阅读说明：本技术 电源转换电路的模拟电流产生电路及其方法 (Analog current generating circuit of power conversion circuit and method thereof ) 是由 曾昭玮 梁佑慈 于 2020-04-15 设计创作，主要内容包括：本发明公开了一种电源转换电路的模拟电流产生电路及其方法,以提供模拟感测电流。模拟感测电流包括交流成分电流与直流成分电流。模拟电流产生电路包括第一电流电路、第二电流电路、合成电路及校正电路。第一电流电路产生斜坡信号,以作为交流成分电流。第二电流电路耦接电源转换电路的输出级,以提供感测电流。感测电流经采样维持处理后产生直流成分电流。合成电路分别耦接第一电流电路与第二电流电路,以合成交流成分电流与直流成分电流为模拟感测电流。校正电路分别耦接第一电流电路、第二电流电路及合成电路,以根据模拟感测电流与感测电流动态调整斜坡信号。本发明通过全模拟的方式预测实际电感电流的变化,有效克服无法取得即时感测电流波形及电路成本高、控制难度高等问题,还可通过校正电路即时校正交流成分电流,以提升感测电流的准确度。(The invention discloses an analog current generating circuit of a power conversion circuit and a method thereof, which are used for providing analog sensing current. The analog sensing current includes an alternating component current and a direct component current. The analog current generating circuit comprises a first current circuit, a second current circuit, a synthesizing circuit and a correcting circuit. The first current circuit generates a ramp signal as an alternating component current. The second current circuit is coupled to the output stage of the power conversion circuit to provide a sensing current. The sensing current is sampled and maintained to generate a DC component current. The synthesis circuit is coupled to the first current circuit and the second current circuit respectively to synthesize the AC component current and the DC component current as the analog sensing current. The correction circuit is coupled to the first current circuit, the second current circuit and the synthesis circuit respectively, so as to dynamically adjust the ramp signal according to the analog sensing current and the sensing current. The invention predicts the change of the actual inductive current in a full simulation mode, effectively overcomes the problems of unavailable instant sensing current waveform, high circuit cost, high control difficulty and the like, and can correct the alternating component current in real time through the correction circuit so as to improve the accuracy of the sensing current.)

1. An analog current generating circuit of a power conversion circuit for providing an analog sensing current, wherein the analog sensing current includes an AC component current and a DC component current, the analog current generating circuit comprising:

a first current circuit for generating a ramp signal as the AC component current;

a second current circuit coupled to an output stage of the power conversion circuit to provide a sensing current, wherein the sensing current generates the dc component current after a sample and hold process;

a synthesizing circuit coupled to the first current circuit and the second current circuit, respectively, for synthesizing the AC component current and the DC component current as the analog sensing current; and

a calibration circuit coupled to the first current circuit, the second current circuit and the combining circuit respectively for dynamically adjusting the ramp signal according to the analog sensing current and the sensing current.

2. The analog current generating circuit of claim 1, wherein the output stage is coupled to an inductor, and the sensing current is related to an inductor current flowing through the inductor.

3. The analog current generating circuit of claim 1, further comprising at least one sample-and-hold circuit coupled between the second current circuit and the combining circuit for performing the sample-and-hold processing on the sensed current to generate the dc component current.

4. The analog current generating circuit of claim 1, wherein the calibration circuit comprises a subtraction circuit receiving the analog sensing current and the sensing current to generate a difference signal, the calibration circuit generating a calibration signal to the first current circuit according to the difference signal.

5. The analog current generating circuit of claim 4, wherein the calibration circuit further comprises an integrating circuit and a comparing circuit, the integrating circuit receives the difference signal to generate a difference voltage, and the comparing circuit generates the calibration signal according to the difference voltage.

6. A method for generating an analog current to provide an analog sense current, wherein the analog sense current includes an ac component current and a dc component current, the method comprising:

(a) providing a ramp signal as the AC component current;

(b) performing a sample-and-hold process on a sensing current to generate the dc component current;

(c) synthesizing the alternating component current and the direct component current to obtain the analog sensing current; and

(d) and dynamically adjusting the ramp signal according to the analog sensing current and the sensing current.

7. The method of claim 6, wherein the sensing current is related to an inductor current flowing through an output inductor.

8. The method of generating an analog current of claim 6, wherein step (d) further comprises:

and adjusting the slope of the ramp signal.

9. The method of generating an analog current of claim 6, wherein step (d) further comprises: integrating the difference between the analog sensing current and the sensing current to adjust the ramp signal.

