阅读说明：本技术 磁纳米粒子成像系统矩阵测量的栅格状探测板及测量方法 (Grid-shaped detection plate for magnetic nanoparticle imaging system matrix measurement and measurement method ) 是由 田捷 张鹏 惠辉 李怡濛 杨鑫 于 2021-07-08 设计创作，主要内容包括：本发明属于磁纳米粒子成像中的系统矩阵测定技术领域,具体涉及了一种磁纳米粒子成像系统矩阵测量的栅格状探测板及测量方法,旨在解决现有技术无法简单快速地测量磁纳米粒子成像中的系统矩阵的问题。本发明包括：根据磁纳米粒子成像系统分辨率调整隔离板；获得设定数量的呈栅格状排列的凹状正方形晶格构成的栅格状探测板；基于系统矩阵本身的特性以及系统矩阵与感应线圈中的电压信号的关系,通过探测板逐渐增加测量范围；将探测板各正方形晶格对应的列值按照晶格位置进行拼接,获得最终的磁纳米粒子成像的系统矩阵。本发明实现了磁纳米粒子成像的系统矩阵的快速测量和校准,分辨率灵活可调,适配多种磁纳米粒子成像系统,降低成本、提高效率。(The invention belongs to the technical field of system matrix determination in magnetic nanoparticle imaging, and particularly relates to a grid-shaped detection plate for magnetic nanoparticle imaging system matrix measurement and a measurement method, aiming at solving the problem that the system matrix in magnetic nanoparticle imaging cannot be simply and rapidly measured in the prior art. The invention comprises the following steps: adjusting the isolation plate according to the resolution of the magnetic nanoparticle imaging system; obtaining a grid-shaped detection plate consisting of a set number of concave square lattices arranged in a grid shape; gradually increasing the measurement range through a detection plate based on the characteristics of the system matrix and the relation between the system matrix and the voltage signal in the induction coil; and splicing column values corresponding to square lattices of the detection plate according to lattice positions to obtain a final magnetic nanoparticle imaging system matrix. The invention realizes the rapid measurement and calibration of the system matrix of magnetic nanoparticle imaging, has flexible and adjustable resolution, is suitable for various magnetic nanoparticle imaging systems, reduces the cost and improves the efficiency.)

1. A grid-like probe plate for matrix measurements in a magnetic nanoparticle imaging system, the grid-like probe plate comprising:

setting a number of concave square lattices which are arranged in a grid shape;

the top of the square lattice is open.

2. The grid-shaped probe plate for matrix measurements of a magnetic nanoparticle imaging system according to claim 1, wherein the square lattices are isolated from each other by using a material identical to that of the square lattices as an isolation plate.

3. A grid-like probe plate for magnetic nanoparticle imaging system matrix measurements according to claim 2, wherein the spacer plate is a removable insert plate.

4. A grid-like probe plate for magnetic nanoparticle imaging system matrix measurements according to claim 2, wherein the material is a resin.

5. The grid-shaped detection plate for matrix measurements of a magnetic nanoparticle imaging system according to claim 1, wherein the square lattice has edges that are no higher than the edges of the grid-shaped detection plate.

6. The grid-shaped detection plate for matrix measurements of a magnetic nanoparticle imaging system according to claim 1, wherein the size of the grid-shaped detection plate is scaled up to a predetermined scale centered at the center of the imaging range of the magnetic nanoparticle imaging system.

7. A grid-like detection plate for matrix measurements by a magnetic nanoparticle imaging system according to claim 1, wherein the size of the square lattice is the same as the pixel size of the imaging resolution of the magnetic nanoparticle imaging system.

