阅读说明：本技术 行星际能量粒子探头、探测系统及探测方法 (Interplanetary energy particle probe, detection system and detection method ) 是由 王玲华 于向前 王永福 施伟红 宗秋刚 陈鸿飞 陈傲 杨芯 周率 于 2021-04-23 设计创作，主要内容包括：本发明提供一种行星际能量粒子探头、探测系统及探测方法,行星际能量粒子探头包括两套望远镜系统,望远镜系统包括两个望远镜单元,每一个望远镜单元均具有开口的第一端及第二端,望远镜单元还包括多层并排设置的半导体探测器。望远镜单元的第一端设置有吸收箔,第二端设置有磁偏转系统,半导体探测器设置在吸收箔和磁偏转系统之间,从而在望远镜单元的两端分别探测不同能量的中高能电子、质子以及中高能离子。行星际能量粒子探测系统采用本发明所述的行星际能量粒子探头,并且进行精细的能档划分,以实现在行星际空间中对能量电子、质子和氨离子的高精度实地探测,为研究太阳系高能粒子的起源和加速提供至关重要的观测数据。(The invention provides an interplanetary energy particle probe, a detection system and a detection method. The first end of the telescope unit is provided with an absorption foil, the second end of the telescope unit is provided with a magnetic deflection system, and the semiconductor detector is arranged between the absorption foil and the magnetic deflection system, so that middle and high energy electrons, protons and middle and high energy ions with different energies are respectively detected at the two ends of the telescope unit. The interplanetary energetic particle detection system adopts the interplanetary energetic particle probe and carries out fine energy level division so as to realize high-precision on-site detection of energetic electrons, protons and ammonia ions in an interplanetary space and provide vital observation data for researching origin and acceleration of solar system energetic particles.)

1. An interplanetary energy particle probe, comprising a mounting base and two sets of telescope systems mounted on the mounting base, wherein:

the telescope system comprises two telescope units and a fixing frame for supporting and fixing the telescope units, the axes of the two telescope units are parallel to each other and perpendicular to the plane of the fixing frame, and the axes of the telescope units in the two telescope systems are perpendicular to each other on the mounting base;

the telescope unit is provided with a first end and a second end, the first end and the second end are both provided with openings, on the fixing frame, the first end of the first telescope unit and the second end of the second telescope unit in the two telescope units are positioned on the same side of the fixing frame, and the second end of the first telescope unit and the first end of the second telescope unit are positioned on the other side of the fixing frame;

the telescope unit further comprises a plurality of layers of semiconductor detectors arranged side by side.

2. The interplanetary energy particle probe of claim 1, wherein each layer of the semiconductor detectors comprises a plurality of pixels.

3. The interplanetary energy particle probe of claim 1, wherein the plurality of layers of semiconductor detectors comprise 4 layers of semiconductor detectors arranged side-by-side, with a spacing between adjacent semiconductor detectors of less than 300 μm.

4. The interplanetary energy particle probe of any one of claims 1-3, wherein each layer of semiconductor detectors comprises 5 pixels, one of the 5 pixels being located at a middle position, and the remaining pixels being arranged around the middle position.

5. Interplanetary energy particle probe according to claim 1, wherein the telescope unit further comprises an absorbing foil and a magnetic deflection system, wherein,

the absorption foil is arranged at the first end of the telescope unit to block protons with energy lower than 400keV, so that the semiconductor detector detects high-energy electrons and medium-energy protons from the first end of the telescope unit;

the magnetic deflection system is arranged at the second end of the telescope unit to deflect electrons with energy lower than 400keV, so that the semiconductor detector detects the high-energy ions from the second end of the telescope unit;

the semiconductor detector is located between the absorbing foil and the magnetic deflection system.

6. The interplanetary energy particle probe of claim 5, wherein the interplanetary energy particle probe detects high energy electrons having an energy of 20keV to 1MeV, the medium energy protons having an energy of 25keV to 12MeV, and the medium energy ions having an energy of 1.5MeV to 10 MeV.

7. The interplanetary energy particle probe of claim 5, wherein the absorbing foil is spaced from the semiconductor detector near the first end by less than 0.5 μm, and the magnetic deflection system is spaced from the semiconductor detector near the second end by between 5 and 20 mm.

8. An interplanetary energy particle detection system, comprising:

an interplanetary energetic particle probe according to any one of claims 1 to 6;

the signal conditioning module is electrically connected with the interplanetary energy particle probe, amplifies an energy signal of incident particles detected by the interplanetary energy particle probe and converts the energy signal into energy and direction information of the incident particles;

and the data processing unit is electrically connected with the signal conditioning module and is used for processing the energy and direction information of the incident particles output by the signal conditioning module.

