阅读说明：本技术 一种实物型交直流两用低值电阻计量标准器 (Object type AC/DC low-value resistance metering standard device ) 是由 吕金华 呼和 闫立新 杜红 郅红磊 王海丽 安晓宁 呼斯乐 云建华 徐有峰 王思 于 2020-06-17 设计创作，主要内容包括：本发明提供一种实物型交直流两用低值电阻计量标准器,其包括：一面板,在该面板上设置有原理性及使用指导性标识；在所述面板上设置有第一电位电极和第二电位电极；在所述面板的下方设置有主电阻器；所述第一电位电极和第二电位电极分别连接到所述面板下方的所述主电阻器的两端；在面板上设置有微调盘,微调盘与主电阻器上预定电阻器相并联。本发明具有结构简单、制造容易、使用方式同被测仪器工作方式一样的优点。(The invention provides a kind of material object type AC/DC low value resistance measurement standard device, it includes: a panel, on which a principle and use instruction mark is set; a first potential electrode and a second potential electrode are arranged on the panel; a main resistor is arranged below the panel; the first potential electrode and the second potential electrode are respectively connected to two ends of the main resistor below the panel; a trimming disk is provided on the panel, the trimming disk being connected in parallel with a predetermined resistor on the main resistor. The invention has the advantages of simple structure, easy manufacture and the same use mode as the working mode of the tested instrument.)

1. A kind of material object type AC/DC low value resistance measures the standard device, it includes: a panel, on which a principle and use instruction mark is set; a first potential electrode and a second potential electrode are arranged on the panel; a main resistor is arranged below the panel; the method is characterized in that: the first potential electrode and the second potential electrode are respectively connected to two ends of the main resistor below the panel; a first trimming disk and a second trimming disk are arranged on the panel, and the first trimming disk is connected with a first preset resistor of the main resistor in parallel; the second trim is in parallel with a second predetermined resistance of the primary resistor.

2. The physical type AC/DC low-value resistance metering standard device according to claim 1, wherein: the main resistor includes a first shunt resistor, a second shunt resistor, and a third shunt resistor.

3. The physical type AC/DC low-value resistance metering standard device according to claim 2, wherein: the first branch measuring range resistor is formed by connecting resistors with a first resistance value and a second resistance value in series; the second span resistor is formed by connecting resistors with a third resistance value and a fourth resistance value in series; the third span resistor is formed by connecting resistors with a fifth resistance value and a sixth resistance value in series.

4. The physical type AC/DC low-value resistance metering standard device according to claim 3, wherein: and a current electrode is shared between two adjacent resistors.

5. The physical type AC/DC low-value resistance metering standard device according to claim 3, wherein: the first branch measuring range resistor comprises 1 first resistance value resistor and 5 second resistance value resistors; the second span resistor comprises 1 resistor with a third resistance value and 4 resistors with a fourth resistance value; the third span resistor includes 1 of the fifth resistance value and 4 of the sixth resistance value.

6. The physical type AC/DC low-value resistance metering standard device according to claim 4, wherein: the first or second trimming disk is connected to the current electrodes at two ends of the parallel resistor, and the step value is determined according to 1/10, 1/100, 1/1000 and 1/10000 of the total resistance value of the parallel resistor.

Technical Field

The invention belongs to the field of electromagnetic metering, and particularly relates to a material-based AC/DC low-value resistance metering standard device for magnitude transmission in the process of testing/calibrating errors of AC/DC high-current low-value resistance measuring instruments such as grounding conduction, transformer DC resistance, loop conduction and the like.

Background

At present, in the process of testing/calibrating errors of an alternating current/direct current large-current low-value resistance measuring instrument such as grounding conduction, transformer direct-current resistance, loop conduction and the like, a single-value physical resistor or an analog resistor is mainly used, however, the single-value physical resistor is used for testing/calibrating, and the defects that the measuring range is narrow and the testing/calibrating work can be completed by wiring for many times are overcome; the disadvantage of using analog resistors for testing/calibration is that this method is not an actual working condition of the instrument being tested and does not provide a good assessment of the actual performance of the instrument.

Therefore, the development of a novel metering standard is required by the metering industry.

