阅读说明：本技术 波长测量装置及方法 (Wavelength measuring device and method ) 是由 张建伟 施文心 于 2021-09-26 设计创作，主要内容包括：本申请涉及一种波长测量装置及方法。波长测量装置包括激光发射器、光开关装置和波长计。所述光开关装置包括光输出口和多个光输入口,所述激光发射器与所述多个光输入口连接,所述光开关装置用于切换所述多个光输入口的导通状态。所述波长计与所述光输出口连接。所述波长测量装置克服在原来的实验中,如果需要测量多个光学信号的波长,需要手动切换多个输入信号来实现多个波长测量的问题。使用本申请的波长测量装置及方法,在实验过程中无需拆装波长计输入端,提高科研过程中的效率,减少了激光在空气中非固定光路传播的机会。(The application relates to a wavelength measuring device and method. The wavelength measuring device comprises a laser transmitter, an optical switch device and a wavelength meter. The optical switch device comprises an optical output port and a plurality of optical input ports, the laser transmitter is connected with the plurality of optical input ports, and the optical switch device is used for switching the conduction states of the plurality of optical input ports. The wavelength meter is connected with the optical output port. The wavelength measuring device overcomes the problem that in the original experiment, if the wavelength of a plurality of optical signals needs to be measured, a plurality of input signals need to be manually switched to realize the measurement of the plurality of wavelengths. By using the wavelength measuring device and method, the input end of the wavelength meter does not need to be disassembled and assembled in the experimental process, the efficiency in the scientific research process is improved, and the chance of non-fixed light path transmission of laser in the air is reduced.)

1. A wavelength measuring device, comprising:

a laser transmitter (100);

an optical switching device (200) comprising an optical output port (210) and a plurality of optical input ports (220), the laser transmitter (100) being connected to the plurality of optical input ports (220), the optical switching device (200) being adapted to switch the plurality of optical input ports (220) to a conducting state; and

and a wavelength meter (300) connected to the optical output port (210).

2. The wavelength measurement device of claim 1, comprising:

and the control device (400) is connected with the optical switch device (200) and is used for switching the conduction states of the plurality of optical input ports (220) through the optical switch device (200).

3. The wavelength measurement device according to claim 2, wherein the control device comprises:

the single chip microcomputer (410), the said single chip microcomputer (410) is connected with the said photoswitch device (200);

and the computer (420) is connected with the single chip microcomputer (410), and the computer (420) controls the optical switch device (200) to switch the conduction states of the plurality of optical input ports (210) through the single chip microcomputer (410).

4. The wavelength measuring device according to claim 3, characterized in that the single-chip microcomputer (410) is connected to the laser transmitter (100) for adjusting the frequency of the laser transmitter (100).

5. A wavelength measuring device according to claim 3, characterized in that said computer (420) is connected to said wavelength meter (300) for calibrating said wavelength meter (300).

6. A wavelength measuring device according to claim 1, characterized in that each of said optical input ports (220) is provided with a first coupler (610), said laser transmitter (100) being connected to said optical switching device (200) through said first coupler (610).

7. A wavelength measuring device according to claim 1, characterized in that said optical output (210) is provided with a second coupler (620), said wavelength meter (300) being connected to said optical switching device (200) through said second coupler (620).

8. A method of wavelength measurement employing the wavelength measurement device of claim 1, wherein the laser transmitter (100) comprises a first laser (110), the method comprising:

s10, selecting the first laser output by the first laser (110);

and S20, controlling the optical switch device (200) to switch the optical input port (220) corresponding to the first laser to be conductive.

9. The method of wavelength measurement according to claim 8, wherein the wavelength measurement device further comprises a control device (400), the control device (400) being connected to the optical switching device (200), the laser transmitter (100) and the wavemeter (300), respectively, the method comprising:

and S30, the control device (400) compares the first wavelength value of the first laser light measured by the wavelength meter (300) with a first standard value, and if the first comparison result is outside a first preset range, the control device adjusts the wavelength of the first laser light output by the first laser (110).

10. The method of wavelength measurement according to claim 8, wherein the laser transmitter (100) further comprises a second laser (120) comprising:

s11, selecting a second laser output by the second laser (120), wherein the stability of the second laser is higher than that of the first laser;

s12, the control device (400) compares the second wavelength value of the second laser measured by the wavelength meter (300) with a second standard value, and if the second comparison result is outside a second preset range, the wavelength meter (300) is calibrated.

Technical Field

The present application relates to the field of measurement, and more particularly, to a device and method for wavelength measurement.

