Electronic device and method for determining unqualified mounting reason of substrate component
阅读说明:本技术 确定贴装在基板部件的贴装不合格原因的电子装置及方法 (Electronic device and method for determining unqualified mounting reason of substrate component ) 是由 李钟明 李德永 崔守亨 郑贤洙 于 2019-06-28 设计创作,主要内容包括:一种确定贴装于基板的多个部件各个的贴装不良原因的方法,所述方法由电子装置执行,可包括如下的步骤:接收所述多个第一部件各个的贴装是否不合格的检查结果,所述检查结果是通过对检查贴装多个第一部件的多个第一类型基板确定,所述多个第一部件各个的所述第一类型基板贴装位置相互不同;利用所述检查结果,计算所述多个第一部件各个的贴装不合格率;基于所述多个第一部件各个的贴装不合格率,在所述多个第一部件中确定出现贴装不合格的多个第二部件;及基于所述多个第一部件各个的贴装不合格率,由部件的贴装位置设定错误、按照部件的类型的贴装条件设定错误及贴装机的喷嘴缺陷中的至少一个确定所述多个第二部件各个的贴装不合格原因。(A method of determining a cause of a poor mounting of each of a plurality of components mounted on a substrate, the method being performed by an electronic device and comprising the steps of: receiving an inspection result of whether mounting of each of the plurality of first components is unqualified, wherein the inspection result is determined by inspecting a plurality of first type substrates for mounting the plurality of first components, and mounting positions of the first type substrates of each of the plurality of first components are different from each other; calculating a mounting failure rate of each of the plurality of first components using the inspection result; determining a plurality of second components with unqualified mounting in the plurality of first components based on the mounting unqualified rate of each of the plurality of first components; and determining a cause of mounting failure of each of the plurality of second components from at least one of a mounting position setting error of the component, a mounting condition setting error according to a type of the component, and a nozzle defect of the mounter, based on a mounting failure rate of each of the plurality of first components.)
1. A method of determining a cause of poor mounting of a component mounted on a substrate, the method being performed by an electronic device, comprising the steps of:
receiving an inspection result of whether mounting of each of a plurality of first components is unqualified, wherein the inspection result is determined by inspecting a plurality of first type substrates on which the plurality of first components are mounted, and mounting positions on the first type substrates of the plurality of first components are different from each other;
calculating a mounting failure rate of each of the plurality of first components using the inspection result;
determining a plurality of second components with unqualified mounting in the plurality of first components based on the mounting unqualified rate of each of the plurality of first components; and
determining a cause of mounting failure of each of the plurality of second components from at least one of a mounting position setting error of a component, a mounting condition setting error according to a type of the component, and a nozzle defect of the mounter, based on a mounting failure rate of each of the plurality of first components.
2. The method of claim 1,
the step of calculating the mounting failure rate of each of the plurality of first components includes the steps of:
using the inspection result to respectively distinguish the first type substrates into at least one first type substrate without mounting failure and at least one first type substrate with mounting failure for the first components; and
and calculating the mounting failure rate of each of the plurality of first components by using the number of the at least one first-type substrate without mounting failure and the number of the at least one first-type substrate with mounting failure.
3. The method of claim 1,
the step of determining, among the plurality of first components, that the plurality of second components which are not qualified for mounting have occurred includes the steps of:
determining a plurality of components having a mounting failure rate greater than a first critical value set in advance among the mounting failure rates of the respective first components; and
determining the determined plurality of components as the plurality of second components.
4. The method of claim 1,
the step of determining a cause of mounting failure for each of the plurality of second components includes the steps of:
classifying the first components into a plurality of first component groups according to a plurality of first component types, the first components being distinguished as one of the first component types,
determining, among the plurality of first component groups, a plurality of second component groups including at least one of the plurality of second components;
comparing mounting failure rates of a plurality of third components included in each of the plurality of second component groups with each other based on the mounting failure rates of each of the plurality of first components; and
determining, among the plurality of second components, a cause of mounting failure of a plurality of fourth components selected based on the comparison result as a mounting position setting error of the component.
5. The method of claim 4,
the plurality of fourth components are components having mounting failure rates determined to be outliers based on the comparison result, respectively, in one of the plurality of second component groups.
6. The method of claim 4,
the step of determining a cause of mounting failure for each of the plurality of second components further includes the steps of:
calculating, among the plurality of first components, a mounting failure rate of each of the plurality of first component types based on a mounting failure rate of each of a plurality of fifth components other than the plurality of fourth components;
classifying the plurality of first component types into a plurality of first component type groups according to a plurality of first nozzles used when mounting the plurality of first components;
comparing mounting failure rates of a plurality of first component types included in each of the plurality of first component type groups with each other; and
among the plurality of second components, a cause of defective mounting of a plurality of sixth components distinguished by a plurality of second component types selected based on the comparison result is determined as an error set in accordance with the component type mounting conditions.
7. The method of claim 6,
the plurality of second component types are respectively one of the plurality of first component type groups, and are determined as component types having mounting failure rates determined as outliers based on the comparison result.
8. The method of claim 6,
the determining of the cause of mounting failure for each of the plurality of second components further includes:
calculating a mounting failure rate of each of the plurality of first nozzles based on a mounting failure rate of each of a plurality of third component types other than the plurality of second component types, among the plurality of first component types;
comparing mounting failure rates of the plurality of first nozzles with each other; and
among the plurality of second components, a cause of mounting failure of a plurality of seventh components mounted with at least one second nozzle selected based on the comparison result is determined as the nozzle defect.
9. The method of claim 8,
the at least one second nozzle is a nozzle having a mounting failure determined to be an outlier among the plurality of first nozzles based on the comparison result.
10. The method of claim 8, further comprising the steps of:
adjusting a mounting failure rate of at least one third nozzle except the at least one second nozzle among the plurality of first nozzles;
adjusting a mounting failure rate of at least one component type of the plurality of first component types based on at least one of the mounting failure rate of the at least one second nozzle and the adjusted mounting failure rate of the at least one third nozzle;
adjusting a mounting failure rate of at least one component of the plurality of first components based on at least one of a mounting failure rate of the at least one second nozzle, a mounting failure rate of each of the adjusted at least one third nozzle, and a mounting failure rate of a component type of the adjusted at least one second nozzle; and
based on the mounting failure rate adjustment result, the degree of contribution to the occurrence of mounting failures, respectively, of a mounting position setting error for the component of the plurality of second components, a mounting condition setting error according to the type of the component, and a nozzle defect included in the mounter, is calculated.
11. The method of claim 10, further comprising the steps of:
a map showing the relationship among the plurality of first components, the plurality of first component types, and the plurality of first nozzles is generated, and
the adjusted mounting failure rates of the respective first components, the adjusted mounting failure rates of the respective first component types, and the adjusted mounting failure rates of the respective first nozzles are shown on the map.
12. The method of claim 10, further comprising the steps of:
and generating and showing a graph in which the adjusted mounting failure rates of the respective first components, the adjusted mounting failure rates of the respective first component types, and the adjusted mounting failure rates of the respective first nozzles are arranged in accordance with the magnitude of the mounting failure rates.
13. The method of claim 1, further comprising the steps of:
and sending a control signal for changing a control parameter of a mounter or information that a mounter component element needs to be replaced to the mounter based on a cause of mounting failure of each of the plurality of second components, wherein the mounter is used for mounting the plurality of first components on the first type substrate.
14. An electronic device for determining a cause of a mounting failure for each of a plurality of components mounted on a substrate, comprising:
more than one memory; and
a processor electrically connected to the one or more memories and
the at least one memory, when executed, receives an inspection result of whether each of the plurality of first components is not acceptable for mounting, the inspection result being determined by inspecting a plurality of first type substrates on which the plurality of first components are mounted, mounting positions on the first type substrates of the plurality of first components being different from each other,
calculating a mounting failure rate of each of the plurality of first components using the inspection result,
determining a plurality of second components, which have been determined to have mounting failure, among the plurality of first components based on mounting failure rates of the respective plurality of first components,
based on the mounting failure rate of each of the plurality of first components, storing a usage specification for determining a cause of mounting failure of each of the plurality of second components from at least one of a mounting position setting error of a component, a mounting condition setting error according to a type of the component, and a nozzle defect included in the mounter.
15. A method of determining a cause of a poor mounting of each of a plurality of components mounted on a substrate, the method being performed by an electronic device, comprising the steps of:
receiving a first error value of each of a plurality of first components, the first error value being determined by inspecting a plurality of first-type substrates on which the plurality of first components are mounted, the mounting positions of the plurality of first components on the first-type substrates being different from each other;
decomposing a first error value of each of the plurality of first components into a second error value due to setting of an error for a mounting position of the component, a third error value due to setting of an error according to a type mounting condition of the component, and a fourth error value due to a defect of a nozzle included in the mounter;
determining a plurality of second components with unqualified mounting in the plurality of first components based on the second error value, the third error value and the fourth error value of each of the plurality of first components; and
determining a cause of defective mounting of each of the plurality of second components from at least one of a mounting position setting error of the component, a mounting condition setting error according to a type of the component, and a nozzle defect included in the mounter, based on the second error value, the third error value, and the fourth error value of each of the plurality of second components.
16. The method of claim 15,
the step of decomposing the first error value for each of the plurality of first components comprises the steps of:
classifying the plurality of first components into a plurality of first component groups according to a plurality of first component types, the plurality of first components being distinguished as one of the plurality of first component types, respectively,
comparing first error values of a plurality of third components included in the plurality of first component groups, respectively, with each other based on the first error values of the respective plurality of first components;
selecting, among the plurality of first components, a plurality of fourth components based on the comparison result;
calculating an average error value of each of the plurality of first component groups based on first error values of a plurality of fifth components other than the plurality of fourth components, among the plurality of first components; and
calculating a second error value of each of the plurality of first components generated due to a mounting position setting error of the component based on the first error value of each of the plurality of first components and the average error value of each of the plurality of first component groups.
