Low-voltage-stabilizing control circuit for wafer test system and voltage-regulating method thereof
阅读说明：本技术 一种晶圆测试系统用低电稳压控制电路及其调压方法 (Low-voltage-stabilizing control circuit for wafer test system and voltage-regulating method thereof ) 是由 刘飞跃 吕红林 于 2020-05-28 设计创作，主要内容包括：本发明公开了一种晶圆测试系统用低电稳压控制电路及其调压方法,包括：AD/DC转换模块、电源驱动模块、过流保护模块、反向耐压模块、串联负反馈稳压模块,所述AD/DC转换模块中电阻R1吸收电容C2出现的过放电流；所述电源驱动模块中电容C9利用自生的充放电性,对降压后的电压进行平滑调制；所述过流保护模块串接在AD/DC转换模块和电源驱动模块中,利用三极管Q4和三极管Q5组成电流的控制开关,遇到释放电流过大时产生自锁现象；所述反向耐压模块中二极管D3和二极管D4通过负极端连接,增大方向导通电压的耐压值；所述串联负反馈稳压模块中三极管Q6和三极管Q7组成达林顿管稳定降压后的电压,进而给晶圆测试系统提供稳定的输出电源,提高测试电路电压的稳定。(The invention discloses a low-voltage-stabilizing control circuit for a wafer test system and a voltage-regulating method thereof, wherein the low-voltage-stabilizing control circuit comprises the following steps: the power supply comprises an AD/DC conversion module, a power supply driving module, an overcurrent protection module, a reverse voltage-withstanding module and a series negative feedback voltage-stabilizing module, wherein a resistor R1 in the AD/DC conversion module absorbs over-discharge current generated by a capacitor C2; the capacitor C9 in the power driving module smoothly modulates the voltage after voltage reduction by utilizing self-generated charge and discharge; the overcurrent protection module is connected in series in the AD/DC conversion module and the power supply driving module, and a current control switch is formed by a triode Q4 and a triode Q5, so that a self-locking phenomenon is generated when the release current is too large; in the reverse voltage-withstanding module, a diode D3 and a diode D4 are connected through a negative terminal, so that the voltage withstanding value of the directional conduction voltage is increased; and in the series negative feedback voltage stabilizing module, the triode Q6 and the triode Q7 form a Darlington tube to stabilize the voltage after voltage reduction, so that a stable output power supply is provided for the wafer test system, and the stability of the test circuit voltage is improved.)
1. The utility model provides a wafer test system is with low voltage regulator control circuit which characterized in that, includes following module:
the AD/DC conversion module is used for converting the acquired mains voltage into low-voltage direct current for the wafer test system;
the power supply driving module is used for transmitting the low-voltage direct current after voltage conversion and reduction to a specific voltage value through a pin;
the overcurrent protection module is used for protecting the overcurrent transmitted from the AD/DC conversion module to the power supply driving module;
the reverse voltage-resistant module is used for increasing the voltage-resistant value of the diode in the direction breakdown and preventing the voltage from fluctuating during the transmission on the component;
the series negative feedback voltage stabilizing module is used for improving the voltage stabilization of the alternating current-direct current conversion voltage after voltage reduction treatment.
2. The low voltage regulator control circuit of claim 1, wherein the transistor Q1 and the transistor Q2 in the AD/DC conversion module control the on/off of the voltage, and the resistor R1 absorbs the over-discharge current generated by the capacitor C2;
the resistor R4 in the power driving module reduces the voltage value, and the capacitor C9 smoothly modulates the reduced voltage by utilizing the self-generated charge and discharge property;
the overcurrent protection module is connected in series in the AD/DC conversion module and the power supply driving module, so that a current control switch is formed by the triode Q4 and the triode Q5, and when the release current is too large, a self-locking phenomenon is generated, and the safety of electric equipment is protected;
in the reverse voltage-withstanding module, a diode D3 and a diode D4 are connected through a negative terminal, so that the voltage withstanding value of the directional conduction voltage is increased;
the triode Q6 and the triode Q7 in the series negative feedback voltage stabilization module form a voltage after the Darlington tube stably reduces voltage, and the base end of the triode Q8 is connected with the variable resistor RV1, so that misoperation caused by the influence of a power frequency band is reduced, a stable output power supply is provided for a wafer test system, and the voltage stability of a test circuit is improved.
