芯片的访问方法、微芯片、智能卡以及调试设备

文档序号:1591068 发布日期:2020-01-03 浏览:3次 >En<

阅读说明:本技术 芯片的访问方法、微芯片、智能卡以及调试设备 (Chip access method, microchip, smart card and debugging equipment ) 是由 胡丽华 冯守川 钟成志 朱明� 于 2018-03-21 设计创作,主要内容包括:一种芯片的访问方法、微芯片、智能卡以及调试设备。芯片的访问方法包括:判断智能卡的加密功能是否被触发(S301);若加密功能被触发,则至少基于密钥生成密文,并将密文反馈至调试设备,以供调试设备将密文发送至待调试的芯片,并供芯片根据密文确定是否允许调试设备对芯片进行访问(S302)。还提供了一种微芯片、智能卡以及调试设备。本方法提高了调试设备访问芯片时的安全性。(A chip access method, a microchip, a smart card and a debugging device. The chip access method comprises the following steps: judging whether the encryption function of the smart card is triggered (S301); if the encryption function is triggered, a ciphertext is generated at least based on the secret key and fed back to the debugging equipment, so that the debugging equipment sends the ciphertext to a chip to be debugged, and the chip determines whether the debugging equipment is allowed to access the chip or not according to the ciphertext (S302). A microchip, a smart card and a debugging device are also provided. The method improves the security of the debugging equipment when accessing the chip.)

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