17. The method of claim 16,
the step of decomposing the first error value for each of the plurality of first components further comprises the steps of:
calculating an error value for each of the plurality of first component types based on an average error value for each of the plurality of first component sets;
classifying the plurality of first component types into a plurality of first component type groups according to a plurality of first nozzles used for mounting the plurality of first components;
comparing error values of a plurality of second component types respectively included in the plurality of first component type groups with each other based on the error value of each of the plurality of first component types;
selecting a plurality of third component types based on the comparison result among the plurality of first component types;
calculating an average error value of each of the plurality of first component type groups based on error values of a plurality of fourth component types other than the plurality of third component types among the plurality of first component types; and
calculating a third error value of each of the plurality of first components because of an error in setting of mounting conditions according to the type of the component, based on the error value of each of the plurality of first component types and the average information of each of the plurality of first component type groups.
18. The method of claim 17,
the step of decomposing the first error value for each of the plurality of second components further comprises the steps of:
calculating an error value for each of the plurality of first nozzles based on the average error value for each of the plurality of first component type groups;
calculating a fourth error value for each of the plurality of first components due to the nozzle defect based on the error value for each of the plurality of first nozzles; and
decomposing the first error value for each of the plurality of first components into a second error value, a third error value, and a fourth error value for each of the plurality of first components.
19. The method of claim 15,
the step of determining, among the plurality of first components, that the plurality of second components which are not qualified for mounting have occurred includes the steps of:
determining a plurality of components for which at least one of the second, third, and fourth error values for each of the plurality of first components is outside of a set first range; and
determining the determined plurality of components as the plurality of second components.
20. The method of claim 15,
the step of determining a cause of mounting failure for each of the plurality of second components includes the steps of:
judging whether the second error value, the third error value and the fourth error value of each of the plurality of second components are within a set second range respectively;
determining a cause of mounting failure for each of the plurality of second components based on the determination result from at least one of a mounting position setting error of the component, a mounting condition setting error according to a type of the component, and a defect of the nozzle.
Technical Field
The present invention relates to an electronic device and a method for determining a cause of defective mounting of a component mounted on a substrate.
Background
Generally, in an SMT (Surface mount Technology) process, a screen printer prints solder paste on a substrate, and a Mounter mounts components on the substrate on which the solder paste is printed.
In addition, as a substrate Inspection apparatus for inspecting a mounting state of a component mounted on a substrate, an Automatic Optical Inspection (AOI) apparatus is being used. The substrate inspection device inspects whether a component is normally attached to a substrate by using an image photographed on the substrate without displacement, deformation, inclination, and the like. The substrate inspection apparatus can determine whether the mounting failure occurs using the inspection result.
On the other hand, in the case where mounting failure occurs as a result of inspection by the substrate inspection apparatus, the apparatus operator is required to perform subsequent processing in the subsequent component mounting process to reduce the mounting failure rate, such as adjustment of control parameters of a mounter that performs the component mounting process, replacement of components included in the mounter, and the like. In order to determine what kind of subsequent processing should be performed to be able to reduce the mounting failure rate, it is necessary to determine the cause of the mounting failure for the component where the mounting failure occurs.
Disclosure of Invention
(problem to be solved)
The invention can provide a method and an electronic device for determining the unqualified mounting reason of each of a plurality of unqualified mounting components by utilizing the unqualified mounting rate of each of the plurality of components mounted on a substrate.
The present invention can provide a method and an electronic apparatus for determining the cause of defective mounting of each of a plurality of components having defective mounting by using measurement information indicating the mounting state of each of the plurality of components mounted on a substrate.
The invention can provide the following method and electronic device: determining the cause of mounting failure of each of the plurality of components having mounting failure, and transmitting a control parameter for eliminating the determined cause of mounting failure to the mounting device.
(means for solving the problems)
According to various embodiments of the present invention, a method of determining a cause of a poor mounting of a component mounted on a substrate, the method being performed by an electronic device, may include the steps of: receiving an inspection result of whether mounting of each of the plurality of first components is unqualified, wherein the inspection result is determined by inspecting a plurality of first type substrates on which the plurality of first components are mounted, and mounting positions of the first type substrates of each of the plurality of first components are different from each other; calculating a mounting failure rate of each of the plurality of first components using the inspection result; determining a plurality of second components with unqualified mounting in the plurality of first components based on the mounting unqualified rate of each of the plurality of first components; and determining a cause of mounting failure of each of the plurality of second components from at least one of a mounting position setting error of the component, a mounting condition setting error according to a type of the component, and a nozzle defect of the mounter, based on a mounting failure rate of each of the plurality of first components.
In an embodiment, the step of calculating the mounting failure rate of each of the plurality of first components may include the steps of: using the inspection result to respectively distinguish the first type substrates into at least one first type substrate without mounting failure and at least one first type substrate with mounting failure for the first components; and calculating the mounting failure rate of each of the plurality of first components by using the number of the at least one first-type substrate without mounting failure and the number of the at least one first-type substrate with mounting failure.
In an embodiment, the step of determining, among the plurality of first components, the plurality of second components that are not eligible for mounting may include the steps of: determining a plurality of components having a mounting failure rate greater than a first critical value set in advance among the mounting failure rates of the respective first components; and determining the determined plurality of components as the plurality of second components.
In an embodiment, the step of determining a cause of mounting failure for each of the plurality of second components may include the steps of: classifying the plurality of first components into a plurality of first component groups according to a plurality of first component types, the plurality of first components being distinguished as one of the plurality of first component types, respectively, determining a plurality of second component groups including at least one of the plurality of second components among the plurality of first component groups; comparing mounting failure rates of a plurality of third components included in each of the plurality of second component groups with each other based on the mounting failure rates of each of the plurality of first components; and determining, among the plurality of second components, a cause of mounting failure of a plurality of fourth components selected based on the comparison result as a mounting position setting error of the component.
In an embodiment, the plurality of fourth components may be components having a mounting failure rate determined to be an outlier (outlier) based on the comparison result in one of the plurality of second component groups, respectively.
In an embodiment, the step of determining the cause of the mounting failure of each of the plurality of second components may further include the steps of: calculating, among the plurality of first components, a mounting failure rate of each of the plurality of first component types based on a mounting failure rate of each of a plurality of fifth components other than the plurality of fourth components; classifying the plurality of first component types into a plurality of first component type groups according to a plurality of first nozzles used when mounting the plurality of first components; comparing mounting failure rates of a plurality of first component types included in each of the plurality of first component type groups with each other; and determining, among the plurality of second components, a cause of mounting failure of a plurality of sixth components distinguished by a plurality of second component types selected based on the comparison result as an error set in accordance with the component type mounting condition.
In an embodiment, the plurality of second component types may be respectively one of the plurality of first component type groups determined as a component type having a mounting failure rate determined as an outlier based on the comparison result.
In an embodiment, the step of determining a cause of mounting failure for each of the plurality of second components may further include: calculating a mounting failure rate of each of the plurality of first nozzles based on a mounting failure rate of each of a plurality of third component types other than the plurality of second component types, among the plurality of first component types; comparing mounting failure rates of the plurality of first nozzles with each other; and determining, among the plurality of second components, a cause of mounting failure of a plurality of seventh components mounted with at least one second nozzle selected based on the comparison result as the nozzle defect.
In an embodiment, the at least one second nozzle may be a nozzle having a mounting failure in which an outlier determined based on the comparison result occurs among the plurality of first nozzles.
In an embodiment, the method may further comprise the steps of: adjusting a mounting failure rate of at least one third nozzle except the at least one second nozzle among the plurality of first nozzles; adjusting a mounting failure rate of at least one component type of the plurality of first component types based on at least one of the mounting failure rate of the at least one second nozzle and the adjusted mounting failure rate of the at least one third nozzle; adjusting a mounting failure rate of at least one component of the plurality of first components based on at least one of a mounting failure rate of the at least one second nozzle, a mounting failure rate of each of the adjusted at least one third nozzle, and a mounting failure rate of a component type of the adjusted at least one second nozzle; and calculating, based on the mounting failure rate adjustment result, a degree of contribution to mounting position setting errors for the components of the plurality of second components, respectively, mounting condition setting errors according to the types of the components, and nozzle defects included in the mounter, respectively, to occurrence of mounting failures.
In an embodiment, the method may further comprise the steps of: generating and showing a map of the relationship of the plurality of first components, the plurality of first component types, and the plurality of first nozzles; the adjusted mounting failure rates of the respective first components, the adjusted mounting failure rates of the respective first component types, and the adjusted mounting failure rates of the respective first nozzles are shown on the map.
In an embodiment, the method may further comprise the steps of: and generating and showing a graph in which the adjusted mounting failure rates of the respective first components, the adjusted mounting failure rates of the respective first component types, and the adjusted mounting failure rates of the respective first nozzles are arranged in accordance with the magnitude of the mounting failure rates.
In an embodiment, the method may further comprise the steps of: and sending a control signal for changing a control parameter of a mounter or information that a mounter component element needs to be replaced to the mounter based on a cause of mounting failure of each of the plurality of second components, wherein the mounter is used for mounting the plurality of first components on the first type substrate.
According to various embodiments of the present invention, an electronic device for determining a cause of a mounting failure of each of a plurality of components mounted on a substrate includes: more than one memory; and a processor electrically connected to the communication circuit and the one or more memories; when the memory is executed, the processor receives the inspection result of whether each of the first components is unqualified for mounting, the inspection result is determined by inspecting a plurality of first type substrates on which a plurality of first components are mounted, mounting positions on the first type substrate of each of the plurality of first components are different from each other, a mounting failure rate of each of the plurality of first components is calculated using the inspection result, and based on the mounting failure rate of each of the plurality of first components, and determining a plurality of second components having mounting failures among the plurality of first components, and storing a description for determining a cause of the mounting failure of each of the plurality of second components based on at least one of a mounting failure rate of each of the plurality of first components, a mounting position setting error of a component, a mounting condition setting error according to a type of the component, and a nozzle defect included in the mounter.
