阅读说明：本技术 原子磁强计温度可调稳场测试系统 (Temperature-adjustable stable field test system of atomic magnetometer ) 是由 秦杰 刘栋苏 郭宇豪 于 2019-09-12 设计创作，主要内容包括：本发明提供了一种原子磁强计温度可调稳场测试系统,该原子磁强计温度可调稳场测试系统包括：原子磁强计,用于待测环境的稳场测试；保温装置,原子磁强计位于保温装置内,保温装置用于维持原子磁强计的环境温度恒定；磁屏蔽桶,保温装置位于磁屏蔽桶内,磁屏蔽桶用于屏蔽外界磁场干扰；温度调节组件,温度调节组件位于磁屏蔽桶外部,温度调节组件用于调节原子磁强计的环境温度。应用本发明的技术方案,以解决现有技术中原子磁强计测试装置的温度不可控导致的不能在高温或低温环境下进行稳场测试的技术问题。(The invention provides a temperature-adjustable stable field test system of an atomic magnetometer, which comprises: the atomic magnetometer is used for the stable field test of the environment to be tested; the atomic magnetometer is positioned in the heat preservation device, and the heat preservation device is used for maintaining the ambient temperature of the atomic magnetometer to be constant; the heat preservation device is positioned in the magnetic shielding barrel, and the magnetic shielding barrel is used for shielding external magnetic field interference; the temperature regulation subassembly, the temperature regulation subassembly is located the magnetism shielding bucket outside, and the temperature regulation subassembly is used for adjusting the ambient temperature of atomic magnetometer. By applying the technical scheme of the invention, the technical problem that the stable field test cannot be carried out in a high-temperature or low-temperature environment due to the uncontrollable temperature of the atomic magnetometer testing device in the prior art is solved.)

1. The utility model provides an adjustable steady field test system of atomic magnetometer temperature which characterized in that, the adjustable steady field test system of atomic magnetometer temperature includes:

the atomic magnetometer (10) is used for the stable field test of the environment to be tested;

the temperature keeping device (20), the atomic magnetometer (10) is positioned in the temperature keeping device (20), and the temperature keeping device (20) is used for keeping the ambient temperature of the atomic magnetometer (10) constant;

the heat preservation device (20) is positioned in the magnetic shielding barrel (30), and the magnetic shielding barrel (30) is used for shielding external magnetic field interference;

a temperature regulation component (40), the temperature regulation component (40) is located outside the magnetic shielding barrel (30), the temperature regulation component (40) is used for regulating the ambient temperature of the atomic magnetometer (10).

2. The system for testing the temperature-adjustable steady field of the atomic magnetometer according to claim 1, wherein the system for testing the temperature-adjustable steady field of the atomic magnetometer further comprises a pipeline (50), the temperature adjusting assembly (40) comprises a temperature adjusting medium and a temperature adjusting unit, the temperature adjusting unit is used for adjusting the temperature of the temperature adjusting medium, and the temperature adjusting medium enters the heat preservation device (20) through the pipeline (50) to adjust the ambient temperature of the atomic magnetometer (10).

3. The system for testing the temperature-adjustable steady field of the atomic magnetometer according to claim 2, wherein the system for testing the temperature-adjustable steady field of the atomic magnetometer comprises a first pipeline (51) and a second pipeline (52), a first end of the first pipeline (51) is connected with the temperature adjusting component (40), a second end of the first pipeline (51) is connected with the heat preservation device (20), a first end of the second pipeline (52) is connected with the temperature adjusting component (40), and a second end of the second pipeline (52) is connected with the heat preservation device (20); the temperature regulation assembly (40), the first pipe (51), the heat retention device (20) and the second pipe (52) form a circulation circuit of the temperature regulation medium.

4. The atomic magnetometer temperature tunable steady field testing system of claim 2 or 3, wherein the temperature tuning medium comprises a gas or a liquid.

5. The adjustable temperature steady field test system of atomic magnetometer of claim 2, characterized in that, the heat preservation device (20) further comprises a temperature sensor (60), the temperature sensor (60) is located in the heat preservation device (20), the temperature sensor (60) is used for collecting the ambient temperature of the atomic magnetometer (10) in the heat preservation device (20) in real time and feeding back the collected temperature value to the temperature adjusting component (40).

6. The adjustable temperature steady field test system of atomic magnetometer of claim 5, characterized in that, the temperature adjusting assembly (40) further comprises a temperature control unit, the temperature control unit is used for controlling the temperature adjusting unit to adjust the temperature of the temperature adjusting medium according to the temperature value collected and fed back by the temperature sensor (60) in real time.