10. The method of generating an analog current according to claim 7, wherein step (b) comprises:

(b1) obtaining the sensing current; and

(b2) at least one sampling and maintaining is carried out on the valley value of the sensing current at a second time according to a pulse width modulation signal so as to obtain the direct current component current.

Technical Field

The present invention relates to a power conversion circuit, and more particularly, to an analog current generating circuit of a power conversion circuit and a method thereof.

Background

In the field of Buck (Buck) or Boost (Boost) power conversion circuits, with the increase of system operating frequency, the on-time of a switch of an output stage of a power conversion circuit is very short under the condition of high-speed switching, so that a traditional current sensing circuit cannot sense the waveform of inductive current in real time.

In order to improve the above-mentioned disadvantages, there is a conventional method of obtaining the sensing current by a Sample & Hold (Sample & Hold) method, which has a problem that the sensing current waveform is not instantaneous enough; another conventional method is to combine a part of the analog current and a part of the sensing current into a complete current waveform, which has the disadvantages of high circuit cost, high control difficulty, and the like. Therefore, the above problems encountered in the prior art still remain to be solved.

Disclosure of Invention

The present invention provides an analog current generating circuit of a power conversion circuit and a method thereof, so as to effectively solve the above problems encountered in the prior art.

An embodiment of the invention is an analog current generating circuit of a power conversion circuit. In this embodiment, the analog current generating circuit is used to provide an analog sensing current. The analog sensing current includes an alternating component current and a direct component current. The current sensing circuit comprises a first current circuit, a second current circuit, a synthesis circuit and a correction circuit. The first current circuit generates a ramp signal as an alternating component current. The second current circuit is coupled to the output stage of the power conversion circuit to provide a sensing current. The sensing current is sampled and maintained to generate a DC component current. The synthesis circuit is coupled to the first current circuit and the second current circuit respectively to synthesize the AC component current and the DC component current as the analog sensing current. The correction circuit is coupled to the first current circuit, the second current circuit and the synthesis circuit respectively, so as to dynamically adjust the ramp signal according to the analog sensing current and the sensing current.

In one embodiment, the output stage is coupled to the inductor, and the sensing current is related to an inductor current flowing through the inductor.

In an embodiment, the analog current generating circuit further includes at least one sample-and-hold circuit coupled between the second current circuit and the synthesizing circuit for performing sample-and-hold processing on the sensing current to generate the dc component current.

In one embodiment, the correction circuit includes a subtraction circuit receiving the analog sensing current and the sensing current to generate a difference signal, and the correction circuit generates a correction signal to the first current circuit according to the difference signal.

In one embodiment, the calibration circuit further includes an integrating circuit and a comparing circuit. The integrating circuit receives the difference signal to generate a difference voltage, and the comparing circuit generates a correction signal according to the difference voltage.

Another embodiment according to the present invention is an analog current generating method. In this embodiment, the analog current generation method provides an analog sensing current. The analog sensing current includes an alternating component current and a direct component current. The analog current generation method comprises the following steps: (a) providing a ramp signal as an alternating component current; (b) sampling and maintaining the sensing current to generate a direct current component current; (c) synthesizing the AC component current and the DC component current to form an analog sensing current; and (d) dynamically adjusting the ramp signal according to the analog sensing current and the sensing current.

In one embodiment, the sensing current is related to an inductor current flowing through an output inductor.

In one embodiment, the step (d) further comprises: the slope of the ramp signal is adjusted.

In one embodiment, the step (d) further comprises: the difference between the analog sense current and the sense current is integrated to adjust the ramp signal.

In one embodiment, step (b) comprises: (b1) obtaining a sensing current; and (b2) sampling and maintaining the valley of the sensing current at a second time according to a pulse width modulation signal to obtain the DC component current.

Compared with the prior art, the analog current generating circuit and the analog current generating method of the power conversion circuit set the alternating component current (i.e. the waveform of the analog sensing current), determine the direct component current (i.e. the valley value of the analog sensing current) according to the minimum value of the sensing current, and then combine the alternating component current and the direct component current into the analog sensing current. Because the analog current generating circuit and the analog current generating method predict the change of the actual inductive current in a full-simulation mode, the problems that the prior art cannot obtain the real-time sensing current waveform, the circuit cost is high, the control difficulty is high and the like can be effectively solved, and the alternating component current (namely the waveform of the analog sensing current) can be corrected in real time through the correcting circuit so as to improve the accuracy of the sensing current.

The advantages and spirit of the present invention can be further understood by the following detailed description of the invention and the accompanying drawings.

Drawings

Fig. 1 is a schematic diagram of a power conversion circuit according to the present invention.

Fig. 2 is a schematic diagram of an analog current generating circuit in the power conversion circuit according to the present invention.

