rotation angles correspond to the transmittances one to one;

under each corner, determining a candidate wavelength value which corresponds to the transmittance of the corner on a transmittance curve of the corner and is located in a target wavelength period, wherein the target wavelength period is a wavelength period of the to-be-detected laser in the transmittance curve;

and taking the candidate wavelength value close to the maximum slope of the transmissivity curve as the wavelength value of the laser to be measured in the plurality of candidate wavelength values.

3. The wavelength measurement device according to claim 2, wherein the processing means (7) is further configured to obtain a transmittance curve at each of a plurality of nominal angles from a plurality of nominal laser light incident into the etalon (2) at each of the plurality of nominal angles;

determining a calibration wavelength value corresponding to a transmittance peak value in the target wavelength period according to the transmittance curve under each calibration corner, wherein the calibration corners correspond to the calibration wavelength values one to one;

determining the corresponding relation between the rotation angle and the wavelength according to each calibration rotation angle and the corresponding calibration wavelength value;

determining the corresponding relation between the light intensity value of the laser to be detected and the rotation angle according to the light intensity value output by the first detector (51) under each rotation angle of the laser to be detected in the plurality of rotation angles;

and determining the spectrogram of the laser to be detected according to the corresponding relation between the rotation angle and the wavelength and the corresponding relation between the light intensity value of the laser to be detected and the rotation angle.

4. The wavelength measurement device according to any one of claims 1 to 3, characterized in that it further comprises a filter (8), said filter (8) being located on an optical path on which a third one of said plurality of light beams is located;

and a third detector (53) in the detectors (5) is positioned on a transmission light path of the filter (8), and a light intensity value output by the third detector (53) is used for determining an estimated wavelength value of the laser to be detected with a light intensity value output by the second detector (52) so as to determine a target wavelength period of the laser to be detected in a transmissivity curve.

5. The wavelength measurement device according to any one of claims 1 to 4, further comprising a temperature-resistant substrate (9), wherein the etalon (2), the rotating member (3), the spectroscopic member (4), and the plurality of detectors (5) are all mounted on the temperature-resistant substrate (9).

6. The wavelength measurement device according to any one of claims 1 to 5, characterized in that the wavelength measurement device further comprises a thermistor (10), the thermistor (10) being configured to monitor a temperature inside the wavelength measurement device.

7. The wavelength measurement device according to any one of claims 1 to 6, characterized in that the wavelength measurement device further comprises a collimator (12), the collimator (12) being mounted at the light entrance position of the wavelength measurement device.

8. Wavelength measuring device according to one of claims 1 to 7, characterized in that the rotating part (3) is a micro-electromechanical system, MEMS.

9. A method for wavelength measurement, which is applied to the wavelength measurement device according to any one of claims 1 to 8, the method comprising:

acquiring a target wavelength period of the laser to be detected in the transmittance curve of the etalon (2);

determining the transmissivity of the laser to be measured through the etalon (2) at each rotation angle according to the light intensity value output by the second detector (52) and the light intensity value output by the first detector (51) at each rotation angle of the plurality of rotation angles of the reflecting mirror (6);

determining candidate wavelength values of the transmittance under the rotation angle, which correspond to the transmittance curve under the rotation angle and are positioned in the target wavelength period, under each rotation angle;

and taking the candidate wavelength value close to the maximum slope of the transmissivity curve as the wavelength value of the laser to be measured in the plurality of candidate wavelength values.

10. The method of claim 9, further comprising:

according to the method, a plurality of calibration lasers are incident into the etalon (2) under each calibration rotation angle in a plurality of calibration rotation angles, and a transmissivity curve under each calibration rotation angle is obtained;

determining a calibration wavelength value corresponding to a transmittance peak value in the target wavelength period according to the transmittance curve under each calibration corner, wherein the calibration corners correspond to the calibration wavelength values one to one;

determining the corresponding relation between the rotation angle and the wavelength according to each calibration rotation angle and the corresponding calibration wavelength value;

determining the corresponding relation between the light intensity value of the laser to be detected and the rotation angle according to the light intensity value output by the first detector (51) under each rotation angle of the laser to be detected in the plurality of rotation angles;

and determining the spectrogram of the laser to be detected according to the corresponding relation between the rotation angle and the wavelength and the corresponding relation between the light intensity value of the laser to be detected and the rotation angle.

Technical Field

The present disclosure relates to wavelength measurement technologies, and in particular, to a wavelength measurement device and a wavelength measurement method.

Background

The laser wavelength is the wavelength output by the laser, is an important parameter of the laser beam output by the laser, and has important significance in the field of basic research and application of optics for accurately measuring the laser wavelength.

At present, a wavelength meter is generally used for measuring the laser wavelength, for example, a michelson wavelength meter can be used for measuring the laser wavelength, a reference laser is structurally required to be built in the wavelength meter, the reference laser can emit reference laser with a known wavelength value, a detector can record the light intensity information of the laser to be measured and the reference laser, and the laser wavelength of the laser to be measured can be measured by comparing the light intensity information of the reference laser and the light intensity information of the laser to be measured.

The built-in reference laser makes the volume of the wavemeter larger, and the larger wavemeter has poor shock resistance, resulting in lower accuracy of the measured wavelength value.

Disclosure of Invention

The embodiment of the application provides a wavelength measuring device and a wavelength measuring method, which can overcome the problems of the related technology, and the technical scheme is as follows:

in one aspect, a wavelength measuring device is provided, which includes an etalon, a rotating member, a beam splitting member, and a plurality of detectors, wherein: the light splitting component is used for receiving laser to be detected and splitting the laser to be detected into a plurality of light beams; the rotating component is provided with a reflector, the reflector is positioned on a light path where a first light beam in the light beams is positioned, the etalon is positioned on a reflected light path of the reflector, a first detector in the detectors is positioned on a transmission light path of the etalon, and a second detector in the detectors is positioned on a light path where a second light beam in the light beams is positioned; the rotating component is used for rotating the angle of the reflector to obtain a plurality of transmissivity curves of the etalon under a plurality of rotation angles of the reflector, wherein the rotation angles correspond to the transmissivity curves one by one; the rotating component is further used for rotating the reflector to enable the first detector to output a plurality of light intensity values under a plurality of rotating angles of the reflector, wherein the rotating angles correspond to the light intensity values output by the first detector one by one; and the light intensity value output by the second detector, the plurality of transmissivity curves and the plurality of light intensity values output by the first detector are used for determining the wavelength value of the laser to be detected.

According to the scheme shown in the embodiment of the application, the wavelength measuring device further comprises a shell, wherein a light inlet is formed in the shell, the light splitting component can be located in the shell and on an incident light path of the light inlet, so that laser emitted into the shell through the light inlet can be received by the light splitting component, and the laser to be measured is divided into a plurality of light beams. The reflecting mirror on the rotating component is located on a light path where a first light beam in the light beams is located, the second detector is located on a light path where a second light beam in the light beams is located, the etalon is located on a reflecting light path of the reflecting mirror, and the first detector is located on a transmitting light path of the etalon.

Thus, the ratio of the light intensity value output by the first detector to the light intensity value output by the second detector can be used as the transmissivity of the laser to be measured in the etalon. Each of the plurality of rotation angles of the mirror corresponds to a transmittance through the etalon and also corresponds to a transmittance curve through the etalon, wherein the transmittance curve is a periodic function of the transmittance with respect to wavelength, such that the wavelength value is obtained by knowing the transmittance curve and the transmittance.