According to various embodiments of the present invention, a method of determining a cause of a mounting failure for each of a plurality of components mounted on a substrate, the method being performed by an electronic device, may include the steps of: receiving a first error value of each of a plurality of first components, the first error value being determined by inspecting a plurality of first-type substrates on which the plurality of first components are mounted, the mounting positions of the plurality of first components on the first-type substrates being different from each other; decomposing a first error value of each of the plurality of first components into a second error value due to an error being set for a mounting position of the component, a third error value due to an error being set in accordance with a type mounting condition of the component, and a fourth error value due to a defect of a nozzle included in the mounter; determining a plurality of second components with unqualified mounting in the plurality of first components based on the second error value, the third error value and the fourth error value of each of the plurality of first components; and determining a cause of defective mounting of each of the plurality of second components from at least one of a mounting position setting error of the component, a mounting condition setting error according to a type of the component, and a nozzle defect included in the mounter, based on the second error value, the third error value, and the fourth error value of each of the plurality of second components.
In one embodiment, the step of decomposing the first error value for each of the plurality of first components may comprise the steps of: classifying the plurality of first components into a plurality of first component groups according to a plurality of first component types, wherein the plurality of first components are respectively distinguished into one of the plurality of first component types, and comparing first error values of a plurality of third components respectively included in the plurality of first component groups with each other based on the first error values of the plurality of first components; selecting, among the plurality of first components, a plurality of fourth components based on the comparison result; calculating, among the plurality of first components, an average error value of each of the plurality of first component groups based on first error values of a plurality of fifth components other than the plurality of fourth components; calculating a second error value of each of the plurality of first components generated due to a mounting position setting error of the component based on the first error value of each of the plurality of first components and the average error value of each of the plurality of first component groups.
In an embodiment, the step of decomposing the first error value for each of the plurality of first components may further include the steps of: calculating an error value for each of the plurality of first component types based on the average error value for each of the plurality of first component sets; classifying the plurality of first component types into a plurality of first component type groups according to a plurality of first nozzles utilized for the plurality of first components; comparing error values of a plurality of second component types respectively included in the plurality of first component type groups with each other based on the error value of each of the plurality of first component types; selecting a plurality of third component types based on the comparison result among the plurality of first component types; calculating an average error value of each of the plurality of first component type groups based on error values of a plurality of fourth component types other than the plurality of third component types among the plurality of first component types; calculating a third error value of each of the plurality of first components because of an error in setting of mounting conditions according to the type of the component, based on the error value of each of the plurality of first component types and the average information of each of the plurality of first component type groups.
In an embodiment, the step of decomposing the first error value for each of the plurality of second components may further include the steps of: calculating an error value for each of the plurality of first nozzles based on the average error value for each of the plurality of first component type groups; calculating a fourth error value of each of the plurality of first components generated due to a defect of the nozzle based on the error value of each of the plurality of first nozzles; decomposing the first error value for each of the plurality of first components into a second error value, a third error value, and a fourth error value for each of the plurality of first components.
In an embodiment, the step of determining, among the plurality of first components, the plurality of second components that are not eligible for mounting may include the steps of: determining a plurality of components for which at least one of the second, third, and fourth error values for each of the plurality of first components is outside of a set first range; determining the determined plurality of components as the plurality of second components.
In an embodiment, the step of determining a cause of mounting failure for each of the plurality of second components may include the steps of: judging whether the second error value, the third error value and the fourth error value of each of the plurality of second components are within a set second range respectively; determining a cause of mounting failure for each of the plurality of second components based on the determination result from at least one of a mounting position setting error of the component, a mounting condition setting error according to a type of the component, and a defect of the nozzle.
(Effect of the invention)
According to the electronic apparatus of various embodiments of the present invention, using the measurement information indicating the mounting failure rate of each of the plurality of components mounted on the substrate or the mounting state of each of the plurality of components, the cause of mounting failure of each of the plurality of components for which mounting failure has occurred can be determined. Therefore, the subsequent treatment which should be executed can be effectively and accurately judged in the subsequent mounting process so as to reduce the mounting failure rate.
In addition, the electronic device displays the result of failure analysis of the mounter component related to the mounted component by inspecting the mounted component in the SMT process, thereby making it easy for a user to recognize it.
In addition, the electronic device determines the cause of the occurrence of mounting failure for the component for which mounting failure has occurred, and based on this, sends notification information for taking subsequent measures, such as replacement of components in the mounter or the like, or may perform control parameter adjustment or the like, to the mounter that performs the component mounting process.
Drawings
FIG. 1 illustrates an SMT process line according to various embodiments of the invention.
Fig. 2 illustrates a first substrate inspection apparatus according to various embodiments of the present invention.
FIG. 3 shows a block diagram of an electronic device according to various embodiments of the invention.
Fig. 4 illustrates a flowchart of a mounting failure cause determination method for each of a plurality of components mounted on a substrate according to various embodiments of the present invention.
Fig. 5 illustrates pads, solder paste, and components on a substrate according to various embodiments of the invention.
Fig. 6 shows a table of components, types of components, and mounting failure rates of respective nozzles according to various embodiments of the present invention.
Fig. 7 illustrates a flowchart of a method of determining a cause of failure in component mounting to set an error for a mounting position of a component according to various embodiments of the present invention.
Fig. 8 illustrates a flowchart of a method of determining a cause of component mounting failure as an error set according to mounting conditions of the type of component according to various embodiments of the present disclosure.
Fig. 9 illustrates a flowchart of a method of determining a cause of component mounting failure as a nozzle defect according to various embodiments of the present invention.
Fig. 10 illustrates a flowchart of a method of calculating a degree of contribution to occurrence of mounting failure according to various embodiments of the present invention.
Fig. 11 shows a table of adjusted mounting failure rates of components, types of components, and nozzles according to each in various embodiments of the present invention.
Fig. 12 illustrates a flowchart of a mounting failure cause determination method for each of a plurality of components mounted on a substrate according to various embodiments of the present invention.
Fig. 13a and 13b show tables of first to fourth error values for each of a plurality of first components according to various embodiments of the present invention.
FIG. 14 illustrates a flow chart of a second error value calculation method for each of a plurality of first components, according to various embodiments of the invention.
FIG. 15 illustrates a flow chart of a third error value calculation method for each of a plurality of first components according to various embodiments of the invention.
FIG. 16 illustrates a flow chart of a fourth error value calculation method for each of a plurality of first components according to various embodiments of the invention.
Fig. 17 is a flowchart illustrating a mounting failure cause determination method for each of a plurality of second components in which mounting failure occurs according to various embodiments of the present invention.
Fig. 18 shows a diagram for explaining a method of controlling a mounter according to a cause of mounting failure in various embodiments of the present invention.
Fig. 19a to 19c show graphs of mounting failure rates according to various embodiments representing the present invention.
Fig. 20 a-20 c show graphs of error values according to various embodiments representative of the present disclosure.
FIG. 21 illustrates a screen in which content is analyzed for error values according to various embodiments of the invention.
FIG. 22 illustrates a screen in which content is analyzed for error values according to various embodiments of the invention.
Fig. 23 illustrates a screen of a solder paste image, a component image after a mounting process, and a component image after a reflow process according to various embodiments of the present invention.
Fig. 24 shows a graph representing mounting failure rates according to various embodiments of the present invention.
Detailed Description
The embodiments disclosed in the present invention are exemplified for the purpose of explaining the technical idea disclosed in the present invention. It is intended that the scope of the claims herein disclosed should not be limited to the embodiments set forth below or the particular illustrations of such embodiments.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. All terms used in the present invention are selected for the purpose of more clearly explaining the present invention, and are not to be construed as limiting the scope of the right of the present invention.
For expressions such as "including", "having", etc., used in the present invention, unless stated differently in a sentence or article including the expression, it should be understood that open-ended terms (open-ended terms) that may include possibilities of other embodiments are included.
The singular expressions used in the present invention may include the plural expressions unless otherwise specified, and the singular expressions used in the claims are also applicable.
The expressions "first", "second", and the like used in the present invention are used to distinguish a plurality of constituent elements from each other, and are not intended to limit the order or importance of the constituent elements.
The expression "based on" used in the present invention is used to describe one or more factors that affect the behavior or action of decision or judgment described in a sentence or a sentence including the expression, and the expression does not exclude additional factors that affect the behavior or action of decision or judgment.
In the present invention, when a component is referred to as being "connected" or "in contact with" another component, it is to be understood that the component may be directly connected or in contact with the other component or may be connected or in contact with another new component through the intermediary of the component.
Hereinafter, embodiments of the present invention will be described with reference to the drawings. In the drawings, the same or corresponding constituent elements are denoted by the same reference numerals. In the following description of the embodiments, the same or corresponding components will not be described repeatedly. However, even if the description of the constituent elements is omitted, there is no intention to exclude such constituent elements from an embodiment.
In the following, the steps of a flow, the steps of a method, the mechanisms, etc. are described in order in a flow chart shown in the drawings, but such flows, methods and mechanisms can be run in any suitable order. That is, the steps of the processes, methods and mechanisms described in various embodiments of the present invention need not be performed in the order described in the present invention. In addition, even though it is described that a part of the steps are not performed simultaneously, such a part of the steps may be performed simultaneously in other embodiments. Additionally, illustrating the flow by description in the figures does not imply that the illustrated flow is exclusive of other variations and modifications, does not imply that more than one of the illustrated flow or any of its steps is essential in the various embodiments of the disclosure, and does not imply that the illustrated flow is preferred.
