阅读说明：本技术 探针装置及弹簧探针 (Probe device and spring probe ) 是由 李文聪 简志胜 魏逊泰 谢开杰 于 2020-05-26 设计创作，主要内容包括：本发明公开一种探针装置及弹簧探针。探针装置包含第一导板、第二导板及多个弹簧探针。第一导板具有多个第一穿孔,第二导板具有多组穿孔群,其分别包含一针轴穿孔及两个定位穿孔。各个弹簧探针具有两个凸出结构,各弹簧探针的针轴及两个凸出结构能通过针轴穿孔及两个定位穿孔而插设于第一导板与第二导板之间,且各个弹簧探针的两个凸出结构能抵靠于第二导板面对第一导板的一侧面,而两个凸出结构能限制弹簧探针相对于第二导板的活动范围。(The invention discloses a probe device and a spring probe. The probe device comprises a first guide plate, a second guide plate and a plurality of spring probes. The first guide plate is provided with a plurality of first through holes, and the second guide plate is provided with a plurality of groups of through holes which respectively comprise a needle shaft through hole and two positioning through holes. Each spring probe has two protruding structures, and the needle shaft and two protruding structures of each spring probe can be through the needle shaft perforation and two location perforation and insert and locate between first baffle and second baffle, and two protruding structures of each spring probe can support by the side that faces first baffle in the second baffle, and two protruding structures can restrict the home range of spring probe for the second baffle.)

1. A probe apparatus, comprising:

at least one first guide plate having a plurality of first through holes;

at least one second guide plate which is arranged at intervals with the first guide plate, wherein the at least one second guide plate is provided with a plurality of groups of through holes, each group of through holes comprises a needle shaft through hole and two positioning through holes, each needle shaft through hole and each positioning through hole penetrate through the second guide plate, the needle shaft through hole and the two positioning through holes of each group of through holes are mutually communicated, and the plurality of through hole groups are arranged at intervals without being mutually communicated;

the spring probes comprise a shell, an elastic part and a needle shaft, the elastic part is arranged in the shell, one end of the needle shaft is arranged in the shell and connected with the elastic part, and the other end of the needle shaft is exposed out of the shell; the outer side of the shell is provided with two protruding structures; the spring probes are arranged between the first guide plate and the second guide plate, two protruding structures of each spring probe abut against one side face, facing the first guide plate, of the second guide plate, the two protruding structures are not accommodated in the two adjacent positioning through holes, and one end of each needle shaft penetrates through each first through hole and is exposed out of one side, opposite to the second guide plate, of the first guide plate;

wherein the housing and the two protruding structures of each spring probe can pass through the needle shaft through hole and the two positioning through holes of each set of the through hole groups.

2. A probe device according to claim 1, wherein said side surface of said second guide plate is formed with a plurality of sets of position-limiting structures, each set of said position-limiting structures comprises two grooves, each of said grooves does not penetrate said second guide plate, two of said grooves of each set of said position-limiting structures are communicated with said needle shaft through holes of each set of said through-hole groups, two of said grooves of each set of said position-limiting structures are not communicated with two of said positioning through holes of each set of said through-hole groups, and two of said projecting structures of each of said spring probes are correspondingly disposed in two of said grooves.

3. The probe apparatus according to claim 1, further comprising an auxiliary guide plate disposed on a side of the second guide plate facing the first guide plate, the auxiliary guide plate having a plurality of auxiliary perforation groups; each auxiliary perforation group comprises a needle shaft auxiliary perforation, two clamping grooves and two avoiding perforations, each needle shaft auxiliary perforation penetrates through the auxiliary guide plate, each clamping groove is formed by one side of the auxiliary guide plate being concave inwards, each clamping groove is arranged facing the first guide plate, each avoiding perforation penetrates through the auxiliary guide plate, the needle shaft auxiliary perforation of each auxiliary perforation group is mutually communicated with the two clamping grooves, the needle shaft auxiliary perforation of each auxiliary perforation group is mutually communicated with the two avoiding perforations, and the two clamping grooves and the two avoiding perforations of each auxiliary perforation group are not mutually communicated; the needle shaft through holes of each group of the through hole groups are mutually communicated with the needle shaft auxiliary through holes of each group of the auxiliary through hole groups, and the two positioning through holes of each group of the through hole groups are mutually communicated with the two avoiding through holes of each group of the auxiliary through hole groups; the two protruding structures of each spring probe are clamped and arranged in the two clamping grooves of each group of auxiliary perforation groups; the shell and the two protruding structures of each spring probe can penetrate through the needle shaft through hole and the two positioning through holes of the group of through holes, and the needle shaft auxiliary through hole and the two avoiding through holes of the group of auxiliary through holes.