Fig. 3A is a schematic diagram of an analog current generating circuit applied to a Buck (Buck) power converter according to the present invention.

Fig. 3B is a schematic diagram of the analog current generating circuit of the present invention applied to a Boost (Boost) power converter.

Fig. 4A is a waveform timing chart of a dc component current obtained by the sample and hold circuit.

Fig. 4B is a waveform timing chart in which the ac component current and the dc component current are synthesized into the analog sense current by the synthesizing circuit.

Fig. 5A and 5B are a schematic diagram and a waveform timing diagram respectively illustrating poor accuracy of the dc component current generated by the analog current generating circuit when the analog current generating circuit performs sampling only by using a single sample-and-hold circuit.

Fig. 6A and 6B are a schematic diagram and a waveform timing diagram respectively illustrating the accuracy of the dc component current generated by the analog current generating circuit when the analog current generating circuit performs sampling through two sample and hold circuits connected in series.

Fig. 7A and 7B are a schematic diagram of a calibration process and a waveform timing diagram of the analog sensing current of the analog current generating circuit.

Fig. 8A and 8B are schematic diagrams of another calibration process and waveform timing diagram of the analog sensing current of the analog current generating circuit.

FIG. 9 is a flow chart of an analog current generation method of the present invention.

Description of the main element symbols:

1 power supply conversion circuit

10 control circuit

12 integrated driver

100 error amplifier

102 comparison circuit

104 pulse width modulation circuit

106 current sensing circuit

120 drive circuit

122 analog current generating circuit

M1 first switch

M2 second switch

OS output stage

L-shaped inductor

C capacitor

R resistance

FB first pin

PWM1 second leg

CSP third pin

CSN fourth pin

PWM2 fifth leg

IOUT sixth pin

SW seventh pin

VIN input voltage

VOUT output voltage

VFB feedback voltage

RAMP signal

COMP comparison signal

CG1 first current circuit

CG2 second current circuit

SH sampling holding circuit

ADD synthesis circuit

1220 correction circuit

SUB subtraction circuit

INT integrating circuit

COM comparator circuit

ADJ adjusting circuit

RSET setting resistance

GND ground terminal

IRP AC component current (ramp signal)

ISEN senses current

IDC DC component current

IOUT analog sense current

IDIF difference signal

VDIF difference voltage

VREF reference voltage

CS correction signal

IL inductance current

SW switch control signal

SWB inverse switch control signal

COU counter

DAC digital-to-analog circuit

CTV count value

3 analog current generating circuit

30 second current circuit

32 sampling and holding circuit

34 correction circuit

36 first current circuit

IDC1 senses the minimum value (valley) of the current

time t 1-t 6

50 second current circuit

52 sample and hold circuit

54 sampling and holding circuit

ISEN' sampled sensed Current

SH 1-SH 2 first-second sampling circuits

m sense current scaling

Current area of S1-S4

SUB 1-SUB 2 first to second subtraction circuits

IDIFA-IDIFB first difference value-second difference value

IACC accumulated current

IDIF 1-IDIF 2 difference signal

VTI 1-VTI 2 voltage-to-current circuit

90 correction circuit

MUL multiplication circuit

IS output current

Idis discharge current source

VRP ramp voltage

S10-S16

Detailed Description

Reference will now be made in detail to exemplary embodiments of the invention, examples of which are illustrated in the accompanying drawings. The same or similar numbered elements/components used in the drawings and the embodiments are used to represent the same or similar parts.

An embodiment according to the present invention is an analog current generating circuit. In this embodiment, the analog current generating circuit can be applied to a switching power conversion circuit (such as a Buck power conversion circuit or a Boost power conversion circuit) to provide an analog sensing current in a full analog manner, but not limited thereto.

Referring to fig. 1, fig. 1 is a schematic diagram of a power conversion circuit 1. As shown in fig. 1, the power conversion circuit 1 includes a control circuit (Controller)10, an integrated driver (DrMOS)12, an inductor L, and a capacitor C. The integrated driver 12 is coupled to the control circuit 10. One end of the inductor L is coupled to the integrated driver 12. The control circuit 10 is coupled to the other end of the inductor L. One end of the capacitor C is coupled to the other end of the inductor L and the other end of the capacitor C is coupled to the ground GND.

The control circuit 10 includes an error amplifier 100, a comparator 102, a pulse width modulation circuit 104, a current sensing circuit 106, a first pin FB, a second pin PWM1, a third pin CSP, and a fourth pin CSN.