FIG. 1 illustrates an
In one embodiment, the
In one embodiment, the
The
In one embodiment,
In addition, the devices included in the
The
Fig. 2 illustrates a first
According to various embodiments of the present disclosure, the first
In one embodiment, the first
In one embodiment, the second
In one embodiment, the
In an embodiment, the
In one embodiment, the first
According to various embodiments of the present invention, the
FIG. 3 shows a block diagram of an
In one embodiment, the memory 310 may store commands or data or the like related to another component of at least one of the
In one embodiment, the memory 310 may hold commands that cause the processor 320 to operate. For example, the memory 310 may store commands for the processor 320 to control other components of the
In one embodiment, the processor 320 drives an operating system or an application program, and may control at least one component of the
In an embodiment, the communication circuit 330 may perform communication with an external electronic device or an external server. For example, the communication circuit 330 may be configured by the
For example, the wireless communication may include cellular communication (e.g., LTE-a (LTE advance), CDMA (code division Multiple Access), WCDMA (Wideband CDMA), UMTS (Universal Mobile Telecommunications system), WiBro (wireless broadband), etc.). Additionally, the wireless communication may include: short-range wireless Communication (e.g., WiFi (wireless Fidelity), LiFi (Light Fidelity), Bluetooth Low Energy (BLE), Zigbee (Zigbee), NFC (Near Field Communication), etc.).
In one embodiment, for example, display 340 may include: liquid Crystal Displays (LCDs), Light Emitting Diode (LED) displays, Organic Light Emitting Diode (OLED) displays, and the like. For example, display 340 may display various content (e.g., text, images, videos, icons, and/or symbols) to a user. Display 340 may include a touch screen; for example, touch, gesture, proximity or hover input, etc. using an electronic pen or a portion of a user's body may be received.
According to various embodiments of the present disclosure, the processor 320 may receive solder paste printing state inspection information or solder position information from the SPI wkdcl130, may receive inspection results indicating whether or not each of a plurality of first components mounted on a substrate from the first
The processor 320 may determine a cause of mounting failure of each of the plurality of second components, for which mounting failure occurs, among the plurality of first components, using the received inspection result indicating whether the plurality of first components are mounted respectively ineligibly or measurement information of the mounting state of each of the components, and the like. A specific method of determining the cause of mounting failure for each of the plurality of second components will be described later.
In an embodiment, the processor 320 determines the reason for the unqualified mounting of each of the plurality of second components, and then the reason for the unqualified mounting of each of the plurality of second components may be displayed through the display 340. The processor 320 may also control the communication circuit 330 to transmit information indicating the cause of the mounting failure of each of the plurality of second components to the
The user confirms the reason for the unqualified mounting of each of the plurality of second components displayed by the display 340 or the display of the electronic device of the user, and can effectively and accurately judge what kind of subsequent processing should be performed in the subsequent component mounting process, so as to reduce the mounting failure rate.
Further, the processor 320 may transmit mounting failure cause information or mounting position information corrected for the second component, respectively, to the
Fig. 4 illustrates a flowchart of a mounting failure cause determination method for each of a plurality of components mounted on a substrate according to various embodiments of the present invention.
In step 410, the processor 320 of the
In one embodiment, the plurality of first components may be respectively attached to different locations on the first type of substrate. That is, positions at which the plurality of first components are mounted on the first type substrate, respectively, may be different from each other. For example, the A component is attached at the A position on the first type substrate, and the B component may be attached at the B position on the first type substrate. Here, the types of the a member and the B member may be the same or different.
The same type of substrate refers to substrates manufactured based on the same design information. That is, the same type of substrates are manufactured according to the same design information, and thus, specific parts can be attached to specific positions of the same type of substrates. For example, a component a may be mounted at the first type substrate a and B positions according to the design information of the first type substrate.
In an embodiment, the inspection result of whether the mounting of each of the plurality of first components is not qualified may include an inspection result of whether the mounting of each of the plurality of first components of the plurality of first type substrates is not qualified. For example, the inspection result of whether the a component mounting has failed or not among the plurality of first components may include an inspection result of whether the a component mounting has failed or not among the plurality of first type substrates. Therefore, the inspection result of the presence or absence of the a component mounting failure may include information indicating that at least one first-type substrate in which the a component mounting failure has occurred and at least one first-type substrate in which the a component mounting failure has not occurred among the plurality of first-type substrates. The inspection result of the mounting failure or non-mounting failure is generated for each of the plurality of first components by the first
For example, when the component is not mounted on the substrate, when the offset (offset) of the mounted component is greater than a previously set critical value, and when the planarity (coplanarity) of the mounted component is greater than a previously set critical value, the first
In step 420, the processor 320 may calculate a mounting failure rate of each of the plurality of first components using the received inspection result. For example, the processor 320 may distinguish, among the plurality of first type substrates, at least one first type substrate on which no mounting failure occurs and at least one first type substrate on which mounting failure occurs, for the respective plurality of first components, using the inspection result. Then, the processor 320 may calculate a mounting failure rate of each of the plurality of first components using the number of the at least one first-type substrate on which no mounting failure occurs and the number of the at least one first-type substrate on which the mounting failure occurs for each of the plurality of first components.
For example, the processor 320 may distinguish a plurality of first type substrates on which mounting failure does not occur to the a component from a plurality of first type substrates on which mounting failure occurs to the a component, among a plurality of 50 first type substrates on which inspection is performed by the first
In the case where the number of the first type substrates for which the mounting failure does not occur to the a component is 35 and the number of the first type substrates for which the mounting failure occurs to the a component is 15, the processor 320 may calculate the mounting failure rate of the a component to be 30%. The processor 320 may repeatedly perform the mounting failure rate calculation process for each of the plurality of first components, and may calculate the mounting failure rate for each of the plurality of first components.
In step 430, the processor 320 may determine a plurality of second components, among the plurality of first components, for which mounting failures have occurred, based on the calculated mounting failure rates of the respective plurality of first components. For example, the processor 320 may determine a plurality of components having a mounting failure rate equal to or greater than a first critical value set in advance among the mounting failure rates of the respective plurality of first components, and may determine the determined plurality of components as a plurality of second components having mounting failures.
For example, in the case where the mounting failure rate of the a-component is 1%, the mounting failure rate of the B-component is 4%, and the first critical value set in advance is 2%, the processor 320 may determine the a-component as the absence of the mounting failure and the B-component as the presence of the mounting failure.
The processor 320 determines a plurality of second parts, among the plurality of first parts, where mounting failure occurs, and thus may simplify a mounting failure cause determination process to be described below. However, step 330 may not be performed depending on the setting of the user.
In step 440, the processor 320 may determine a cause of mounting failure of each of the plurality of second components for which mounting failure occurs, based on the mounting failure rate of each of the plurality of first components. For example, the processor 320 may determine from the cause of mounting failure of each of the plurality of second components that at least one of a mounting position setting error of the component, a mounting condition setting error according to a type of the component, and a nozzle defect included in the mounter is determined. However, this is for illustrative purposes only, and not limited to this, and a feeder defect included in the mounter, a spindle defect included in the mounter, and a reel defect included in the mounter may be set as causes of mounting failure. In this case, the processor 320 may determine the cause of the mounting failure of each of the plurality of second parts from at least one of a mounting position setting error of the part, a mounting condition setting error according to the type of the part, a nozzle defect, a spindle defect, a feeder defect, and a reel defect. A specific method of determining the cause of mounting failure for each of the plurality of second components will be described later.
Fig. 5 illustrates pads, solder paste, and components on a substrate according to various embodiments of the invention. As described above, the substrate 510 may include more than one pad 540. In one embodiment, the pads 540 may be formed with a pair. The position of the pad 540 is a position that becomes a center point 542 of the centers of two pads when a pair of pads is formed. The centers of the two pads are points of line segment centers connecting the centers of the two pads constituting a pair. For example, the location of the pad 540 means that the center of the pad may be embodied in the case where the pad is formed of one pad rather than a pair of pads, such as a bga (ball Grid array). For example, when the substrate 510 is viewed in the XY coordinate plane, the center point 542 serves as an origin (0,0) and serves as a reference point indicating the positions of the solder paste and the component.
In an embodiment, solder paste 550 may be printed on the pads 540. The position of the solder paste 550 refers to a point that becomes the center 552 of the two solder pastes 550; for example, the position may be a point which becomes the center of mass of two solder pastes.
In addition, the XY coordinates may be added with Z coordinates, and based on this, the position of a point which becomes the center of at least one solder paste, or a point which becomes the center of mass (center of mass) may be used. That is, a three-dimensional vector may be implied. Then, rotation information indicating a rotation angle (angle offset) of the solder paste to the pad may be further included.
In one embodiment, the component 560 may be attached to the substrate 520 where the solder paste 550 is printed. For example, the position of the component 560 refers to the position of a point that becomes the center 562 of the component. The first
The substrate 520 of the mounting part 560 may be subjected to a reflow process. While undergoing the reflow process, melting solder paste 550 may change the positions of solder paste 550 and components 560. The second
Fig. 6 shows a table of components, types of components, and mounting failure rates of respective nozzles according to various embodiments of the present invention. According to various embodiments disclosed herein, the processor 320 may calculate a mounting failure rate of each of the plurality of first components. Hereinafter, for convenience of explanation, it is assumed that the reference critical value is 2% for determining that a plurality of second components having mounting failure occur among the plurality of first components. Accordingly, as shown in fig. 6, the C0-C13, C17 and C18 components, whose mounting failure rates are greater than the first critical value, may be determined as a plurality of second components, whose mounting failures occur. In addition, the C14-C16 components and the C19-C21 components having the mounting failure rates less than the first critical value are determined as having no mounting failure.
In an embodiment, the processor 320 may calculate a mounting failure rate by type of the component and a mounting failure rate of the nozzle based on the calculated mounting failure rate of each of the plurality of first components. The processor 320 may determine a cause of mounting failure for each of the plurality of second components for which mounting failure occurs, based on the calculated mounting failure rates by the types of the components and the mounting failure rates of the nozzles. A specific method of determining the cause of mounting failure of the plurality of second components will be described in more detail with reference to fig. 7 to 9.
Fig. 7 is a flowchart illustrating a method of determining a cause of component mounting failure as an error in setting a mounting position of a component according to various embodiments of the present invention.
In
In
In
For example, mounting failure rates of the C0 through C2 components included in the
For example, using a method such as distance-based clustering, Grubb's test, MIQCP (Mixed Integer quadratic constraint Programming), or the like, whether or not there is at least one part having a mounting failure rate determined as an outlier can be confirmed through a result of comparison between mounting failure rates of a plurality of third parts respectively included in the plurality of
In
In an embodiment, the plurality of fourth parts may be parts determined to have a mounting failure rate determined to be an outlier based on the
For example, in the
As described above, the difference between the mounting failure rate of C15 components and the mounting failure rate of C13 components, which is the reference for determining the outlier in the
On the other hand, the processor 320 may confirm that there is no part having a mounting failure rate determined as an outlier in the plurality of
The processor 320 may determine that the mounting failure reason of the component having the mounting failure rate determined as the outlier is a mounting position setting error of the component as determined as being due to the mounting position setting error of the component occurring compared to the mounting failure of the other components having the mounting failure rate determined as the outlier among the components of the same type.
Fig. 8 is a flowchart illustrating a method of determining a cause of component mounting failure as an error set according to mounting conditions of the type of component according to various embodiments of the present disclosure.
In
Since the mounting failures of the fourth components are most affected by the mounting position setting error of the components, if the mounting failures of the fourth components are also considered to calculate the mounting failures of the first types, the mounting failures of the first types cannot be accurately calculated. Accordingly, the processor 320 may calculate the mounting failure rate of each of the plurality of first component types based on the mounting failure rate of each of the plurality of fifth components except the plurality of fourth components.
In one embodiment, referring to fig. 6, the processor 320 may calculate a mounting failure rate of the P0 component type based on the mounting failure rates of the C0 components to the C2 components. For example, the processor 320 may calculate the mounting failure rate of the P0 component type to be 55%, i.e., the average of the mounting failure rates of C0 to C2 components. Likewise, the processor 320 may calculate a mounting failure rate of the P2 component type based on the mounting failure rates of the C7 components and the C8 components. For example, the processor 320 may calculate the mounting failure rate of the P2 component type to be 31%, i.e., the average of the mounting failure rates of the C7 components and the C8 components. The processor 320 may also calculate the mounting failure rate of each of the P3 component type, the P5 component type, the P6 component type, and the P7 component type in the same manner.
On the other hand, the processor 320 may calculate the mounting failure rate of the P1 component type based on the mounting failure rates of the C3 to C5 components, and as described above, in order to accurately calculate the mounting failure rate of the P1 component type, the processor 320 determines the cause of mounting failure as the mounting failure rate of the C6 component for which the mounting position of the component is set incorrectly, which may not be used for the calculation of the mounting failure rate of the P1 component type. The processor 320 may calculate that the mounting failure rate of the P1 component type is 29%, which is an average of the mounting failure rates of the C3 components, the C4 components, and the C5 components. Similarly, the processor 320 may calculate the mounting failure rate of the P4 component type to be 1% by using the mounting failure rates of the C14 components and the C15 components, in addition to the mounting failure rate of the C13 components.
In
In
For example, the mounting failure rates of each of the P0 component types through P2 component types included in the first
For example, it is possible to confirm whether there is at least one component type having a mounting failure rate determined as an outlier by comparing mounting failure rates of a plurality of second component types respectively included in a plurality of first
In
In an embodiment, the plurality of third component types may be component types determined to have mounting failure rates determined to be outliers based on the comparison result of
For example, in the first
In addition, if the processor 320 determines that the difference between the mounting failure rate of the P7 component type and the mounting failure rate of the P6 component type, which are the criteria for determining the outlier in the first
The processor 320 may determine the cause of the mounting failure of the C0-C2 components classified as the P0 component type as an error set according to the mounting conditions of the component type. In addition, the processor 320 may determine the cause of the mounting failure of the C9-C12 components classified into the P3 component type and the C17 and C18 components classified into the P6 component type as an error set according to the mounting conditions of the component types.
In addition, although not shown, the processor 320 may also determine that there is no mounting failure rate determined as an outlier in the specific component type group based on the comparison result of the
The processor 320 discriminates mounting failures of components having a mounting failure rate of a component type determined as an outlier compared to other component types among components mounted through the same nozzle, and may determine that the mounting failure occurred due to an error set according to mounting conditions of the component type. Accordingly, the processor 320 may determine the mounting failure reason distinguished as the component type component having the mounting failure rate determined as the outlier as the error set according to the type mounting condition of the component.
Fig. 9 is a flowchart illustrating a method of determining a cause of component mounting failure as a nozzle defect according to various embodiments of the present invention.
In
Since the mounting failures of the sixth components are most affected by the error set in the mounting conditions for each component type, if the mounting failures of the first types are calculated in consideration of the mounting failures of the third component types, which are the component types of the sixth components, the mounting failures of the first nozzles cannot be accurately calculated. Accordingly, the processor 320 may calculate the mounting failure rate of each of the plurality of first nozzles based on the mounting failure rate of each of the plurality of fourth component types except for the plurality of third component types.
For example, referring to fig. 6, the processor 320 may calculate a mounting failure rate of the N0 nozzle based on the mounting failure rates of the P1 component type and the P2 component type. As described above, in order to accurately calculate the mounting failure rate of the N0 nozzle, the processor 320 may not use the mounting failure rate of the P0 component type in the calculation of the mounting failure rate of the N0 nozzle, the P0 component type being a component type in which the cause of mounting failure is determined as C0 components, C1 components, and C2 components that are erroneously set according to the type mounting conditions of the components. The processor 320 may calculate the mounting failure rate of the N0 nozzle to be 30%, which is an average of the mounting failure rates of the P1 component type and the P2 component type.
In addition, the processor 320 may calculate a mounting failure rate of the N1 nozzle based on the mounting failure rates of the P4 component type and the P5 component type. The processor 320 may not use the mounting fraction defective of the P3 component type in the calculation of the mounting fraction defective of the N1 nozzle in order to accurately calculate the mounting fraction defective of the N1 nozzle. The processor 320 may calculate the mounting failure rate of the N1 nozzle to be 1%, which is an average of the mounting failure rates of the P4 component type and the P5 component type.
In addition, the processor 320 may calculate a mounting failure rate of the N2 nozzle based on the mounting failure rate of the P8 part type. The processor 320 may not use the mounting fraction defective of the P6 component type in the calculation of the mounting fraction defective of the N2 nozzle in order to accurately calculate the mounting fraction defective of the N2 nozzle. The processor 320 may calculate the mounting failure rate of the N2 nozzle to be 0.33%, which is an average of the mounting failure rates of the P7 part types.
In
For example, it may be confirmed whether there is at least one second nozzle having a mounting failure rate determined as an outlier by comparing mounting failure rates of a plurality of first nozzles with each other using a method such as clustering of distances, Grubb's inspection, MIQCP, or the like.
In
In an embodiment, the at least one second nozzle may be a nozzle having a mounting failure rate determined as an outlier based on the comparison result of the
For example, in view of the difference between the mounting failure rate of the N2 nozzle and the N1 mounting failure rate, it can be determined that the difference between the mounting failure rate of the N2 nozzle and the N0 mounting failure rate, which are criteria for determining an outlier, has an abnormal value. Accordingly, the processor 320 determines the mounting failure rate of the N0 nozzle as an outlier, and may determine the N0 nozzle as a nozzle having the mounting failure rate determined as the outlier. In addition, the processor 320 may determine the cause of the mounting failure of the C0 to C8 components mounted using the N0 nozzle using the nozzle defect.
The processor 320 may determine that the nozzle defect is generated due to a mounting failure of a component mounted through a nozzle having a mounting failure rate determined as an outlier compared to other nozzles, among the components mounted through the plurality of nozzles mounted on the same spindle in the mounting process of the component. Accordingly, the processor 320 may determine a mounting failure cause of a component mounted through a nozzle having a mounting failure rate determined as an outlier as a nozzle defect.
In one embodiment, the cause of component mounting failure may be generated due to various causes of mounting failure, and thus the cause of component mounting failure may be determined by two or more causes, not one. For example, it may be determined that the causes of the mounting failures of the C0-C2 components are the mounting condition setting errors and the nozzle defect errors according to the types of the components, and that the causes of the mounting failures of the C6 components are the mounting position setting errors and the nozzle defect errors of the components.
On the other hand, in fig. 7 to 9, for convenience of explanation, at least one of an error in determining a mounting position of a component, an error in setting mounting conditions according to a type of a component, and a nozzle defect is mainly described, but the present invention is not limited thereto. For example, in order to determine the cause of the mounting failure of the plurality of second components, the processor 320 may further use the mounting failure rates according to the respective mounting failure rates of the plurality of feeders included in the mounter, the respective mounting failure rates of the plurality of spindles, and the respective mounting failure rates of the plurality of reels. In this case, the processor 320 may determine the cause of the mounting failure of the plurality of second parts from at least one of a mounting position setting error, a mounting condition setting error according to the type of the part, a defect of the feeder, a defect of the nozzle, a defect of the spindle, and a defect of the reel.
For example, the mounting failure rates for the plurality of feeders may be the same as described above, and the manner of calculating the mounting failure rate for each of the plurality of nozzles based on the mounting failure rate for each of the types of the plurality of parts may be the same. In this case, the mounting failure rates of the plurality of nozzles are calculated in the same manner as the above calculation method using the mounting failure rates of the plurality of feeders, and the above calculation method is a method of calculating the mounting failure rates of the plurality of nozzles using the mounting failure rates of the plurality of component types. In addition, the mounting failure rates of the plurality of spindles may be calculated based on the mounting failure rates of the respective plurality of nozzles in the same manner as the above calculation method, which calculates the mounting failure rates of the respective plurality of nozzles using the mounting failure rates of the respective plurality of component types. Further, the method of determining that the cause of mounting failure of at least one of the plurality of second components is feeder defect, and the method of determining that the cause of mounting failure of at least one component is spindle defect, and the method of determining that the cause of mounting failure is reel defect, based on the calculated mounting failure rates of each of the plurality of feeders, are the same as the above-described method of determining the cause of failure, and therefore, a separate description is omitted.