4. The probe apparatus according to claim 3, wherein each of the engaging grooves penetrates the auxiliary guide plate.

5. The probe apparatus according to claim 1, further comprising a spacer frame fixedly disposed between the first guide plate and the second guide plate, wherein the first guide plate, the spacer frame and the second guide plate together form a receiving space, and a plurality of spring probes having two protruding structures are correspondingly disposed in the receiving space.

6. The probe apparatus according to claim 1, wherein the outer side of the housing of each spring probe further has two auxiliary positioning structures, two of the auxiliary positioning structures and two of the protruding structures are respectively adjacent to two opposite ends of the housing, and the two auxiliary positioning structures and the two of the protruding structures are disposed in a staggered manner; the probe device further comprises an auxiliary positioning guide plate, the auxiliary positioning guide plate is arranged on one side, facing the second guide plate, of the first guide plate, the auxiliary positioning guide plate is provided with a plurality of groups of auxiliary positioning through holes, each group of auxiliary positioning through hole group comprises a first auxiliary through hole and two second auxiliary through holes, each first auxiliary through hole penetrates through the auxiliary positioning guide plate, each second auxiliary through hole penetrates through the auxiliary positioning guide plate, and the first auxiliary through hole and the two second auxiliary through holes of each group of auxiliary positioning through hole group are mutually communicated; the two auxiliary positioning structures of each spring probe are clamped in the two second auxiliary through holes.

7. The probe apparatus of claim 6, wherein the housing has a first section and a second section, the first section having an outer diameter greater than an outer diameter of the second section, two of the protruding structures located in the first section, and two of the secondary positioning structures located in the second section.

8. A spring probe, comprising:

the shell is internally provided with a containing groove, and the outer side of the shell is provided with two protruding structures;

the elastic piece is arranged in the accommodating groove; and

one end of the needle shaft is fixed with the elastic piece, and one end of the needle shaft opposite to the end arranged in the containing groove is defined as a contact end; when the contact end is pressed, the elastic piece can elastically deform.

9. The spring probe of claim 8 wherein said housing further has two auxiliary positioning structures, two of said auxiliary positioning structures and two of said protruding structures are respectively adjacent to opposite ends of said housing, and said two of said auxiliary positioning structures and two of said protruding structures are offset from each other.

10. The spring probe of claim 9 wherein said housing has a first section and a second section, said first section having an outer diameter greater than an outer diameter of said second section, two of said projecting structures located in said first section and two of said complementary locating structures located in said second section.

Technical Field

The present invention relates to a probe apparatus and a spring probe, and more particularly, to a probe apparatus having a spring probe and a spring probe.

Background

Referring to fig. 1, a cross-sectional view of a conventional probe apparatus is shown. The conventional probe apparatus P includes a base P1, a plurality of spring probes P2, and a top P3. The base P1 includes a plurality of limiting through holes P11, and the cover P3 has a plurality of cover through holes P31. The probe device P is mounted in the following manner: firstly, needle implanting operation is carried out, so that one ends of a plurality of spring probes P2 are correspondingly arranged in a plurality of limiting through holes P11 of a base P1; then, the through holes P11 of the top cover P3 are correspondingly inserted through the spring probes P2, so that the top cover P3 and the base P1 can be fixed to each other, and the movable range of the spring probes P2 is limited by the base P1 and the top cover P3.

As described above, in practical applications, in embodiments where the number of the spring probes P2 is large or the size of the spring probe P2 is small, the through holes P11 of the top cover P3 may not pass through the spring probes P2 smoothly, and the top cover P3 may not be fixed to the base P1.

