阅读说明：本技术 一种超高层建筑物垂直度测控方法 (Super high-rise building perpendicularity measurement and control method ) 是由 蔡猛 蔡志远 童璐 于泉有 王文哲 乔有功 邵岩 张文龙 黄健东 于 2021-04-24 设计创作，主要内容包括：本发明涉及人工智能技术领域,具体涉及一种超高层建筑物垂直度测控方法。该方法包括：采集不同焦距下建筑物的预留孔图像,预留孔的中心位于图像中心；并提取每张预留孔图像中每层预留孔的轮廓；对每张预留孔图像,分别连接预留孔每条边上同比例的点,获取多条立体线；根据立体线的间隔距离计算每张预留孔图像的相对垂直度；相对垂直度以垂直度偏差和偏差方向来表征；对于同一层预留孔在不同焦距下的预留孔图像,根据相对垂直度的可靠度对其进行筛选获得有效数据,通过筛选过的所有相对垂直度进行整合获取绝对垂直度。本发明实施例能够准确地得到超高层建筑物的垂直度,操作简便,精确度高。(The invention relates to the technical field of artificial intelligence, in particular to a method for measuring and controlling the verticality of a super high-rise building. The method comprises the following steps: collecting reserved hole images of buildings under different focal lengths, wherein the centers of the reserved holes are positioned in the centers of the images; extracting the outline of each layer of preformed hole in each preformed hole image; respectively connecting points with the same proportion on each edge of each preformed hole for each preformed hole image to obtain a plurality of three-dimensional lines; calculating the relative verticality of each reserved hole image according to the spacing distance of the three-dimensional lines; relative perpendicularity is characterized in terms of a perpendicularity deviation and deviation direction; and screening the preformed hole images of the same layer of preformed holes under different focal lengths according to the reliability of the relative verticality to obtain effective data, and integrating all the screened relative verticality to obtain the absolute verticality. The embodiment of the invention can accurately obtain the verticality of the super high-rise building, and has simple and convenient operation and high precision.)

1. A super high-rise building verticality measurement and control method is characterized by comprising the following steps:

collecting reserved hole images of buildings under different focal lengths, wherein the centers of the reserved holes are positioned in the centers of the images; extracting the outline of each layer of the preformed hole in each preformed hole image;

respectively connecting points with the same proportion on each edge of the preformed hole to each preformed hole image to obtain a plurality of three-dimensional lines; calculating the relative verticality of each reserved hole image according to the spacing distance of the three-dimensional lines; the relative perpendicularity is characterized in terms of a perpendicularity deviation and a deviation direction;

and screening the images of the preformed holes of the same layer under different focal lengths, and integrating all screened relative verticality to obtain the absolute verticality.

2. The method of claim 1, wherein before acquiring the images of the prepared holes of the building at different focal lengths, the method further comprises the steps of:

and acquiring an image with the minimum focal length, obtaining the edge of each preformed hole, calculating the deviation of the center point of the outermost preformed hole relative to the center of the image, and adjusting the camera according to the deviation.

3. The method according to claim 1, wherein the same layer of preformed holes is determined by: and numbering and recording the reserved holes of each layer, and taking the reserved holes with the same number as the reserved holes of the same layer.

4. The method according to claim 1, characterized in that said verticality deviation is obtained by:

obtaining a three-dimensional line of each edge of the preformed hole, calculating the distance deviation of each three-dimensional line, and obtaining the perpendicularity deviation according to all the distance deviations;

and then calculating the deviation direction according to the arctan function of the distance deviation.

5. The method of claim 4, wherein before obtaining the relief line for each side of the preformed hole, the method further comprises the steps of:

acquiring the rotation angle of the outline of each layer of the preformed hole;

and correcting the contour of the reserved hole according to the rotation angle.

6. The method according to claim 1, wherein the method for screening the preformed hole images of the same layer of preformed holes at different focal lengths comprises:

obtaining the measurement quality evaluation value according to the weighting sum of the measurement precision, the deviation degree and the imaging distortion degree, and selecting the measurement quality evaluation value to be higher; the measurement precision and the measurement quality evaluation value are in a negative correlation relationship, the deviation degree and the measurement quality evaluation value are in a negative correlation relationship, and the imaging distortion degree and the measurement quality evaluation value are in a positive correlation relationship.

7. The method of claim 6, wherein the measurement accuracy is calculated by:

and obtaining the measurement precision of each layer of preformed hole under the corresponding focal length by calculating the ratio of the shooting height of each layer of preformed hole in the preformed hole image corresponding to each focal length to the adopted focal length.

8. The method of claim 6, wherein the degree of deviation is calculated by:

and taking the outermost preformed hole contour in each preformed hole image as a standard contour line, and calculating the multiple relation between the number of pixel points on the standard contour line and the number of pixel points of the contour of each layer of preformed holes to obtain the deviation degree.

9. The method according to claim 6, wherein the imaging distortion degree is obtained by:

and acquiring the imaging distortion degree according to the distance proportion from the point on the contour of the preformed hole to the center of the image of the preformed hole.

10. The method according to claim 1, characterized in that the absolute perpendicularity is obtained by:

and selecting a layer of the prepared hole as a reference layer, and obtaining the uniform standard verticality of the effective data by taking the reference layer as a reference to be used as the absolute verticality.

Technical Field

The invention relates to the technical field of artificial intelligence, in particular to a method for measuring and controlling the verticality of a super high-rise building.

Background

The high-rise building can generate vertical deviation in the construction process, the deviation is a normal phenomenon within a certain limit, and if the deviation exceeds the specified limit, the normal use of the building can be influenced, and in severe cases, the safety of the building can even be endangered, so that the verticality monitoring of the high-rise building is very necessary.

At present, the verticality measurement and control of a super high-rise building mostly adopt an internal control method, namely, a laser plumb instrument or a plumb bob is used for setting out lines and detection through a prepared vertical alignment hole in the building.

In practice, the inventors found that the above prior art has the following disadvantages:

the plumb line hanging method is greatly influenced by external environments such as wind power and the like, and has relatively low precision; the laser plumb method requires a transparent glass plate to be placed on each layer, and is complicated to operate and prone to errors.

Disclosure of Invention

In order to solve the technical problems, the invention aims to provide a method for measuring and controlling the verticality of a super high-rise building, which adopts the following technical scheme:

an embodiment of the invention provides a method for measuring and controlling the verticality of an ultra-high-rise building, which comprises the following steps:

collecting reserved hole images of buildings under different focal lengths, wherein the centers of the reserved holes are positioned in the centers of the images; extracting the outline of each layer of the preformed hole in each preformed hole image;

respectively connecting points with the same proportion on each edge of the preformed hole to each preformed hole image to obtain a plurality of three-dimensional lines; calculating the relative verticality of each reserved hole image according to the spacing distance of the three-dimensional lines; the relative perpendicularity is characterized in terms of a perpendicularity deviation and a deviation direction;

and screening the images of the preformed holes of the same layer under different focal lengths, and integrating all screened relative verticality to obtain the absolute verticality.

Preferably, before acquiring images of the prepared holes of the building at different focal lengths, the method further comprises the following steps:

and acquiring an image with the minimum focal length, obtaining the edge of each preformed hole, calculating the deviation of the center point of the outermost preformed hole relative to the center of the image, and adjusting the camera according to the deviation.

Preferably, the method for determining the preformed hole in the same layer comprises the following steps: and numbering and recording the reserved holes of each layer, and taking the reserved holes with the same number as the reserved holes of the same layer.

Preferably, the step of obtaining the verticality deviation is as follows:

obtaining a three-dimensional line of each edge of the preformed hole, calculating the distance deviation of each three-dimensional line, and obtaining the perpendicularity deviation according to all the distance deviations;

and then calculating the deviation direction according to the arctan function of the distance deviation.

Preferably, before the obtaining of the solid line of each side of the preformed hole, the method further comprises the following steps:

acquiring the rotation angle of the outline of each layer of the preformed hole;

and correcting the contour of the reserved hole according to the rotation angle.

Preferably, the method for screening the preformed hole images of the same layer of preformed holes under different focal lengths comprises the following steps:

obtaining the measurement quality evaluation value according to the weighting sum of the measurement precision, the deviation degree and the imaging distortion degree, and selecting the measurement quality evaluation value to be higher; the measurement precision and the measurement quality evaluation value are in a negative correlation relationship, the deviation degree and the measurement quality evaluation value are in a negative correlation relationship, and the imaging distortion degree and the measurement quality evaluation value are in a positive correlation relationship.

Preferably, the calculation method of the measurement accuracy is as follows:

and obtaining the measurement precision of each layer of preformed hole under the corresponding focal length by calculating the ratio of the shooting height of each layer of preformed hole in the preformed hole image corresponding to each focal length to the adopted focal length.

Preferably, the calculation method of the deviation degree is:

and taking the outermost preformed hole contour in each preformed hole image as a standard contour line, and calculating the multiple relation between the number of pixel points on the standard contour line and the number of pixel points of the contour of each layer of preformed holes to obtain the deviation degree.

Preferably, the imaging distortion degree is obtained according to a distance ratio of a point on the contour of the preformed hole to the center of the image of the preformed hole.

Preferably, the method for obtaining the absolute verticality comprises the following steps:

and selecting a layer of the prepared hole as a reference layer, and obtaining the uniform standard verticality of the effective data by taking the reference layer as a reference to be used as the absolute verticality.

The embodiment of the invention has the following beneficial effects:

1. the perpendicularity deviation and deviation direction of the building are obtained through calculating the distance difference of the three-dimensional line, the perpendicularity is represented, the measuring accuracy is guaranteed through the law of imaging, then the perpendicularity of the building is accurately obtained, whether the building meets the standard or not is detected, manual participation is needed only when equipment is placed in the measuring process, the degree of automation is high, the measuring speed is high, and the influence of the height and the number of floors is avoided.

2. And multiple groups of verticality data between the same floors are obtained through continuous change of focal lengths, and the optimal degree corresponding to the data is judged through combination of measurement precision, deviation degree and imaging distortion degree, so that the accuracy of the measurement result is ensured, and accurate data is obtained.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions and advantages of the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.

Fig. 1 is a flowchart of a method for measuring and controlling verticality of a super high-rise building according to an embodiment of the present invention;

FIG. 2 is a flow chart illustrating the steps of a method for measuring and controlling the verticality of a super high-rise building according to an embodiment of the present invention;

fig. 3 is a schematic view of a super high-rise building including a prepared hole according to an embodiment of the present invention;

FIG. 4 is a captured preformed hole image provided by one embodiment of the present invention;

FIG. 5 is a perspective view of one embodiment of the present invention;

FIG. 6 is a schematic diagram of a preformed hole in an image coordinate system according to an embodiment of the present invention;

fig. 7 is a schematic diagram of performing hough transform on a reserved hole according to an embodiment of the present invention;

fig. 8 is a schematic diagram of performing hough transform on a reserved hole according to an embodiment of the present invention;

fig. 9 is a schematic diagram of the integration of relative verticality provided by one embodiment of the present invention.

Detailed Description

To further illustrate the technical means and effects of the present invention adopted to achieve the predetermined purpose, the following detailed description is provided with reference to the accompanying drawings and preferred embodiments for a flow chart of the method for measuring and controlling the verticality of an ultra-high-rise building according to the present invention, and the detailed implementation, structure, features and effects thereof are described below. In the following description, different "one embodiment" or "another embodiment" refers to not necessarily the same embodiment. Furthermore, the particular features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.

The following describes a specific scheme of a flow chart of the method for measuring and controlling the verticality of a super high-rise building in detail with reference to the accompanying drawings.

Referring to fig. 1 and fig. 2, fig. 1 shows a flowchart of a method for measuring and controlling the verticality of an ultra-high-rise building according to an embodiment of the present invention, and fig. 2 shows a flowchart of steps of the method for measuring and controlling the verticality of an ultra-high-rise building according to an embodiment of the present invention.

The method comprises the following steps:

s001, collecting reserved hole images of buildings under different focal lengths, wherein the center of the reserved hole is positioned in the center of the image; and extracting the contour of each layer of the prepared holes in each prepared hole image.

The camera needs to use a tripod to adjust the height so that the imaging surface is absolutely level. And acquiring the height h as an initial focal length value.

1) And collecting an image with the minimum focal length, obtaining the edge of each preformed hole, calculating the deviation of the center point of the outermost preformed hole relative to the center of the image, and adjusting the camera according to the deviation.

Specifically, the method comprises the following steps:

referring to fig. 3 and 4, the reserved hole image IM is collected when the focal length is minimum_f(min)In the figure, the top layer preformed hole 301 and the first preformed hole 302 are actually of equal size, the collected images of the plurality of preformed holes are shown in fig. 4, the imaging of the plurality of preformed holes is in a concentric zooming mode, and the spacing distance between the holes is continuously reduced due to perspective imaging.

And obtaining the edge of each reserved hole through image processing, calculating the deviation of the central point of the outermost closed area relative to the center of the image, and adjusting the position and the height of the camera support according to the deviation until the deviation is 0 or the deviation value is within an allowable error range. I.e. to ensure that the outermost layer of the prepared hole is positioned at the exact center of the image.

2) The focal length of the camera is changed linearly, and reserved hole images under different focal lengths are acquired.

From the minimum focal length f_(min)To the maximum focal length f_(max)Is incremented, or from f_(max)To f_(min)A decrement is performed. The image acquired at each focal length f is marked as IM_f。

As an example, the focal length of the camera in the embodiment of the invention is from f_(min)To f_(max)An increment is made.

The physical units corresponding to the pixels in the images acquired at different focal lengths are different, that is, the measurement accuracy is different, so that the images acquired at each focal length need to be analyzed.

The image first needs to be semantically segmented using DNN:

the categories that need to be segmented include: hole cross-section, same layer, background, target.

It should be noted that the target is not essential, and the target is used as a reference when the target exists, and the hole is used as a reference when the target does not exist. To facilitate rapid identification, the edges of the holes and targets can be treated rapidly by applying a marking color or pattern.

The loss function of DNN uses a cross-entropy loss function.

3) And performing edge detection on the result image to obtain a definite boundary of each closed area, and determining the contour line of the reserved hole according to the types of pixels on two sides of the boundary.

As an example, the embodiment of the present invention uses the canny algorithm to perform edge detection, and in other embodiments, other edge detection algorithms that can achieve the same effect may be used.

4) And numbering and recording each layer of preformed holes, and using the same set of numbers when collecting the preformed hole images under different focal lengths.

Obtaining an image IM acquired at minimum focal distance_f(min)The contour line of (1) allocates serial numbers to the reserved holes in the image, and the serial numbers cannot be allocated after the focal length is prevented from changingAnd cleaning the floors corresponding to the reserved holes in the corresponding images. The method for distributing the numbers comprises the following steps:

the number of the prepared holes on the outermost layer is 0.

In the embodiment of the invention, the cameras shoot from the top of the building downwards, so the number is the number of layers from the cameras.

As an example, referring to fig. 3, the top layer preformed hole 301 is numbered 0, the first layer preformed hole 302 is numbered 1, and so on, all the numbers are obtained.

In the still image determined by the focal length, as the graph is closer to the center of the image, that is, farther from the camera, the imaging area of the same-layer object is smaller, and the unit pixel represents a larger physical quantity, that is, the unit of measurement is increased, which also represents an increase in error. Therefore, although the perpendicularity of the building can be measured in a static scene, the closer to the center of the image, the lower the confidence of the accuracy of the measured data.

The measurement accuracy requirement of the building perpendicularity measurement process is very strict, and the measurement accuracy needs to be improved as much as possible on the premise that the requirement of a real scene on the measurement method is met.

S002, respectively connecting points with the same proportion on each edge of each preformed hole for each preformed hole image to obtain a plurality of three-dimensional lines; calculating the relative verticality of each reserved hole image according to the spacing distance of the three-dimensional lines; relative perpendicularity is characterized in terms of the perpendicularity deviation and the direction of deviation.

The method comprises the following specific steps:

1) and obtaining corresponding three-dimensional lines of each outline of the inner layer and the outline of the outermost layer.

It should be noted that the form of the solid line is shown in fig. 5, the solid line is a vertical height line in an actual scene, and the point on the solid line has only different coordinates along the height direction of the floor.

As an example, as shown in FIG. 5, line segment q₁And N pixel points are arranged, so that N three-dimensional lines can be obtained outwards, and each line is connected with the same-proportion point. q. q.s₁Upper S point, ratioIs S/N, is connected to q₂The solid line 401 can be obtained from the points with the same S/N ratio.

In the prior art, judgment is usually performed by using the separation distance in four directions, namely, up, down, left and right, or by using the center point of a square. These methods are all based on the ideal assumption that the edges are absolutely clean and the preformed holes are absolutely standard squares.