Background

In the fields of basic scientific research, precision measurement, measurement and the like, the wavelength measurement of continuous wave and pulse lasers is greatly required. Wavemeters are designed specifically for wavelength measurement with continuous wave and pulsed lasers, and are devices with extremely high accuracy and measurement rate.

In the use process of the wavelength meter, if the wavelength of a plurality of optical signals needs to be measured, the plurality of input signals need to be manually switched to realize the measurement of the plurality of wavelengths, which brings great inconvenience to the measurement work. The input connecting end of the wavelength meter is frequently disassembled and assembled, so that the chance of the propagation of the laser in the air through the non-fixed optical path is increased.

Disclosure of Invention

In view of the above, it is necessary to provide a wavelength measurement apparatus and method, which solve the problem that the wavelength observation needs to be performed by manually switching the input terminal of the wavelength meter when measuring a plurality of optical signals and a plurality of wavelengths.

A wavelength measuring device includes a laser transmitter, an optical switching device, and a wavelength meter. The optical switch device comprises an optical output port and a plurality of optical input ports, the laser transmitter is connected with the plurality of optical input ports, and the optical switch device is used for switching the conduction states of the plurality of optical input ports. The wavelength meter is connected with the optical output port.

In one embodiment, the wavelength measuring device comprises a control device. The control device is connected with the optical switch device and used for switching the conduction states of the plurality of optical input ports through the optical switch device.

In one embodiment, the control device comprises a single chip microcomputer and a computer. The single chip microcomputer is connected with the optical switch device. The computer is connected with the single chip microcomputer, and the computer controls the optical switch device to switch the conduction state of the plurality of optical input ports through the single chip microcomputer.

In one embodiment, the single chip microcomputer is connected with the laser transmitter. The single chip microcomputer is used for adjusting the frequency of the laser transmitter. In one embodiment, the computer is connected to the wavemeter. The computer is used to calibrate the wavemeter. In one embodiment, each of the light input ports is provided with a first coupler. The laser transmitter is connected with the optical switch device through the first coupler.

In one embodiment, the optical output port is provided with a second coupler. The wavelength meter is connected with the optical switch device through the second coupler.

A method for measuring wavelength adopts the wavelength measuring device. The laser transmitter includes a first laser. The method comprises the steps of selecting first laser output by the first laser, and controlling the optical switch device to switch the optical input port corresponding to the first laser to be conducted. In one embodiment, the wavelength measuring device further comprises a control device. The control device is respectively connected with the optical switch device, the laser transmitter and the wavemeter. The method includes the control device comparing a first wavelength value of the first laser light measured by the wavemeter with a first standard value. And if the first comparison result is out of a first preset range, adjusting the wavelength of the first laser output by the first laser.

In one embodiment, the laser transmitter further comprises a second laser. The method includes selecting a second laser output by the second laser, the second laser having a higher stability than the first laser. And the control device compares a second wavelength value of the second laser measured by the wavelength meter with a second standard value, and calibrates the wavelength meter if a second comparison result is out of a second preset range.

In summary, the present application provides a wavelength measurement device and method. The wavelength measuring device comprises a laser transmitter, an optical switching device and a wavelength meter. The optical switch device comprises an optical output port and a plurality of optical input ports, the laser transmitter is connected with the plurality of optical input ports, and the optical switch device is used for switching the conduction states of the plurality of optical input ports. The wavelength meter is connected with the optical output port. The optical switch device is characterized in that the plurality of light input ports are connected with the laser transmitter, the control device controls the conduction states of the plurality of light input ports of the optical switch device to realize the measurement of a plurality of wavelengths, the input end of the wavelength meter is not required to be disassembled and assembled in the measurement process, the convenience is brought to scientific research work, and the chance of the propagation of the non-fixed light path of laser in the air is reduced.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments or the conventional technologies of the present application, the drawings used in the descriptions of the embodiments or the conventional technologies will be briefly introduced below, it is obvious that the drawings in the following descriptions are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.

Fig. 1 is a first schematic structural diagram of a wavelength measurement device according to an embodiment of the present disclosure;

fig. 2 is a schematic structural diagram of a wavelength measurement device according to an embodiment of the present disclosure;

fig. 3 is a schematic structural diagram of a wavelength measurement device according to an embodiment of the present disclosure;

fig. 4 is a schematic structural diagram of a wavelength measurement device according to an embodiment of the present application.

