阅读说明：本技术 一种用于瞬态热阻测试的夹持装置 (Clamping device for transient thermal resistance test ) 是由 王敏 于 2019-10-12 设计创作，主要内容包括：本发明公开了一种用于瞬态热阻测试的夹持装置,包括底座,通过在底板中心处固定设有夹持板,顶板和底板的另一侧设有第二侧板,顶板的上对称设有拉力表,拉力表上连接有拉绳,活动板上对称设有固定环,拉绳与固定环连接,活动板下方设有夹块,使用时,将测试器件放置在夹持板上,转动螺纹杆,使其在滑块与滑槽的配合下推动活动板向下移动,在推动时,即可通过拉力表测算出此时向下的拉力,可以根据需要,增加或者减小夹块对夹持板的压力,有益效果：这样的装置结构简单,使用方便,可以在瞬态热阻测试时,根据需要调节不同的夹持力,不会使芯片压碎,或者夹持力过小,增加接触热阻和电阻,影响测试结果。(The invention discloses a clamping device for transient thermal resistance testing, which comprises a base, wherein a clamping plate is fixedly arranged at the center of a bottom plate, a second side plate is arranged at the other side of a top plate and the bottom plate, tension meters are symmetrically arranged on the top plate, pull ropes are connected with the tension meters, fixing rings are symmetrically arranged on a movable plate, the pull ropes are connected with the fixing rings, clamping blocks are arranged below the movable plate, when the clamping device is used, a testing device is placed on the clamping plate, a threaded rod is rotated to push the movable plate to move downwards under the matching of a sliding block and a sliding groove, and when the threaded rod is pushed, the downward pull force at the moment can be measured through the tension meters, so that the pressure of the clamping blocks on the clamping plate can be increased or reduced according to needs: the device has a simple structure, is convenient to use, can adjust different clamping forces according to requirements during transient thermal resistance testing, does not crush the chip, or has excessively small clamping force, increases thermal contact resistance and resistance, and influences a testing result.)

1. The clamping device for the transient thermal resistance test is characterized by comprising a base (1), wherein a first supporting rod (2) is arranged on the base (1), a second supporting rod (3) is arranged on the first supporting rod (2), the first supporting rod (2) is connected with the second supporting rod (3) through an adjusting device (4), a first side plate (5) is arranged at one end of the second supporting rod (3), a top plate (6) and a bottom plate (7) are respectively arranged at two ends of the first side plate (5), the top plate (6) and the bottom plate (7) are fixedly connected with the first side plate (5), a clamping plate (8) is fixedly arranged at the center of the bottom plate (7), a second side plate (9) is arranged at the other side of the top plate (6) and the bottom plate (7), a movable plate (10) is arranged between the first side plate (5) and the second side plate (9), the both ends of fly leaf (10) all are equipped with slider (11), first curb plate (5) with second curb plate (9) are located all be equipped with spout (12) on the lateral wall of slider (11), slider (11) with spout (12) phase-match, roof (6) center department is equipped with thread bush (13), be equipped with threaded rod (14) in thread bush (13), the last symmetry of roof (6) is equipped with tensiometer (15), be connected with stay cord (16) on tensiometer (15), the symmetry is equipped with solid fixed ring (17) on fly leaf (10), stay cord (16) with gu fixed ring (17) are connected, fly leaf (10) below is equipped with clamp splice (18).

2. The clamping device for transient thermal resistance test according to claim 1, characterized in that the adjusting device (4) comprises a first clamping plate (19) and a second clamping plate (20), and a fastening shaft (21) is arranged between the first clamping plate (19) and the second clamping plate (20).

3. The clamping device for the transient thermal resistance test according to claim 1, wherein the movable plate (10) is provided with a fixed plate (22) at a position below the threaded rod (14), and a threaded groove (23) is formed in the center of the fixed plate (22).

4. The clamping device for the transient thermal resistance test according to claim 1, wherein the first support rod (2) and the second support rod (3) are made of stainless steel.

5. The clamping device for the transient thermal resistance test is characterized in that mounting nails (24) are symmetrically arranged below the base (1).

Technical Field

The invention relates to the technical field of thermal resistance test clamping, in particular to a clamping device for transient thermal resistance test.