Disclosure of Invention

The invention aims to provide an AC/DC low-value resistance real object metering standard device which is used for testing/calibrating errors of AC/DC high-current low-value resistance measuring instruments such as grounding conduction, transformer DC resistance, loop conduction and the like, has a working range of 0.1 mu omega-2 omega, and has a measuring current larger than 1A in the field of electromagnetic metering.

The invention provides a kind of material object type AC/DC low value resistance measurement standard device, it includes: a panel, on which a principle and use instruction mark is set; a first potential electrode and a second potential electrode are arranged on the panel; a main resistor is arranged below the panel; the first potential electrode and the second potential electrode are respectively connected to two ends of the main resistor below the panel; a first trimming disk and a second trimming disk are arranged on the panel, and the first trimming disk is connected with a first preset resistor of the main resistor in parallel; the second trim is in parallel with a second predetermined resistance of the primary resistor.

Wherein the main resistor includes a first shunt resistor, a second shunt resistor, and a third shunt resistor.

The first branch measuring range resistor is formed by connecting resistors with a first resistance value and a second resistance value in series; the second span resistor is formed by connecting resistors with a third resistance value and a fourth resistance value in series; the third span resistor is formed by connecting resistors with a fifth resistance value and a sixth resistance value in series.

Wherein, a current electrode is shared between two adjacent resistors.

Wherein the first span resistor comprises 1 first resistance resistor and 5 second resistance resistors; the second span resistor comprises 1 resistor with a third resistance value and 4 resistors with a fourth resistance value; the third span resistor includes 1 of the fifth resistance value and 4 of the sixth resistance value.

The first trimming disk or the second trimming disk is connected to the current electrodes at two ends of the parallel resistor, and the step value is determined according to 1/10, 1/100, 1/1000 and 1/10000 of the total resistance value of the parallel resistor.

The invention relates to an AC/DC low-value resistance material object measuring standard device, which comprises a panel with a principle and use guiding identification, an electrode connected with a main resistor Rz under the panel, a fine adjustment resistance disc, and potential electrodes P1 and P2; the first potential electrode P1 and the second potential electrode P2 are provided at both ends of the main resistor Rz; the main resistor Rz comprises at least 3 groups of series-connected span-dividing resistor groups; the third span resistor group comprises 3 resistors of 0.5 omega and 4 resistors of 0.1 omega which are connected in series; the second span resistor group comprises resistors of 1 omega and 4 omega, which are connected in series, of 0.05 omega and 0.01 omega; the first span resistor group includes 1 0.005 Ω and 5 0.001 Ω resistors connected in series.

The 0.005 omega resistor of the first branch range resistor group is connected with 1 micro-adjustment disc with a set step value of 1 mu omega in parallel; the 0.002 Ω resistor is connected in parallel with 1 first trimming pad set to a step value of 0.1 μ Ω. When the calibration device is used, the voltage measuring end of the calibrated low resistance meter is connected to the voltage output electrodes P1 and P2 of the standard device, the current output end is connected to the current electrodes corresponding to the two ends of the standard device, and the current electrodes are changed on the current electrodes at the two ends of the standard device according to the required value of the standard device according to different values; the micro-adjustment disc can be adjusted to carry out measurement, so that the device has the advantages of simple structure, easy manufacture and the same use mode as the working mode of the measured instrument.

Drawings

FIG. 1 is a schematic diagram of an appearance of an AC/DC loop resistance standard according to the present invention;

fig. 2 is a schematic diagram of the structure principle and the use of the ac/dc loop resistance standard device of the present invention.

DETAILED DESCRIPTION OF EMBODIMENT (S) OF INVENTION

In order to make the objects, technical solutions and advantages of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention. It should be noted that the embodiments and features of the embodiments in the present application may be arbitrarily combined with each other without conflict.