Disclosure of Invention

The invention discloses a probe device, which is mainly used for solving the problem that a top cover is difficult to be mutually fixed with a base provided with a plurality of spring probes in the assembling process of the known probe device.

One embodiment of the invention discloses a probe device, which comprises at least one first guide plate, at least one second guide plate and a plurality of spring probes. At least one first guide plate is provided with a plurality of first through holes; the at least one second guide plate and the first guide plate are arranged at intervals, the at least one second guide plate is provided with a plurality of groups of through hole groups, each group of through hole group comprises a needle shaft through hole and two positioning through holes, each needle shaft through hole and each positioning through hole penetrate through the second guide plate, the needle shaft through hole and the two positioning through holes of each group of through hole group are mutually communicated, and the plurality of through hole groups are arranged at intervals and are not mutually communicated; each spring probe comprises a shell, an elastic piece and a needle shaft, wherein the elastic piece is arranged in the shell, one end of the needle shaft is arranged in the shell and connected with the elastic piece, and the other end of the needle shaft is exposed out of the shell; the outer side of the shell is provided with two protruding structures; the spring probes are arranged between the first guide plate and the second guide plate, two protruding structures of each spring probe abut against one side face, facing the first guide plate, of the second guide plate, the two protruding structures are not accommodated in the two adjacent positioning through holes, and one end of each needle shaft penetrates through each first through hole and is exposed out of one side, opposite to the second guide plate, of the first guide plate; wherein, the shell and the two protruding structures of each spring probe can pass through the needle shaft through holes and the two positioning through holes of each group of through hole groups.

Preferably, the side of the second guide plate is formed with a plurality of sets of limiting structures, each set of limiting structure comprises two grooves, each groove does not penetrate through the second guide plate, the two grooves of each set of limiting structure are communicated with the needle shaft through holes of each set of through hole group, the two grooves of each set of limiting structure are not communicated with the two positioning through holes of each set of through hole group, and the two protruding structures of each spring probe are correspondingly arranged in the two grooves.

Preferably, the probe device further comprises an auxiliary guide plate, the auxiliary guide plate is arranged on one side of the second guide plate facing the first guide plate, and the auxiliary guide plate is provided with a plurality of auxiliary perforation groups; each auxiliary perforation group comprises a needle shaft auxiliary perforation, two clamping grooves and two avoiding perforations, each needle shaft auxiliary perforation penetrates through the auxiliary guide plate, each clamping groove is formed by one side of the auxiliary guide plate being concave, each clamping groove is arranged facing the first guide plate, each avoiding perforation penetrates through the auxiliary guide plate, the needle shaft auxiliary perforation of each auxiliary perforation group is mutually communicated with the two clamping grooves, the needle shaft auxiliary perforation of each auxiliary perforation group is mutually communicated with the two avoiding perforations, and the two clamping grooves and the two avoiding perforations of each auxiliary perforation group are not mutually communicated; the needle shaft through holes of each group of through hole groups are mutually communicated with the needle shaft auxiliary through holes of each group of auxiliary through hole groups, and the two positioning through holes of each group of through hole groups are mutually communicated with the two avoiding through holes of each group of auxiliary through hole groups; the two convex structures of each spring probe are clamped and arranged in the two clamping grooves of each group of auxiliary perforation groups; the shell and the two protruding structures of each spring probe can penetrate through the needle shaft through hole and the two positioning through holes of the group of through holes, the needle shaft auxiliary through hole and the two avoiding through holes of the group of auxiliary through holes.

Preferably, each of the catching grooves penetrates the auxiliary guide.

Preferably, the probe apparatus further includes a spacing frame fixedly disposed between the first guide plate and the second guide plate, the first guide plate, the spacing frame and the second guide plate together form an accommodating space, and the portions of the plurality of spring probes having the two protruding structures are correspondingly located in the accommodating space.