3. The low voltage regulation control circuit for wafer test system as claimed in claim 1, wherein the reverse voltage withstanding module comprises: a voltage regulating unit; the voltage regulating unit comprises a capacitor C10, a voltage regulator U2, a diode D7, a capacitor C11, a resistor R15, a variable resistor RV2, a diode D6, a capacitor C12, a variable resistor RV3 and a triode Q9, wherein one end of the capacitor C10 is connected with a pin 1 of the voltage regulator U2, a negative end of the diode D7 and a port VIN respectively; the other end 1 of the capacitor C10 is respectively connected with one end of a capacitor C11, a pin 1 and a pin 3 of a variable resistor RV2, one end of a capacitor C12 and a ground wire GND; the other end of the capacitor C11 is respectively connected with a pin 2 of a voltage stabilizer U2 and the negative electrode end of a diode D6; the positive end of the diode D6 is respectively connected with one end of a resistor R15, the positive end of a diode D7, a pin 3 of a voltage stabilizer U2, the other end of a capacitor C12, a pin 2 of a variable resistor RV3 and the collector end of a triode Q9; the other end of the resistor R15 is connected with a pin 2 of a variable resistor RV 2; pin 1 of the variable resistor RV3 is connected with a base terminal of a triode Q9; and pin 3 of the variable resistor RV3 is respectively connected with an emitter terminal of the triode Q9 and a port VON.
4. The low voltage stabilization control circuit for the wafer test system according to claim 1, wherein the AD/DC conversion module comprises a transformer T1, a bridge voltage stabilization diode VD1, a transistor Q2, a transistor Q1, a capacitor C2, a resistor R1, and a capacitor C1, wherein pin 1 of the transformer T1 is connected to the positive AC terminal; pin 2 of the transformer T1 is connected with an AC negative end; pin 4 of the transformer T1 is connected with pin 1 of a bridge type voltage stabilizing diode VD 1; pin 3 of the transformer T1 is connected with pin 2 of a bridge type voltage stabilizing diode VD 1; the pin 4 of the bridge type voltage stabilizing diode VD1 is respectively connected with the collector terminal of the triode Q2 and one end of the capacitor C2; the pin 3 of the bridge type voltage stabilizing and stabilizing diode VD1 is respectively connected with the emitter terminal of the triode Q1 and one end of the capacitor C1; the base terminal of the triode Q2 is connected with the collector terminal of the triode Q1; the emitter terminal of the triode Q2 is respectively connected with one end of a resistor R1 and the other end of a capacitor C1; the other end of the resistor R1 is respectively connected with the base terminal of the triode Q1 and the other end of the capacitor C2.
5. The low voltage regulation control circuit for the wafer test system as claimed in claim 1, wherein the power driving module comprises a resistor R2, a resistor R3, a diode D1, a resistor R4, a capacitor C9, a capacitor C3, a capacitor C4, a resistor R5, and a flip-flop U1, wherein one end of the resistor R2 is connected to one end of the resistor R3, an emitter terminal of a transistor Q2, one end of the resistor R1, and the other end of the capacitor C1, respectively; the other end of the resistor R2 is respectively connected with the cathode end of the diode D1, one end of the resistor R4, the pin 8 of the trigger U1 and one end of the resistor R5; the positive end of the diode D1 is respectively connected with the other end of the resistor R4, one end of the capacitor C9 and a pin 4 of the trigger U1; the other end of the resistor R3 is respectively connected with a pin 5 and a pin 2 of a trigger U1; the other end of the capacitor C9 is respectively connected with one end of a capacitor C3, a pin 3 of a bridge type voltage stabilizing diode VD1, an emitter terminal of a triode Q1 and one end of a capacitor C1; the other end of the capacitor C3 is respectively connected with the positive end of a capacitor C4 and a pin 1 of a trigger U1; the other end of the resistor R5 is connected with pin 6 of the trigger U1.
6. The low voltage regulation control circuit for the wafer test system as claimed in claim 1, wherein the over-current protection module comprises a transistor Q4, a capacitor C6, a resistor R10, a transistor Q5, a resistor R9 and a capacitor C5, wherein an emitter terminal of the transistor Q4 is respectively connected to a positive terminal of the capacitor C6, a terminal of the resistor R10, the other terminal of the capacitor C3, a positive terminal of the capacitor C4 and a pin 1 of a flip-flop U1; the collector terminal of the triode Q4 is respectively connected with one end of a resistor R9, the cathode terminal of a capacitor C5, the base terminal of the triode Q5, the other end of the capacitor C9, one end of a capacitor C3, a pin 3 of a VD1 of a bridge type voltage-stabilizing and voltage-stabilizing diode, the emitter terminal of the triode Q1 and one end of a capacitor C1; the base terminal of the triode Q4 is respectively connected with the negative terminal of the capacitor C6, the other terminal of the resistor R10 and the collector terminal of the triode Q5; and the emitter terminal of the triode Q5 is respectively connected with the positive terminal of the capacitor C5, the other terminal of the resistor R9 and the ground wire GND.