The input terminal + of the error amplifier 100 is coupled to the first pin FB and the input terminal-receives the reference voltage VREF, so as to generate the error amplification signal COMP according to the reference voltage VREF and the feedback voltage VFB of the first pin FB.

The input terminal + of the comparing circuit 102 is coupled to the output terminal of the error amplifier 100 and the input terminal-receives the RAMP signal RAMP for comparing the error amplified signal COMP with the RAMP signal RAMP to generate a comparison result.

The PWM circuit 104 is coupled to the output terminal of the comparison circuit 102, the current sensing circuit 106 and the second pin PWM1, and is configured to generate a PWM signal according to the comparison result between the error amplification signal COMP and the RAMP signal RAMP, and output the PWM signal through the second pin PWM 1. The current sensing circuit 106 is coupled to the pulse width modulation circuit 104, the third pin CSP and the fourth pin CSN, respectively, for providing a sensing current and outputting the sensing current through the third pin CSP and the fourth pin CSN.

The integrated driver 12 includes a driving circuit 120, an analog current generating circuit 122, a first switch M1, a second switch M2, a fifth pin PWM2, a sixth pin IOUT, and a seventh pin SW. The fifth pin PWM2 is coupled to the second pin PWM1 of the control circuit 10. The driving circuit 120 is coupled to the fifth pin PWM2, the control terminal of the first switch M1, and the control terminal of the second switch M2, respectively. The sixth pin IOUT is coupled to the third pin CSP of the control circuit 10. One end of the resistor R and one end of the capacitor C are both coupled between the third pin CSP and the sixth pin IOUT, and the other end of the resistor R and the other end of the capacitor C are both coupled to the reference voltage VREF. The first switch M1 is coupled between the input voltage VIN and the second switch M2, and a control terminal of the first switch M1 is coupled to the driving circuit 120. The second switch M2 is coupled between the first switch M1 and the analog current generating circuit 122, and a control terminal of the second switch M2 is coupled to the driving circuit 120. The analog current generating circuit 122 is coupled to the sixth pin IOUT and two ends of the second switch M2, respectively.

One end of the inductor L is coupled between the first switch M1 and the second switch M2 through the seventh pin SW and the other end of the inductor L is coupled to the output voltage VOUT. The inductor current IL flowing through the inductor L comes from between the first switch M1 and the second switch M2. The capacitor C is coupled between the output voltage VOUT and the ground GND. In this embodiment, the output stage OS of the power conversion circuit 1 includes a first switch M1, a second switch M2, an inductor L and a capacitor C, but not limited thereto.

Referring to fig. 2, fig. 2 is a schematic diagram of the analog current generating circuit 122 in the power conversion circuit 1.

As shown in fig. 2, the analog current generating circuit 122 includes a first current circuit CG1, a second current circuit CG2, a sample-and-hold circuit SH, a synthesizing circuit ADD, and a correcting circuit 1220, and has an optional setting resistor PIN.

The setting resistor PIN is coupled to one end of the external setting resistor RSET, and the other end of the setting resistor RSET is coupled to the ground GND. The first current circuit CG1 is coupled to the setting resistor PIN, the synthesizing circuit ADD and the correcting circuit 1220, respectively. The second current circuit CG2 is coupled to the sample-and-hold circuit SH, the calibration circuit 1220 and two ends of the external second switch M2 (not shown in fig. 2), respectively. The sample-and-hold circuit SH is coupled between the second current circuit CG2 and the synthesis circuit ADD. The synthesis circuit ADD is coupled to the first current circuit CG1, the sample-and-hold circuit SH, and the correction circuit 1220, respectively. The correction circuit 1220 is coupled to the second current circuit CG2, the synthesis circuit ADD and the first current circuit CG1, respectively.

It should be noted that the first current circuit CG1 is coupled to the setting resistor RSET through the setting resistor PIN, and the resistance value of the setting resistor RSET is related to the inductance value of the inductor L, so that the first current initial waveform generated by the first current circuit CG1 is closer to the real current waveform, but not limited thereto.

The first current circuit CG1 generates a ramp signal to be supplied to the synthesizing circuit ADD as the alternating component current IRP. The second current circuit CG2 is coupled to the output stage OS of the power conversion circuit 1 for providing the sensing current ISEN to the sample-and-hold circuit SH and the correction circuit 1220, respectively. In practical applications, the sensing current ISEN is related to the inductor current IL flowing through the inductor L in the output stage OS, but not limited thereto.

When the sample-and-hold circuit SH receives the sensing current ISEN, the sample-and-hold circuit SH performs a sample-and-hold process on the sensing current ISEN to generate a dc component current IDC to the synthesis circuit ADD. In practical applications, the dc component current IDC is a fixed current value and is the minimum value (valley value) of the sensing current ISEN/the inductor current IL, but not limited thereto.

