阅读说明：本技术 清洁治具 (Cleaning jig ) 是由 李日新 王裕广 莊明儒 张文铨 于 2020-06-12 设计创作，主要内容包括：本申请提供一种清洁治具,用以清洁测试设备中的多个测试部,所述清洁治具包含框架以及多个清洁单元。所述框架具有第一侧,第一侧位于框架的外缘。所述多个清洁单元可拆卸地设置于框架的第一侧,每一个清洁单元上具有清洁片,且每一个清洁单元的清洁片朝向框架外。其中,每一个清洁单元对应所述多个测试部其中之一,且每一个测试部同时接触对应的清洁片的第一面与第二面。(The application provides a cleaning jig for cleaning a plurality of test parts in test equipment, the cleaning jig comprises a frame and a plurality of cleaning units. The frame has a first side located at an outer edge of the frame. The cleaning units are detachably arranged on the first side of the frame, each cleaning unit is provided with a cleaning sheet, and the cleaning sheet of each cleaning unit faces the outside of the frame. Each cleaning unit corresponds to one of the plurality of testing parts, and each testing part simultaneously contacts the first surface and the second surface of the corresponding cleaning sheet.)

1. A cleaning tool for cleaning a plurality of testing portions in a testing apparatus, the cleaning tool comprising:

a frame having a first side, the first side being located at an outer edge of the frame; and

the cleaning units are detachably arranged on a first side of the frame, each cleaning unit is provided with a cleaning sheet, and the cleaning sheet of each cleaning unit faces the outside of the frame;

each cleaning unit corresponds to one of the test parts, and each test part simultaneously contacts with a first surface and a second surface of the corresponding cleaning sheet.

2. The cleaning fixture of claim 1, wherein each cleaning unit has a first locking member thereon, the first locking member detachably securing the first side.

3. The cleaning fixture of claim 2, wherein each cleaning unit has a second locking member thereon, and the second locking member detachably fixes the cleaning sheet.

4. The cleaning fixture according to claim 3, wherein the first locking member is locked in a direction different from a direction in which the second locking member is locked.

5. The cleaning fixture of claim 1, wherein the testing portions of the testing apparatus are configured to test a plurality of electronic components on a carrier tray, the frame defines a frame length and a frame width, the frame length is equal to the carrier tray length, and the frame width is equal to the carrier tray width.

6. The cleaning fixture of claim 5, wherein the positions of the cleaning units on the first side correspond to the positions of the electronic components on the tray.

7. The cleaning fixture of claim 1, wherein the first and second surfaces of the cleaning sheet are sandpaper.

Technical Field

The present disclosure relates to a cleaning device, and more particularly, to a cleaning device for cleaning a testing apparatus.

Background

Generally, various electronic devices require routine maintenance or cleaning after a period of use to ensure that the electronic devices continue to function properly. In particular, for electronic devices requiring high precision, such as various testing devices, the error in measuring data can be reduced by performing maintenance or cleaning correctly. Taking the detection of the battery as an example, the testing device needs to clamp the electrode of the battery by the testing portion, and then the testing portion charges and discharges the battery to detect whether the battery is working normally. In practice, when the battery leaves a factory, the electrode of the battery is often coated with an oxide film, and the testing part must take charge of scraping the oxide film while clamping the electrode. As a result, after a period of use, the surface of the test portion may be stained with a small amount of scraped oxide film, or the surface of the test portion may have some residue of oxide film.

It will be appreciated that the oxide film on the surface of the test portion may interfere with the accuracy of the test, in addition to possibly affecting the efficiency of the test portion in charging and discharging the battery. In addition, because the test section needs to carry a large current, unintended oxide film residue may also cause accidents such as smoke or fire. In practice, it is important to clean the test portion of the test device at regular intervals, but it is troublesome to clean the test portion of the test device. For example, a test apparatus generally needs to test a large number of cells in batches, and assuming that the electrodes of each cell correspond to one test portion, it is conceivable that the test apparatus will have a large number of test portions, and it is necessary to wash and clean the test portions of the test apparatus one by one, which is time-consuming and laborious. Accordingly, there is a need for a new cleaning tool that can rapidly clean a plurality of testing parts of a testing apparatus in batches, thereby reducing the downtime and cleaning time of the testing apparatus and reducing the manpower and material resources for cleaning the testing apparatus.

