阅读说明：本技术 高时间分辨率分幅照相系统 (High time resolution framing photographic system ) 是由 王峰 理玉龙 徐涛 刘祥明 关赞洋 魏惠月 彭晓世 刘欣城 刘永刚 任宽 于 2019-11-27 设计创作，主要内容包括：本发明公开了一种高时间分辨率分幅照相系统,包括成像光路和记录光路,所述成像光路包括第一透镜、分束镜、台阶反射镜和半导体器件,所述台阶反射镜的反射面上具有若干级台阶,任意两级台阶的厚度均不相同,所述半导体器件远离分束镜的一侧表面镀有金属反射膜。采用以上技术方案的高时间分辨率分幅照相系统,实现了对X射线二维空间分布的高时间分辨多幅照相,具有目前传统X射线分幅相机不可达到的高时间分辨能力。(The invention discloses a high-time-resolution framing photographic system which comprises an imaging light path and a recording light path, wherein the imaging light path comprises a first lens, a beam splitter, a step reflector and a semiconductor device, a plurality of steps are arranged on the reflecting surface of the step reflector, the thicknesses of any two steps are different, and a metal reflecting film is plated on the surface of one side, far away from the beam splitter, of the semiconductor device. The high-time-resolution framing photographic system adopting the technical scheme realizes high-time-resolution multi-frame photography of X-ray two-dimensional spatial distribution and has high time resolution capability which cannot be achieved by the traditional X-ray framing camera at present.)

1. A high time resolution framing photographic system comprising an imaging optical path and a recording optical path, characterized by: the imaging light path comprises a first lens (1), a beam splitter (2), a step reflector (3) and a semiconductor device (4), wherein a reflecting surface of the step reflector (3) is provided with a plurality of steps (3a), the thicknesses of any two steps (3a) are different, and the surface of one side, far away from the beam splitter (2), of the semiconductor device (4) is plated with a metal reflecting film (4 a);

the X-ray to be measured is emitted from the surface of one side of a semiconductor device (4) plated with a metal reflecting film (4a), meanwhile, ultrashort pulse laser is emitted to a step reflecting mirror (3) through a first lens (1) and a beam splitter (2) in sequence, a plurality of imaging light beams are reflected back by the step reflecting mirror (3), the imaging light beams are emitted to the semiconductor device (4) in sequence, and are then introduced into a recording light path after being reflected by the metal reflecting film (4a) and the beam splitter (2) in sequence, and recording is carried out by the recording light path.

2. The high temporal resolution framing photographic system of claim 1, wherein: the reflecting surfaces of all the steps (3a) are of a plane structure, the inclination angles of the reflecting surfaces of any two steps (3a) are different, and imaging light beams can act on the surface of the semiconductor device (4) in a staggered and superposed mode.

3. The high temporal resolution framing photographic system of claim 1, wherein: the thickness relation of each stage of the steps (3a) is distributed in an arithmetic progression.

4. The high temporal resolution framing photographic system of claim 1, wherein: the recording light path comprises a second lens (5), a third lens (6), a frequency domain filter device (7) and a CCD (8), the second lens (5) is located between the beam splitter (2) and the frequency domain filter device (7), and the third lens (6) is located between the frequency domain filter device (7) and the CCD (8).

5. The high temporal resolution framing camera system of claim 4, wherein: the frequency domain filter device (7) is a diaphragm.

Technical Field

The invention relates to the technical field of laser fusion research, in particular to a high-time-resolution framing photographic system.

Background

Inertial confinement fusion is expected to become an effective way for cleanly utilizing fusion energy in the future, has important research value in the fields of civil economy and military, and develops a series of deep researches around laser inertial confinement fusion in the countries such as the United states, China, Russia and the like in the world. Inertial confinement fusion can be divided into direct drive and indirect drive according to a driving mode, and in any mode, the inertial confinement fusion is finally embodied in compression implosion of spherical target pellets, and finally high-pressure high-temperature fusion combustion is realized to realize ignition.

In laser inertial confinement fusion research, an X-ray framing camera is one of the very important diagnostic systems. The diagnosis of various key physical quantities and physical processes can be completed by measuring the time-space change process of the X-ray by adopting an X-ray framing camera. For example, in an indirect drive experimental study, an X-ray framing camera is used for measuring an X-ray luminescence process in a cavity through a black cavity opening, so that a plasma core focusing process in the black cavity can be diagnosed; by combining an X-ray backlight photographing method and utilizing an X-ray framing camera, multiple photographs can be taken of the target pill in the compression process, so that physical quantities such as the compression speed, symmetry and the like of the target pill can be diagnosed; in the later stage of implosion compression, an X-ray framing camera is connected with a KB and other microscopic imaging systems, so that the morphology evolution process of the hot spots can be diagnosed.

However, limited by the current state of the art of the electronic industry, the time resolution of the X-ray framing camera is often difficult to be better than 40ps, and it is difficult to provide fine experimental data for some ultrafast physical processes, thereby affecting the final analysis and judgment of the experiment. For example, the persistence process of the hot spot in the implosion process is about 100ps, so in order to obtain the fine evolution process of the hot spot, a diagnosis technology with higher time resolution is needed to diagnose the two-dimensional morphology evolution of the hot spot, and it becomes urgent to solve the above problems.

Disclosure of Invention

The invention provides a high-time-resolution framing photographic system, aiming at solving the technical problem that the existing framing photographic system is low in time resolution.

The technical scheme is as follows:

the utility model provides a high temporal resolution framing photographic system, includes imaging optical path and recording optical path, its main points lie in: the imaging light path comprises a first lens, a beam splitter, a step reflector and a semiconductor device, wherein the reflecting surface of the step reflector is provided with a plurality of steps, the thicknesses of any two steps are different, and the surface of one side of the semiconductor device, which is far away from the beam splitter, is plated with a metal reflecting film;

the X-ray to be measured is emitted from the surface of one side of the semiconductor device plated with the metal reflecting film, meanwhile, the ultrashort pulse laser is emitted to the step reflecting mirror through the first lens and the beam splitter in sequence, a plurality of imaging light beams are reflected back by the step reflecting mirror, the imaging light beams are emitted into the semiconductor device in sequence, and then are introduced into the recording light path after being reflected through the metal reflecting film and the beam splitter in sequence and are recorded through the recording light path.

By adopting the above method, in the semiconductor device, due to different intensities, the photorefractive effect caused by the X-rays in each spatial region forms different degrees of phase modulation on the probe light (i.e. each imaging beam) and converts the phase modulation into intensity modulation of the probe light, that is, the spatial intensity information of the X-rays to be detected is converted into spatial intensity modulation of the probe light; through the structural design of the step reflector, not only can each imaging beam image different positions of the semiconductor device, but also because the arrival time of each imaging beam is different, an ultrashort pulse time sequence is formed, so that each imaging beam can carry the intensity information of X-rays to be detected at different times and is finally recorded by a recording light path, thereby realizing high-time-resolution multi-frame photography of two-dimensional X-ray spatial distribution, and having high-time resolution capability (superior to 10ps) which can not be achieved by the traditional X-ray framing camera at present.

Preferably, the method comprises the following steps: the reflecting surfaces of the steps are of a plane structure, the inclination angles of the reflecting surfaces of any two steps are different, and imaging light beams can act on the surface of the semiconductor device in a staggered and superposed mode. In the above manner, more positions of the semiconductor device can be covered.

Preferably, the method comprises the following steps: the thickness relation of each step is distributed in an arithmetic progression. In the above manner, the time resolution can be controlled more accurately.

Preferably, the method comprises the following steps: the recording light path comprises a second lens, a third lens, a frequency domain filter device and a CCD (charge coupled device), the second lens is positioned between the beam splitter and the frequency domain filter device, and the third lens is positioned between the frequency domain filter device and the CCD. In the above manner, the photographic result can be accurately recorded.

Preferably, the method comprises the following steps: the frequency domain filter device is a diaphragm. With the above configuration, the frequency domain filtering can be stably and reliably performed.

Compared with the prior art, the invention has the beneficial effects that:

the high-time-resolution framing photographic system adopting the technical scheme utilizes the step reflector to generate an ultrashort pulse time sequence, combines the photoinduced refraction effect and the frequency domain filtering of the semiconductor device, converts the spatial intensity information of the X-ray to be detected into the spatial intensity modulation of the probe light, simultaneously images the probe light carrying the spatial intensity information of the X-ray to be detected at different moments to different positions based on the different inclination angle designs of the steps of the step reflector, and records the probe light by the recording light path, realizes the high-time-resolution multi-frame photographing of the two-dimensional spatial distribution of the X-ray, and has the high-time-resolution capability which can not be achieved by the traditional X-ray framing camera at present.

Drawings

FIG. 1 is a schematic view of the present invention;

FIG. 2 is a schematic structural diagram of a step reflector;

fig. 3 is a schematic structural view of the semiconductor device.