9. The interplanetary energetic particle detection system of claim 8, wherein the signal conditioning module comprises two signal conditioning units, and the two signal conditioning units are respectively connected with two sets of telescope systems in the interplanetary energetic particle probe.

10. The interplanetary energetic particle detection system of claim 8, further comprising a power supply unit comprising a low voltage power supply and a high voltage power supply, the low voltage power supply powering the signal conditioning module and the data processing unit, the high voltage power supply powering the interplanetary energetic particle probe.

11. The interplanetary energy particle detection system of claim 8, further comprising an upper computer communicatively coupled to the data processing unit and sending instructions to the data processing unit.

12. A interplanetary energetic particle detection method is characterized by comprising the following steps:

detecting incident particles in interplanetary space with an interplanetary energy particle probe, the interplanetary energy particle probe being as claimed in any one of claims 1 to 6;

amplifying the energy signal of the incident particle and converting the energy signal into energy and direction information of the incident particle;

screening electrons, protons and ions with different energies and different directions according to the energy and direction information of the incident particles, and counting the electrons, the protons and the ions;

and processing the counting information of the electrons, the protons and the ions to complete data packaging.

13. The interplanetary energy particle detection method of claim 12, wherein the steps of screening and counting electrons, protons, and ions of different energies and different directions according to the energy and direction information of the incident particles further comprise:

the electrons, protons, and ions in the incident particles are respectively energy-step divided according to the exponential distribution of the energy spectrum of the incident particles, the energy of the incident electrons is divided into 39 energy steps, the energy of the incident protons is divided into 59 energy steps, and the energy of the incident ions is divided into 19 energy steps.

Technical Field

The application relates to the field of space particle observation, in particular to an interplanetary energy particle probe, a detection system and a detection method.

Background

The origin and acceleration of solar high-energy particles have been one of the important frontier topics of space physics. Solar high-energy particles observed in interplanetary space are mainly classified into two types: one is a persistent "solar wind high energy particle" and one is an intermittent "solar high energy particle event". For solar energetic particle events, it is generally thought to originate from solar explosive activity, but the physical mechanism and nature of its particle acceleration process is not clear. For solar wind high-energy particles, due to the limited sensitivity of the conventional particle detectors, the observed data are limited, so that the origin and acceleration mechanism of the particles are still poorly known.

The sun is an excellent natural particle accelerator that can accelerate ions from tens of keV up to tens of GeV and electrons from tens of eV up to hundreds of MeV during various transients, particularly solar flare and coronage ejection (Lin, 2005). When the acceleration region is connected to open magnetic lines, the accelerated charged particles can escape into interplanetary space along the open magnetic lines, and be observed by a particle detector on the satellite: these charged particles are much more energetic than thermal plasma energy, and their flux is characterized by significant velocity dispersion (i.e., fast particles arrive at the satellite earlier than slow particles), a phenomenon known as solar high-energy particle events. These particles carry information on the origin and acceleration process of the energetic particles. Solar energetic particle events observed around 1AU are generally divided into two categories: slow-varying types and impulse types.

Many recent studies have shown that the correlation of slow-varying solar energetic particle events with coronal mass ejection is much more complex than previously thought. In addition, the particle energy spectrum of the solar energetic particle event is generally a double power law spectrum, and the generation of the double power law spectrum cannot be explained by the existing particle acceleration theory and model. Thus, we are not aware of the specific acceleration regions, mechanisms and processes of the modified solar energetic particle event at the present time. The local shock wave acceleration phenomenon in the interplanetary space can provide a breakthrough for solving the serious scientific problems, but the existing interplanetary space energy particle detector cannot observe the fine space-time characteristics of the local shock wave particle acceleration process due to the limitations of energy level resolution, angle resolution and time resolution. Therefore, in order to explore the major scientific problem of origin and acceleration of slowly varying solar energetic particles, we need to perform high-precision field observation of energy particles in interplanetary space.