8. A method for measuring a grid-shaped probe plate for matrix measurement of a magnetic nanoparticle imaging system, the method being based on the grid-shaped probe plate for matrix measurement of a magnetic nanoparticle imaging system according to any one of claims 1 to 7, the method comprising:

step S10, adjusting the isolation plate according to the resolution of the magnetic nanoparticle imaging system, and placing the adjusted detection plate into the imaging space of the magnetic nanoparticle imaging system and adjusting the position, so that the imaging plane is parallel to the detection plate and passes through the crystal lattice; taking the square lattice at the upper left corner in the detection plate as an initial lattice, and performing grid scanning on each square lattice according to a snake shape to enable t to be 1 as the current square lattice;

step S20, injecting tracer SPIO solution with standard concentration into the current square lattice t; the liquid level position of the tracer SPIO solution is higher than the imaging plane, and no solution overflows to other square lattices;

step S30, carrying out a complete MPI scan, and subtracting all previous voltage signal values from the voltage signal value obtained by scanning to obtain the current voltage signal;

step S40, filtering and denoising the current voltage signal to obtain an available system matrix;

step S50, solving through inverse operation according to the current voltage signal and the concentration of the tracer SPIO solution to obtain a column value of a system matrix corresponding to the current square lattice t;

step S60, let t be t +1, and go to step S20 until the value of t is the set number of square lattices, and obtain the column value of the system matrix corresponding to each square lattice;

and step S70, splicing the column values of the system matrix corresponding to each square lattice according to the positions of the square lattices to obtain the system matrix of the magnetic nanoparticle imaging system.

9. An apparatus, comprising:

at least one processor; and

a memory communicatively coupled to at least one of the processors; wherein the content of the first and second substances,

the memory stores instructions executable by the processor for performing a method of measuring a grid-like probe plate for matrix measurements by a magnetic nanoparticle imaging system as claimed in claim 8.

10. A computer readable storage medium storing computer instructions for execution by the computer to perform the method of measuring a grid-like probe plate for magnetic nanoparticle imaging system matrix measurements of claim 8.

Technical Field

The invention belongs to the technical field of system matrix measurement in magnetic nanoparticle imaging equipment, and particularly relates to a grid-shaped detection plate for magnetic nanoparticle imaging system matrix measurement and a measurement method.

Background

How to accurately and objectively locate tumors and other lesions in clinical diagnosis and detection has been an international research hotspot and challenging problem. The existing medical imaging technologies such as CT, MRI, SPECT and the like have the problems of great harm, poor positioning, low precision and the like. In recent years, a brand new tracer-based Imaging mode, namely Magnetic nanoparticle Imaging (MPI) technology, is proposed. The technology can accurately position an imaging target by detecting the spatial concentration distribution of superparamagnetic iron oxide nanoparticles (SPIONs). Compared with the traditional imaging method, the MPI technology has the characteristics of high space-time resolution and high sensitivity while being not limited by the imaging depth, and has great medical application potential.

The reconstruction methods of the MPI system today can be basically divided into two categories: a system matrix method and an X-space method. Compared with a system matrix reconstruction method, the X-space method has higher reconstruction speed, but the resolution of a reconstructed image is difficult to improve, so that the system matrix method is always the main research direction of image reconstruction. The system matrix determination in the system matrix reconstruction method is always an important subject, and the accuracy and precision of the measurement directly affect the reconstruction result of the image. Meanwhile, in order to ensure that the system matrix at any point in the space is determined, the currently accepted system matrix measuring method is to move the magnetic nanoparticle probe one by one through a mechanical arm so as to accurately cover all positions in the space, thereby obtaining an accurate and comprehensive system matrix. However, the method requires extremely high cost, and the design of the movement track and the precision control of the mechanical arm are also challenging and not universal.

Therefore, how to simply and quickly measure the system matrix in a magnetic nanoparticle imaging device has always been a challenging problem.

Disclosure of Invention

In order to solve the above-mentioned problems of the prior art, i.e., the problem that the prior art cannot simply and rapidly measure the system matrix in the magnetic nanoparticle imaging apparatus, the present invention provides a grid-shaped probe plate for magnetic nanoparticle imaging system matrix measurement, the grid-shaped probe plate comprising:

setting a number of concave square lattices which are arranged in a grid shape;

the top of the square lattice is open.

In some preferred embodiments, the square lattices are isolated from each other by using a material which is the same as the material of the square lattices as an isolating plate.

In some preferred embodiments, the isolation plate is an insertion plate which can be freely disassembled and assembled.

In some preferred embodiments, the material is a resin.

In some preferred embodiments, the square lattice has edges that are no higher than the edges of the grid-like probe plate.

In some preferred embodiments, the grid-like detection plate is sized for a set up scale magnification centered at the center of the imaging range of the magnetic nanoparticle imaging system.

In some preferred embodiments, the size of the square lattice is the same as the pixel size of the imaging resolution of the magnetic nanoparticle imaging system.

In another aspect of the present invention, a method for measuring a grid-shaped probe plate for matrix measurement of a magnetic nanoparticle imaging system is provided, based on the grid-shaped probe plate for matrix measurement of the magnetic nanoparticle imaging system, the method includes:

step S10, adjusting the isolation plate according to the resolution of the magnetic nanoparticle imaging system, and placing the adjusted detection plate into the imaging space of the magnetic nanoparticle imaging system and adjusting the position, so that the imaging plane is parallel to the detection plate and passes through the crystal lattice; taking the square lattice at the upper left corner in the detection plate as an initial lattice, and performing grid scanning on each square lattice according to a snake shape to enable t to be 1 as the current square lattice;

step S20, injecting tracer SPIO (superparamagnetic nano ferric oxide) solution with standard concentration into the current square lattice t; the liquid level position of the tracer SPIO solution is higher than the imaging plane, and no solution overflows to other square lattices;

step S30, carrying out a complete MPI scan, and subtracting all previous voltage signal values from the voltage signal value obtained by scanning to obtain the current voltage signal;

step S40, filtering and denoising the current voltage signal to obtain an available system matrix;

step S50, solving through inverse operation according to the current voltage signal and the concentration of the tracer SPIO solution to obtain a column value of a system matrix corresponding to the current square lattice t;

step S60, let t be t +1, and go to step S20 until the value of t is the set number of square lattices, and obtain the column value of the system matrix corresponding to each square lattice;

and step S70, splicing the column values of the system matrix corresponding to each square lattice according to the positions of the square lattices to obtain the system matrix of the magnetic nanoparticle imaging system.

In a third aspect of the present invention, an apparatus is provided, which includes:

at least one processor; and

a memory communicatively coupled to at least one of the processors; wherein the content of the first and second substances,

the memory stores instructions executable by the processor for performing a method of measuring a grid-shaped probe plate for matrix measurements by a magnetic nanoparticle imaging system as described above.

In a fourth aspect of the present invention, a computer-readable storage medium is provided, which stores computer instructions for being executed by the computer to implement the above-mentioned measurement method of the grid-shaped detection plate for magnetic nanoparticle imaging system matrix measurement.

The invention has the beneficial effects that:

(1) the grid-shaped detection plate for magnetic nanoparticle imaging system matrix measurement utilizes the relationship between the system matrix of the magnetic nanoparticle imaging system and a measurement voltage signal, and adopts the detection plate to gradually increase the measurement range, so that the system matrix of the whole imaging space can be completely and accurately measured. Compared with the traditional mechanical arm type measurement, the measurement method is simple and reliable, and can eliminate the inaccuracy of system matrix measurement caused by the deviation generated when the mechanical arm moves.

(2) According to the grid-shaped detection plate for the matrix measurement of the magnetic nanoparticle imaging system, the size of the square lattice in the detection plate can be adjusted through the plug board which can be freely disassembled and assembled, so that the grid-shaped detection plate is suitable for the resolution ratios of different magnetic nanoparticle imaging systems, and can be adapted to various magnetic nanoparticle imaging systems due to the flexible regulation and control of the resolution ratio, so that the grid-shaped detection plate is more widely applied.