Preferably, the outer side of the shell of each spring probe is also provided with two auxiliary positioning structures, the two auxiliary positioning structures and the two protruding structures are respectively adjacent to two opposite ends of the shell, and the two auxiliary positioning structures and the two protruding structures are arranged in a staggered manner; the probe device also comprises an auxiliary positioning guide plate, the auxiliary positioning guide plate is arranged on one side, facing the second guide plate, of the first guide plate, the auxiliary positioning guide plate is provided with a plurality of groups of auxiliary positioning through hole groups, each group of auxiliary positioning through hole group comprises a first auxiliary through hole and two second auxiliary through holes, each first auxiliary through hole penetrates through the auxiliary positioning guide plate, each second auxiliary through hole penetrates through the auxiliary positioning guide plate, and the first auxiliary through holes and the two second auxiliary through holes of each group of auxiliary positioning through hole groups are mutually communicated; the two auxiliary positioning structures of each spring probe are clamped in the two second auxiliary through holes.

Preferably, the housing has a first section and a second section, the outer diameter of the first section is larger than that of the second section, the two protruding structures are located at the first section, and the two auxiliary positioning structures are located at the second section.

One embodiment of the present invention discloses a spring probe, comprising: a shell, the interior of which is provided with a containing groove, and the outer side of the shell is provided with two convex structures; the elastic piece is arranged in the containing groove; one end of the needle shaft is fixed with the elastic piece, and the end of the needle shaft opposite to the end arranged in the containing groove is defined as a contact end; the elastic member is elastically deformable when the contact end is pressed.

Preferably, the housing further has two auxiliary positioning structures, the two auxiliary positioning structures and the two protruding structures are respectively adjacent to two opposite ends of the housing, and the two auxiliary positioning structures and the two protruding structures are disposed in a staggered manner.

Preferably, the housing has a first section and a second section, the outer diameter of the first section is larger than that of the second section, the two protruding structures are located at the first section, and the two auxiliary positioning structures are located at the second section.

In summary, the probe apparatus and the spring probe of the present invention can be assembled conveniently by providing two protruding structures on the spring probe, providing a plurality of perforation groups on the second guide plate, and making each perforation group include a needle shaft perforation and two positioning perforations.

For a better understanding of the nature and technical content of the present invention, reference should be made to the following detailed description of the invention and the accompanying drawings, which are provided for illustration purposes only and are not intended to limit the scope of the invention in any way.

Drawings

Fig. 1 is a schematic cross-sectional view of a conventional probe apparatus.

Fig. 2 is a partial perspective cross-sectional view of a first embodiment of a probe apparatus of the present invention.

Fig. 3 is an exploded view of a first embodiment of the probe apparatus of the present invention.

Fig. 4 is a schematic view illustrating a process of penetrating a spring probe into a second guide plate of the first embodiment of the probe apparatus of the present invention.

Fig. 5 is a partial perspective cross-sectional view of a second embodiment of the probe apparatus of the present invention.

Fig. 6 is an exploded view of a second embodiment of the probe apparatus of the present invention.

Fig. 7 is a partial sectional view illustrating a needle implanting process of the spring probe of the probe apparatus of the present invention.

Fig. 8 is a partial perspective cross-sectional view of a third embodiment of a probe device of the present invention.

Fig. 9 is an exploded view of a third embodiment of the probe apparatus of the present invention.

Fig. 10 is a partial perspective cross-sectional view of a fourth embodiment of the probe apparatus of the present invention.

Fig. 11 is an exploded view of a fourth embodiment of the probe apparatus of the present invention.

Detailed Description

In the following description, reference is made to or shown in the accompanying drawings for the purpose of illustrating the subject matter described herein, and in which is shown by way of illustration only, and not by way of limitation, specific reference may be made to the drawings.

Referring to fig. 2 to 4 together, fig. 2 is a partial cross-sectional view illustrating a first embodiment of the probe apparatus of the present invention, fig. 3 is an exploded view illustrating the first embodiment of the probe apparatus of the present invention, and fig. 4 is a schematic view illustrating one of the probes of the probe apparatus of the present invention passing through the second guide plate. The probe apparatus 100 of the present invention comprises a first guide plate 1, a spacer frame 2, a second guide plate 3 and a plurality of spring probes 4. The first guide plate 1 has a plurality of first through holes 11. The first through holes 11 are spaced apart from each other, and the first through holes 11 penetrate the first guide plate 1. In the drawings of the present embodiment, the probe apparatus 100 includes 9 spring probes 4 as an example, but the number of the spring probes 4 is not limited to 9.