Background

In the process of producing semiconductor devices, in order to quickly and effectively check the sintering quality (thermal resistance) between a device chip and a shell, a screening method of transient thermal resistance test is generally adopted. The method is to apply single power pulse to the semiconductor device to be tested, measure thermal sensitive parameters after the pulse is finished, infer the temperature rise of the device chip, and then infer the quality of the device sintering quality (sintering thermal resistance). The test of the transient thermal resistance can meet 100 percent of screening in the process production of semiconductor devices, and mainly eliminates devices with larger thermal resistance caused by unqualified chip sintering quality. When the transient thermal resistance test is carried out on the semiconductor device, the semiconductor device needs to be clamped and fixed, in order to ensure that the semiconductor device can work normally, the clamping force of the clamping device on the semiconductor device needs to be strictly controlled, the conventional clamping device is often too large in clamping force and crushes a chip, or the clamping force is too small, so that the contact thermal resistance and the resistance are increased, and the test result is influenced.

An effective solution to the problems in the related art has not been proposed yet.

Disclosure of Invention

The present invention provides a clamping device for transient thermal resistance test, which is directed to the problems in the related art, so as to overcome the above technical problems in the related art.

The technical scheme of the invention is realized as follows:

a clamping device for transient thermal resistance testing comprises a base, wherein a first supporting rod is arranged on the base, a second supporting rod is arranged on the first supporting rod, the first supporting rod is connected with the second supporting rod through an adjusting device, a first side plate is arranged at one end of the second supporting rod, a top plate and a bottom plate are respectively arranged at two ends of the first side plate, the top plate and the bottom plate are fixedly connected with the first side plate, a clamping plate is fixedly arranged at the center of the bottom plate, a second side plate is arranged at the other side of the top plate and the bottom plate, a movable plate is arranged between the first side plate and the second side plate, sliding blocks are arranged at two ends of the movable plate, sliding grooves are respectively formed in one side wall of each sliding block of the first side plate and the second side plate, the sliding blocks are matched with the sliding grooves, and thread sleeves are arranged at the center of the top, the pull-type tension meter is characterized in that a threaded rod is arranged in the threaded sleeve, pull meters are symmetrically arranged on the top plate, pull ropes are connected to the pull meters, fixing rings are symmetrically arranged on the movable plate, the pull ropes are connected with the fixing rings, and clamping blocks are arranged below the movable plate.

Furthermore, adjusting device includes first splint and second splint, be equipped with the fastening axle between first splint with the second splint.

Furthermore, the position that the fly leaf is located the threaded rod below is equipped with the fixed plate, fixed plate center department is equipped with the thread groove.

Furthermore, the first support rod and the second support rod are made of stainless steel.

Furthermore, the installation nails are symmetrically arranged below the base.

The invention provides a clamping device for transient thermal resistance testing, which has the following beneficial effects:

(1) when the device is used, a testing device is placed on the clamping plate, the threaded rod is rotated to push the movable plate to move downwards under the matching of the sliding block and the sliding groove, the downward pulling force can be measured by the tension meter when the device is pushed, the pressure of the clamping block on the clamping plate can be increased or decreased as required, the device has a simple structure, is convenient to use, can adjust different clamping forces according to requirements during transient thermal resistance testing, does not crush the chip, or has excessively small clamping force, increases thermal contact resistance and resistance, and influences a testing result.

(2) The adjusting device comprises a first clamping plate and a second clamping plate, a fastening shaft is arranged between the first clamping plate and the second clamping plate, and the positions of the first supporting rod and the second supporting rod can be adjusted.

(3) The movable plate is located at the position below the threaded rod, the center of the fixed plate is provided with a threaded groove, and the movable plate is protected when the threaded rod rotates.

(4) The first supporting rod and the second supporting rod are made of stainless steel, so that the service life of the first supporting rod and the service life of the second supporting rod can be prolonged.

(5) The installation nails are symmetrically arranged below the base, so that the base can be conveniently installed and detached.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.

FIG. 1 is a schematic structural diagram of a clamping device for transient thermal resistance testing according to an embodiment of the present invention;

fig. 2 is a schematic structural diagram of an adjusting device in a clamping device for transient thermal resistance testing according to an embodiment of the invention.

In the figure:

1. a base; 2. a first support bar; 3. a second support bar; 4. an adjustment device; 5. a first side plate; 6. a top plate; 7. a base plate; 8. a clamping plate; 9. a second side plate; 10. a movable plate; 11. a slider; 12. a chute; 13. a threaded sleeve; 14. a threaded rod; 15. a tension meter; 16. pulling a rope; 17. a fixing ring; 18. a clamping block; 19. a first splint; 20. a second splint; 21. fastening the shaft; 22. a fixing plate; 23. a thread groove; 24. and (6) installing the nail.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments that can be derived by one of ordinary skill in the art from the embodiments given herein are intended to be within the scope of the present invention.

The invention is further described with reference to the following drawings and detailed description: