Resin film manufacturing apparatus and resin film manufacturing method
阅读说明:本技术 树脂膜制造装置及树脂膜制造方法 (Resin film manufacturing apparatus and resin film manufacturing method ) 是由 前西隆一郎 原本信洋 藤井文武 于 2020-03-09 设计创作,主要内容包括:本发明涉及一种树脂膜制造装置及树脂膜制造方法,在一种实施方式的树脂膜制造装置中,首先根据从厚度传感器获得的从树脂膜厚度分布中计算出的控制误差,确定每一加热螺栓的当前状态以及针对之前选择的操作的回馈,然后根据该回馈,更新作为状态和条件的组合的控制条件,并从更新后的控制条件中选择与当前状态相应的最恰当操作。随后,根据所述最恰当操作,对加热件进行控制。(In one embodiment, a current state of each heating bolt and a feedback for a previously selected operation are first determined based on a control error calculated from a resin film thickness distribution obtained from a thickness sensor, and then, based on the feedback, a control condition that is a combination of the state and the condition is updated, and an optimum operation corresponding to the current state is selected from the updated control conditions. Subsequently, the heating member is controlled in accordance with the most appropriate operation.)
1. A resin film manufacturing apparatus, comprising:
a die including a plurality of pairs of heating bolts arranged along long sides of a pair of die lips and a heating member for heating the heating bolts, the die being capable of adjusting a die lip gap for each of the heating bolts;
a cooling roller that cools the film-shaped molten resin extruded from the gap between the pair of die lips and discharges a resin film that is a solidified form of the molten resin;
a thickness sensor that measures a thickness distribution in a width direction of the resin film discharged from the cooling roll; and
a control unit that performs feedback control on the die lip gap based on a thickness distribution obtained from the thickness sensor, wherein,
for each of the heating bolts, the control unit:
determining a current state and feedback for a previously selected operation based on a control error calculated from the thickness profile;
updating control conditions according to the feedback, and selecting the most appropriate operation corresponding to the current state from the updated control conditions, wherein the control conditions are the combination of the state and the operation; and is
Controlling the heating member according to the most suitable operation.
2. The resin film manufacturing apparatus according to claim 1, wherein said operation is modification of an output of said heating member.
3. The resin film manufacturing apparatus according to claim 1, wherein said operation is modification of a parameter of a PID controller for controlling an output of said heating member.
4. The resin film manufacturing apparatus according to claim 1, wherein the thickness sensor is a non-contact sensor.
5. The resin film manufacturing apparatus according to claim 4, wherein the thickness sensor measures a thickness distribution in a width direction of the resin film by scanning in the width direction of the resin film.
6. The resin film manufacturing apparatus according to claim 5, wherein the thickness sensor measures the thickness distribution in the width direction of the resin film that is horizontally conveyed.
7. The resin film manufacturing apparatus according to claim 1, wherein only one of the pair of die lips is connected to the heating bolt.
8. A method for producing a resin film, comprising the steps of:
(a) extruding a film-like molten resin from a gap between a pair of die lips of a die;
(b) conveying a resin film, which is a solidified form of the molten resin, and measuring a thickness distribution of the resin film in a width direction; and
(c) feedback control is applied to the die lip gap based on the measured thickness profile, wherein,
the die includes a plurality of pairs of heating bolts provided along the long sides of the pair of die lips and a heating member for heating the heating bolts, and the die lip gap can be adjusted for each of the heating bolts,
in the step (c), for each of the heating bolts, a computer:
(c1) determining a current state and feedback for a previously selected operation based on a control error calculated from the thickness profile;
(c2) updating control conditions according to the feedback, and selecting the most appropriate operation corresponding to the current state from the updated control conditions, wherein the control conditions are the combination of the state and the operation; and is
(c3) Controlling the heating member according to the most suitable operation.
9. The resin film manufacturing method according to claim 8, wherein said operation determined in said step (c2) is modification of an output of said heating element.
10. The resin film manufacturing method according to claim 8, wherein said operation determined in said step (c2) is modification of a parameter of a PID controller for controlling an output of said heating element.
11. The resin film manufacturing method according to claim 8, wherein in the step (b), a thickness distribution in a width direction of the resin film is measured by a noncontact thickness sensor.