7. The low voltage regulation control circuit for the wafer test system as claimed in claim 1, wherein the reverse withstand voltage module comprises a resistor R6, a diode D2, a resistor R7, a diode D3, a diode D4, a transistor Q3, and a resistor R8, wherein one end of the resistor R6 is connected to one end of a resistor R8, the other end of the resistor R2, the negative end of the diode D1, one end of a resistor R4, a pin 8 of a flip-flop U1, and one end of a resistor R5, respectively; the other end of the resistor R6 is respectively connected with the positive end of a diode D4, the negative end of a diode D2, the emitter end of a triode Q3 and a port VIN; the positive end of the diode D2 is respectively connected with the emitter terminal of the triode Q4, the positive end of the capacitor C6, one end of the resistor R10, the other end of the capacitor C3, the positive end of the capacitor C4, a pin 1 of the trigger U1 and a ground wire GND; one end of the resistor R7 is connected with a pin 3 of a trigger U1; the other end of the resistor R7 is respectively connected with the anode end of a diode D3 and the base end of a triode Q3; the other end of the resistor R8 is connected with a collector terminal of a triode Q3; the negative terminal of the diode D3 is connected with the negative terminal of the diode D4.
8. The low voltage stabilization control circuit for the wafer test system as claimed in claim 1, wherein the series negative feedback voltage stabilization module comprises a capacitor C7, a resistor R11, a capacitor C8, a transistor Q6, a transistor Q7, a resistor R12, a diode D5, a resistor R12, a transistor Q8, a variable resistor RV1, a resistor R13, and a resistor R14, wherein the positive terminal of the capacitor C7 is connected to one terminal of a resistor R11, a collector terminal of the transistor Q6, and a collector terminal of the transistor Q7, respectively; the negative end of the capacitor C7 is respectively connected with the negative end of a capacitor C8, the positive end of a diode D5, one end of a resistor R14, the direct current DC negative end, the positive end of a diode D2, the emitter end of a triode Q4, the positive end of a capacitor C6, one end of a resistor R10, the other end of the capacitor C3, the positive end of a capacitor C4, a pin 1 of a trigger U1 and a ground wire GND; the other end of the resistor R11 is connected with a collector terminal of a triode Q8; the emitter terminal of the triode Q6 is connected with the base terminal of the triode Q7; the base end of the triode Q6 is connected with the positive end of a capacitor C8; the emitter terminal of the triode Q7 is respectively connected with the resistor R12, one end of the resistor R13 and the direct current DC positive terminal; the other end of the resistor R12 is respectively connected with the cathode end of the diode D5 and the emitter end of the triode Q8; the base end of the triode Q8 is connected with pin 1 of a variable resistor RV 1; the resistor R13 is connected with a pin 2 of a variable resistor RV 1; and pin 3 of the variable resistor RV1 is connected with the other end of the resistor R14.
9. The voltage regulating method of the low voltage stabilizing control circuit for the wafer test system as claimed in claim 3, wherein the voltage regulating unit obtains the input voltage through the port VIN to regulate to reach the safe and stable output voltage, and further transmits the regulated safe voltage to the series negative feedback voltage stabilizing module through the port VON, so as to meet different low voltage output requirements, and the specific steps are as follows:
step 1, a pin 1 of a voltage stabilizer U2 receives direct current converted by alternating current in a reverse voltage-withstanding module through a port VIN, an obtained direct current is stored by a capacitor C10 and is rapidly released when a voltage shortage phenomenon occurs in a voltage stabilizer U2, the output voltage of the voltage stabilizer U2 is ensured to be stable, a diode D7 has one-way conductivity, unstable voltage is adjusted by the voltage stabilizer U2 again, and a stable effect is achieved, the capacitor C11 is connected with a pin 2 of the voltage stabilizer U2, the other end of the capacitor C11 is grounded, so that a frequency band except the output voltage is filtered when the voltage stabilizer U2 operates, and the influence of a power supply interference frequency band on other components is prevented;
step 2, the resistor R15 and the variable resistor RV2 are connected in series to form a voltage reduction circuit, the resistance value of the resistor R15 is a fixed value, the precision of the resistance value can be improved through the variable resistor RV2, different output voltage values can be achieved according to different resistance values, and then the capacitor C12 is connected in parallel in a circuit, so that the transmission speed of the voltage after voltage reduction is stabilized, and the loss of a power supply caused by retention is prevented; the triode Q9 obtains parameters after voltage reduction through a base terminal, and then limits the conduction of the voltage after voltage reduction through the resistance value of the variable resistor, when the obtained voltage at the collector terminal of the triode Q9 is higher than the voltage of the base terminal regulated through the variable resistor RV3, the triode Q9 is used as a contactless switch, so that the obtained reduced voltage at the collector terminal is transmitted to the series negative feedback voltage stabilizing module through the port VON, the voltage after voltage reduction is stabilized, when the obtained voltage at the collector terminal of the triode Q9 is lower than the voltage of the base terminal regulated through the variable resistor RV3, the triode Q9 has no control effect, and when the obtained voltage at the collector terminal of the triode Q9 is consistent with the voltage of the base terminal regulated through the variable resistor RV3, the reduced voltage is conducted through the pin 3 of the variable resistor RV 3.