In a possible implementation manner, the wavelength measuring device further includes a processing component, and the processing component is electrically connected to the rotating component and the plurality of detectors respectively; the processing component is used for determining the transmissivity of the laser to be detected passing through the etalon at each corner according to the light intensity value output by the second detector and the light intensity value output by the first detector at each corner in a plurality of corners of the reflector; the processing component may be further configured to determine, at each corner, a candidate wavelength value that corresponds to the transmittance at the corner on a transmittance curve at the corner and is located in a target wavelength period, where the target wavelength period is a wavelength period to which the laser to be measured belongs in the transmittance curve; the processing means may be further configured to use, as the wavelength value of the laser light to be measured, a candidate wavelength value near a maximum slope of a transmittance curve among the plurality of candidate wavelength values.

According to the scheme shown in the embodiment of the application, the transmittance curve and the transmittance are known, and the wavelength value can be obtained, but as the transmittance curve is a periodic function of sine and cosine, a plurality of wavelength values can be obtained by one transmittance. Then, the target wavelength period of the laser to be measured on the transmittance curve is screened, so that one transmittance corresponds to two wavelength values, and thus, 2m wavelength values can be obtained by m transmittances, and the 2m wavelength values can be called as candidate wavelength values. And then, taking the candidate wavelength value close to the maximum slope of the transmissivity curve as the wavelength value of the laser to be measured in the candidate wavelength values. Thus, from the maximum slope of the transmittance curve and whichever transmittance is used to calculate that the same laser light to be measured has only one wavelength value, one can be determined from a plurality of candidate wavelength values as the wavelength value of the laser light to be measured.

In one possible implementation, the processing component is further configured to obtain a transmittance curve according to a plurality of calibration lasers incident into the etalon at each of a plurality of calibration rotation angles; determining a calibration wavelength value corresponding to a transmittance peak value in the target wavelength period according to the transmittance curve under each calibration corner, wherein the calibration corners correspond to the calibration wavelength values one to one; determining the corresponding relation between the rotation angle and the wavelength according to each calibration rotation angle and the corresponding calibration wavelength value; determining the corresponding relation between the light intensity value of the laser to be detected and the rotation angle according to the light intensity value output by the first detector under each rotation angle of the laser to be detected in a plurality of rotation angles; and determining the spectrogram of the laser to be detected according to the corresponding relation between the rotation angle and the wavelength and the corresponding relation between the light intensity value of the laser to be detected and the rotation angle.

According to the scheme shown in the embodiment of the application, the wavelength measuring device can measure a wavelength value and obtain a spectrogram of laser to be measured, and correspondingly, a plurality of rotation angles can be selected, and the relationship between the rotation angles for calibrating the rotation angles and the wavelength can be called calibration rotation angles, for example, calibration rotation angle 1, calibration rotation angle 2 and calibration rotation angle 3, wherein the more the number of the selected calibration rotation angles is, the higher the precision of the relationship between the calibrated rotation angles and the wavelength is, and a person skilled in the art can flexibly select the number of the calibration rotation angles according to requirements, so that three calibration rotation angles are used for illustration.

Then, a plurality of lasers on the transmittance curve may be selected, or all lasers on the transmittance curve may be selected, and these lasers are used to enter the etalon to generate the transmittance curve, and these lasers may be referred to as calibration lasers, for example, calibration laser 1, calibration laser 2, and calibration laser 3, where the greater the number of selected calibration lasers, the higher the accuracy of the relationship between the obtained rotation angle and the wavelength is, and those skilled in the art may flexibly select the number of calibration lasers according to requirements, and for convenience of description, three calibration lasers are used for example.

Then, when the rotation angle of the reflector 6 is at the calibration rotation angle 1, the calibration laser 2, and the calibration laser 3 are respectively incident to the wavelength measuring device to obtain the transmittance curve 1 of the etalon 2 corresponding to the calibration rotation angle 1, and the wavelength value corresponding to the peak within the target wavelength period is determined in the transmittance curve 1 and is recorded as the calibration wavelength value 1, so that a group (calibration rotation angle 1, calibration wavelength value 1) can be obtained. Similarly, a (calibration rotation angle 2, calibration wavelength value 2) and a (calibration rotation angle 2, calibration wavelength value 2) can be obtained separately. Thus, after obtaining multiple sets (calibration rotation angles, calibration wavelength values) under multiple calibration rotation angles, the corresponding relationship between the rotation angles and the wavelengths can be obtained through the multiple sets (calibration rotation angles, calibration wavelength values).

The calibration wavelength value is a wavelength value corresponding to a peak on the transmittance curve, and may be referred to as a center wavelength value.

Then, the laser to be measured enters the wavelength measuring device, the rotating part drives the reflector to rotate, the first detector outputs a light intensity value under each corner, and the corresponding relation between the light intensity value and the corner can be obtained. Therefore, the corresponding relation between the light intensity value and the wavelength is converted according to the calibrated corresponding relation between the rotation angle and the wavelength and the corresponding relation between the light intensity value and the rotation angle, and the spectrogram of the laser to be detected is further obtained, wherein the corresponding relation between the light intensity value and the wavelength is also the spectrogram of the laser to be detected.

After the spectrogram of the laser to be detected is obtained, not only can the wavelength value of the laser to be detected be read from the spectrogram, but also whether the laser to be detected belongs to a single wave or a multi-wave can be judged, and the central wavelength, the side mode and the line width of the laser to be detected can be read, wherein the central wavelength is the wavelength value corresponding to the peak position in the spectrogram, and the side mode is the wavelength value corresponding to the peak position in the spectrogram. If the side modes in the spectrogram are few, the quality of the laser generated by the laser is good, and the wavelength measuring device can evaluate the quality of the laser generated by the laser through the spectrogram. Therefore, the wavelength measuring device has wider application.

In a possible implementation manner, the wavelength measurement device further includes a filter, and the filter is located on an optical path where a third light beam of the plurality of light beams is located; and a third detector in the detectors is positioned on a transmission light path of the filter, and a light intensity value output by the third detector is used for determining an estimated wavelength value of the laser to be detected with a light intensity value output by the second detector so as to determine a target wavelength period of the laser to be detected in a transmissivity curve.

The estimated wavelength value may be a specific value or a range of values, but whether the estimated wavelength value belongs to a value or a range of values, the estimated wavelength value falls within a wavelength period, which is also a target wavelength period to which the laser to be measured belongs in the transmittance curve.

According to the scheme shown in the embodiment of the application, the ratio of the light intensity value output by the third detector to the light intensity value output by the second detector can be used as the transmissivity of the laser to be detected for passing through the filter. Then, according to the corresponding relation between the transmittance of the filter and the wavelength, the wavelength value corresponding to the calculated transmittance can be obtained, and the wavelength value can be used as the estimated wavelength value of the laser to be measured. After the estimated wavelength value is determined in the above manner, the target wavelength period to which the estimated wavelength value belongs can be determined according to the position of the estimated wavelength value on the transmittance curve.

In a possible implementation manner, the wavelength measuring device further includes a temperature-resistant substrate, and the etalon, the rotating member, the light splitting member, and the plurality of detectors are all mounted on the temperature-resistant substrate.

According to the scheme, the temperature-resistant variable substrate can be made of ceramic materials, the temperature-resistant variable substrate has the characteristic of high temperature non-deformation, the stability of a component mounted on the temperature-resistant variable substrate can be improved, and then the stability of the wavelength measuring device is higher, so that the accuracy of measuring the wavelength value can be improved.

In one possible implementation, the wavelength measurement device further comprises a thermistor for monitoring the temperature inside the wavelength measurement device.

According to the scheme shown in the embodiment of the application, the thermistor can be arranged on the inner wall of the shell and used for monitoring the temperature change in the shell in real time. And the thermistor is electrically connected with the processing part and used for sending the monitored temperature data to the processing part so that the processing part determines the compensation value of the parameter according to the corresponding relation between the prestored temperature and the compensation value of the parameter influenced by the temperature, thus the wavelength value obtained by calculation after temperature compensation is more accurate and the influence of the temperature on the measurement result can be reduced.

In a possible implementation manner, the wavelength measuring device further includes a collimator, and the collimator is installed at the light inlet position of the wavelength measuring device.

According to the scheme shown in the embodiment of the application, the collimator can be an optical fiber collimator, laser to be detected generated by the laser enters the shell through the collimator, the luminous flux of the laser to be detected entering the wavelength measuring device can be increased, and light is stronger.

In one possible implementation, the rotating component is a micro-electromechanical system MEMS.

In the solution shown in the embodiment of the present application, the rotating component is a component capable of rotating, and for example, the rotating component may be a micro-electro-mechanical system (MEMS), and for example, the rotating component may also be a piezoelectric ceramic device. In this embodiment, the specific implementation structure of the rotating member is not limited, and the mirror can be rotated to adjust the incident angle into the etalon.

In another aspect, a method for wavelength measurement is provided, where the method is applied to the wavelength measurement apparatus described above, and the method includes: acquiring a target wavelength period of the laser to be detected in the transmissivity curve; determining the transmissivity of the laser to be detected through the etalon at each rotation angle according to the light intensity value output by the second detector and the light intensity value output by the first detector at each rotation angle in the plurality of rotation angles of the reflector; determining candidate wavelength values of the transmittance under the rotation angle, which correspond to the transmittance curve under the rotation angle and are positioned in the target wavelength period, under each rotation angle; and taking the candidate wavelength value close to the maximum slope of the transmissivity curve as the wavelength value of the laser to be measured in the plurality of candidate wavelength values.

According to the scheme shown in the embodiment of the application, the ratio of the light intensity value output by the first detector to the light intensity value output by the second detector can be used as the transmissivity of the laser to be detected in the etalon. At each corner, there is a transmission through the etalon and a transmission curve through the etalon, wherein the transmission curve is a periodic function of transmission with wavelength, such that the wavelength value is obtained by knowing the transmission curve and the transmission.

However, since the transmittance curve is a periodic function of sine and cosine, a plurality of wavelength values can be obtained by one transmittance. Then, the target wavelength period of the laser to be measured on the transmittance curve is screened, so that one transmittance corresponds to two wavelength values, and thus, 2m wavelength values can be obtained by m transmittances, and the 2m wavelength values can be called as candidate wavelength values. And then, taking the candidate wavelength value close to the maximum slope of the transmissivity curve as the wavelength value of the laser to be measured in the candidate wavelength values. Thus, from the maximum slope of the transmittance curve and whichever transmittance is used to calculate that the same laser light to be measured has only one wavelength value, one can be determined from a plurality of candidate wavelength values as the wavelength value of the laser light to be measured.

In one possible implementation, the method further includes: determining a calibration wavelength value corresponding to a transmittance peak value in the target wavelength period according to a transmittance curve obtained by injecting calibration laser into the etalon at a calibration rotation angle; determining the corresponding relation between the rotation angle and the wavelength according to the calibration rotation angle and the calibration wavelength value determined under the calibration rotation angle; determining the corresponding relation between the light intensity value of the laser to be detected and the rotation angle according to the light intensity value output by the first detector under each rotation angle of the laser to be detected; and determining the spectrogram of the laser to be detected according to the corresponding relation between the rotation angle and the wavelength and the corresponding relation between the light intensity value of the laser to be detected and the rotation angle.

According to the scheme shown in the embodiment of the application, the spectrogram is also the relation between the light intensity value and the wavelength or the frequency, the corresponding relation between the rotation angle and the light intensity value can be obtained by using the wavelength measuring device, and if the corresponding relation between the rotation angle and the wavelength of the wavelength measuring device can be calibrated in advance, the corresponding relation between the light intensity value and the wavelength can be obtained by using the corresponding relation between the rotation angle and the light intensity value of the laser to be measured and the calibrated corresponding relation between the rotation angle and the wavelength, and the spectrogram can be obtained.

In the embodiment of the application, the wavelength measuring device is provided with only one etalon, the occupied space of the etalon in the shell is small, and the occupied space of the rotating part, the detector and the light splitting part in the shell is also small, so that the wavelength measuring device is small in size compared with a wavelength meter with a built-in reference laser, the shock resistance of the small-size wavelength measuring device is good, and the accuracy of the measured wavelength value can be improved.

Drawings

Fig. 1 is a schematic structural diagram of a wavelength measurement device according to an embodiment of the present disclosure;

FIG. 2 is a schematic diagram of a transmittance curve provided by an embodiment of the present application;

fig. 3 is a schematic structural diagram of a wavelength measurement device according to an embodiment of the present disclosure;

FIG. 4 is a schematic flow chart of a method for wavelength measurement according to an embodiment of the present disclosure;

fig. 5 is a flowchart illustrating a method for wavelength measurement according to an embodiment of the present disclosure.

Description of the figures

1. The device comprises a shell 2, an etalon 3, a rotating component 4, a light splitting component 5, a detector 6, a reflecting mirror 7, a processing component 8, a filter 9, a temperature change resistant substrate 10, a thermistor 11, a light inlet 12, a collimator 51, a first detector 52, a second detector 53 and a third detector

Detailed Description

The embodiment of the application relates to a wavelength measuring device, which is used for measuring the wavelength value of laser, wherein the wavelength value or frequency value of the laser is an important optical parameter, and the dynamic and long-term stability of the wavelength is also an important index for evaluating the performance of the laser. The wavelength measuring device provided by the application can measure the wavelength value of the laser to be measured, can also obtain the spectrogram of the laser to be measured, can read out the wavelength value of the laser from the spectrogram, can determine whether the laser belongs to single wave or multi-wave, and can determine the central wavelength, the line width, the side mode and the like of the laser.

The laser to be measured may be generated by a laser or modulated in a later period, and the source of the laser to be measured is not limited in this embodiment. For measurement accuracy, the spectral bandwidth of the laser under test is typically within one wavelength period on the transmission curve of the etalon. If the laser to be detected is generated by the laser, the quality of the laser can be evaluated by the spectrogram after the spectrogram of the laser to be detected is obtained by the embodiment.

As shown in fig. 1, the wavelength measuring device may include an etalon 2, a rotating component 3, a beam splitting component 4, and a plurality of detectors 5, wherein: the light splitting component 4 is used for receiving the laser to be detected and splitting the laser to be detected into a plurality of light beams; the rotating component 3 is provided with a reflecting mirror 6, the reflecting mirror 6 is positioned on a light path where a first light beam (marked as figure 1) in the plurality of light beams is positioned, the etalon 2 is positioned on a reflecting light path of the reflecting mirror 6, a first detector 51 in the plurality of detectors 5 is positioned on a transmitting light path of the etalon 2, and a second detector 52 in the plurality of detectors 5 is positioned on a light path where a second light beam (marked as figure 1) in the plurality of light beams is positioned; a rotating member 3 for rotating the mirror 6 to obtain a plurality of transmittance curves of the etalon 2 at a plurality of rotation angles of the mirror, wherein the rotation angles correspond to the transmittance curves one-to-one; the rotating part 3 is further used for rotating the reflector 6 to enable the first detector 51 to output a plurality of light intensity values under a plurality of rotation angles of the reflector 6, wherein the rotation angles correspond to the light intensity values output by the first detector 51 one by one; the light intensity value output by the second detector 52, the plurality of light intensity values output by the first detector 51 and the plurality of transmittance curves are used for determining the wavelength value of the laser to be measured, wherein the light intensity value output by the second detector 52 is used as a reference light intensity value and is irrelevant to the rotation angle of the reflector 6.

The wavelength measuring device can further comprise a shell 1, and therefore the etalon 2, the rotating component 3, the light splitting component 4 and the detectors 5 are all installed in the shell 1, the shell 1 is provided with a light inlet 11, the light splitting component 4 can be located on an incident light path of the light inlet 11, and the light splitting component 4 can receive laser to be measured and divide the laser to be measured into a plurality of light beams.

