阅读说明：本技术 一种牙科检查用的双模式探测器 (Dual-mode detector for dental examination ) 是由 金虎林 于 2020-04-16 设计创作，主要内容包括：本发明公开了一种牙科检查用的双模式探测器,其特征在于,所述探测器包括有Dummy Pad,所述Dummy Pad由变形的两个COF type的Gate IC进行组合,实现在一个Panel上运行Dental CT模式和Panorama模式。本发明的探测器中使用一个Flat panel支持Dental CT模式和Panorama模式两种模式,减少了使用两个CMOS传感器的制造成本,而驱动Panorama模式时,Dummy Pad由两个COF type的Gate IC组成的50条线路可任意定义,而且驱动所需线路数也可任意定义,并且驱动Dental CT模式(整体画面)时,添加STV2进行驱动,不仅较好的通道线路的使用效率,而且分配合理。(The invention discloses a dual-mode detector for Dental examination, which is characterized by comprising a Dummy Pad, wherein the Dummy Pad is combined by two COF type Gate ICs in a deformed mode, and a Dental CT mode and a Panorama mode are operated on one Panel. The detector of the invention uses one Flat panel to support two modes of a fractional CT mode and a Panorama mode, thereby reducing the manufacturing cost of using two CMOS sensors, and when the Panorama mode is driven, 50 lines formed by Gate ICs of two COF types can be randomly defined for Dummy Pad, the number of lines required by driving can be randomly defined, and when the fractional CT mode (whole picture) is driven, STV2 is added for driving, thereby not only having better use efficiency of channel lines, but also having reasonable distribution.)

1. A dual mode detector for Dental examinations, characterized in that it comprises a Dummy Pad combined by two COF type gates IC of varying types, enabling running the Dental CT mode and Panorama mode on one Panel.

2. A dual mode probe for dental examinations according to claim 1 characterized in that only 50 lines are driven in the panorama mode of operation, the 50 lines being arbitrarily definable and the number of lines required for driving being arbitrarily definable.

3. A dual mode detector for dental examinations according to claim 1 characterized in that the STV2 output of the nth Gate IC in the DentalCT mode is not connected to the STV1 of the (N + 1) th Gate IC.

Technical Field

The invention mainly relates to the technical field of dental examination equipment, in particular to a dual-mode detector for dental examination.

Background

When a general Dental detector is combined with an X-ray device for tooth inspection, a structure of a Dental system in the detector, which supports a Dental CT mode and a Panorama mode, is composed of two CMOS sensors of the Dental CT and the Panorama, and each sensor works when shooting a required mode.

However, the Panorama mode in which the operation in the entire screen mode (dental CT mode) is not problematic but the operation in the partial region (50 lines) cannot be driven is because 1 Gate IC is composed of 256 channels, all 256 channel lines are necessarily driven in the STV1 and CPV modes, and after the above-described 256 channel lines are connected to the panel in a state where all channels are driven, only 50 channels of a necessary portion are read to realize a partial extraction function, but when an image is repeatedly acquired, unnecessary data are accumulated in the extra lines (51 to 256) during VGH driving, and the 50 channel data of the necessary portion are affected by a phenomenon of warming up of the panel.

Disclosure of Invention

The present invention provides a dual-mode detector for dental examination, which is used to solve the technical problems in the background art.

The technical scheme adopted by the invention for solving the technical problems is as follows:

a dual mode detector for dental examinations, characterized in that it comprises a Dummy Pad combined by two COF type Gate ICs of varying type, enabling the running of the DentalCT mode and Panorama mode on one Panel.

Further, only 50 lines are driven in the panorama mode, the 50 lines can be defined arbitrarily, and the number of lines required for driving can be defined arbitrarily.

Further, the STV2 output of the Nth Gate IC in the Dental CT mode is not connected to the STV1 of the (N + 1) th Gate IC.

Compared with the prior art, the invention has the beneficial effects that:

the detector of the invention uses one Flat panel to support two modes of a fractional CT mode and a Panorama mode, thereby reducing the manufacturing cost of using two CMOS sensors, and when the Panorama mode is driven, 50 lines formed by Gate ICs of two COF types can be randomly defined for Dummy Pad, the number of lines required by driving can be randomly defined, and when the fractional CT mode (whole picture) is driven, STV2 is added for driving, thereby not only having better use efficiency of channel lines, but also having reasonable distribution.

The present invention will be explained in detail below with reference to the drawings and specific embodiments.

Drawings

FIG. 1 is a schematic diagram of the architecture of the fractional CT mode and Panorama mode of the present invention;

FIG. 2 is a schematic diagram of the expanded architecture of the X-ray panel of the present invention;

FIG. 3 is an enlarged view of area A in FIG. 2;

FIG. 4 is a schematic diagram of a Gate IC according to the present invention;

FIG. 5 is a timing diagram of the STV1 output and STV2 output of the present invention;

FIG. 6 is a schematic diagram of a driving connection structure of two Gate ICs according to the present invention;

FIG. 7 is a schematic diagram of a Dental CT mode and Panorama mode implemented on the same panel;

FIG. 8 is a schematic diagram of the connection of the architecture composed of two COF type Gate ICs according to the present invention;

FIG. 9 is an enlarged view of the screen of the present invention in both the case where the Gate IC is small or large.

Detailed Description

In order to facilitate an understanding of the invention, the invention will now be described more fully hereinafter with reference to the accompanying drawings, in which several embodiments of the invention are shown, but which may be embodied in different forms and not limited to the embodiments described herein, but which are provided so as to provide a more thorough and complete disclosure of the invention.

It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may be present, and when an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present, as the terms "vertical", "horizontal", "left", "right" and the like are used herein for descriptive purposes only.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs, and the knowledge of the terms used herein in the specification of the present invention is for the purpose of describing particular embodiments and is not intended to limit the present invention, and the term "and/or" as used herein includes any and all combinations of one or more of the associated listed items.