12. The resin film manufacturing method according to claim 11, wherein the thickness sensor measures a thickness distribution in a width direction of the resin film by scanning in the width direction of the resin film.
13. The resin film manufacturing method according to claim 12, wherein the thickness sensor measures the thickness distribution in the width direction of the resin film that is horizontally conveyed.
14. The resin film manufacturing method according to claim 8, wherein only one of the pair of die lips is attached to the heating bolt.
Technical Field
The present invention relates to a resin film manufacturing apparatus and a resin film manufacturing method.
Background
In one known resin film manufacturing apparatus, a film-shaped molten resin is extruded through a gap between die lips provided on an extruder. In such a resin film manufacturing apparatus, it is necessary to achieve a uniform film thickness in the resin film width direction.
Therefore, the mold disclosed in japanese unexamined patent application publication nos. 2010-167584, 2012-240332, 2013-052574 includes a plurality of heating bolts provided along the long side direction of the die lip (the resin film width direction). By individually adjusting the degree of thermal expansion caused by the heater of each heating bolt, the die lip gap of the die can be locally adjusted.
Further, japanese unexamined patent application publication No. 2013-039677 discloses a resin film manufacturing apparatus capable of measuring the thickness of a resin film during the manufacturing process and performing feedback control on the die lip gap of a mold.
Disclosure of Invention
The present inventors have found that various problems are involved in the development of a resin film manufacturing apparatus including a die having a plurality of heating bolts and capable of feedback-controlling a lip gap.
Other problems and novel features of the present disclosure will become apparent from the description of the specification and the drawings.
In the resin film manufacturing apparatus of an embodiment, first, the current state of each heating bolt and the feedback for the previously selected operation are determined based on the control error calculated from the resin film thickness distribution obtained from the thickness sensor, then, based on the feedback, the control conditions as the state/condition combination are updated, and the most appropriate operation corresponding to the current state is selected from the updated control conditions. Subsequently, the heating member is controlled in accordance with the most appropriate operation.
According to this embodiment, an excellent resin film manufacturing apparatus can be provided.
The above and other objects, features and advantages of the present disclosure will be more fully understood from the following detailed description and the accompanying drawings. Wherein the description and drawings are for illustrative purposes only and are not to be construed as limiting the present disclosure.
Drawings
Fig. 1 is a schematic cross-sectional view of the overall structure of a resin film manufacturing apparatus and a resin film manufacturing method according to a first embodiment.
Fig. 2 is a cross-sectional view of the T-die 20.
Fig. 3 is a partial perspective view of the lower portion (with die lips) of the T-
Fig. 4 is a block diagram showing the configuration of the
Fig. 5 is a flowchart of a method for controlling a die lip gap in the method for manufacturing a resin film according to the first embodiment.
Fig. 6 is a block diagram showing the structure of the
Detailed Description
Hereinafter, specific embodiments of the present disclosure will be described in detail with reference to the accompanying drawings. However, the present disclosure is not limited to the following embodiments. The following description and drawings are appropriately shortened and simplified for clarity of illustration.
First embodiment
< integral Structure of resin film production apparatus >
First, referring to fig. 1, the overall structure of the resin film manufacturing apparatus and the resin film manufacturing method of the first embodiment is described. Fig. 1 is a schematic cross-sectional view of the overall structure of a resin film manufacturing apparatus and a resin film manufacturing method according to a first embodiment.
It should be noted that the right-handed spiral xyz cartesian coordinate system is given in fig. 1 and other figures for the purpose of facilitating the description of the positional relationship between the elements. In general, in all the drawings, the Z-axis forward direction is the vertically upward direction, and the XY plane is the horizontal plane.
Further, in the present specification, the resin film includes a resin sheet.