Fig. 10 is a flowchart illustrating a method of calculating a degree of contribution to occurrence of mounting failure according to various embodiments of the present invention.
In
In
For example, the processor 320 may adjust the mounting failure rate of the remaining plurality of component types other than the plurality of second component types selected in
In addition, the processor 320 may reduce the mounting failure rate of the P0 part type calculated in
In
For example, the processor 320 may adjust the mounting failure rate of at least one component determined as not having the mounting failure among the first component types and the remaining components except the fourth components selected in the
In addition, the processor 320 may reduce the mounting failure rate of the C6 parts calculated in the step 420 to 45% from the mounting failure rate of the N0 nozzle to 15% of 30%, and adjust the mounting failure rate of the C6 parts type. The processor 320 determines that the mounting failure rate of the C6 parts calculated in the step 420 includes the mounting failure rate of the N0 nozzle, and may adjust the mounting failure rate of the C6 parts. In addition, unlike fig. 9, in the case where the mounting failure rate of the P4 type is not 0%, it is determined that the mounting failure rate of the P4 type is also included in the mounting failure rate of the C6 component type, and therefore the processor 320 also reduces the mounting failure rate of the P4 type at the mounting failure rate of the C6 component type, so that the mounting failure rate of the C6 component type can be adjusted. On the other hand, since the mounting failure rate of each of the P4 component type and the N1 nozzle is 0%, the mounting failure rate of the C13 component may not be adjusted.
In
For example, the processor 320 may judge that the degree to which the mounting condition setting error of the P0 component type contributes to the occurrence of mounting failure of C0 to C2 components is 45%, and may judge that the degree to which the N0 nozzle defect contributes to the occurrence of mounting failure is 55%. In addition, the processor 320 determines that the degree of contribution of the N0 nozzle defect to the occurrence of mounting failures of C3 to C5, C7, and C8 components is 100%, determines that the degree of contribution of the mounting position setting error of C6 components to the occurrence of mounting failures of C6 components is 33%, and may determine that the degree of contribution of the N0 nozzle defect to the occurrence of mounting failures is 67%.
As described above, the degree to which the mounting condition setting error of the judgment P3 component type contributes to the occurrence of mounting failures of C9 to C12 components is 100%, the degree to which the mounting position setting error of the judgment C13 component contributes to the occurrence of mounting failures of C13 components is 100%, and the degree to which the mounting condition setting error of the judgment P6 component type contributes to the occurrence of mounting failures of C17 components and C18 components is 100%.
As described above, the processor 320 may adjust the mounting failure rate calculated in the mounting failure cause determining process, and may further calculate the degree of contribution of the mounting position setting error of the component, the mounting condition setting error according to the type of the component, and the defect of the nozzle included in the mounter to the respective mounting failures of the plurality of second components in which the mounting failures occur.
In addition, the processor 320 may display the mounting failure rate as shown in fig. 11, which is obtained by adjusting the mounting failure rate as shown in fig. 6 calculated in the mounting failure cause determining process or the mounting failure rate calculated in the mounting failure cause determining process, through the display 340. For example, the processor 320 may set, among the C0 parts through the C21 parts, a height value of a component indicating a mounting failure rate of the C6 part and the C13 part having the mounting failure rate determined as an outlier to be greater than a height value of a component indicating a mounting failure rate of the other parts. The height values of the components representing the mounting failure rates of the C6 and C13 components may be determined based on the values of the mounting failure rates of the C6 components and the C13 components. Further, the color of the component indicating the mounting failure rate of the C6 component and the C13 component may be displayed separately from the component indicating the mounting failure rate of the other component. However, this is for illustrative purposes only, but is not limited thereto, and elements indicating the mounting failure rates of the C6 component and the C13 component and elements indicating the mounting failure rates of other components may be displayed separately in various ways.
As described above, the processor 320 may display, on the display 340, the components representing the mounting failure rates of the P0 component type, the P3 component type, and the P6 component type having the mounting failure rate determined as the outlier, separately from the components representing the mounting failure rates of the other component types, among the P0 component types to the P7 component types. Further, the processor 320 also displays, on the display 340, the components indicating the mounting failure rates of the N1 nozzles having the mounting failure rate determined as the outlier among the N0 to N2 nozzles, separately from the components indicating the mounting failure rates of the other nozzles. Accordingly, the user can intuitively and easily identify the cause of the mounting failure of each of the plurality of second components having the mounting failure.
Fig. 12 is a flowchart illustrating a mounting failure cause determination method for each of a plurality of components mounted on a substrate according to various embodiments of the present invention.
In 1210, the processor 320 of the
In one embodiment, the plurality of first components may be respectively attached to different locations on the first type of substrate. That is, positions at which the plurality of first components are mounted on the first type substrate, respectively, may be different from each other. For example, the A component is attached at the A position on the first type substrate, and the B component may be attached at the B position on the first type substrate. Here, the types of the a member and the B member may be the same or different.
In addition, the same type of substrate may indicate substrates manufactured according to the same design information. That is, the same type of substrates are manufactured according to the same design information, and thus, specific parts can be attached to specific positions of the same type of substrates. For example, a component a may be mounted at the a position of each of the first type substrates a and B according to the design information of the first type substrate.
In one embodiment, the first error value for each of the plurality of first components may be generated based on a measured value measured for inspection of the substrate performed by the first
In one embodiment, the first error value for each of the plurality of first components may include: at least one of an error value of a mounting position of each of the plurality of first components and an error value of a flatness of each of the plurality of first components. For example, the mounting positions of each of the plurality of first components measured by the inspection are compared with the reference positions of each of the plurality of first components confirmed by the design information of the first type substrate, from which an error value for the mounting positions of each of the plurality of first components can be calculated. In addition, the flatness of each of the plurality of first components measured by the inspection is compared with the reference flatness of each of the plurality of first components confirmed by the design information of the first type substrate, whereby an error value can be calculated for the mounting position of each of the plurality of first components. In this manner, the first error value of each of the plurality of first components may be generated by comparing the measured value measured by the inspection and the reference value confirmed by the substrate design information.
In addition, the first error value for each of the plurality of first components may be generated using a plurality of measured values for each of the plurality of first components measured during the inspection of the plurality of first type substrates. For example, in the plurality of first components, the first error value of the a component may be generated based on one of an average value, a median value, a mode value, a minimum value, a maximum value, a standard deviation, and the like of the plurality of first error values, which are generated by comparing a plurality of measurement values and reference values of the a component measured in the inspection of the plurality of first type substrates, respectively. However, this is for illustrative purposes only and is not limited thereto.
In addition, the measurement information indicating whether the plurality of first components are respectively mounted on the first-type substrate may also be used to determine the cause of mounting failure for each of the plurality of first components. However, in this case, the mounting failure rate of each of the plurality of first components calculated based on the measurement information indicating whether or not each of the plurality of first components is mounted on the first type substrate may be used instead of the first error value of each of the plurality of first components to determine the cause of the mounting failure of each of the plurality of first components. In the following, for convenience of explanation, description will be given centering on a method of determining causes of mounting failures of the respective plurality of first components using first error values of the respective plurality of first components, but is not limited thereto, and the causes of mounting failures of the respective plurality of first components can be determined in the same manner even using mounting failure rates of the respective plurality of first components.
In
Further, according to the setting by the user, feeder defect, spindle defect, and reel defect included in the mounter may be set as a plurality of causes of mounting failure. In this case, the processor 320 may decompose the first error value into second to fourth error values, a fifth error value generated due to a defect of the feeder, a sixth error value generated due to a defect of the spindle, and a seventh error value generated due to a defect of the reel. For convenience of explanation, the first error value is divided into the second to fourth error values, but the first error value is not limited to this, and may be divided into a plurality of error values corresponding to the number of the plurality of failure causes. The specific direction for decomposing the plurality of first error values will be described later.
In
For example, the first range may be set differently from the range of error values serving as a reference for determining whether or not the component is not mounted properly, or the second error value, the third error value, and the fourth error value may be set similarly.
For example, assuming that the first error value of the a component is 1um among the plurality of first components, the first error value is decomposed into a second error value of 1um, a third error value of-30 um, and a fourth error value of 30um, and in the case where the set first range is-3 um to 3um, the third error value and the fourth error value of the a component exceed the first range, the processor 320 may determine that the a component is not properly mounted even if the first error value, which is a combination of the second error value to the fourth error value, is within the first range. On the contrary, assuming that the first error value of the B component is 1um among the plurality of first components, the first error value is decomposed into a second error value of 1um, a second error value of 2um, and a third error value of-2 um, and the first range is set to be in a case of-3 um to 3um, and the second error value, the third error value, and the fourth error value of the B component all exist in the first range, it is determined that the B component is not defective in mounting.
The processor 320 determines a plurality of second parts, which are not mounted properly, among the plurality of first parts, and thus can simplify a process of determining a cause of mounting failure, which will be described below. However, the setting of the user may not be performed in the 1230 step.
In
Fig. 13a and 13b show tables of first to fourth error values for each of a plurality of first components according to various embodiments of the present invention. As shown in fig. 13a, according to various embodiments disclosed herein, the processor 320 of the
For convenience of explanation, the first error value will be described mainly as an error value of mounting positions of the plurality of first components, but the present invention is not limited to this, and the same application as that described below can be applied to a case where the first error value is an error value of flatness of the plurality of first components or a mounting failure rate is used instead of the first error value.
Fig. 14 is a flowchart illustrating a second error value calculation method for each of a plurality of first components according to various embodiments of the present invention.