(3) The grid-shaped detection plate for magnetic nanoparticle imaging system matrix measurement has low cost, so that an MPI imaging system based on a system matrix is easier to popularize, the research cost of MPI imaging is reduced, and the development potential of the imaging mode is increased.

Drawings

Other features, objects and advantages of the present application will become more apparent upon reading of the following detailed description of non-limiting embodiments thereof, made with reference to the accompanying drawings in which:

FIG. 1 is a schematic diagram of a grid-shaped probe plate for matrix measurement in a magnetic nanoparticle imaging system according to the present invention;

FIG. 2 is a schematic flow chart of a measurement method of a grid-shaped detection plate for matrix measurement of a magnetic nanoparticle imaging system according to the present invention.

Detailed Description

The present application will be described in further detail with reference to the following drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the relevant invention and not restrictive of the invention. It should be noted that, for convenience of description, only the portions related to the related invention are shown in the drawings.

It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict. The present application will be described in detail below with reference to the embodiments with reference to the attached drawings.

The invention relates to a grid-shaped detection plate for matrix measurement of a magnetic nanoparticle imaging system, which comprises:

setting a number of concave square lattices which are arranged in a grid shape;

the top of the square lattice is open.

In order to more clearly illustrate the grid-shaped detection plate for the matrix measurement of the magnetic nanoparticle imaging system of the present invention, the following description will be made with reference to fig. 1 for the modules of the embodiment of the present invention.

The grid-shaped detection plate for the magnetic nanoparticle imaging system matrix measurement according to the first embodiment of the present invention is described in detail as follows:

the grid-shaped detection plate for the magnetic nanoparticle imaging system matrix measurement comprises a set number of concave square lattices which are arranged in a grid shape:

the top of the square lattice is in an open state;

the square lattices are isolated by taking the material which is the same as the material of the square lattices as an isolation plate; the material is resin;

in order to facilitate system matrix acquisition with any set resolution, the lattice size should be any size that can be varied. In one embodiment of the present invention, the technical solution for achieving the purpose is: the horizontal and vertical isolation plates are set as plug plates which can be freely disassembled and assembled, as shown in fig. 1, the structural schematic diagram of the grid-shaped detection plate measured by the magnetic nanoparticle imaging system matrix is that when a lattice unit is constructed, the lattice unit is firstly inserted into the detection plate along the longitudinal direction through an edge socket (forward direction) for fixing, the distance is roughly adjusted according to the required lattice size, then the distance is transversely adjusted through the edge socket (reverse direction), and the position of the plug plate along the longitudinal direction is adjusted according to the interval socket, so that the complete and closed lattice unit is formed. Because the setting of horizontal vertical picture peg is unanimous, consequently can conveniently produce through 3D printer technique to through the quantity and the position change crystal lattice size of equal proportion adjustment interval socket.

A square lattice having edges not higher than edges of the grid-like probe plate;

the grid-shaped detection plate is used for amplifying the imaging range of the magnetic nanoparticle imaging system in a set proportion by taking the center of the imaging range as a center, namely the size of the grid-shaped detection plate is slightly larger than the imaging range of the magnetic nanoparticle imaging system;

the size of the square lattice is the same as the pixel size of the imaging resolution of the magnetic nanoparticle imaging system.