As shown in fig. 1, the first embodiment resin film manufacturing apparatus includes an
The
The
It is to be noted that, although not shown in the drawings, for example, a motor as a power source is connected to the
As shown in FIG. 1, a T-
The
The
The
< Structure of T-
Referring to fig. 2 and 3, the structure of the T-
As shown in fig. 2 and 3, the T-
The facing surfaces of the pair of die blocks 21 and 22 are provided with a
Further, the
When the
The
As shown in fig. 3, a plurality of
Each
The distance between the
Further, the gap between the
< construction of control means 70 of comparative example >
The overall structure of the resin film manufacturing apparatus of the comparative example is similar to that of the resin film manufacturing apparatus of the first embodiment shown in fig. 1. In the comparative example, the control unit performs feedback control on the
< construction of control means 70 of first embodiment >
Hereinafter, the structure of the
Note that the functional blocks of the
The state observation unit 71 calculates a control error of each
It is to be noted that, in calculating the average value of the measured values pv, the measured values at both ends of the
Further, the measured value pv of each
Subsequently, the state observing unit 71 determines the current state st of each
The state st is predetermined to divide the control error values into a finite number of groups, which may be an infinite number of values. For illustrative purposes, only a simple example is illustrated here: when the control error is err, the state st1 is defined as-0.9 μm-err < -0.6 μm, -0.6 μm-err < -0.3 μm is defined as the state st2, -0.3 μm-err <0.3 μm is defined as the state st3, 0.3 μm-err <0.6 μm is defined as the state st4, and 0.6 μm-err < 0.9 μm is defined as the state st5, and so on. In practical applications, a larger number of more subdivided states st are often set.
The feedback rw is an index evaluating the operation ac selected in the previous state st.
Specifically, when the absolute value of the calculated current control error value is smaller than the absolute value of the previous control error, the state observation unit 71 determines the previously selected operation ac as the appropriate operation, and sets the feedback rw to a positive value, for example. In other words, the feedback rw is determined so that the operation ac selected previously may be selected again in the same state as before.
In contrast, when the absolute value of the calculated current control error value is larger than the absolute value of the previous control error, the state observation unit 71 determines that the previously selected operation ac is inappropriate, and sets the feedback rw to a negative value, for example. In other words, the feedback rw is determined so that the operation ac selected previously cannot be selected again in the same state as before.
Specific examples of feedback rw will be given later. The value of feedback rw can be determined as appropriate. For example, the value of feedback rw may always be positive; alternatively, the value of feedback rw may always be negative.
The control condition learning unit 72 performs reinforcement learning for each
TABLE 1
Table 1 shows the control conditions (learning results) of Q-learning as an example of reinforcement learning. The top row of Table 1 shows the five states st 1-st 5. Specifically, the second to sixth columns show five states st1 to st5, respectively. In addition, the left-most column of Table 1 shows four operations ac 1-ac 4. Specifically, the second to fifth rows show four operations ac 1-ac 4, respectively.
In the example of Table 1, the operation of reducing the output (e.g., voltage) to the
The value determined by the combination of state st and operation ac in table 1 is referred to as quality Q (st, ac). For the quality Q, an initial value is given first, and then the quality Q is updated sequentially according to the feedback rw and a known updating formula. The initial value of the quality Q is included in the learning condition shown in fig. 4, for example. The learning condition is input by an operator, for example. For example, an initial value of the quality Q may be stored in the storage unit 73, and a past learning result may be used as the initial value. Further, the learning conditions shown in FIG. 4 include, for example, states st1 to st5 and operations ac1 to ac4 shown in Table 1.
The quality Q is described by taking the state st4 in table 1. In the state st4, the control error is greater than or equal to 0.3 μm and less than or equal to 0.6 μm, indicating that the die lip gap of the
In the example of table 1, when the control error is, for example, 0.4 μm, the state st is the state st 4. Therefore, the control condition learning unit 72 selects the most appropriate operation ac4 having the highest quality Q in the state st4 and outputs it to the control signal output unit 74.
The control signal output unit 74 increases the control signal ctr to be output to the
Subsequently, when the absolute value of the next control error is smaller than the absolute value of the current control error (0.4 μm), the state observation unit 71 judges that it is appropriate to select the operation ac4 at the current state st4, thereby outputting the feedback rw having a positive value. Accordingly, the control condition learning unit 72 updates the control condition based on the feedback rw, thereby increasing the mass (+5.6) of the operating ac4 in the state st 4. Thus, for the state st4, the control condition learning unit 72 selects the operation ac4 again.
In contrast, when the absolute value of the next control error is larger than the absolute value of the current control error (0.4 μm), the state observation unit 71 determines that it is not appropriate to select the operation ac4 in the current state st4, thereby outputting the feedback rw having a negative value. Accordingly, the control condition learning unit 72 updates the control condition based on the feedback rw, thereby reducing the mass (+5.6) of the operating ac4 in the state st 4. Thus, the quality of operation ac4 in state st4 becomes smaller than the quality (+5.4) of operation ac 3. Therefore, for the state st4, the control condition learning unit 72 selects the operation ac3 instead of the operation ac 4.
The update timing of the control condition is not limited to the subsequent timing, but may be appropriately selected in consideration of the time lag or the like. Furthermore, the learning process can be accelerated by randomly selecting the operation ac at an early stage of the learning process. In addition, although the reinforcement learning is described in Table 1 by taking a simple Q-learning as an example, the present invention is not limited thereto, and any learning algorithm such as Q-learning, Actor-Critic (AC) method, TD-learning, or Monte-Carlo method may be used in the present invention. For example, the learning algorithm may be selected based on the actual situation. For example, when the number of states st and operations AC increases, and there is a case of "combinatorial explosion", the AC method may be employed.
In addition, the AC method often uses a probability distribution function as its policy function. The probability distribution function is not limited to a normal distribution function, and for simplicity, functions such as Sigmoid and Softmax may also be used. The Sigmoid function is the most commonly used function in a neural network, and can also be used since reinforcement learning is a kind of machine learning as in a neural network. The Sigmoid function also has the advantage of being simple and easy to use.
As mentioned above, there are numerous learning algorithms and functions available, and these are appropriately selected.
As described above, since the first embodiment resin film manufacturing apparatus does not employ PID control, it is not necessary to perform parameter adjustment when the process conditions are changed. Further, the
< method for producing resin film >
Hereinafter, the method for manufacturing a resin film of the first embodiment is described in detail with reference to fig. 1 and 5. Fig. 5 is a flowchart of a method for controlling a die lip gap in the method for manufacturing a resin film according to the first embodiment.
As shown in fig. 1, in the first embodiment resin film manufacturing method, a film-shaped
Subsequently, the
After that, the
Hereinafter, a die lip gap control method in the resin film manufacturing method of the first embodiment is described with reference to fig. 5. The description of fig. 5 will be further described with reference to fig. 4, as needed.
First, as shown in fig. 5, the state observation unit 71 of the
Subsequently, the control condition learning unit 72 of the
After that, the control signal output unit 74 of the
When the manufacturing of the
As described above, the first embodiment resin film manufacturing method does not employ PID control, and therefore parameter adjustment is not required when the process conditions are changed. In addition, the method updates the control conditions (learning results) based on the feedback rw by performing reinforcement learning with a computer, and selects the most appropriate operation corresponding to the current state st from the updated control conditions. As such, the time and resin material required for adjustment can be reduced as compared with the comparative example even when the process conditions are changed.
Second embodiment
Hereinafter, a second embodiment resin film manufacturing apparatus will be described. The entire structure of the resin film manufacturing apparatus of the second embodiment is the same as that of the resin film manufacturing apparatus of the first embodiment shown in fig. 1 to 3, and thus, the description thereof is omitted. The second embodiment resin film manufacturing apparatus differs from the first embodiment resin film manufacturing apparatus in the structure of the
Fig. 6 is a block diagram showing the structure of the
Similar to the first embodiment, the state observing unit 71 determines the current state st of each
The control condition learning unit 72 also performs reinforcement learning for each
As shown in fig. 6, the parameters of the PID controller 74a are sequentially updated in accordance with the operation ac output by the control condition learning unit 72. The PID controller 74a outputs a control signal ctr to the
Other elements are the same as those of the first embodiment, and thus are not described in detail.
As described above, since the second embodiment resin film manufacturing apparatus employs PID control, parameter adjustment is required when process conditions vary. In the resin film manufacturing apparatus of the second embodiment, the
From the above description of the present disclosure, it is apparent that embodiments of the present disclosure may be modified in various ways. Such variations are not to be regarded as a departure from the spirit and scope of the disclosure, and all such modifications as would be obvious to one skilled in the art are intended to be included within the scope of the following claims.
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