Fig. 1 is a schematic structural diagram of the low-value resistance measurement standard according to the present invention. The invention discloses a real object type low-value resistance metering standard device, which comprises: a panel 100, wherein the panel 100 is preferably made of a metal material, and further preferably, the panel 100 is made of a metal plate with a length of 550mm, a width of 330mm and a thickness of 2 mm; a principle and use guiding mark 200 is arranged on the panel 100 and used for guiding the resistance value combination in use and marking the maximum load current flow of each range of resistance; a first potential electrode P1(600) and a second potential electrode P2(700) are mounted on a first side of a panel 100, a main resistor Rz (900) is disposed under the panel 100, and the first potential electrode P1(600) and the second potential electrode P2(700) are respectively connected to both ends of the main resistor Rz (900) under the panel 100; the main resistor Rz (900) preferably comprises 18 standard resistors R, and one current electrode 500 is provided at least one side position corresponding to each of the standard resistors R; the detailed structure is as follows:

the upper part is provided with 3 current electrodes which are marked as B, C, D from left to right; the middle upper part is provided with 5 current electrodes marked as A, 1, 2, 3 and 4 from left to right; the middle lower part is provided with 5 current electrodes marked as a, b, c, d and e from left to right; the lower part is provided with 6 current electrodes, which are marked as f, g, h, i, j and k from left to right.

The use, machining adjustment and use of the main resistor Rz (900) comprising the 18 standard resistors R and the 19 current electrodes 500 are performed in the following order, and the specific group values of each range are as follows:

the first measuring range resistor is a 0.01 omega measuring range resistor group, the first measuring range resistor comprises 1 resistor of 0.005 omega and 5 resistors of 0.001 omega which are connected in series, and the first measuring range resistor starts from the resistor group with the minimum measuring range reference value of 0.01 omega when in adjustment, and the first measuring range resistor sequentially comprises 0.001 omega between f and g, 0.002 omega between f and h, 0.003 omega between f and i, 0.004 omega between f and j, 0.005 omega between a and f and 0.010 omega between a and k; the combination values when used were: 0.01 omega is the resistance between a and k; 0.009 omega is the resistance value between a and j; 0.008 omega is the resistance between a and i; 0.007 omega is the resistance value between a and h; 0.006 omega is the resistance between a and g; 0.005 omega is the resistance between a and f; 0.004 omega is the resistance value between f and j; 0.003 omega is the resistance between f and i; 0.002 omega is the resistance value between f and h; 0.001 omega is the resistance value between f and g; the first span resistor contains 10 values, and is preferably made of a 2mm x 40mm manganin resistance alloy strip, and the working load current is ac/dc 120A.

The second span resistor is a 0.1 omega component range resistor group, the first span resistor comprises 1 0.05 omega and 4 0.01 omega which are connected in series, when in adjustment, the resistance value of the resistor group with the span reference value of 0.1 omega is adjusted to 0.01 omega between e and d, 0.02 omega between e and c, 0.03 omega between e and b, 0.04 omega between e and a, and 0.05 omega between e and 4 in sequence; in use, a first span resistor is incorporated into the second span resistor, the resulting combined value being: 0.1 omega is a resistance value between 4 and k; 0.09 omega is a resistance value between 4 and a; 0.08 omega is a resistance value between 4 and b; 0.07 omega is a resistance value between 4 and c; 0.06 omega is a resistance value between 4 and d; 0.05 omega is a resistance value between 4 and e; 0.04 omega is the resistance value between e and a; 0.03 omega is the resistance value between e and b; 0.02 omega is the resistance value between e and c; 0.01 omega is the resistance value between e and d; a total of 10 values are obtained in combination with a first span and a second span resistor, which preferably can be machined from a 0.3mm x 50mm strip of manganin resistance alloy. The working current carrying quantity is AC/DC 40A.

