阅读说明：本技术 一种离子探头 (Ion probe ) 是由 吴宝昕 于 2019-10-15 设计创作，主要内容包括：本发明提供一种离子探头,该离子探头包括接口(1)、第一圆管(2)、第二圆管(3)、采样管(4)、以及第一放电板(5)；第二圆管(3)同心的放置在第一圆管(2)内,采样管(4)同心的放置在第二圆管(3)内,第一放电板(5)固定在第二圆管(3)的外壁。该离子探头使得样品离子在采样管传输过程中的损失减小,从而获得高灵敏度的质谱仪。(The invention provides an ion probe, which comprises an interface (1), a first round pipe (2), a second round pipe (3), a sampling pipe (4) and a first discharge plate (5); the second round pipe (3) is concentrically arranged in the first round pipe (2), the sampling pipe (4) is concentrically arranged in the second round pipe (3), and the first discharge plate (5) is fixed on the outer wall of the second round pipe (3). The ion probe reduces the loss of sample ions in the transmission process of the sampling tube, thereby obtaining a high-sensitivity mass spectrometer.)

1. An ion probe is characterized by comprising an interface (1), a first round pipe (2), a second round pipe (3), a sampling pipe (4) and a first discharge plate (5); the second round pipe (3) is concentrically arranged in the first round pipe (2), the sampling pipe (4) is concentrically arranged in the second round pipe (3), and the first discharge plate (5) is fixed on the outer wall of the second round pipe (3).

2. The ion probe according to claim 1, wherein the first cylindrical tube (2) and the second cylindrical tube (3) are conductive tubes or insulating tubes having an inner wall at least partially covering the conductor.

3. The ion probe according to claim 2, wherein the first discharge plate (5) comprises a first circular ring (51) and a first discharge tip (52) extending outwardly along an outer diameter of the first circular ring (51) at the outer diameter of the first circular ring (51).

4. The ion probe according to claim 3, characterized in that the inner diameter of the first circular ring (51) is equal to the outer diameter of the second circular tube (3), and the sum of the outer diameter of the first circular ring (51) and the length of the first discharge tip (52) is smaller than the inner diameter of the first circular tube (2).

5. The ion probe according to claim 4, characterized in that the end of the sampling tube (4) near the sample (6) is higher than the end of the second circular tube (3) near the sample (6), and the wall of the end of the sampling tube (4) near the sample is arc-shaped.

6. The ion probe according to claim 5, further comprising a second discharge plate (7) fixedly disposed at an inner wall of the first circular tube (2).

7. The ion probe according to claim 6, wherein the second discharge plate (7) comprises a second circular ring (71) and a second discharge tip (72) extending outwardly along an inner diameter of the second circular ring (71) at the inner diameter of the second circular ring (71).

8. The ion probe according to claim 7, characterized in that the outer diameter of the second ring (71) is equal to the outer diameter of the first tube (2) and the second ring (71) is fixed at the inner diameter of the first tube (2) by means of screws passing through the wall of the first tube (2).

9. The ion probe of claim 7, wherein the second discharge tip (72) and the first discharge tip (52) are spaced apart.

Technical Field

The invention relates to the technical field of material detection, in particular to an ion probe.

Background

Mass spectrometers detect and analyze molecules of different molecular weights according to the difference in the charge-to-mass ratio (m/z) of ions. In a miniaturized mass spectrometer, the ions are usually obtained by a plasma generated by an ion probe near the sample and interacting with molecules on the surface of the sample to generate sample ions, which are transported along a sampling tube under the action of a gas flow to a mass analyzer for analysis and detection. However, the sample ions will contact the inner wall of the sampling tube during transport of the sampling tube, causing ion loss due to neutralization effects, thereby reducing the sensitivity of the mass spectrometer analysis.

Disclosure of Invention

In view of the above problems, the present invention provides an ion probe, which reduces the loss of sample ions during the transmission process of a sampling tube, thereby obtaining a high-sensitivity mass spectrometer.

The invention provides an ion probe, which comprises an interface 1, a first round pipe 2, a second round pipe 3, a sampling pipe 4 and a first discharge plate 5, wherein the interface is connected with the first round pipe 2; the second round pipe 3 is concentrically placed in the first round pipe 2, the sampling pipe 4 is concentrically placed in the second round pipe 3, and the first discharge plate 5 is fixed on the outer wall of the second round pipe 3.

The first round tube 2 and the second round tube 3 may be conductor tubes or insulating tubes with inner walls at least partially covering the conductors.

Wherein the first discharge plate 5 includes a first circular ring 51 and first discharge tips 52 extending outward along an outer diameter of the first circular ring 51 at the outer diameter of the first circular ring 51. The inner diameter of the first circular ring 51 is equal to the outer diameter of the second circular tube 3, and the sum of the outer diameter of the first circular ring 51 and the length of the first discharge tip 52 is smaller than the inner diameter of the first circular tube 2.

Wherein, the end part of the sampling tube 4 close to the sample 6 is higher than the end part of the second round tube 3 close to the sample 6, and the wall of the end part of the sampling tube 4 close to the sample is in a circular arc shape.

Wherein, the device also comprises a second discharge plate 7 fixedly arranged on the inner wall of the first round pipe 2.