Disclosure of Invention

In view of this, a main objective of the present application is to provide a cleaning fixture, which can rapidly and massively clean a plurality of test portions of a testing device without stopping the testing device, so as to improve the detection efficiency of the testing device.

The application provides a cleaning jig for cleaning a plurality of test parts in test equipment, the cleaning jig comprises a frame and a plurality of cleaning units. The frame has a first side located at an outer edge of the frame. The cleaning units are detachably arranged on the first side of the frame, each cleaning unit is provided with a cleaning sheet, and the cleaning sheet of each cleaning unit faces the outside of the frame. Each cleaning unit corresponds to one of the plurality of testing parts, and each testing part simultaneously contacts the first surface and the second surface of the corresponding cleaning sheet.

In some embodiments, each cleaning unit can have a first locking member thereon, the first locking member being removably secured to the first side. In addition, each cleaning unit may have a second locking member thereon, the second locking member detachably securing the cleaning sheet. In addition, the locking direction of the first locking member may be different from the locking direction of the second locking member. And the first and second sides of the cleaning sheet may be sandpaper.

In some embodiments, the plurality of test sections of the test apparatus are configured to carry a plurality of electronic components on the tray, and the frame defines a frame length and a frame width, wherein the frame length may be equal to the length of the tray and the frame width may be equal to the width of the tray. In addition, the arrangement positions of the cleaning units on the first side can correspond to the arrangement positions of the electronic components on the carrying tray.

To sum up, the clean tool that this application provided can be used for clean test equipment, and test equipment's test section can press from both sides tight cleaning sheet by oneself and grind away dirty, and need not wash test section one by one with the manual work. Therefore, the cleaning jig can complete the work of cleaning a plurality of testing parts in the testing equipment in batches, reduces the shutdown and cleaning time of the testing equipment, and improves the detection efficiency of the testing equipment.

Further details regarding other functions and embodiments of the present application are described below with reference to the accompanying drawings.

Drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments described in the present application, and other drawings can be obtained by those skilled in the art without creative efforts.

Fig. 1 is a schematic perspective view illustrating a cleaning fixture according to an embodiment of the present application;

FIG. 2 is a perspective view of a cleaning unit according to an embodiment of the present application;

fig. 3 is a side view illustrating a cleaning unit according to an embodiment of the present application.

Description of the symbols

1 cleaning jig 10 frame

100 first side 102 second side

12 cleaning unit 120 body

120a first clamping plate 120b second clamping plate

122 first locking member 124 second locking member

126 cleaning sheet 2 test section

L frame length W frame width

Height of H frame

Detailed Description

In order to specifically describe the embodiments and achieve the effects of the present application, an embodiment is provided and described below with reference to the drawings.

Referring to fig. 1 and 2 together, fig. 1 is a schematic perspective view illustrating a cleaning fixture according to an embodiment of the present application, and fig. 2 is a schematic perspective view illustrating a cleaning unit according to an embodiment of the present application. As shown in the figure, the cleaning fixture 1 includes a frame 10 and a plurality of cleaning units 12, the plurality of cleaning units 12 may be arranged on two sides of the frame 10, and the cleaning sheet 126 in each cleaning unit faces the outside of the frame 10. In one example, two sides of the frame 10 may be respectively defined as a first side 100 and a second side 102, and the plurality of cleaning units 12 may be respectively grouped into two groups, one group of cleaning units 12 being disposed on the first side 100, and the other group of cleaning units 12 being disposed on the second side 102. As shown in fig. 1, the cleaning units 12 disposed on the first side 100 are arranged in a row, and the cleaning sheets 126 in each cleaning unit are oriented at substantially the same angle, e.g., perpendicularly to the outside of the frame 10.