7. The temperature-adjustable steady field test system of an atomic magnetometer according to any one of claims 1 to 6, wherein the material of the heat preservation device (20) comprises a high-low temperature resistant non-magnetic material.

8. The adjustable temperature field stabilization test system of an atomic magnetometer according to claim 2, wherein the pipeline (50) comprises a high and low temperature resistant polyester hose.

9. The system of claim 2, further comprising a thermal insulation layer disposed on an outer surface of at least one of the thermal insulation device (20) and the pipeline (50).

10. The system of claim 9, wherein the insulating layer comprises a low thermal conductivity insulating material.

Technical Field

The invention relates to the technical field of magnetometer testing, in particular to a temperature-adjustable stable field testing system of an atomic magnetometer.

Background

In the field of magnetometer testing, performance testing of an atomic magnetometer needs to be performed in a high-precision high-stability magnetic field, and most of field stabilizing devices can only achieve magnetometer testing at an uncontrollable normal temperature at present. With the diversification of engineering applications, field stabilization testing is often required in high-temperature or low-temperature environments. The temperature of the atomic magnetometer testing device in the prior art is not controllable, and the stable field test under the high-temperature or low-temperature environment cannot be realized.

Disclosure of Invention

The invention provides a temperature-adjustable field stabilization test system for an atomic magnetometer, which can solve the technical problem that field stabilization test cannot be performed in a high-temperature or low-temperature environment due to uncontrollable temperature of an atomic magnetometer test device in the prior art.

The invention provides a temperature-adjustable stable field test system of an atomic magnetometer, which comprises: the atomic magnetometer is used for the stable field test of the environment to be tested; the atomic magnetometer is positioned in the heat preservation device, and the heat preservation device is used for maintaining the ambient temperature of the atomic magnetometer to be constant; the heat preservation device is positioned in the magnetic shielding barrel, and the magnetic shielding barrel is used for shielding external magnetic field interference; the temperature regulation subassembly, the temperature regulation subassembly is located the magnetism shielding bucket outside, and the temperature regulation subassembly is used for adjusting the ambient temperature of atomic magnetometer.

Furthermore, the temperature-adjustable stable field test system of the atomic magnetometer further comprises a pipeline, the temperature adjusting assembly comprises a temperature adjusting medium and a temperature adjusting unit, the temperature adjusting unit is used for adjusting the temperature of the temperature adjusting medium, and the temperature adjusting medium enters the heat preservation device through the pipeline to adjust the ambient temperature of the atomic magnetometer.

Furthermore, the temperature-adjustable stable field test system of the atomic magnetometer comprises a first pipeline and a second pipeline, wherein the first end of the first pipeline is connected with the temperature adjusting assembly, the second end of the first pipeline is connected with the heat preservation device, the first end of the second pipeline is connected with the temperature adjusting assembly, and the second end of the second pipeline is connected with the heat preservation device; the temperature adjusting assembly, the first pipeline, the heat preservation device and the second pipeline form a circulation loop of a temperature adjusting medium.

Further, the temperature adjusting medium includes a gas or a liquid.

Further, the heat preservation device still includes temperature sensor, and temperature sensor is located the heat preservation device, and temperature sensor is used for gathering the ambient temperature of atomic magnetometer in the heat preservation device in real time and feeding back the temperature value of gathering to the temperature regulation subassembly.

Further, the temperature adjusting component also comprises a temperature control unit, and the temperature control unit is used for controlling the temperature adjusting unit to adjust the temperature of the temperature adjusting medium according to the temperature value acquired and fed back by the temperature sensor in real time.

Furthermore, the material of the heat preservation device comprises high-low temperature resistant non-magnetic material.

Further, the pipeline comprises a high and low temperature resistant polyester hose.

Furthermore, the temperature-adjustable stable field test system of the atomic magnetometer further comprises a heat insulation layer, and the heat insulation layer is positioned on the outer surface of at least one of the heat insulation device and the pipeline.

Further, the material of the heat-insulating layer comprises a low-heat-conductivity-coefficient heat-insulating material.

By applying the technical scheme of the invention, the temperature-adjustable field stabilization test system of the atomic magnetometer is provided, and the temperature of the field stabilization test device of the atomic magnetometer is adjustable by configuring the heat preservation device and the temperature adjusting assembly, so that the field stabilization test of the atomic magnetometer can be carried out in a high-temperature or low-temperature environment. Compared with the prior art, the invention can solve the technical problem that the stable field test can not be carried out in a high-temperature or low-temperature environment due to the uncontrollable temperature of the atomic magnetometer testing device in the prior art.