The etalon 2 may also be referred to as an F-P etalon, which is a short term for a fabry-perot etalon and is an interferometer mainly composed of two parallel flat glass or quartz plates. For example, the etalon can be an air gap etalon, which is composed of two pieces of parallel glass with an air medium in the middle, the surfaces of the glass are coated, the reflectivity can be in a range of 50% -99% (but not limited to the range), and the etalon can also be other types of etalons.

The rotating member 3 is a member capable of rotating, and may be, for example, a micro-electro-mechanical system (MEMS), and the rotating member 3 may also be a piezoelectric ceramic device. In this embodiment, the specific implementation structure of the rotating member 3 is not limited, and the mirror 6 can be rotated to adjust the incident angle entering the etalon 2.

For example, during the rotation of the mirror 6 by the rotating member 3, the phase of the transmittance curve of the etalon changes, and the transmittance curve is shifted on the coordinate axis, for example, the range of the rotation angle of the mirror 6 can make the transmittance curve shift exactly one cycle, for example, the rotation angle of the mirror 6 of the rotating member 3 can be tuned within ± 0.7 degrees.

In order to obtain the rotation angle of the reflector 6, correspondingly, an angle sensor is further mounted on the rotating component 3, and the angle sensor can be fixed with the reflector 6. Thus, when the mirror 6 rotates, the rotation angle of the mirror 6 can be acquired by the angle sensor.

The light splitting component 4 is configured to split an incident beam into a plurality of light beams, and for example, may include at least one half-transmitting and half-reflecting beam splitter, or may also include at least one half-transmitting and half-reflecting light splitting prism, or may also include both a beam splitter and a light splitting prism, and the like.

The detector 5 is used to convert the received optical signal into an electrical signal, and may be, for example, a photodiode.

The light intensity value output by the first detector 51 and the light intensity value output by the second detector are used to calculate the transmittance of the laser light in the etalon 2, for example, the ratio of the light intensity value output by the first detector 51 to the light intensity value output by the second detector 52 is the transmittance of the laser light in the etalon 2.

As described above, the rotation angle of the reflecting mirror 6 corresponds to the transmittance curve one by one, the rotation angle of the reflecting mirror 6 also corresponds to the light intensity value output by the first detector 51 one by one, and the ratio of the light intensity value output by the first detector 51 to the light intensity value output by the second detector 52 is the transmittance of the laser light to be measured in the etalon 2, so that the light intensity value output by the first detector 51 corresponds to the transmittance of the laser light to be measured in the etalon 2 one by one, and therefore, it can be known that the rotation angle of the reflecting mirror 6 corresponds to the transmittance of the laser light to be measured in the etalon 2 one by one, so that under each rotation angle of the reflecting mirror 6, there is one transmittance curve and one transmittance.

The transmittance curve is a curve in which the transmittance changes with the wavelength, the transmittance curve belongs to a sine and cosine periodic function, and the target wavelength period is a wavelength range to which the laser to be measured belongs in the transmittance curve.

In one example, as shown in fig. 1, a light inlet 11 may be disposed at a side wall of the housing 1, and the laser emitted by the laser may enter the wavelength measuring device through the light inlet 11. The light splitting part 4 may be installed on an incident light path of the light inlet 11 in the housing 1, and is configured to receive light incident from the light inlet 11 and then divide a received light beam into a plurality of light beams, wherein the division of the light beam into the plurality of light beams by the light splitting part 4 is related to the number of parts for receiving laser light in the housing 1. For example, if two detectors 5 for receiving laser light are included in the housing 1, the light splitting part 11 may divide the laser light into two beams, and for example, if three detectors 5 for receiving laser light are included in the housing 1, the light splitting part 11 may divide the laser light into three beams.

As shown in fig. 1, the mirror 6 is attached to the rotary member 3, and when the rotary member 3 rotates, the mirror 6 also rotates. As shown in fig. 1, the reflecting mirror 6 may be positioned on an optical path (may be referred to as a first light flux) on which one of the plurality of light fluxes emitted from the spectroscopic member 4 is positioned in a positional relationship, and the incident angle of the first light flux incident on the reflecting mirror 6 may be changed because the reflecting mirror 6 can be rotated. As shown in fig. 1, the etalon 2 may be positioned in the reflected light path of the mirror 6, and one of the plurality of detectors 5 (which may be referred to as a first detector 51) may be positioned in the transmitted light path of the etalon 2.

The light intensity values output by the first detector 51 and the second detector 52 can be processed by a processing device electrically connected to the wavelength measuring device, or can be processed by the wavelength measuring device.

For example, when the laser is processed by a processing device electrically connected to the wavelength measuring device, the wavelength measuring device may be externally connected to a processing device, the wavelength measuring device is electrically connected to the processing device, and further, the signal collected by the detector 5 of the wavelength measuring device may be transmitted to the processing device, so that the processing device processes the signal to obtain the wavelength value of the laser to be measured.

For another example, in the case of processing by the wavelength measuring device, the wavelength measuring device may include a processing part 7, the processing part 7 is installed in the housing 1, and the processing part 7 is electrically connected to the rotating part 3 and the plurality of probes 5, respectively.

The processing unit 7 may determine, according to the light intensity value output by the second detector 52 and the light intensity value output by the first detector 51 at each of the plurality of rotation angles, the transmittance of the laser to be measured passing through the etalon 2 at each rotation angle; under each corner, the processing component 7 may determine a candidate wavelength value, corresponding to the transmittance at the corner on a transmittance curve at the corner, of the transmittance at the corner and located in a target wavelength period, where the target wavelength period is a wavelength period to which the laser to be measured belongs in the transmittance curve; among the plurality of candidate wavelength values, the processing section 7 may take a candidate wavelength value near the maximum slope of the transmittance curve as the wavelength value of the laser light to be measured.

The method for implementing the processing process is not limited in this embodiment, and the wavelength value of the laser to be measured may be obtained by calculating according to the light intensity values output by the first detector 51 and the second detector 52, which is convenient for describing the example of the processing component 7 that may be installed in the wavelength measurement device.

The specific principle of obtaining the wavelength value by the wavelength measuring device can be as follows:

in application, the transmittance of the etalon and the wavelength value of the laser have a relationship as shown in the following formula:

wherein I represents a transmittance, that is, a ratio of a light intensity value transmitted from the etalon to a light intensity value incident to the etalon; r represents the reflectivity of the etalon; n represents the refractive index of the etalon; l represents the cavity length of the etalon; theta represents an included angle between a light beam in the etalon and a normal line of an end face of the etalon; λ represents a wavelength value.

As is clear from the above equation, the transmittance curve is a periodic function in which the transmittance changes with the wavelength, and the phase of the transmittance curve can be changed by changing the incident angle, so that the transmittance curve is shifted left and right in a coordinate system in which the transmittance is plotted on the ordinate and the wavelength is plotted on the abscissa. The incident angle is related to the rotation angle of the mirror 6, and the incident angle of the laser beam to the etalon 2 can be adjusted by changing the rotation angle of the mirror 6, so that each rotation angle of the mirror 6 corresponds to one transmittance curve. Since the rotation angle changes, the light intensity value received by the first detector 51 also changes, so that each rotation angle of the mirror 6 also corresponds to the light intensity value of the output of one first detector 51.

And since the transmittance may be calculated by the ratio of the intensity value transmitted from the etalon to the intensity value incident to the etalon, the intensity value transmitted from the etalon may be determined by the intensity value output from the first detector 51. As shown in fig. 1, the second detector 52 of the plurality of detectors 5 is located on the light path where the second light beam of the plurality of light beams is located, and the light intensity value output by the second detector 52 can be used as the light intensity value incident to the etalon, so that the light intensity value output by the second detector 52 and the light intensity value output by the first detector 51 are used to calculate the transmittance of the laser in the etalon 2. For example, the transmission through an etalon I isWherein, P₁Is the light intensity value, P, output by the first detector 51₂Is the value of the light intensity output by the second detector 52.