The spacing frame 2 is disposed on one side of the first guide plate 1, the second guide plate 3 is disposed on the opposite side of the spacing frame 2 from the first guide plate 1, and the second guide plate 3 and the first guide plate 1 are disposed spaced apart from each other. In practical applications, the first guide plate 1, the spacer frame 2 and the second guide plate 3 may be fixed to each other by a plurality of screws, for example, but not limited thereto. The spacer frame 2 is mainly used to arrange the first guide plate 1 and the second guide plate 3 at an interval, so the shape and thickness of the spacer frame 2 can be changed according to the requirement, and are not limited to the illustration in the figure. In particular, the probe apparatus 100 may not have the spacer frame 2 as long as the first guide plate 1 and the second guide plate 3 are provided at a distance, and for example, in different embodiments, the spacer frame 2 and the first guide plate 1 may be integrally formed, or the spacer frame 2 and the second guide plate 3 may be integrally formed.

The second guide plate 3 has a plurality of sets of through-hole groups 31, each set of through-hole group 31 includes a needle shaft through-hole 311 and two positioning through-holes 312, each needle shaft through-hole 311 and each positioning through-hole 312 penetrate through the second guide plate 3, the needle shaft through-hole 311 and the two positioning through-holes 312 of each set of through-hole group 31 are communicated with each other, and the plurality of through-hole groups 31 are disposed at intervals and are not communicated with each other. Wherein each needle shaft through hole 311 is arranged substantially corresponding to each first through hole 11 of the first guide plate 1.

Each spring probe 4 includes a housing 41, a needle shaft 42, and an elastic member 43 (e.g., a compression spring), the elastic member 43 is disposed in the housing 41, one end of the needle shaft 42 is disposed in the housing 41 and connected to the elastic member 43, and the other end of the needle shaft 42 is exposed out of the housing 41. When the needle shaft 42 is pressed at one end exposed out of the housing 41, the elastic member 43 is elastically deformed and generates an elastic restoring force, and when the one end of the needle shaft 42 is not pressed, the elastic restoring force of the elastic member 43 restores the needle shaft 42 to the state of being not pressed. The outer side of the housing 41 has two protruding structures 411. The housing 41 and the two protruding structures 411 of each spring probe 4 can simultaneously pass through the needle shaft through hole 311 and the two positioning through holes 312 of one set of through hole groups 31.

The plurality of spring probes 4 are disposed between the first guide plate 1 and the second guide plate 3, and the two protruding structures 411 of each spring probe 4 abut against the second guide plate 3 at a side face 1A facing the first guide plate 1, and the two protruding structures 411 are not accommodated in the two positioning through holes 312, so that the two protruding structures 411 of each spring probe 4 abut against the second guide plate 3, the moving range of each spring probe 4 relative to the second guide plate 3 is limited, and each spring probe 4 is not easy to move relative to the second guide plate 3.

The two protruding structures 411 are mainly used for limiting the moving range of the housing 41 relative to the second guide plate 3, so that the shape of the two protruding structures 411 of each spring probe 4 can be changed according to requirements as long as the two protruding structures 411 can limit the moving range of the housing 41 relative to the second guide plate 3. In the present embodiment, the two protruding structures 411 of each spring probe 4 are oppositely disposed on two sides of the housing 41, but the positions of the two protruding structures 411 disposed on the housing 41 are not limited to the positions shown in the figures.

One end of the needle shaft 42 of each spring probe 4 penetrates through the first through holes 11 and is exposed on one side of the first guide plate 1 opposite to the second guide plate 3, and the end of the needle shaft 42 of each spring probe 4 exposed on the first guide plate 1 is defined as a contact end for contacting a Device Under Test (DUT). In practical applications, each spring probe 4 may be a spring connector (POGO PIN) in various forms according to requirements.