Reference numerals:

a wavelength measuring device 10; a laser transmitter 100; a first laser 110; a second laser 120; an optical switching device 200; an optical output port 210; a light input port 220; a laser emitter output port 230; a wavemeter input port 240; a wavelength meter 300; a control device 400; a single chip microcomputer 410; a computer 420; a first connecting line 510; a second connection line 520; a third connecting line 530; a fourth connection line 540; a first coupler 610; a second coupler 620.

Detailed Description

In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is further described in detail below by way of embodiments and with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.

The numbering of the components as such, e.g., "first", "second", etc., is used herein only to distinguish the objects as described, and does not have any sequential or technical meaning. The term "connected" and "coupled" when used in this application, unless otherwise indicated, includes both direct and indirect connections (couplings). In the description of the present application, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", and the like, indicate orientations or positional relationships based on those shown in the drawings, and are used only for convenience in describing the present application and for simplicity in description, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed in a particular orientation, and be operated, and thus, are not to be considered as limiting the present application.

In this application, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may be directly contacting the first and second features or indirectly contacting the first and second features through intervening media. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.

Referring to fig. 1, an embodiment of the present application provides a wavelength measurement device 10. The wavelength measuring device 10 includes a laser transmitter 100, an optical switching device 200, and a wavelength meter 300. The optical switching device 200 includes an optical output port 210 and a plurality of optical input ports 220. The laser transmitter 100 is connected to the plurality of optical input ports 220, and the optical switch device 200 is configured to switch the conduction states of the plurality of optical input ports 220. The wavelength meter 300 is connected to the optical output port 210.

The wavelength measurement device 10 provided in the embodiment of the present application can measure the wavelengths of light with different wavelengths by switching the conduction states of the plurality of light input ports 220 through the optical switch device 200. The plurality of optical input ports 220 of the optical switch device 200 are connected to the laser transmitter 100 according to requirements in practical experiments, the optical output port 210 of the optical switch device 200 is connected to the wavemeter 300, the optical switch device 200 is configured to switch conduction states of the plurality of optical input ports 220, and the laser transmitter 100 is configured to transmit a plurality of optical signals with different wavelengths. The wavelength meter 300 measures the laser wavelength emitted by the laser emitter 100 and input by each of the light input ports 220, so as to realize the function of measuring multiple wavelengths. In the process of wavelength measurement, the input end of the wavelength meter 300 does not need to be manually disassembled and assembled, the problem that the input end of the wavelength meter 300 needs to be manually switched to realize wavelength measurement when a plurality of optical signals and a plurality of wavelengths are measured in the prior art is solved, the scientific research efficiency is improved, and the chance of non-fixed light path transmission of laser in the air is reduced.

Referring also to fig. 2, in one embodiment, the wavelength measuring device 10 includes a control device 400. The control device 400 is connected to the optical switching device 200. The control device 400 is used for switching the conduction states of the plurality of optical input ports 220 through the optical switch device 200.

The control device 400 is connected to the corresponding interface of the optical switch device 200 through a first connection line 510 according to the usage rule of the optical switch device 200. The control device 400 supplies power to the optical switching device 200 through the first connection line 510. The control means 400 outputs a control signal. The optical switch device 200 is configured to receive the control signal from the control device 400, switch the conduction states of the plurality of optical input ports 220, and implement gating of one of the optical input ports 220 of the optical switch device 200 or cyclic gating of the plurality of optical input ports 220. The control device 400 can also control the on-time of the plurality of light input ports 220 through the control signal.

In one embodiment, the control device 400 includes a single chip 410 and a computer 420. The single chip microcomputer 410 is connected with the optical switch device 200. The computer 420 is connected with the single chip microcomputer 410. The computer 420 controls the optical switch device 200 to switch the conduction states of the plurality of optical input ports 220 through the single chip 410.

The single chip microcomputer 410 is connected to the optical switch device 200 through the first connection line 510. The single chip microcomputer 410 is connected with the computer 420 through a second connection line 520. The second connection line 520 may be a USB data line or other data bus. The second connection line 520 is used for communication between the computer 420 and the single chip microcomputer 410. The computer 420 may program a control program that cooperates with the wavelength meter 300. The computer 420 controls the on state of the optical switch device 200 through the single chip 410 by the control program, so as to gate one of the plurality of optical input ports 220 of the optical switch device 200 or cyclically gate the plurality of optical input ports 220. The computer 420 may select the time for which the optical input port 220 is turned on by the control program, so that the wavelength meter 300 can measure the wavelengths of the optical signals emitted by the laser transmitter 100.

In one embodiment, the single chip 410 is connected to the laser transmitter 100. The single chip microcomputer 410 is used for adjusting the frequency of the laser transmitter 100.