Therefore, the rotation angle of the reflecting mirror 6 changes, the phase of the transmittance curve changes, and the light intensity value output by the first detector 51 also changes, so that at each rotation angle, the transmittance curve and the transmittance, hereinafter referred to as the transmittance corresponding to the transmittance curve, and the transmittance curve corresponding to the transmittance, refer to the transmittance curve and the transmittance calculated by the first detector 51 and the second detector 52 at the same rotation angle.

According to the above formula, the transmittance curve belongs to a periodic function of sine and cosine, so that one transmittance can obtain a plurality of wavelength values, and a plurality of transmittances can obtain a plurality of wavelength values, and in order to screen out one wavelength value from the plurality of wavelength values, the following method can be used:

firstly, the technician can estimate the transmission rate of the laser according to the estimated wavelength value of the laser to be measuredAnd performing a first round of screening on the target wavelength period belonging to the curve, wherein after the first round of screening, each transmittance corresponds to two wavelength values, so that 2m wavelength values can be obtained by m transmittances, and the 2m wavelength values can be called candidate wavelength values. For example, as shown in FIG. 2, FIG. 2 is a portion of a transmittance curve for transmittance I as a function of wavelength λ, a transmittance curve S₁And transmittance curve S₂All are local curves in the target wavelength period, and the abscissa of the intersection point 1, the intersection point 2, the intersection point 3 and the intersection point 4 are candidate wavelength values.

The estimated wavelength value of the laser to be measured may be a specific value, or may be a range of values, which is an approximate value or an approximate range value of the wavelength value of the laser to be measured. The skilled person can obtain this by means of a laser generating the laser light to be measured, or by adding filters and detectors to the wavelength measuring device, as will be described below.

Then, since the same laser has only one wavelength value, only one of the two wavelength values corresponding to each transmittance is correct, and the wavelength values corresponding to the plurality of transmittances should be close to each other, then, the wavelength values corresponding to each transmittance may be compared with the wavelength values corresponding to the other transmittances, respectively, and a second round of screening may be performed according to the difference, where the difference refers to an absolute value. For example, I_iObtaining lambda on the corresponding transmittance curve_i1And λ_i2，λ_i1Respectively with other than λ_i2Making difference between other wavelength values_i2Respectively with other than λ_i1Making difference for other wavelength values, and selecting the wavelength value (lambda) corresponding to the minimum difference from the difference values_i1Or λ_i2) As I_iCorresponding correct wavelength value. Thus, 2m wavelength values after the second round of screening may become m wavelength values, which are correct and may be referred to as correct wavelength values.

For example, as shown in FIG. 2, I₁The corresponding wavelength values are respectively the abscissa, I, of the intersection points 1 and 2₂With corresponding wavelength values being point of intersection 3 and point of intersection 4, respectivelyThe abscissa, the wavelength values are subtracted to screen out I₁Corresponding correct wavelength value, and I₂Corresponding correct wavelength value. For I₁Of the horizontal coordinate differences between the intersection 1 and the intersections 3 and 4, and between the intersection 2 and the intersections 3 and 4, it is obvious that the horizontal coordinate difference between the intersection 2 and the intersection 3 is the smallest, so I₁The corresponding correct wavelength value is the abscissa corresponding to the intersection point 2. Also for I₂Of the horizontal coordinate differences between the intersection 3 and the intersections 1 and 2, and between the intersection 4 and the intersections 1 and 2, respectively, it is obvious that the horizontal coordinate difference between the intersection 3 and the intersection 2 is the smallest, so I₂The corresponding correct wavelength value is the abscissa corresponding to the intersection point 3.

Then, since the rotation angle is changed, the transmittance curve is shifted in the coordinate system, and only the accuracy of the wavelength value can be changed, and the transmittance changes most sharply with the wavelength at the position with the maximum slope on the transmittance curve, and theoretically, the accuracy of the wavelength value calculated by using the transmittance at this position is higher, so that the accuracy is higher by using the value corresponding to the calculated transmittance on the transmittance curve as the wavelength value, and therefore, a third round of screening can be performed on the basis of the second round of screening by using the slope of the transmittance curve, and a wavelength value can be obtained as the wavelength value of the laser to be measured, and the accuracy of the obtained wavelength value is higher.

For example, as shown in FIG. 2, at I₁Corresponding wavelength values (abscissa of intersection 2) and I₂In the corresponding wavelength value (abscissa of intersection 3), I₂The slope on the corresponding transmittance curve is greater than I₁Slope on the corresponding transmittance curve, so I₂The corresponding wavelength value can be regarded as a wavelength value closest to the maximum slope on the transmittance curve, and can be used as the wavelength value of the laser to be measured.

Based on the above, when using the wavelength measuring device to determine the wavelength value of the laser light to be measured, the skilled person can first pass the period (which can be recorded as the target wavelength period) of the laser light to be measured in the transmittance curve. Then, by the obtained transmittance curve and the transmittances obtained by the first detector 51 and the second detector 52 at each rotation angle of the mirror 6, the wavelength values corresponding to each transmittance on the corresponding transmittance curve and located within the target wavelength period can be obtained, and these wavelength values can be referred to as candidate wavelength values. Then, according to the principle that the wavelength values corresponding to the plurality of transmittances should be close to each other and the principle that the wavelength value at the position with the maximum slope on the transmittance curve is the most accurate, one wavelength value can be screened out from the candidate wavelength values to serve as the wavelength value of the laser to be measured.

For example, according to the principle that the wavelength values corresponding to a plurality of transmittances should be close to each other, the correct wavelength value corresponding to each transmittance may be screened from the candidate wavelength values by using the magnitude of the difference between each wavelength value corresponding to each transmittance and the wavelength values corresponding to other transmittances as the screening condition. And then according to the above, the wavelength value at the maximum slope on the transmittance curve is most accurate, and the target correct wavelength value closest to the maximum slope on the transmittance curve can be selected from the multiple correct wavelength values, and the target correct wavelength value is used as the wavelength value of the laser to be measured.

Alternatively, after the candidate wavelength value is obtained, the transmittance corresponding to the maximum slope may be selected according to the principle that the accuracy of the wavelength value corresponding to the maximum slope is the highest, and the correct wavelength value may be selected from the two wavelength values corresponding to the transmittance according to the principle that the wavelength values corresponding to the plurality of transmittances should be close to each other, and used as the wavelength value of the laser to be measured.

In this embodiment, the specific execution sequence for screening out one wavelength value from the candidate wavelength values as the wavelength value of the laser to be measured is not limited, and technicians can flexibly select the wavelength value according to actual conditions.

For example, as shown in FIG. 2, where FIG. 2 is a portion of a transmittance curve with transmittance I as a function of wavelength λ, the rotation angle β₁The transmittance curve S is obtained₁And a transmittance I₁Angle of rotation beta₂The transmittance curve S is obtained₂And a transmittance I₂Wherein S is₁And S₂Are all the transmittance curves in the target wavelength period, and accordingly, can be based on the target periodThe transmittance curve and transmittance within the period calculate wavelength values, which may be referred to as candidate wavelength values, that is, the wavelength values corresponding to the intersection points 1 to 4 are all candidate wavelength values. Then, the correct wavelength value is selected from the candidate wavelength values, wherein I₁At S₁The corresponding correct wavelength value is the abscissa, I, corresponding to the intersection point 2₂At S₂The correct wavelength value corresponds to the abscissa corresponding to the intersection 3, and therefore, the abscissas corresponding to the intersections 2 and 3 are both correct wavelength values. And then selecting a correct wavelength value closest to the maximum slope of the transmissivity curve from the plurality of correct wavelength values as the wavelength value of the laser to be measured. As shown in FIG. 2, intersection 3 is at S₂The upper corresponding slope is greater than the intersection point 2 at S₂And the corresponding slope, namely the correct wavelength value corresponding to the intersection point 3 can be regarded as a wavelength value closest to the maximum slope on the transmittance curve, and can be used as the wavelength value of the laser to be measured.

