阅读说明：本技术 一种大气暴晒样品测厚装置及方法 (Atmospheric exposure sample thickness measuring device and method ) 是由 李伟光 潘吉林 楚鹰军 鹿中晖 夏永生 李英志 于 2021-07-19 设计创作，主要内容包括：本发明提供一种大气暴晒样品测厚装置及方法,所述大气暴晒样品测厚装置包括辅助定位装置、测厚传感器和多个光束发射装置；所述辅助定位装置具有上开口的放置槽,所述放置槽用于放置样品；所述多个光束发射装置分为两组；两组光束发射装置均安装在辅助定位装置的侧壁上,并且两组光束发射装置的发射光朝向不同,使得两组光束发射装置的发射光在样品表面交汇后形成若干个光交叉定位点；所述测厚传感器用于对光交叉定位点处的样品进行测厚。本发明可以不破坏样品表面状态情况下进行测厚点准确定位,可以保证样品腐蚀减薄速率的准确性。(The invention provides a device and a method for measuring thickness of an atmospheric exposure sample, wherein the device for measuring thickness of the atmospheric exposure sample comprises an auxiliary positioning device, a thickness measuring sensor and a plurality of light beam emitting devices; the auxiliary positioning device is provided with a placing groove with an upper opening, and the placing groove is used for placing a sample; the plurality of light beam emitting devices are divided into two groups; the two groups of light beam emitting devices are arranged on the side wall of the auxiliary positioning device, and the emitting light directions of the two groups of light beam emitting devices are different, so that the emitting light of the two groups of light beam emitting devices forms a plurality of light cross positioning points after meeting on the surface of the sample; the thickness measuring sensor is used for measuring the thickness of the sample at the optical cross positioning point. The invention can accurately position the thickness measuring point without damaging the surface state of the sample, and can ensure the accuracy of the corrosion thinning rate of the sample.)

1. The thickness measuring device for the atmosphere exposed sample is characterized by comprising an auxiliary positioning device (1), a thickness measuring sensor (2) and a plurality of light beam emitting devices (3);

the auxiliary positioning device (1) is provided with a placing groove with an upper opening, and the placing groove is used for placing a sample (4);

the plurality of light beam emitting devices (3) are divided into two groups; the two groups of light beam emitting devices (3) are arranged on the side wall (11) of the auxiliary positioning device (1), and the emitting light directions of the two groups of light beam emitting devices (3) are different, so that a plurality of light cross positioning points (41) are formed after the emitting light of the two groups of light beam emitting devices (3) is converged on the surface of the sample (4);

the thickness measuring sensor (2) is used for measuring the thickness of the sample (4) at the light cross positioning point (41).

2. The atmospheric insolation sample thickness measuring apparatus according to claim 1, characterized in that the side wall (11) of the auxiliary positioning device (1) has a plurality of mounting holes (12); the plurality of light beam emitting devices (3) are respectively installed in the plurality of installation holes (12).

3. The atmospheric insolation sample thickness measuring apparatus according to claim 2, wherein the plurality of light beam emitting devices (3) are movable up and down in the mounting hole (12) for adjusting the center of the emitted light of the plurality of light beam emitting devices (3) to be in the same plane as the surface of the sample (4).

4. The atmospheric insolation sample thickness measuring apparatus according to claim 3, characterized in that the light beam emitting device (3) adjusted in position in the mounting hole (12) is fixed by a bolt.

5. The atmospheric insolation sample thickness measuring apparatus according to claim 1, characterized in that the emitted light of the two sets of light beam emitting devices (3) are perpendicular to each other and the respective light beam emitting devices (3) in the two sets are equally spaced.

6. Atmospheric exposure sample thickness measuring device according to claim 5, characterized in that the side walls (11) of the auxiliary positioning device (1) are rectangular in plan view; two groups of light beam emitting devices (3) are respectively arranged on two adjacent side walls (11) of the auxiliary positioning device (1).

7. Atmospheric exposure sample thickness measuring device according to claim 1, characterized in that the placement tank is form-matched to the sample (4) placed therein.

8. The atmospheric insolation sample thickness measuring apparatus according to claim 1, characterized in that the light beam emitting device (3) is an infrared light emitting device.

9. Atmospheric insolation sample thickness measuring device according to claim 1, characterized in that there is a support body (13) below the auxiliary positioning device (1).

10. An atmospheric exposure sample thickness measuring method, which is realized by the atmospheric exposure sample thickness measuring device according to any one of claims 1 to 9, and comprises the following steps:

step S1, placing the sample (4) in the placing groove of the auxiliary positioning device (1);

step S2, two groups of light beam emitting devices (3) are installed in the installation holes (12) of the auxiliary positioning device (1);

step S3, turning on the light beam emitting device (3), and adjusting the height position of the light beam emitting device (3) according to the surface position of the sample (4) to enable the emitted light of the light beam emitting device (3) and the surface of the sample (4) to be in the same plane; after the adjustment is in place, the light beam emitting device (3) is fixed;

step S4, the emitted light of the two groups of light beam emitting devices (3) forms a plurality of light cross positioning points (41) after meeting on the surface of the sample (4);

step S5, measuring the thickness of the light cross positioning points (41) one by adopting a thickness measuring sensor (2), and recording the sample thickness measurement data before exposure;

step S6, the thickness measuring sensor (2) is collected, the light beam emitting device (3) is closed, and the sample (4) is taken out for insolation;

step S7, the sample (4) after being exposed for a certain time is executed again according to the step S1-step S6, and thickness measurement data of the exposed sample are obtained; and obtaining the thickness reduction amount of the sample according to the thickness measurement data of the sample before and after the exposure, and obtaining the corrosion reduction speed of the sample according to the ratio of the thickness reduction amount of the sample to the exposure time.

Technical Field

The invention relates to the technical field of corrosion and protection of natural environment, in particular to a device and a method for measuring thickness of an atmospheric insolation sample.

Background

The corrosion rate is generally measured by a corrosion weight loss test and is expressed as a corrosion thinning rate by conversion. The atmospheric exposure test is that the material is placed in a specified exposure field, and after a certain exposure period, the corrosion weight loss condition of the material is measured and converted into the corrosion thinning rate.

The method of randomly measuring and averaging the reduced thickness of the insolation sample is adopted, and the measuring position is not fixed.

For the method of coating thickness measurement, 5 points are required in a certain area in the relevant standard, 3 times of each electrical measurement is averaged, and the position of the thickness measurement point is not fixed.

Disclosure of Invention

The invention aims to provide a device and a method for measuring thickness of an atmospheric insolation sample, which aim to solve the problem of accurate positioning of a thickness measuring point.

The invention provides a thickness measuring device for an atmospheric exposure sample, which comprises an auxiliary positioning device, a thickness measuring sensor and a plurality of light beam emitting devices, wherein the auxiliary positioning device is used for positioning the atmospheric exposure sample;

the auxiliary positioning device is provided with a placing groove with an upper opening, and the placing groove is used for placing a sample;

the plurality of light beam emitting devices are divided into two groups; the two groups of light beam emitting devices are arranged on the side wall of the auxiliary positioning device, and the emitting light directions of the two groups of light beam emitting devices are different, so that the emitting light of the two groups of light beam emitting devices forms a plurality of light cross positioning points after meeting on the surface of the sample;

the thickness measuring sensor is used for measuring the thickness of the sample at the optical cross positioning point.

Further, a plurality of mounting holes are formed in the side wall of the auxiliary positioning device; the plurality of light beam emitting devices are respectively installed in the plurality of installation holes.

Further, the plurality of light beam emitting devices can move up and down in the mounting hole, and the center of the emitted light of the plurality of light beam emitting devices is adjusted to be in the same plane with the surface of the sample.

Further, the light beam emitting device adjusted in position in the mounting hole is fixed by a bolt.

Further, the emitted light of the two sets of light beam emitting devices are perpendicular to each other, and the intervals between the light beam emitting devices in the two sets are the same.

Preferably, the side wall of the auxiliary positioning device is rectangular in plan view; two groups of light beam emitting devices are respectively arranged on two adjacent side walls of the auxiliary positioning device.

Further, the placement groove is matched with the shape of the sample placed therein.

Preferably, the light beam emitting device is an infrared light emitting device.

Furthermore, a support body is arranged below the auxiliary positioning device.

