阅读说明：本技术 一种静电防护器件和防静电测试电路 (Electrostatic protection device and anti-static test circuit ) 是由 黄威 于 2019-09-19 设计创作，主要内容包括：本发明提出一种静电防护器件和防静电测试电路,涉及面板显示技术领域,静电防护器件包括：位于底层的第一测试单元,所述第一测试单元用于连接待测试显示面板；覆盖第一测试单元上方的第一绝缘层；覆盖第一绝缘层的第一屏蔽单元,所述第一屏蔽单元接地；所述第一屏蔽单元与第一测试单元之间电性连接且具有连接状态和断开状态；当测试点灯时,电性连接为连接状态,当测试结束时,电性连接为断开状态。所述静电防护器件通过改变静电防护器件的相关设计来改善面板的抗静电防护能力。(The invention provides an electrostatic protection device and an anti-static test circuit, which relate to the technical field of panel display, wherein the electrostatic protection device comprises: the first test unit is positioned at the bottom layer and used for connecting the display panel to be tested; a first insulating layer covering the first test unit; a first shielding unit covering the first insulating layer, the first shielding unit being grounded; the first shielding unit is electrically connected with the first testing unit and has a connection state and a disconnection state; when the test lights up, the electrical connection is in a connection state, and when the test is finished, the electrical connection is in a disconnection state. The static protection device improves the antistatic protection capability of the panel by changing the relevant design of the static protection device.)

1. An electrostatic protection device, comprising:

the first test unit is positioned at the bottom layer and used for connecting the display panel to be tested;

a first insulating layer covering the first test unit;

a first shielding unit covering the first insulating layer, the first shielding unit being grounded;

the first shielding unit is electrically connected with the first testing unit and has a connection state and a disconnection state;

when the test lights up, the electrical connection is in a connection state, and when the test is finished, the electrical connection is in a disconnection state.

2. The ESD device of claim 1 wherein the first testing unit is one or more conductive layers and the first shielding unit is one or more conductive layers.

3. The electrostatic protection device of claim 2, wherein when the first test unit is a multilayer conductive layer, the first test unit comprises:

a first metal layer;

the second insulating layer covers the first metal layer, and a first opening in the middle is formed in the second insulating layer;

and the first metal oxide layer covers the second insulating layer, and is in contact with the first metal layer through the first opening.

4. The electrostatic protection device according to claim 2, wherein when the first shielding unit is a multilayer conductive layer, the first shielding unit includes:

a second metal layer;

the third insulating layer covers the second metal layer, and a first opening in the middle is formed in the third insulating layer;

and the second metal oxide layer covers the third insulating layer, and is in contact with the second metal layer through the first opening.

5. The ESD protection device of claim 1, wherein the first shielding unit and the first testing unit are electrically connected through an external connection hole.

6. The electrostatic protection device according to claim 5, wherein the first shielding unit includes a first body portion and a first connecting portion connected to the first body portion; the first test unit comprises a second main body part and a second connecting part connected with the second main body part; the first shielding unit is electrically connected with the first testing unit through a connecting hole formed in the first connecting portion and the second connecting portion.

7. The ESD protection device of claim 1, wherein a circuit control switch is disposed on the first shielding unit or the first testing unit to control electrical connection or disconnection.

8. The ESD device of claim 7 wherein the circuit control switch is a TFT device.

9. The ESD protection device of claim 8 wherein the circuit control switch is formed by multiple TFT devices connected in series or in parallel, or a set of circuits formed by multiple TFT devices.

10. The ESD protection device according to claim 1, wherein the first testing unit and the first shielding unit are electrically disconnected by laser cutting.

11. An antistatic test circuit, comprising the electrostatic protection device of any one of claims 1 to 9, for performing a lighting test on a display panel, characterized in that the electrostatic protection device is electrically contacted with the display panel to be tested through a jig probe during the lighting test, and the interior of the electrostatic protection device is electrically connected to be in a connection state during the test; when the test is finished, the internal electrical connection of the electrostatic protection device is in a disconnected state.

Technical Field

The invention belongs to the technical field of panel display, and particularly relates to an electrostatic protection device and an anti-static test circuit.

Technical Field

Disclosure of Invention

The invention provides an electrostatic protection device and an anti-static test circuit.

The technical scheme of the invention is as follows:

the invention discloses an electrostatic protection device, which is a first test unit positioned at the bottom layer, wherein the first test unit is used for connecting a display panel to be tested; a first insulating layer covering the first test unit; a first shielding unit covering the first insulating layer, the first shielding unit being grounded; the first shielding unit is electrically connected with the first testing unit and has a connection state and a disconnection state; when the test lights up, the electrical connection is in a connection state, and when the test is finished, the electrical connection is in a disconnection state.

Preferably, the first testing unit is one or more conductive layers, and the first shielding unit is one or more conductive layers.

Preferably, when the first test unit is a multilayer conductive layer, the first test unit includes: a first metal layer; the second insulating layer covers the first metal layer, and a first opening in the middle is formed in the second insulating layer; and the first metal oxide layer covers the second insulating layer, and is in contact with the first metal layer through the first opening.

Preferably, when the first shielding unit is a multilayer conductive layer, the first shielding unit includes: a second metal layer; the third insulating layer covers the second metal layer, and a first opening in the middle is formed in the third insulating layer; and the second metal oxide layer covers the third insulating layer, and is in contact with the second metal layer through the first opening.

Preferably, the first shielding unit and the first testing unit are electrically connected through an external connection hole.