Wherein the second discharge plate 7 includes a second circular ring 71 and second discharge tips 72 extending outwardly along an inner diameter of the second circular ring 71 at the inner diameter of the second circular ring 71. The outer diameter of the second circular ring 71 is equal to the outer diameter of the first circular tube 2, and the second circular ring 71 is fixed at the inner diameter of the first circular tube 2 by a screw passing through the wall of the first circular tube 2.

Wherein the second discharge tip 72 and the first discharge tip 52 are spaced apart.

Drawings

Fig. 1 is a schematic view of an ion probe according to a first embodiment of the present invention.

Fig. 2 is a plan view of a discharge plate according to a first embodiment of the present invention.

Fig. 3 is a schematic view of an ion probe according to a second embodiment of the present invention.

Fig. 4 is a plan view of a discharge electrode of an ion probe according to a second embodiment of the present invention.

Detailed Description

Embodiments of the present application will be described in detail by examples, so that how to apply technical means to solve technical problems and achieve technical effects of the present application can be fully understood and implemented.

Fig. 1 is a schematic view of an ion probe according to a first embodiment of the present invention. The ion probe comprises an interface 1, a first circular tube 2, a second circular tube 3, a sampling tube 4 and a first discharge plate 5. The second round pipe 3 is concentrically placed in the first round pipe 2, the sampling pipe 4 is concentrically placed in the second round pipe 3, and the first discharge plate 5 is fixed on the outer wall of the second round pipe 3. The first round tube 2 and the second round tube 3 may be conductor tubes or insulating tubes with inner walls at least partially covering the conductors. A voltage from a voltage source (not shown) is applied to the first discharge plate 5 via the first circular tube 2 or a conductor on the inner wall of the first circular tube 2 and a conductor on the outer wall of the second circular tube 3 or 3, thereby ionizing a gas (for example, air) passing between the first circular tube 2 and the second circular tube 3.

Fig. 2 is a plan view of a first discharge plate according to a first embodiment of the present invention. The first discharge plate 5 includes a first circular ring 51 and first discharge tips 52 extending outward along an outer diameter of the first circular ring 51 at the outer diameter of the first circular ring 51. The inner diameter of the first circular ring 51 is equal to the outer diameter of the second circular tube 3, and the sum of the outer diameter of the first circular ring 51 and the length of the first discharge tip 52 is smaller than the inner diameter of the first circular tube 2. The number of the first discharge tips 52 may be 3, 4, 5, 6, 8, 12, etc. The number of the first discharge tips is preferably 16, 32 from the viewpoint of complete ionization of the gas.

In operation of the ion probe, gas (e.g. air) transported between the first cylindrical tube 2 and the second cylindrical tube 3 is ionized by the first discharge tip 52 on the first discharge plate 5 to form plasma, which is transported by the gas flow to the surface of the sample 6 to interact with molecules on the surface of the sample 6, thereby generating sample ions, which are transported along the sampling tube 4 by the gas flow to a mass analyzer, not shown, to be analyzed and detected; the gas (e.g. air) transmitted between the second circular tube 3 and the sampling tube 4 will be transported along the inner wall of the sampling tube 4, and a gas sheath layer is provided between the sample ions and the inner wall of the sampling tube 4, which gas sheath layer will block the diffusion or migration of the sample ions towards the inner wall of the sampling tube 4, so that more sample ions will not contact the inner wall of the sampling tube 4 before reaching the end of the sampling tube 4, thereby increasing the amount of ions reaching the mass analyzer (not shown) through the interface 1 at the end of the sampling tube 4, and further improving the sensitivity of sample ion detection.

In order to facilitate transport of the gas transported between the second tube 3 and the sampling tube 4 along the inner wall of the sampling tube 4, the end of the sampling tube 4 near the sample 6 is higher than the end of the second tube 3 near the sample 6, and the wall of the end of the sampling tube 4 near the sample is circular.

Fig. 3 is a schematic view of an ion probe according to a second embodiment of the present invention. The ion probe of the second embodiment of the present invention is different from the ion probe of the first embodiment of the present invention in that a second discharge plate 7 is fixedly disposed on the inner wall of the first circular tube 2. The same components of the ion probe of the second embodiment and the ion probe of the first embodiment are not described again. Please refer to the first embodiment.

Fig. 4 is a plan view of the second discharge plate 7 according to the second embodiment of the present invention, in which a dotted line indicates the second discharge plate 7 and a solid line indicates the first discharge plate 5. The second discharge plate 7 includes a second circular ring 71 and second discharge tips 72 extending outwardly along an inner diameter of the second circular ring 71 at the inner diameter of the second circular ring 71. The second ring 71 has an outer diameter equal to the outer diameter of the first tube 2 and the second ring 71 is fixed to the inner diameter of the first tube 2 by screws (not shown) passing through the wall of the first tube 2. The number of the second discharge tips 72 may be 3, 4, 5, 6, 8, 12, etc. The number of the second discharge tips is preferably 16, 32 from the viewpoint of complete ionization of the gas. In addition, the second discharge tip 72 and the first discharge tip 52 are spaced apart, which facilitates gas ionization and reduces a gas ionization voltage, as shown in fig. 4.

There are many other possible embodiments of the present invention, which are not listed here, and the embodiments claimed in the claims of the present invention can be implemented.

The details not described in the specification of the present application belong to the common general knowledge of those skilled in the art.