Pulsed solar energetic particle events (also referred to as "electron-rich and 3 He" solar energetic particle events) consist primarily of-1-100 keV electrons, accompanied by low intensity ions of energy-MeV/nucleon (FIG. 4), and high ionization states for ions rich in He ions, heavy nuclei (e.g., Fe abundances increased by-10 times), and overweight nuclei >200 amu. This type of event is the most common particle acceleration phenomenon that occurs on the sun. Furthermore, recent studies have found that in pulsed solar high-energy particle events, low-energy electrons, high-energy electrons and He-rich ions are not generally accelerated and released simultaneously on the sun: low-energy electrons are accelerated and released, and the electrons generate type III radio shots through interaction with corona-solar atmosphere and solar wind plasma; the high-energy electrons are accelerated and released about 10-30 minutes after the start of the type III radio-shot; ions rich in 3He are accelerated and released approximately one hour after the onset of a type iii radio burst.

Previous studies have proposed that impulse-type solar high-energy particle pieces are accelerated in impulse-type solar flares. However, it was recently discovered that only one third of the "ammonia 3 rich" solar high-energy electron events observed around 1AU were associated with soft X-ray flare, while 60% were associated with coronal mass ejection from the west side of the sun. Many observation studies have also shown that these solar energy particles may be associated with solar jets. Therefore, the origin and acceleration of the pulse-type solar energetic particle event is not clear. This is probably because most of the pulse-type solar high-energy particle events have narrow energy range, small particle flux, very short duration (< minutes), and small angular width of the beam moving along the magnetic field lines, so the existing interplanetary space energy particle detector cannot detect these small events due to the limitations of energy resolution, time resolution, and angular resolution. Therefore, in order to overcome the serious scientific problem of how the impulse-type solar energetic particles originate and accelerate, it is also necessary to perform high-precision field observation of the energetic particles in the interplanetary space.

The flux of solar wind energetic particles is low. Because the sensitivity of the conventional particle detector is relatively limited, long-time data accumulation is required to obtain enough particle counts to realize effective observation of solar wind high-energy particles. The limited detector sensitivity limits the knowledge of the fine spatiotemporal characteristics of solar wind energetic particles. Therefore, the origin and acceleration of such high energy particle phenomena, which are more prevalent in interplanetary space, are poorly understood. At present, China is still blank in the field of interplanetary energy particle detectors. Therefore, the development of a high-precision and low-noise energy particle instrument is an important frontage scientific subject for overcoming the origin and acceleration of solar high-energy particles and fills the urgent need of China for filling the blank in the field of interplanetary space energy particle detectors.

Disclosure of Invention

Aiming at the defects in the aspect of interplanetary space energy particle detection, the invention provides an interplanetary energy particle probe, a detection system and a detection method. The interplanetary energy particle probe comprises two telescope systems, each telescope system comprises two telescope units, each telescope unit is provided with a first end and a second end, and the telescope units further comprise a plurality of layers of semiconductor detectors arranged side by side. The first end of the telescope unit is provided with an absorption foil, the second end of the telescope unit is provided with a magnetic deflection system, and the semiconductor detector is arranged between the absorption foil and the magnetic deflection system, so that middle and high energy electrons, protons and middle and high energy particles with different energies are respectively detected at the two ends of the telescope unit. The interplanetary energy particle probe, the detection system comprising the probe and the detection method can distinguish electrons, protons and particles, realize fine energy level observation and obtain high energy level resolution.

According to a first aspect of the present invention there is provided an interplanetary energy particle probe comprising: mounting base and install two sets of telescope systems on mounting base, wherein:

the telescope system comprises two telescope units and a fixing frame for supporting and fixing the telescope units, the axes of the two telescope units are parallel to each other and perpendicular to the plane of the fixing frame, and the axes of the telescope units in the two telescope systems are perpendicular to each other on the mounting base;

the telescope unit is provided with a first end and a second end, the first end and the second end are both provided with openings, on the fixing frame, the first end of the first telescope unit and the second end of the second telescope unit in the two telescope units are positioned on the same side of the fixing frame, and the second end of the first telescope unit and the first end of the second telescope unit are positioned on the other side of the fixing frame;

the telescope unit further comprises a plurality of layers of semiconductor detectors arranged side by side.

Optionally, each layer of the semiconductor detector comprises a plurality of pixels.

Optionally, the plurality of layers of semiconductor detectors comprises 4 layers of semiconductor detectors arranged side by side, and the spacing between adjacent semiconductor detectors is less than 300 μm.

Optionally, each layer of the semiconductor detector comprises 5 pixels, one of the 5 pixels is located at a middle position, and the rest pixels are arranged around the middle position.

Optionally, the telescope unit further comprises an absorption foil and a magnetic deflection system, wherein,

the absorption foil is arranged at the first end of the telescope unit to block protons with energy lower than 400keV, so that the semiconductor detector detects high-energy electrons and medium-energy protons from the first end of the telescope unit;

the magnetic deflection system is arranged at the second end of the telescope unit to deflect electrons with energy lower than 400keV, so that the semiconductor detector detects the high-energy ions from the second end of the telescope unit;

the semiconductor detector is located between the absorbing foil and the magnetic deflection system.