Drawings

The accompanying drawings, which are included to provide a further understanding of the embodiments of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention. It is obvious that the drawings in the following description are only some embodiments of the invention, and that for a person skilled in the art, other drawings can be derived from them without inventive effort.

FIG. 1 is a schematic structural diagram illustrating an atomic magnetometer temperature adjustable steady field testing system provided in accordance with an embodiment of the present invention;

FIG. 2 shows a schematic diagram of a closed loop control system for main magnetic field current provided in accordance with a specific embodiment of the present invention;

FIG. 3 illustrates a schematic diagram of a magnetic field compensation closed-loop control system provided in accordance with a specific embodiment of the present invention.

Wherein the figures include the following reference numerals:

10. an atomic magnetometer; 20. a heat preservation device; 30. a magnetic shielding barrel; 40. a temperature regulating component; 50. a pipeline; 51. a first pipeline; 52. a second pipeline; 60. a temperature sensor.

Detailed Description

It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict. The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the invention, its application, or uses. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

It is noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of example embodiments according to the present application. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, and it should be understood that when the terms "comprises" and/or "comprising" are used in this specification, they specify the presence of stated features, steps, operations, devices, components, and/or combinations thereof, unless the context clearly indicates otherwise.

The relative arrangement of the components and steps, the numerical expressions and numerical values set forth in these embodiments do not limit the scope of the present invention unless specifically stated otherwise. Meanwhile, it should be understood that the sizes of the respective portions shown in the drawings are not drawn in an actual proportional relationship for the convenience of description. Techniques, methods, and apparatus known to those of ordinary skill in the relevant art may not be discussed in detail but are intended to be part of the specification where appropriate. In all examples shown and discussed herein, any particular value should be construed as merely illustrative, and not limiting. Thus, other examples of the exemplary embodiments may have different values. It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, further discussion thereof is not required in subsequent figures.

As shown in fig. 1, according to an embodiment of the present invention, there is provided an atomic magnetometer temperature-adjustable field stabilization test system, which includes an atomic magnetometer 10, a thermal insulation device 20, a magnetic shielding bucket 30, and a temperature adjustment assembly 40. The atomic magnetometer 10 is used for a stable field test of an environment to be tested; the atomic magnetometer 10 is positioned in the heat preservation device 20, and the heat preservation device 20 is used for maintaining the environmental temperature of the atomic magnetometer 10 constant; the heat preservation device 20 is positioned in the magnetic shielding barrel 30, and the magnetic shielding barrel 30 is used for shielding external magnetic field interference; the temperature adjusting assembly 40 is located outside the magnetic shield bucket 30, and the temperature adjusting assembly 40 is used to adjust the ambient temperature of the atomic magnetometer 10.

By applying the configuration mode, the temperature-adjustable stable field test system of the atomic magnetometer is provided, and the temperature of the stable field test device of the atomic magnetometer is adjustable by configuring the heat preservation device and the temperature adjusting assembly, so that the stable field test of the atomic magnetometer can be performed in a high-temperature or low-temperature environment. Compared with the prior art, the invention can solve the technical problem that the stable field test can not be carried out in a high-temperature or low-temperature environment due to the uncontrollable temperature of the atomic magnetometer testing device in the prior art.

As an embodiment of the present invention, in order to achieve the effect of insulating the environment of the internal atomic magnetometer 10 by the temperature insulating device 20 and simultaneously avoid the magnetic field interference caused by the material of the temperature insulating device 20 to the steady field test of the atomic magnetometer 10, the material of the temperature insulating device 20 may be configured to include a high-temperature and low-temperature resistant non-magnetic material.

Further, in the present invention, in order to facilitate the temperature adjustment assembly 40 to adjust the ambient temperature of the atomic magnetometer 10, the atomic magnetometer temperature adjustable steady field testing system can be further configured to include the pipeline 50, and the temperature adjustment assembly 40 can be configured to include a temperature adjusting medium and a temperature adjusting unit. The temperature adjusting unit is used for adjusting the temperature of a temperature adjusting medium, and the temperature adjusting medium enters the heat preservation device 20 through the pipeline 50 to adjust the ambient temperature of the atomic magnetometer 10. The ambient temperature of atomic magnetometer 10 can be adjusted between-40 ℃ and 70 ℃.

As a specific embodiment of the present invention, in order to adapt to the high or low temperature environment of the steady field test, the pipeline 50 may be configured to include a high and low temperature resistant polyester hose.

In addition, in the present invention, in order to realize the recycling of the temperature adjusting medium to reduce the resource waste, the temperature adjustable steady field test system of the atomic magnetometer is configured to include a first pipeline 51 and a second pipeline 52, a first end of the first pipeline 51 is connected to the temperature adjusting assembly 40, a second end of the first pipeline 51 is connected to the temperature keeping device 20, a first end of the second pipeline 52 is connected to the temperature adjusting assembly 40, and a second end of the second pipeline 52 is connected to the temperature keeping device 20; the temperature adjustment assembly 40, the first pipe 51, the temperature keeping device 20, and the second pipe 52 form a circulation circuit of the temperature adjustment medium.

As an embodiment of the present invention, a first end of the first pipeline 51 is connected to an outlet of the temperature adjustment assembly 40, a second end of the first pipeline 51 passes through a hole at the radial center of the magnetic shielding barrel 30 to be connected to a corresponding pipeline interface of the thermal insulation device 20, a first end of the second pipeline 52 is connected to an inlet of the temperature adjustment assembly 40, a second end of the second pipeline 52 passes through a hole at the radial center of the magnetic shielding barrel 30 to be connected to a corresponding pipeline interface of the thermal insulation device 20, and the temperature adjustment medium circulates in a loop formed by the temperature adjustment assembly 40, the first pipeline 51, the thermal insulation device 20 and the second pipeline 52.

With this arrangement, the temperature of the temperature adjusting medium circulated in the temperature adjusting unit 40 is adjusted by the temperature adjusting unit, and the temperature adjusting medium having a certain temperature is sent out from the temperature adjusting unit 40 and circulated into the temperature keeping device 20 along the first pipe 51 to adjust the ambient temperature of the atomic magnetometer 10 placed in the temperature keeping device 20, and then, the temperature adjusting medium is returned to the temperature adjusting unit 40 along the second pipe 52.

Further, in the present invention, a suitable temperature adjusting medium may be selected according to the actual situation of the steady field test. As a specific embodiment of the present invention, the temperature adjusting medium includes a gas or a liquid.

In addition, in the present invention, in order to be able to monitor the ambient temperature of the atomic magnetometer 10 in the temperature keeping device 20 in real time, the temperature keeping device 20 is configured to further include a temperature sensor 60, the temperature sensor 60 is located in the temperature keeping device 20, and the temperature sensor 60 is configured to collect the ambient temperature of the atomic magnetometer 10 in the temperature keeping device 20 in real time and feed back the collected temperature value to the temperature adjusting assembly 40. As a specific embodiment of the present invention, the temperature sensor 60 may be selected from a conventional PT100 temperature sensor 60.

Further, in the present invention, in order to realize the automatic adjustment of the temperature adjustment assembly 40, the temperature adjustment assembly 40 is configured to further include a temperature control unit, and the temperature control unit is configured to control the temperature adjustment unit to adjust the temperature of the temperature adjustment medium according to the temperature value collected and fed back by the temperature sensor 60 in real time.

In addition, in the present invention, in order to reduce the temperature exchange between the stable field test system and the outside, the temperature-adjustable stable field test system of the atomic magnetometer is further configured to include an insulating layer on an outer surface of at least one of the insulating device 20 and the pipeline 50. As an embodiment of the invention, the material of the insulating layer comprises a low-heat-conductivity insulating material.

Further, in the present invention, the atomic magnetometer 10 and the temperature sensor 60 can be fixed inside the thermal insulation box by clips, the bottom of the thermal insulation box is provided with an installation interface fixed inside the magnetic shielding barrel 30, and the fixed connection between the above components can avoid displacement and collision of each component during the field stabilization test.

In addition, in the present invention, as shown in fig. 2 and 3, in order to provide a highly accurate and stable magnetic field to the atomic magnetometer 10, closed-loop stability control is performed on the main magnetic field current, and magnetic field compensation is performed by energizing the compensation coil. Specifically, a closed-loop stable control of the main magnetic field current is formed through a first PID controller, a first high-precision current source, a main coil and an ammeter, and a closed-loop control of the compensation magnetic field is formed through a second PID controller, a second high-precision current source, a compensation coil and an optical pump magnetometer. Through the two closed-loop controls, a high-precision and high-stability magnetic field can be provided for the atomic magnetometer 10, the magnetic field intensity is 10000nT to 80000nT, and the static peak-to-peak noise is lower than 8 pT.

