阅读说明：本技术 适配器的测试方法、装置、设备及存储介质 (adapter test method, device, equipment and storage medium ) 是由 田晨 于 2018-09-30 设计创作，主要内容包括：一种适配器的测试方法、装置、设备及存储介质,其中,方法包括：检测适配器中器件的温度(S101)；根据适配器中器件的温度判断适配器是否处于温度平衡状态(S102)；如果处于温度平衡状态,则提升适配器所处环境的环境温度(S103)；检测适配器的输出功率,并判断在器件的温度达到第一预设温度阈值之前,适配器是否出现降功率操作(S104)；如果未出现降功率操作,则判断适配器测试失败(S105)。该方法在适配器的测试过程中考虑温度因素,检测适配器是否存在过温保护机制,确保了通过检测后的适配器的安全性和可靠性。(A test method, a device, equipment and a storage medium of an adapter are provided, wherein the method comprises the following steps: detecting the temperature of a device in the adapter (S101); judging whether the adapter is in a temperature balance state or not according to the temperature of the device in the adapter (S102); if the temperature is in the equilibrium state, the environmental temperature of the environment where the adapter is located is increased (S103); detecting the output power of the adapter, and judging whether the adapter has power reduction operation before the temperature of the device reaches a first preset temperature threshold value (S104); if the power-down operation does not occur, it is judged that the adapter test failed (S105). According to the method, temperature factors are considered in the test process of the adapter, whether an over-temperature protection mechanism exists in the adapter is detected, and the safety and reliability of the adapter passing the detection are ensured.)

1. a method for testing an adapter, comprising:

Detecting the temperature of a device in the adapter;

judging whether the adapter is in a temperature balance state or not according to the temperature of the device in the adapter;

If the temperature is in the temperature equilibrium state, increasing the ambient temperature of the environment where the adapter is located;

Detecting the output power of the adapter, and judging whether the adapter has power reduction operation before the temperature of the device reaches a first preset temperature threshold value; and

And if the power-down operation does not occur, judging that the adapter test fails.

2. The method for testing an adapter of claim 1, further comprising, prior to said detecting a temperature of a device in the adapter:

And controlling the adapter to carry out full load output.

3. the method of testing an adapter of claim 1, wherein the initial value of the ambient temperature is 38-42 degrees.

4. The method for testing an adapter according to claim 1, wherein a temperature sensor is provided in the adapter, and the adapter is powered down when the temperature detected by the temperature sensor reaches a second preset temperature threshold, wherein the second preset temperature threshold is smaller than the first preset temperature threshold.

5. the method of testing an adapter of claim 1, wherein said adapter is disposed in an incubator, said incubator providing said ambient temperature.

6. An apparatus for testing an adapter, comprising:

A temperature detector for detecting a temperature of a device in the adapter;

A power detector for detecting an output power of the adapter;

an environment temperature regulator for regulating the environment temperature of the environment in which the adapter is located;

And the controller is used for controlling the adapter to enter a full-load output state, judging whether the adapter is in a temperature balance state according to the temperature of the devices in the adapter, controlling the environment temperature regulator to increase the environment temperature when the adapter is judged to be in the temperature balance state, and judging whether the adapter performs power reduction operation before the temperature of the devices in the adapter reaches a first preset temperature threshold value.

7. The apparatus of claim 6, wherein the ambient temperature regulator is further to:

The initial value of the ambient temperature is set to 38-42 degrees.

8. The apparatus of claim 6, wherein the controller is further configured to:

And when the temperature detected by the temperature detector reaches a second preset temperature threshold value, performing power reduction operation on the adapter, wherein the second preset temperature threshold value is smaller than the first preset temperature threshold value.

9. An electronic device, comprising: memory, processor and computer program stored on the memory and executable on the processor, which when executing the program, implements the method of testing an adapter according to any of claims 1-5.

10. A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out a method for testing an adapter according to any one of claims 1 to 5.

Technical Field

The present application relates to the field of electronic devices, and in particular, to a method, an apparatus, a device, and a storage medium for testing an adapter.

Background

At present, an adapter is widely applied to the field of charging of electrical equipment, and alternating current can be converted into direct current which accords with the work of electric equipment through the adapter. It will be appreciated that testing of the performance of the adapter is required during the development stage to ensure that the adapter meets the relevant standards and requirements in actual use.