In addition, the cleaning fixture 1 is used for cleaning the testing device, and particularly, the cleaning fixture 1 can be used for cleaning a testing portion (not shown in fig. 1) of the testing device. In practice, the testing portion of the testing apparatus may be used to test the electronic device (not shown) during normal operation or use of the testing apparatus (e.g. during testing). In one example, the electronic component may be a battery, and the testing device is a device for detecting whether the battery is operating properly. As will be understood by those skilled in the art, in the process of testing the battery, the testing portion needs to be firmly electrically connected to the electrodes of the battery to perform the charging and discharging test on the battery or measure the voltage inside the battery. Assuming that the electronic component is a pouch battery, since the electrodes of the pouch battery are laminated and have a certain degree of flexibility, the test part must clamp the electrodes to prevent the electrodes from falling off, which may cause accidents. Of course, the present embodiment does not limit the electronic component to be a pouch battery, and does not limit the electrodes to be sheet-shaped, and the electronic component described in the present embodiment should be considered as the electronic component as long as the testing portion of the testing apparatus electrically connects the electrodes of the electronic component by clamping the electrodes.

To test electronic components in batches, a plurality of electronic components may be placed on a tray (not shown) and then the entire tray may be placed in a library location in the testing apparatus so that the plurality of electronic components may be tested together. In contrast, the test apparatus has a plurality of test sections, each of which is electrically connected to an electrode of one of the electronic devices. The present embodiment does not limit the position of the electrodes of the electronic components, for example, a plurality of electronic components may be arranged on two sides of the carrier tray, and the electrode of each electronic component may face the outside of the carrier tray vertically. In practice, the electronic components may be disposed in the carrier tray in a manner similar to the cleaning tool 1 illustrated in fig. 1 of the present embodiment, for example, the carrier tray may be compared with the frame 10 of the cleaning tool 1, the electronic components may be compared with the cleaning unit 12 of the cleaning tool 1, and the electrodes of the electronic components may be compared with the cleaning sheets 126 of the cleaning unit 12. At this time, although the cleaning jig 1 does not have an actual electronic component (for example, a battery to be tested), the appearance can simulate a case where a plurality of electronic components are placed on the boat.

In order to place the cleaning fixture 1 into a storage space of the testing apparatus, the frame 10 may define a frame length L and a frame width W, both of which are smaller than the length and width of the tray. Of course, to better simulate the placement of multiple electronic components on the boat, the frame length L may also be exactly equal to the length of the boat, and the frame width W may likewise be exactly equal to the width of the boat. In addition, the height of the frame 10 can also be defined as a frame height H, which should be smaller than the height of the boat. In one example, the frame height H may be exactly equal to the height of the boat, such that the frame 10 has an apparent volume substantially equal to the volume of the boat when the frame length L, the frame width W, the frame height H, and the length, width, and height of the boat are all the same.

The present embodiment will next describe the structure of the cleaning unit and roughly exemplify the manner in which the test section is cleaned by the cleaning unit. Referring to fig. 2 and 3 together, fig. 2 is a schematic perspective view illustrating a cleaning unit according to an embodiment of the present application, and fig. 3 is a schematic perspective view illustrating the cleaning unit and a testing part according to the embodiment of the present application. As shown in fig. 2, the cleaning unit 12 of the cleaning fixture 1 is shown, the cleaning unit 12 has a body 120, and the body 120 is provided with a first locking member 122, a second locking member 124 and a cleaning sheet 126. The first locking member 122 may be used to be locked to the frame 10 of the cleaning fixture 1, for example, to the first side 100 of the frame 10. In practice, when the first locking member 122 is locked, the frame 10 and the cleaning unit 12 do not move or rotate relative to each other, so that the cleaning sheet 126 can be kept stable. When the first locking member 122 is released, the cleaning unit 12 can be detached from the frame 10, thereby facilitating maintenance or replacement of the cleaning unit 12.