The wavelength measuring device is provided with only one etalon, the occupied space of the etalon in the shell is small, and the occupied spaces of the rotating part, the detector and the light splitting part in the shell are also small, so that the wavelength measuring device is small in size and good in shock resistance compared with a wavelength meter with a built-in reference laser, and the accuracy of a measured wavelength value can be improved.

Moreover, the wavelength measuring device drives the reflector to rotate through the rotating part, so that the incident angle entering the etalon can be adjusted to obtain a plurality of transmittance curves, and then the wavelength value obtained at the position closest to the maximum slope of the transmittance curve is used as the wavelength value of the laser to be measured, so that the accuracy of the obtained wavelength value is higher, and the wavelength value measured by the wavelength measuring device is more accurate.

In addition, a spectrogram can be obtained by using the wavelength measuring device, and after the spectrogram is obtained, more information can be read out from the spectrogram by a technician. For example, the wavelength value of the laser to be measured can be read out through the spectrogram, whether the laser to be measured belongs to single wave or multi-wave is judged, each wavelength value can be read out if the laser to be measured belongs to multi-wave, the side mode value of the laser to be measured can be read out through the spectrogram, the line width of the laser to be measured and the like are also read out, the quality of the laser emitted by the laser to be measured can be judged through the read information, and the like, so that the application universality of the wavelength measuring device is improved.

The process of obtaining a spectrogram by the wavelength measurement device may be as follows, which may be performed by the processing component 7: the processing component 7 can enter the etalon 2 under each of the plurality of calibration rotation angles according to the plurality of calibration lasers to obtain a transmittance curve under each calibration rotation angle; determining a calibration wavelength value corresponding to a transmittance peak value in a target wavelength period according to the transmittance curve under each calibration corner, wherein the calibration corners correspond to the calibration wavelength values one to one; determining the corresponding relation between the rotation angle and the wavelength according to each calibration rotation angle and the corresponding calibration wavelength value; determining the corresponding relation between the light intensity value of the laser to be detected and the rotation angle according to the light intensity value output by the first detector 51 under each rotation angle of the laser to be detected; and determining the spectrogram of the laser to be detected according to the corresponding relation between the rotation angle and the wavelength and the corresponding relation between the light intensity value of the laser to be detected and the rotation angle.

In an example, the spectrogram is a relationship between a light intensity value and a wavelength or a frequency, a corresponding relationship between a rotation angle and the light intensity value can be obtained by using the wavelength measuring device, and if the corresponding relationship between the rotation angle and the wavelength of the wavelength measuring device can be calibrated in advance, the corresponding relationship between the light intensity value and the light intensity value of the laser to be measured and the corresponding relationship between the calibrated rotation angle and the wavelength can be obtained, that is, the spectrogram is obtained.

The process of calibrating the corresponding relationship between the rotation angle and the wavelength may be as follows:

first, a plurality of rotation angles may be selected, and the relationship between the rotation angles and the wavelengths may be referred to as calibration rotation angles, for example, calibration rotation angle 1, calibration rotation angle 2, and calibration rotation angle 3, wherein the greater the number of the selected calibration rotation angles, the higher the accuracy of the relationship between the calibration rotation angles and the wavelengths, and those skilled in the art may flexibly select the number of the calibration rotation angles according to requirements, and for convenience of description, three calibration rotation angles are used for example.

Then, a plurality of lasers on the transmittance curve may be selected, or all lasers on the transmittance curve may be selected, and these lasers are used to enter the etalon to generate the transmittance curve, and these lasers may be referred to as calibration lasers, for example, calibration laser 1, calibration laser 2, and calibration laser 3, where the greater the number of selected calibration lasers, the higher the accuracy of the transmittance curve at each calibration rotation angle is, and the higher the accuracy of the relationship between the obtained rotation angle and the wavelength is, and those skilled in the art may flexibly select the number of calibration lasers according to requirements, and for convenience of description, an example is performed by using three calibration lasers.

Then, when the rotation angle of the reflector 6 is at the calibration rotation angle 1, the calibration laser 2, and the calibration laser 3 are respectively incident to the wavelength measuring device to obtain the transmittance curve 1 of the etalon 2 corresponding to the calibration rotation angle 1, and the wavelength value corresponding to the peak within the target wavelength period is determined in the transmittance curve 1 and is recorded as the calibration wavelength value 1, so that a group (calibration rotation angle 1, calibration wavelength value 1) can be obtained. Similarly, the rotation angle of the reflector 6 is adjusted by the rotating component, so that the rotation angle of the reflector 6 is a calibration rotation angle 2, under the calibration rotation angle 2, the calibration laser 1, the calibration laser 2 and the calibration laser 3 are respectively incident to the wavelength measuring device, so as to obtain a transmittance curve 2 of the etalon 2 corresponding to the calibration rotation angle 2, a wavelength value corresponding to a peak within a target wavelength period is determined in the transmittance curve 2, and the wavelength value is recorded as the calibration wavelength value 2, so that a group (the calibration rotation angle 2 and the calibration wavelength value 2) can be obtained. And adjusting the rotation angle of the reflector 6 through the rotating part 3 again to enable the rotation angle of the reflector 6 to be a calibration rotation angle 3, respectively enabling the calibration laser 1, the calibration laser 2 and the calibration laser 3 to be incident to the wavelength measuring device under the calibration rotation angle 3 to obtain a transmissivity curve 3 of the etalon 2 corresponding to the calibration rotation angle 3, determining a wavelength value corresponding to a peak in a target wavelength period in the transmissivity curve 3, and marking the wavelength value as the calibration wavelength value 3 so as to obtain a group (the calibration rotation angle 3 and the calibration wavelength value 3). Thus, after obtaining multiple sets (calibration rotation angles, calibration wavelength values) under multiple calibration rotation angles, the corresponding relationship between the rotation angles and the wavelengths can be obtained through the multiple sets (calibration rotation angles, calibration wavelength values).

The calibration wavelength value is a wavelength value corresponding to a peak on the transmittance curve, and may be referred to as a center wavelength value.

Then, the laser to be measured enters the wavelength measuring device, the rotating part 3 drives the reflector 6 to rotate, the first detector 51 outputs a light intensity value under each corner, and the corresponding relation between the light intensity value and the corner can be obtained. Therefore, the corresponding relation between the light intensity value and the wavelength is converted according to the calibrated corresponding relation between the rotation angle and the wavelength and the corresponding relation between the light intensity value and the rotation angle, wherein the corresponding relation between the light intensity value and the wavelength is the spectrogram of the laser to be measured.

After the spectrogram of the laser to be detected is obtained, not only can the wavelength value of the laser to be detected be read from the spectrogram, but also whether the laser to be detected belongs to a single wave or a multi-wave can be judged, and the central wavelength, the side mode and the line width of the laser to be detected can be read, wherein the central wavelength is the wavelength value corresponding to the peak position in the spectrogram, and the side mode is the wavelength value corresponding to the peak position in the spectrogram. If the side modes in the spectrogram are few, the quality of the laser generated by the laser is good, and the wavelength measuring device can evaluate the quality of the laser generated by the laser through the spectrogram. Therefore, the wavelength measuring device has wider application.