When the synthesizing circuit ADD receives the ac component current IRP from the first current circuit CG1 and the dc component current IDC from the sample and hold circuit SH, respectively, the synthesizing circuit ADD synthesizes the ac component current IRP and the dc component current IDC into the analog sensing current IOUT and outputs the analog sensing current IOUT to the correction circuit 1220.

When the correction circuit 1220 receives the sensing current ISEN from the second current circuit CG2 and the analog sensing current IOUT from the synthesis circuit ADD, respectively, the correction circuit 1220 generates the correction signal CS to the first current circuit CG1 according to the sensing current ISEN and the analog sensing current IOUT, so as to dynamically adjust the slope of the ramp signal (i.e., the ac component current IRP provided to the synthesis circuit ADD) generated by the first current circuit CG1, such that the analog sensing current IOUT is m times the inductor current IL, and m is the sensing current scaling.

In one embodiment, as shown in fig. 2, the calibration circuit 1220 includes a subtraction circuit SUB, an integration circuit INT, a comparison circuit COM, and an adjustment circuit ADJ. The subtraction circuit SUB is coupled to the second current circuit CG2, the synthesis circuit ADD, and the integration circuit INT, respectively. The integrating circuit INT is coupled between the subtracting circuit SUB and the input terminal + of the comparing circuit COM. Input terminal-of the comparison circuit COM receives the reference voltage VREF. The output terminal of the comparison circuit COM is coupled to the adjustment circuit ADJ. The adjusting circuit ADJ is coupled to the first current circuit CG 1.

When the subtraction circuit SUB receives the sensing current ISEN from the second current circuit CG2 and the analog sensing current IOUT from the synthesis circuit ADD, respectively, the subtraction circuit SUB subtracts the analog sensing current IOUT and the sensing current ISEN to generate a difference signal IDIF to the integration circuit INT.

When the integration circuit INT receives the difference signal IDIF, the integration circuit INT integrates the difference signal IDIF from the first time to the second time to generate a difference voltage VDIF to the input terminal + of the comparison circuit COM.

When the input terminal + and the input terminal-of the comparison circuit COM receive the difference voltage VDIF and the reference voltage VREF, respectively, the comparison circuit COM compares the difference voltage VDIF and the reference voltage VREF and outputs the comparison result VCOM to the adjustment circuit ADJ, the adjustment circuit ADJ generates the correction signal CS to the first current circuit CG1 according to the comparison result VCOM, and the slope of the ramp signal (i.e. the ac component current IRP provided to the synthesis circuit ADD) generated by the first current circuit CG1 is dynamically adjusted so that the analog sensing current IOUT is m times the inductive current IL, and m is the sensing current scaling.

In one embodiment, the adjusting circuit ADJ includes a counter COU and a digital-to-analog converter DAC. The counter COU is coupled to the output terminal of the comparison circuit COM and the DAC. The DAC circuit is coupled to the counter COU and the first current circuit CG 1.

When the counter COU receives the comparison result VCOM of the difference voltage VDIF and the reference voltage VREF provided by the comparison circuit COM, if the comparison result VCOM indicates that the difference voltage VDIF is greater than the reference voltage VREF, it indicates that the analog sensing current IOUT is too large, and at this time, the count value CTV provided by the counter COU is decreased by 1; if the comparison result VCOM indicates that the difference voltage VDIF is less than or equal to the reference voltage VREF, which indicates that the analog sensing current IOUT is too small, the count value CTV provided by the counter COU is incremented by 1. In practice, the reference voltage VREF may be zero, but is not limited thereto.

Then, the DAC sends the correction signal CS to the first current circuit CG1 according to the count value CTV of the counter COU, so as to dynamically adjust the slope of the ramp signal generated by the first current circuit CG1 (i.e. the ac component current IRP provided to the synthesis circuit ADD) by adjusting the variable current source in the first current circuit CG 1.

In practical applications, the analog current generating circuit of the present invention can be applied to various switching dc-dc power converters, such as a Buck (Buck) power converter circuit or a Boost (Boost) power converter circuit, but not limited thereto. In addition, the analog current generating circuit of the present invention selects the switch with relatively long on-time in the output stage for current sensing, but not limited thereto.

Referring to fig. 3A, for example, a Buck (Buck) power converter, an output stage OS includes a first switch M1, a second switch M2, an inductor L, and a capacitor C. The first switch M1 and the second switch M2 are connected in series between the input voltage VIN and the ground GND, and the control terminals of the first switch M1 and the second switch M2 are controlled by the switch control signals SW and SWB with opposite phases, respectively. One end of the inductor L is coupled between the first switch M1 and the second switch M2, and the other end of the inductor L is coupled to the output voltage VOUT. The capacitor C is coupled between the output voltage VOUT and the ground GND.