Technical Field
The invention relates to the technical field of low-voltage stabilization, in particular to a low-voltage stabilization control circuit for a wafer test system and a voltage regulation method thereof.
Background
The voltage stabilizing circuit is a power circuit which is required to keep output voltage basically unchanged when input power grid voltage fluctuates or a load changes, the voltage stabilizing circuit is divided into a direct current voltage stabilizing circuit and an alternating current voltage stabilizing circuit according to the type of current, and is divided into a series voltage stabilizing circuit and a parallel voltage stabilizing circuit according to the mode that the voltage stabilizing circuit is connected with the load, and the low-voltage stabilizing circuit converts the obtained mains supply voltage into low-voltage direct current for a wafer test system, so that stable output voltage can be provided by low-voltage equipment.
The wafer test in the wafer test system is a very important test, and this step also puts forward a higher requirement on the electric energy stability of the detection equipment, and unstable voltage can cause the fluctuation of the power supply voltage of the detection equipment, thereby affecting the accuracy of test data, and the data of the wafer test cannot be really expressed, and the storage capacitor can generate an over-discharge current phenomenon when the obtained mains voltage is converted into direct-current voltage, thereby affecting the stability of devices in the test and failing to accurately transmit the test data; the voltage after stepping down can take place undulantly when stepping down through the step-down device to the DC voltage who obtains handles to unable steady output steady voltage, the flow that the circuit can accelerated current under overload's operation causes the circuit and heaies up, thereby detects the load of components and parts with higher speed, and then can't realize the protection to the consumer.
Disclosure of Invention
The purpose of the invention is as follows: a low voltage regulator control circuit for wafer test system is provided to solve the above problems.
The technical scheme is as follows: a low voltage regulator control circuit for a wafer test system, comprising:
the AD/DC conversion module is used for converting the acquired mains voltage into low-voltage direct current for the wafer test system;
the power supply driving module is used for transmitting the low-voltage direct current after voltage conversion and reduction to a specific voltage value through a pin;
the overcurrent protection module is used for protecting the overcurrent transmitted from the AD/DC conversion module to the power supply driving module;
the reverse voltage-resistant module is used for increasing the voltage-resistant value of the diode in the direction breakdown and preventing the voltage from fluctuating during the transmission on the component;
the series negative feedback voltage stabilizing module is used for improving the voltage stabilization of the alternating current-direct current conversion voltage after voltage reduction treatment.
According to one aspect of the invention, the transistor Q1 and the transistor Q2 in the AD/DC conversion module control the on and off of voltage, and the resistor R1 absorbs over-discharge current generated by the capacitor C2;
the resistor R4 in the power driving module reduces the voltage value, and the capacitor C9 smoothly modulates the reduced voltage by utilizing the self-generated charge and discharge property;
the overcurrent protection module is connected in series in the AD/DC conversion module and the power supply driving module, so that a current control switch is formed by the triode Q4 and the triode Q5, and when the release current is too large, a self-locking phenomenon is generated, and the safety of electric equipment is protected;
in the reverse voltage-withstanding module, a diode D3 and a diode D4 are connected through a negative terminal, so that the voltage withstanding value of the directional conduction voltage is increased;
the triode Q6 and the triode Q7 in the series negative feedback voltage stabilization module form a voltage after the Darlington tube stably reduces voltage, and the base end of the triode Q8 is connected with the variable resistor RV1, so that misoperation caused by the influence of a power frequency band is reduced, a stable output power supply is provided for a wafer test system, and the voltage stability of a test circuit is improved.