As can be seen in fig. 2, the body 120 is formed of two similar plate-like structures, which are defined as a first clamping plate 120a and a second clamping plate 120b, and the first clamping plate 120a and the second clamping plate 120b are locked by a second locking member 124. In the example shown in fig. 2, the locking directions of the first locking member 122 and the second locking member 124 are different, for example, the locking directions of the first locking member 122 and the second locking member 124 may be perpendicular to each other. In one example, one end of the cleaning sheet 126 may be sandwiched by the first clamping plate 120a and the second clamping plate 120b, while the other end of the cleaning sheet 126 is exposed and may be used to clean the test part 2. In practice, the cleaning sheet 126 is a two-sided sheet-like component, and both sides (first and second sides) of the cleaning sheet 126 may have a sandpaper-like roughened surface. In one example, the cleaning sheet 126 may be a piece of sandpaper folded in half with the smooth surface of the sandpaper folded on the inside and the rough surface of the sandpaper folded on the outside. That is, both the first and second sides of the cleaning sheet 126 may be a sandpaper roughened surface. It should be noted that the present embodiment does not limit how many test parts 2 can simultaneously clamp one cleaning sheet 126, and although fig. 3 shows that two test parts 2 simultaneously clamp one cleaning sheet 126, the cleaning sheet 126 may correspond to only one test part 2.

In practical terms, when the testing apparatus detects the electronic component, the testing portion 2 not only clamps the electrode of the electronic component, but also slightly moves when pressing against the surface of the electrode, so as to scrape off the oxide film on the surface of the electrode. After a certain period of time, the test portion 2 is inevitably contaminated with residues of the oxide film or dust, and the test portion 2 must be periodically cleaned. In one example, after the testing device detects the electronic component, the tray with the electronic component can be pulled out from the storage position, and the cleaning fixture 1 can be placed in the storage position. Since the position of the cleaning sheet 126 is the same as the position of the electrodes of the electronic component, the engineer can issue the same instruction to the test equipment, for example, control the test section 2 of the test equipment to sandwich the electrodes of the electronic component. Of course, the present embodiment is not limited to the instructions received by the testing equipment, and for example, an engineer may issue instructions dedicated to self-cleaning to the testing equipment.

In response to the above, since the electrodes of the electronic component have been replaced with the cleaning sheet 126, the testing section 2 of the testing apparatus is changed to be clamped to the cleaning sheet 126 at a position originally intended to be clamped to the electrodes of the electronic component. It can be understood by those skilled in the art that since the testing part 2 also has the action of pressing against the cleaning sheet 126 and moving slightly, the residue and dust originally accumulated on the testing part 2 can be removed by the rough surface of the cleaning sheet 126, thereby achieving the purpose of cleaning the testing part 2. In one example, if the test portion 2 has a lot of dirt, the engineer may issue several repeated commands to the test device, for example, control the test portion 2 of the test device to clamp several cleaning sheets 126, so as to achieve the purpose of cleaning the test portion 2. As can be seen from the above, in practice, the test equipment utilizes the cleaning fixture 1 to achieve the self-cleaning effect, for example, the cleaning can be achieved by utilizing the existing command, rather than the cleaning fixture 1 utilizes the cleaning sheet 126 to actively remove the residue and dust on the test portion 2.

In addition, when the cleaning sheet 126 reaches the use limit (e.g., after multiple uses), the second locking member 124 can also be released to allow the first clamping plate 120a to be slightly separated from the second clamping plate 120 b. At this time, the engineer may draw out the used cleaning sheet 126 from between the first clamping plate 120a and the second clamping plate 120b and replace it with a new cleaning sheet 126. For stopping the test equipment and detaching and cleaning the test parts 2 one by one, the embodiment has obvious advantages that a cleaning jig 1 can be used for cleaning a greater number of test parts 2 at a time. On the other hand, the present embodiment can clean the test section 2 in the next stock position by only replacing the cleaning sheet 126, and the test apparatus does not need to be stopped for cleaning the test section 2, which also means that the detection efficiency can be greatly improved.

To sum up, the clean tool that this application provided can be used for clean test equipment, and test equipment's test section can press from both sides tight cleaning sheet by oneself and grind away dirty, and need not wash test section one by one with the manual work. Therefore, the cleaning jig can complete the work of cleaning a plurality of testing parts in the testing equipment in batches, reduces the shutdown and cleaning time of the testing equipment, and improves the detection efficiency of the testing equipment.

The above-described embodiments and/or implementations are only illustrative of the preferred embodiments and/or implementations for implementing the technology of the present application, and are not intended to limit the implementations of the technology of the present application in any way, and those skilled in the art can make many changes or modifications to the equivalent embodiments without departing from the scope of the technology disclosed in the present application, but should still be considered as the technology or implementations substantially the same as the present application.