Drawings

The foregoing and/or additional aspects and advantages of the present application will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:

Fig. 1 is a schematic flowchart of a method for testing an adapter according to an embodiment of the present disclosure;

Fig. 2 is a schematic structural diagram of a testing apparatus for an adapter according to an embodiment of the present disclosure;

FIG. 3 is a schematic structural diagram of an electronic device according to an embodiment of the present application; and

Fig. 4 is a schematic structural diagram of an electronic device according to another embodiment of the present application.

Detailed Description

reference will now be made in detail to embodiments of the present application, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary and intended to be used for explaining the present application and should not be construed as limiting the present application.

The embodiment of the application provides a testing method of an adapter, aiming at the technical problem that whether the adapter can automatically realize over-temperature protection when the temperature is too high cannot be tested when the adapter is tested in the related technology.

According to the test method of the adapter, the temperature of each main device in the adapter is detected, when the temperature of each device is in a balance state and does not reach a set safety threshold, the environment temperature is increased so that the temperature of the adapter reaches the set safety threshold, and then whether the adapter has power reduction protection operation or not is detected, so that an over-temperature protection mechanism of the adapter is detected.

The following describes a test method, device and equipment of an adapter according to an embodiment of the present application with reference to the drawings.

the test method of the adapter provided by the embodiment of the present application can be executed by the test device of the adapter provided by the embodiment of the present application, and the device is used for realizing the test of the adapter.

fig. 1 is a schematic flowchart of a method for testing an adapter according to an embodiment of the present application, where as shown in fig. 1, the method for testing an adapter includes the following steps:

step 101, detecting the temperature of the device in the adapter.

Specifically, when the adapter is tested, a load is connected to the adapter, so that the adapter enters a normal charging mode to test working parameters of the adapter, such as output voltage, output current, output power, and device temperature in the adapter in practical application, wherein the load may be an electric device such as a mobile phone, or a test device such as a charging trap. For example, when the adapter is a flash charging source adapter, the adapter may be connected to a mobile phone and controlled to enter a fast charging mode, so as to detect operating parameters such as an output voltage, an output current, an output power, and a device temperature in the adapter of the flash charging source adapter in the fast charging mode.

it should be noted that, in order to make the temperature of the device in the adapter quickly approach the safe temperature threshold value, shorten the test time, the adapter can be controlled to perform full output, when the adapter is fully output, the heating value of the adapter is increased, and further, the device in the adapter easily reaches the safe temperature threshold value. And when the device in the adapter is close to the safe temperature threshold, the working parameters such as the output voltage and the output current of the adapter in the current state can be tested, so that the performance of the adapter under high temperature and high load can be detected, and the reliability of the test can be improved.

It can be understood that, in order to improve the accuracy of the test and avoid the influence of the external temperature change on the working parameters of the detection adapter, the adapter needs to be placed in a stable environment temperature as a possible implementation manner, the adapter can be placed in an incubator for testing, and the initial value of the environment temperature during the test is set by the incubator, for example, the air in the hot air blower heating box of the incubator is set to 38-42 ℃.

When the temperature of the device is detected specifically, the temperature of each device in the adapter can be detected in different modes according to different practical applications.

As a possible implementation manner, each main device in the adapter and the testing device of the adapter are connected through a temperature sensing line, when the temperature of each device rises and a temperature gradient exists between each device and the other end of the corresponding temperature sensing line, each temperature sensing line generates current due to thermal electromotive force existing at the two ends, and then the testing device of the adapter acquires the current generated in each temperature sensing line and determines the temperature of each main device according to the mapping relation between the current and the temperature. The main devices connected to the temperature sensing line may include field effect transistors, transformers, capacitors, and Micro Control Units (MCU) in the adapter.

As another possible implementation manner, when the temperature of each device in the adapter cannot be simultaneously tested, a temperature sensor may be disposed in the adapter, the temperature sensor may detect devices, such as the micro control unit, whose working parameters are easily affected by the temperature, and after the temperature sensor detects the temperature of the device, the obtained data is sent to the testing device of the adapter.

And 102, judging whether the adapter is in a temperature balance state or not according to the temperature of the device in the adapter.

The temperature equilibrium state refers to that the temperature of the device in the adapter is kept constant within a preset time, or the temperature changes within a set range, for example, when the temperature change of the device in the adapter is less than 1 ℃ in a half hour, the adapter is determined to be in the temperature equilibrium state.