As shown in fig. 2 and 3, the spacer frame 2 has a through hole 21 at the center, and the through hole 21 is disposed through the spacer frame 2. When the first guide plate 1, the spacer frame 2 and the second guide plate 3 of the probe apparatus 100 are fixed to each other, a containing space SP is formed, and a portion of the plurality of spring probes 4 having the two protruding structures 411 is correspondingly located in the containing space SP. In practical application, the spacing frame 2 is mainly used for arranging the first guide plate 1 and the second guide plate 3 at a distance from each other, so that the protruding structure 411 of each spring probe 4 can move corresponding to the accommodating space SP; more specifically, by the arrangement of the spacing frame 2, when each spring probe 4 is rotated, the two protruding structures 411 can move corresponding to the accommodating space SP.

As shown in fig. 4 and fig. 2, in the actual assembly process of the probe apparatus 100 of the present invention, the housing 41 and the two protruding structures 411 of each spring probe 4 are respectively inserted through one needle shaft through hole 311 and the two positioning through holes 312 connected thereto by using a related robot or manually, then, when one end of the needle shaft 42 of the spring probe 4 is inserted into the first through hole 11 of the first guide plate 1, and the two protruding structures 411 are located in the accommodating space SP, the spring probe 4 can be rotated by using a related robot or manually, so that the two protruding structures 411 are no longer correspondingly located at one side of the two positioning through holes 312, the two protruding structures 411 are correspondingly abutted against one side surface 3A of the second guide plate 3 facing the first guide plate 1, so that the needle inserting operation of the single spring probe 4 of the probe device 100 can be completed.

As described above, in the probe apparatus 100 according to the present invention, the spring probes 4 can be inserted into the first guide plate 1 and the second guide plate 3 and rotated by the robot arm or the person through the protrusion 411 of the spring probes 4 and the plurality of through holes 31 of the second guide plate 3, and thus the needle inserting operation of the spring probes 4 can be completed, but the probe apparatus 100 according to the present invention does not have the conventional probe apparatus P shown in fig. 1, and when the top cover P3 and the bottom cover P1 are fixed to each other after the plurality of spring probes P2 are inserted into the bottom cover P1, the plurality of spring probes P2 cannot correctly pass through the plurality of top cover through holes P31 of the top cover P3.

Referring to fig. 5 to 7, fig. 5 is a perspective partial cross-sectional view illustrating a probe apparatus according to a second embodiment of the present invention, fig. 6 is an exploded view illustrating the probe apparatus according to the second embodiment of the present invention, and fig. 7 is a cross-sectional view illustrating the probe apparatus according to the present invention during a needle implantation process.

As shown in fig. 5 and 6, the probe apparatus 100 of the present embodiment is different from the previous embodiments in that: the side surface 3A of the second guide plate 3 is further formed with a plurality of sets of limiting structures 32, each set of limiting structures 32 includes two grooves 321, each groove 321 does not penetrate through the second guide plate 3, the two grooves 321 of each set of limiting structures 32 are mutually communicated with the needle shaft through holes 311 of each set of through hole groups 31, the two grooves 321 of each set of limiting structures 32 are not mutually communicated with the two positioning through holes 312 of each set of through hole groups 31, and the two grooves 321 communicated with each needle shaft through hole 311 can correspondingly accommodate the two protruding structures 411 of a single spring probe 4. In brief, the second guide plate 3 has a plurality of blind recesses 321 formed on the side surface 3A, and each needle shaft through hole 311 is communicated with two recesses 321.

As shown in fig. 5 and 7, in practical applications, the needle implanting operation flow of the spring probes 4 of the probe apparatus 100 of the present embodiment may be: first, the second guide plate 3 and the spacing frame 2 are arranged at an interval by using a relevant mechanism (for example, a gasket, a member similar to the spacing frame 2, etc.), and then, after the housing 41 and the two protruding structures 411 of each spring probe 4 are made to pass through the needle shaft through hole 311 and the two positioning through holes 312 of the second guide plate 3, each spring probe 4 is rotated so that the two protruding structures 411 of each spring probe 4 are located right below the two grooves 321; when the two protruding structures 411 of each spring probe 4 are located right below the two grooves 321, the related mechanism originally disposed between the second guide plate 3 and the spacing frame 2 is removed, so that the second guide plate 3 can move toward the spacing frame 2, and accordingly, the two protruding structures 411 of each spring probe 4 are correspondingly accommodated in the two grooves 321 located on the side surface 3A of the second guide plate 3; finally, the first guide plate 1, the spacing frame 2 and the second guide plate 3 are fixed to each other, thereby completing the needle implanting operation. That is, in the probe apparatus 100 of the present embodiment, after the needle implanting operation of each spring probe 4 is completed, the two protruding structures 411 of each spring probe 4 will be correspondingly engaged in the two grooves 321, and each spring probe 4 will be difficult to rotate relative to the second guide plate 3.