Optionally, the energy of the high-energy electrons detected by the interplanetary energy particle probe is between 20keV and 1MeV, the energy of the medium-energy protons is between 25keV and 12MeV, and the energy of the medium-energy ions is between 1.5MeV and 10 MeV.

Optionally, the absorption foil is spaced from the semiconductor detector near the first end by less than 0.5 μm, and the magnetic deflection system is spaced from the semiconductor detector near the second end by 5-20 mm.

According to another aspect of the invention, there is provided an interplanetary energetic particle detection system, the detection system comprising:

the interplanetary energy particle probe is the interplanetary energy particle probe provided by the invention;

the signal conditioning module is electrically connected with the interplanetary energy particle probe, amplifies an energy signal of incident particles detected by the interplanetary energy particle probe and converts the energy signal into energy and direction information of the incident particles;

and the data processing unit is electrically connected with the signal conditioning module and is used for processing the energy and direction information of the incident particles output by the signal conditioning module.

Optionally, the signal conditioning module includes two signal conditioning units, and the two signal conditioning units are respectively connected with two sets of telescope systems in the interplanetary energy particle probe.

Optionally, the interplanetary energy particle detection system further includes a power supply unit, where the power supply unit includes a low-voltage power supply and a high-voltage power supply, the low-voltage power supply supplies power to the signal conditioning module and the data processing unit, and the high-voltage power supply supplies power to the interplanetary energy particle probe.

Optionally, the interplanetary energy particle detection system further comprises an upper computer, and the upper computer is in communication connection with the data processing unit and sends an instruction to the data processing unit.

According to another aspect of the present invention, there is provided an interplanetary energy particle detection method, comprising the steps of:

detecting incident particles in interplanetary space by using an interplanetary energy particle probe, wherein the interplanetary energy particle probe is the interplanetary energy particle probe provided by the invention;

amplifying the energy signal of the incident particle and converting the energy signal into energy and direction information of the incident particle;

screening electrons, protons and ions with different energies and different directions according to the energy and direction information of the incident particles, and counting the electrons, the protons and the ions;

and processing the counting information of the electrons, the protons and the ions to complete data packaging.

Optionally, screening out electrons, protons, and ions of different energies and different directions according to the energy and direction information of the incident particle, and counting the electrons, protons, and ions further includes the following steps:

the electrons, protons, and ions in the incident particles are respectively energy-step divided according to the exponential distribution of the energy spectrum of the incident particles, the energy of the incident electrons is divided into 39 energy steps, the energy of the incident protons is divided into 59 energy steps, and the energy of the incident ions is divided into 19 energy steps.

The interplanetary energy particle probe, the detection system and the detection method have the following beneficial effects:

the interplanetary energy particle probe comprises two telescope systems, each telescope system comprises two telescope units, each telescope unit is provided with a first end and a second end, and the telescope units further comprise a plurality of layers of semiconductor detectors arranged side by side. The first end of the telescope unit is provided with an absorption foil, the second end of the telescope unit is provided with a magnetic deflection system, and the semiconductor detector is arranged between the absorption foil and the magnetic deflection system, so that middle and high energy electrons, protons and middle and high energy particles with different energies are respectively detected at the two ends of the telescope unit.

The interplanetary energy particle detection system adopts the interplanetary energy particle probe and carries out fine energy stage division to realize high-precision on-site detection of energy electrons, protons and ammonia ions in interplanetary space, for example, the detection system can measure electrons with energy from 20keV to 1MeV, protons with energy from 25keV to 12MeV and helium ions with energy from 1.5MeV to 10MeV, the total field of view is 180 x 90 degrees, the energy stage resolution is delta E/E <0.1, the angular resolution is <8 degrees, the time resolution is 1 second (electrons and protons) and 10 seconds (helium ions). High precision in-situ detection of energetic electrons, protons and ammonia ions in interplanetary space can provide vital observation data for studying the origin and acceleration of solar system energetic particles.

Drawings

The features and advantages of the present invention will be more clearly understood by reference to the accompanying drawings, which are illustrative and not to be construed as limiting the invention in any way, and in which:

fig. 1 is a schematic structural diagram of an interplanetary energy particle probe according to an embodiment of the present invention.

Fig. 2 shows a schematic top sectional view of the telescope unit of fig. 1.