The invention also provides an atmospheric exposure sample thickness measuring method which is realized by adopting the atmospheric exposure sample thickness measuring device and comprises the following steps:

step S1, placing a sample in a placing groove of the auxiliary positioning device;

step S2, two groups of light beam emitting devices are arranged in the mounting holes of the auxiliary positioning device;

step S3, turning on the light beam emission device, and adjusting the height position of the light beam emission device according to the surface position of the sample to make the emitted light of the light beam emission device and the surface of the sample in the same plane; after the light beam emitting device is adjusted in place, the light beam emitting device is fixed;

step S4, the emitted light of the two groups of light beam emitting devices forms a plurality of light cross positioning points after meeting on the surface of the sample;

step S5, adopting thickness measuring sensors to measure the thickness of the optical cross positioning points one by one, and recording the sample thickness measurement data before exposure;

step S6, collecting the thickness measuring sensor, closing the light beam emitting device and taking out the sample for insolation;

step S7, executing the sample after being exposed for a certain time according to the step S1-step S6 again, and obtaining thickness measuring data of the exposed sample; and obtaining the thickness reduction amount of the sample according to the thickness measurement data of the sample before and after the exposure, and obtaining the corrosion reduction speed of the sample according to the ratio of the thickness reduction amount of the sample to the exposure time.

In summary, due to the adoption of the technical scheme, the invention has the beneficial effects that:

1. the invention can accurately position the thickness measuring point without damaging the surface state of the sample, and can ensure the accuracy of the corrosion thinning rate of the sample.

2. The method can calculate the corrosion thinning speed of the sample through two simple thickness measurements, and can find the position corresponding to the maximum corrosion thinning rate and the minimum corrosion thinning rate of the sample from the thickness measurement data corresponding to each optical cross positioning point, thereby having practical significance for engineering application.

3. The invention provides higher precision requirement for sample processing, and has reverse promotion effect on the precision processing of the insolation sample.

4. The method is beneficial to further improving the efficiency of sample thickness measurement, and promoting the sample thickness measurement to realize mechanized operation and develop towards the direction of the Internet of things.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention, and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.

Fig. 1 is a side view of an auxiliary positioning device in an atmospheric exposure sample thickness measuring device according to an embodiment of the present invention.

Fig. 2 is a top view of an auxiliary positioning device in an atmospheric exposure sample thickness measuring device according to an embodiment of the invention.

Fig. 3 is a schematic diagram of a light beam emitting device in an atmosphere exposure sample thickness measuring device according to an embodiment of the invention.

Fig. 4 is a schematic diagram of a thickness measuring sensor in an atmospheric exposure sample thickness measuring device for measuring the thickness of a sample according to an embodiment of the invention.

Fig. 5 is a schematic diagram of forming an optical cross positioning point in an atmospheric exposure sample thickness measuring device according to an embodiment of the invention.

Fig. 6 is a flowchart of a method for measuring thickness of an atmospheric exposure sample according to an embodiment of the present invention.

Icon: 1-auxiliary positioning device, 11-side wall, 12-mounting hole, 13-support, 2-thickness measuring sensor, 3-light beam emitting device, 31-light emitting point, 4-sample and 41-light cross positioning point.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. The components of embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.

Thus, the following detailed description of the embodiments of the present invention, presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Examples

As shown in fig. 1, fig. 2, fig. 3, and fig. 4, the present embodiment provides an atmospheric insolation sample thickness measuring apparatus, which includes an auxiliary positioning device 1, a thickness measuring sensor 2, and a plurality of light beam emitting devices 3;

the auxiliary positioning device 1 is provided with a placing groove with an upper opening, and the placing groove is used for placing a sample 4;

the plurality of light beam emitting devices 3 are divided into two groups; the two groups of light beam emitting devices 3 are both installed on the side wall 11 of the auxiliary positioning device 1, and the emitting light directions of the two groups of light beam emitting devices 3 are different, so that the emitting light of the two groups of light beam emitting devices 3 forms a plurality of light cross positioning points 41 after meeting on the surface of the sample 4, as shown in fig. 5;

the thickness measuring sensor 2 is used for measuring the thickness of the sample 4 at the light intersection positioning point 41.

As shown in fig. 1 and 2, the side wall 11 of the auxiliary positioning device 1 has a plurality of mounting holes 12; the plurality of light beam emitting devices 3 are respectively installed in the plurality of installation holes 12.

The plurality of light beam emitting devices 3 can move up and down in the mounting holes 12 and are used for adjusting the centers of the emitted light of the plurality of light beam emitting devices 3 to be in the same plane with the surface of the sample 4 so as to obtain more accurate thickness measurement data of the sample 4. The light beam emitting device 3 adjusted in place in the mounting hole 12 needs to be fixed, and the light beam emitting device 3 can be fixed by bolts.