The measurement of the perpendicularity of the building has higher requirements on the measurement accuracy, the calculation is pixel level in the embodiment of the invention, the edge of the reserved hole of the actually acquired image is not an ideal clear and regular line segment, sawtooth noise conditions with different degrees are often generated, and particularly under the condition that the hole has certain deflection, the noise is more serious, and the measurement accuracy is seriously influenced by the condition.

The jaggy phenomenon makes it possible for some degree of gray pixels to exist beside the black pixels. If the measurement is carried out by using a conventional method, large errors are possible. Therefore, a stereo line mode is introduced, and random sampling is carried out on the stereo lines in four directions to carry out calculation so as to eliminate noise point errors.

2) And acquiring the rotation angle of the profile of each layer of the reserved holes.

As shown in fig. 6, 7 and 8, the specific steps include:

a. calculate the sum of P₁～P₄The second-order center distance of all points on the edge of the formed contour is obtained to obtain the centroid coordinate (u) of the contour₀，v₀)。

b. And c-e conversion is carried out on the old contour coordinate information by taking the contour centroid as a new coordinate origin.

c. Carrying out Hough transform for one time: conversion of cartesian rectangular coordinates (u, v) into hough coordinate space (θ, ρ).

d. And (3) extracting the highlight points by taking 1/8 of the number of the edge points as a threshold value to obtain coordinates of the highlight points.

e. And (3) carrying out secondary Hough transform: a conversion of the hough coordinate space (θ, ρ) to a second hough coordinate space (e, γ).

f. Obtaining the coordinate (0, gamma) of the highest point of brightness on the epsilon axis_m)，2*γ_mBeing the length of an absolute square, theta₁Namely the rotation angle corresponding to the square.

In the actual image processing process, the edge of the reserved hole is not an ideal single-pixel continuous line segment, and the hough transform detects single-pixel straight lines, so that several parallel straight lines may be detected for the same edge. In order to select the corresponding straight line from each direction, a square of an absolute single pixel is constructed, and the noise error is eliminated by the above-described procedure.

3) And correcting the contour of the reserved hole according to the rotation angle.

The coordinate correction formula is:

where u 'represents the corrected abscissa and v' represents the corrected ordinate.

4) And obtaining a three-dimensional line of each edge of the preformed hole, calculating the distance deviation of each three-dimensional line, and obtaining the verticality deviation according to all the distance deviations.

The specific steps of calculating the verticality deviation between the two prepared holes comprise:

a. equal-amount three-dimensional lines are randomly selected in four directions, and the three-dimensional lines at equal proportion positions are selected in the four directions.

b. And obtaining the intersection point coordinates of the same three-dimensional line and the outlines of the two preformed holes, and calculating by using a two-point distance formula to obtain the distance deviation D on the three-dimensional line. The four directions are respectively represented as D_u，D_-u，D_v，D_-v。

c. And comparing the distances in the four directions, and synthesizing the transverse and longitudinal differences into a comprehensive difference.

The perpendicularity deviation P is:

5) and then calculating the deviation direction according to the arctan function of the distance deviation.

The formula of the deviation direction is as follows:

and S003, screening the reserved hole images of the same layer of reserved holes under different focal lengths, and integrating all screened relative verticality to obtain the absolute verticality.

The verticality between two floors can be obtained by calculation in images acquired under different focal lengths, but the corresponding measurement quality under different focal lengths is different, namely the measured data in the same image has different credibility at different positions; the relative vertical deviation between the two layers of ground also has good and bad difference in the measured data under the images collected by different focal lengths.

In the embodiment of the invention, the verticality deviation is measured by taking the pixel as a measurement unit and is established on the corresponding three-dimensional line, so that the quality of the measurement result is influenced by the physical quantity of the unit pixel and the division error of the three-dimensional line. According to the embodiment of the invention, the final perpendicularity data of the whole building is obtained by using the measurement data with the highest quality, so that the measurement data needs to be screened according to the measurement quality.

The method comprises the following specific steps:

1) and obtaining the measurement precision of each layer of preformed hole under the corresponding focal length by calculating the ratio of the shooting height of each layer of preformed hole in the preformed hole image corresponding to each focal length to the adopted focal length.

Calculating the measurement precision M corresponding to each layer of regional imaging_i：

Wherein M is_iTo representThe measurement accuracy of the reserved hole with the number i is shown in the specification, i represents the number of the reserved hole, CH represents the height of the floor, h represents the height of the camera support, and f represents the focal length corresponding to the current image.