Fig. 3 is a schematic structural diagram of the semiconductor detector in fig. 2.

Fig. 4 is a functional block diagram of an interplanetary energy particle detection system according to a second embodiment of the present invention.

Fig. 5 is a schematic flowchart illustrating a interplanetary energetic particle detection method according to a third embodiment of the present invention.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Example one

As shown in fig. 1, the interplanetary energy particle probe 100 provided in this embodiment includes a mounting base 101 and two sets of telescope systems mounted on the mounting base 101: a first telescope system 1021 and a second telescope system 1022. In an alternative embodiment, the mounting base 101 may be a power supply housing of an interplanetary energetic particle probe.

Each telescope system comprises two telescope units and a fixing frame for supporting and fixing the telescope units, and the horizontal plane of the fixing frame is arranged on the mounting base 101. As shown in fig. 1, the first telescope system 1021 includes a mount 1021-1, and a first telescope unit 1021-2 and a second telescope unit 1021-3 fixed to the mount 1021-1. The second telescope system 1022 includes a fixed frame 1022-1, and a first telescope unit 1022-2 and a second telescope unit 1022-3 fixed to the fixed frame 1022-1. On the fixing frame, the axes of the first telescope unit and the second telescope unit are parallel to each other, and the first telescope unit and the second telescope unit are arranged on the fixing frame in a vertical plane perpendicular to the fixing frame.

Referring also to fig. 1, vertical planes of mounts 1021-1 and 1022-1 of the first telescope system 1021 and the second telescope system 1022 are mounted on the mounting base perpendicularly to each other, and the mounts 1021-1 and 1022-1 are spaced apart from each other. Accordingly, the axes of the telescope units on the two mounts are also perpendicular to each other, i.e., the axis 1021-30 of the second telescope unit 1021-3 of the first telescope system 1021 and the axis 1022-30 of the second telescope unit 1022-3 of the second telescope system 1022 are perpendicular to and intersect each other, and similarly, the axis (not shown) of the first telescope unit 1021-1 of the first telescope system 1021 and the axis (not shown) of the first telescope unit 1022-2 of the second telescope system 1022 are perpendicular to and intersect each other. The installation mode of the telescope system can realize the coverage of near-omnidirectional field angles.

To further illustrate the manner of mounting the telescope unit on the mount, fig. 2 illustrates the manner of mounting the telescope unit in the telescope system by taking a first telescope system 1021 as an example. As shown in FIG. 2, each telescope unit (the first telescope unit 1021-2 and the second telescope unit 1021-3) has an open first end 103 and a second end 104. On the fixing frame, the first end 103 of the first telescope unit 1021-2 and the second end 104 of the second telescope unit 1021-3 are located on the same side of the fixing frame 1021-1, and the second end 104 of the first telescope unit 1021-2 and the first end 103 of the second telescope unit 1021-3 are located on the other side of the fixing frame 1021-1.

Referring also to fig. 2, a plurality of layers of side-by-side semiconductor detectors 105 are disposed in each telescope unit, the semiconductor detectors being disposed in an intermediate region between the first end 103 and the second end 104. In an alternative embodiment, as shown in fig. 3, each telescope unit comprises 4 layers of side-by-side semiconductor detectors 105, and in order to reduce signal noise that may be caused by other energetic particles, the spacing between two adjacent layers of semiconductor detectors is as small as possible, and in this embodiment, the spacing between two adjacent layers of semiconductor detectors is less than 300 μm. Each layer of semiconductor detectors 105 includes 5 pixels, i.e., a first pixel 1051, a second pixel 1052, a third pixel 1053, a fourth pixel 1054, and a fifth pixel 1055, which are preferably high-sensitivity silicon semiconductor detectors. The silicon semiconductor detector is a small (3mm by 3mm) low-capacitance detector, and the window dead layer is only formedThe electrostatic silicon semiconductor detector can detect electrons with energy lower than 2keV, and the energy threshold of the electrostatic silicon semiconductor detector is far lower than the threshold of the electrostatic silicon semiconductor detector and is not lower than 20-30 keV. In this embodiment, each layer of semiconductor detector includes a fixed shell 1050, and the fixed shell 1050 is preferably usedA circular hollow housing, 5 pixels in the semiconductor detector being arranged one in the middle, and the remaining four pixels being distributed in a circle around the middle pixel and fixed in the hollow housing 1050. In addition, the semiconductor detector 105 is also provided with a data transmission interface 1056 for data interaction with an external data processing unit. The semiconductor detector of the present embodiment can obtain an angular resolution of less than 8 ° by adopting the above arrangement design of 4 layers × 5 pixels.