Preferably, the first shielding unit includes a first body portion and a first connecting portion connected to the first body portion; the first test unit comprises a second main body part and a second connecting part connected with the second main body part; the first shielding unit is electrically connected with the first testing unit through a connecting hole formed in the first connecting portion and the second connecting portion.

Preferably, a circuit control switch is arranged on the first shielding unit or the first testing unit to control electrical connection or disconnection.

Preferably, the circuit control switch is a TFT device.

Preferably, the circuit control switch is formed by connecting a plurality of TFT devices in series or in parallel, or is a group of circuits formed by a plurality of TFT devices.

Preferably, the first testing unit and the first shielding unit are externally subjected to laser cutting to realize an electrical connection disconnection state.

The invention also discloses an anti-static test circuit, which comprises the static protection device and is used for carrying out lighting test on the display panel, wherein the static protection device is electrically contacted with the display panel to be tested through the jig probe during the lighting test, and the internal electrical connection of the static protection device is in a connection state during the test; when the test is finished, the internal electrical connection of the electrostatic protection device is in a disconnected state.

The invention can bring at least one of the following beneficial effects:

the invention can isolate the static electricity generated on the terminal from entering the display panel through the lighting test circuit, thereby avoiding the risk of damaging TFT devices and circuits in the panel by the static electricity. The function of lighting test is not influenced, and the effect of shielding static electricity can be realized through the uppermost metal oxide layer (ITO) under the normal working state of the panel, so that the ESD resistance of the panel is effectively improved.

Drawings

The present invention will be further described in the following detailed description of preferred embodiments, which is to be read in connection with the accompanying drawings.

FIG. 1 is a top view of a prior art lighting test board;

FIG. 2 is a cross-sectional view of a lighting test board in the prior art;

FIG. 3 is a schematic view of an electrostatic protection device of the present invention;

FIG. 4 is a schematic diagram of an ESD protection device according to an embodiment of the present invention;

FIG. 5 is a diagram of a first test unit according to an embodiment of the invention.

Detailed Description

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following description will be made with reference to the accompanying drawings. It is obvious that the drawings in the following description are only some examples of the invention, and that for a person skilled in the art, other drawings and embodiments can be derived from them without inventive effort.

For the sake of simplicity, the drawings only schematically show the parts relevant to the present invention, and they do not represent the actual structure as a product. In addition, in order to make the drawings concise and understandable, components having the same structure or function in some of the drawings are only schematically illustrated or only labeled. In this document, "one" means not only "only one" but also a case of "more than one".

The present invention provides an electrostatic protection device for a lighting test apparatus, as shown in fig. 3, including: the first testing unit 10 is positioned at the bottom layer, and the first testing unit 10 is used for connecting the display panel to be tested; a first insulating layer 20 covering the first test unit 10; a first shielding unit 30 covering the first insulating layer 20, the first shielding unit 30 being Grounded (GND); the first shielding unit 30 is electrically connected to the first testing unit 10 and has an electrically connected state and an electrically disconnected state; when the test lights up, the electrical connection is in a connection state, and when the test is finished, the electrical connection is in a disconnection state.

Among them, the first test unit 10 can play a complete lighting test role when used alone, but it cannot play a role of shielding static electricity when used alone, and easily damages the panel, so the present invention additionally provides a first shielding unit 30 for shielding static electricity.

The first testing unit 10 may be formed of one or more conductive layers, and the first shielding unit 30 may also be formed of one or more conductive layers, which may be metal, metal oxide, or any other conductive material. Regardless of the first testing unit 10 or the first shielding unit 30, when the conductive layers are multi-layered, two adjacent conductive layers may be connected by a via hole of the insulating layer, or two conductive layers may be directly connected without an insulating layer therebetween, and particularly, the internal connection manner of the first testing unit 10 or the first shielding unit 30 may be selected according to the material and the form of the conductive layers and the process.

The first testing unit 10 and the first shielding unit 30 are separated by the first insulating layer 20, the first shielding unit 30 covers the first insulating layer 20, and the area of the first shielding unit 30 is larger than that of the first testing unit 10, and the first shielding unit 30 does not have any connection with other layers of the first testing unit 10 within the effective testing area range of the first testing unit 10.

The first shielding unit 30 and the first testing unit 10 are electrically connected outside the effective testing area range of the first testing unit 10 and have two states of an electrically connected state and a disconnected state, the connection mode is not limited here, any one or more conductive layers of the first shielding unit 30 and any one or more conductive layers of the first testing unit 10 can be electrically connected outside the effective testing area range of the first testing unit 10 through connection holes, the multiple layers of metals may or may not overlap, as long as the electrical connection between the first shielding unit 30 and the first testing unit 10 is realized, and in addition, the number and the positions of the connection holes are not limited in the present invention.

When lighting test is carried out, the first test unit 10 can lead out metal wires to be connected with a display panel to be tested, the first shielding unit 30 is connected with the jig probe, the first shielding unit 30 is grounded, and the jig probe can send an electric signal into the display panel by contacting with the first shielding unit 30 on the surface; after the lighting test is finished, the electrical connection state between the first shielding unit 30 and the first testing unit 10 is adjusted to be the disconnection state. Therefore, the effect that static electricity generated on the isolation terminal enters the display panel through the lighting test circuit is achieved, and the risk that TFT devices and circuits inside the panel are damaged by static electricity is avoided.

The technical solution of the present invention is described in detail with specific examples below.