The analog current generating circuit 3 includes a second current circuit 30, a sample hold circuit 32, a correction circuit 34, a synthesis circuit ADD, and a first current circuit 36. The sample-and-hold circuit 32 is coupled between the second current circuit 30 and the synthesis circuit ADD. The synthesis circuit ADD is coupled to the sample and hold circuit 32, the first current circuit 36 and the correction circuit 34, respectively. Correction circuit 34 is coupled to second current circuit 30, synthesis circuit ADD, and first current circuit 36, respectively. The first current circuit 36 is coupled to the synthesis circuit ADD and the correction circuit 34, respectively.

It should be noted that, for a Buck (Buck) power converter, in an application of a High transfer ratio (High transfer ratio), the on-time of the Low-side switch (i.e., the second switch M2) in the output stage OS is relatively long, and therefore, the second current circuit 30 selects the second switch with a long on-time and couples to two terminals of the second switch M2 for current sensing, so as to provide the sensing current ISEN related to the inductor current IL flowing through the inductor L to the sample-and-hold circuit 32 and the calibration circuit 34.

The first current circuit 36 receives the input voltage VIN, the output voltage VOUT, and the switch control signal SW of the first switch M1, respectively, and generates a ramp signal as the ac component current IRP to be provided to the synthesis circuit ADD.

When the sample-and-hold circuit 32 receives the sensing current ISEN related to the inductor current IL, the sample-and-hold circuit 32 performs a sample-and-hold process on the sensing current ISEN to generate a dc component current IDC to the synthesis circuit ADD.

For example, as shown in fig. 4A and 4B, at time t1, the switch control signal SW controlling the first switch M1 changes from high level to low level, i.e., the first switch M1 is not turned on and the second switch M2 is turned on. Therefore, the second current circuit 30 coupled to the two terminals of the second switch M2 starts to provide the sensing current ISEN, and the sensing current ISEN drops from a higher current value until time t2 like the inductor current IL.

At time t2, the switch control signal SW changes from low to high, i.e. the first switch M1 is turned on and the second switch M2 is turned off. Therefore, the second current circuit 30 coupled to the two terminals of the second switch M2 stops providing the sensing current ISEN, and the current value IDC1 of the sensing current ISEN at the time t2 is the minimum value (valley value) of the sensing current ISEN/the inductor current IL, and the dc component current IDC can be obtained according to the current value IDC 1.

When the synthesizing circuit ADD receives the ac component current IRP from the first current circuit 36 and the dc component current IDC from the sample and hold circuit 32, respectively, the synthesizing circuit ADD synthesizes the ac component current IRP and the dc component current IDC into the analog sensing current IOUT and outputs the analog sensing current IOUT to the correction circuit 34. For example, the synthesis circuit ADD may be an addition circuit or a circuit node for adding the ac component current IRP and the dc component current IDC to each other to obtain the analog sensing current IOUT.

When the correction circuit 34 receives the sensing current ISEN from the second current circuit 30 and the analog sensing current IOUT from the synthesis circuit ADD, respectively, the correction circuit 34 generates the correction signal CS to the first current circuit 36 according to the sensing current ISEN and the analog sensing current IOUT, so as to dynamically adjust the slope of the ramp signal generated by the first current circuit 36 (i.e., the ac component current IRP provided to the synthesis circuit ADD) such that the analog sensing current IOUT is m times the inductor current IL, and m is the sensing current scaling ratio.

Referring to fig. 3B, if a Boost (Boost) power conversion circuit is taken as an example, the output stage OS includes a first switch M1, a second switch M2, an inductor L and a capacitor C. The first switch M1 and the second switch M2 are connected in series between the output voltage VOUT and the ground GND, and the control terminals of the first switch M1 and the second switch M2 are controlled by the switch control signals SWB and SW that are opposite in phase to each other, respectively. One end of the inductor L is coupled between the first switch M1 and the second switch M2, and the other end of the inductor L is coupled to the input voltage VIN. The capacitor C is coupled between the output voltage VOUT and the ground GND.

The analog current generating circuit 3 includes a second current circuit 30, a sample hold circuit 32, a correction circuit 34, a synthesis circuit ADD, and a first current circuit 36. The sample-and-hold circuit 32 is coupled between the second current circuit 30 and the synthesis circuit ADD. The synthesis circuit ADD is coupled to the sample and hold circuit 32, the first current circuit 36 and the correction circuit 34, respectively. Correction circuit 34 is coupled to second current circuit 30, synthesis circuit ADD, and first current circuit 36, respectively. The first current circuit 36 is coupled to the synthesis circuit ADD and the correction circuit 34, respectively.