The target wavelength cycle of the laser to be detected on the transmittance curve can be determined by an estimated wavelength value of the laser to be detected, wherein the estimated wavelength value can be obtained by a laser generating the laser to be detected, and can also be calculated by a filter and a detector, and the corresponding implementation structure can be as follows:

as shown in fig. 3, the wavelength measuring device further includes a filter 8, the filter 8 is installed in the housing 1, and the filter 8 is located on an optical path where a third light beam (marked (c) in fig. 3) among the plurality of light beams is located; the third detector 53 of the plurality of detectors 5 is located on the transmission light path of the filter 8, and the light intensity value output by the third detector 53 is used for determining the estimated wavelength value of the laser to be measured with the light intensity value output by the second detector 52, so as to determine the target wavelength period of the laser to be measured in the transmittance curve.

The filter 8 may be a linear filter, or may be a surface-coated glass sheet, and the transmittance of the filter is in a linear relationship or an approximately linear relationship with the wavelength of the incident light.

The third detector 53, similar to the first detector 51 and the second detector 52, may also be a photodiode, and is used for converting the received optical signal into an electrical signal.

In practice, the filter 8 is located on the optical path of the third light beam generated by the splitting means 4 by the third detector 53, the third detector 53 is located on the optical path of the transmission of the filter 8, and the second detector 52 is located on the optical path of the second light beam generated by the splitting means 4. In this way, the laser to be measured directly enters the second detector 52 without passing through any object, the light intensity value output by the second detector 52 may be referred to as a reference light intensity value, the laser to be measured enters the third detector 53 through the filter 8, the light intensity value output by the third detector 53 is the light intensity value absorbed by the filter 8, and accordingly, the ratio between the light intensity value output by the third detector 53 and the light intensity value output by the second detector 52 may be used as the transmittance of the laser to be measured through the filter 8. Then, according to the correspondence between the transmittance and the wavelength of the filter 8, a wavelength value corresponding to the calculated transmittance can be obtained, and the wavelength value can be used as an estimated wavelength value of the laser to be measured.

For example, the processing unit 7 of the wavelength measuring device is electrically connected to the third detector 53, and the processing unit 7 receives the light intensity value P of the second detector 52₂And the light intensity value P of the third detector 53₃Then, the transmittance I of the laser to be measured passing through the filter 8 can be obtained asThe processing means 7 in turn depend on the transmittance versus wavelength of the filter 8According to the relation, the wavelength value corresponding to the calculated transmissivity can be obtained, and the wavelength value can be used as the estimated wavelength value of the laser to be measured.

After the estimated wavelength value is determined in the above manner, the target wavelength period to which the estimated wavelength value belongs can be determined according to the position of the estimated wavelength value on the transmittance curve.

In a possible application, the wavelength measuring device is located in a large environment temperature change, for example, the environment temperature in summer is high, the environment temperature in winter is low, and the environment temperature in different areas is different, so as to avoid the deformation of the components in the housing 1 due to the environment temperature change, correspondingly, as shown in fig. 1 and 3, the wavelength measuring device may further include a temperature-resistant substrate 9, the temperature-resistant substrate 9 is installed in the housing 1, and the etalon 2, the rotating member 3, the light splitting member 4, the processing member 7, the filter 8 and the plurality of detectors 5 are all installed on the temperature-resistant substrate 9. The temperature change resistant substrate 9 may be made of a ceramic material. Thus, the temperature change resistant substrate 9 has a characteristic of being non-deformable at high temperature, and can improve the stability of components mounted thereon, so that the wavelength measuring device has high stability, and the accuracy of measuring a wavelength value can be improved.

In one possible application, in order to further improve the accuracy of the wavelength measurement, the wavelength measuring device further includes a thermistor 10, and the thermistor 10 is mounted in the housing 1, for example, the thermistor 10 may be mounted on the inner wall of the housing 1 for monitoring the temperature change in the housing 1 in real time. In the electrical connection, the thermistor 10 is electrically connected to the processing component 7, and is configured to send the monitored temperature data to the processing component 7, so that the processing component 7 determines the compensation value of the parameter according to the correspondence between the pre-stored temperature and the compensation value of the parameter affected by the temperature, and thus the wavelength value calculated after the temperature compensation is more accurate, and the influence of the temperature on the measurement result can be reduced.

In one possible application, in order to increase the light flux of the laser light to be measured into the wavelength measuring device, the wavelength measuring device may further include a collimator 12, as shown in fig. 1 and 3, and the collimator 12 is installed on the outer wall of the housing 1 at a position corresponding to the light inlet 11. Wherein the collimator 12 may be a fiber collimator. Therefore, laser to be measured generated by the laser enters the shell 1 through the collimator 12, the luminous flux of the laser to be measured entering the wavelength measuring device can be improved, and the light is stronger.

Based on the above, as shown in fig. 3, the wavelength measuring device may include a housing 1, an etalon 2, a rotating component 3, a light splitting component 4, and a plurality of detectors 5, for example, three detectors, wherein the light splitting component 4 may include at least one beam splitter, for example, two beam splitters, and the above components are located in the housing 1 and mounted on the temperature-resistant substrate 9. The inner wall of the shell 1 is also provided with a thermistor 10, the shell 1 is provided with a light inlet 11, and the outer wall of the shell 1 is provided with a collimator 12 at a position corresponding to the light inlet 11.

In the positional relationship of the above components, as shown in fig. 3, the first beam splitter of the spectroscopic component 4 is located on the incident light path of the light inlet 11, the second beam splitter of the spectroscopic component 4 is located on the reflected light path of the first beam splitter, and the reflector 6 of the rotary component 3 is located on the transmitted light path of the second beam splitter. The filter 8 is located on the transmission path of the first beam splitter, the third detector 53 is located on the transmission path of the filter 8, and the second detector 52 is located on the reflection path of the second beam splitter. The etalon 2 is positioned in the reflection optical path of the mirror 6 and the first detector 52 is positioned in the transmission optical path of the etalon 2.

Based on the structure, the wavelength measuring device can measure the wavelength value of the laser to be measured and can also obtain the spectrogram of the laser to be measured, wherein the process of measuring the wavelength value of the laser to be measured can be as follows:

first, the estimated wavelength value of the laser to be measured can be obtained through the light intensity values output by the second detector 52 and the third detector 53 and the corresponding relationship between the transmittance and the wavelength of the filter 8. For example, the ratio of the light intensity value output by the third detector 53 to the light intensity value output by the second detector 52 obtains the transmittance of the laser to be measured through the filter 8, and then determines the estimated wavelength value of the laser to be measured according to the corresponding relationship between the transmittance and the wavelength of the filter 8. Then, the target wavelength period of the wavelength of the laser to be measured on the transmissivity curve can be estimated through the estimated wavelength value of the laser to be measured.

Then, the rotating part 3 drives the reflector 6 to rotate, a light intensity value output by the first detector 51 can be obtained at each rotation angle of the reflector 6, the transmittance of the laser to be measured through the etalon can be obtained through the light intensity value output by the first detector 51 and the light intensity value output by the second detector 52, and a transmittance curve is also corresponding to each rotation angle. Thus, at each corner, a transmittance through the etalon and a transmittance curve can be obtained, e.g., as shown in FIG. 2, at the corner β₁Corresponding to the transmittance curve S₁And calculating the transmittance I through the light intensity value₁Angle of rotation beta₂Corresponding to the transmittance curve S₂And calculating the transmittance I through the light intensity value₂。

Then, at each rotation angle of the mirror 6, on a transmittance curve having a wavelength as an abscissa and a transmittance as an ordinate, an intersection point of the transmittance and the corresponding transmittance curve in the target wavelength cycle can be obtained. And obtaining a plurality of intersection points under a plurality of rotation angles, then selecting the intersection point which is closest to the maximum slope of the transmissivity curve and is the correct wavelength value of the corresponding transmissivity from the plurality of intersection points, wherein the wavelength value at the intersection point can be used as the wavelength value of the laser to be detected.