As described above, by forming the plurality of grooves 321 on the side surface 3A of the second guide plate 3, the two protruding structures 411 of the spring probes 4 can be correspondingly engaged with the two grooves 321, so that the spring probes 4 are not easily rotated with respect to the first guide plate 1 and the second guide plate 3. In practical applications, as long as each protruding structure 411 can be correspondingly engaged with the corresponding groove 321, and accordingly each spring probe 4 is limited not to easily rotate relative to the second guide plate 3, the shape and size of each protruding structure 411 and the shape and size of each groove 321 can be set according to requirements.

Referring to fig. 8 and 9 together, fig. 8 is a perspective partial cross-sectional view illustrating a probe apparatus according to a third embodiment of the present invention, and fig. 9 is an exploded view illustrating the probe apparatus according to the third embodiment of the present invention. The probe apparatus 100 of the present embodiment is different from the previous embodiments in the following point: the probe apparatus 100 further includes an auxiliary guide plate 5. The auxiliary guide 5 is arranged on the side of the second guide 3 facing the first guide 1. In practical applications, the second guide plate 3, the auxiliary guide plate 5, the spacer frame 2 and the first guide plate 1 may be fixed to each other by screws, but the fixing method is not limited thereto.

The auxiliary guide 5 has a plurality of auxiliary perforated groups 51. Each auxiliary perforation group 51 includes a needle shaft auxiliary perforation 511, two engaging grooves 512, and two avoiding perforations 513, each needle shaft auxiliary perforation 511 penetrates the auxiliary guide plate 5, each engaging groove 512 is formed by recessing one side of the auxiliary guide plate 5, each engaging groove 512 is disposed facing the first guide plate 1, each avoiding perforation 513 penetrates the auxiliary guide plate 5, the needle shaft auxiliary perforation 511 and the two engaging grooves 512 of each auxiliary perforation group 51 are communicated with each other, the needle shaft auxiliary perforation 511 and the two avoiding perforations 513 of each auxiliary perforation group 51 are communicated with each other, and the two engaging grooves 512 and the two avoiding perforations 513 of each auxiliary perforation group 51 are not communicated with each other.

The auxiliary guide plate 5 is fixed to one side of the second guide plate 3, the needle shaft through hole 311 of each group of through holes 31 and the needle shaft auxiliary through hole 511 of each group of auxiliary through holes 51 communicate with each other, and the two positioning through holes 312 of each group of through holes 31 and the two escape through holes 513 of each group of auxiliary through holes 51 communicate with each other. In practical applications, the needle shaft through hole 311 and the two positioning through holes 312 of each set of through hole group 31, and the needle shaft auxiliary through hole 511 and the two avoiding through holes 513 of each set of auxiliary through hole group 51 may have the same shape and size, and the housing 41 and the two protruding structures 411 of each spring probe 4 can sequentially pass through the needle shaft through holes of each set of through hole group 31, the two positioning through holes 312 communicated therewith, the needle shaft auxiliary through holes 511 of each set of auxiliary through hole group 51, and the two avoiding through holes 513 communicated therewith. The two engaging slots 512 of each set of auxiliary through holes 51 are used to engage with the two protruding structures 411 of each spring probe 4.