As shown in fig. 2, a measurement method of a grid-shaped probe plate for magnetic nanoparticle imaging system matrix measurement according to a second embodiment of the present invention is based on the grid-shaped probe plate for magnetic nanoparticle imaging system matrix measurement, and the measurement method includes:

step S10, adjusting the isolation plate according to the resolution of the magnetic nanoparticle imaging system, and placing the adjusted detection plate into the imaging space of the magnetic nanoparticle imaging system and adjusting the position, so that the imaging plane is parallel to the detection plate and passes through the crystal lattice; taking the square lattice at the upper left corner in the detection plate as an initial lattice, and performing grid scanning on each square lattice according to a snake shape to enable t to be 1 as the current square lattice; the serpentine raster scan sequence is only a preferable scheme in one embodiment of the present invention, and in other embodiments, a raster scan sequence from left to right and from top to bottom, or a raster scan sequence from top to bottom and from left to right, etc. may be selected as needed, and when column values of the system matrix corresponding to each square lattice are subsequently spliced, the column values and lattice positions need to be spliced in a one-to-one correspondence manner with reference to the raster scan sequence;

step S20, injecting tracer SPIO solution with standard concentration into the current square lattice t; the liquid level position of the tracer SPIO solution is higher than the imaging plane, and no solution overflows to other square lattices;

step S30, carrying out a complete MPI scan, and subtracting all previous voltage signal values from the voltage signal value obtained by scanning to obtain the current voltage signal;

step S40, filtering and denoising the current voltage signal to obtain an available system matrix;

step S50, solving through inverse operation according to the current voltage signal and the concentration of the tracer SPIO solution to obtain a column value of a system matrix corresponding to the current square lattice t;

step S60, let t be t +1, and go to step S20 until the value of t is the set number of square lattices, and obtain the column value of the system matrix corresponding to each square lattice;

and step S70, splicing the column values of the system matrix corresponding to each square lattice according to the positions of the square lattices to obtain the system matrix of the magnetic nanoparticle imaging system.

It can be clearly understood by those skilled in the art that, for convenience and brevity of description, the specific working process and related descriptions of the method described above may refer to the corresponding process in the foregoing system embodiment, and are not described herein again.

It should be noted that, the grid-shaped detection plate and the method for matrix measurement of a magnetic nanoparticle imaging system provided in the foregoing embodiments are only illustrated by dividing the functional modules, and in practical applications, the functions may be distributed by different functional modules according to needs, that is, the modules or steps in the embodiments of the present invention are further decomposed or combined, for example, the modules in the embodiments may be combined into one module, or may be further split into a plurality of sub-modules, so as to complete all or part of the functions described above. The names of the modules and steps involved in the embodiments of the present invention are only for distinguishing the modules or steps, and are not to be construed as unduly limiting the present invention.

An apparatus of a third embodiment of the invention comprises:

at least one processor; and

a memory communicatively coupled to at least one of the processors; wherein the content of the first and second substances,

the memory stores instructions executable by the processor for performing a method of measuring a grid-shaped probe plate for matrix measurements by a magnetic nanoparticle imaging system as described above.

A computer readable storage medium of a fourth embodiment of the present invention stores computer instructions for execution by the computer to implement the above-mentioned measurement method of the grid-shaped probe plate for magnetic nanoparticle imaging system matrix measurement.

It can be clearly understood by those skilled in the art that, for convenience and brevity of description, the specific working processes and related descriptions of the storage device and the processing device described above may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.

Those of skill in the art would appreciate that the various illustrative modules, method steps, and modules described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both, and that programs corresponding to the software modules, method steps may be located in Random Access Memory (RAM), memory, Read Only Memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art. To clearly illustrate this interchangeability of electronic hardware and software, various illustrative components and steps have been described above generally in terms of their functionality. Whether such functionality is implemented as electronic hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.

The terms "first," "second," and the like are used for distinguishing between similar elements and not necessarily for describing or implying a particular order or sequence.

The terms "comprises," "comprising," or any other similar term are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.

So far, the technical solutions of the present invention have been described in connection with the preferred embodiments shown in the drawings, but it is easily understood by those skilled in the art that the scope of the present invention is obviously not limited to these specific embodiments. Equivalent changes or substitutions of related technical features can be made by those skilled in the art without departing from the principle of the invention, and the technical scheme after the changes or substitutions can fall into the protection scope of the invention.