The above calculation formula is obtained from similar triangles of the pinhole image.

Namely the following equation:

wherein L is_iNumber of pixels representing the edge length of the edge of the preformed hole, numbered i, D_iAnd the actual side length of the corresponding reserved hole with the number i is shown.

2) And taking the outermost preformed hole contour in each preformed hole image as a standard contour line, and calculating the multiple relation between the number of pixel points on the standard contour line and the number of pixel points of the contour of each layer of preformed holes to obtain the deviation degree.

The division of the solid lines is also performed in units of pixels, which are all used integers, corresponding to rounding operations. As shown in FIG. 5, judge q₂Whether or not the point on is q₁Integral multiple of the point above, the degree of deviation is:

wherein q is₁{q₂B represents q₂Divided by q₁The remainder is taken, b being the remainder.

3) And obtaining the imaging distortion degree according to the distance proportion from the point on the contour of the preformed hole to the center of the image of the preformed hole.

The smaller the distance G from a point on the outline of the preformed hole to the center of the image, the closer to the center, the smaller the degree of distortion.

4) Obtaining a measurement quality evaluation value according to the weighted sum of the measurement precision, the deviation degree and the imaging distortion degree; the measurement precision and the measurement quality evaluation value are in a negative correlation relationship, the deviation degree and the measurement quality evaluation value are in a negative correlation relationship, and the imaging distortion degree and the measurement quality evaluation value are in a positive correlation relationship.

Where yx denotes a measurement quality evaluation value at a certain focal length, and is a weight of each of three types of measurement quality evaluation indexes, α + β + μ is 1, and α > β > μ. Mi_(min)Indicating the minimum measurement accuracy at the current focal length, K is the wide dimension of the image,indicating the degree of distortion.

5) And selecting a layer of reserved holes as a reference layer, and obtaining the perpendicularity of a unified standard by taking the effective data as the reference layer as reference to be used as the absolute perpendicularity.

The method comprises the following specific steps:

selecting effective data; and screening the relative verticality with higher measurement quality evaluation value as effective data for the preformed hole images of the same layer of preformed holes under different focal lengths.

As an example, the vertical deviation between the reserved hole number 1 and the reserved hole number 2 at the focal distance f₁The time measurement obtains a vertical deviation P₁Measured mass of 2.1 at focal length f₂The verticality deviation is P obtained by time measurement₂Measuring mass 1.3, selecting vertical deviation P₁As the final integrated data.

As f increases, the field of view becomes smaller, the number of floors of information that can be collected decreases, wherein the number of valid measurements also decreases. And obtaining optimal measurement data according to the measurement quality evaluation value yx, selecting a layer of reserved holes as a reference layer, and obtaining data with unified standards as absolute verticality.

As an example, as shown in fig. 9, the embodiment of the present invention obtains the absolute perpendicularity with the building numbered 0 as a reference origin.

In summary, the embodiment of the present invention collects the images of the preformed holes of the buildings at different focal lengths, and the center of the preformed hole is located at the center of the image; extracting the outline of each layer of preformed hole in each preformed hole image; respectively connecting points with the same proportion on each edge of each preformed hole for each preformed hole image to obtain a plurality of three-dimensional lines; calculating the relative verticality of each reserved hole image according to the spacing distance of the three-dimensional lines; relative perpendicularity is characterized in terms of a perpendicularity deviation and deviation direction; and screening the preformed hole images of the same layer of preformed holes under different focal lengths according to the reliability of the relative verticality to obtain effective data, and integrating all the screened relative verticality to obtain the absolute verticality. The embodiment of the invention can accurately obtain the verticality of the super high-rise building, and has simple and convenient operation and high precision.

It should be noted that: the precedence order of the above embodiments of the present invention is only for description, and does not represent the merits of the embodiments. And specific embodiments thereof have been described above. Other embodiments are within the scope of the following claims. In some cases, the actions or steps recited in the claims may be performed in a different order than in the embodiments and still achieve desirable results. In addition, the processes depicted in the accompanying figures do not necessarily require the particular order shown, or sequential order, to achieve desirable results. In some embodiments, multitasking and parallel processing may also be possible or may be advantageous.

The embodiments in the present specification are described in a progressive manner, and the same and similar parts among the embodiments are referred to each other, and each embodiment focuses on the differences from the other embodiments.

The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.