The third span resistor is a 2 omega span resistor group, the third span resistor comprises 3 resistors of 0.5 omega and 4 resistors of 0.1 omega which are connected in series, and the third span resistor is adjusted by starting from the resistor group with the span reference value of 1 omega in sequence of A-1(0.1 omega), A-2(0.2 omega), A-3(0.3 omega), A-4(0.4 omega), B-A (0.5 omega), B-k (1.0 omega), C-4(1.4 omega) and D-A (1.5 omega); when in use, the first span resistor and the second span resistor are combined to the third span resistor, and the obtained combined value is as follows: 2 omega is the resistance between D and k; 1.9 omega is the resistance value between D and 4; 1.8 omega is the resistance between D and 3; 1.7 omega is the resistance value between D and 2; 1.6 omega is the resistance value between D and 1; 1.5 omega is the resistance between D and A; 1.4 omega is the resistance value between C and 4; 1.3 omega is the resistance value between C and 3; 1.2 omega is the resistance value between C and 2; 1.1 omega is the resistance value between C and 1; 1.0 omega is the resistance value between B and k; 0.9 omega is the resistance value between B and 4; 0.8 omega is the resistance value between B and 3; 0.7 omega is the resistance value between B and 2; 0.6 omega is the resistance value between B and 1; 0.5 omega is the resistance value between B and A; 0.4 omega is the resistance value between A and 4; 0.3 omega is the resistance between A and 3; 0.2 omega is the resistance value between A and 2; 0.1 omega is the resistance value between A and 1; the combination of the first span, the second span resistor and the third span resistor obtains 20 values, the third span resistor is preferably made of 0.3mm 33mm manganin resistance alloy belt, and the working load current is 20A.

Other values between 0.001 Ω -2.0 Ω can be obtained by the combination of the first span, the second span and the third span, and the combination of the resistance values should ensure that the electrode is marked between D-k.

A second side of the panel (100) is mounted with a first trimming disk (300) and a second trimming disk (400), said first trimming disk being connected in parallel with a first predetermined resistance of said main resistor; the second trim is in parallel with a second predetermined resistance of the primary resistor. The first and second trimming disks 300 and 400 are preferably both decimal trimming disks; the first trimming disk 300 is connected in parallel to the 0.002 Ω resistor of the first span resistor group marked as f-h, and the step value of the first trimming disk 300 is 0.1 μ Ω; the second trimming disk 300 is connected in parallel to 0.005 Ω resistors, labeled a-f, of the first span resistor, and the step value of the second trimming disk 400 is 1 μ Ω.

The second trimming disk 400 preferably includes a 0-11 bit rotary band switch, where R with different resistance values is installed at a 0-11 fixed cutter position and the resistance is switched by the rotary cutter position, where the parallel standard resistance R is 0.005 Ω in this example; the resolution of R is 0.001m omega, and the parallel resistance is calculated according to the formula:

R_{and are}＝R×(R-R_{Resolution ratio})/R_{Resolution ratio}(1)

When the device is used, the rotating band switch is adjusted and switched from 0 to 11, and the corresponding parallel 0.5m omega standard resistor R is changed from 5m omega to 4.989m omega according to a 1 mu omega step value.

The specific parallel values are as follows:

× -0 mu omega at position 0, R_{And are}Empty connected 1-position × -1 mu omega, R_{And are}＝25.01Ω

× -2 mu omega at position 2 and R_{And are}12.48 omega 3 position × -3 mu omega, R_{And are}＝8.32Ω

Position 4: × -4 muΩ；R_{And are}6.24 omega 5 position × -5 mu omega, R_{And are}＝4.95Ω

Position 6 × -6 mu omega, R_{And are}4.16 omega 7 position × -7 mu omega, R_{And are}＝4.95Ω

8 position × -8 mu omega, R_{And are}Position 3.11 omega 9 × -9 mu omega, R_{And are}＝2.77Ω

10 position × -10 mu omega, R_{And are}2.49 omega 11 position × -11 mu omega, R_{And are}＝2.26Ω

The first trimming disk 300 preferably includes a rotary band switch having 0 to 11 bits, a resistor R having different resistance values is mounted on the 0 to 11 fixed bit and switched by the rotary bit, the resistance value is set according to the value of the standard resistor R connected in parallel, in this example, the standard resistor R connected in parallel is 2m Ω, and the resolution R is 0.0001m Ω, the parallel resistor is calculated by formula (1), and when in use, the parallel resistor R is switched with the rotary band switch from 0 to 11, and the standard resistor R connected in parallel is changed from 2 Ω to 1.989m Ω by a step value of 0.1 μ Ω.