The above is the process of calculating the wavelength value by using the wavelength measuring device, and the wavelength measuring device can also be used to obtain the spectrogram of the laser to be measured, which can refer to the following:

firstly, a plurality of calibration rotation angles and a plurality of calibration lasers are selected, the plurality of calibration lasers are injected into the etalon 2 under one calibration rotation angle to obtain a transmissivity curve under the calibration rotation angle, the wavelength values corresponding to the wave crests in the target wavelength period on the transmissivity curve are recorded, the wavelength values can be recorded as calibration wavelength values, and a group of calibration rotation angles and calibration wavelength values is obtained. It can be seen that multiple sets of calibration rotation angles (calibration rotation angles, calibration wavelength values) can be obtained. The corresponding relation between the rotation angle and the wavelength can be obtained through the multiple groups (calibrating the rotation angle and calibrating the wavelength value).

Then, the laser to be measured enters the wavelength measuring device, and the first detector 51 can output a light intensity value under each rotation angle in the rotation process of the reflector 6, so that the corresponding relation between the light intensity value and the rotation angle can be obtained.

Then, the corresponding relation between the light intensity value and the wavelength of the laser to be measured, that is, the spectrogram of the laser to be measured, can be obtained through the corresponding relation between the light intensity value and the rotation angle of the laser to be measured and the corresponding relation between the pre-calibrated wavelength and the rotation angle.

After the spectrogram is obtained by the wavelength measuring device, the wavelength value of the laser to be measured can be read out, the line width of the laser to be measured can be read out, whether the laser to be measured belongs to single wave or multi-wave can be judged, the quality of the laser to be measured can be evaluated, and the like, and the wavelength measuring device is wide in application.

In the embodiment of the application, the wavelength measuring device is provided with only one etalon, the occupied space of the etalon in the shell is small, and the occupied space of the rotating part, the detector and the light splitting part in the shell is also small, so that the wavelength measuring device is small in size and good in shock resistance compared with a wavelength meter with a built-in reference laser, and the accuracy of a measured wavelength value can be improved.

The present application further provides a method for wavelength measurement, which can be applied to the above-mentioned wavelength measurement apparatus, and the method can be executed by a processing device electrically connected to the wavelength measurement apparatus, and also can be executed by a processing component of the wavelength measurement apparatus, where the execution subject is not limited in this embodiment, and can be exemplified by the processing component of the wavelength measurement apparatus, as shown in fig. 4, the method can be executed according to the following procedures:

in step 401, a target wavelength period of the laser to be measured in the transmittance curve of the etalon 2 is obtained.

The transmittance curve, i.e. the functional relationship between transmittance and wavelength or frequency, can be determined according to the above formula.

In an example, the processing component may first obtain an estimated wavelength value of the laser to be detected, and then determine the target wavelength period according to the estimated wavelength value, where the estimated wavelength value may be obtained by a laser that generates the laser to be detected, or may be calculated by light intensity values output by the third detector 53 and the second detector 52, which may be referred to above, and details are not described here any more.

In step 402, the transmittance of the laser to be measured passing through the etalon at each rotation angle is determined according to the light intensity value output by the second detector and the light intensity value output by the first detector at each rotation angle of the plurality of rotation angles of the reflecting mirror.

In one example, the transmittance through the etalon may be calculated by the intensity value output by the first detector 51 and the intensity value output by the second detector 52, e.g., the transmittance through the etalon 2 is the ratio of the intensity value output by the first detector 51 to the intensity value output by the second detector 52 at each rotation angle. Since the rotation angle changes, the intensity value of the light output from the first detector 51 changes, and therefore the rotation angle changes, and the transmittance through the etalon 2 also changes, each rotation angle corresponds to one transmittance, and the rotation angles correspond to the transmittances through the etalon one to one.

In step 403, at each corner, candidate wavelength values of the transmittance at the corner corresponding to the transmittance curve at the corner and located within the target wavelength period are determined.

In one example, the transmission I through the etalon 2 is as shown in fig. 2₁And transmittance curve S₁Is obtained at a certain rotation angle, and has a transmittance I through the etalon 2₂And transmittance curve S₂The wavelength values corresponding to the intersection points 1 to 4 are all candidate wavelength values obtained under another corner.

In step 404, the candidate wavelength value near the maximum slope of the transmittance curve among the plurality of candidate wavelength values is used as the wavelength value of the laser light to be measured.

In one example, the obtained wavelength values should be close to each other according to whichever transmittance calculation is used, and the intersection point 3 is located at a position close to the intersection point at the maximum slope of the transmittance curve, so that the wavelength value corresponding to the intersection point 3 can be used as the wavelength value of the laser light to be measured.

As described above, the wavelength measuring device can also obtain a spectrogram of the laser to be measured, and accordingly, as shown in fig. 5, the obtaining of the spectrogram by the wavelength measuring device can be performed according to the following process:

in step 501, a plurality of calibration lasers are incident into the etalon at each of a plurality of calibration rotation angles to obtain a transmittance curve at each calibration rotation angle.

In one example, a transmittance curve may be obtained by injecting a plurality of calibration lasers into the etalon at a calibration rotation angle, and then a transmittance curve may be obtained by injecting a plurality of calibration lasers into the etalon at a plurality of calibration rotation angles, where the calibration rotation angles correspond to the transmittance curves one to one.

In step 502, according to the transmittance curve at each calibration rotation angle, a calibration wavelength value corresponding to the transmittance peak value in the target wavelength period is determined.

And the calibration rotation angles correspond to the calibration wavelength values one to one.

In one example, for each calibration angle, the corresponding wavelength value at the peak within the target wavelength period on the transmittance curve is recorded, and the wavelength value may be referred to as a calibration wavelength value, so that a set (calibration angle, calibration wavelength value) can be obtained. Similarly, under a plurality of calibration rotation angles, a plurality of groups (calibration rotation angles, calibration wavelength values) can be obtained.

In step 503, the corresponding relationship between the rotation angle and the wavelength is determined according to each calibration rotation angle and the corresponding calibration wavelength value.

In one example, the corresponding relationship between the rotation angle and the wavelength can be generated by a plurality of sets (calibration rotation angle, calibration wavelength value), wherein the more the number of the sets (calibration rotation angle, calibration wavelength value), the more accurate the corresponding relationship between the rotation angle and the wavelength is.

In step 504, the corresponding relationship between the light intensity value of the laser to be measured and the rotation angle is determined according to the light intensity value output by the first detector when the laser to be measured is at each rotation angle.

In one example, the laser to be measured is incident into the wavelength measuring device, and by rotating the reflecting mirror 6, the light intensity values output by the first detector 51 at a series of rotation angles can be obtained, so as to obtain the corresponding relationship between the light intensity values and the rotation angles.

In step 505, a spectrogram of the laser to be measured is determined according to the corresponding relationship between the rotation angle and the wavelength and the corresponding relationship between the light intensity value of the laser to be measured and the rotation angle.

In one example, the correspondence between the light intensity value and the wavelength, that is, the spectrogram of the laser to be measured, can be generated according to the correspondence between the light intensity value and the rotation angle of the laser to be measured and the correspondence between the rotation angle and the wavelength specified in step 503.

The application scenario for generating the spectrogram of the laser to be detected is described above, and reference may be made to the above description, which is not repeated here.

In the embodiment of the application, the wavelength measuring device is provided with only one etalon, the occupied space of the etalon in the shell is small, and the occupied space of the rotating part, the detector and the light splitting part in the shell is also small, so that the wavelength measuring device is small in size and good in shock resistance compared with a wavelength meter with a built-in reference laser, and the accuracy of a measured wavelength value can be improved.

The above description is only one embodiment of the present application and should not be taken as limiting the present application, and any modifications, equivalents, improvements, etc. made within the spirit and principle of the present application should be included in the protection scope of the present application.