For further understanding of the present invention, the temperature-adjustable field-stabilizing test system of the atomic magnetometer is described in detail below with reference to fig. 1 to 3.

As shown in fig. 1 to 3, according to an embodiment of the present invention, there is provided an atomic magnetometer temperature-adjustable field stabilization test system, which specifically includes an atomic magnetometer 10, a thermal insulation device 20, a magnetic shielding barrel 30, and a temperature adjustment assembly 40. The atomic magnetometer 10 is located in the heat preservation device 20, and the heat preservation device 20 is used for maintaining the ambient temperature of atomic magnetometer 10 invariable, and the heat preservation device 20 is located magnetic shielding bucket 30, and temperature regulation subassembly 40 is located the outside of magnetic shielding bucket 30, and temperature regulation subassembly 40 is used for adjusting the ambient temperature of atomic magnetometer 10.

The temperature-adjustable stable field test system of the atomic magnetometer further comprises a first pipeline 51 and a second pipeline 52, wherein the first end of the first pipeline 51 is connected with the temperature adjusting component 40, the second end of the first pipeline 51 is connected with the heat preservation device 20, the first end of the second pipeline 52 is connected with the temperature adjusting component 40, and the second end of the second pipeline 52 is connected with the heat preservation device 20.

The temperature adjusting assembly 40 includes a temperature adjusting medium and a temperature adjusting unit, and the temperature adjusting medium is a gas. The temperature adjusting unit is used for adjusting the temperature of the gas, and the gas enters the heat preservation device 20 through the pipeline 50 to adjust the ambient temperature of the atomic magnetometer 10. The temperature regulation assembly 40, the first pipe 51, the thermal insulation means 20 and the second pipe 52 form a circulation circuit for the gas.

The heat preservation device 20 further comprises a temperature sensor 60, the temperature sensor 60 is located in the heat preservation device 20, and the temperature sensor 60 is used for collecting the ambient temperature of the atomic magnetometer 10 in the heat preservation device 20 in real time and feeding back the collected temperature value to the temperature adjusting assembly 40.

The temperature adjustment assembly 40 further comprises a temperature control unit for controlling the temperature adjustment unit to adjust the temperature of the gas according to the temperature value collected and fed back by the temperature sensor 60 in real time.

In this embodiment, the gas is first temperature-regulated in the temperature regulation assembly 40, the gas having a certain temperature is introduced into the temperature maintenance device 20 along the first pipe 51, and the ambient temperature of the atomic magnetometer 10 placed in the temperature maintenance device 20 is further regulated, and then, the gas is returned to the temperature regulation assembly 40 along the second pipe 52. The temperature sensor 60 in the temperature holding device 20 collects the ambient temperature of the atomic magnetometer 10 in real time and feeds the ambient temperature back to the temperature adjusting assembly 40. When the ambient temperature of the atomic magnetometer 10 is higher than the desired steady field test temperature, the temperature adjusting unit in the temperature adjusting assembly 40 decreases the ambient temperature of the atomic magnetometer 10 by decreasing the temperature of the gas and maintains the ambient temperature at the desired steady field test temperature; when the ambient temperature of atomic magnetometer 10 is below the desired steady field test temperature, the temperature regulating unit within temperature regulating assembly 40 causes the ambient temperature of atomic magnetometer 10 to be increased and maintained at the desired steady field test temperature by increasing the temperature of the gas.

In summary, the invention provides a temperature-adjustable field stabilization test system for an atomic magnetometer, which realizes temperature adjustment of the field stabilization test device for the atomic magnetometer by configuring a heat preservation device and a temperature adjustment assembly, so that field stabilization test of the atomic magnetometer can be performed in a high-temperature or low-temperature environment. Compared with the prior art, the invention can solve the technical problem that the stable field test can not be carried out in a high-temperature or low-temperature environment due to the uncontrollable temperature of the atomic magnetometer testing device in the prior art.

Spatially relative terms, such as "above … …," "above … …," "above … …," "above," and the like, may be used herein for ease of description to describe one device or feature's spatial relationship to another device or feature as illustrated in the figures. It will be understood that the spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. For example, if a device in the figures is turned over, devices described as "above" or "on" other devices or configurations would then be oriented "below" or "under" the other devices or configurations. Thus, the exemplary term "above … …" can include both an orientation of "above … …" and "below … …". The device may be otherwise variously oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.

It should be noted that the terms "first", "second", and the like are used to define the components, and are only used for convenience of distinguishing the corresponding components, and the terms have no special meanings unless otherwise stated, and therefore, the scope of the present invention should not be construed as being limited.

The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.