The specific parallel values are as follows:

× -0 mu omega at position 0, R_{And are}Empty joint, position 1: × -0.1 mu omega, R_{And are}＝2.96Ω

× -0.2 mu omega at position 2, R_{And are}1.99 omega, position 3 × -0.3 mu omega, R_{And are}＝1.33Ω

The 4 position is × -0.4 mu omega, R_{And are}1.00 omega, 5-position × -0.5 mu omega, R_{And are}＝0.80Ω

× -0.6 mu omega at position 6, R_{And are}0.67 omega, 7-position × -0.7 mu omega, R_{And are}＝0.57Ω

8 position × -0.8 mu omega, R_{And are}0.50 omega, position 9 × -0.9 mu omega R_{And are}＝0.44Ω

10 position × -1.0 mu omega, R_{And are}0.40 omega, position 11 × -1.1 mu omega, R_{And are}＝0.36Ω

According to the practical AC/DC low-value resistance metering standard device, the first span resistor is formed by connecting 2 resistors of a first resistance value (0.001 omega) and a second resistance value (0.005 omega) in series, the second span resistor is formed by connecting 2 resistors of a third resistance value (0.01 omega) and a fourth resistance value (0.05 omega) in series, and the third span resistor is formed by connecting 2 resistors of a fifth resistance value (0.1 omega) and a sixth resistance value (0.5 omega) in series; therefore, the structure is simple, the processing and the adjustment are easy, and 40 high-power standard resistance values such as 0.001m omega-2 omega can be combined when the device is used; the first fine tuning disc 300 with the step value of 0.1 mu omega and the second fine tuning disc 400 with the step value of 1 mu omega are arranged on the second side of the panel (100), the first fine tuning disc 300 and the second fine tuning disc 400 are both composed of 11 single-value resistors and rotary band switches, and the first span resistor is converted into the fine tuning value with the range of 0.1 mu omega-12.1 mu omega through the switching of the rotary band switches, so that the measurement precision is improved to 0.1 mu omega.

The use description in conjunction with fig. 2 is as follows: voltage measuring electrodes P1 and P2 of the device 800 to be tested are respectively connected to a first potential electrode P1(600) and a second potential electrode P2(700) of the AC/DC low-resistance real object measuring standard; current output C1 receives on the panel 100 sign of the dual-purpose low resistance in kind measurement standard of alternating current-direct current has the current electrode of B, and current output C2 receives on the panel 100 sign of the dual-purpose low resistance in kind measurement standard of alternating current-direct current has the current electrode of k, can measure, and different values only need to change current output C1, C2 on the both ends current electrode of the required value of standard, and further also can adjust first fine tuning dish or second fine tuning dish and measure.

In one embodiment, B — k is 1.0 Ω; adjusting the second fine tuning disc 400 at x-1 μ Ω;

the disc 1 (0-11 mu omega) reduces the parallel resistors a-f to 0.005 omega by 1 mu omega, namely the resistance values of a-f are changed to 0.00499 omega; adjusting x-0.1 μ Ω; the (0-1.1 μ Ω) pad 1 of the first trimming pad 300 reduces the parallel resistance f to h of 0.002 Ω by 0.1 μ Ω, that is, f to h of 0.001999 Ω; in this case, B to k is 0.9989 Ω.

If the current output ends C1 and C2 of the adjusted detected instrument 800 are connected to different current electrodes of the panel (100) of the AC/DC dual-purpose low-resistance material object metering standard instrument, the following results can be obtained: any value of 0.001 Ω to 2.000 Ω; if the X-1. mu. omega. and X-0.1. mu. omega. disks are adjusted, it is possible to obtain: different values in the range of 0.1 μ Ω to 12.1 μ Ω; the error of the resolution of the device 800 can be calibrated by calibrating the error of the indication value of the device 800. Therefore, the device has the advantages of simple structure, easy manufacture and the same use mode as the working mode of the tested instrument.

It is to be understood that while the present invention has been described in conjunction with the preferred embodiments thereof, it is not intended to limit the invention to those embodiments. It will be apparent to those skilled in the art from this disclosure that many changes and modifications can be made, or equivalents modified, in the embodiments of the invention without departing from the scope of the invention. Therefore, any simple modification, equivalent change and modification made to the above embodiments according to the technical essence of the present invention are still within the scope of the protection of the technical solution of the present invention, unless the contents of the technical solution of the present invention are departed.