阅读说明：本技术 显示装置、电子装置、阵列测试结构及阵列测试方法 (Display device, electronic device, array test structure and array test method ) 是由 张盛鹉 于 2017-12-26 设计创作，主要内容包括：一种显示装置(10),包括显示面板(100),第一金属走线(200),第一金属走线(200)包括第一端(210)和第二端(220),第一金属走线(200)的第一端(210)连接显示面板(100)；控制模块(300),连接第一金属走线(200)的第二端(220)；第二金属走线(400),第二金属走线(400)包括第三端(410)和第四端(420),第二金属走线(400)的第三端(410)连接控制模块(300),第二金属走线(400)的第四端(420)用于接收第一测试信号,控制模块(300)用于控制第一测试信号是否通过第一金属走线(200)传输至显示面板(100),当控制模块(300)控制第一测试信号通过第一金属走线(200)传输至显示面板(100)时,以对显示面板(100)进行测试。一种电子装置、阵列测试结构及阵列测试方法。该显示装置(10)能够避免显示面板(100)线路腐蚀和静电攻击。(A display device (10) comprises a display panel (100), a first metal wire (200), wherein the first metal wire (200) comprises a first end (210) and a second end (220), and the first end (210) of the first metal wire (200) is connected with the display panel (100); a control module (300) connected to the second end (220) of the first metal trace (200); the second metal wire (400), the second metal wire (400) includes a third end (410) and a fourth end (420), the third end (410) of the second metal wire (400) is connected with the control module (300), the fourth end (420) of the second metal wire (400) is used for receiving a first test signal, the control module (300) is used for controlling whether the first test signal is transmitted to the display panel (100) through the first metal wire (200), and when the control module (300) controls the first test signal to be transmitted to the display panel (100) through the first metal wire (200), the display panel (100) is tested. An electronic device, an array test structure and an array test method are provided. The display device (10) can prevent the display panel (100) from line corrosion and electrostatic attack.)

A display device, characterized in that the display device comprises:

a display panel;

the first metal routing comprises a first end and a second end, and the first end of the first metal routing is connected with the display panel;

the control module is connected with the second end of the first metal wire;

the second metal routing wire comprises a third end and a fourth end, the third end of the second metal routing wire is connected with the control module, the fourth end of the second metal routing wire is used for receiving a first test signal, the control module is used for controlling whether the first test signal is transmitted to the display panel through the first metal routing wire or not, and when the control module controls the first test signal to be transmitted to the display panel through the first metal routing wire, the display panel is tested.

The display device according to claim 1, wherein the display panel includes a plurality of data lines or scan lines, and the first end of the first metal trace is connected to the data lines or the scan lines in the display panel.

The display device according to claim 1, wherein the control module includes a plurality of electronically controlled switches therein, the electronically controlled switches being first thin film transistors.

The display device according to claim 3, wherein the first thin film transistor comprises a source electrode, the third end of the second metal wire is connected to the source electrode of the first thin film transistor, and the first test signal is transmitted to the source electrode of the first thin film transistor through the second metal wire.

The display device according to claim 4, wherein the first thin film transistor further comprises a drain, and the drain in the first thin film transistor is connected to the second end of the first metal trace.

The display device of claim 5, wherein the first thin film transistor further comprises an active region through which the source and the drain are spaced.

The display device according to claim 5, wherein the first thin film transistor further comprises a gate, the gate receives a control signal and controls on and off between the source and the drain under the control of the control signal, and when the source and the drain are turned on under the control of the control signal, the first test signal is transmitted to the active region through the source of the first thin film transistor and reaches the drain, and is transmitted to the display panel through a first metal wire electrically connected to the drain.

The display device according to claim 3, wherein the first thin film transistor has a structure type including a back channel etch type structure first thin film transistor, a conventional etch stop structure first thin film transistor, or a coplanar etch structure first thin film transistor.

The display device of claim 1, wherein the display device further comprises:

the welding pad is electrically connected with the first metal wire;

the chip on film is arranged on the welding pads and used for providing second test signals, and the second test signals are transmitted to the display panel through the welding pads and first metal wires electrically connected with the welding pads so as to test the display panel.

An electronic device characterized in that the electronic device comprises the display device according to any one of claims 1 to 9.

An array test structure, comprising:

an array test module for providing a first test signal;

the second metal wire comprises a third end and a fourth end, and the fourth end of the second metal wire is connected with the array test module to receive the first test signal;

the third end of the second metal wire is connected with the control module;

the first metal routing comprises a first end and a second end, the second end of the first metal routing is connected with the control module, the first end of the first metal routing is connected with the display panel, the control module is used for controlling whether the first test signal is transmitted to the display panel through the first metal routing or not, and when the control module controls the first test signal to be transmitted to the display panel through the first metal routing, the display panel is tested.

The array test structure of claim 11, wherein the control module includes a plurality of electronically controlled switches therein, the electronically controlled switches being first thin film transistors.

The array test structure of claim 12, wherein the first thin film transistor comprises a source, a drain, and an active region, a third end of the second metal trace connects to the source in the first thin film transistor, the drain in the first thin film transistor connects to a second end of the first metal trace, the source and the drain are spaced apart by the active region.

The array test structure of claim 13, wherein the first thin film transistor further comprises a gate, the gate receives a control signal and controls on and off between the source and the drain under the control of the control signal, and when the source and the drain are turned on under the control of the control signal, the first test signal is transmitted to the active region and to the drain through the source of the first thin film transistor and to the display panel through a first metal trace electrically connected to the drain.

The array test structure of claim 11, wherein the array test module comprises one or more stages of test signal circuits, the test signal circuits comprise second thin film transistors, and the fourth ends of the second metal traces are connected to the second thin film transistors for connecting to the array test module.

The array test method of the display panel is characterized by comprising the following steps:

the array test module provides a first test signal and transmits the first test signal to the control module through the second metal wire;

the control module controls whether the first test signal is transmitted to the display panel through a first metal routing or not, and when the control module controls the first test signal to be transmitted to the display panel through the first metal routing, the display panel is tested.

The array test method of the display panel according to claim 16, wherein the control module comprises a first thin film transistor, the first thin film transistor comprises a source electrode, a drain electrode, a gate electrode and an active region, the gate electrode receives a control signal and controls the on and off between the source electrode and the drain electrode under the control of the control signal, and when the source electrode and the drain electrode are turned on under the control of the control signal, the first test signal is transmitted to the active region through the source electrode of the first thin film transistor, reaches the drain electrode, and is transmitted to the display panel through a first metal wire electrically connected to the drain electrode.

The array test method of the display panel according to claim 17, wherein when the source and the drain are turned off under the control of the control signal, the first test signal cannot be transmitted to the active region through the source of the first thin film transistor and reaches the drain, thereby blocking the first test signal from being transmitted to the display panel through a first metal wire electrically connected to the drain.

The array testing method of the display panel according to claim 18, wherein the first metal traces are electrically connected to a chip on film, the chip on film is used for providing a second test signal, and the second test signal is transmitted to the display panel through the chip on film and the first metal traces electrically connected to the chip on film for testing the display panel.