For a Boost (Boost) type power conversion circuit, in an application of a High conversion ratio (High-voltage ratio), the on-time of a High-side switch (i.e., the first switch M1) in the output stage OS is relatively long, so that the second current circuit 30 selects the first switch M1 with a long on-time and couples to two ends of the first switch M1 for current sensing, so as to provide a sensing current ISEN related to the inductor current IL flowing through the inductor L to the sample-and-hold circuit 32 and the correction circuit 34.

The generation manner of the analog sensing current IOUT of the boost power conversion circuit is similar to that of the buck power conversion circuit, and therefore, the description thereof is omitted here.

Next, referring to fig. 5A and 5B, if the analog current generating circuit only uses one sample-and-hold circuit 52, during the sampling period of the sample-and-hold circuit 52 (for example, from time t2 to time t3 in fig. 5B, the sampling signal VSH is HIGH), the generated dc component current IDC has the same waveform as the sensing current ISEN and cannot be maintained at the constant current value IDC1, resulting in poor accuracy.

Therefore, in a preferred embodiment, as shown in fig. 6A and 6B, the analog current generating circuit may include two sample and hold circuits 52 and 54 connected in series, which are used to generate the sensing current ISEN by sampling and holding the inductor current IL for the first time at time t1 to t2 and sampling and holding the sensing current ISEN for the second time at time t2 to t3 to generate the sampled sensing current ISEN', so that the dc component current IDC generated thereby can be always maintained at the fixed current value IDC1, thereby effectively improving the accuracy thereof.

In practical applications, the correction circuit 34 may subtract the analog sensing current IOUT provided by the synthesis circuit ADD from the sensing current ISEN provided by the second current circuit 30 to obtain a difference value, and then, after the difference value is calculated, the slope of the ramp signal (i.e., the ac component current IRP provided to the synthesis circuit ADD) provided by the first current circuit 36 is trimmed according to the calculation result, so as to correct the analog sensing current IOUT provided by the synthesis circuit ADD to approach the actual inductor current IL.

Next, two embodiments will be described in detail.

First, taking the schematic diagram of the analog sensing current IOUT correction flow shown in fig. 7A as an example, the subtraction circuit SUB subtracts the analog sensing current IOUT and the sensing current ISEN to obtain a difference value, filters noise through the switch circuit S1, and then accumulates through the integration circuit INT to obtain a difference signal IDIF. Then, the correction signal CS is generated according to the current value of the difference signal IDIF to correspondingly adjust the parameter of the first current circuit 36, such as the slope of the ac component current IRP, but not limited thereto.

For example, if the current value of the difference signal IDIF is greater than 0 (ampere), the correction signal CS is adjusted down and the difference signal IDIF is reset. If the current value of the difference signal IDIF is equal to 0 (ampere), the correction signal CS is maintained and the difference signal IDIF is reset. If the current value of the difference signal IDIF is less than 0 (ampere), the correction signal CS is adjusted up and the difference signal IDIF is reset.

As shown in fig. 7B, the subtraction circuit SUB subtracts the current area S1 of the analog sensing current IOUT from the current area S2 of the sensing current ISEN between time t2 and time t3 to obtain a difference value, and accumulates the difference value by the integration circuit INT to obtain a difference signal IDIF to generate the correction signal CS, so that the slope of the ac component current IRP generated by the first current circuit 36 is adjusted accordingly.

It should be noted that, when the correction signal CS is larger, the amplitude of the generated RAMP signal RAMP is larger, and the slope of the RAMP signal RAMP is larger under the condition of fixed frequency, so that the slope of the ac component current IRP can be finely adjusted. The integration circuit INT is reset for accumulation each time the correction signal CS is updated. The analog current generating circuit of the power conversion circuit of the invention can continuously repeat the correction steps, so that the waveform of the analog sensing current IOUT can approach the actual inductance current IL.