At
In
For example, the first error values of the C0 parts through C2 parts included in the first part group 1311, the first error values of the C3 parts through C6 parts included in the first part group 1312, the first error values of the C7 parts and C8 parts included in the first part group 1313, the first error values of the C9 parts through C12 parts included in the first part group 1314, the first error values of the C13 parts through C15 parts included in the first part group 1315, the first error values of the C17 parts and C18 parts included in the first part group 1317, and the first error values of the C19 parts through C21 parts included in the first part group 1318 are compared with each other. Only one C16 component is included in the first component group 1316, so that a process of comparing first error values with each other can be generated.
For example, using a method such as distance-based clustering, Grubb's testing, MIQCP (Mixed Integer quadratic constraint Programming), or the like, whether or not there is at least one component having a mounting failure rate determined as an outlier can be confirmed by a mutual comparison result between first error values of a plurality of third components included in each of the plurality of first component groups 1311, 1312, 1313, 1314, 1315, 1316, 1317, 1318.
In
For example, in the first component group 1312, with respect to the first error value of the C6 component and the first error value difference of each of the C3 through C5 components, it may be determined to have an abnormal value in view of the difference from the first error value of each of the C3 through C5 components. Accordingly, the processor 320 determines that the first error value of the C6 component is an outlier, and the C6 component may be determined as the component in the first set of components 1312 having the first error value determined to be an outlier. Likewise, the processor 320 may determine the C13 component as the component in the first set 1315 having the first error value determined to be an outlier.
On the other hand, the processor 320 may confirm that there is no component having the first error value determined as an outlier among the plurality of first component sets 1311, 1313, 1314, 1317, 1318 based on the comparison result of
At 1440, processor 320 may calculate an average error value for each of first set of components 1311, 1312, 1313, 1314, 1315, 1316, 1317, 1318 based on first error values for a plurality of fifth components in the plurality of second components other than the plurality of fourth components selected at 1430. For example, the processor 320 may calculate an average error value based on the first error values of the C3 component through the C5 component, in addition to the C6 component, for the first group of components 1312 identified as having first error values determined to be outliers. Referring to FIG. 13a, the average error value of the first error values of the C3 through C5 components is 29um, which may be calculated as the average error value of the first group of components 1312. Likewise, for the first component set 1315, the average error value of the first error values of the C14 component and the C15 component other than the C13 component is 1um, which may be calculated as the average error value of the first component set 1315.
On the other hand, the processor 320 may calculate an average error value of components included in each of the plurality of first component groups 1311, 1313, 1314, 1316, 1317, 1318 as an average error value of each of the plurality of first component groups 1311, 1313, 1314, 1316, 1317, 1318 for a plurality of first component groups 1311, 1313, 1314, 1316, 1317, 1318, which are confirmed as not having a component having a first error value determined as an outlier.
In
In one embodiment, the second error value for each of the plurality of first components may be calculated based on a difference between the error value for each of the plurality of first components and an average error value for one of a plurality of first groups included in each of the plurality of first components. For example, the processor 320 may calculate the second error value for the CO component as a difference of 0um between the first error value of 55um for the C0 component and the average error value of 55um for the first component set 1311 including the C0 component. Additionally, the processor 320 may calculate a second error value for the C6 component having a first error value determined to be an outlier from the difference 16um between the first error value for the C6 component of 45um and the average error value for the first set of components 1312 including the C6 component of 29 um. Likewise, a second error value may also be calculated for the remaining components. The second error value thus calculated can be utilized in a process of determining a plurality of second components, among the plurality of first components, for which mounting failures have occurred and a process of determining a cause of mounting failure for each of the plurality of second components.
Fig. 15 is a flowchart illustrating a third error value calculation method for each of a plurality of first components according to various embodiments of the present invention.
At
For example, referring to fig. 13b, the average error value of the first component set 1311 corresponding to the P0 component type is 55um, thereby calculating an error value of the P0 component type; the average error value for the first group 1312 of components having P1 component type error values corresponding to the P1 component type is 29um, from which an error value for the P1 component type is calculated; the average error value of the first component set 1313 corresponding to the P2 component type is 31um, from which an error value of the P2 component type can be calculated. Likewise, error values for the P3 component type through the P7 component type may also be calculated separately.
At
At 1530, processor 320 may compare error values of a plurality of second component types included in each of the plurality of first component type groups 1321, 1322, 1323 with each other based on the error values of each of the plurality of first component types. For example, the processor 320 may compare mounting failure rates of a plurality of second component types included in each of the plurality of first component type groups 1321, 1322, 1323 with each other for determining whether there is at least one component type having an error value determined as an outlier among a plurality of second component types included in each of the plurality of first component type groups 1321, 1322, 1323.
For example, the error values of the P0 component types through the P2 component types included in the first component type group 1321 may be compared with each other, the error values of the P3 component types through the P5 component types included in the second component type group 1322 may be compared with each other, and the error values of the P6 component types and the P7 component types included in the second component type group 1323 may be compared with each other.
For example, using a method such as distance-based clustering, Grubb's inspection, MIQC, or the like, whether or not there is at least one component type having an outlier determined may be confirmed through the result of mutual comparison between mounting failure rates of a plurality of second component types included in each of the plurality of first component type groups 1321, 1322, 1323.
In 1540, processor 320 may select a third plurality of component types based on the comparison of 1530 among the first plurality of component types. For example, the third plurality of component types may be one of the first plurality of component type groups 1321, 1322, 1323 determined as the component type having the error value determined as the outlier based on the comparison result of the 1530 step.
For example, in the first component type group 1321, with respect to the difference between the error value of the P0 component type and the error values of each of the P1 component type and the P2 component type, it may be determined to have an abnormal value in view of the difference between the error values of each of the P1 component type and the P2 component type. Accordingly, the processor 320 determines the error value for the P0 component type to be an outlier, and may determine the P0 component type as the component type in the first component type group 1321 having the error value determined to be the outlier. Likewise, the processor 320 may determine the P3 component type as the component type in the first component type group 1323 having the error value determined to be an outlier and the P6 component type as the component type in the first component type group 1322 having the error value determined to be an outlier. The specific method of determining whether the error value is an outlier when comparing the error value of a specific component type with the error values of other component types to which the component type group belongs may use the above-described methods of distance-based clustering, Grubb's test, MIQC, etc.
At
In
In an embodiment, the third error value for each of the plurality of first components may be calculated based on a difference between the error value for each of the plurality of first components and an average error value for one of a plurality of first component type groups 1321, 1322, 1323 including each of the plurality of first component types. For example, the processor 320 calculates a third error value for each of the C0 component to the C2 component from a difference 25um between an error value of 55um for the P0 component type to which the C0 component to the C2 component belong and an average error value of 30um for the first component type group 1321 including the P0 component type. In addition, the processor 320 calculates a third error value of each of the C3 to C6 components from a difference-1 um between the error value of the P1 component type to which the C3 to C6 components belong being 29um and the average error value of the first component type group 1321 being 30 um. Likewise, a third error value may also be calculated for the remaining components. The third error value thus calculated may use a process of determining a plurality of second components, among the plurality of first components, for which mounting failures have occurred and a process of determining a cause of mounting failure for each of the plurality of second components.
FIG. 16 is a flow chart of a fourth error value calculation method for each of a plurality of first components in various embodiments of the invention.
At
For example, referring to FIG. 13b, the average error value for the first component type group 1321 corresponding to the N0 nozzle is 30um, thereby calculating an error value for the N0 nozzle; the average error value for the first component type group 1322 corresponding to the N1 nozzle was 1um, thereby calculating an error value for the N1 nozzle; the average error value for the first component type group 1323 corresponding to the N2 nozzle was 0.33um, from which an error value for the N2 nozzle was calculated.
In 1620, the processor 320 may calculate a four-error value for each of the plurality of first components due to the defect of the nozzle based on the error value for each of the plurality of first nozzles calculated in 1610. For example, a nozzle defect is a mechanical defect of the nozzle itself, because the defective nozzle cannot operate according to the set control parameters.
In an embodiment, the fourth error value for each of the plurality of first components may be calculated based on the error value for each of the plurality of first nozzles. For example, the error value of the N0 nozzle is 30um, and thus the processor 320 may calculate a fourth error value for each of the C0 to C8 components mounted through the N0 nozzle. In addition, the error value of the N1 nozzle is 1um, so that the processor 320 may calculate a fourth error value for each of the C9 to C16 components mounted through the N1 nozzle; the error value of the N2 nozzle is 0.33um, and thus the processor 320 may calculate a fourth error value for each of the C17 components through the C21 components mounted through the N2 nozzle. The fourth error value thus calculated may be utilized in a process of determining a plurality of second components, among the plurality of first components, for which mounting failures have occurred and a process of determining a cause of mounting failure for each of the plurality of second components.
In
Fig. 17 is a flowchart illustrating a mounting failure cause determination method for each of a plurality of second components in which mounting failure occurs according to various embodiments of the present invention.
In 1710, the processor 320 of the
In 1720, the processor 320 determines a cause of mounting failure for each of the plurality of second components as at least one of a mounting position setting error of the component, a mounting condition setting error by type of the component, and a defect of the nozzle based on the determination result of 1710. For example, the processor 320 may determine that, among the second, third and fourth error values of the C0 through C2 units, the error value within the second range is the second error value, and the third and fourth error values are out of the second range. Accordingly, the processor 320 may determine the cause of the mounting failure of each of the C0 parts through the C2 parts as a mounting condition error and a nozzle defect according to the type of the part.
In addition, the processor 320 determines that, of the second error value, the third error value, and the fourth error value of each of the C3 components through the C5 components, only the fourth error value exceeds the second range, and may determine the cause of the mounting failure of each of the C3 components through the C5 components as the defect of the nozzle. On the other hand, the processor 320 determines that the second error value and the fourth error value are out of the second range for the C6 component, and may determine the cause of the mounting failure of the C6 component as the mounting position setting error of the component and the defect of the nozzle.