Detailed Description

The present invention will be further described with reference to the following examples and the accompanying drawings.

As shown in fig. 1, a high time resolution framing photographic system includes an imaging optical path and a recording optical path, the imaging optical path includes a first lens 1, a beam splitter 2, a step reflector 3 and a semiconductor device 4, the recording optical path includes a second lens 5, a third lens 6, a frequency domain filter device 7 and a CCD8, the second lens 5 is located between the beam splitter 2 and the frequency domain filter device 7, and the third lens 6 is located between the frequency domain filter device 7 and a CCD 8. Wherein the step reflector 3 and the semiconductor device 4 as well as the first lens 1 and the second lens 5 are distributed two by two opposite around the beam splitter 2.

Referring to fig. 1 and 2, the reflecting surface of the step reflector 3 has a plurality of steps 3a, and the thicknesses of any two steps 3a are different. Further, the thickness relation of the steps 3a at each stage is distributed in an arithmetic progression. In this embodiment, the thickness difference of each step 3a is 1.5mm, and when a beam of ultrashort pulse laser incides step reflector 3, the ultrashort pulse signal that reflects back is because the optical path difference, is cut apart into two liang of interval and is 10 ps's ultrashort pulse sequence in the time to the cooperation realizes high time resolution ratio light and shoots. Specifically, the time difference between adjacent ultrashort pulse signals in the ultrashort pulse sequence can be adjusted by controlling the thickness difference of the step 3a, so that the time resolution can be adjusted according to actual needs.

Moreover, the reflecting surfaces of the steps 3a at each stage are of a planar structure, the inclination angles of the reflecting surfaces of any two stages of steps 3a are different, and the imaging light beams can act on the surface of the semiconductor device 4 in a staggered and superposed manner.

Referring to fig. 1 and fig. 3, a surface of the semiconductor device 4 on a side away from the beam splitter 2 is plated with a metal reflective film 4a, and the metal reflective film 4a can reflect the imaging beam and allow the X-ray to be measured to pass through.

In this embodiment, the frequency domain filter device 7 is a diaphragm, the semiconductor device 4 is cadmium antimonide, and the semiconductor device 4 made of cadmium antimonide can convert the spatial intensity information of the X-ray to be detected into refractive index change information, so as to modulate the probe light.

Referring to fig. 1, an X-ray to be measured is incident from a surface of a side of a semiconductor device 4 coated with a metal reflective film 4a, meanwhile, an ultrashort pulse laser is sequentially emitted to a step reflector 3 through a first lens 1 and a beam splitter 2, and is reflected back to a plurality of imaging beams by the step reflector 3, each imaging beam is sequentially emitted to the semiconductor device 4, is sequentially reflected by the metal reflective film 4a and the beam splitter 2, is introduced into a recording optical path, is sequentially emitted to a CCD8 through a second lens 5, a frequency domain filter 7 and a third lens 6, and is finally recorded by a CCD 8.

Specifically, the ultrashort pulse laser sequentially passes through the first lens 1 and the beam splitter 2 and is emitted to the step reflector 3, and due to the special multi-step 3a design of the step reflector 3, each imaging beam has different time delays and can be in a staggered overlapping state on the surface of the semiconductor device. Meanwhile, one side of the semiconductor device 4 is plated with a metal reflecting film 4a, X-rays to be measured enter from one side of the metal reflecting film 4a, and imaging light beams enter from the other side of the semiconductor device 4, pass through the semiconductor device 4 and are reflected at the metal reflecting film 4 a. In the semiconductor device 4, the photorefractive effect caused by different light intensities in different degrees is in the semiconductor device 4, and the photorefractive effect caused by the X-rays in each spatial region forms different degrees of phase modulation for each imaging light beam due to different intensities (the phase modulation formed by the photorefractive effect is converted into the intensity modulation of the probe light, in other words, the spatial intensity information of the X-rays to be measured is converted into the spatial intensity modulation of the probe light). Then, after entering the recording optical path, each imaging light beam is emitted to the frequency domain filter device 7 through the second lens 5, after being subjected to frequency domain filtering by the frequency domain filter device 7, is emitted to the CCD8 through the third lens 6, and is finally recorded by the CCD8, so that the high-time-resolution framing photographic result of the X-ray to be detected can be obtained.

Finally, it should be noted that the above-mentioned description is only a preferred embodiment of the present invention, and those skilled in the art can make various similar representations without departing from the spirit and scope of the present invention.