Still referring to fig. 2, at the first end 103 of the telescope unit, an absorbing foil 106 is arranged, which absorbing foil 106 is located on the outside of the semiconductor detector 105 for blocking protons with an energy below 400keV, which absorbing foil in an alternative embodiment is a polycarbonate foil. The absorption foil is spaced from said semiconductor detector near said first end by less than 1 μm, preferably less than 0.5 μm, most preferably the absorption foil is in close proximity to the semiconductor detector. The absorption foil blocks protons and other ions of energy below 400keV in the high-energy particles incident from the first end of the telescope unit, whereby the semiconductor detector detects high-energy (20keV to 1MeV) electrons and high-energy (25keV to 12MeV) protons incident from the first end of the telescope unit. The second end 104 of the telescope unit is provided with a magnetic deflection system 107 near the middle area of the telescope unit, which magnetic deflection system 107 is also located outside the semiconductor detector 105, thereby forming a structure in which the semiconductor detector 105 is located between the absorbing foil 106 and the magnetic deflection system. The distance between the magnetic deflection system and the semiconductor detector close to the second end is adjustable, and is determined comprehensively according to the size of the detector, the size of an opening of the magnet, the thickness of the opening of the magnet, the magnetic field intensity and other parameters, so that the geometric factor of the instrument is maximized; in an alternative embodiment, the magnetic deflection system is spaced from the semiconductor detector near the second end by 5-20 mm. In an alternative embodiment, the magnetic deflection system may be a magnet-generated magnetic deflection system capable of deflecting electrons having an energy below 400keV without affecting the medium and high energy ions, whereby the semiconductor detector 105 is capable of detecting medium and high energy ions incident from the second end of the telescope unit, the medium and high energy ions detected by the semiconductor detector being helium ions having an energy between 1.5MeV and 10MeV in the preferred embodiment. The design of the semiconductor detector, the absorption foil and the magnetic deflection system in the embodiment enables the telescope system to detect different types of high-energy particles respectively, and facilitates subsequent counting and classification of different particles.

As described above, the interplanetary energy particle probe of the present embodiment is capable of measuring electrons with energies from 20keV to 1MeV, protons with energies from 25keV to 12MeV, and helium ions with energies from 1.5MeV to 10MeV, with a total field of view of 180 × 90 °, an angular resolution of less than 8 °, a temporal resolution of 1 second (electrons and protons) and 10 seconds (ammonia ions), enabling accurate detection of different charged particles.

Example two

In this embodiment, as shown in fig. 4, the interplanetary energetic particle detection system includes an interplanetary particle probe, a signal conditioning module and a data processing unit.

In this embodiment, the interplanetary particle probe is the interplanetary particle probe described in the first embodiment, and reference may be made to the description of the first embodiment, which is not described in detail herein.

Referring to fig. 4, in the present embodiment, the signal conditioning module mainly includes two signal conditioning units, and the signal conditioning units are preferably an ASIC chip and an FPGA chip. The two ASIC chips and the FPGA chip are respectively in communication connection with the first telescope unit and the second telescope unit of the interplanetary particle probe and are used for receiving a weak signal output by a semiconductor detector in the telescope unit and amplifying the weak signal. The weak signal output by the semiconductor detector contains incident particle energy information, the ASIC chip and the FPGA chip receive and amplify the weak signal and then convert the weak signal into the energy and direction information of the particles, and the discrimination, counting and accumulation of electrons, protons and helium ions with different directions and energies are completed, so that the subsequent particle data processing is facilitated. The data processing unit is in communication connection with the signal adjusting module, receives the data information from the signal adjusting module, processes the received data information, and completes the packaging, storage and sending of data.

In this embodiment, the signal conditioning module and the data processing module are disposed in an electronics housing, and the electronics housing can be used as the mounting base 101 of the interplanetary particle probe shown in fig. 1.

Referring to fig. 4 as well, in this embodiment, the interplanetary energy particle detection system further includes an upper computer, which is in communication connection with the data processing unit and can send an instruction to the data processing unit, and the data processing unit receives and executes the instruction. In addition, although not shown, the interplanetary energy particle detection system further comprises a power supply unit, wherein the power supply unit comprises a high-voltage power supply and a low-voltage power supply, the high-voltage power supply is used for supplying power to the interplanetary energy particle probe, and the high-voltage power supply is used for supplying power to electronic circuit parts such as the signal processing module and the data processing module. Preferably, the power supply unit is disposed within the power supply cabinet.