Next, taking the schematic diagram of the analog sensing current IOUT calibration process shown in fig. 8A as an example, the calibration circuit may include a first subtraction circuit SUB1, a first sampling circuit SH1, a second sampling circuit SH2, a second subtraction circuit SUB2, and an integration circuit INT. The first subtraction circuit SUB1 receives the analog sensing current IOUT and the sensing current ISEN and subtracts the analog sensing current IOUT and the sensing current ISEN to obtain a difference signal IDIF 1. The first sampling circuit SH1 samples the difference signal IDIF1 at a first time (i.e., time t2 in fig. 8B) to obtain a first difference IDIFA. The second sampling circuit SH2 samples the difference signal IDIF1 at a second time (i.e., time t3 in fig. 8B) to obtain a second difference value IDIFB. The second subtraction circuit SUB2 receives the first difference value IDIFA and the second difference value IDIFB, subtracts the first difference value IDIFA and the second difference value IDIFB to obtain a difference signal IDIF2, and then adds the difference signal IDIF and the second difference value IDIFB by the integration circuit INT to obtain an accumulated current IACC. Then, the correction signal CS is generated according to the current value of the accumulated current IACC to correspondingly adjust the parameter of the first current circuit 36, such as the slope of the ac component current IRP, but not limited thereto.

For example, if the accumulated current IACC has a current value greater than 0 (ampere), the correction signal CS is decreased and the accumulated current IACC is reset. If the current value of the accumulated current IACC is equal to 0 (ampere), the correction signal CS will remain unchanged and reset the accumulated current IACC. If the current value of the difference signal IDIF is less than 0 (ampere), the correction signal CS is increased and the accumulated current IACC is reset.

As shown in fig. 8B, the first subtracting circuit SUB1 subtracts the current area S1 of the analog sensing current IOUT from the current area S2 of the sensing current ISEN, and then samples the difference signal IDIF1 at times t2 and t3 by the first sampling circuit SH1 and the second sampling circuit SH2 respectively to obtain a first difference value IDIFA and a second difference value IDIFB corresponding to times t2 and t3 respectively. Then, the difference between the first difference IDIFA and the second difference IDIFB is accumulated by the integration circuit INT to obtain an accumulated current IACC, and the correction signal CS is adjusted accordingly.

It should be noted that, when the correction signal CS is larger, the amplitude of the RAMP signal RAMP generated by the first current circuit 36 is larger, and the slope of the RAMP signal RAMP is larger under the condition of fixed frequency, so that the waveform of the ac component current IRP can be finely adjusted. The integration circuit INT is reset for accumulation each time the correction signal CS is updated. The analog current generating circuit of the power conversion circuit of the invention can continuously repeat the correction steps, so that the waveform of the analog sensing current IOUT can approach the actual inductance current IL.

Another embodiment according to the present invention is an analog current generating method. In this embodiment, the analog current generating method may be applied to a switching power converter circuit (such as a Buck power converter circuit or a Boost power converter circuit) to provide an analog sensing current in a full analog manner, where the analog sensing current includes an ac component current and a dc component current, but is not limited thereto.

Referring to fig. 9, fig. 9 is a flowchart of an analog current generating method in this embodiment. As shown in fig. 9, the analog current generating method includes the steps of:

step S10: providing a ramp signal as an alternating component current;

step S12: sampling and maintaining the sensing current signal to generate a direct current component current;

step S14: synthesizing the AC component current and the DC component current to form an analog sensing current; and

step S16: the ramp signal is dynamically adjusted according to the analog sensing current and the sensing current.

In practical applications, the step S10 may set the information of the output inductor through an external setting resistor to generate the ramp signal, but not limited thereto; the sensing current signal in step S12 is related to the inductor current flowing through the output inductor, but not limited thereto; in step S16, the slope of the ramp signal is adjusted, but not limited thereto.

In an embodiment, the step S16 further includes integrating the difference between the analog sensing current and the sensing current to adjust the ramp signal, but not limited thereto.

In another embodiment, step S16 further includes obtaining a difference between the sensing current and the analog sensing current, and integrating the difference between the first time and the second time to adjust the ramp signal, but not limited thereto.

In another embodiment, the step S12 further includes obtaining the sensing current signal, and performing at least one sampling and maintaining on a valley of the sensing current signal at a second time according to the pwm signal to obtain the dc component current, but not limited thereto.

Compared with the prior art, the analog current generating circuit and the analog current generating method of the power conversion circuit set the alternating component current (i.e. the waveform of the analog sensing current) according to the external output inductance, determine the direct component current (i.e. the valley value of the analog sensing current) according to the minimum value of the sensing current, and then combine the alternating component current and the direct component current into the analog sensing current. Because the analog current generating circuit and the analog current generating method predict the change of the actual inductive current in a full-simulation mode, the problems that the prior art cannot obtain the real-time sensing current waveform, the circuit cost is high, the control difficulty is high and the like can be effectively solved, and the alternating component current (namely the waveform of the analog sensing current) can be corrected in real time through the correcting circuit so as to improve the accuracy of the sensing current.