According to one aspect of the invention, the voltage regulating unit comprises a capacitor C10, a voltage regulator U2, a diode D7, a capacitor C11, a resistor R15, a variable resistor RV2, a diode D6, a capacitor C12, a variable resistor RV3 and a triode Q9, wherein one end of the capacitor C10 is respectively connected with a pin 1 of the voltage regulator U2, a negative end of the diode D7 and a port VIN; the other end 1 of the capacitor C10 is respectively connected with one end of a capacitor C11, a pin 1 and a
According to one aspect of the invention, the AD/DC conversion module comprises a transformer T1, a bridge type voltage regulator diode VD1, a transistor Q2, a transistor Q1, a capacitor C2, a resistor R1, and a capacitor C1, wherein a pin 1 of the transformer T1 is connected with an AC positive terminal of alternating current;
According to one aspect of the invention, the power driving module comprises a resistor R2, a resistor R3, a diode D1, a resistor R4, a capacitor C9, a capacitor C3, a capacitor C4, a resistor R5 and a trigger U1, wherein one end of the resistor R2 is connected with one end of the resistor R3, one end of an emitter of a triode Q2, one end of the resistor R1 and the other end of a capacitor C1 respectively; the other end of the resistor R2 is respectively connected with the cathode end of the diode D1, one end of the resistor R4, the pin 8 of the trigger U1 and one end of the resistor R5; the positive end of the diode D1 is respectively connected with the other end of the resistor R4, one end of the capacitor C9 and a
According to one aspect of the invention, the overcurrent protection module comprises a triode Q4, a capacitor C6, a resistor R10, a triode Q5, a resistor R9 and a capacitor C5, wherein an emitter terminal of the triode Q4 is respectively connected with a positive terminal of the capacitor C6, one terminal of the resistor R10, the other terminal of the capacitor C3, a positive terminal of the capacitor C4 and a pin 1 of a trigger U1; the collector terminal of the triode Q4 is respectively connected with one end of a resistor R9, the cathode terminal of a capacitor C5, the base terminal of the triode Q5, the other end of the capacitor C9, one end of a capacitor C3, a
According to one aspect of the invention, the reverse voltage withstanding module comprises a resistor R6, a diode D2, a resistor R7, a diode D3, a diode D4, a triode Q3 and a resistor R8, wherein one end of the resistor R6 is respectively connected with one end of the resistor R8, the other end of the resistor R2, the cathode end of the diode D1, one end of the resistor R4, a pin 8 of a trigger U1 and one end of a resistor R5; the other end of the resistor R6 is respectively connected with the positive end of a diode D4, the negative end of a diode D2, the emitter end of a triode Q3 and a port VIN; the positive end of the diode D2 is respectively connected with the emitter terminal of the triode Q4, the positive end of the capacitor C6, one end of the resistor R10, the other end of the capacitor C3, the positive end of the capacitor C4, a pin 1 of the trigger U1 and a ground wire GND; one end of the resistor R7 is connected with a
According to one aspect of the invention, the series negative feedback voltage stabilizing module comprises a capacitor C7, a resistor R11, a capacitor C8, a triode Q6, a triode Q7, a resistor R12, a diode D5, a resistor R12, a triode Q8, a variable resistor RV1, a resistor R13 and a resistor R14, wherein the positive terminal of the capacitor C7 is respectively connected with one end of a resistor R11, a collector terminal of the triode Q6 and a collector terminal of the triode Q7; the negative end of the capacitor C7 is respectively connected with the negative end of a capacitor C8, the positive end of a diode D5, one end of a resistor R14, the direct current DC negative end, the positive end of a diode D2, the emitter end of a triode Q4, the positive end of a capacitor C6, one end of a resistor R10, the other end of the capacitor C3, the positive end of a capacitor C4, a pin 1 of a trigger U1 and a ground wire GND; the other end of the resistor R11 is connected with a collector terminal of a triode Q8; the emitter terminal of the triode Q6 is connected with the base terminal of the triode Q7; the base end of the triode Q6 is connected with the positive end of a capacitor C8; the emitter terminal of the triode Q7 is respectively connected with the resistor R12, one end of the resistor R13 and the direct current DC positive terminal; the other end of the resistor R12 is respectively connected with the cathode end of the diode D5 and the emitter end of the triode Q8; the base end of the triode Q8 is connected with pin 1 of a variable resistor RV 1; the resistor R13 is connected with a
According to one aspect of the invention, the capacitor C4, the capacitor C5, the capacitor C6, the capacitor C7 and the capacitor C8 are all electrolytic capacitors; the diode D1, the diode D2, the diode D5, the diode D7 and the diode D6 are all zener diodes; the model of the triode Q1, the model of the triode Q3, the model of the triode Q5, the model of the triode Q6, the model of the triode Q8 and the model of the triode Q9 are all NPN; the types of the triode Q2 and the triode Q4 are PNP; the model of the trigger U1 is 555; the voltage stabilizer U2 is LM 337T.