As described above, the interplanetary energy particle detection system of the present embodiment employs a low-noise multi-channel integrated preamplifier technology, which can realize fine energy level observation and obtain high energy level resolution (Δ E/E < 0.1).

EXAMPLE III

The embodiment provides a interplanetary energetic particle detection method, as shown in fig. 5, the method includes the following steps:

step S101: detecting incident particles in interplanetary space by using an interplanetary energy particle probe, wherein the interplanetary energy particle probe is provided by the embodiment of the invention;

as described in the first embodiment, the absorption foil and the magnetic deflection system are arranged at the first and second end of the telescope unit, respectively, so that the detector detects high energy (energy between 20keV and 1MeV) electrons and medium energy protons (energy between 25keV and 12MeV) from the first end of the telescope unit and medium energy (helium ions with ion energy between 1.5MeV and 10 MeV) from the second end of the telescope unit.

Step S102: amplifying the energy signal of the incident particle and converting the energy signal into energy and direction information of the incident particle;

step S103: screening electrons, protons and ions with different energies and different directions according to the energy and direction information of the incident particles, and counting the electrons, the protons and the ions;

step S104: and processing the counting information of the electrons, the protons and the ions to complete data packaging.

In this embodiment, the signal conditioning module described in the second embodiment is used to amplify the energy signal of the incident particle and convert the energy signal into energy and direction information of the incident particle. As described in the second embodiment, the signal conditioning module mainly includes two signal conditioning units, and the signal conditioning units are preferably an ASIC chip and an FPGA chip. The two ASIC chips and the FPGA chip are respectively in communication connection with the first telescope unit and the second telescope unit of the interplanetary particle probe and are used for receiving a weak signal output by a semiconductor detector in the telescope unit and amplifying the weak signal. The weak signal output by the semiconductor detector contains incident particle energy information, the ASIC chip and the FPGA chip receive and amplify the weak signal and then convert the weak signal into the energy and direction information of the particles, and the discrimination, counting and accumulation of electrons, protons and helium ions with different directions and energies are completed, so that the subsequent particle data processing is facilitated. And processing the counting information of the electrons, the protons and the ions by using the data processing unit of the second embodiment to complete data packaging, storage and transmission.

In order to count the electrons, protons and ions more finely, the method of the present embodiment further includes energy-level-dividing the electrons, protons and ions in the incident particles respectively according to the exponential distribution of the energy spectrum of the incident particles, preferably, the energy of the incident electrons is divided into 39 energy levels as shown in table 1 below; as shown in table 2 below, the energy of the incident protons was divided into 59 energy bins; the energy of the incident ions was divided into 19 energy bins as shown in table 3 below. The main reason why the present embodiment adopts the exponential distribution to finely divide the energy bands is that the energy spectrum distribution of the space particles is in an exponential form. If a linear energy interval is used, the low energy level flux may be more than an order of magnitude higher than the highest energy level flux, which may significantly affect the effectiveness of the high energy level data. Therefore, the energy level is divided according to the exponential distribution rule of the energy spectrum, namely, the energy level interval is in direct proportion to the flux, the actual situation of the space radiation environment is better met, and the detection and the analysis research are facilitated.

TABLE 1 energy grading of incident electrons

E1	20.0～22.1keV	E21	148.7～164.4keV
				E2	22.1～24.4keV	E22	164.4～181.7keV
E3	24.4～27.0keV	23	181.7～200.9keV
				E4	27.0～29.9keV	E24	200.9～222.1keV
E5	29.9～33.0keV	E25	222.1～245.5keV
				E6	33.0～36.5keV	E26	245.5～271.4keV
E7	36.5～40.4keV	E27	271.4～300.1keV
				E8	40.4～44.6keV	E28	300.1～331.7keV
E9	44.6～49.3keV	29	331.7～366.8keV
				E10	49.3～54.5keV	E30	366.8～405.4keV
E11	54.5～60.3keV	E31	405.4～448.2keV
				E12	60.3～66.7keV	E32	448.2～495.5keV
E13	66.7～73.7keV	E33	495.5～547.8keV
				E14	73.7～81.5keV	E34	547.8～605.6keV
E15	81.5～90.1keV	E35	605.6～669.5keV
				E16	90.1～99.6keV	E36	669.5～740.1keV
E17	99.6～110.1keV	E37	740.1～818.2keV
				E18	110.1～121.7keV	E38	818.2～904.6keV
E19	121.7～134.5keV	E39	904.6～1000keV
				E20	134.5～148.7keV	E40

TABLE 2 energy binning of incident protons

P1	25.0-27.8keV	P21	202.7-225.1keV	P41	1643.4-1824.6keV
						P2	27.8-30.8keV	P22	225.1-249.9keV	P42	1824.6-2025.9keV
P3	30.8-34.2keV	P23	249.9-277.4keV	P43	2025.9-2249.4keV
						P4	34.2-38.0keV	P24	277.4-308.0keV	P44	2249.4-2497.5keV
P5	38.0-42.2keV	P25	308.0-342.0keV	P45	2497.5-2773.0keV
						P6	42.2-46.8keV	P26	342.0-379.8keV	P46	2773.0-3078.9keV
P7	46.8-52.0keV	P27	379.8-421.6keV	P47	3078.9-3418.6keV
						P8	52.0-57.7keV	P28	421.6-468.2keV	P48	3418.6-3795.7keV
P9	57.7-64.1keV	P29	468.2-519.8keV	P49	3795.7-4214.4keV
						P10	64.1-71.2keV	P30	519.8-577.1keV	P50	4214.4-4679.3keV
P11	71.2-79.0keV	P31	577.1-640.8keV	P51	4679.3-5195.4keV
						P12	79.0-87.8keV	P32	640.8-711.5keV	P52	5195.4-5768.6keV
P13	87.8-97.4keV	P33	711.5-790.0keV	P53	5768.6-6404.9keV
						P14	97.4-108.2keV	P34	790.0-877.1keV	P54	6404.9-7111.4keV
P15	108.2-120.1keV	P35	877.1-973.9keV	P55	7111.4-7895.9keV
						P16	120.1-133.4keV	P36	973.9-1081.3keV	P56	7895.9-8766.9keV
P17	133.4-148.1keV	P37	1081.3-1200.6keV	P57	8766.9-9734.0keV
						P18	148.1-164.4keV	P38	1200.6-1333.0keV	P58	9734.0-10807.8keV
P19	164.4-182.6keV	P39	1333.0-1480.1keV	P59	10807.8-12000.0keV
						P20	182.6-202.7keV	P40	1480.1-1643.4keV

TABLE 3 energy binning of incident ions

He1	1500.0-1657.5keV	He11	4071.2-4498.7keV
				He2	1657.5-1831.5keV	He12	4498.7-4971.1keV
He3	1831.5-2023.9keV	He13	4971.1-5493.1keV
				He4	2023.9-2236.4keV	Hel4	5493.1-6069.9keV
He5	2236.4-2471.2keV	He15	6069.9-6707.3keV
				He6	2471.2-2730.7keV	He16	6707.3-7411.6keV\
He7	2730.7-3017.4keV	He17	7411.6-8189.8keV
				He8	3017.4-3334.3keV	He18	8189.8-9049.7keV
He9	3334.3-3684.4keV	He19	9049.7-10000.0keV
				He10	3684.4-4071.2keV

The interplanetary energy particle probe, the detection system and the detection method have the following beneficial effects:

the interplanetary energy particle probe comprises two telescope systems, each telescope system comprises two telescope units, each telescope unit is provided with a first end and a second end, and the telescope units further comprise a plurality of layers of semiconductor detectors arranged side by side. The first end of the telescope unit is provided with an absorption foil, the second end of the telescope unit is provided with a magnetic deflection system, and the semiconductor detector is arranged between the absorption foil and the magnetic deflection system, so that middle and high energy electrons, protons and middle and high energy particles with different energies are respectively detected at the two ends of the telescope unit.

The interplanetary energy particle detection system adopts the interplanetary energy particle probe and carries out fine energy stage division to realize high-precision on-site detection of energy electrons, protons and ammonia ions in interplanetary space, for example, the detection system can measure electrons with energy from 20keV to 1MeV, protons with energy from 25keV to 12MeV and helium ions with energy from 1.5MeV to 10MeV, the total field of view is 180 x 90 degrees, the energy stage resolution is delta E/E <0.1, the angular resolution is <8 degrees, the time resolution is 1 second (electrons and protons) and 10 seconds (helium ions). High precision in-situ detection of energetic electrons, protons and ammonia ions in interplanetary space can provide vital observation data for studying the origin and acceleration of solar system energetic particles.

The foregoing embodiments are merely illustrative of the principles of this invention and its efficacy, rather than limiting it, and various modifications and variations can be made by those skilled in the art without departing from the spirit and scope of the invention, which is defined in the appended claims.