On the other hand, for convenience of explanation, in fig. 14 to 17, description has been made centering on determination of the cause of mounting failure of a plurality of second components having mounting failure as at least one of mounting position setting error of a component, mounting condition setting error according to the type of a component, and nozzle defect, but the present invention is not limited thereto. For example, in order to determine the cause of the defective mounting of the second components, the processor 320 may further use an error value of each of the feeders, an error value of each of the spindles, and an error value of each of the reels included in the mounter. In this case, the processor 320 may determine the cause of the mounting failure of the plurality of second parts using at least one of a mounting position setting error, a mounting condition setting error according to the type of the part, a defect of the feeder, a defect of the nozzle, a defect of the spindle, and a defect of the reel.
For example, the feeder error values are calculated based on the error values of the respective types of the plurality of components in the same manner as the above-described manner of calculating the error values of the respective nozzles. In this case, the error value of each of the plurality of nozzles is calculated by using the error value of each of the plurality of feeders in the same manner as the calculation manner described above in which the error value of each of the plurality of nozzles is calculated by using the error value of each of the plurality of component types. The plurality of spindle error values are calculated based on the error values of the plurality of nozzles in the same manner as described above in which the error values of the plurality of nozzles are calculated using the error values of the plurality of component types. The method comprises the steps of decomposing a first error value of each of a plurality of first components into a second error value to a seventh error value by calculating error values of a plurality of feeders, error values of a plurality of spindles and error values of a plurality of reels, determining a plurality of second components which are not qualified in mounting by using the decomposed second error values to seventh error values, and determining the reason why the plurality of second components are not qualified in mounting. The method of defecting the plurality of second components and determining the cause of mounting failure of each of the plurality of second components is the same as described above, and thus a separate explanation is omitted.
Fig. 18 is a diagram illustrating a method of controlling a mounter according to a cause of mounting failure according to various embodiments of the present invention.
According to various embodiments disclosed in the present invention, the processor 320 of the
Further, when the processor 320 determines that the component (for example, a nozzle, a spindle, a feeder, a reel, or the like) of the
In an embodiment, the processor 320 may determine, among the second components where the mounting failure occurs, a fourth component whose mounting position is set incorrectly for which the mounting failure reason is determined. The processor 320 may confirm the deviation of each of the plurality of fourth components by the inspection results of the plurality of first type substrates received from the first
In an embodiment, the processor 320 may determine that the cause of mounting failure is determined as a sixth component that is set to be wrong in accordance with the component-type setting condition, among the second components for which mounting failure occurs. The processor 320 may confirm the offset, flatness, etc. of each of the plurality of sixth members by the inspection results of the plurality of first type substrates received from the first
In an embodiment, the processor 320 may determine, among the plurality of second components on which the mounting failure occurs, a plurality of seventh components whose mounting failure cause is determined to be a defect of the nozzle. The processor 320 confirms nozzles used for mounting the plurality of seventh components, outputs information of the nozzles whose confirmation is required to be replaced through the display 340, or transmits the information to the
Further, if there are a plurality of components determined as feeder defects, spindle defects, or reel defects among the plurality of second components having mounting failures, the processor 320 confirms the feeder, spindle, or reel used for mounting the plurality of components, and outputs information on the feeder, spindle, or reel that needs to be replaced through the display 340, or transmits the information to the
Fig. 19a to 19c illustrate graphs representing mounting failure rates according to various embodiments of the present invention.
According to various embodiments disclosed in the present invention, the processor 320 of the
The processor 320 may calculate mounting failure rates of the respective first components, mounting failure rates of the respective first component types, and mounting failure rates of the respective first nozzles, using the calculated mounting failure rates of the respective first components. The processor 320 determines the cause of mounting failure using the calculated result, and then may adjust the mounting failure rate of each of the plurality of first components, the mounting failure rate of each of the plurality of first component types, and the mounting failure rate of each of the plurality of first nozzles. As shown in fig. 19b, the processor 320 may graphically illustrate the adjusted mounting failure rate of each of the plurality of first components, the adjusted mounting failure rate of each of the plurality of first component types, and the adjusted mounting failure rate of each of the plurality of first nozzles.
In addition, as shown in fig. 19c, the processor 320 adjusts and displays the sizes of the included nodes in various graphic shapes (for example, bubble shapes) according to the adjusted mounting failure rates of the respective first components, the adjusted mounting failure rates of the respective first component types, and the adjusted mounting failure rates of the respective first nozzles, so that a user can more clearly identify the cause of mounting failure. For example, the processor 320 may adjust the mounting failure rate to the C6 component node of 15%, the P0 component type node of 25%, and the N0 nozzle node of 30%, and may display other nodes of which the mounting failure rate is adjusted to 0% more largely. In addition, the processor 320 may display sizes different from each other according to mounting failure rates respectively adjusted by the C6 component node, the P0 component type node, and the N0 nozzle node. In addition, the processor 320 may generate a graph or table showing a mounting failure rate ranking in which mounting failure rates of each mounter component, part, and type of part are arranged according to the magnitude of the mounting failure rate.
In addition, although it has been described above that the sizes of the nodes are expressed differently according to the adjusted mounting failure rates, this is only for the purpose of explanation, and is not limited thereto. In order to allow a user to more clearly identify the cause of the mounting failure, various means, such as changing the color, pattern, and the like of the node, may be used.
Fig. 20 a-20 c show graphs of error values according to various embodiments of the present disclosure.
According to various embodiments disclosed herein, the processor 320 of the
The processor 320 may decompose the calculated first error value of each of the plurality of first components into a second error value generated due to a mounting position setting error of the component, a third error value generated due to a mounting condition setting error according to the type of the component, and a fourth error value generated due to a defect of the nozzle. The processor 320 determines the reason for the mounting failure by using the decomposition result, and then may graphically show a second error value, a third error value, and a fourth error value as shown in fig. 20 b.
In addition, as shown in fig. 20c, the processor 320 may adjust and show the size of the node included in the graph of the tree structure according to the second error value, the third error value and the fourth error value, so that the user can more clearly identify the reason for the non-mounting defect. For example, the processor 320 calculates absolute values of the second error value, the third error value, and the fourth error value, and the size of each node may be adjusted such that the absolute value becomes a radius. Accordingly, the user can more clearly recognize the cause of the mounting failure. In addition. The above description shows the size of the node according to the size of the absolute value of the error value, but this is for illustrative purposes only and is not limited thereto. In order to make the user more clearly recognize the cause of the mounting failure, various ways such as changing the color, pattern, and the like of the node may be used.
FIG. 21 illustrates a screen in which content is analyzed for error values according to various embodiments of the invention.
According to various embodiments disclosed herein, the processor 320 of the
In one embodiment, if the user selects a PO node corresponding to the P0 part type in the graph 2110, the processor 320 may display information of the PO node (e.g., identification information for identifying the PO part type) with the node information 2120. It is shown in fig. 21 that the selected node information 2120 shows only identification information for identifying the type of the PO part, but is not limited thereto, and the available node information 2120 shows various information related to the type of the PO part.
In addition, the processor 320 may display error value information 2130 corresponding to the PO node. Error value information 2130 shows error value 2131 of node N0, which is the upper node of the PO node, and error value 2130 of the PO node, separately. However, this is for illustrative purposes only and is not limited thereto. The error value information 2130 may also show the error values of the C0 node, the C1 node, and the C2 node, which are lower nodes than the P0 node.
As described above, the first error value for each of the plurality of first components may be generated using a plurality of measured values for each of the plurality of first components measured during the inspection of the plurality of first type substrates. The first error value of each of the plurality of first components may be generated based on one of an average value, a median value, a mode value, a minimum value, a maximum value, a standard deviation, and the like of the plurality of first error values. In addition, the second error value, the third error value and the fourth error value are generated by decomposing the first error value, so the processor 320 decomposes the plurality of first error values respectively, and can calculate the average value, the median value, the mode value, the minimum value, the maximum value, the standard deviation and the like of each of the plurality of second error values, the plurality of third error values and the plurality of fourth error values and the second error values, the third error values and the fourth error values.
The processor 320 generates and illustrates an error value trend graph 2140 of the P0 node as the selected node based on the calculated plurality of second error values, the plurality of third error values, and the plurality of fourth error values. In addition, the processor 320 may generate and display an error value map 2150 using an average value, a median value, a mode value, a minimum value, a maximum value, a standard deviation, and the like of the error values of the P0 node as the selected node. Accordingly, the user can easily grasp the error value characteristic of the P0 node as the selected node.
FIG. 22 illustrates a screen in which content is analyzed for error values according to various embodiments of the invention.
According to various embodiments disclosed herein, the processor 320 of the
In one embodiment, if the user selects the N0 node corresponding to the N0 nozzle included in the
Additionally, processor 320 may display
Fig. 23 illustrates a screen of a solder paste image, a component image after a mounting process, and a component image after a reflow process according to various embodiments of the present invention.
According to various embodiments disclosed in the present invention, the processor 320 of the
Fig. 24 illustrates a graph of mounting failure rates according to various embodiments of the present invention.
According to various embodiments disclosed in the present invention, the processor 320 of the
The method is described by way of specific embodiments, but is implemented as computer readable code on a computer readable recording medium. The computer-readable recording medium includes all kinds of recording devices that can read data from a computer system. For example, the computer-readable recording medium may include: ROM, RAM, CD-ROM, magnetic tape, floppy disk, optical data storage devices, and the like. In addition, the computer-readable recording medium is distributed over network-connected computer systems, and stores and runs codes that can be read by a computer in a distributed manner. Then, functional (functional) programs, codes, and code segments for implementing the embodiments can be easily inferred by programmers skilled in the art to which the present invention pertains.
Although the technical ideas disclosed in the present invention have been described above by way of examples of some embodiments and shown in the accompanying drawings, various substitutions, modifications and changes can be made by those skilled in the art without departing from the technical ideas and scope of the present invention as understood by those having ordinary knowledge in the technical field of the present invention. Further, such alternatives, modifications, and variations are to be understood as being within the scope of the following claims.
- 上一篇:一种医用注射器针头装配设备
- 下一篇:一种治疗新型冠状病毒感染的肺炎的方剂及其应用