The single chip microcomputer 410 is connected with the laser transmitter 100 through a fourth connection wire 540. The fourth connection line 540 may be a cable. The computer 420 outputs the adjusting signal to the single chip microcomputer 410 according to the wavelength measurement value of the wavelength meter 300. The single chip microcomputer 410 may transmit the adjustment signal to the laser transmitter 100 through the cable, and the laser transmitter 100 receives the adjustment signal to adjust the frequency of the plurality of optical signals transmitted by the laser transmitter 100.

In one embodiment, the computer 420 is connected to the wavemeter 300. The computer 420 is used to calibrate the wavelength meter 300.

The computer 420 is connected to the wavemeter 300 by a third connection 530. The third connection line 530 may be a USB data line or other data bus. The third connection 530 is used for communication between the computer 420 and the wavemeter 300. The wavelength meter 300 transmits the wavelength measurement results of the plurality of optical signals emitted by the laser transmitter 100 to the computer 420 through the third connection line 530. The computer 420 calibrates the wavemeter 300 according to the measurement transmitted through the third connection 530.

In one embodiment, each of the light input ports 220 is provided with a first coupler 610. The laser transmitter 100 is connected to the optical switch device 200 through the first coupler 610.

The first coupler 610 is connected to the optical input port 220 and the laser transmitter output port 230, respectively. The first coupler 610 is connected to the optical switch device 200 through the optical input port 220, and the first coupler 610 is connected to the laser transmitter 100 through the laser transmitter output port 230, so as to complete signal transmission of the optical signal from the laser transmitter 100 to the optical switch device 200. The laser transmitter output port 230 may be an optical fiber. The fiber optic connector of the laser transmitter output port 230 may be an angled FC/APC type connector.

In one embodiment, the optical output port 210 is provided with a second coupler 620. The wavelength meter 300 is connected to the optical switch device 200 through the second coupler 620.

The second coupler 620 is connected to the optical output port 210 and the wavelength meter input port 240, respectively. The second coupler 620 is connected to the optical switch device 200 through the optical output port 210, and the second coupler 620 is connected to the wavelength meter 300 through the wavelength meter input port 240, so as to complete signal transmission of the optical signal from the optical switch device 200 to the wavelength meter 300. Therefore, in the present application, the transmission paths of the optical signals emitted by the laser transmitter 100 are transmitted from the laser transmitter 100 to the optical switch device 200 and then to the wavelength meter 300. The wavemeter 300 may be a HighFinesse wavemeter. The wavemeter input port 240 may be a broad spectrum single mode fiber. The fiber optic connection of the wavemeter input port 240 may be a non-angled FC/PC type connection.

Referring to fig. 3, the present embodiment further provides a method for measuring a wavelength by using the wavelength measuring device 10. The laser transmitter 100 includes a first laser 110. The method includes selecting a first laser output by the first laser 110, and controlling the optical switch device 200 to switch the optical input port 220 corresponding to the first laser to be on.

The laser transmitter 100 includes a first laser 110. The first laser 110 may be a 369nm external cavity semiconductor laser, a 935nm DFB laser, or the like. The plurality of optical input ports 220 are respectively connected to the plurality of first lasers 110, and the optical switch device 200 is controlled to switch the optical input ports 220 corresponding to the first lasers to be on, so that one optical input port 220 of the optical switch device 200 is gated or a plurality of optical input ports 220 are circularly gated. The wavelength meter 300 sequentially measures the wavelengths of the first laser light output from the plurality of first lasers 110. After the apparatus is connected, the wavelength of the first laser beams output by the first lasers 110 can be measured. Need not manual dismouting wavemeter input at the in-process of wavelength measurement, improve the efficiency in the scientific research process. During the process of measuring the wavelengths of a plurality of first laser lights, the first laser lights are emitted by the first laser 110, enter the optical input port 220 of the optical switch device 200, and are transmitted to the wavemeter 300 through the optical output port 210 of the optical switch device 200, so that the chance of the laser lights propagating through an unfixed optical path in the air is reduced.

In one embodiment, the wavelength measurement device 10 further comprises a control device 400. The control device 400 is connected to the optical switch device 200, the laser transmitter 100, and the wavemeter 300, respectively. The method includes the control device 400 comparing a first wavelength value of the first laser light measured by the wavemeter 300 with a first standard value. If the first comparison result is outside a first preset range, the wavelength of the first laser light output by the first laser 110 is adjusted.