According to one aspect of the invention, a voltage regulating method of a low-voltage regulation control circuit for a wafer test system is characterized in that a voltage regulating unit obtains input voltage through a port VIN so as to regulate the input voltage to reach safe and stable output voltage, and further transmits the regulated safe voltage to a series negative feedback voltage regulation module through a port VON so as to meet different low-voltage output requirements, and the method comprises the following specific steps:
step 1, a pin 1 of a voltage stabilizer U2 receives direct current converted by alternating current in a reverse voltage-withstanding module through a port VIN, an obtained direct current is stored by a capacitor C10 and is rapidly released when a voltage shortage phenomenon occurs in a voltage stabilizer U2, the output voltage of the voltage stabilizer U2 is ensured to be stable, a diode D7 has one-way conductivity, unstable voltage is adjusted by the voltage stabilizer U2 again, and a stable effect is achieved, the capacitor C11 is connected with a
Has the advantages that: the invention designs a low-voltage-stabilizing control circuit for a wafer test system and a voltage regulating method thereof, wherein the low-voltage-stabilizing control circuit is designed for the circuit for the wafer test system, and the detection circuit can accurately judge the quality of a wafer by providing safe and stable voltage for the wafer test circuit, can stably transmit detection data and achieve the aim of accurate detection, so that the inaccurate test data caused by unstable voltage cannot be generated; when the acquired mains voltage is converted into direct-current voltage, an over-discharge current phenomenon occurs in a storage capacitor, so that the condition that whether the voltage is switched on or switched off is judged by using a triode Q1 and a triode Q2 in an AD/DC conversion module, and the stored electric energy of a capacitor C2 is absorbed according to a resistor R1 to prevent the discharge current from exceeding a set parameter value, so that components and parts are stably tested; when the acquired direct current is subjected to voltage reduction processing through the voltage reduction device, the voltage after voltage reduction fluctuates, the voltage on the unidirectional line is adjusted through the resistor R4 in the power supply driving module, and the capacitor C9 smoothly modulates the voltage after voltage reduction by utilizing the charging and discharging property of the capacitor C9, so that the voltage after voltage reduction is stabilized; under the overload operation, the circuit can generate heat, and a current control switch is formed by the triode Q4 and the triode Q5 in the overheating protection module, so that the self-locking phenomenon is generated when the release current is too large or exceeds the base electrode terminal conducting voltage of the triode, and the safety of electric equipment is protected.
Drawings
Fig. 1 is a block diagram of the present invention.
Fig. 2 is a diagram of the low voltage regulation control circuit of the present invention.
Fig. 3 is a circuit diagram of an AD/DC conversion module of the present invention.
Fig. 4 is a circuit diagram of the power driving module of the present invention.
Fig. 5 is a circuit diagram of an overcurrent protection module of the invention.
Fig. 6 is a circuit diagram of a reverse withstand voltage module of the present invention.
Fig. 7 is a circuit diagram of a series negative feedback voltage stabilization module of the present invention.
Fig. 8 is a circuit diagram of the voltage regulating unit of the present invention.
Detailed Description
As shown in fig. 1, in this embodiment, a low voltage regulation control circuit for a wafer test system includes:
the AD/DC conversion module is used for converting the acquired mains voltage into low-voltage direct current for the wafer test system;
the power supply driving module is used for transmitting the low-voltage direct current after voltage conversion and reduction to a specific voltage value through a pin;
the overcurrent protection module is used for protecting the overcurrent transmitted from the AD/DC conversion module to the power supply driving module;
the reverse voltage-resistant module is used for increasing the voltage-resistant value of the diode in the direction breakdown and preventing the voltage from fluctuating during the transmission on the component;
the series negative feedback voltage stabilizing module is used for improving the voltage stabilization of the alternating current-direct current conversion voltage after voltage reduction treatment.
In a further embodiment, as shown in fig. 2, a transistor Q1 and a transistor Q2 in the AD/DC conversion module control the on/off of the voltage, and a resistor R1 absorbs the over-discharge current appearing in a capacitor C2;
the resistor R4 in the power driving module reduces the voltage value, and the capacitor C9 smoothly modulates the reduced voltage by utilizing the self-generated charge and discharge property;
the overcurrent protection module is connected in series in the AD/DC conversion module and the power supply driving module, so that a current control switch is formed by the triode Q4 and the triode Q5, and when the release current is too large, a self-locking phenomenon is generated, and the safety of electric equipment is protected;
in the reverse voltage-withstanding module, a diode D3 and a diode D4 are connected through a negative terminal, so that the voltage withstanding value of the directional conduction voltage is increased;
the triode Q6 and the triode Q7 in the series negative feedback voltage stabilization module form a voltage after the Darlington tube stably reduces voltage, and the base end of the triode Q8 is connected with the variable resistor RV1, so that misoperation caused by the influence of noise signals is reduced, a stable output power supply is provided for a wafer test system, and the voltage stability of the test circuit is improved.
In a further embodiment, as shown in fig. 8, the voltage regulating unit includes a capacitor C10, a voltage regulator U2, a diode D7, a capacitor C11, a resistor R15, a variable resistor RV2, a diode D6, a capacitor C12, a variable resistor RV3, and a transistor Q9.