In general, the emitted light of the two sets of light beam emitting devices 3 are perpendicular to each other, and the distances between the light beam emitting devices 3 in the two sets are the same, so that the formed light intersecting location points 41 are also uniformly distributed. The side wall 11 of the auxiliary positioning device 1 is rectangular in plan view; two sets of light beam emitting devices 3 are respectively installed on two adjacent side walls 11 of the auxiliary positioning device 1, as shown in fig. 5. The side wall 11 of the auxiliary positioning device 1 may be circular, elliptical, polygonal, irregular, etc. in plan view, and only the emitted light of the two sets of light beam emitting devices 3 need to be perpendicular to each other to form a plurality of light intersecting positioning points 41 which are uniformly distributed.

Further, the placing groove is matched with the shape of the sample 4 placed in the placing groove, so that the sample 4 placed in the placing groove is at the same position every time, the thickness measuring data of the sample 4 at the same light intersection positioning point 41 before and after exposure correspond, and the accuracy of the corrosion thinning rate of the sample 4 is improved.

Preferably, the light beam emitting device 3 is an infrared light emitting device, and as shown in fig. 3, the light emitting spot 31 of the light beam emitting device 3 is at the center position thereof.

Still further, the auxiliary positioning device 1 is provided with a support body 13 below, so that the auxiliary positioning device 1 can be placed on a test platform conveniently.

Based on the atmospheric exposure sample thickness measuring device, the working principle of the atmospheric exposure sample thickness measuring device is detailed by an atmospheric exposure sample thickness measuring method realized by the atmospheric exposure sample thickness measuring device. As shown in fig. 6, the method for measuring the thickness of the atmosphere exposure sample is realized by using the apparatus for measuring the thickness of the atmosphere exposure sample 4 according to any one of claims 1 to 9, and comprises the following steps:

step S1, placing the sample 4 in the placement groove of the auxiliary positioning device 1, wherein the auxiliary positioning device 1 with the rectangular side wall 11 in the top view is adopted in the embodiment, as shown in fig. 2;

step S2, mounting two groups of light beam emitting devices 3 in the mounting holes 12 of the auxiliary positioning device 1; as shown in fig. 1 and 2;

step S3, turning on the light beam emitting device 3, and adjusting the height position of the light beam emitting device 3 according to the surface position of the sample 4, so that the emitted light of the light beam emitting device 3 and the surface of the sample 4 are in the same plane; after the light beam emitting device 3 is adjusted in place, fixing the light beam emitting device;

step S4, the emitted light of the two sets of light beam emitting devices 3 forms a plurality of light intersecting positioning points 41 after meeting on the surface of the sample 4, as shown in fig. 5;

step S5, as shown in FIG. 4, measuring the thickness of the light cross positioning points 41 one by using the thickness measuring sensors 2, and recording the thickness measuring data of the sample 4 before exposure;

step S6, the thickness measuring sensor 2 is collected, the light beam emitting device 3 is closed, and the sample 4 is taken out for insolation;

step S7, the sample 4 after being exposed for a certain time is executed again according to the step S1-step S6, and thickness measurement data of the exposed sample are obtained; and obtaining the thickness reduction amount of the sample according to the thickness measurement data of the sample before and after the exposure, and obtaining the corrosion reduction speed of the sample 4 according to the ratio of the thickness reduction amount of the sample to the exposure time.

Therefore, the atmospheric exposure sample thickness measuring device provided by the invention provides the positioning of the thickness measuring points (namely the light cross positioning point 41) before and after exposure for the sample 4, and the corrosion and thinning speed of the sample can be calculated by measuring the thickness of the sample 4 before and after exposure twice. The invention has the following technical effects:

1. the invention can accurately position the thickness measuring point without damaging the surface state of the sample 4, and can ensure the accuracy of the corrosion thinning rate of the sample.

2. According to the invention, the corrosion thinning speed of the sample 4 can be calculated through simple two-time thickness measurement, and the positions corresponding to the maximum corrosion thinning rate and the minimum corrosion thinning rate of the sample 4 can be found from the thickness measurement data corresponding to each optical cross positioning point 41, so that the method has practical significance for engineering application.

3. The invention provides higher precision requirement for the processing of the sample 4, and has reverse promotion effect on the precision processing of the insolation sample 4.

4. The method is beneficial to further improving the efficiency of thickness measurement of the sample 4, and promoting the thickness measurement of the sample 4 to realize mechanical operation and develop towards the direction of the Internet of things.

The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.