The wavelength meter 300 sequentially measures the first wavelength values of the first laser lights output from the first lasers 110. And setting the first standard value and the first preset range according to the actual experimental requirements. The control device 400 compares the first wavelength value of the first laser light measured by the wavemeter 300 with a first standard value. If the first comparison result is outside the first predetermined range, the control device 400 outputs the adjustment signal through a fourth connection line 540 according to the comparison result. The first laser 110 receives the adjustment signal, and adjusts the first wavelength value of the first laser output by the first laser 110, so that the first wavelength value of the first laser output by the first laser 110 is stabilized within the first preset range of the first standard value.

Ytterbium ion²S_1/2-²P_1/2Energy level and²D_3/2-³D[3/2]_1/2the transition wavelengths corresponding to the energy levels are 369.5nm and 935.18nm respectively, wherein²D_3/2Is that²P_1/2The metastable energy levels generated by the spontaneous emission,³D[3/2]_1/2is metastable and can decay back to²S_1/2Energy level. During the experiment, the first laser light generated by the first laser 110 is required to be stable 369nm and 935nm laser light. Thus, in this experiment, the first wavelength criterion values were 369nm and 935 nm. The control device 400 includes a single chip microcomputer 410 and a computer 420. The computer 420 can write a program matching with the single chip 420 and the first laser 110. The computer 420 may compare the first wavelength normalized values 369nm, 935nm with the actual values of the first wavelength of the first laser measured by the wavemeter 300 by the program. If the first comparison result is outside the first predetermined range, the computer 420 calculates an adjustment amount through the program. The computer 420 transmits the adjustment amount to the first laser 110 through the single chip microcomputer 410 using a PID algorithm. The adjustment is transmitted to the first laser 110 through a fourth connection 540. The computer 420 alternately locks the plurality of first lasers 110 through the single chip microcomputer 410, and finally, the first wavelength value of the first laser emitted by the plurality of first lasers 110 is stabilized within the first preset range of the first standard value. Referring also to fig. 4, in one embodiment, the laser transmitter 100 further includes a second laser 120. The method includes selecting a second laser light output by the second laser 120, the stability of the second laser 120 being higher than the stability of the first laser 110. The control device 400 compares a second wavelength value of the second laser measured by the wavelength meter 300 with a second standard value, and calibrates the wavelength meter 300 if the second comparison result is outside a second preset range.

The stability of the second laser 120 is higher than the stability of the first laser 110. The second laser 120 may be a 633nm DFB semiconductor laser with stabilized iodine molecular spectra. The second laser 120 has a very high stability, which is much higher than the wavemeter 300. The multiple optical input ports 220 of the optical switch device 200 are connected to multiple first lasers 110 and multiple second lasers 120 as required. The wavelength meter 300 measures the second wavelength value of the second laser light output by the second laser 120. Setting the second standard value and the second preset range according to experiment requirements, controlling the optical switch device 200 to be connected to the optical input port 220 of the second laser 120 to be conducted by the control device 400, and comparing the second wavelength value of the second laser measured by the wavemeter 300 with the second standard value by the control device 400. If the second comparison result is outside the second preset range, the control device 400 corrects the wavelength meter 300 according to the second comparison result.

The control device 400 controls the on-state of the optical input port 220 of the optical switch device 200 connected to the first laser 110 and the second laser 120. In the experimental process, the wavemeter 300 does not need to be disassembled and assembled, the scientific research efficiency is improved, and the chance of the propagation of the laser in the air through the non-fixed light path is reduced. During the measurement of the first wavelength value of the first wavelength of the first laser 110, the control device 400 switches the on states of the plurality of optical input ports 220 of the optical switch device 200, so as to complete the calibration of the wavelength meter 300, thereby greatly improving the experimental efficiency, simplifying the calibration process, and simultaneously realizing the functions of wavelength measurement and wavelength meter calibration.

The control device 400 includes a single chip microcomputer 410 and a computer 420. The computer 420 is connected to the wavemeter 300 by a third connection 530. The computer 420 controls the optical switch device 200 to be connected to the optical input port 220 of the second laser 120 through the single chip 410. The wavelength meter 300 transmits the wavelength measurement results of the plurality of optical signals emitted by the laser transmitter 100 to the computer 420 through the third connection line 530. The computer 420 calibrates the wavemeter 300 according to the measurement transmitted through the third connection 530. In the calibration process, the wavemeter 300 does not need to be disassembled and assembled, the scientific research efficiency is improved, and the chance of the propagation of the laser in the air through the non-fixed light path is reduced.

The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.

The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present patent. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.