In a further embodiment, one end of the capacitor C10 in the voltage regulating unit is respectively connected to pin 1 of the voltage regulator U2, the negative terminal of the diode D7, and the port VIN; the other end 1 of the capacitor C10 is respectively connected with one end of a capacitor C11, a pin 1 and a
In a further embodiment, as shown in fig. 3, the AD/DC conversion module includes a transformer T1, a bridge zener diode VD1, a transistor Q2, a transistor Q1, a capacitor C2, a resistor R1, and a capacitor C1.
In a further embodiment, pin 1 of the transformer T1 in the AD/DC conversion module is connected to the positive AC terminal of the alternating current;
In a further embodiment, as shown in fig. 4, the power driving module includes a resistor R2, a resistor R3, a diode D1, a resistor R4, a capacitor C9, a capacitor C3, a capacitor C4, a resistor R5, and a flip-flop U1.
In a further embodiment, one end of the resistor R2 in the power driving module is respectively connected to one end of the resistor R3, the emitter terminal of the transistor Q2, one end of the resistor R1, and the other end of the capacitor C1; the other end of the resistor R2 is respectively connected with the cathode end of the diode D1, one end of the resistor R4, the pin 8 of the trigger U1 and one end of the resistor R5; the positive end of the diode D1 is respectively connected with the other end of the resistor R4, one end of the capacitor C9 and a
In a further embodiment, as shown in fig. 5, the over-current protection module includes a transistor Q4, a capacitor C6, a resistor R10, a transistor Q5, a resistor R9, and a capacitor C5.
In a further embodiment, the emitter terminal of the triode Q4 in the overcurrent protection module is respectively connected to the positive terminal of a capacitor C6, one terminal of a resistor R10, the other terminal of a capacitor C3, the positive terminal of a capacitor C4, and pin 1 of a flip-flop U1; the collector terminal of the triode Q4 is respectively connected with one end of a resistor R9, the cathode terminal of a capacitor C5, the base terminal of the triode Q5, the other end of the capacitor C9, one end of a capacitor C3, a
In a further embodiment, as shown in fig. 6, the reverse voltage withstanding module includes a resistor R6, a diode D2, a resistor R7, a diode D3, a diode D4, a transistor Q3, and a resistor R8.
In a further embodiment, one end of the resistor R6 in the reverse voltage withstanding module is respectively connected to one end of the resistor R8, the other end of the resistor R2, the negative end of the diode D1, one end of the resistor R4, the pin 8 of the flip-flop U1, and one end of the resistor R5; the other end of the resistor R6 is respectively connected with the positive end of a diode D4, the negative end of a diode D2, the emitter end of a triode Q3 and a port VIN; the positive end of the diode D2 is respectively connected with the emitter terminal of the triode Q4, the positive end of the capacitor C6, one end of the resistor R10, the other end of the capacitor C3, the positive end of the capacitor C4, a pin 1 of the trigger U1 and a ground wire GND; one end of the resistor R7 is connected with a
In a further embodiment, as shown in fig. 7, the series negative feedback voltage stabilizing module includes a capacitor C7, a resistor R11, a capacitor C8, a transistor Q6, a transistor Q7, a resistor R12, a diode D5, a resistor R12, a transistor Q8, a variable resistor RV1, a resistor R13, and a resistor R14.
In a further embodiment, the positive terminal of the capacitor C7 in the series negative feedback voltage stabilizing module is respectively connected with one terminal of a resistor R11, a collector terminal of a transistor Q6 and a collector terminal of a transistor Q7; the negative end of the capacitor C7 is respectively connected with the negative end of a capacitor C8, the positive end of a diode D5, one end of a resistor R14, the direct current DC negative end, the positive end of a diode D2, the emitter end of a triode Q4, the positive end of a capacitor C6, one end of a resistor R10, the other end of the capacitor C3, the positive end of a capacitor C4, a pin 1 of a trigger U1 and a ground wire GND; the other end of the resistor R11 is connected with a collector terminal of a triode Q8; the emitter terminal of the triode Q6 is connected with the base terminal of the triode Q7; the base end of the triode Q6 is connected with the positive end of a capacitor C8; the emitter terminal of the triode Q7 is respectively connected with the resistor R12, one end of the resistor R13 and the direct current DC positive terminal; the other end of the resistor R12 is respectively connected with the cathode end of the diode D5 and the emitter end of the triode Q8; the base end of the triode Q8 is connected with pin 1 of a variable resistor RV 1; the resistor R13 is connected with a
In a further embodiment, the capacitor C4, the capacitor C5, the capacitor C6, the capacitor C7 and the capacitor C8 are all electrolytic capacitors; the diode D1, the diode D2, the diode D5, the diode D7 and the diode D6 are all zener diodes; the model of the triode Q1, the model of the triode Q3, the model of the triode Q5, the model of the triode Q6, the model of the triode Q8 and the model of the triode Q9 are all NPN; the types of the triode Q2 and the triode Q4 are PNP; the model of the trigger U1 is 555; the voltage stabilizer U2 is LM 337T.