The needle implanting operation flow of each spring probe 4 of the probe apparatus 100 of the present embodiment may be: firstly, a gap is formed between the auxiliary guide plate 5 and the spacing frame body 2 by using related components, then, the shell 41 and the two protruding structures 411 of each spring probe 4 sequentially pass through the needle shaft through hole 311 of the second guide plate 3 and the two positioning through holes connected with the needle shaft through hole 311, the needle shaft auxiliary through hole 511 of the auxiliary guide plate 5 and the two avoiding through holes 513 connected with the needle shaft auxiliary through hole 511, and then the spring probe 4 is rotated, so that the two protruding structures 411 are correspondingly positioned below the two clamping grooves 512; finally, when all the spring probes 4 are inserted into the second guide plate 3 and the auxiliary guide plate 5 and rotated, the components originally disposed between the auxiliary guide plate 5 and the partition frame 2 are pulled away, so that the auxiliary guide plate 5 and the second guide plate 3 move toward the partition frame 2, and thus, the engaging grooves 512 are correspondingly engaged with the protruding structures 411, and the spring probes 4 cannot be easily rotated. In different embodiments, each of the engaging grooves 512 may be formed to penetrate the auxiliary guide 5.

Referring to fig. 10 and 11 together, fig. 10 is a perspective partial cross-sectional view illustrating a fourth embodiment of the probe apparatus of the present invention, and fig. 11 is an exploded view illustrating the fourth embodiment of the probe apparatus of the present invention. The biggest difference between this embodiment and the aforementioned first embodiment is: the probe apparatus 100 further comprises an auxiliary positioning guide 6. The auxiliary positioning guide 6 is arranged on the side of the first guide 1 facing the second guide 3. The assistant positioning guide plate 6 has a plurality of assistant positioning through hole groups 61, each assistant positioning through hole group 61 includes a first assistant through hole 611 and two second assistant through holes 612, each first assistant through hole 611 passes through the assistant positioning guide plate 6, each second assistant through hole 612 passes through the assistant positioning guide plate 6, and the first assistant through hole 611 and the two second assistant through holes 612 of each assistant positioning through hole group 61 are mutually communicated.

The outer side of the housing 41 of each spring probe 4 further has two auxiliary positioning structures 44, the two auxiliary positioning structures 44 and the two protruding structures 411 are respectively adjacent to two opposite ends of the housing 41, and the two auxiliary positioning structures 44 and the two protruding structures 411 are disposed in a staggered manner. In practical applications, the housing 41 may have a first section 41A and a second section 41B, the outer diameter of the first section 41A is larger than that of the second section 41B, two protruding structures 411 are located on the first section 41A, and two auxiliary positioning structures 44 are located on the second section 41B.

The two auxiliary positioning structures 44 of each spring probe 4 can be engaged with the two second auxiliary through holes 612 of each set of auxiliary positioning hole groups 31, and the housing 41 of each spring probe 4 with the two auxiliary positioning structures 44 can correspondingly pass through the first auxiliary through holes 611 of each set of auxiliary positioning hole groups 61.

The needle implanting operation flow of each spring probe 4 of the present embodiment may be: the housing 41 and the two positioning through holes 312 of each spring probe 4 are made to penetrate through the second guide plate 3, then, one end of the needle shaft 42 of the spring probe 4 is made to correspondingly penetrate through the first through hole 11 of the first guide plate 1, at this time, the two protruding structures 411 are correspondingly located in the accommodating space SP formed by the spacing frame 2, the second guide plate 3 and the first guide plate 1, the two auxiliary positioning structures 44 are correspondingly abutted against one side of the first guide plate 1 facing the second guide plate 3, and a part of the second section 41B of the housing 41 of the spring probe 4 is made to correspondingly penetrate through the first auxiliary through hole 611; finally, the spring probe 4 is rotated to correspondingly engage the two auxiliary positioning structures 44 into the two second auxiliary through holes 612.

In particular, in practical applications, the spring probes 4 of the above embodiments may be manufactured and sold separately, and the spring probes 4 are not limited to be manufactured and sold together with the probe device 100.

In summary, the probe apparatus and the spring probe of the present invention can be assembled conveniently by providing two protruding structures on the spring probe, providing a plurality of perforation groups on the second guide plate, and making each perforation group include a needle shaft perforation and two positioning perforations.

The above description is only a preferred embodiment of the present invention, and not intended to limit the scope of the present invention, so that all equivalent technical changes made by using the contents of the present specification and the accompanying drawings are included in the scope of the present invention.