In a further embodiment, a voltage regulation method of a low-voltage regulation control circuit for a wafer test system is characterized in that a voltage regulation unit obtains an input voltage through a port VIN to regulate to reach a safe and stable output voltage, and then transmits the regulated safe voltage to a series negative feedback voltage regulation module through a port VON, so that different low-voltage output requirements are met, and the method specifically comprises the following steps:
step 1, a pin 1 of a voltage stabilizer U2 receives direct current converted by alternating current in a reverse voltage-withstanding module through a port VIN, an obtained direct current is stored by a capacitor C10 and is rapidly released when a voltage shortage phenomenon occurs in a voltage stabilizer U2, the output voltage of the voltage stabilizer U2 is ensured to be stable, a diode D7 has one-way conductivity, unstable voltage is adjusted by the voltage stabilizer U2 again, and a stable effect is achieved, the capacitor C11 is connected with a
step 2, the resistor R15 and the variable resistor RV2 are connected in series to form a voltage reduction circuit, the resistance value of the resistor R15 is a fixed value, the precision of the resistance value can be improved through the variable resistor RV2, different output voltage values can be achieved according to different resistance values, and then the capacitor C12 is connected in parallel in a circuit, so that the transmission speed of the voltage after voltage reduction is stabilized, and the loss of a power supply caused by retention is prevented; the triode Q9 obtains parameters after voltage reduction through a base terminal, and then limits the conduction of the voltage after voltage reduction through the resistance value of the variable resistor, when the obtained voltage at the collector terminal of the triode Q9 is higher than the voltage of the base terminal regulated through the variable resistor RV3, the triode Q9 is used as a contactless switch, so that the obtained reduced voltage at the collector terminal is transmitted to the series negative feedback voltage stabilizing module through the port VON, the voltage after voltage reduction is stabilized, when the obtained voltage at the collector terminal of the triode Q9 is lower than the voltage of the base terminal regulated through the variable resistor RV3, the triode Q9 has no control effect, and when the obtained voltage at the collector terminal of the triode Q9 is consistent with the voltage of the base terminal regulated through the variable resistor RV3, the reduced voltage is conducted through the pin 3 of the variable resistor RV 3.
In summary, the present invention has the following advantages: the bridge type voltage stabilizing diode VD1 utilizes unidirectional conductivity to stabilize voltage of converting alternating current into direct current, the triode Q1 and the triode Q2 control on-off of the voltage, the resistor R1 absorbs over-discharge current appearing on the capacitor C2, the capacitor C1 is used for improving response speed of the triode Q1 and the triode Q2 by stored electric energy, the resistor R3 and the resistor R2 are used for carrying out series voltage division on the received voltage to meet different power consumption requirements on each branch circuit, then the voltage value is reduced by the resistor R4, the capacitor C9 utilizes self-generated charge-discharge performance to carry out smooth modulation on the voltage after voltage reduction, when the input voltage reaches the starting voltage of the trigger U1, the electric energy is transmitted through the unidirectional conductivity of the diode, the capacitor C3 is used for maintaining the balance of the transmission voltage on the circuit, and one end of the capacitor C4 is grounded to eliminate an interference frequency band generated when the trigger U1 runs; therefore, the triode Q4 and the triode Q5 form a current control switch, when the release current is too large, a self-locking phenomenon is generated, the safety of electric equipment is protected, the resistor R10 and the capacitor C6 are connected in parallel to reduce impedance, and the response speed of the triode is improved; the diode D3 is connected with the negative electrode end of the diode D4, the withstand voltage value of the direction conducting voltage is increased, the breakdown phenomenon caused by overlarge direction voltage is prevented, and the triode Q3 acquires the voltage reduction value of the resistor R8 according to the collector end to control the on-off of the power supply; according to the voltage of the Darlington tube formed by the triode Q6 and the triode Q7 after voltage reduction is stabilized, the capacitor C7 is connected in parallel with the circuit to provide stored electric energy, the stored electric energy is released when the power shortage phenomenon occurs, the base electrode end of the triode Q8 is connected with the variable resistor RV1, the misoperation caused by the influence of the power frequency band is reduced, a stable output power supply is further provided for the wafer test system, and the stability of the test circuit voltage is improved.
It should be noted that the various features described in the above embodiments may be combined in any suitable manner without departing from the scope of the invention. The invention is not described in detail in order to avoid unnecessary repetition.
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